CN116338286A - Dark current detection circuit and dark current detection method for optical device - Google Patents
Dark current detection circuit and dark current detection method for optical device Download PDFInfo
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Abstract
The application discloses a dark current detection circuit and a dark current detection method of an optical device. A dark current detection circuit of an optical device, comprising: the device comprises a test circuit board, a sampling module, a regulation and control module and a control module, wherein the sampling module is in signal connection with the regulation and control module and is used for converting a current signal generated by an optical device to be tested into an analog voltage signal by adopting any first gain coefficient; the regulation and control module is in signal connection with the control module and is used for converting the analog voltage signal into a digital voltage signal; the control module is in signal connection with the sampling module and is used for converting the digital voltage signal and the first gain coefficient into the magnitude of dark current of the optical device to be tested; the control module adjusts the first gain coefficient of the sampling module according to the measured dark current. The dark current detection circuit and the dark current detection method for the optical device have the advantages that the dark current detection circuit and the dark current detection method for the optical device with corresponding measuring ranges can be provided according to the magnitude of dark current.
Description
Technical Field
The application relates to the technical field of optical devices, in particular to a dark current detection circuit and a dark current detection method of an optical device.
Background
Various types of photo sensors (e.g., APD, PD, and photosensitive coupling element) may generate weak current inside the photocell due to factors such as thermionic emission and leakage of the photocell tube under the action of an applied voltage without receiving any light due to unpredictable process problems or special structure of the device itself during the manufacturing process, i.e., dark current of the photocell. The detection of dark current is an indispensable content in the test of the light-sensitive device, and by detecting the dark current, whether the diode element breaks down or whether the wafer process has a problem can be judged.
However, the detection of dark current is difficult, and the magnitude of dark current is usually in the nA level. The current multimeter can only meet the current measurement of mA level, and has great error for the current measurement of uA level, but can not measure at all for the current of nA level.
For the detection of dark currents, measurements are generally made using special dark current detection devices. However, the process is not limited to the above-mentioned process,
the existing dark current detection devices are high in price, the measuring ranges of many dark current detection devices are fixed, the measuring ranges of some dark current detection devices are 0-10 nA, and the detecting ranges of some dark current detection devices are 0-100 nA. The larger the measuring range is, the lower the numerical accuracy is, for example, the actual dark current generated by a certain optical device is 11.123nA, the dark current detection equipment with the measuring range of 0.01-10 nA is adopted, and the magnitude of the detected dark current is 11.12nA; if dark current detection equipment with a range of 1-100 nA is adopted, the dark current is detected to be 11nA. However, the current dark current detection device has a fixed measurement range, so the measurement accuracy is limited.
In summary, there is a lack of a dark current detection circuit and a dark current detection method for providing a light device with a corresponding range according to the magnitude of the dark current.
Disclosure of Invention
The content of the present application is intended to introduce concepts in a simplified form that are further described below in the detailed description. The section of this application is not intended to identify key features or essential features of the claimed subject matter, nor is it intended to be used to limit the scope of the claimed subject matter.
As a first aspect in the present application, in order to solve a technical problem that an existing dark current detection apparatus has a fixed range, resulting in low measurement accuracy, some embodiments of the present application provide a dark current detection circuit of an optical device, including: the device comprises a test circuit board, a sampling module, a regulation and control module and a control module;
the test circuit board is in signal connection with the sampling module and provides a test environment for the optical device to be tested;
the sampling module is in signal connection with the regulation and control module and is used for converting a current signal generated by the optical device to be tested into an analog voltage signal by adopting a first gain coefficient;
the regulation and control module is in signal connection with the control module and is used for converting the analog voltage signal into a digital voltage signal by adopting a second gain coefficient;
the control module is in signal connection with the sampling module and is used for calculating the dark current of the optical device to be tested according to the first gain coefficient and the second gain coefficient by the digital voltage signal;
the control module adjusts the first gain coefficient of the sampling module according to the measured dark current so as to adjust the measurement range of the dark current.
According to the scheme, the test circuit board provides a test environment, after the working voltage is applied to the optical device, the optical device can generate dark current, and then the dark current is detected, so that the property of the optical device in the dark current aspect can be known. The sampling module can receive dark current generated by the optical device and convert the dark current into an analog voltage signal under the gain of the first gain coefficient. The regulation and control module can convert the analog voltage signal into a digital voltage signal and then send the digital voltage signal to the control module. The control module can calculate the magnitude of dark current according to the magnitude of the received digital voltage, the first gain coefficient and the second gain coefficient, and then control the magnitude of the first gain coefficient according to the current measuring range and the measured dark current magnitude relation, so as to change the measuring range, thereby being capable of adapting to the measurement of different dark current magnitudes. So, in this scheme, control module is according to the magnitude of the dark current that obtains of calculation, the magnitude of continuous control first gain factor to can play the effect of feedback regulation, thereby through the mode of adjusting first gain factor magnitude, adjust the minimum electric current that control module can discern, and then guarantee to obtain best measurement accuracy.
Further, the sampling module comprises a transimpedance amplifier, a fixed gain circuit and a plurality of gear gain circuits; the fixed gain circuit and the gear gain circuit are connected in parallel with the input end and the output end of the transimpedance amplifier; any gain circuit is conducted and connected with the fixed gain circuit in parallel to form a gain resistor of the transimpedance amplifier.
There are many ways to convert the current signal into the voltage signal, but when the voltage signal is sampled and collected, a large error is easily generated due to the internal resistance of the sampling device, and the dark current is very small, so if the sampling and collection are affected by the resistance, the measurement error is larger, and even the information of the dark current cannot be obtained. Therefore, in the scheme, the transimpedance amplifier is used for converting the current signal into the voltage information, and the transimpedance amplifier is used for converting the current signal into the voltage information in an impedance feedback mode, so that the influence of the internal resistance on the current signal when the current signal is acquired can be avoided. Further, when applied to a current of nA level such as a dark current, there is sufficient measurement accuracy. The magnitude of the first gain coefficient can be controlled by controlling the magnitude of the gain resistor, and then the first gain coefficient is adjusted; thus, the gain resistor is adjusted, the measurement range of dark current can be controlled, and the requirements of different precision can be met.
Further, the fixed gain circuit comprises a fixed gain resistor and a fixed gain capacitor, the fixed gain resistor and the fixed gain capacitor are connected in parallel, and the fixed gain resistor is connected in parallel with the input end and the output end of the transimpedance amplifier.
The fixed gain circuit forms the most basic gain resistor of the transimpedance amplifier and can provide the most basic amplification gain coefficient for the sampling module.
Further, the gear gain circuit comprises a gear gain resistor, a gear gain capacitor and a relay; the gear gain resistor is connected with the relay in series, the gear gain capacitor is connected with the gear gain resistor in parallel, and the gear gain resistor is connected with the relay in parallel at the input end and the output end of the mutual inductance amplifier; the control module controls the relay of the gear gain circuit to be closed and opened so as to adjust the first gain coefficient of the sampling module.
The fixed gain circuit can provide a fixed gain coefficient, and the control module only needs to control the closing of the relay of the gear gain circuit, so that the fixed gain circuit and different gear gain circuits are connected in parallel, different gain resistors can be obtained, and the first gain coefficient is adjusted.
Further, according to the dark current of different optical devices to be tested, a plurality of first gain coefficients and 1 second gain coefficient matched with the first gain coefficients are set.
Further, the circuit also comprises an amplitude limiting protection circuit, wherein the amplitude limiting protection circuit is arranged between the sampling module and the test circuit board, the input end of the amplitude limiting protection circuit is connected with the output end of the test circuit board, and the output end of the amplitude limiting protection circuit is connected with the input end of the sampling module.
The limiting protection circuit can protect the sampling module, so that the light device to be tested is prevented from generating relatively large working current due to certain reasons, and the fact that the current input into the sampling module is too large due to the large current is avoided, and the sampling module is damaged.
Further, the voltage regulation and control device also comprises an RC filter circuit, wherein the RC filter circuit is arranged between the regulation and control module and is used for filtering the voltage signal output by the regulation and control module.
The RC filter circuit can filter the digital voltage signal generated by the control module, and filter alternating current components in the circuit, so that direct current voltage is directly input to the control unit, noise is restrained, the control module can receive clearer digital voltage signals, and the second voltage information is prevented from being influenced by the noise of the alternating current components.
As a second aspect of the present application, in order to solve the technical problem of low measurement accuracy caused by the fixed range of the dark current detection method, a dark current detection method is provided, which includes the following steps:
step 1: the method comprises the steps that an optical device to be tested is mounted on a test circuit board, the test circuit board applies working voltage to the optical device to be tested, and dark current generated by the optical device to be tested is output to a sampling module;
step 2: the sampling module receives dark current generated by the optical device to be tested, converts the dark current into an analog voltage signal by adopting a first gain coefficient, and then sends the analog voltage signal to the regulation and control module;
step 3: the regulation and control module converts the analog voltage signal into a digital voltage signal by a second gain coefficient and then sends the digital voltage signal to the control module;
step 4: the control module calculates the magnitude of dark current according to the first gain coefficient, the second gain coefficient and the digital voltage signal;
step 5: the control module adjusts a first gain coefficient of the sampling module according to the measured dark current.
According to the method and the device, the relation between the magnitude of the dark current and the current measuring range of the device is calculated through the first gain coefficient and the second gain coefficient, the magnitude of the first gain coefficient is fed back and adjusted, the current measuring range is changed, the measuring range and the magnitude of the dark current are mutually adapted, and the accuracy of dark current measurement is guaranteed; and the control module performs feedback adjustment according to the magnitude of the dark current obtained by calculation, so that the measurement accuracy is ensured, and meanwhile, the device has high test efficiency and does not need to manually adjust the measuring range.
Further, in step 5, the first gain factor is adjusted according to the measured dark current and the measurement range of the control module under the current first gain factor selection, so that the measured dark current is located in the middle region of the measurement range of the control module
The magnitude of the dark current is controlled in the middle area of the measuring range of the control module, and the magnitude of the digital voltage signal is indicated to be in the middle area of the receiving end of the control module, so that the control module has enough precision when identifying the digital voltage signal, and the situation that the dark current is calculated in a large error after the first gain coefficient and the second gain coefficient are amplified because the identification precision is too low when the control module identifies the digital voltage signal is avoided.
In the process of adjusting the measuring range, the first gain coefficient and the second gain coefficient can both influence the measuring range, and if two measuring ranges are adjusted simultaneously, on one hand, two adjusting circuits are required to be arranged, so that the cost is high, and on the other hand, under the condition that the two gain coefficients can be adjusted, the signal can be easily amplified particularly greatly, and the stability of the circuit is influenced. For this purpose, the present application provides the following scheme:
and setting a plurality of first gain coefficients and 1 second gain coefficient corresponding to the first gain coefficients according to intervals of dark currents generated by different optical devices to be tested.
In the scheme provided by the application, a plurality of first gain coefficients and second gain coefficients corresponding to the first gain coefficients are preconfigured according to the possibly generated dark current of the optical device, so that the second gain coefficients can adapt to dark current measurement of different optical devices without changing.
To sum up: the application provides a dark current detection circuit and a dark current detection method of an optical device capable of providing corresponding measuring ranges according to the magnitude of dark current.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, are included to provide a further understanding of the application and to provide a further understanding of the application with regard to the other features, objects and advantages of the application. The drawings of the illustrative embodiments of the present application and their descriptions are for the purpose of illustrating the present application and are not to be construed as unduly limiting the present application.
In addition, the same or similar reference numerals denote the same or similar elements throughout the drawings. It should be understood that the figures are schematic and that elements and components are not necessarily drawn to scale.
In the drawings:
fig. 1 is a schematic diagram of a dark current detection circuit.
Fig. 2 is a circuit diagram of a test circuit board loaded with an optical device under test.
Fig. 3 is a circuit diagram of a dark current detection circuit.
Fig. 4 is a flowchart of a dark current detection method.
Description of the embodiments
Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While certain embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete. It should be understood that the drawings and embodiments of the present disclosure are for illustration purposes only and are not intended to limit the scope of the present disclosure.
It should be noted that, for convenience of description, only the portions related to the present invention are shown in the drawings. Embodiments of the present disclosure and features of embodiments may be combined with each other without conflict.
The present disclosure will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.
Referring to fig. 1, a dark current detection circuit of an optical device includes a test circuit board, a sampling module, a regulation module, and a control module. The test circuit board is in signal connection with the sampling module, the sampling module is in signal connection with the regulating module, and the sampling module and the regulating module are in signal connection with the control module.
Referring to FIG. 2, R in the figure PD I is the optical device to be tested dark And generating dark current for the optical device to be tested.
The test circuit board is used for loading the optical device to be tested and applying working voltage for generating dark current to the optical device to be tested.
The voltage applied to the light device by the test circuit board is generally the rated voltage of the light device, so that the magnitude of dark current which can be generated by the light device under the rated voltage can be measured.
The sampling module is used for receiving the generated current signal of the optical device to be tested and converting the current signal into an analog voltage signal by adopting a first gain coefficient.
Because the dark current generated by the optical device to be tested is very small, a certain gain is needed to be adopted when the dark current is converted into voltage, so that the tiny current is converted into a readable voltage signal.
The regulation and control module is used for collecting the voltage signals output by the sampling module and converting the analog voltage signals into digital voltage signals by adopting a second gain coefficient.
The voltage signal output by the sampling module is generally an analog voltage signal, so that conversion is required, and the pin of the control module for receiving the voltage signal is a fixed range, so that the regulation module is required to regulate the first voltage to a value which accords with the range of the voltage signal received by the control module.
The control module is in signal connection with the sampling module and is used for converting the digital voltage signal into the magnitude of dark current of the optical device to be tested according to the first gain coefficient and the second gain coefficient;
the control module adjusts the first gain coefficient of the sampling module according to the measured dark current so as to regulate and control the measurement range of the control module.
Referring to fig. 3, where U1 is a transimpedance amplifier.
The adopted module comprises a mutual resistance amplifier, a fixed gain circuit and a gear gain circuit; the fixed gain circuit and the gear gain circuit are connected in parallel with the input end and the output end of the transimpedance amplifier; any gain circuit is conducted and connected with the fixed gain circuit in parallel to form a gain resistor of the transimpedance amplifier.
The fixed gain circuit comprises a fixed gain resistor and a fixed gain capacitor connected with the fixed gain resistor in parallel; the gear gain circuit comprises a gear gain resistor, a gear gain capacitor connected with the gear gain resistor in parallel, and a relay connected with the gain resistor in series, wherein the relay is connected with the control module in a signal manner; the control module controls the relay of the gain circuit of different gears to be closed so as to control the gain multiple of the sampling module.
R for fixed gain resistor 0 R for indicating gear gain resistance 1 、R 2 、…、R k …, R is k Representing the gear gain resistance in the kth gear gain circuit. Each gear in a plurality of gear gain circuitsThe resistance values of the gain resistors are different, and the first gain coefficient Arf of the sampling module K =(Ro+R k )/(Ro*R k ) The voltage output by the sampling module is U, U=I dark *Arf K， Wherein I is dark Dark current generated for the light device.
Specifically, referring to fig. 3, in the case where the gear gain circuit has 1, the gear gain circuit, the transimpedance amplifier, and the fixed gain branch are briefly described.
The input end of the transimpedance amplifier is connected to the test circuit board, the dark current generated by the optical device to be tested on the test circuit board flows into the input end of the transimpedance amplifier, the output end of the transimpedance amplifier is connected to the input end of the regulation module, and the analog voltage signal generated by the transimpedance amplifier is input to the regulation module. Fixed gain resistor R 0 The fixed gain capacitor is connected in parallel with the gain resistor R 0 Such that the fixed gain circuit forms a fixed gain resistor of the transimpedance amplifier. Gear gain capacitor and gear gain resistor R 1 Parallel connection, gear gain resistor R 1 One end of the relay is connected to the input end of the transimpedance amplifier, and the other end of the relay is connected to the output end of the transimpedance amplifier. Thus, when the control module controls the relay to be closed, the first gain factor arf= (ro+r) 1 )/(Ro*R 1 )。
The sampling module adopts the principle of a transimpedance amplifier, and when dark current is converted into voltage, the influence of internal resistance on current measurement when a current signal is measured is avoided.
Referring to fig. 3, U2 is a signal amplifier.
The regulation and control module comprises a signal amplifier and a feedback circuit; the input end of the signal amplifier is connected with the output end of the transimpedance amplifier, and the feedback circuit is connected in parallel with the input end and the output end of the signal amplifier. The signal amplifier is capable of converting an analog voltage signal into a digital voltage signal.
In the testing process, if the photophobicity of the optical device to be tested is not good, the optical device to be tested can generate large working currents, and after the working currents flow into the sampling module and are amplified by the sampling module, the control module and the control module are easy to be adversely affected, that is, the control module and the control module are easy to break down due to overload, so that in some embodiments: the dark current detection circuit further comprises an amplitude limiting protection circuit, the amplitude limiting protection circuit is arranged between the sampling module and the test circuit board, the input end of the amplitude limiting protection circuit is connected with the output end of the test circuit board, and the output end of the amplitude limiting protection circuit is connected with the input end of the sampling module.
The amplitude limiting protection circuit can limit the magnitude of a current signal input to the sampling module, and avoid the generation of too large current of an optical device to be tested on the test circuit board under illumination to burn out the sampling module, the regulation and control module or the control module.
Further, according to the dark current of different optical devices to be tested, a plurality of first gain coefficients and 1 second gain coefficient matched with the first gain coefficients are set
The digital signal is input to the control module, however, the signal generated by the regulation module has a certain alternating current component, so that the control module is easily influenced by the alternating current signal when calculating the magnitude of the dark current.
For this purpose, the dark current detection circuit of the optical device further comprises an RC filter circuit, wherein the RC filter circuit is arranged between the regulation module and the control module and is used for filtering noise related to the alternating current part in the output signal of the regulation module.
Referring to fig. 4, some embodiments of the present application further provide a method for detecting dark current, including the following steps:
step 1: and mounting the optical device to be tested on a test circuit board, applying working voltage to the optical device to be tested by the test circuit board, and sending dark current generated by the optical device to be tested to the sampling module.
In step 1, the circuit input from the test circuit board to the sampling module is required to pass through the limiting amplifier.
The limiting amplifier is capable of controlling the magnitude of the current into the sampling module.
Step 2: the sampling module receives dark current generated by the optical device to be tested, converts the dark current into an analog voltage signal by adopting a first gain coefficient, and then sends the analog voltage signal to the regulation and control module.
Step 3: the regulation and control module converts the analog voltage signal into a digital voltage signal by a second gain coefficient and then sends the digital voltage signal to the control module.
In step 3: the digital voltage signal output by the regulation and control module passes through the RC filter circuit and then is input to the control module.
Step 4: the control module calculates the magnitude of the dark current according to the first gain coefficient, the second gain coefficient and the digital voltage signal.
Step 5: the control module adjusts a first gain coefficient of the sampling module according to the measured dark current.
For example, the voltage range that can be received by the receiving end of the control module receiving the digital voltage signal is assumed to be 0-3.3 v, and the minimum voltage that can be read by the control module is 0.01v, so that the control module can have 330 effective identification numbers. 0v, 0.01v, 0.02v … 3.3.3 v, respectively. The second gain factor is a fixed factor and is 10 times the second gain factor. Therefore, the range of the analog voltage which can be read by the control module is 0-33V, and the minimum analog voltage which can be identified is 0.1V.
If the first gain factor is 10000 times, the current with the measuring range of 0 to 330nA, that is, 330nA, can be converted into 33v analog voltage after being amplified by the first gain factor, so that the control module can effectively recognize that the dark current is 1nA. Therefore, the actual measurement range is 1 to 330nA.
Accordingly, if the first gain factor is changed to 1000 times, that is, if the current of 3300nA is amplified by the first gain factor, it can be converted into an analog voltage of 33v, so that the dark current that can be recognized by the control module is 10nA. Therefore, the actual measurement range is 10 to 3300nA.
By combining the analysis, the logic relationship of the application when the measuring range is changed can be obtained as follows: if the first gain coefficient is 10000 times, the measurement range is 1-330 nA, and the dark current measured at this time is 20nA. It is apparent that the range is too large at this time. Then, the first gain factor is adjusted to 100000 times, and then the measurement range is adjusted to 0.1-33 nA, and the dark current is measured again at this time, so that the dark current can be accurate to decimal, namely 20.0nA can be measured.
The above is the modification logic of the first gain factor.
In step 5, the control module sends a closing instruction to the relays in the corresponding gear adjusting circuits according to the measured dark current, and sends an opening instruction to the relays in the other gear adjusting circuits.
Further, according to the intervals of dark currents generated by different optical devices to be tested, a plurality of first gain coefficients and 1 second gain coefficient corresponding to the plurality of first gain coefficients are set. For example, a certain factory mainly produces 3 types of optical devices, and the dark current intervals of the three types of optical devices are approximately 100nA,10nA and 1nA, so that the dark current detection equipment of the engineering needs to be configured with at least 3 measuring ranges, and the magnitude of the second gain coefficient is reversely deduced according to the 3 measuring ranges, and then the magnitude of each first gain coefficient is reversely deduced, so that the effect of regulating and controlling reasonable measuring ranges can be achieved by only regulating the first gain coefficients.
The foregoing description is only of the preferred embodiments of the present disclosure and description of the principles of the technology being employed. It will be appreciated by those skilled in the art that the scope of the invention in the embodiments of the present disclosure is not limited to the specific combination of the above technical features, but encompasses other technical features formed by any combination of the above technical features or their equivalents without departing from the spirit of the invention. Such as the above-described features, are mutually substituted with (but not limited to) the features having similar functions disclosed in the embodiments of the present disclosure.
Claims (10)
1. A dark current detection circuit for an optical device, comprising: the test circuit board, the sampling module, the regulation and control module,
the test circuit board is in signal connection with the sampling module and provides a test environment for the optical device to be tested;
the sampling module is in signal connection with the regulation and control module and is used for converting dark current generated by the optical device to be tested into an analog voltage signal by adopting a first gain coefficient;
the regulation and control module is in signal connection with the control module and is used for converting the analog voltage signal into a digital voltage signal by adopting a second gain coefficient;
the control module is in signal connection with the sampling module and is used for calculating the dark current of the optical device to be tested according to the first gain coefficient and the second gain coefficient by the digital voltage signal;
the control module adjusts the first gain coefficient of the sampling module according to the measured dark current so as to regulate and control the measurement range of the control module.
2. The dark current detection circuit of an optical device according to claim 1, wherein: the sampling module comprises a mutual resistance amplifier, a fixed gain circuit and a plurality of gear gain circuits;
the fixed gain circuit and the gear gain circuit are connected in parallel with the input end and the output end of the transimpedance amplifier; any gain circuit is conducted and connected with the fixed gain circuit in parallel to form a gain resistor of the transimpedance amplifier.
3. The dark current detection circuit of an optical device according to claim 2, wherein: the fixed gain circuit comprises a fixed gain resistor and a fixed gain capacitor, the fixed gain resistor and the fixed gain capacitor are connected in parallel, and the fixed gain resistor is connected in parallel with the input end and the output end of the transimpedance amplifier.
4. A dark current detection circuit for an optical device according to claim 3, wherein: the gear gain circuit comprises a gear gain resistor, a gear gain capacitor and a relay;
the gear gain resistor is connected with the relay in series, the gear gain capacitor is connected with the gear gain resistor in parallel, and the gear gain resistor is connected with the relay in parallel at the input end and the output end of the mutual inductance amplifier; the control module controls the relay of the gear gain circuit to be closed and opened so as to adjust the first gain coefficient of the sampling module.
5. A dark current detection circuit for an optical device according to claim 3, wherein: according to the dark current of different optical devices to be tested, a plurality of first gain coefficients and 1 second gain coefficient matched with the first gain coefficients are set.
6. The dark current detection circuit of an optical device according to claim 1, wherein: the circuit also comprises an amplitude limiting protection circuit, wherein the amplitude limiting protection circuit is arranged between the sampling module and the test circuit board, the input end of the amplitude limiting protection circuit is connected with the output end of the test circuit board, and the output end of the amplitude limiting protection circuit is connected with the input end of the sampling module.
7. The dark current detection circuit of an optical device according to claim 1, wherein: the RC filter circuit is arranged between the regulation and control module and is used for filtering the voltage signal output by the regulation and control module.
8. A dark current detection method, characterized by a dark current detection circuit for an optical device according to any one of claims 1 to 7: the method comprises the following steps:
step 1: the method comprises the steps that an optical device to be tested is mounted on a test circuit board, the test circuit board applies working voltage to the optical device to be tested, and dark current generated by the optical device to be tested is sent to a sampling module;
step 2: the sampling module receives dark current generated by the optical device to be tested, converts the dark current into an analog voltage signal by adopting a first gain coefficient, and then outputs the analog voltage signal to the regulation and control module;
step 3: the regulation and control module converts the analog voltage signal into a digital voltage signal by a second gain coefficient and then sends the digital voltage signal to the control module;
step 4: the control module calculates the magnitude of dark current according to the first gain coefficient, the second gain coefficient and the digital voltage signal;
step 5: the control module adjusts a first gain coefficient of the sampling module according to the measured dark current.
9. The dark current detection method according to claim 8, characterized in that: in step 5, the first gain factor is adjusted according to the measured magnitude of the dark current and the measuring range of the control module under the condition of selecting the current first gain factor, so that the measured magnitude of the dark current is located in the middle area of the measuring range of the control module.
10. The dark current detection method according to claim 8, characterized in that: and setting a plurality of first gain coefficients and 1 second gain coefficient corresponding to the first gain coefficients according to intervals of dark currents generated by different optical devices to be tested.
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| CN202310609406.9A CN116338286B (en) | 2023-05-29 | 2023-05-29 | Dark current detection circuit and dark current detection method for optical device |
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