CN116418330A - Error adjustment method, selector and device of device based on analog circuit - Google Patents
Error adjustment method, selector and device of device based on analog circuit Download PDFInfo
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- CN116418330A CN116418330A CN202310229578.3A CN202310229578A CN116418330A CN 116418330 A CN116418330 A CN 116418330A CN 202310229578 A CN202310229578 A CN 202310229578A CN 116418330 A CN116418330 A CN 116418330A
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Abstract
The application provides an error adjustment method, a selector and a device of a device based on an analog circuit, wherein the method comprises the following steps: acquiring sensing data; determining a threshold range in which the sensing data is located from at least two threshold ranges stored in advance; selecting an error adjustment value corresponding to the threshold range from at least two error adjustment values stored in advance; and transmitting the error adjustment value to a working circuit so that the working circuit executes detection analysis work related to the sensing data under the correction of the error adjustment value. The application provides a method for dynamically selecting an error adjustment value, which can enable devices such as a chip or equipment to reach an optimal working state under different physical mechanism conditions.
Description
Technical Field
The present application relates to an error adjustment method, and more particularly, to an error adjustment method, a selector, and an apparatus for an apparatus based on an analog circuit.
Background
At present, the physical mechanism of a chip or a device composed of common analog circuits is changed along with the working conditions. Trim (error adjustment or correction) is often required. The conditions affecting the physical mechanism of the chip or device are mainly the Process, voltage (Voltage), temperature (Temperature), and PVT for short. However, the trim of the chip or the equipment is static at present, and the trim is mainly performed on the chip or the equipment with different process changes under the typical voltage and room temperature. However, even chips or devices that pass through a trim can suffer from accuracy degradation, increased errors, and even failure at different temperature and voltage deviations.
For example, trim is performed in a production environment for variations from process to process at typical operating voltages and typical operating temperatures. The static trim value only meets a certain voltage or temperature range, for example, the temperature working range of the industrial grade is-40 ℃ to +85 ℃. However, the errors caused by different temperature or voltage deviations are different, so that the trim values are also the same, and it is difficult for temperature or voltage sensitive circuits to meet the accuracy or performance requirements at static trim values.
Disclosure of Invention
The invention aims to provide an error adjustment method, a selector and a device of a device based on an analog circuit, which are used for solving the problem that a fixed error adjustment value cannot meet the corresponding precision or performance requirements of the device under different physical mechanism conditions.
A first aspect of an embodiment of the present application provides a method for adjusting an error of an apparatus based on an analog circuit, the method including: acquiring sensing data; determining a threshold range in which the sensing data is located from at least two threshold ranges stored in advance; selecting an error adjustment value corresponding to the threshold range from at least two error adjustment values stored in advance; and transmitting the error adjustment value to a working circuit so that the working circuit executes detection analysis work related to the sensing data under the correction of the error adjustment value.
In one implementation of the first aspect, the sensing data includes process, voltage and/or temperature sensing data.
In one implementation manner of the first aspect, the error adjustment value is a value measured and stored in advance under PVT conditions commonly used on a production line.
In an implementation manner of the first aspect, the error adjustment value is stored in a first storage space in advance, and a storage manner of the first storage space is power-down nonvolatile; the threshold range is stored in a second storage space in advance, and is configured through external equipment and written into the second storage space.
In another implementation of the first aspect, the error adjustment value and the threshold range are pre-stored in different addresses of the same memory space.
In an implementation manner of the first aspect, the step of determining, from among the at least two pre-stored threshold ranges, a threshold range in which the sensing data is located includes: determining a threshold range in which the sensing data is positioned from at least two threshold ranges stored in advance by utilizing an error gear mechanism; the error gear mechanism is a linear judgment or nonlinear judgment mechanism.
In an implementation manner of the first aspect, before the step of acquiring the sensing data, the method further includes: in response to a sensor generating sensed data requiring correction, the sensor is corrected by fixing the correction value such that the sensor has a sensitivity to changes in the test environment that is less than the operating circuit.
A second aspect of embodiments of the present application provides an error adjustment selector configured to: acquiring sensing data; determining a threshold range in which the sensing data is located from at least two threshold ranges stored in advance; selecting an error adjustment value corresponding to the threshold range from at least two error adjustment values stored in advance; and transmitting the error adjustment value to a working circuit so that the working circuit executes detection analysis work related to the sensing data under the correction of the error adjustment value.
A third aspect of embodiments of the present application provides an analog circuit-based apparatus, the apparatus comprising: the error adjusts the selector.
In an implementation manner of the third aspect, the apparatus further includes: the device comprises a sensing module, a first storage space, a second storage space and a working circuit; the sensing module is configured to collect the sensing data; the first storage space is configured to pre-store at least two threshold ranges; the second storage space is configured to store at least two error adjustment values in advance; the operation circuit receives the selected error adjustment value, and performs detection analysis operation related to the sensing data under the correction of the error adjustment value.
As described above, the error adjustment method, the selector and the device of the analog circuit-based device have the following advantages:
the error adjustment value, i.e., trim value, is dynamically selected by sensing, via sensors or other special circuitry, the process, voltage, temperature, or other operating environment that causes a change in the physical mechanism of the chip/device that the analog circuitry is made up of. The chip or the equipment can reach the optimal working state under different PVT arbitrary conditions. According to the method, error adjustment is carried out by dividing the threshold range, the trim value is dynamically selected, so that a circuit sensitive to parameters such as temperature or voltage can meet the precision or performance requirements (such as failure requirements) even when working under larger temperature deviation or larger voltage deviation.
Drawings
Fig. 1 is a schematic flow chart of an error adjustment method of an analog circuit-based device according to an embodiment of the present application.
Fig. 2 shows an error adjustment value selection schematic diagram of an error adjustment method for an analog circuit-based device according to an embodiment of the present application.
Fig. 3 is a schematic diagram illustrating an operation principle of the error adjustment selector according to the embodiment of the present application.
Fig. 4 shows a schematic structural diagram of an analog circuit-based device according to an embodiment of the present application.
Description of element reference numerals
4. Analog circuit-based device
41. Error adjustment selector
42. Sensing module
43. A first storage space
44. A second storage space
45. Working circuit
S11 to S14 steps
Detailed Description
Other advantages and effects of the present application will become apparent to those skilled in the art from the present disclosure, when the following description of the embodiments is taken in conjunction with the accompanying drawings. The present application may be embodied or carried out in other specific embodiments, and the details of the present application may be modified or changed from various points of view and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments may be combined with each other without conflict.
It should be noted that, the illustrations provided in the following embodiments merely illustrate the basic concepts of the application by way of illustration, and only the components related to the application are shown in the drawings and are not drawn according to the number, shape and size of the components in actual implementation, and the form, number and proportion of the components in actual implementation may be arbitrarily changed, and the layout of the components may be more complex.
The following describes the technical solutions in the embodiments of the present application in detail with reference to the drawings in the embodiments of the present application.
Referring to fig. 1, a schematic flow chart of an error adjustment method of an analog circuit-based device according to an embodiment of the present application is shown. As shown in fig. 1, the error adjustment method of the analog circuit-based device according to the embodiment specifically includes the following steps:
s11, acquiring sensing data.
In one embodiment, the sensor data includes process, voltage and/or temperature sensing data.
And S12, determining the threshold range in which the sensing data is located from at least two threshold ranges stored in advance.
In one embodiment, step S12 specifically includes: determining a threshold range in which the sensing data is positioned from at least two threshold ranges stored in advance by utilizing an error gear mechanism; the error gear mechanism is a linear judgment or nonlinear judgment mechanism.
The linear determination may be a simple linear function determination, for example, y=a×x+b, (a, b are determining coefficients, x, y are linear relationships, and the value of y may be determined directly according to the value of x for selection, where a linear function may be established according to the sensing data and the threshold value in this application). Nonlinear relations refer to look-up table relations that are either expressed as relatively complex functions or that are not regular and cannot be fitted with simple expressions, requiring experimental measurements.
S13, selecting an error adjustment value (trim value) corresponding to the located threshold range from at least two error adjustment values stored in advance.
For example, the conversion accuracy of the ADC (Analog-to-Digital Converter ) may be exemplified by environmental problems according to the actual working environment, if the ADC is greatly affected by the environmental temperature, for example, several units of-40 ℃, 0 ℃, 25 ℃,100 ℃ are selected, the production line writes the errors (trim values) corresponding to the several temperatures into the storage unit, and then, according to the temperature values obtained by the temperature sensor, the linear judgment or the nonlinear judgment mechanism described in S12 is utilized to select which trim value error is the smallest at present.
In one embodiment, the error adjustment value is a value measured and stored in advance under PVT conditions common to production lines. In particular, it may be burned into an internal or external memory space of the chip or device.
In an embodiment, the error adjustment value is stored in a first storage space in advance, and a storage mode of the first storage space is power-down nonvolatile; the threshold range is stored in a second storage space in advance, and is configured through external equipment and written into the second storage space.
Specifically, the external device refers to a CPU (Central Processing Unit ) or a host, which writes a required threshold range into the second storage space. In practical applications, the threshold range flexibly configured by the CPU or host may be a fixed value, and this mode is slightly less flexible than the configuration mode.
In another embodiment, the error adjustment value and the threshold range are pre-stored in different addresses of the same memory space.
In practical application, the pre-stored trim values need to adopt the same scheme in the generation environment and the practical use environment, trim values corresponding to a plurality of threshold ranges or threshold gears are measured, and then the measured threshold ranges and the corresponding trim values are programmed into the internal or external nonvolatile storage space of the chip or the device.
And S14, transmitting the error adjustment value to a working circuit so that the working circuit executes detection analysis work related to the sensing data under the correction of the error adjustment value.
Specifically, in combination with the above temperature acquisition example, the working circuit may be a circuit for monitoring and alarming the temperature, transmitting an error adjustment value of the temperature to the working circuit, determining a corrected temperature value by the working circuit under the correction of the error adjustment value, further analyzing whether the corrected temperature value meets the monitored normal temperature condition, and determining whether the alarm is required according to the judgment.
It should be noted that the temperature acquisition is only one of the analog circuit scenarios illustrated for illustrating implementation of the method principles of the present application, and other analog circuit applications to which the error adjustment principles of the present application may be applied are within the scope of the present application.
In one embodiment, before step S11, the method further includes: in response to a sensor generating sensed data requiring correction, the sensor is corrected by fixing the correction value such that the sensor has a sensitivity to changes in the test environment that is less than the operating circuit.
Specifically, a sensor for detecting the environment or condition such as PVT can be used as a sensor which can work stably, if the sensor itself also needs trim, a circuit adopting a fixed static trim mode is needed to be designed for a circuit, so that the sensitivity along with PVT changes is smaller than that of a circuit to be trim, namely a working circuit.
Referring to fig. 2, an error adjustment value selection schematic diagram of an error adjustment method of an analog circuit-based device according to an embodiment of the present application is shown. As shown in fig. 2, the trim selector firstly obtains the value of the sensing data from the sensor, adopts a certain mechanism (the mechanism needs to be matched with a mass production trim link) to judge which gear is currently selected according to a gear threshold or a threshold range (only two gears are shown in fig. 2), and then selects one trim from a storage space storing the trim value according to the judged gear to be transmitted. The memory space stores a trim value of 1 and a trim value of 2. The mechanism for determining the trim shift position may be a simple linear determination or a non-linear determination.
Thus, the sensor or other special circuit detects PVT (or other operating environment parameter), and can be dynamically divided into various intervals (the range of which can be configured by an external device) according to the value obtained by detecting PVT, and if the current detected PVT satisfies the current range through some calculation relation, one trim value is selected. Each range corresponds to a trim. The need for greater accuracy or the sensor or other special circuitry may be divided into more intervals for PVT (or other operating environment parameters). If there is only one trim, the trim scheme used for the current chip or device.
Fig. 3 is a schematic diagram illustrating the working principle of the error adjustment selector according to the embodiment of the present application. As shown in fig. 3, the error adjustment selector according to the present embodiment is configured to:
acquiring sensing data; determining a threshold range in which the sensing data is located from at least two threshold ranges stored in advance; selecting an error adjustment value corresponding to the threshold range from at least two error adjustment values stored in advance; and transmitting the error adjustment value to a working circuit so that the working circuit executes detection analysis work related to the sensing data under the correction of the error adjustment value.
In practical application, the error adjustment selector is a trim selector, and a dynamic trim scheme is adopted, so that a circuit sensitive to PVT variation can work well and stably under wider conditions, such as higher temperature or lower temperature.
Referring to fig. 4, a schematic diagram of an analog circuit-based device according to an embodiment of the present application is shown. As shown in fig. 4, the analog circuit-based device 4 according to the present embodiment includes: the error adjustment selector 41.
The error adjustment selector 41 is configured to: acquiring sensing data; determining a threshold range in which the sensing data is located from at least two threshold ranges stored in advance; selecting an error adjustment value corresponding to the threshold range from at least two error adjustment values stored in advance; and transmitting the error adjustment value to a working circuit so that the working circuit executes detection analysis work related to the sensing data under the correction of the error adjustment value.
With continued reference to fig. 4, the analog circuit-based device 4 further includes: a sensing module 42, a first memory space 43, a second memory space 44 and a working circuit 45.
The sensing module 42 is configured to collect the sensed data.
In particular, the sensing module 42 refers to a sensor (e.g., PVT) that is used to detect various operating environment parameters in a chip or device under different physical mechanisms.
The first storage space 43 is configured to store at least two threshold ranges in advance.
In particular, the first storage space 43 is used for storing a plurality of trim values measured at the time of generation.
The second storage space 44 is configured as at least two error adjustment values stored in advance.
Specifically, the second storage space 44 is used to store a plurality of written threshold ranges. The CPU or host will need a threshold range to write to the second Memory space 44. The second Memory space 44 may be either a power-down volatile Memory, such as a register or SRAM (Static Random-Access Memory), or a power-down nonvolatile Memory.
The operation circuit 45 receives the selected error adjustment value, and performs detection analysis operation related to the sensor data with the correction of the error adjustment value.
The protection scope of the error adjustment method of the analog circuit-based device according to the embodiment of the present application is not limited to the execution sequence of the steps listed in the embodiment, and all the schemes implemented by adding or removing steps and replacing steps according to the prior art made by the principles of the present application are included in the protection scope of the present application.
The device based on analog circuit according to the embodiment of the present application may implement the error adjustment method of the device based on analog circuit according to the present application, but the implementation device of the error adjustment method of the device based on analog circuit according to the present application includes, but is not limited to, the structure of the device based on analog circuit listed in the present embodiment, and all structural modifications and substitutions made according to the principles of the present application in the prior art are included in the protection scope of the present application.
In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, or methods may be implemented in other manners. For example, the apparatus embodiments described above are merely illustrative, e.g., the division of modules/units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple modules or units may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or modules or units, which may be in electrical, mechanical or other forms.
The modules/units illustrated as separate components may or may not be physically separate, and components shown as modules/units may or may not be physical modules, i.e., may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules/units may be selected according to actual needs to achieve the purposes of the embodiments of the present application. For example, functional modules/units in various embodiments of the present application may be integrated into one processing module, or each module/unit may exist alone physically, or two or more modules/units may be integrated into one module/unit.
Those of ordinary skill would further appreciate that the elements and algorithm steps of the examples described in connection with the embodiments disclosed herein may be embodied in electronic hardware, in computer software, or in a combination of the two, and that the elements and steps of the examples have been generally described in terms of function in the foregoing description to clearly illustrate the interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
The descriptions of the processes or structures corresponding to the drawings have emphasis, and the descriptions of other processes or structures may be referred to for the parts of a certain process or structure that are not described in detail.
The foregoing embodiments are merely illustrative of the principles of the present application and their effectiveness, and are not intended to limit the application. Modifications and variations may be made to the above-described embodiments by those of ordinary skill in the art without departing from the spirit and scope of the present application. Accordingly, it is intended that all equivalent modifications and variations which may be accomplished by persons skilled in the art without departing from the spirit and technical spirit of the disclosure be covered by the claims of this application.
Claims (10)
1. A method for error adjustment of an analog circuit-based device, the method comprising:
acquiring sensing data;
determining a threshold range in which the sensing data is located from at least two threshold ranges stored in advance;
selecting an error adjustment value corresponding to the threshold range from at least two error adjustment values stored in advance;
and transmitting the error adjustment value to a working circuit so that the working circuit executes detection analysis work related to the sensing data under the correction of the error adjustment value.
2. The method according to claim 1, characterized in that:
the sensed data includes process, voltage and/or temperature sensed data.
3. The method according to claim 1, characterized in that:
the error adjustment value is a value which is measured and stored in advance under PVT conditions which are common on the production line.
4. The method according to claim 1, characterized in that:
the error adjustment value is stored in a first storage space in advance, and the storage mode of the first storage space is power-down nonvolatile;
the threshold range is stored in a second storage space in advance, and is configured through external equipment and written into the second storage space.
5. The method according to claim 1, characterized in that:
the error adjustment value and the threshold range are pre-stored in different addresses of the same memory space.
6. The method of claim 1, wherein the step of determining the threshold range in which the sensed data is located from among the at least two threshold ranges stored in advance, comprises:
determining a threshold range in which the sensing data is positioned from at least two threshold ranges stored in advance by utilizing an error gear mechanism; the error gear mechanism is a linear judgment or nonlinear judgment mechanism.
7. The method of claim 1, wherein prior to the step of acquiring the sensed data, the method further comprises:
in response to a sensor generating sensed data requiring correction, the sensor is corrected by fixing the correction value such that the sensor has a sensitivity to changes in the test environment that is less than the operating circuit.
8. An error adjustment selector, the error adjustment selector configured to:
acquiring sensing data;
determining a threshold range in which the sensing data is located from at least two threshold ranges stored in advance;
selecting an error adjustment value corresponding to the threshold range from at least two error adjustment values stored in advance;
and transmitting the error adjustment value to a working circuit so that the working circuit executes detection analysis work related to the sensing data under the correction of the error adjustment value.
9. An analog circuit-based apparatus, the apparatus comprising: the error adjustment selector of claim 8.
10. The apparatus according to claim 9, wherein: the apparatus further comprises: the device comprises a sensing module, a first storage space, a second storage space and a working circuit;
the sensing module is configured to collect the sensing data;
the first storage space is configured to pre-store at least two threshold ranges;
the second storage space is configured to store at least two error adjustment values in advance;
the operation circuit receives the selected error adjustment value, and performs detection analysis operation related to the sensing data under the correction of the error adjustment value.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310229578.3A CN116418330A (en) | 2023-03-10 | 2023-03-10 | Error adjustment method, selector and device of device based on analog circuit |
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| CN202310229578.3A CN116418330A (en) | 2023-03-10 | 2023-03-10 | Error adjustment method, selector and device of device based on analog circuit |
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