CN116379942A - Device and method for measuring object diameter by light scattering method - Google Patents
Device and method for measuring object diameter by light scattering method Download PDFInfo
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- CN116379942A CN116379942A CN202310367936.7A CN202310367936A CN116379942A CN 116379942 A CN116379942 A CN 116379942A CN 202310367936 A CN202310367936 A CN 202310367936A CN 116379942 A CN116379942 A CN 116379942A
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- 239000004065 semiconductor Substances 0.000 claims abstract description 43
- 238000012360 testing method Methods 0.000 claims abstract description 21
- 238000002474 experimental method Methods 0.000 claims abstract description 9
- 238000012545 processing Methods 0.000 claims description 6
- 238000004364 calculation method Methods 0.000 claims description 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
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- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses a testing device and a testing method for measuring the diameter of an object by a light scattering method, and is characterized by further comprising a movable frame arranged on a support, a laser mechanism arranged on the movable frame in a sliding manner, a driving mechanism arranged on the movable frame and used for driving the laser mechanism to move, a stepping motor arranged on a bottom frame, a rotating arm arranged on the bottom frame and connected with the stepping motor, and a light intensity sensor arranged on the rotating arm. The invention adopts the arrangement of a driving mechanism, controls the laser beam adjusting frame to move through a stepping motor and controls the distance of each movement to be consistent; after the position of the semiconductor laser moves, the strongest point of reflected light intensity changes, the strongest point of light intensity is automatically captured by the light intensity sensor, so that an accurate incident angle and an accurate reflecting angle are obtained, and then the diameter of a cylinder of a sample to be measured is automatically calculated according to an algorithm, so that the accuracy of experiments is ensured, the operation of operators is facilitated, and the operation complexity is reduced.
Description
Technical Field
The invention relates to an experiment for testing the diameter of an object by a light scattering method, in particular to a device and a method for testing the diameter of the object by the light scattering method.
Background
The experimental device substrate for measuring the diameter of an object by using a light scattering method in the prior art comprises a laser, a movable frame for installing the laser, a disc and a movable platform for calibrating a lens, wherein the movement of the laser is manually adjusted each time in the experiment, the strongest light intensity point reflected by the laser irradiated to the object is found by eyes to obtain an incident angle and a reflection angle, and then the incident angle and the reflection angle are calculated according to the obtained data; but through the removal of manual adjustment laser instrument, the removal distance at every turn is difficult to guarantee unanimously, must have certain deviation to find the strongest light strong point through the eye also can have certain deviation, lead to the angle of incidence and the corresponding deviation that has of reflection angle that obtains, lead to the calculation data of experiment at last to appear deviating, influence experimental effect, and adjust at every turn all needs manual operation, complex operation and data inaccuracy. For this purpose, a test device for measuring the diameter of an object by a light scattering method and a test method thereof are proposed.
Disclosure of Invention
The invention aims to solve the problems and provides a testing device and a testing method for measuring the diameter of an object by using a light scattering method.
In order to achieve the above purpose, the invention provides a testing device for measuring the diameter of an object by a light scattering method, which comprises a bottom frame and a bracket arranged on the bottom frame, wherein the bracket is arranged on the bottom frame; the device is characterized by further comprising a moving frame, a laser mechanism, a driving mechanism, a stepping motor, a rotating arm and a light intensity sensor, wherein the moving frame is arranged on the support, the laser mechanism is arranged on the moving frame in a sliding manner, the driving mechanism is arranged on the moving frame and used for driving the laser mechanism to move, the stepping motor is arranged on the bottom frame, the rotating arm is arranged on the bottom frame and connected with the stepping motor, and the light intensity sensor is arranged on the rotating arm; the chassis is also provided with a disc, and the disc is provided with an angle indication.
Further preferably, the stepper motor is connected with an angle encoder.
Further preferably, the laser mechanism includes a laser beam adjustment frame slidably mounted on the movable frame and a semiconductor laser mounted on the laser beam adjustment frame; the driving mechanism comprises a step motor II arranged on the movable frame, a screw rod connected with the step motor, and a nut seat movably arranged on the screw rod and connected with the laser beam adjusting frame.
Further preferably, the moving frame is further provided with a sliding rail, and the laser beam adjusting frame is provided with a sliding groove matched with the sliding rail.
A testing method of a testing device for measuring the diameter of an object by a light scattering method is characterized by comprising the following steps of: the test method is as follows:
1) Instrument preparation: opening a power supply of the semiconductor laser and adjusting the power strength of the semiconductor laser;
2) Spot adjustment: placing a cylindrical sample in the center of the disc, enabling the laser beam to be shot on the surface of the cylindrical sample, and enabling the spot size of the current distance shot on the surface of the cylindrical sample to be minimum by adjusting a focusing lens at the front part of the semiconductor laser;
3) And (3) light path adjustment: taking down the cylindrical sample from the center of the disc, placing a calibration lens at the zero-scale position of the center of the disc, adjusting the positions of the laser beam adjusting frame and the semiconductor laser through a step motor II to enable the laser beam to enter the calibration lens, and enabling the laser beam to return to the center of a light outlet hole of the semiconductor laser after being reflected by the calibration lens, wherein the laser beam passes through the center of a circle; then the calibration lens is taken down, then a sample is placed in the center of the disc, and reflected light can be observed to return to the center position of the light outlet hole of the semiconductor laser, and the position of the semiconductor laser is the initial position;
4) Experiments were performed: changing the positions of the laser beam adjusting frame and the semiconductor laser through a step motor II, enabling the semiconductor laser to move towards one direction, setting the position of the semiconductor laser as b, and setting the moving interval of each time as delta b; after the movement interval adjustment is finished, controlling a stepping motor with an angle encoder to control the rotating arm to rotate, stopping rotating after a light intensity sensor on the rotating arm receives a maximum light intensity signal (namely a scattering spot position), and automatically recording an angle position 2 alpha and a semiconductor laser position b through the angle encoder on the stepping motor; then, after changing the position b according to the delta b again, measuring the angle position 2 alpha of the scattering spot after changing the position b each time by the same method until the angle 2 alpha is 90 degrees;
5) And (3) calculating: let R be the radius of the sample, b be the position of the semiconductor laser (i.e. the aiming distance, the distance between the beam and a parallel line passing through the center of the target), the beam will be reflected after hitting the target, let the angle of reflection be α, the angle of reflection reflected by the side of the sample will be equal to the angle of incidence α, and geometrically derived
Defining total reflection angle θ=pi-2α, giving +.>
Differential scattering cross section is calculated from experimental data of the variation Deltab of the aiming distance b and the variation Deltaphi of the scattering angle phi>
By->
Preliminary calculation of R 0 The distance r from the scattering center (i.e. the distance from the receiving surface of the light intensity sensor to the center of the disc) is measured and then passed +.>
Then do->
Graph, deriving slope K 1 And R is 1 ；
6) Repeating the data processing process of the step 5) for a plurality of times in an iterative mode until R n+1 And R is R n Substantially uniform, i.e. as the value of R, thereby defining the radius of the cylinder.
The invention adopts the arrangement of the driving mechanism, controls the laser beam adjusting frame to move through the stepping motor, and controls the distance of each movement to be consistent; meanwhile, through the arrangement of the stepping motor, the angle encoder and the light intensity sensor, after the position of the semiconductor laser moves, the reflected light intensity strongest point changes, the light intensity strongest point is automatically captured through the light intensity sensor, so that an accurate incident angle and a reflecting angle are obtained, and then the diameter of a cylinder of a sample to be detected is automatically calculated according to an algorithm, so that the accuracy of experiments is ensured, the operation of operators is facilitated, and the operation complexity is reduced.
Drawings
FIG. 1 is a schematic diagram of the structure of the present invention;
FIG. 2 is a schematic diagram of the structure of the present invention;
FIG. 3 is a schematic view in partial cross-section of the drive mechanism of the present invention;
FIG. 4 is a graph of scattering angle phi versus aiming distance b for the present invention;
FIG. 5 shows the differential scattering cross-section and x (x represents)
) Is a relationship data graph of (1);
FIG. 6 is a schematic illustration of the present invention
Sample radius data table obtained in relation to x.
Legend description: 1. a chassis; 11. a disc; 12. an angle indication; 2. a bracket; 3. a moving rack; 31. a slide rail; 4. a laser mechanism; 41. a laser beam adjusting frame; 42. a semiconductor laser; 43. a chute; 5. a driving mechanism; 51. a step motor II; 52. a screw rod; 53. a nut seat; 6. a stepping motor; 7. a rotating arm; 8. and a light intensity sensor.
Detailed Description
The invention further provides a testing device and a testing method for measuring the diameter of an object by using a light scattering method, and the testing device and the testing method are described below with reference to the accompanying drawings.
Referring to fig. 1 to 6, a test apparatus for measuring the diameter of an object by a light scattering method includes a base frame 1 and a bracket 2 mounted on the base frame 1; the device is characterized by further comprising a movable frame 3 arranged on the bracket 2, a laser mechanism 4 arranged on the movable frame 3 in a sliding manner, a driving mechanism 5 arranged on the movable frame 3 and used for driving the laser mechanism 4 to move, a stepping motor 6 arranged on the bottom frame 1, a rotating arm 7 arranged on the bottom frame 1 and connected with the stepping motor 6, and a light intensity sensor 8 arranged on the rotating arm 7; a disc 11 is also arranged on the underframe 1, and an angle indicator 12 is arranged on the disc 11; the stepping motor 6 is connected with an angle encoder;
by adopting the arrangement of the driving mechanism 5, the laser beam adjusting frame 41 is controlled to move by the stepping motor 51, and the moving distance of each time is controlled to be consistent; meanwhile, through the arrangement of the stepping motor 6, the angle encoder and the light intensity sensor 8, after the position of the semiconductor laser 42 moves, the reflected light intensity strongest point changes, and the light intensity strongest point is automatically captured through the light intensity sensor 8, so that an accurate incident angle and a reflection angle are obtained, the accuracy of experiments is ensured, the operation of operators is facilitated, and the operation complexity is reduced;
when the light intensity sensor 8 captures the strongest light intensity point, the rotating arm 7 is driven to rotate by the stepping motor 6, the rotating arm 7 drives the light intensity sensor 8 to rotate to capture the strongest light intensity point, and the rotation angle is obtained by the angle encoder after capturing.
Further, the laser mechanism 4 includes a laser beam adjustment frame 41 slidably mounted on the movable frame 3 and a semiconductor laser 42 mounted on the laser beam adjustment frame 41; the driving mechanism 5 comprises a second stepping motor 51 arranged on the moving frame 3, a screw rod 52 connected with the second stepping motor 51, and a nut seat 53 movably arranged on the screw rod 52 and connected with the laser beam adjusting frame 41;
when the semiconductor laser 42 moves, the screw rod 52 is driven to rotate by the stepping motor 51, and the screw rod 52 drives the laser beam adjusting frame 41 to linearly move by being in spiral fit with the nut seat 53, so that the semiconductor laser 42 is driven to linearly move.
Further, the moving frame 3 is further provided with a sliding rail 31, and the laser beam adjusting frame 41 is provided with a sliding groove 43 adapted to the sliding rail 31; by the arrangement of the slide rail 31 and the slide groove 43, the movement of the laser beam adjusting frame 41 is limited and guided.
The testing method comprises the following steps:
1) Firstly, preparing an instrument, and adjusting the power intensity of the semiconductor laser 42 after the power of the semiconductor laser 42 is turned on;
2) Spot adjustment: placing a cylindrical sample in the center of the disc, enabling the laser beam to irradiate on the surface of the cylindrical sample, and completing spot adjustment after the spot size of the current distance to the surface of the cylindrical sample is minimized by adjusting a focusing lens at the front part of the semiconductor laser 42;
3) And (3) light path adjustment: taking down the cylindrical sample from the center of the disc 11, placing a calibration lens at the zero-scale position of the center of the disc, adjusting the positions of the laser beam adjusting frame 41 and the semiconductor laser 42 through the stepping motor 51 to enable the laser beam to enter the calibration lens, and enabling the laser beam to return to the center of a light outlet hole of the semiconductor laser 42 after being reflected by the calibration lens, wherein the laser beam passes through the center of a circle; then the calibration lens is taken down, then a sample is placed at the center of the disc 11, so that reflected light can be observed and returned to the position of the semiconductor laser 42, and the center position of a light outlet hole of the semiconductor laser 42 is the initial position;
4) Experiments were performed: the laser beam adjusting frame and the semiconductor laser 42 are driven to move in one direction by the stepping motor 51, the position of the semiconductor laser 42 is set to b, and each moving interval is set to Deltab, for example, each moving interval is set to 0.1cm; after the movement interval adjustment is completed, the rotating arm 7 is driven to rotate by the stepping motor 6, when the light intensity sensor 8 on the rotating arm 7 receives a maximum light intensity signal (namely, the position of a scattered spot), the rotation is stopped, and the angle position 2 alpha and the position b of the semiconductor laser 42 are automatically recorded by the angle encoder on the stepping motor 6; then, after changing the position b according to the delta b again, measuring the angle position 2 alpha of the scattering spot after changing the position b each time by the same method until the angle 2 alpha is 90 degrees;
5) And (3) calculating: setting R as the radius of the sample, and calculating the differential scattering cross section through experimental data of the variation delta b of the aiming distance b and the variation delta phi of the scattering angle phi
By->
Preliminary calculation of R 0 The distance r from the scattering center (i.e. the distance from the light intensity sensor receiving surface to the center of the disc 11) is measured and then calculated +.>
Then do->
Graph, slope K is derived by linear fitting 1 And R is 1 ；
6) Repeating the data processing process of the step 5) for a plurality of times in an iterative mode until R n+1 And R is R n The diameter of the sample can be obtained after the radius is determined;
and (3) recording and processing experimental data:
by passing through
The relation data of the scattering angle phi and the aiming distance b are plotted, as shown in fig. 4, the intercept of the trend line is set to be 0, and the slope K is obtained, so that the primary estimation R of the radius of the cylinder can be obtained 0 ；
Making differential scattering cross-sections
(unit: cm/radian) and +.>
Relational data relating the above
As x; as shown in the figure 5 of the drawings,
by passing through
The relation diagram between x and the slope K is obtained 1 R represents 1 ＝2K 1 As shown in fig. 6, the present invention,
by R 1 Replacement of R 0 Repeating the data processing process in an iterative mode to obtain K 2 、R 2 The method comprises the steps of carrying out a first treatment on the surface of the Similarly with R n Substitution of R 0 Repeating the above processing to obtain R n+1 Up to R n+1 And R is R n The dimensions are substantially the same, i.e. the radius of the sample cylinder is determined.
The scope of protection of the present invention is not limited to the above embodiments and variations thereof. Conventional modifications and substitutions by those skilled in the art based on the content of the present embodiment fall within the protection scope of the present invention.
Claims (5)
1. A testing device for measuring the diameter of an object by a light scattering method comprises a bottom frame (1) and a bracket (2) arranged on the bottom frame (1); the device is characterized by further comprising a movable frame (3) arranged on the bracket (2), a laser mechanism (4) arranged on the movable frame (3) in a sliding manner, a driving mechanism (5) arranged on the movable frame (3) and used for driving the laser mechanism (4) to move, a stepping motor (6) arranged on the underframe (1), a rotating arm (7) arranged on the underframe (1) and connected with the stepping motor (6), and a light intensity sensor (8) arranged on the rotating arm (7); the chassis (1) is also provided with a disc (11), and the disc (11) is provided with an angle indication (12).
2. A test device for measuring the diameter of an object by a light scattering method according to claim 1, wherein: the stepping motor (6) is connected with an angle encoder.
3. A test device for measuring the diameter of an object by a light scattering method according to claim 1, wherein: the laser mechanism (4) comprises a laser beam adjusting frame (41) which is slidably arranged on the movable frame (3) and a semiconductor laser (42) which is arranged on the laser beam adjusting frame (41); the driving mechanism (5) comprises a second stepping motor (51) arranged on the movable frame (3), a screw rod (52) connected with the second stepping motor (51), and a nut seat (53) movably arranged on the screw rod (52) and connected with the laser beam adjusting frame (41).
4. A test device for measuring the diameter of an object by a light scattering method according to claim 3, wherein: the movable frame (3) is also provided with a sliding rail (31), and the laser beam adjusting frame (41) is provided with a sliding groove (43) matched with the sliding rail (31).
5. A test method of a test device for measuring the diameter of an object by a light scattering method according to any one of claims 1 to 4, characterized in that: the test method is as follows:
1) Instrument preparation: opening a power supply of the semiconductor laser and adjusting the power strength of the semiconductor laser;
2) Spot adjustment: placing a cylindrical sample in the center of the disc, enabling the laser beam to be shot on the surface of the cylindrical sample, and enabling the spot size of the current distance shot on the surface of the cylindrical sample to be minimum by adjusting a focusing lens at the front part of the semiconductor laser;
3) And (3) light path adjustment: taking down the cylindrical sample from the center of the disc, placing a calibration lens at the zero-scale position of the center of the disc, adjusting the positions of the laser beam adjusting frame and the semiconductor laser through a step motor II to enable the laser beam to enter the calibration lens, and enabling the laser beam to return to the center of a light outlet hole of the semiconductor laser after being reflected by the calibration lens, wherein the laser beam passes through the center of a circle; then the calibration lens is taken down, then a sample is placed in the center of the disc, and reflected light can be observed to return to the center position of the light outlet hole of the semiconductor laser, and the position of the semiconductor laser is the initial position;
4) Experiments were performed: changing the positions of the laser beam adjusting frame and the semiconductor laser through a step motor II, enabling the semiconductor laser to move towards one direction, setting the position of the semiconductor laser as b, and setting the moving interval of each time as delta b; after the movement interval adjustment is finished, controlling a stepping motor with an angle encoder to control the rotating arm to rotate, stopping rotating after a light intensity sensor on the rotating arm receives a maximum light intensity signal, and automatically recording an angle position 2 alpha and a semiconductor laser position b through the angle encoder on the stepping motor; then, after changing the position b according to the delta b again, measuring the angle position 2 alpha of the scattering spot after changing the position b each time by the same method until the angle 2 alpha is 90 degrees;
5) And (3) calculating: setting R as the radius of the sample, b as the position of the semiconductor laser, reflecting after the light beam hits the target, setting the reflecting angle as alpha, and obtaining the reflecting angle reflected by the side surface of the sample equal to the incident angle alpha according to geometry
Defining total reflection angle θ=pi-2α, giving +.>
Differential scattering cross section is calculated from experimental data of the variation Deltab of the aiming distance b and the variation Deltaphi of the scattering angle phi>
By->
Preliminary calculation of R 0 Measuring distance r from scattering center and then passing
Then do->
Graph, slope K is derived by linear fitting 1 And R is 1 ；
6) Repeating the data processing process of the step 5) for a plurality of times in an iterative mode until R n+1 And R is R n Substantially uniform, i.e. as the value of R, thereby defining the radius of the cylinder.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202310367936.7A CN116379942A (en) | 2023-04-08 | 2023-04-08 | Device and method for measuring object diameter by light scattering method |
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| CN202310367936.7A CN116379942A (en) | 2023-04-08 | 2023-04-08 | Device and method for measuring object diameter by light scattering method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116718568A (en) * | 2023-08-04 | 2023-09-08 | 中节能(达州)新材料有限公司 | Device and method for detecting light reflecting performance of light reflecting material |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116718568A (en) * | 2023-08-04 | 2023-09-08 | 中节能(达州)新材料有限公司 | Device and method for detecting light reflecting performance of light reflecting material |
| CN116718568B (en) * | 2023-08-04 | 2023-10-17 | 中节能(达州)新材料有限公司 | Device and method for detecting light reflecting performance of light reflecting material |
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