CN116358417A - Device and method for judging object edge position through Fresnel diffraction principle - Google Patents
Device and method for judging object edge position through Fresnel diffraction principle Download PDFInfo
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- G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
Abstract
The invention relates to the technical field of data processing, in particular to a device and a method for judging the edge position of an object through a Fresnel diffraction principle. Comprising the following steps: the parallel laser light source is used for emitting laser light sources which are parallel to each other; the image sensor is used for receiving parallel light rays of the parallel laser light sources emitted by the parallel laser light sources after being blocked by the measured object and forming a light intensity diffraction image; the distance measuring device is used for measuring the distance between the measured object and the image sensor; and the processor is used for determining the position value of the measured object in the detection area according to the characteristic data information in the light intensity diffraction image and the distance between the measured object and the image sensor. Compared with the traditional infrared measurement mode and ultrasonic measurement mode, the invention has the advantages of high precision, high linearity and the like, compared with the image recognition technology, the invention has the advantages of low cost, simple structure and the like, and the laser light source can ignore the influence of external environment light without complex algorithm.
Description
Technical Field
The invention relates to the technical field of data processing, in particular to a device and a method for judging the edge position of an object through a Fresnel diffraction principle.
Background
In the prior art, in the mode of recognizing the object edge position by the sensor, the method of ultrasonic and infrared measurement can be realized by methods such as an ultrasonic sensor, an infrared sensor, image recognition and the like, wherein the transmitting end and the receiving end are arranged on two sides of the measured object, the shielding position is judged by judging the variation compared with the transmitting amount or the previous measuring amount, the image recognition is to take a picture of the object by using a camera, the edge pixel position of the object is recognized by an algorithm, and the position of the edge is judged according to the position of the camera.
However, in the prior art, the method for measuring the edges of the object by using ultrasonic waves and infrared rays generally has the problem of low precision, generally 0.1mm, and has the problem of poor linearity, generally 1-5%, and the ultrasonic waves and infrared rays measuring method is limited by the size of the generator, so that the measuring range of a single device is small, generally only a few millimeters, although the measuring range can be increased by using a splicing mode, the process requirement on the splicing of the devices is high, the measured value at the splicing position easily has great deviation, the image quality is easily influenced by the performance of external environment light and a light supplementing light source by using an image identification measuring mode, and the industrial camera is expensive, and a special upper computer is required for carrying out image identification processing, and the precision also directly depends on the performance of an algorithm and hardware.
Disclosure of Invention
The invention aims to provide a device and a method for judging the edge position of an object by using the Fresnel diffraction principle, the device and the method adopt parallel laser generated by laser through a light source, so that the light intensity is uniform and stable.
In order to achieve the above object, the present invention provides the following technical solutions:
an apparatus for determining the position of a diffraction edge of an object by fresnel diffraction, comprising:
the parallel laser light source is used for emitting laser light sources which are parallel to each other;
the image sensor is used for receiving parallel light rays which are emitted by the parallel laser light sources and are parallel to each other after the parallel laser light sources are shielded by the measured object, and forming a light intensity diffraction image;
the distance measuring device is used for measuring the distance between the measured object and the image sensor;
and the processor is used for determining the position value of the measured object in the detection area according to the characteristic data information in the light intensity diffraction image and the distance between the measured object and the image sensor.
In some embodiments of the present application, the parallel laser light source includes a monochromatic laser generator and a lens, the monochromatic laser generator is disposed at a focal point of the lens, and light rays emitted by the monochromatic laser generator are refracted by the lens to form the laser light sources parallel to each other.
In some embodiments of the present application, the processor is further configured to determine, by using fresnel diffraction principles, characteristic data information of the light intensity diffraction image, where the characteristic data information includes a peak position, a straight edge where diffraction occurs, and a diffraction distance value, and determine a distance between the parallel laser light source and a projection point of the straight edge where diffraction occurs, so as to determine a position of the measured object in a detection area.
In some embodiments of the present application, the processor is further configured to calculate and determine a distance between the parallel laser light source and a projected point of the straight edge where diffraction occurs according to the following formula:
in the method, in the process of the invention,
for the wavelength of the diffracted light, +.>
For the distance between the parallel laser source and the projection point of the straight edge where diffraction occurs, +.>
Is the distance between the peak position of the light intensity diffraction image and the straight edge where diffraction occurs.
In some embodiments of the present application, the light intensity diffraction image comprises a fresnel straight edge diffraction simulation graph and a light intensity graph;
the image sensor is also used for carrying out numerical filtering processing on the image numerical value of the light intensity curve graph.
In some embodiments of the present application, the image sensor is one of a CCD and a CMOS.
In order to achieve the above object, the present invention further provides a method for determining a diffraction edge position of an object according to a fresnel diffraction principle, which is applied to the device for determining a diffraction edge position of an object according to the fresnel diffraction principle, and includes:
emitting laser light sources which are parallel to each other through parallel laser light sources, and determining the wavelength of diffracted light of the laser light sources;
measuring the distance between the surface of the object to be measured and the image sensor;
receiving parallel light rays which are emitted by the parallel laser light sources and are parallel to each other after the parallel laser light sources pass through the object to be measured, and forming a light intensity diffraction image; wherein, the liquid crystal display device comprises a liquid crystal display device,
the light intensity diffraction image comprises a Fresnel straight-edge diffraction simulation image and a light intensity curve graph;
performing numerical filtering processing on the image values of the light intensity curve graph;
fitting the light intensity diffraction image, and determining the position value of the detected object in the detection area through the light intensity diffraction image.
In some embodiments of the present application, the fitting the light intensity diffraction image includes:
and obtaining the position of the first peak point by fitting a function curve of the light intensity diffraction image and analyzing the function characteristics of the first derivative and the second reciprocal.
In some embodiments of the present application, after the fitting processing is performed on the light intensity diffraction image, the method further includes:
calculating and determining the distance between the parallel laser light source and the projection point of the straight edge where diffraction occurs by the light intensity diffraction image according to the following formula:
in the method, in the process of the invention,
for the wavelength of the diffracted light, +.>
For the distance between the parallel laser source and the projection point of the straight edge where diffraction occurs, +.>
Is the distance between the peak position of the light intensity diffraction image and the straight edge where diffraction occurs.
In some embodiments of the present application, the position value of the measured object diffraction edge is determined according to the following formula:
n=X-
；
wherein n is the position value of the diffraction edge of the measured object, X is the position of the first peak point,
is the distance between the peak position of the light intensity diffraction image and the straight edge where diffraction occurs.
The invention provides a device and a method for judging the edge position of an object by using a Fresnel diffraction principle, which have the beneficial effects that compared with the prior art:
the invention produces monochromatic laser through the parallel laser source, has good stability, because the measuring method of the invention measures the light intensity, and the laser intensity is far greater than the external environment light, the external environment light can not produce obvious influence when collecting the image characteristic, effectively guarantee the measuring precision, in addition, the imaging by the direct light source, does not need to expose, does not need to complex image edge detection algorithm, does not need to control the image control parameters such as exposure time, etc., has simplified the controlled process, has improved the detection efficiency, and the detection speed is faster compared with the method of photo image recognition, the diffraction light intensity waveform can change immediately when the position changes, can also recognize immediately.
Drawings
FIG. 1 is a schematic structural diagram of an apparatus for determining an edge position of an object according to the Fresnel diffraction principle in an embodiment of the present invention;
FIG. 2 is a simulated Fresnel straight edge diffraction pattern in an embodiment of the present invention;
FIG. 3 is a graph of light intensity in an embodiment of the invention;
FIG. 4 is a flow chart of a method for determining the edge position of an object according to the Fresnel diffraction principle in an embodiment of the present invention.
In the figure: 1. a monochromatic laser generator; 2. a lens; 3. an image sensor; 4. a distance measuring device; 5. an object to be measured; 6. a processor.
Detailed Description
The following describes in further detail the embodiments of the present invention with reference to the drawings and examples. The following examples are illustrative of the invention and are not intended to limit the scope of the invention.
In the description of the present application, it should be understood that the terms "center," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, merely to facilitate description of the present application and simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present application.
The terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present application, unless otherwise indicated, the meaning of "a plurality" is two or more.
In the description of the present application, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be the communication between the inner sides of the two elements. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art in a specific context.
In the prior art, the method for measuring the edges of the object by using ultrasonic waves and infrared rays generally has the problem of low precision, generally 0.1mm and poor linearity, generally 1-5%, and the ultrasonic waves and infrared rays are limited by the size of a generator, so that the measuring range of a single device is small, generally only a few millimeters, although the measuring range can be increased by using a splicing mode, the process requirement on the splicing of the devices is high, the measured value at the splicing position easily has large deviation, and the image quality is easily influenced by the external environment light and the performance of a light supplementing light source by using an image recognition measuring mode, so that the problem that accurate measurement cannot be performed is caused.
Therefore, the invention provides a device and a method for judging the edge position of an object by using the Fresnel diffraction principle, and the light source adopts parallel laser generated by laser, so that the light intensity is uniform and stable.
Referring to fig. 1, an embodiment of the disclosure provides an apparatus for determining a diffraction edge position of an object according to fresnel diffraction principle, including:
the parallel laser light source is used for emitting laser light sources which are parallel to each other;
the image sensor 3 is used for receiving parallel light rays of the parallel laser light sources emitted by the parallel laser light sources after being blocked by the measured object 5, and forming a light intensity diffraction image;
a distance measuring device 4, the distance measuring device 4 is used for measuring the distance between the measured object 5 and the image sensor 3;
and a processor 6, wherein the processor 6 is used for determining the position value of the measured object 5 in the detection area according to the characteristic data information in the light intensity diffraction image and the distance between the measured object 5 and the image sensor 3.
It can be understood that the measuring device of the present invention may be a laser triangle ranging device, an ultrasonic ranging device, or other devices with ranging capability, and when the measuring device is used for laser ranging, the image sensor may be two parts, one part generates a diffraction waveform image, and the other part is used for receiving triangle ranging laser, or may be a single integral image sensor, so that a part of the photosensitive area of the sensor exceeds the range of parallel laser and is used for receiving the reflected light of the ranging laser.
In a specific embodiment of the present application, the parallel laser light source includes a monochromatic laser generator 1 and a lens 2, the monochromatic laser generator 1 is disposed at a focal point of the lens 2, and the light emitted by the monochromatic laser generator 1 is refracted by the lens 2 to form the laser light sources parallel to each other.
In a specific embodiment of the present application, the processor 6 is further configured to determine, according to fresnel diffraction principles, characteristic data information of the light intensity diffraction image, where the characteristic data information includes a peak position, a straight edge where diffraction occurs, and a diffraction distance value, and the processor 6 is further configured to determine a distance between the parallel laser light source and a projection point of the straight edge where diffraction occurs, so as to determine a position of the measured object 5 in the detection area.
In a specific embodiment of the present application, the processor 6 is further configured to calculate and determine the distance between the parallel laser light source and the projection point of the straight edge where diffraction occurs according to the following formula:
in the method, in the process of the invention,
for the wavelength of the diffracted light, +.>
For the distance between the parallel laser source and the projection point of the straight edge where diffraction occurs, +.>
Is the distance between the peak position of the light intensity diffraction image and the straight edge where diffraction occurs.
It will be appreciated that the formula for determining the distance between the parallel laser source and the projection point of the straight edge where diffraction occurs is derived from the following formula:
in the method, in the process of the invention,
for the wavelength of the diffracted light, +.>
For the distance between the parallel laser source and the projection point of the straight edge where diffraction occurs, +.>
Since the peak position of the Fresnel diffraction fringe has an approximate fixed relation with the straight edge where diffraction occurs and the diffraction distance, the relation between the distance between the Fresnel diffraction peak point and the straight edge projection point, the distance between the wavelength and the distance between the light source and the straight edge projection point can be obtained by transforming the formula.
In one embodiment of the present application, referring to FIGS. 2-3, the light intensity diffraction image comprises a Fresnel straight edge diffraction simulation image and a light intensity curve graph;
the image sensor 3 is also used for performing numerical filtering processing on the image values of the light intensity curve.
In a specific embodiment of the present application, the image sensor 3 is one of a CCD and a CMOS.
Based on the same technical concept, referring to fig. 4, the invention also provides a method for judging the position of the object diffraction edge by using the fresnel diffraction principle, which is applied to a device for judging the position of the object diffraction edge by using the fresnel diffraction principle, and comprises the following steps:
emitting laser light sources which are parallel to each other through the parallel laser light sources, and determining the diffraction light wavelength of the laser light sources;
measuring the distance between the surface of the object to be measured and the image sensor;
receiving parallel light rays which are emitted by the parallel laser light sources and are parallel to each other after the parallel laser light sources pass through the object to be measured to form a light intensity diffraction image; wherein, the liquid crystal display device comprises a liquid crystal display device,
the light intensity diffraction image comprises a Fresnel straight-edge diffraction simulation image and a light intensity curve graph;
performing numerical filtering treatment on the image values of the light intensity curve graph;
fitting the light intensity diffraction image, and determining the position value of the measured object in the detection area through the light intensity diffraction image.
In a specific embodiment of the present application, the fitting process of the light intensity diffraction image includes:
and obtaining the position of the first wave peak point by fitting a function curve of the light intensity diffraction image and analyzing the function characteristics of the first derivative and the second reciprocal.
In a specific embodiment of the present application, after performing the fitting processing on the light intensity diffraction image, the method further includes:
the distance between the parallel laser source and the projected point of the straight edge where diffraction occurs is calculated and determined from the light intensity diffraction image and according to the following formula:
in the method, in the process of the invention,
for the wavelength of the diffracted light, +.>
For the distance between the parallel laser source and the projection point of the straight edge where diffraction occurs, +.>
Is the distance between the peak position of the light intensity diffraction image and the straight edge where diffraction occurs.
In one embodiment of the present application, the position value of the diffraction edge of the measured object is determined according to the following formula:
n=X-
；
wherein n is the position value of the diffraction edge of the measured object, X is the position of the first peak point,
is the distance between the peak position of the light intensity diffraction image and the straight edge where diffraction occurs.
In summary, the parallel laser light sources emit the parallel laser light sources, the image sensor receives the parallel light rays of the laser light sources after being blocked by the measured object and forms the light intensity diffraction image, the distance measuring device measures the distance between the measured object and the image sensor, and the processor determines the position value of the measured object in the detection area, so that the traditional detection mode of the sensor is changed, the precision and the linearity are improved, the structure is simple, and the cost is reduced. In addition, the invention produces monochromatic laser through the parallel laser light source, has good stability, because the measuring method of the invention measures the light intensity, and the laser intensity is far greater than the external environment light, the external environment light can not generate obvious influence when collecting the image characteristics, the measuring precision is effectively ensured, meanwhile, the direct light source is used for imaging, the exposure is not needed, the complex image edge detection algorithm is not needed, the image control parameters such as the exposure time are not needed to be controlled, the control process is simplified, the detection efficiency is improved, the detection speed is faster compared with the photo image identification method, the diffracted light intensity waveform can be changed immediately when the position is changed, and the identification can be realized immediately.
The foregoing is merely an example of the present invention, and the scope of the present invention is not limited thereto, and all changes made in the structure according to the present invention should be considered as falling within the scope of the present invention without departing from the gist of the present invention.
It will be clear to those skilled in the art that, for convenience and brevity of description, the specific working process of the system described above and the related description may refer to the corresponding process in the foregoing method embodiment, which is not repeated here.
It should be noted that, in the system provided in the foregoing embodiment, only the division of the foregoing functional modules is illustrated, in practical application, the foregoing functional allocation may be performed by different functional modules, that is, the modules or steps in the embodiment of the present invention are further decomposed or combined, for example, the modules in the foregoing embodiment may be combined into one module, or may be further split into multiple sub-modules, so as to complete all or part of the functions described above. The names of the modules and steps related to the embodiments of the present invention are merely for distinguishing the respective modules or steps, and are not to be construed as unduly limiting the present invention.
Those of skill in the art will appreciate that the various illustrative modules, method steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the program(s) corresponding to the software modules, method steps, may be embodied in Random Access Memory (RAM), memory, read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, removable disk, CD-ROM, or any other form of storage medium known in the art. To clearly illustrate this interchangeability of electronic hardware and software, various illustrative components and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as electronic hardware or software depends upon the particular application and design constraints imposed on the solution. Those skilled in the art may implement the described functionality using different approaches for each particular application, but such implementation is not intended to be limiting.
The terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus/apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus/apparatus.
Thus far, the technical solution of the present invention has been described in connection with the preferred embodiments shown in the drawings, but it is easily understood by those skilled in the art that the scope of protection of the present invention is not limited to these specific embodiments. Equivalent modifications and substitutions for related technical features may be made by those skilled in the art without departing from the principles of the present invention, and such modifications and substitutions will fall within the scope of the present invention.
The above is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention.
Claims (10)
1. A device for determining the position of the diffraction edge of an object by fresnel diffraction, comprising:
the parallel laser light source is used for emitting laser light sources which are parallel to each other;
the image sensor is used for receiving parallel light rays which are emitted by the parallel laser light sources and are parallel to each other after the parallel laser light sources are shielded by the measured object, and forming a light intensity diffraction image;
the distance measuring device is used for measuring the distance between the measured object and the image sensor;
and the processor is used for determining the position value of the measured object in the detection area according to the characteristic data information in the light intensity diffraction image and the distance between the measured object and the image sensor.
2. The apparatus for determining the position of a diffraction edge of an object according to claim 1, wherein,
the parallel laser light source comprises a monochromatic laser generator and a lens, wherein the monochromatic laser generator is arranged on a focus of the lens, and light rays emitted by the monochromatic laser generator are refracted by the lens to form the laser light sources which are parallel to each other.
3. The apparatus for determining the position of a diffraction edge of an object according to claim 1, wherein,
the processor is further used for determining characteristic data information of the light intensity diffraction image through a Fresnel diffraction principle, wherein the characteristic data information comprises a peak position, a straight edge where diffraction occurs and a diffraction distance value, and the processor is further used for determining the distance between the parallel laser light source and a projection point of the straight edge where diffraction occurs so as to determine the position of the measured object in a detection area.
4. An apparatus for determining the position of a diffraction edge of an object by the fresnel diffraction principle according to claim 3,
the processor is further configured to calculate and determine a distance between the parallel laser light source and a projected point of the straight edge where diffraction occurs according to the following formula:
in the method, in the process of the invention,
for the wavelength of the diffracted light, +.>
Is parallel excitationThe distance between the light source and the projection point of the straight edge where diffraction occurs,
is the distance between the peak position of the light intensity diffraction image and the straight edge where diffraction occurs.
5. The apparatus for determining the position of a diffraction edge of an object according to claim 1, wherein,
the light intensity diffraction image comprises a Fresnel straight-edge diffraction simulation image and a light intensity curve graph;
the image sensor is also used for carrying out numerical filtering processing on the image numerical value of the light intensity curve graph.
6. The apparatus for determining the position of a diffraction edge of an object according to claim 1, wherein,
the image sensor is one of a CCD and a CMOS.
7. A method for judging the position of the diffraction edge of an object by using the fresnel diffraction principle, which is applied to the device for judging the position of the diffraction edge of the object by using the fresnel diffraction principle as set forth in any one of claims 1 to 6, and is characterized by comprising:
emitting laser light sources which are parallel to each other through parallel laser light sources, and determining the wavelength of diffracted light of the laser light sources;
measuring the distance between the surface of the object to be measured and the image sensor;
receiving parallel light rays which are emitted by the parallel laser light sources and are parallel to each other after the parallel laser light sources pass through the object to be measured, and forming a light intensity diffraction image; wherein, the liquid crystal display device comprises a liquid crystal display device,
the light intensity diffraction image comprises a Fresnel straight-edge diffraction simulation image and a light intensity curve graph;
performing numerical filtering processing on the image values of the light intensity curve graph;
fitting the light intensity diffraction image, and determining the position value of the detected object in the detection area through the light intensity diffraction image.
8. The method of determining the position of the diffraction edge of an object according to claim 7, wherein said fitting the light intensity diffraction image comprises:
and obtaining the position of the first peak point by fitting a function curve of the light intensity diffraction image and analyzing the function characteristics of the first derivative and the second reciprocal.
9. The method for determining the position of the diffraction edge of an object according to claim 8, wherein after the fitting process is performed on the light intensity diffraction image, further comprises:
calculating and determining the distance between the parallel laser light source and the projection point of the straight edge where diffraction occurs by the light intensity diffraction image according to the following formula:
in the method, in the process of the invention,
for the wavelength of the diffracted light, +.>
For the distance between the parallel laser source and the projection point of the straight edge where diffraction occurs,
is the distance between the peak position of the light intensity diffraction image and the straight edge where diffraction occurs.
10. The method for determining the position of the diffraction edge of an object according to claim 9, wherein the position value of the diffraction edge of the object to be measured is determined according to the following formula:
n=X-
；
wherein n is the position value of the diffraction edge of the measured object, X is the position of the first peak point,
is the distance between the peak position of the light intensity diffraction image and the straight edge where diffraction occurs.
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| CN117115082A (en) * | 2023-07-12 | 2023-11-24 | 钛玛科（北京）工业科技有限公司 | Method and equipment for detecting overlap quality of tire |
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