CN210665954U

CN210665954U - Relay durability testing arrangement

Info

Publication number: CN210665954U
Application number: CN201920795980.7U
Authority: CN
Inventors: 李穷; 邵振东; 钱伟
Original assignee: Anhui Woboyuan Technology Co Ltd
Current assignee: Anhui Woboyuan Technology Co Ltd
Priority date: 2019-05-28
Filing date: 2019-05-28
Publication date: 2020-06-02
Anticipated expiration: 2029-05-28

Abstract

The utility model discloses a relay durability testing device, which comprises a plurality of relays, a first power supply, a second power supply, a MCU and a Hall sensor; each relay comprises a coil, a first contact and a second contact, and is provided with a pair of input ends connected with the coil and a pair of output ends connected with the first contact and the second contact, and a switch connected with a first power supply is further arranged at one input end of each relay; the first power supply connects the relays in parallel with the switch through the input end; the second power supply connects a plurality of relays and the Hall sensor in series to form an output loop through an output end; whether have electric current and pass to MCU with the result in the hall sensor response output return circuit, the break-make number of times of the break-make of every switch of MCU control and every switch of record compares with prior art, the utility model discloses an MCU comes the break-make of control switch and the break-make number of times of record switch to can test the durability of a plurality of relays in succession, effectively use manpower sparingly cost and effectively improve efficiency of software testing.

Description

Relay durability testing arrangement

[ technical field ] A method for producing a semiconductor device

The utility model relates to a relay field, specificly relate to a relay durability testing arrangement.

[ background of the invention ]

The relay is an electric control device, has an interactive relation between a control system (also called an input loop) and a controlled system (also called an output loop), is usually applied to an automatic control circuit, and is actually an 'automatic switch' for controlling the operation of large current by using small current, so that the relay plays roles of automatic regulation, safety protection, circuit switching and the like in the circuit. In the prior art, each relay needs to be subjected to a durability test to determine the service cycle of the relay so as to be beneficial to maintaining equipment using the relay, however, a manual test method is still adopted when the existing relay is subjected to the durability test, the test cycle is long, the efficiency is low, and the labor cost is high.

In view of the above, it is desirable to provide a novel relay durability testing apparatus to overcome the shortcomings of the prior art.

[ Utility model ] content

The utility model aims at providing a relay durability testing arrangement can carry out the durability test to a plurality of relays automatically.

In order to achieve the above object, the utility model provides a relay durability testing arrangement, including a plurality of relays, first power, second power, MCU and hall sensor; each relay comprises a coil, a first contact and a second contact, and is provided with a pair of input ends which are respectively connected with two ends of the coil and a pair of output ends which are respectively connected with the first contact and the second contact, and a switch connected with a first power supply is further arranged at one input end of each relay; the first power supply connects the relays in parallel with the switches through the input end of each relay, so that each relay forms an input loop with the first power supply through the corresponding pair of input ends and the switches; the second power supply connects a plurality of relays and the Hall sensor in series to form an output loop through the output end of the relay; the Hall sensor is used for sensing whether current exists in the output loop and transmitting the result to the MCU, and the MCU is also electrically connected with each switch and used for controlling the on-off of each switch and recording the on-off times of each switch.

As an improvement of the relay durability testing device of the utility model, the first power supply is a 0-32V DC power supply, and the second power supply is a 50-700V DC power supply.

As an improvement of the relay durability testing apparatus of the present invention, the second power source connects a plurality of relays in series with the hall sensor through a power wire having an impedance.

As an improvement of the relay durability testing device of the present invention, the switch is a MOS transistor.

As the utility model discloses a relay durability testing arrangement's improvement, every switch of MCU control carries out the break-make according to certain frequency.

As the utility model discloses a relay durability testing arrangement's improvement, the switch continuous cycle break-make of a plurality of relays of MCU control.

As the utility model discloses relay durability testing arrangement's an improvement still includes a human-computer interaction's display screen, and this display screen links to each other with MCU.

Compared with the prior art, the utility model provides a relay durability testing arrangement's beneficial effect lies in: the on-off of the switch and the on-off times of the record switch are controlled through the MCU, the durability of the relays can be tested continuously, the labor cost is effectively saved, and the testing efficiency is effectively improved.

[ description of the drawings ]

Fig. 1 is a schematic structural diagram of a relay durability testing apparatus provided by the present invention;

fig. 2 is a schematic block diagram of the relay durability test apparatus shown in fig. 1.

[ detailed description ] embodiments

In order to make the objects, technical solutions and advantageous technical effects of the present invention more clearly understood, the present invention is further described in detail with reference to the accompanying drawings and the following detailed description. It should be understood that the detailed description and specific examples, while indicating the present invention, are given by way of illustration only and not by way of limitation.

The utility model provides a relay durability testing arrangement 100, can be automatic carry out the durability test to a plurality of relays 10.

Referring to fig. 1, in an embodiment of the present invention, a relay durability testing apparatus 100 includes a plurality of relays 10, a first power source 20, a second power source 30, an MCU (micro controller Unit) 40 and a hall sensor 50.

Each relay 10 includes a coil 101, a first contact 102 and a second contact 103, and has a pair of input terminals 1011 connected to both ends of the coil 101, respectively, and a pair of output terminals 1021 connected to the first contact 102 and the second contact 103, respectively, and each relay 10 further has a switch 104 connected to the first power supply 20 at one input terminal 1011. The first power supply 20 is a 0-32V dc power supply and connects a plurality of relays 10 in parallel through the input terminals 1011 and the switches 104 of the relays 10, so that each relay 10 forms an input loop with the first power supply 20 through a corresponding pair of input terminals 1011 and the switch 104, the first power supply 20 is used for supplying power to the coil 101 of the relay 10 to conduct the corresponding first contact 102 and the second contact 103, that is, the switch 104 of each relay 10 is closed to electrify the coil 101 and generate a magnetic field for attracting the corresponding first contact 102 and the second contact 103, so as to conduct the corresponding first contact 102 and the second contact 103. The second power supply 30 is a 50-700V direct current power supply and connects the relays 10 and the hall sensors 50 in series through the output ends 1021 of the relays 10 to form an output loop, the relays 10 and the hall sensors 50 are connected in series through power conducting wires with impedances by the second power supply 30 to simulate an output loop on-load test, the hall sensors 50 are used for sensing whether current exists in the output loop and transmitting the result to the MCU 40, and the MCU 40 is also electrically connected with each switch 104 and controls the on-off of each switch 104 and records the on-off times of each switch 104.

It should be understood that when the hall sensor 50 senses a current in the output circuit, the first contact 102 and the second contact 103 of each relay 10 are in a conductive state, i.e., the switch 104 of each relay 10 is in a closed state, when the switch 104 of any one relay 10 is opened, the output loop is opened, and the hall sensor 50 cannot sense the current in the output loop, so that after the switch 104 of one of the relays 10 is continuously turned on and off by the MCU 40 until the relay 10 has a sticking fault (i.e. the corresponding first contact 102 is still conducted with the second contact 103 when the coil 101 of the relay 10 is not energized), and simultaneously, the MCU 40 records the on-off times of the switch 104 to obtain the durability parameters of the relay 10, further, the relay durability test apparatus 100 according to the present embodiment can automatically perform durability tests on a plurality of relays.

Further, in some embodiments, the MCU 40 may control the switch 104 of each relay 10 to be turned on and off according to a certain frequency, that is, the time interval between two consecutive on and off of each switch 104 may be set by the MCU 40 as required to obtain the corresponding endurance performance parameter of the relay 10, so as to test the endurance of the relay 10 more comprehensively. Preferably, switch 104 is a MOS transistor to facilitate control by MCU 40. In this embodiment, the gate of the MOS transistor is connected to the MCU 40, the source of the MOS transistor is connected to the positive electrode of the first power supply 20, and the drain of the MOS transistor is connected to the negative electrode of the first power supply 20 through the pair of input terminals 1011 of the corresponding relay 10.

Referring to fig. 2, further, in an embodiment, the MCU 40 of the relay durability test apparatus 100 controls the switches 104 of the relays 10 to be continuously cycled on and off to simultaneously perform the durability test on each relay 10, that is, the MCU 40 controls the switches 104 of each relay 10 to be turned on and off once in each cycle.

Specifically, firstly, the MCU 40 controls the switch 104 of each relay 10 to be closed, then the MCU 40 opens the switch of the first relay 10, if the hall sensor 50 cannot sense the current in the output loop, the MCU 40 accumulates the on/off times of the first relay 10, and then closes the switch 104 of the first relay 10 in a delayed manner, if the hall sensor 50 senses the current in the output loop, the MCU 40 determines that the first relay 10 has an adhesion fault and opens the switch of the second relay 10 after the delay to skip the test of the first relay 10, similarly, the hall sensor 50 determines whether the second relay 10 has a fault to accumulate the on/off times of the second relay 10 or skip the test of the second relay 10, and so on until the nth relay 10 (i.e. the last relay 10) completes one cycle on/off, and finally, continuously repeating the above circulation on-off until each relay 10 breaks down, and counting the on-off times required by each relay 10 when each relay 10 breaks down by the MCU 40 and completing the durability test.

Further, in a more specific embodiment, the relay durability test apparatus 100 further includes a human-computer interaction display screen 60, the display screen 60 is connected to the MCU 40 to operate the relay durability test apparatus 100, for example, the display screen 60 may set the frequency of the on/off switch 104 of the MCU 40, and the display screen 60 may also display the test status of each relay 10 (i.e., the number of times the switch 104 corresponding to the relay 10 is turned on/off, whether the relay 10 is faulty, and the number of times the relay 10 is faulty).

The utility model discloses a relay durability testing arrangement 100 comes the break-make of control switch 104 and the break-make number of times of record switch 104 through MCU 40 to can test the durability of a plurality of relays 10 in succession, effectively use manpower sparingly and effectively improve efficiency of software testing.

The invention is not limited solely to that described in the specification and the embodiments, and additional advantages and modifications will readily occur to those skilled in the art, and it is not intended to be limited to the specific details, representative apparatus, and illustrative examples shown and described herein, without departing from the spirit and scope of the general concept as defined by the appended claims and their equivalents.

Claims

1. A relay durability test device is characterized in that: the device comprises a plurality of relays, a first power supply, a second power supply, an MCU and a Hall sensor; each relay comprises a coil, a first contact and a second contact, and is provided with a pair of input ends which are respectively connected with two ends of the coil and a pair of output ends which are respectively connected with the first contact and the second contact, and a switch connected with a first power supply is further arranged at one input end of each relay; the first power supply connects the relays in parallel with the switches through the input end of each relay, so that each relay forms an input loop with the first power supply through the corresponding pair of input ends and the switches; the second power supply connects a plurality of relays and the Hall sensor in series to form an output loop through the output end of the relay; the Hall sensor is used for sensing whether current exists in the output loop and transmitting the result to the MCU, and the MCU is also electrically connected with each switch and used for controlling the on-off of each switch and recording the on-off times of each switch.

2. The relay durability test apparatus according to claim 1, characterized in that: the first power supply is a 0-32V direct current power supply, and the second power supply is a 50-700V direct current power supply.

3. The relay durability test apparatus according to claim 1, characterized in that: the second power supply connects a plurality of relays in series with the Hall sensors through power wires with impedances.

4. The relay durability test apparatus according to claim 1, characterized in that: the switch is an MOS tube.

5. The relay durability test apparatus according to claim 1, characterized in that: and the MCU controls each switch to be switched on and off according to a certain frequency.

6. The relay durability test apparatus according to claim 1, characterized in that: and the MCU controls the switches of the relays to be continuously and circularly switched on and off.

7. The relay durability test apparatus according to claim 1, characterized in that: the system also comprises a human-computer interaction display screen, and the display screen is connected with the MCU.