CN116317948A - Oscillation circuit with dynamic temperature correction function - Google Patents

Oscillation circuit with dynamic temperature correction function Download PDF

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Publication number
CN116317948A
CN116317948A CN202310290841.XA CN202310290841A CN116317948A CN 116317948 A CN116317948 A CN 116317948A CN 202310290841 A CN202310290841 A CN 202310290841A CN 116317948 A CN116317948 A CN 116317948A
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circuit
temperature
current
check code
dynamic
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陈培腾
陈敏
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Chipsea Technologies Shenzhen Co Ltd
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Chipsea Technologies Shenzhen Co Ltd
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03BGENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/02Details
    • H03B5/04Modifications of generator to compensate for variations in physical values, e.g. power supply, load, temperature
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03BGENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/08Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
    • H03B5/12Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
    • H03B5/1228Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device the amplifier comprising one or more field effect transistors

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Abstract

The invention provides a dynamic temperature correction oscillation circuit, which is suitable for the technical field of semiconductors and comprises an oscillation circuit and a dynamic temperature correction circuit. Through the mode, the oscillating circuit working in a dynamic temperature environment can be corrected, so that the oscillating circuit is more stable in operation and wider in applicability.

Description

Oscillation circuit with dynamic temperature correction function
Technical Field
The invention belongs to the technical field of semiconductors, and particularly relates to a dynamic temperature correction oscillating circuit.
Background
In large scale integrated circuits, clock signals are a very important component of many electronic systems, and clock signals are usually generated by oscillators, and RC oscillators are the most commonly used type of oscillator circuits, which are simple in structure, high in integration and low in cost.
However, the RC oscillator is greatly affected by the change of working voltage and temperature, the process correlation is relatively poor, the precision is relatively poor, and the error is generally in the range of 2-10%.
The performance of the oscillator plays a vital role in the performance of the whole system, and with the increasingly strict requirements on the frequency precision and the temperature coefficient of the clock, the conventional RC oscillator cannot meet the use requirements of the system.
Disclosure of Invention
The invention aims to provide a dynamic temperature correction oscillating circuit, which aims to solve the problems that the prior art cannot provide a dynamic temperature correction oscillating circuit for correcting clock frequency in a dynamic temperature environment, so that the clock frequency is greatly influenced by temperature change in the dynamic temperature environment, and the user experience is poor.
The technical scheme adopted for solving the technical problems is as follows:
the utility model provides a dynamic temperature correction's oscillating circuit, including oscillating circuit and dynamic temperature correction circuit, wherein, oscillating circuit includes the comparator, and dynamic temperature correction circuit includes temperature sensor, reads current ambient temperature through temperature sensor, and dynamic temperature correction circuit adjusts the temperature characteristic of the bias current of comparator according to current ambient temperature to adjust the frequency temperature characteristic of oscillating circuit.
In an embodiment of the dynamic temperature correction oscillation circuit, when the current ambient temperature is within a threshold window, the dynamic temperature correction circuit determines a reference check code according to the current ambient temperature and the current clock frequency, when the current ambient temperature is outside the threshold window, determines a current check code according to the current ambient temperature and the current clock frequency, and adjusts the temperature characteristic of the bias current of the comparator according to the reference check code and the current check code, thereby adjusting the frequency temperature characteristic of the oscillation circuit.
In an embodiment of the dynamic temperature correction oscillation circuit of the present invention, the dynamic temperature correction circuit further includes: a quantizer for comparing the reference check code with the current check code to generate a temperature correction code; and the correction circuit is used for adjusting the temperature characteristic of the bias current of the comparator according to the temperature correction code, so that the frequency temperature characteristic of the oscillating circuit is adjusted.
In an embodiment of the dynamic temperature correction oscillation circuit of the present invention, the dynamic temperature correction circuit further includes: an integrator; the clock control circuit is connected with the integrator; the window detector is connected with the quantizer and the clock control circuit; when the window detector detects that the current ambient temperature is within a threshold window, enabling the clock control circuit, and the clock control circuit provides a current clock signal of the oscillating circuit for the integrator, and the integrator integrates the specified voltage for a preset clock period based on the clock signal to obtain a reference check code; when the window detector detects that the current ambient temperature is outside the threshold window, the energy quantizer and the clock control circuit are enabled, the clock control circuit provides the current clock signal of the oscillating circuit for the integrator, and the integrator integrates the specified voltage for a preset clock period based on the clock signal to obtain the current check code.
In one embodiment, the window detector controls the clock control circuit to disable the integrator and turn off the quantizer when detecting that the current ambient temperature is again within the threshold window.
In an embodiment of the dynamic temperature correction oscillation circuit of the present invention, the dynamic temperature correction circuit further includes: the analog-to-digital converter is connected with the integrator and is used for converting the voltage value obtained by integrating the integrator to obtain a reference check code or a current check code; the first memory is connected with the analog-to-digital converter and the quantizer and is used for storing a reference check code; the second memory is connected with the analog-to-digital converter and the quantizer and is used for storing the current check code.
In an embodiment of the dynamic temperature correction oscillation circuit, the correction circuit comprises a microprocessor and a plurality of field effect transistors, wherein the field effect transistors are connected with the microprocessor, the microprocessor is connected with the quantizer, and the microprocessor is used for selecting the field effect transistors according to the temperature correction code to adjust the temperature characteristics of the bias current of the comparator.
In an embodiment of the dynamic temperature correction oscillation circuit, the oscillation circuit comprises a capacitor circuit for starting oscillation, and a compensation circuit for compensating the temperature characteristic of clock frequency is connected to the lower stage of the capacitor circuit.
In one embodiment, the oscillating circuit further comprises a comparator and a voltage stabilizing circuit, wherein the output end of the voltage stabilizing circuit is connected with a first current mirror circuit, the first current mirror circuit is further connected with the same-directional input end of the comparator, and the same-directional input end of the comparator is further connected with a pull-down resistor; the output end of the voltage stabilizing circuit is connected with a second current mirror circuit, the second current mirror circuit is also connected with the input end of the capacitor circuit, the reverse input end of the voltage comparator is also connected with the input end of the capacitor circuit, the output end of the capacitor circuit is connected with the compensation circuit, and the output end of the compensation circuit is grounded.
In the oscillation circuit for dynamic temperature correction, in one embodiment, the output end of a comparator is connected with a logic controller, the input end of a capacitance circuit and the output end of a compensation circuit are connected in parallel with a charge-discharge electronic switch, and the charge-discharge electronic switch is controlled by the logic controller; the capacitance value compensation circuit of the capacitance circuit comprises a plurality of field effect transistors with different resistance values, and the temperature characteristics of clock frequency are accurately compensated by selecting the field effect transistors with different resistance values.
The invention provides a dynamic temperature correction oscillation circuit, which comprises an oscillation circuit and a dynamic temperature correction circuit and is characterized in that the oscillation circuit comprises a comparator, the dynamic temperature correction circuit comprises a temperature sensor, the current ambient temperature is read through the temperature sensor, and the dynamic temperature correction circuit adjusts the temperature characteristic of the bias current of the comparator according to the current ambient temperature, so that the frequency temperature characteristic of the oscillation circuit is adjusted. Through the mode, the oscillating circuit working in a dynamic temperature environment can be corrected, so that the oscillating circuit is more stable in operation and wider in applicability.
Drawings
FIG. 1 is a block diagram of an oscillating circuit with dynamic temperature correction according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a reference check code storing process of a dynamic temperature correction oscillation circuit according to a second embodiment of the present invention;
fig. 3 is a schematic diagram of a dynamic temperature correction process of an oscillating circuit with dynamic temperature correction according to a second embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
The following describes in detail the implementation of the present invention in connection with specific embodiments:
embodiment one:
fig. 1 shows the structure of a dynamic temperature correction oscillation circuit according to a first embodiment of the present invention, and for convenience of explanation, only the parts related to the embodiment of the present invention are shown in detail as follows:
in the embodiment of the invention, the oscillating circuit for dynamic temperature correction comprises an oscillating circuit and a dynamic temperature correction circuit, wherein the oscillating circuit comprises a capacitor circuit K for generating oscillating current, and a compensation circuit M for compensating the temperature characteristic of clock frequency is connected to the lower stage of the capacitor circuit K; the dynamic temperature correction circuit comprises a temperature sensor TempSensor, reads the current ambient temperature through the temperature sensor TempSensor, and corrects the temperature characteristic of the clock frequency; the invention provides a dynamic temperature correction oscillation circuit, which comprises an oscillation circuit and a dynamic temperature correction circuit, wherein the oscillation circuit comprises a capacitor circuit K, a compensation circuit M for compensating the temperature characteristic of clock frequency is connected to the lower stage of the capacitor circuit K, and the compensation circuit M can change a charging interval of the capacitor circuit K along with the change of temperature so as to influence the charging time, so that the problem of logic gate delay caused by the change of temperature is compensated by the change of the charging time caused by the capacitor circuit; further, the current ambient temperature is read through a temperature sensor TempSensor in the dynamic temperature correction circuit, the temperature characteristic of the clock frequency is corrected according to the current ambient temperature, and the stability of the clock frequency along with the temperature change is improved; the method and the device can correct the oscillating circuit working in a dynamic temperature environment, so that the oscillating circuit is more stable in operation and wider in applicability.
As shown in fig. 1, the oscillating circuit further includes a comparator COMP and a voltage stabilizing circuit LDO, an output end of the voltage stabilizing circuit LDO is connected with a first current mirror circuit (not shown in the figure), the first current mirror circuit is further connected with a co-directional input end of the comparator COMP, and a pull-down resistor R is further connected with the co-directional input end of the comparator COMP; the output end of the voltage stabilizing circuit LDO is connected with a second current mirror circuit (not shown in the figure), the second current mirror circuit is also connected with the input end of a capacitance circuit K, the reverse input end of a voltage comparator COMP is also connected with the input end of the capacitance circuit K, the output end of the capacitance circuit K is connected with a compensation circuit M, and the output end of the compensation circuit M is grounded; further improving the accuracy of the clock frequency.
As shown in fig. 1, the output end of the comparator COMP is connected with a logic controller logic control, the input end of the capacitor circuit K and the output end of the compensation circuit M are connected in parallel with a charge-discharge electronic switch S, and the charge-discharge electronic switch S is controlled by the logic controller logic control; the capacitance circuit K and the compensation circuit M are both connected with an external control circuit, the capacitance circuit K comprises a plurality of capacitors (not shown in the figure) and a plurality of electronic switches (not shown in the figure), the number of the parallel connection of the plurality of capacitors is controlled by controlling the on-off of the plurality of electronic switches, the capacitance value compensation circuit M of the capacitance circuit is adjusted to comprise a plurality of field effect transistors (not shown in the figure) with different resistance values, and the temperature characteristics of clock frequency are accurately compensated by selecting the field effect transistors with different resistance values.
As shown in fig. 1, the dynamic temperature correction circuit further includes a temperature threshold window detector TempWindowDetect connected to the temperature sensor TempSensor, the temperature threshold window detector TempWindowDetect being connected to a clock control circuit ClockControl and a Quantizer, the logic controller logic control also being connected to the clock control circuit ClockControl, the clock control circuit ClockControl also being connected to an Integrator, the Integrator is connected with an analog-to-digital converter ADC, the analog-to-digital converter ADC is connected with a first Memory1 and a second Memory2, the first Memory1 and the second Memory2 are connected with a Quantizer Quantizer, and the Quantizer Quantizer is also connected with a correction circuit N for correcting the temperature characteristic of the bias current of the comparator COMP.
As shown in fig. 1, the correction circuit N includes a microprocessor (not shown) and a plurality of field effect transistors (not shown), wherein the plurality of field effect transistors are connected to the microprocessor, and the microprocessor is connected to the Quantizer.
Embodiment two:
fig. 1 shows the structure of a dynamic temperature correction oscillation circuit according to the second embodiment of the present invention, and for convenience of explanation, only the parts related to the second embodiment of the present invention are shown in detail as follows:
in the embodiment of the invention, the oscillating circuit comprises a voltage stabilizing circuit LDO, and the voltage stabilizing output VLDO of the power supply voltage VDD provides stable working voltage for the core device of the oscillating circuit, so that the influence of the power supply voltage on the clock frequency is eliminated. The current I1 generates a reference voltage VREF on the pull-down resistor R to connect to the positive input of the comparator COMP, the reference voltage vref=i1×r, the current I2 provides a charge/discharge current to the capacitive circuit K, and the capacitive circuit K connects to the negative input of the comparator COMP to compare with the reference voltage VREF. According to the output result of the comparator COMP, the logic controller logic controls the capacitor circuit K to charge and discharge the electronic switch S to turn on and off so as to generate a clock signal.
According to formula (1):
Figure BDA0004141420060000061
acquiring clock frequencyRate of C total The capacitance of the output of the capacitance circuit K is f, and the clock frequency is f. The clock frequency is easily affected by process variation, and the invention controls the on-off of a plurality of electronic switches in the capacitor circuit K through an external control circuit, and controls the total capacitance of output by precisely controlling the number of parallel capacitors, namely C in the formula (1) total And trimming is performed, the clock frequency is calibrated when the chip leaves the factory, the precision of the clock frequency is ensured, and the influence of process variation on the clock frequency is eliminated.
The compensation circuit 2 is connected below the capacitor circuit 1 to perform first compensation on the temperature characteristic of the clock frequency. The channel resistance of the field effect transistor in the compensation circuit 2 changes along with the change of temperature, the changed channel resistance can change the charging interval of the capacitor to cause the change of charging time, and the delay time of the logic gate caused by the change of temperature is compensated by the caused change of charging time. And a field effect transistor with proper channel resistance in the compensation circuit M is selected by an external control circuit to be connected into the oscillation circuit for temperature compensation. According to the scheme, the temperature characteristic of the clock frequency is modified for the first time, the temperature characteristic can be within an error range of +/-2%, and compared with a traditional oscillator, the influence of temperature change on the clock frequency is eliminated to a great extent.
Based on the first correction of the clock frequency temperature characteristic, the invention also adds a dynamic temperature correction technology to carry out the second correction of the clock frequency temperature characteristic. The complete structure comprises: the temperature sensor TempSensor detects the current working environment temperature, and sends the detected temperature value into the temperature threshold window detector TempWindow detect, when the temperature threshold window detector TempWindow detect detects that the corresponding temperature value falls in the threshold window, the Integrator is activated through the clock control circuit ClockControl, and the Quantizer is enabled. The Integrator starts integrating the appointed voltage signal, the integrated output voltage of the Integrator is converted through the analog-to-digital conversion circuit ADC, the analog-to-digital conversion circuit ADC outputs a current ambient temperature check code and a reference check code, and the current ambient temperature check code and the reference check code are compared through the Quantizer to generate a group of temperature correction codes to adjust the temperature characteristic of the frequency of the oscillating circuit.
The above-mentioned oscillating circuit is subjected to room temperature environment T before leaving the factory R Correcting the clock frequency at a temperature of C, and converting the clock frequency f R Defined as the room temperature reference correction frequency.
The basic principle of the dynamic temperature correction technology is that the current ambient temperature is detected by a temperature sensor TempSensor and the temperature value is sent to a temperature threshold window detector TempWindow Detector, when the temperature threshold window detector TempWindow Detector detects that the corresponding temperature value falls within a threshold window of the room temperature TR+/-delta T, a reference check code storage is started, the reference check code storage activates an Integrator by a clock control circuit ClockControl, the specified voltage is integrated within a specified clock count length, the integrated result is converted into a corresponding digital code by an analog-to-digital converter ADC and is stored in a system Memory (a first Memory 1) as a reference check code D ref
As the ambient temperature changes and drifts, when the temperature threshold window detector TempWindowDetect detects that the ambient temperature value falls within the threshold window of other non-room temperature ambient temperatures tn±Δt (dividing the whole temperature range into tn=tr+2k×Δt, k=0, ±1, ±2 … …), the corresponding oscillation frequency temperature correction is started, the oscillation frequency temperature correction activates the Integrator by the clock control circuit ClockControl, integrates the same designated voltage within the same specified clock count length, and the integrated result is converted into the corresponding digital code by the analog-to-digital converter ADC and recorded in the system Memory (second Memory 2) as D ENV ,D ENV And the corresponding check code is the current ambient temperature. D (D) ENV And the previous reference check code D ref Comparing by Quantizer to generate a set of temperature correction codes (second temperature correction code Tt 2)<n-1:0>) The frequency temperature characteristic of the oscillating circuit is adjusted. Since the clock count length is related to the frequency of the oscillating circuit, when the frequency f of the oscillating circuit N Correction of frequency f compared to a room temperature reference R When the clock is bigger or smaller, the corresponding clock counting length is also shorter or longer, and the integration is performedThe integral output voltage of the Integrator will be reduced or increased, and the temperature correction code is fed back to adjust the negative or positive change of the temperature correction code, so as to finally make the frequency f of the oscillating circuit N Stabilize at reference room temperature correction frequency f R In the vicinity, the temperature offset of the oscillating circuit is reduced, and the influence of the temperature change on the clock frequency is further eliminated.
As shown in fig. 2, the schematic diagram of the reference check code storage process provided by the invention is that the Integrator is in a reset state in the initial state, and the Integrator is reset under the control of the RST signal after each integration conversion is completed; the temperature sensor TempSensor detects the current ambient temperature and sends the temperature value into a temperature threshold window detector TempWindow detection, when the temperature threshold window detector TempWindow detection detects that the corresponding temperature value falls within a room temperature TR+/-delta T threshold window, a reference check code storage is started, the reference check code storage controls a Clock signal in an oscillating circuit through a Clock control circuit ClockControl to activate an Integrator, the Clock control circuit ClockControl provides a Clock signal for the Integrator, the Integrator starts integrating the Vin signal, the Integrator integrates the Vin signal for N Clock cycles to obtain a voltage Vo1, and the voltage Vo1 is converted by an analog-to-digital converter ADC to obtain a reference check code D ref Will be quasi-check code D ref Saving in the first Memory1, resetting the Integrator after conversion, and correcting the code Tt2 for the second time<n-1:0>The default value is maintained.
As shown in fig. 3, according to the schematic diagram of the dynamic temperature correction process provided by the present invention, when the temperature threshold window detector TempWindowDetect detects that the ambient temperature value still falls within the threshold window of the room temperature tr±Δt, the temperature threshold window detector TempWindowDetect controls the clock control circuit ClockControl to disable the Integrator and simultaneously turns off the Quantizer, the second time temperature correction code Tt2 is executed at this time<n-1:0>The default value continues to be maintained. When the temperature threshold window detector TempWindow detect detects that the ambient temperature value falls within the TN+ -DeltaT threshold window of other non-room temperature ambient temperatures, then correspondingThe oscillation frequency temperature correction is carried out, the oscillation frequency temperature correction activates an Integrator through a Clock control circuit ClockControl, the Integrator starts integrating the same Vin signal again, the Integrator integrates N Clock cycles on the Vin signal, the voltage Vo2 is obtained through integration, and the voltage Vo2 is converted into a check code D through an analog-to-digital converter ADC ENV D is to ENV Storing in a second Memory2, and storing the reference check code D in the first Memory1 ref Reading out the check code D ENV And reference check code D ref By comparing with Quantizer, a set of temperature correction codes (second temperature correction code Tt2<n-1:0>) The temperature characteristic of the bias current I of the comparator COMP is modified by a proper field effect transistor to control the correction circuit N, so that the frequency f of the oscillating circuit N Stabilize at room temperature reference correction frequency f R Nearby.
By the same correction method as described above, the second temperature correction code Tt2 is used<n-1:0>The temperature characteristic of the bias current I of the comparator COMP is dynamically modified so as to ensure the frequency f of the oscillating circuit in a wide temperature range N Are all stable at the room temperature reference correction frequency f R Nearby. And dynamically fitting the temperature curve of the clock frequency after compensation into a new temperature curve, so as to dynamically correct the temperature characteristic of the clock frequency, and improving the stability of the clock frequency along with the temperature change to be within an error range of +/-0.5%.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the invention.

Claims (10)

1. The dynamic temperature correction oscillation circuit comprises an oscillation circuit and a dynamic temperature correction circuit, and is characterized in that the oscillation circuit comprises a comparator, the dynamic temperature correction circuit comprises a temperature sensor, the current ambient temperature is read through the temperature sensor, and the dynamic temperature correction circuit adjusts the temperature characteristic of the bias current of the comparator according to the current ambient temperature, so that the frequency temperature characteristic of the oscillation circuit is adjusted.
2. The dynamic temperature-corrected oscillation circuit according to claim 1, wherein,
and when the current ambient temperature is within a threshold window, determining a reference check code according to the current ambient temperature and the current clock frequency, and when the current ambient temperature is outside the threshold window, determining a current check code according to the current ambient temperature and the current clock frequency, and adjusting the temperature characteristic of the bias current of the comparator according to the reference check code and the current check code, thereby adjusting the frequency temperature characteristic of the oscillating circuit.
3. A dynamic temperature-corrected oscillation circuit according to claim 2,
the dynamic temperature correction circuit further includes:
a quantizer for comparing the reference check code with the current check code to generate a temperature correction code;
and the correction circuit is used for adjusting the temperature characteristic of the bias current of the comparator according to the temperature correction code, so that the frequency temperature characteristic of the oscillating circuit is adjusted.
4. A dynamic temperature-corrected oscillation circuit according to claim 3,
the dynamic temperature correction circuit further includes:
an integrator;
the clock control circuit is connected with the integrator;
a window detector, the window detector connecting the quantizer and the clock control circuit;
enabling the clock control circuit when the window detector detects that the current ambient temperature is within a threshold window, and enabling the clock control circuit to provide a current clock signal of the oscillating circuit to the integrator, wherein the integrator integrates a specified voltage for a preset clock period based on the clock signal so as to obtain the reference check code; and when the window detector detects that the current ambient temperature is outside a threshold window, enabling the quantizer and the clock control circuit, wherein the clock control circuit provides the current clock signal of the oscillating circuit for the integrator, and the integrator integrates the specified voltage for a preset clock period based on the clock signal so as to obtain the current check code.
5. The dynamic temperature-corrected oscillation circuit according to claim 4,
the window detector controls the clock control circuit to disable the integrator and to turn off the quantizer when it detects that the current ambient temperature is again within a threshold window.
6. The dynamic temperature-corrected oscillation circuit according to claim 4,
the dynamic temperature correction circuit further includes:
the analog-to-digital converter is connected with the integrator and is used for converting the voltage value obtained by integrating the integrator into the reference check code or the current check code;
the first memory is connected with the analog-to-digital converter and the quantizer and is used for storing the reference check code;
the second memory is connected with the analog-to-digital converter and the quantizer and is used for storing the current check code.
7. A dynamic temperature-corrected oscillation circuit according to claim 3,
the correction circuit comprises a microprocessor and a plurality of field effect transistors, wherein the field effect transistors are connected with the microprocessor, the microprocessor is connected with the quantizer, and the microprocessor is used for selecting the field effect transistor according to the temperature correction code to adjust the temperature characteristic of the bias current of the comparator.
8. The dynamic temperature-corrected oscillation circuit according to claim 1, wherein,
the oscillating circuit comprises a capacitor circuit for starting oscillation, and a compensation circuit for compensating the temperature characteristic of the clock frequency is connected to the lower stage of the capacitor circuit.
9. The dynamic temperature-corrected oscillation circuit according to claim 8,
the oscillating circuit further comprises a comparator and a voltage stabilizing circuit, wherein the output end of the voltage stabilizing circuit is connected with a first current mirror circuit, the first current mirror circuit is further connected with the same-direction input end of the comparator, and the same-direction input end of the comparator is further connected with a pull-down resistor; the output end of the voltage stabilizing circuit is connected with a second current mirror circuit, the second current mirror circuit is also connected with the input end of the capacitance circuit, the reverse input end of the voltage comparator is also connected with the input end of the capacitance circuit, the output end of the capacitance circuit is connected with the compensation circuit, and the output end of the compensation circuit is grounded.
10. The dynamic temperature-corrected oscillation circuit according to claim 9,
the output end of the comparator is connected with a logic controller, the input end of the capacitor circuit and the output end of the compensation circuit are connected in parallel with a charge-discharge electronic switch, and the charge-discharge electronic switch is controlled by the logic controller; the capacitance circuit and the compensation circuit are connected with an external control circuit, the capacitance circuit comprises a plurality of capacitors and a plurality of electronic switches, the number of the capacitors connected in parallel is controlled by controlling the on-off states of the electronic switches, the capacitance value of the capacitance circuit is adjusted, the compensation circuit comprises a plurality of field effect transistors with different resistance values, and the temperature characteristics of clock frequency are accurately compensated by selecting the field effect transistors with different resistance values.
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