CN116338345A - Channel controller, control device and test device for multi-channel test - Google Patents

Abstract

A channel controller, a control device and a test device for multi-channel testing, the channel controller for multi-channel testing comprising: the device comprises a sampling unit, a processing unit and a protection unit; the sampling unit is used for collecting current flowing through the tested object and outputting a collection signal; the protection unit comprises a driving module and a first switch module; the driving module is used for outputting a state change signal to the first switch module according to the acquisition signal; the processing unit is used for outputting a first protection control signal to the protection unit according to the state change signal; the protection unit is used for closing the channel where the protection unit is located according to the first protection control signal. The sampling unit is adopted to collect the current flowing through the tested object in real time, the first protection mode is triggered when the collection signal of the current reaches the set threshold value, the test channel is rapidly closed through the protection unit, and the problem of rapid protection when short circuits are caused by damage or other anomalies in the test process of a certain channel product is solved.

Description

Channel controller, control device and test device for multi-channel test

Technical Field

The present disclosure relates to electrical parameter testing, and more particularly to a channel controller, a channel control device and a testing device for multi-channel testing.

Background

Currently, electrical parameter testing time is long for certain products. For example, a withstand voltage test is performed on a PTC product, in which a dc power supply is used to apply rated voltage and/or limiting voltage to the PTC product to be tested, and test parameters are collected. The overall test time was about 20 hours. In order to improve the efficiency of the test, it is necessary to perform the test of a plurality of products simultaneously.

The most direct test method is to test a direct current power supply corresponding to a PTC product. Multiple DC power supplies are needed for testing multiple products. The method has the advantages that the requirement for test equipment synchronously increases along with the increase of the tested objects, the cost is remarkable, and the occupied area and the energy consumption of the equipment are increased in equal proportion. How to test a plurality of objects to be tested simultaneously by using one test device is an important technical problem which is constantly addressed in the field.

Disclosure of Invention

In view of the above, the embodiments of the present application provide a channel controller, a channel control device and a testing device for multi-channel testing to solve at least one problem in the background art.

In a first aspect, an embodiment of the present application provides a channel controller for multi-channel testing, including: the device comprises a sampling unit, a processing unit and a protection unit; the sampling unit is connected with the protection unit; the processing unit is connected with the protection unit; the sampling unit is used for collecting current flowing through the tested object and outputting a collection signal; the protection unit comprises a driving module and a first switch module; the driving module is used for outputting a state change signal to the first switch module according to the acquisition signal; the processing unit is used for outputting a first protection control signal to the protection unit according to the state change signal; the protection unit is used for closing the channel where the protection unit is located according to the first protection control signal.

With reference to the first aspect of the present application, in an alternative embodiment, the driving module includes a first input terminal, a second input terminal, and a first output terminal; the first input end is connected with the sampling unit and is used for receiving the acquisition signal; the second input end is connected with the processing unit and is used for receiving a first protection control signal; the driving module is used for continuously outputting a closing signal to the first switch module according to the first protection control signal; and the first switch module continuously closes the channel where the protection unit is positioned according to the continuous closing signal.

With reference to the first aspect of the present application, in an optional implementation manner, the protection unit further includes a delay module, configured to reduce a rising speed of a current flowing through the first switch module, so that the first switch module changes a state.

With reference to the first aspect of the present application, in an optional implementation manner, the processing unit is further connected to the sampling unit; the processing unit is used for comparing the sampling value of the current flowing through the tested object with a first threshold value and outputting a second protection control signal to the protection unit according to the comparison result so as to control the channel where the protection unit is located to be closed.

With reference to the first aspect of the present application, in an optional implementation manner, the sampling unit includes a signal conditioning module; the signal conditioning module is used for performing range conversion and amplification on the current flowing through the tested object so that the processing unit can obtain the sampling value.

With reference to the first aspect of the present application, in an optional implementation manner, the channel controller for multi-channel testing further includes a protection control unit connected to the protection unit, the sampling unit and the processing unit, respectively; the protection control unit is used for receiving the acquisition signal and the starting signal of the processing unit so as to control the protection unit to enter a working state.

With reference to the first aspect of the present application, in an optional implementation manner, the processing unit is further configured to compare the sampled value of the current flowing through the measured object with a second threshold value, and send an enable signal to the protection control unit according to a comparison result.

With reference to the first aspect of the present application, in an optional implementation manner, the protection control unit includes a second switch module, where the second switch module is connected to the protection unit and the processing unit, and the second switch module is configured to change an operating state of the second switch module according to an enable signal of the processing unit, so as to control the protection unit to enter the operating state.

In a second aspect, embodiments of the present application provide a channel control device for multi-channel testing, including: at least two channel controllers according to the first aspect, each of the channel controllers being connected to a different object to be measured; each channel controller is used for independently controlling the test state of the tested object connected with the channel controller.

In a third aspect, an embodiment of the present application provides a multi-channel testing apparatus, including: at least two test channels, each test channel comprising a channel controller of the first aspect described above, and a test power supply connected to the channel controller; each channel controller is used for independently controlling whether the test channel is closed or not.

According to the channel controller for multi-channel testing, provided by the embodiment of the application, the current flowing through the tested object is monitored in real time by the sampling unit, the first protection mode is triggered when the current reaches the set threshold value, the test channel is rapidly closed by the protection unit, the problem of rapid protection when a certain channel product is damaged or short-circuited due to other anomalies in the test process is solved, the power supply of the channel is rapidly cut off without affecting the test of other channels, the purposes of simultaneous testing of a plurality of test channels and a plurality of objects are achieved, the test efficiency is greatly improved, and the test cost is saved.

Additional aspects and advantages of the application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the application.

Drawings

The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute an undue limitation to the application. In the drawings:

FIG. 1 is a schematic block diagram of a channel controller for multi-channel testing according to an embodiment of the present application;

FIG. 2 is a partial circuit diagram of a channel controller according to an embodiment of the present application;

FIG. 3a is a schematic diagram showing a current mutation of a measured object;

FIG. 3b is a schematic diagram showing a slow rise of current generated by the object under test;

FIG. 4 is a schematic block diagram of a channel controller for multi-channel testing according to another embodiment of the present application;

FIG. 5 is a partial circuit diagram of a channel controller including a protection unit according to an embodiment of the present application;

FIG. 6 is a plot of the voltammetric characteristics of a PTC;

FIG. 7 is a schematic block diagram of a channel controller for multi-channel testing according to another embodiment;

FIG. 8 is a schematic diagram of a channel controller including a protection control unit according to an embodiment of the present application;

fig. 9 is a schematic structural diagram of a multi-channel testing device according to an embodiment of the present application.

Detailed Description

In order to make the technical solution and the beneficial effects of the present application more obvious and understandable, the technical solution in the embodiments of the present application will be clearly and completely described by way of listing specific embodiments, and it is obvious that the described embodiments are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, are intended to be within the scope of the present application.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

It will be understood that the terms "first," "second," and the like, as used herein, may be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another element. For example, a first resistance may be referred to as a second resistance, and similarly, a second resistance may be referred to as a first resistance, without departing from the scope of the present application. Both the first resistor and the second resistor are resistors, but they are not the same resistor. When "first" is described, it does not necessarily mean that "second" is present; and when "second" is discussed, it does not necessarily mean that the first element, component, region, layer or section is present. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. The meaning of "a plurality of" is two or more, unless specifically defined otherwise. It will be further understood that the terms "comprises" and "comprising," when used in this specification, specify the presence of stated features, but do not preclude the presence or addition of one or more other features. As used herein, the term "and/or" includes any and all combinations of the associated listed items.

It is to be understood that in the context of this application "connected" means that the connected end and the connected end have electrical signals or data transfer to each other, and can be understood as "electrically connected", "communicatively connected" or the like. In the context of this application, "a is directly connected to B" means that no other components than wires are included between a and B.

The inventor finds that if one direct current power supply is used for testing a plurality of PTC products, the following situations occur due to the difference of the plurality of PTC products: the short circuit caused by damage of one PTC product in the testing process causes the direct current power supply to enter a constant current mode, at this time, because of the short circuit of the load, the output voltage value of the direct current power supply is very low according to ohm's law, which leads to the interruption of the testing process due to the failure of maintaining the conduction state of the PTC products of other channels. In order to solve the problem, the inventor proposes to detect, judge and quickly protect the current in each channel testing process by adopting a channel controller, and when a short circuit is found in the testing process of a certain channel product, the power supply of the channel is quickly cut off without affecting the testing of other channels, so that the one-to-many testing is realized, namely, the testing of a plurality of PTC products is realized by adopting one power supply. And the maximum channel expansion can be performed according to the configured direct current power supply power.

The embodiment of the present application provides a channel controller 100 for multi-channel testing, as shown in fig. 1, including: a sampling unit 110, a processing unit 120 and a protection unit 130. The sampling unit 110 is connected to the protection unit 130. The processing unit 120 is connected to the protection unit 130.

The sampling unit 110 is used for collecting current flowing through the object 140 to be tested and outputting a collection signal. Optionally, the sampling unit includes a first collecting module, configured to collect a current flowing through the PTC product, convert the collected current signal into a voltage signal, and output the voltage signal as a collected signal.

The protection unit 130 includes a driving module 131 and a first switching module 132; the driving module 131 is configured to output a state change signal to the first switching module 132 according to the sampling signal. The first switch module 132 is configured to change its own operating state according to the state change signal. For example, the first switch module 132 changes from an on state to an off state, thereby briefly closing the test channel.

The processing unit 120 is configured to output a first protection control signal to the protection unit according to the state change signal, so as to control the channel where the protection unit is located to be continuously closed. The protection unit 130 is configured to close a channel where the protection unit 130 is located according to the first protection control signal, so as to stop the test of the tested object of the channel. The processing unit 120 may be implemented by hardware with a computing function, such as a single-chip microcomputer, PLC, ARM, CPU, and the like. The hardware device can be embedded or non-embedded system such as desktop, mobile phone, industrial personal computer, tablet and the like.

Optionally, the protection unit further comprises a delay module for reducing a rate of change of the current flowing through the first switching module such that the first switching module has sufficient time to change state.

The operation of the channel controller 100 is as follows: the sampling unit 110 acquires a current flowing through the object 140 to obtain an acquisition signal. When the object 140 is damaged or otherwise abnormally short-circuited during the test, the current flowing through the object suddenly rises, resulting in a sudden increase in the acquisition signal. After receiving the suddenly increased acquisition signal, the driving module 131 outputs a state change signal to the first switch module 132, and controls the first switch module 132 to change the working state. The first switch module 132 briefly changes from an on state to an off state. The processing unit 120 receives the output signal of the driving module in real time, and after receiving the state change signal, the processing unit 120 continuously outputs a first protection control signal to the driving module 131, and the switch module 132 controls the tested object 140 and the test circuit where the protection unit 130 is located to break according to the first protection control signal, so that the test channel is continuously closed, and the test of the tested object 140 in the channel is stopped.

The driving module is adopted to rapidly respond to the acquired signals, sampling actions such as signal conditioning and analog-to-digital conversion are not required to be carried out on the current flowing through the PTC product to be tested, and when the acquired signals are suddenly changed, the test channel is rapidly and temporarily closed, so that rapid protection is realized. Meanwhile, a processing unit is adopted to monitor the state change signal output by the driving module in real time, and once the state change signal is received, a first protection control signal is continuously sent to the driving module. When the driving module receives the first protection control signal, the driving module continuously outputs a state change signal to the first switch module, and continuously closes the test channel to realize continuous protection. The protection procedure described above is referred to as a first protection mode, or "hardware protection". Therefore, when the tested object of one channel is damaged or short-circuited due to other abnormalities, the channel can be quickly closed, and the testing of other channels is not affected. When the multiple channel controllers are adopted, the independent control of multiple different test channels is realized, so that the simultaneous test of multiple tested objects by one direct current power supply is realized.

The PTC product is described in detail below as a test object.

Fig. 2 is a partial circuit diagram of a channel controller. As shown in fig. 2, HV is connected to the positive electrode of the dc power supply. LJ1 and LJ2 are connected with the tested object. The sampling unit 110 includes a voltage sampling resistor R15 for converting an operation current flowing through the PTC product under test into a voltage signal. The sampling unit further comprises an acquisition module. The acquisition module comprises resistors R13 and R7 which are connected in series. The first input SD of the protection unit is connected between the resistors R13, R7. The resistors R13 and R7 are used for dividing voltages at two ends of the R15 to obtain acquisition signals, and the acquisition signals are input into the driving module IC3 through a first input end. The threshold value for triggering the protection unit to perform hardware protection is set by setting the resistance values of the resistors R13 and R7.

The protection unit includes a driving module IC3 and a first switching module Q1. The first switching module Q1 employs a high voltage transistor. The driving module IC3 employs a driving chip. The IC3 comprises a first input, a second input 2, a first output 6, and a second output 7. The first output terminal 6 is connected to the base of Q1. The second output 7 is connected to the base of Q1 via a resistor R14. IC3 receives the input signal of the sampling unit via a first input. The second control end 2 of the driving module IC3 is connected to the output of the processing unit, and is configured to receive the first protection control signal output by the processing unit. The base level of the Q1 is introduced to the input end of the processing unit IN, and the processing unit judges whether the Q1 is cut off or not by acquiring the base level of the Q1.

The withstand voltage test of the PTC product includes a rated withstand voltage test and a limit withstand voltage test. The conventional rated withstand voltage test method is to apply rated voltage to the tested PTC using a direct current power source and judge whether the tested PTC product is damaged by a current value within a prescribed time. The conventional extreme withstand voltage test method uses a direct current power supply to gradually increase the applied voltage to the tested PTC until the PTC is damaged, the appearance is mostly burst or short circuit, and the current is suddenly increased before burst.

Fig. 3a is a schematic diagram showing the occurrence of abrupt current change in the PTC product under test. The abscissa is time T, and the ordinate is current I flowing through the PTC product under test and voltage V applied to the PTC product under test. I is PTC steady-state working current, V is voltage applied to two ends of PTC, I2 is a first protection value triggering hardware protection, and I1 is a preset second protection value. When the tested PTC product reaches the limit withstand voltage value or other anomalies such as damage and the like to short circuit in the withstand voltage test process, the working current flowing through the tested PTC product rises suddenly and reaches I2 quickly, and hardware protection is triggered directly.

When the working current flowing through the tested PTC product has rising mutation, the acquisition signal received by the SD end also suddenly increases, the SD end inputs a '1 high level', and the first output end 6 of the trigger driving module IC3 is triggered to cut off Q1 due to the inhalation of the current. The first switching module Q1 is briefly turned off.

Meanwhile, the processing unit monitors the base level of the switch module Q1 in real time to judge whether the Q1 is turned off or not. When Q1 is turned off, the processing unit continuously outputs a low level to the second input terminal 2 of the driving unit IC3, i.e., the "K flag" terminal, so as to realize that the first output terminal OUTS6 of the driving unit IC3 continuously drives and sucks "to cause Q1 to be turned off, thereby realizing closing of the test channel. The "driving sink" means that the first output terminal OUTS6 of the driving unit IC3 is capable of receiving a sink current, thereby outputting a low level to the base of Q1.

Optionally, the protection unit further includes an inductor L1 connected in series with the PCT product under test in the test loop. The PCT product under test is connected to the collector C of the first switching module Q1 via an inductance L1. The inductor L1 is used for delaying the rising speed of the current flowing through the PCT product to be tested, so that the first switch module Q1 has enough time to change from the on state to the off state. By utilizing the characteristic that the current flowing through the inductor cannot be suddenly changed instantaneously, when the detected PTC breaks instantaneously, the time is striven for the cut-off action of the Q1. The actual measurement operation time was 1. Mu.s.

When the tested PTC reaches the limit withstand voltage value or the PTC breaks short circuit to cause current rising abrupt change, the corresponding line current will rise abrupt change. The current sampling voltage dividing resistor composed of R13 and R7 is used for transmitting signals to the SD pin of the driving chip, and the output is turned on and off by changing the level of the SD pin, so that the circuit loop of the high-voltage triode is driven to be turned off, and the purpose of turning off the voltage applied to the two ends of the PTC is achieved.

It can be appreciated that if the response speed of the first switch module Q1 is fast enough, the inductor L1 is not required.

In another embodiment, the protection unit further comprises a second protection mode, also called "software protection". When the voltage withstand test is performed on the tested PCT product, the current flowing through the tested PTC product is slowly increased and is not suddenly changed. As shown in fig. 3b, I is a PTC steady-state working current, V is a voltage applied across the PTC, I1 is a protection current value set by a user, I2 is a hardware threshold protection current, and when the PTC is damaged, the channel controller has enough time to respond, the response time is T2-T1, and a second protection mode of "software protection" is adopted.

The first protection mode operates in parallel with the second protection mode. The second protection mode needs to sample the current flowing through the tested PCT product to obtain a sampling value, so that the protection speed is slower than that of the first protection mode, and the method is suitable for the situation that the current changes slowly. The sampling includes range conversion, amplification and analog-to-digital conversion after the current is collected.

As shown in fig. 4, the processing unit is also connected to the sampling unit. The sampling unit also comprises a signal conditioning module which is used for performing range conversion and amplification on the current flowing through the tested object so that the processing unit performs analog-to-digital conversion to obtain the sampling value. As shown in fig. 5, the signal conditioning module includes a second acquisition module and an amplification module IC2A. The second acquisition module comprises sampling resistors R2 and R3, and the resistors R2 and R3 are connected in series and then connected to a first switch module Q1 emission set E for sampling the current flowing through the PTC to be tested. IC1 is an analog switch chip. The non-inverting input end of the amplifying module IC2A is connected between the resistors R2 and R3. And the signal acquisition module is used for receiving the signal acquired by the second acquisition module, and amplifying the signal after the signal is input from the non-inverting input end of the IC2A operational amplifier. The amplified signal enters a processing unit from the output end 1 of the IC2A operational amplifier to perform A/D conversion to obtain a sampling value of the current flowing through the tested PTC product.

The processing unit compares the sampled value with a first threshold value and when the sampled value is greater than the first threshold value, triggers a second protection mode, i.e. "software protection". The first threshold is a current threshold corresponding to triggering "software protection". The processing unit outputs a second protection control signal to the IN2 end of the driving module IC3, so that the first switch module Q1 is continuously turned off, and the channel where the protection unit is located is controlled to be closed. The continuous turn-off mode of the first switch module Q1 is the same as the first protection mode described above.

In another embodiment, the channel controller further comprises a protection control unit. The protection control unit is used for controlling the working state of the protection unit so as to control whether the protection function of the test channel where the protection unit is located is effective or not.

When the voltage withstand test is performed on the PCT, when the voltage is continuously given to the PTC resistor, the resistance value of the PTC resistor is reduced before and after the Curie temperature, and then the resistance value of the PTC resistor is rapidly increased, and the current flowing through the PTC resistor to be tested reaches the maximum at the Curie temperature. Fig. 6 shows the voltammetric characteristic of a PTC resistor, with the voltage applied to PCT on the abscissa and the current flowing through PTC on the ordinate. When the PCT resistor is powered on, the current increases rapidly with increasing applied voltage, and when the curie temperature is reached, the current reaches a maximum value. And the withstand voltage test includes a rated withstand voltage test and a limit withstand voltage test. The rated voltage and breakdown voltage of the PTC appear after the current reaches the maximum value, namely, the two tests are the test process after the PTC breaks through the Curie temperature, so when the PTC effect occurs and the current reaches the maximum value, the protection function is triggered by exceeding the threshold values of hardware protection and software protection, the test channel is closed, the test process is terminated without starting, and the situation of 'error protection' occurs.

And comparing the sampling value of the current flowing through the tested PTC product with a second threshold value by adopting a processing unit, and controlling the working state of the protection unit by adopting a protection control unit according to the comparison result. And judging whether the current flowing through the tested PTC reaches the maximum current corresponding to the Curie temperature or not by detecting the current change. When the sampling value is smaller than the second threshold value, the measured PTC does not reach the Curie temperature point, the current value reaches the maximum value Imax, the control protection unit is in a non-working state, and the protection function of the test channel is not effective. When the sampling value is greater than or equal to a second threshold value, the PTC to be tested is indicated to have passed the Curie temperature point and is in a pressure-resistant test stage, and the protection unit is in a working state at the moment, so that the protection function of the test channel is effective, and the problem of 'error protection' is solved.

As shown in fig. 7, the protection control unit 150 is connected to the processing unit 120 and the protection unit 130, and is configured to receive an enable signal, and control an operation state of the protection unit according to the enable signal. When the protection control unit does not receive the enable signal, the protection control unit 150 and the PTC product under test are in the same test loop, and the protection unit 130 is not connected to the loop. At this time, the protection unit 130 is not turned on because it is not connected to the test circuit, and does not operate. When the protection control unit 150 receives the enabling signal, the protection unit 130 is connected to the test loop, so that the protection unit is in an operating state. At this time, the protection unit 130 is electrically connected to the PTC product under test and is in the same test loop, thereby protecting the PTC product under test.

Optionally, the protection control unit 150 includes a second switch module, connected to the processing unit 120, for changing its state according to the enable signal, so as to control whether the protection unit is in an operating state. When the starting signal is not received, the second switch module is conducted, so that the protection control unit and the PTC product to be tested are in the same test loop; the protection unit is shorted or not gated and is in a non-working state. When receiving the enabling signal, the second switch module is disconnected to enable the protection control unit to be not operated, at the moment, the protection unit is gated and is in an operating state, and the protection unit and the tested PTC product are in the same test loop, so that the protection of the tested PTC product is realized.

Optionally, the protection control unit 150 includes a second switching member and a second switching controller. The second switch controller is respectively connected with the microcontroller and the second switch piece and is used for controlling the second switch piece to change the state of the second switch piece according to the enabling signal so as to control the protection unit to be in a working state.

As shown in fig. 8, the second switching module includes a high voltage relay and a second switching controller BG 2. J1A is the coil of the high-voltage relay, J1B is the coil of the high-voltage relayAnd a contact. At the beginning, the coil of the relay is attracted, and a loop is formed by the direct current power supply, the tested PTC and the protection control unit. The protection unit is not connected to the test loop, and the protection function is not effective. The processing unit samples the current flowing through the tested PTC in real time through the second acquisition module of the sampling unit to obtain a sampling value of the current. Comparing the sampled value with a second threshold value to determine whether the current flowing through the PTC reaches the maximum current I at Curie temperature _max . When the current flowing through the tested PTC product does not reach the maximum value, the tested PTC product does not reach the Curie temperature point, and the withstand voltage test stage is not reached, and the protection unit is not required to be started.

When the current flowing through the tested PTC product reaches the maximum value or reaches the maximum value, the tested PTC product is indicated to enter a withstand voltage test stage, and the protection unit needs to be started. The processing unit sends an enable signal to the protection control unit. The JEX terminal of the protection control unit receives the enable signal and is low. At this time, the second switching controller BG2 is turned off by the low base level, and the high-voltage relay coil is turned from the on state to the off state. The protection control unit is disconnected and the protection unit is connected to the test loop. At this time, the direct current power supply, the tested PTC and the protection unit form a loop, and the protection function is effective. The current flows through the tested PCT product from the positive pole HV of the direct current power supply, then passes through the inductor L1, the collector C of the first switch module Q1 and the emission set E of the first switch module Q1, and then forms a loop by dividing three branches. The first branch is a sampling resistor R15. The second branch is resistors R13 and R7. The third branch is resistors R2 and R3.

Optionally, the second threshold is a maximum current Imax at which the PTC product being measured is at curie temperature. The processing unit judges whether the current flowing through the tested PTC product reaches the maximum current or not to judge whether the tested PTC product needs to be started for protection or not. When the current of the tested PTC product reaches the maximum current, the tested PTC product is about to enter a withstand voltage test stage, a protection unit is started, the protection unit is connected into a test loop, and the protection function is effective.

Optionally, the second threshold is above 70% of the maximum current Imax, i.e. the second threshold is ≡70% Imax. Optionally, the second threshold is ≡80% imax. Optionally, the second threshold is ≡90% imax. The processing unit judges whether the current flowing through the tested PTC product reaches the second threshold value or not according to the number of times that the current reaches the second threshold value. When the current flowing through the tested PTC product reaches a second threshold value for the second time, the fact that the tested PTC product reaches the maximum current is known, the tested PTC product enters a withstand voltage test stage, a protection unit is started, the protection unit is connected into a test loop, and the protection function is effective.

The embodiment of the application also provides a channel control device for multi-channel test, as shown in fig. 9, including: at least two channel controllers, each of which is connected with a different object to be measured; each channel controller is used for independently controlling the test state of the tested object connected with the channel controller. Thereby realizing the simultaneous test of a plurality of tested objects. When a certain tested object is damaged or abnormal and short-circuited, the test channel where the object is positioned is quickly closed, and the test of other tested objects is not affected.

Another embodiment of the present application further provides a multi-channel testing device, as shown in fig. 9, specifically including: each test channel comprises the channel controller and a tested object connected with the channel controller; each channel controller is used for independently controlling whether the test channel is closed or not. The multi-channel test device further includes a test power supply. Alternatively, the multi-channel test device includes only one test power supply. Optionally, the test power supply is a direct current power supply. When the multichannel test is carried out, the aim of the multichannel synchronous test can be achieved by only adding a channel controller. By adopting the channel controller, the simultaneous test of a plurality of tested objects can be completed by only one power supply.

The embodiment of the application not only can realize quick protection, but also has the advantages that the provided channel controller is small in size and far smaller than the direct-current power supply, so that the occupied area of the whole testing equipment is small. The channel controller has low energy consumption, namely single-digit watt-level energy consumption, which is far lower than the energy consumption of the DC power supply added during one-to-one test. Has the advantages of small volume and low energy consumption.

The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The above examples merely represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the invention. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application is to be determined by the claims appended hereto.

Claims (10)

1. A channel controller for multi-channel testing, comprising: the device comprises a sampling unit, a processing unit and a protection unit; the sampling unit is connected with the protection unit; the processing unit is connected with the protection unit;

the sampling unit is used for collecting current flowing through the tested object and outputting a collection signal;

the protection unit comprises a driving module and a first switch module; the driving module is used for outputting a state change signal to the first switch module according to the acquisition signal;

the processing unit is used for outputting a first protection control signal to the protection unit according to the state change signal; the protection unit is used for closing the channel where the protection unit is located according to the first protection control signal.

2. The channel controller for multi-channel testing according to claim 1, wherein the drive module comprises a first input, a second input, and a first output; the first input end is connected with the sampling unit and is used for receiving the acquisition signal; the second input end is connected with the processing unit and is used for receiving a first protection control signal; the driving module is used for continuously outputting a closing signal to the first switch module according to the first protection control signal; and the first switch module continuously closes the channel where the protection unit is positioned according to the continuous closing signal.

3. The channel controller for multi-channel testing according to claim 1, wherein the protection unit further comprises a delay module for reducing a rising speed of a current flowing through the first switching module such that the first switching module changes state.

4. The channel controller for multi-channel testing according to claim 1, wherein the processing unit is further connected with the sampling unit; the processing unit is used for comparing the sampling value of the current flowing through the tested object with a first threshold value and outputting a second protection control signal to the protection unit according to the comparison result so as to control the channel where the protection unit is located to be closed.

5. The channel controller for multi-channel testing according to claim 4, wherein the sampling unit comprises a signal conditioning module; the signal conditioning module is used for performing range conversion and amplification on the current flowing through the tested object so that the processing unit can obtain the sampling value.

6. The channel controller for multi-channel testing according to claim 1, further comprising a protection control unit connected to the protection unit, the sampling unit and the processing unit, respectively; the protection control unit is used for receiving the acquisition signal and the starting signal of the processing unit so as to control the protection unit to enter a working state.

7. The channel controller for multi-channel testing according to claim 6, wherein the processing unit is further configured to compare the sampled value of the current flowing through the object under test with a second threshold value, and send an enable signal to the protection control unit according to the comparison result.

8. The channel controller for multi-channel testing according to claim 6, wherein the protection control unit comprises a second switch module, the second switch module is respectively connected with the protection unit and the processing unit, and the second switch module is used for changing the working state of the second switch module according to the enabling signal of the processing unit so as to control the protection unit to enter the working state.

9. A channel control device for multi-channel testing, comprising: at least two channel controllers according to any one of claims 1-8, each of said channel controllers being connected to a different object under test; each channel controller is used for independently controlling the test state of the tested object connected with the channel controller.

10. A multi-channel testing device, comprising: at least two test channels, each test channel comprising the channel controller of any one of claims 1-8, and a test power supply connected to the channel controller; each channel controller is used for independently controlling whether the test channel is closed or not.

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