CN116295586A - Sensor testing system, method, electronic equipment and storage medium - Google Patents
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Abstract
The invention discloses a sensor test system, a method, electronic equipment and a storage medium, wherein the sensor test system comprises a test device, a program control signal trigger and an intelligent gateway, the test device is respectively in communication connection with the intelligent gateway and the program control signal trigger, the intelligent gateway is also in communication connection with a sensor to be tested, the program control signal trigger is positioned at a debugging position around the sensor, the sensor comprises at least one of an arc sensor, a smoke sensor, a temperature and humidity sensor and a gas sensor, the test device controls a functional module in the program control signal trigger to operate by determining the sensor to be tested so as to change the non-electrical quantity of the surrounding environment of the sensor, further, the value of the non-electrical quantity detected by the sensor can be changed, whether the sensor is qualified or not can be judged by comparing the values of the non-electrical quantity in a trigger signal and a detection signal, the functions and performance detection of each sensor can be completed, the engineering and standardized application can be realized, the test process is automated, and the test efficiency is high.
Description
Technical Field
The present invention relates to the field of sensor testing technologies, and in particular, to a sensor testing system, a sensor testing method, an electronic device, and a storage medium.
Background
Along with the promotion of electric power thing networking construction work, a large amount of sensor equipment and data need be through intelligent gateway access thing networking platform, and on-the-spot debugging operation maintenance pressure is great. How to realize safe, rapid and reliable access of the sensor is a key problem in the construction process of the electric power Internet of things. The current power internet of things sensor debugging also has the following problems:
1. lack of specialized multi-function debugging equipment. The existing sensor test mode is on one surface, can only complete the test in the aspect of communication, and cannot complete the function detection of each sensor under the fault scene.
2. The sensor debugging quality lacks unified standard, and the debugging quality varies from person to person, and can not realize standardized application.
3. The debugging work of the sensor is mainly based on manual debugging, and the debugging efficiency is low.
Disclosure of Invention
The invention provides a sensor testing system, a sensor testing method, electronic equipment and a storage medium, which are used for solving the problems that the function detection of each sensor under a fault scene can not be completed, the standardized application can not be realized and the debugging efficiency is low in sensor testing.
In a first aspect, the invention provides a sensor test system, comprising a test device, a program-controlled signal trigger and an intelligent gateway, wherein the test device is respectively in communication connection with the intelligent gateway and the program-controlled signal trigger, the intelligent gateway is also in communication connection with a sensor to be tested, the program-controlled signal trigger is positioned at a debugging position around the sensor, the sensor comprises at least one of an arc sensor, a smoke sensor, a temperature and humidity sensor and a gas sensor,
the test device is used for generating a test scheme according to the received test instruction of the sensor, generating a debugging instruction according to the test scheme and sending the debugging instruction to the program-controlled signal trigger;
the program control signal trigger is used for scheduling the function module related to the sensor to operate according to the debugging instruction so as to change the non-electrical quantity of the surrounding environment of the sensor;
the intelligent gateway is used for receiving the detection signal sent by the sensor and forwarding the detection signal to the testing device;
the testing device is also used for judging whether the sensor is qualified or not according to the trigger signal and the detection signal.
In a second aspect, the present invention provides a sensor testing method applied to the sensor testing system according to the first aspect, where the sensor testing system includes a testing device, a program control signal trigger, and an intelligent gateway, and the sensor testing method includes:
the testing device generates a testing scheme according to the received testing instruction of the sensor, generates a debugging instruction according to the testing scheme and sends the debugging instruction to the program-controlled signal trigger;
the program control signal trigger schedules the function module related to the sensor to operate according to the debugging instruction so as to change the non-electrical quantity of the surrounding environment of the sensor;
the intelligent gateway receives the detection signal sent by the sensor and forwards the detection signal to the testing device;
and the testing device judges whether the sensor is qualified or not according to the trigger signal and the detection signal.
In a third aspect, the present invention provides an electronic device, including:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein,,
the memory stores a computer program executable by the at least one processor to enable the at least one processor to perform the sensor testing method of the second aspect of the invention.
In a fourth aspect, the present invention provides a computer readable storage medium storing computer instructions for causing a processor to execute the sensor testing method according to the second aspect of the present invention.
The embodiment of the invention provides a sensor test system, which comprises a test device, a program control signal trigger and an intelligent gateway, wherein the test device is respectively in communication connection with the intelligent gateway and the program control signal trigger, the intelligent gateway is also in communication connection with a sensor to be tested, the program control signal trigger is positioned at a debugging position around the sensor, the sensor comprises at least one of an arc sensor, a smoke sensor, a temperature and humidity sensor and a gas sensor, the test device is used for generating a test scheme according to a received test instruction of the sensor, generating a debugging instruction according to the test scheme and sending the debugging instruction to the program control signal trigger; the program control signal trigger is used for scheduling the operation of the functional module related to the sensor according to the debugging instruction so as to change the non-electrical quantity of the surrounding environment of the sensor; the intelligent gateway is used for receiving the detection signal sent by the sensor and forwarding the detection signal to the testing device; the testing device is also used for judging whether the sensor is qualified or not according to the trigger signal and the detection signal.
The function module in the program control signal trigger is controlled to operate by determining the sensor to be detected, so that the non-electrical quantity of the surrounding environment of the sensor is changed, the value of the non-electrical quantity detected by the sensor is changed, whether the sensor is qualified or not can be judged by comparing the trigger signal with the value of the non-electrical quantity in the detection signal, the function and performance detection of each sensor under a fault scene can be completed, the sensor debugging standardization application is realized, the testing process is automatic, and the testing efficiency is high.
It should be understood that the description in this section is not intended to identify key or critical features of the embodiments of the invention or to delineate the scope of the invention. Other features of the present invention will become apparent from the description that follows.
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In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a sensor testing system according to a first embodiment of the present invention;
FIG. 2 is a schematic diagram of a sensor testing process according to a first embodiment of the present invention;
FIG. 3 is a graph of a comparison of data provided in accordance with one embodiment of the present invention;
FIG. 4 is a graph showing another comparison of data provided in accordance with one embodiment of the present invention;
FIG. 5 is a flow chart of a sensor testing method according to a second embodiment of the present invention;
fig. 6 is a schematic structural diagram of an electronic device according to a third embodiment of the present invention.
Detailed Description
In order that those skilled in the art will better understand the present invention, a technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, shall fall within the scope of the present invention.
Example 1
Fig. 1 is a schematic structural diagram of a sensor testing system according to a first embodiment of the present invention, where the embodiment is applicable to detecting whether a sensor is qualified. As shown in fig. 1, the sensor testing system includes: the intelligent gateway device comprises a testing device 10, a program control signal trigger 20 and an intelligent gateway 30, wherein the testing device 10 is respectively in communication connection with the intelligent gateway 30 and the program control signal trigger 20, the intelligent gateway 30 is also in communication connection with a sensor 40 to be tested, the program control signal trigger 20 is positioned at a debugging position around the sensor 40, and the debugging position refers to a position capable of changing the non-electric quantity detected by the sensor 40 after a functional module in the program control signal trigger 20 operates. It is readily understood that programmable signal trigger 20 is located closer to sensor 40, and the adjustment position can be specifically adjusted according to actual requirements.
The testing device is used for generating a testing scheme according to the received testing instruction of the sensor, generating a debugging instruction according to the testing scheme and sending the debugging instruction to the program-controlled signal trigger.
The sensor comprises at least one of an arc sensor, a smoke sensor, a temperature and humidity sensor and a gas sensor, i.e. the sensor is a sensor or a collection of sensors, and the physical quantities detected by the sensors are all non-electrical quantities. Wherein the arc sensor is a partial discharge sensor.
The testing device is portable, and testing software is integrated in the testing device. The testing device can pre-store testing schemes of various sensors, and can also interact information with the intelligent gateway, so that the testing schemes of the various sensors can be obtained through the intelligent gateway, and the intelligent gateway is equivalent to a data center. Assuming that the test schemes are codes, each code for a class of sensors, a non-electrical quantity, for example:
the code is 11, the corresponding sensor is a gas sensor, the corresponding non-electric quantity is oxygen content,
the code is 12, the corresponding sensor is a gas sensor, the corresponding non-electric quantity is nitrogen content,
the code is 103, the corresponding sensor is a temperature sensor, and the corresponding non-electrical quantity is temperature.
Specifically, the testing device may be provided with a display interface, the testing device may receive a test instruction of the sensor by detecting an operation acting on the display interface, the testing device may also be connected to other control centers, the test instruction of the sensor may be sent by the control center connected to the testing device, after receiving the test instruction of the sensor, a pre-stored test scheme of the sensor to be tested may be called, or a test scheme of the sensor may be obtained from the intelligent gateway, and then a debug instruction is generated according to the test scheme, that is, the debug instruction also includes information of the sensor to be tested.
The program control signal trigger is used for scheduling the function module related to the sensor to operate according to the debugging instruction so as to change the non-electric quantity of the surrounding environment of the sensor.
The program-controlled signal trigger can be in communication connection with the testing device through Bluetooth. The program control signal trigger is provided with a plurality of functional modules which correspond to the types of the sensors and comprise an arc triggering module, a smoke triggering module, a temperature and humidity triggering module and a gas triggering module. The electric arc triggering module can realize signal triggering of the partial discharge sensor; the smoke triggering module can realize signal triggering of the smoke sensor; the temperature and humidity triggering module can realize signal triggering of the temperature and humidity sensor; the gas triggering module can realize signal triggering of the gas sensor; for example, when the gas sensor can detect SF6, O2, O3, the gas trigger module can produce SF6, O2, O3 to trigger a signal from the gas sensor. The signal triggering is to make the sensor obtain a changed detection signal under the influence of the operation of the functional module. After receiving the debugging command, the program control signal trigger can analyze the debugging command to determine a functional module related to the sensor, and then schedule the functional module to operate so as to change the non-electrical quantity of the surrounding environment of the sensor, wherein the non-electrical quantity can be electric arc, smoke concentration, temperature and humidity and gas concentration.
Specifically, the programming signal trigger may parse the debug instruction to determine the sensor; searching a function module corresponding to the sensor in a preset sensor-function module comparison table; and scheduling the function module to operate.
Furthermore, the debugging instruction also includes information of the sensor to be detected, the program-controlled signal trigger can analyze the debugging instruction to obtain information of the sensor, the preset sensor-function module comparison table also can include related information of the sensor and the function module, and the program-controlled signal trigger searches the function module corresponding to the sensor in the preset sensor-function module comparison table, and at the moment, can call the related function module.
The functional modules comprise an arc triggering module, a smoke triggering module, a temperature and humidity triggering module and a gas triggering module corresponding to the types of the sensors. In an example, the sensor is a temperature sensor, the corresponding non-electric quantity is temperature, the corresponding functional module is a heating module, the heating module is started to heat the air temperature around the sensor, and the program control signal trigger is located at the debugging position around the sensor, so that the sensor can detect the ambient temperature after the heating module is started and transmit the ambient temperature to the intelligent gateway.
In another example, as shown in fig. 2, where the sensor is an arc sensor 41, the programmable signal trigger 20 may activate an arc triggering module to apply an arc to the arc sensor 41, the arc sensor 41 may detect that the arc is generating a detection signal and transmit the detection signal to the smart gateway 30 via bluetooth, and the smart gateway 30 may then transmit the detection signal to the test device 10.
The intelligent gateway is used for receiving detection signals sent by the sensor and forwarding the detection signals to the testing device. The function of the intelligent gateway includes collecting and forwarding the detection signals of the sensors. And the detection signal is forwarded to the testing device after being received.
If the testing device is connected with the intelligent gateway for the first time and acquires data, the testing device writes the data into the data center from the intelligent gateway, and the testing device comprises the following steps: model registration, device registration, acquisition of GUID (Globally Unique Identifier ), write data or parameters. If the test device is registered, the test device only acquires data, and only two steps of acquiring GUID, writing data or parameters are needed. The GUID is an identification number on the intelligent gateway, and the testing device and the intelligent gateway carry out identity confirmation and establish communication connection according to the GUID.
The testing device is also used for judging whether the sensor is qualified or not according to the trigger signal and the detection signal.
The trigger signal is a signal for controlling the function module in the program control signal trigger to operate, the change condition of the non-electric quantity in the surrounding environment of the sensor can be known according to the trigger signal after the function module operates, and the detection signal is the non-electric quantity in the surrounding environment actually detected by the sensor, so that whether the sensor is qualified can be judged by comparing the change condition of the non-electric quantity in the surrounding environment of the sensor, which is obtained by the trigger signal and the detection signal.
In one example, the test apparatus may also generate a debug report after the sensor test is completed.
The embodiment of the invention provides a sensor test system, which comprises a test device, a program control signal trigger and an intelligent gateway, wherein the test device is respectively in communication connection with the intelligent gateway and the program control signal trigger, the intelligent gateway is also in communication connection with a sensor to be tested, the program control signal trigger is positioned at a debugging position around the sensor, the sensor comprises at least one of an arc sensor, a smoke sensor, a temperature and humidity sensor and a gas sensor, the test device is used for generating a test scheme according to a received test instruction of the sensor, generating a debugging instruction according to the test scheme and sending the debugging instruction to the program control signal trigger; the program control signal trigger is used for scheduling the operation of the functional module related to the sensor according to the debugging instruction so as to change the non-electrical quantity of the surrounding environment of the sensor; the intelligent gateway is used for receiving the detection signal sent by the sensor and forwarding the detection signal to the testing device; the testing device is also used for judging whether the sensor is qualified or not according to the trigger signal and the detection signal. The function module in the program control signal trigger is controlled to operate by determining the sensor to be detected, so that the non-electrical quantity of the surrounding environment of the sensor is changed, the value of the non-electrical quantity detected by the sensor is changed, whether the sensor is qualified or not can be judged by comparing the trigger signal with the value of the non-electrical quantity in the detection signal, the function and performance detection of each sensor under a fault scene can be completed, engineering and standardized application are realized, the testing process is automatic, and the testing efficiency is high.
In an alternative embodiment of the present invention, the program control signal trigger may have a plurality of signal triggering modes with unique ID numbers, corresponding to buttons of the remote controller one by one. The tester can select the corresponding trigger button according to the type of the non-electric quantity sensor, the remote controller sends out a signal trigger instruction, and trigger information is transmitted to the portable sensor debugging tool in real time.
In an alternative embodiment of the invention, the test device comprises:
the trigger signal analysis module is used for determining a standard value and a first test time of the non-electrical quantity generated after the function module operates according to the trigger signal;
the detection signal analysis module is used for obtaining an actual measurement value of the non-electric quantity detected by the sensor and second test time according to the detection signal;
and the performance judging module is used for judging whether the sensor is qualified or not according to the standard value, the first test time, the actual measurement value and the second test time.
After the data are obtained, whether the sensor is qualified or not can be judged by comparing the standard value and the actual measured value under the same time. For example, as shown in fig. 3, the first curve is a curve corresponding to a standard value, the second curve is a curve corresponding to an actual measurement value, the standard value and the actual measurement value are compared, the standard value of a time is f1 (a), the actual measurement value is f1 (b), the standard value of b time is f2 (a), the actual measurement value is f2 (b), f1 (a) and f1 (b) can be compared, f2 (a) and f2 (b) can be compared, difference values can be calculated respectively, and if the difference values are within a preset range, the sensor can be determined to be qualified.
Specifically, the performance judging module includes:
the first curve drawing submodule is used for drawing a first curve according to the first test time and the standard value;
the second curve drawing submodule is used for drawing a second curve according to the second test time and the measured value;
the line segment intercepting submodule is used for intercepting a first line segment on a first curve and intercepting a second line segment on a second curve in the same time period;
and the performance judging sub-module is used for judging whether the sensor is qualified or not by comparing the first line segment and the second line segment in the same time period.
As shown in fig. 4, if the standard value and the measured value are drawn as curves, whether the sensor is qualified or not may be determined by comparing the features of the first line segment and the second line segment in the same time period, for example, the features may be the trend, the change trend or the curvature of the curves.
The performance judging submodule comprises:
a curvature difference calculation sub-module for calculating a difference of curvatures of the first line segment and the second line segment for the same time period;
the qualified line segment judging sub-module is used for determining the second line segment as a qualified line segment when the difference value of the curvatures is within a preset range;
the normal performance determining submodule is used for determining that the performance of the sensor is normal if the ratio of the number of the qualified line segments to the number of all the second line segments is larger than a preset proportion;
and the performance abnormality determination submodule is used for determining that the performance of the sensor is abnormal if the ratio of the number of the qualified line segments to the number of all the second line segments is smaller than a preset ratio.
Illustratively, as shown in fig. 4, in the period ab, the curvature of the first line segment is s1 (ab), the curvature of the second line segment is s2 (ab), in the period bc, the curvature of the first line segment is s1 (bc), the curvature of the second line segment is s2 (bc), and if the curvature difference is within the preset range, the second line segment is a qualified line segment by calculating the curvature difference between the first line segment and the second line segment in each period.
It should be noted that, because the program-controlled signal trigger is located at the debugging position around the sensor, there may be different distance differences between the program-controlled signal trigger and the debugging position, that is, the program-controlled signal trigger may be affected by the environment, so that there is a difference between the measured value and the standard value, but the variation trend of the program-controlled signal trigger and the standard value should be approximately the same.
In an alternative embodiment of the present invention, the testing device is further configured to send a detection signal calling instruction to the intelligent gateway, and the intelligent gateway is further configured to collect a detection signal of the sensor and send the detection signal to the testing device when receiving the detection signal calling instruction.
Example two
Fig. 5 is a flowchart of a sensor testing method according to a second embodiment of the present invention, where the method may be performed by a sensor testing system according to the first embodiment, and the sensor testing system includes a testing device, a program-controlled signal trigger, and an intelligent gateway. As shown in fig. 5, the sensor testing method includes:
s501, the testing device generates a testing scheme according to the received testing instruction of the sensor, generates a debugging instruction according to the testing scheme and sends the debugging instruction to the program-controlled signal trigger;
s502, a program control signal trigger dispatches the function module related to the sensor to operate according to the debugging instruction so as to change the non-electrical quantity of the surrounding environment of the sensor;
s503, the intelligent gateway receives a detection signal sent by the sensor and forwards the detection signal to the testing device;
s504, the testing device judges whether the sensor is qualified or not according to the trigger signal and the detection signal.
In an alternative embodiment of the present invention, the program-controlled signal trigger schedules the function module related to the sensor to operate according to the debug instruction, including:
the program-controlled signal trigger analyzes the debugging instruction to determine a sensor; searching a function module corresponding to the sensor in a preset sensor-function module comparison table; the scheduling function module operates.
In an alternative embodiment of the invention, the functional modules include an arc triggering module, a smoke triggering module, a temperature and humidity triggering module and a gas triggering module.
In an alternative embodiment of the present invention, the testing device determines whether the sensor is qualified according to the trigger signal and the detection signal, including:
the testing device determines a standard value and a first testing time of a non-electrical quantity generated after the function module operates according to the trigger signal;
obtaining an actual measurement value of the non-electric quantity detected by the sensor and a second test time according to the detection signal;
and judging whether the sensor is qualified or not according to the standard value, the first test time, the actual measurement value and the second test time.
In an alternative embodiment of the present invention, determining whether the sensor is qualified according to the standard value, the first test time, the measured value, and the second test time includes:
drawing a first curve according to the first test time and the standard value;
drawing a second curve according to the second test time and the measured value;
intercepting a first line segment on a first curve and intercepting a second line segment on a second curve in the same time period;
and judging whether the sensor is qualified or not by comparing the first line segment and the second line segment in the same time period.
In an alternative embodiment of the present invention, determining whether the sensor is acceptable by comparing the first line segment and the second line segment in the same time period includes:
calculating a difference in curvature of the first line segment and the second line segment for the same time period;
when the difference value of the curvatures is within a preset range, determining the second line segment as a qualified line segment;
if the ratio of the number of the qualified line segments to the number of all the second line segments is larger than a preset ratio, determining that the performance of the sensor is normal;
if the ratio of the number of the qualified line segments to the number of all the second line segments is smaller than the preset ratio, determining that the performance of the sensor is abnormal.
In an alternative embodiment of the invention, the testing device sends a detection signal calling instruction to the intelligent gateway, and the intelligent gateway collects the detection signal of the sensor and sends the detection signal to the testing device when receiving the detection signal calling instruction.
The sensor testing method provided by the embodiment of the invention can be applied to the sensor testing system provided by any embodiment of the invention, and has the functional modules and beneficial effects corresponding to the system.
Example III
Fig. 6 shows a schematic diagram of an electronic device 40 that may be used to implement an embodiment of the invention. Electronic devices are intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device may also represent various forms of mobile devices, such as personal digital assistants, cellular telephones, smartphones, and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be exemplary only, and are not meant to limit implementations of the inventions described and/or claimed herein.
As shown in fig. 6, the electronic device 40 includes at least one processor 41, and a memory communicatively connected to the at least one processor 41, such as a Read Only Memory (ROM) 42, a Random Access Memory (RAM) 43, etc., in which the memory stores a computer program executable by the at least one processor, and the processor 41 may perform various suitable actions and processes according to the computer program stored in the Read Only Memory (ROM) 42 or the computer program loaded from the storage unit 48 into the Random Access Memory (RAM) 43. In the RAM 43, various programs and data required for the operation of the electronic device 40 may also be stored. The processor 41, the ROM 42 and the RAM 43 are connected to each other via a bus 44. An input/output (I/O) interface 45 is also connected to bus 44.
Various components in electronic device 40 are connected to I/O interface 45, including: an input unit 46 such as a keyboard, a mouse, etc.; an output unit 47 such as various types of displays, speakers, and the like; a storage unit 48 such as a magnetic disk, an optical disk, or the like; and a communication unit 49 such as a network card, modem, wireless communication transceiver, etc. The communication unit 49 allows the electronic device 40 to exchange information/data with other devices via a computer network, such as the internet, and/or various telecommunication networks.
The processor 41 may be various general and/or special purpose processing components with processing and computing capabilities. Some examples of processor 41 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various specialized Artificial Intelligence (AI) computing chips, various processors running machine learning model algorithms, digital Signal Processors (DSPs), and any suitable processor, controller, microcontroller, etc. The processor 41 performs the various methods and processes described above, such as the sensor test method.
In some embodiments, the sensor testing method may be implemented as a computer program tangibly embodied on a computer-readable storage medium, such as the storage unit 48. In some embodiments, part or all of the computer program may be loaded and/or installed onto the electronic device 40 via the ROM 42 and/or the communication unit 49. When the computer program is loaded into RAM 43 and executed by processor 41, one or more steps of the sensor testing method described above may be performed. Alternatively, in other embodiments, processor 41 may be configured to perform the sensor testing method in any other suitable manner (e.g., by means of firmware).
Various implementations of the systems and techniques described here above can be implemented in digital electronic circuitry, integrated circuit systems, field Programmable Gate Arrays (FPGAs), application Specific Integrated Circuits (ASICs), application Specific Standard Products (ASSPs), systems On Chip (SOCs), complex Programmable Logic Devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs, the one or more computer programs may be executed and/or interpreted on a programmable system including at least one programmable processor, which may be a special purpose or general-purpose programmable processor, that may receive data and instructions from, and transmit data and instructions to, a storage system, at least one input device, and at least one output device.
A computer program for carrying out methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the computer programs, when executed by the processor, cause the functions/acts specified in the flowchart and/or block diagram block or blocks to be implemented. The computer program may execute entirely on the machine, partly on the machine, as a stand-alone software package, partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of the present invention, a computer-readable storage medium may be a tangible medium that can contain, or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. The computer readable storage medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. Alternatively, the computer readable storage medium may be a machine readable signal medium. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and a pointing device (e.g., a mouse or a trackball) through which a user can provide input to the electronic device. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic input, speech input, or tactile input.
The systems and techniques described here can be implemented in a computing system that includes a background component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such background, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), wide Area Networks (WANs), blockchain networks, and the internet.
The computing system may include clients and servers. The client and server are typically remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server can be a cloud server, also called a cloud computing server or a cloud host, and is a host product in a cloud computing service system, so that the defects of high management difficulty and weak service expansibility in the traditional physical hosts and VPS service are overcome.
It should be appreciated that various forms of the flows shown above may be used to reorder, add, or delete steps. For example, the steps described in the present invention may be performed in parallel, sequentially, or in a different order, so long as the desired results of the technical solution of the present invention are achieved, and the present invention is not limited herein.
The above embodiments do not limit the scope of the present invention. It will be apparent to those skilled in the art that various modifications, combinations, sub-combinations and alternatives are possible, depending on design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of the present invention.
Claims (10)
1. The sensor test system is characterized by comprising a test device, a program control signal trigger and an intelligent gateway, wherein the test device is respectively in communication connection with the intelligent gateway and the program control signal trigger, the intelligent gateway is also in communication connection with a sensor to be tested, the program control signal trigger is positioned at a debugging position around the sensor, the sensor comprises at least one of an arc sensor, a smoke sensor, a temperature and humidity sensor and a gas sensor,
the test device is used for generating a test scheme according to the received test instruction of the sensor, generating a debugging instruction according to the test scheme and sending the debugging instruction to the program-controlled signal trigger;
the program control signal trigger is used for scheduling the function module related to the sensor to operate according to the debugging instruction so as to change the non-electrical quantity of the surrounding environment of the sensor;
the intelligent gateway is used for receiving the detection signal sent by the sensor and forwarding the detection signal to the testing device;
the testing device is also used for judging whether the sensor is qualified or not according to the trigger signal and the detection signal.
2. The sensor testing system of claim 1, wherein the programmable signal trigger is further to:
parsing the debug instructions to determine the sensor; searching a function module corresponding to the sensor in a preset sensor-function module comparison table; and scheduling the function module to operate.
3. The sensor testing system of claim 1, wherein the functional modules include an arc triggering module, a smoke triggering module, a temperature and humidity triggering module, and a gas triggering module.
4. A sensor testing system according to any of claims 1-3, wherein said testing means comprises:
the trigger signal analysis module is used for determining a standard value and a first test time of the non-electrical quantity generated after the function module operates according to the trigger signal;
the detection signal analysis module is used for obtaining an actual measurement value of the non-electric quantity detected by the sensor and a second test time according to the detection signal;
and the performance judging module is used for judging whether the sensor is qualified or not according to the standard value, the first test time, the actual measurement value and the second test time.
5. The sensor testing system of claim 4, wherein the performance determination module comprises:
the first curve drawing submodule is used for drawing a first curve according to the first test time and the standard value;
the second curve drawing submodule is used for drawing a second curve according to the second test time and the actual measurement value;
the line segment intercepting submodule is used for intercepting a first line segment on the first curve and intercepting a second line segment on the second curve in the same time period;
and the performance judging sub-module is used for judging whether the sensor is qualified or not by comparing the first line segment and the second line segment in the same time period.
6. The sensor testing system of claim 5, wherein the performance determination submodule comprises:
a curvature difference calculation sub-module for calculating a difference of curvatures of the first line segment and the second line segment for the same time period;
the qualified line segment judging submodule is used for determining the second line segment as a qualified line segment when the difference value of the curvatures is in a preset range;
the normal performance determining submodule is used for determining that the performance of the sensor is normal if the ratio of the number of the qualified line segments to the number of all the second line segments is larger than a preset proportion;
and the performance abnormality determination submodule is used for determining that the performance of the sensor is abnormal if the ratio of the number of the qualified line segments to the number of all the second line segments is smaller than a preset ratio.
7. A sensor testing system according to any one of claims 1-3, wherein the testing device is further configured to send a detection signal summoning instruction to the intelligent gateway, and wherein the intelligent gateway is further configured to collect the detection signal of the sensor and send the detection signal to the testing device when receiving the detection signal summoning instruction.
8. A sensor testing method, applied to the sensor testing system of any one of claims 1-7, the sensor testing system comprising a testing device, a programmed signal trigger, and an intelligent gateway, the sensor testing method comprising:
the testing device generates a testing scheme according to the received testing instruction of the sensor, generates a debugging instruction according to the testing scheme and sends the debugging instruction to the program-controlled signal trigger;
the program control signal trigger schedules the function module related to the sensor to operate according to the debugging instruction so as to change the non-electrical quantity of the surrounding environment of the sensor;
the intelligent gateway receives the detection signal sent by the sensor and forwards the detection signal to the testing device;
and the testing device judges whether the sensor is qualified or not according to the trigger signal and the detection signal.
9. An electronic device, the electronic device comprising:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein,,
the memory stores a computer program executable by the at least one processor to enable the at least one processor to perform the sensor testing method of any one of claims 1-7.
10. A computer readable storage medium, characterized in that it stores computer instructions for causing a processor to implement the sensor testing method of any one of claims 1-7 when executed.
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