CN116256618A - Short circuit testing device, short circuit testing circuit and short circuit testing method - Google Patents

Short circuit testing device, short circuit testing circuit and short circuit testing method Download PDF

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Publication number
CN116256618A
CN116256618A CN202310190599.9A CN202310190599A CN116256618A CN 116256618 A CN116256618 A CN 116256618A CN 202310190599 A CN202310190599 A CN 202310190599A CN 116256618 A CN116256618 A CN 116256618A
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CN
China
Prior art keywords
test
short circuit
tested
short
circuit
Prior art date
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Pending
Application number
CN202310190599.9A
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Chinese (zh)
Inventor
艾青
杨晶晶
李德跃
黄炉平
李衡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Csic Anpel Instrument Co ltd Hubei
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Csic Anpel Instrument Co ltd Hubei
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Filing date
Publication date
Application filed by Csic Anpel Instrument Co ltd Hubei filed Critical Csic Anpel Instrument Co ltd Hubei
Priority to CN202310190599.9A priority Critical patent/CN116256618A/en
Publication of CN116256618A publication Critical patent/CN116256618A/en
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors

Abstract

The application discloses a short circuit testing device, a short circuit testing circuit and a short circuit testing method. The short circuit testing device comprises a carrier plate and a core plate; the carrier plate is provided with a placing groove, and the shape of the placing groove corresponds to that of the circuit board to be tested; the placing groove is provided with first through holes, and the positions and the number of the first through holes are determined according to points to be tested of the circuit board to be tested; the core board comprises a plurality of test units, each test unit is electrically connected with a corresponding point to be tested through a first through hole, and the test units are used for testing whether the point to be tested has a short circuit fault or not; the core board also comprises a control unit, wherein the control unit is electrically connected with the test unit and is used for controlling the test unit to test the short circuit of the circuit board to be tested and sending out a test result. Therefore, all the test units can be controlled to perform short-circuit test on the circuit board to be tested at the same time only by operating the control unit, so that the circuit board to be tested with more points to be tested can also perform short-circuit test on a plurality of test points accurately and simultaneously, and the efficiency of short-circuit test on the circuit board is improved.

Description

Short circuit testing device, short circuit testing circuit and short circuit testing method
Technical Field
The application relates to the technical field of circuit board testing, in particular to a short circuit testing device, a short circuit testing circuit and a short circuit testing method.
Background
The circuit board is widely applied to various electronic equipment, has the functions of data acquisition and control analysis, and whether the failure of the circuit board directly affects whether the electronic equipment can normally operate or not.
One of the common faults of the circuit board is a short circuit fault, which can cause the working failure of the electronic equipment and even cause fire, and cause irreversible damage to the electronic equipment. Thus, the short circuit test is one of the basic test items in the circuit board production process.
At present, short circuit testing of a circuit board is usually completed manually, and a tester uses a short circuit testing gear of a universal meter to test each to-be-tested point of the circuit board one by one. However, when there are many points to be tested of the circuit board to be tested, the manual testing method is prone to false testing or missing testing, resulting in low short circuit testing efficiency, and further reducing the production efficiency of the circuit board.
Disclosure of Invention
The embodiment of the application provides the short circuit testing device which can automatically perform short circuit testing on the circuit board to be tested, so that the circuit board to be tested with more points to be tested can also accurately perform short circuit testing, and the efficiency of the short circuit testing of the circuit board is improved; the embodiment of the application also provides a short circuit test circuit which can be electrically connected with only one point to be tested to detect whether the point to be tested has a short circuit or not; the embodiment of the application also provides a short circuit test method, which uses the short circuit test device and the short circuit test circuit to test the short circuit of the circuit board to be tested.
The embodiment of the application provides a short circuit testing device for test circuit board that awaits measuring, the circuit board that awaits measuring includes the station of waiting to measure, the device includes:
the support plate is provided with a placing groove, and the placing groove is provided with a first through hole;
a test unit and a control unit; the test unit is arranged in alignment with the first through hole, so that the test unit is electrically connected with a point to be tested through the first through hole when in operation; the control unit is connected with the test unit to control the short circuit test of the test unit to the point to be tested.
In some embodiments, the short circuit testing device further comprises a core board, the testing unit and the control unit being disposed on the core board.
In some embodiments, the control unit is a control circuit having an FPGA chip.
In some embodiments, the test unit and the point under test are electrically connected by a spring test pin.
In some embodiments, the carrier plate is provided with a spring shaft, and the carrier plate is connected with the core plate through the spring shaft; the spring shaft has a natural length that is greater than or equal to the length of the spring test needle.
In some embodiments, the short circuit test apparatus further comprises:
the box body is arranged outside the core plate, and the carrier plate is connected with the box body through the spring shaft; the box body is provided with a second through hole, and the second through hole is correspondingly arranged with the first through hole.
In some embodiments, the short circuit test apparatus further comprises:
the guide rod is provided with a first guide rod end and a second guide rod end which are oppositely arranged, and the first guide rod end is connected with the box body;
the pressing plate is provided with a guide hole, and the guide rod passes through the guide hole so as to enable the pressing plate to move along the direction of the guide rod; the pressing plate is also provided with a fixing pin which moves along a first direction Z during working so as to realize complete contact between the point to be tested and the spring test needle; the fixing pins have a first dimension A in the first direction Z, the circuit board to be tested has a second dimension B in the first direction Z, and the first dimension A is larger than the second dimension B.
In some embodiments, the short circuit test device further comprises a power mechanism comprising:
the connecting rod is provided with a first connecting rod end and a second connecting rod end;
the handle comprises a hand holding part, a first connecting part and a second connecting part which are sequentially connected; the first connecting part is connected with the first connecting rod end;
the compression bar comprises a first compression bar end and a second compression bar end; the first pressing rod end is connected with the second connecting rod end, and the second pressing rod end is connected with the pressing plate;
the fixing seat is provided with a first fixing end, a second fixing end and a third fixing end; the first fixed end is connected with the second connecting part, and the second fixed end is connected with the first compression bar end.
In some embodiments, the short circuit test apparatus further comprises a mounting bracket comprising:
the first cross beam is connected with the third fixed end;
the second cross beam is connected with the second guide rod end;
and the strut is connected with the first cross beam, and the strut is connected with the second cross beam.
In some embodiments, the short circuit test device further comprises a short circuit warning unit, the short circuit warning unit and the test unit being electrically connected.
In some embodiments, the short circuit warning unit comprises an indicator light and/or a buzzer.
Accordingly, an embodiment of the present application provides a short circuit testing device, which is used in any one of the foregoing short circuit testing devices, where the short circuit testing circuit includes:
the comparator is used for comparing the test voltage of the to-be-tested point with a preset reference voltage and generating a comparison result;
the switch is used for outputting a warning information sending signal according to the comparison result;
and the warning unit is used for sending out warning information according to the warning information sending signal.
In some embodiments, the comparator includes a first comparison input, a second comparison input, and a first comparison output; the first comparison input end inputs the test voltage, the second comparison input end inputs the reference voltage, and the first comparison output end outputs the comparison result;
the switch comprises a first switch input end and a first switch output end; the first switch input end is coupled with the first comparison output end, and the first switch output end outputs the warning information sending signal;
the warning unit comprises a first warning input end, and the first warning input end is coupled with the first switch output end.
Correspondingly, the embodiment of the application provides a short circuit test method, wherein the short circuit test device is adopted for testing, or the short circuit test circuit is adopted for testing; the method comprises the following steps:
placing a circuit board to be tested in a placing groove;
the test unit is electrically connected with a point to be tested on the circuit board to be tested through a first through hole;
and the control unit controls the test unit to perform short circuit test on the point to be tested.
Compared with the prior art, the embodiment of the application provides a short circuit testing device which comprises a carrier plate and a core plate; the carrier plate is provided with a placing groove, and the shape of the placing groove corresponds to that of the circuit board to be tested; the placing groove is provided with first through holes, and the positions and the number of the first through holes are determined according to points to be tested of the circuit board to be tested; the core board comprises a plurality of test units, each test unit is electrically connected with one point to be tested through a first through hole, and the test units are used for testing whether the point to be tested has a short circuit fault or not; the core board also comprises a control unit, wherein the control unit is electrically connected with the test unit and is used for controlling the test unit to test the short circuit of the circuit board to be tested and sending out a test result. Therefore, all the test units can be controlled to perform short circuit test on the circuit board to be tested at the same time only by operating the control unit, so that the circuit board to be tested with more points to be tested can also perform short circuit test accurately, and the efficiency of the short circuit test of the circuit board is improved.
Compared with the prior art, the embodiment of the application provides a short circuit test circuit which comprises a comparator, a switch and a warning unit; the comparator is used for comparing the test voltage of the to-be-tested point with a preset reference voltage and generating a comparison result; the switch is used for outputting a warning information sending signal according to the comparison result; the warning unit is used for sending out warning information according to the warning information sending signal. Therefore, the short circuit test circuit is different from the traditional universal meter that two points to be tested need to be electrically connected simultaneously, and the short circuit test circuit can detect whether a short circuit exists at the point to be tested by only electrically connecting the point to be tested through setting a constant reference voltage, so that the efficiency of the short circuit test of the circuit board is further improved.
Compared with the prior art, the embodiment of the application provides a short circuit test method, which comprises the following steps: placing a circuit board to be tested in a placing groove; the test unit is electrically connected with a point to be tested on the circuit board to be tested through the first through hole; the control unit controls the test unit to perform short circuit test on the to-be-tested point. Therefore, the automatic short circuit test of the circuit board to be tested can be realized by the test unit and the control unit only by placing the circuit board to be tested in the placing groove, and the efficiency of the short circuit test of the circuit board is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly introduced below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic structural diagram of a short circuit testing device according to an embodiment of the present application;
fig. 2 is a schematic diagram of a power circuit of a core board in a short circuit testing device according to an embodiment of the present application;
fig. 3 is a schematic diagram of a driving circuit of a core board in a short circuit testing device according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of a short circuit testing device according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a box in a short circuit testing device according to an embodiment of the present application;
fig. 6 is a schematic diagram of an internal structure of a box in a short circuit testing device according to an embodiment of the present application;
fig. 7 is a schematic structural diagram of a pressing plate in a short circuit testing device according to an embodiment of the present application;
fig. 8 is a schematic diagram of a first dimension and a second dimension in a short circuit testing device according to an embodiment of the present disclosure;
fig. 9 is a schematic structural diagram of a power mechanism in a short circuit testing device according to an embodiment of the present disclosure;
fig. 10 is a schematic structural diagram of a mounting rack in a short circuit testing device according to an embodiment of the present application;
fig. 11 is a schematic structural diagram of a short circuit test circuit according to an embodiment of the present application;
reference numerals: 100-supporting plate; 110-a placement tank; 120-a first through hole; 130-spring shaft; 200-core plate; 210-a test unit; 220-a control unit; 300-spring test needle; 400-box body; 410-a second through hole; 500-guide rod; 510-a first guide bar end; 520-second guide bar end; 600-pressing plate; 610-vias; 620-fixing pins; 700-power mechanism; 710-a connecting rod; 711-a first link end; 712-second link end; 720-handle; 721-hand grip; 722—a first connection; 723-a second connection; 730-a compression bar; 731-a first presser bar end; 732-a second presser bar end; 740-fixing seat; 741-a first fixed end; 742-a second fixed end; 743-a third fixed end; 800-mounting frame; 810-a first beam; 820-a second beam; 830-struts; 900-short circuit warning unit; 910-indicator lights; 920-buzzer; a is a first dimension; b is a second dimension; z is the first direction.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It will be apparent that the described embodiments are only some, but not all, of the embodiments of the present application. All other embodiments, which can be made by those skilled in the art based on the embodiments herein without making any inventive effort, are intended to be within the scope of the present application.
Referring to fig. 1, a schematic structural diagram of a short circuit testing device provided in an embodiment of the present application is provided, where the short circuit testing device is used for testing a circuit board to be tested, the circuit board to be tested includes a point to be tested, and the device includes a carrier board 100, a testing unit 210 and a control unit 220.
The carrier 100 is provided with a placement groove 110, and the placement groove 110 is provided with a first through hole 120. The test unit 210 is aligned to the first through hole 120, so that the test unit 210 is electrically connected with the point to be tested through the first through hole 120 when in operation; the control unit 220 is connected to the test unit 210 to control the test unit 210 to test the short circuit to be tested and send out the test result.
Specifically, the short circuit testing apparatus of the present application, as a special custom apparatus, may set the placement groove 110 and the first through hole 120 according to the shape and size of the circuit board to be tested, and the number and positions of the points to be tested. The method is particularly suitable for short circuit test of the circuit board to be tested in a manual production line or a semi-automatic production line.
Specifically, the control unit 220 is a control circuit with an FPGA chip, and under the control of the control unit 220, compared with the conventional short circuit test, the test point needs to be detected by using two test probes of the universal meter, and the present application can detect whether a short circuit exists at one test point only by using one test unit. In addition, the placement of the placement groove 110 and the first through hole 120 may improve positioning accuracy.
In one embodiment, the short circuit testing apparatus further includes a core board 200, and the testing unit 210 and the control unit 220 are disposed on the core board 200.
Referring to fig. 2, a schematic power circuit diagram of a core board in a short circuit testing device according to an embodiment of the present application is shown. The power supply input of the power supply circuit is direct current 5V, and the power supply circuit is derived from a universal 220V-to-5V direct current adapter, and then a stable voltage signal required by the operation of the control unit 220 on the core board 200 can be obtained through the power supply management control unit and the power supply module.
Referring to fig. 3, a schematic diagram of a driving circuit of a core board in a short circuit testing device according to an embodiment of the present application is shown. The driving circuit of the core board 200 is an RS485 driving circuit, and the matching control unit 220 can upload the test result to external control equipment or monitoring equipment so as to monitor the test condition of the circuit board to be tested in real time.
Referring to fig. 4, another schematic structural diagram of a short circuit testing device according to an embodiment of the present application is provided. In one embodiment, the test unit 210 and the point under test may be electrically connected by a spring test pin 300.
In one embodiment, the carrier plate 100 is provided with a spring shaft 130, and the carrier plate 100 is connected to the core plate 200 through the spring shaft 130; the natural length of spring shaft 130 is greater than or equal to the length of spring test needle 300.
Specifically, when the board to be tested is naturally placed, there is a problem that a gap or a connection surface is insufficient between the point to be tested and the spring test needle 300, so that the electrical connection between the point to be tested and the spring test needle 300 is failed. The spring shaft 130 can make full contact between the point to be tested and the spring test needle 300 by pushing the ballast plate 100 down, so that the electrical connection between the point to be tested and the spring test needle 300 is ensured to be effective, and the final short circuit test result is ensured to be effective. Wherein, the natural length refers to the length of the spring test needle 300 when the spring test needle 300 is not subject to an external force.
Referring to fig. 5, a schematic structural diagram of a box in a short circuit testing device according to an embodiment of the present application is provided; fig. 6 is a schematic diagram of an internal structure of a box in a short circuit testing device according to an embodiment of the present application.
In one embodiment, the short circuit testing apparatus further includes a case 400. The box 400 is arranged outside the core plate 200, and the carrier plate 100 is connected with the box 400 through the spring shaft 130; the case 400 is provided with a second through hole 410, and the second through hole 410 is disposed corresponding to the first through hole 120.
Specifically, the case 400 may provide a certain protection for the internal structure. In addition, according to the actual use requirement, the box 400 can be additionally provided with a power socket, a communication interface, an operation case and other structures so as to realize more comprehensive functions.
Specifically, the number of the second through holes 410 and the number of the first through holes 120 are disposed correspondingly, and the positions of the second through holes 410 and the positions of the first through holes 120 are disposed correspondingly.
Referring to fig. 7, a schematic structural diagram of a pressing plate in a short circuit testing device according to an embodiment of the present application is provided; fig. 8 is a schematic diagram of a first dimension and a second dimension in a short circuit testing device according to an embodiment of the present application.
In one embodiment, the short circuit testing apparatus further includes a guide bar 500 and a pressing plate 600. The guide rod 500 is provided with a first guide rod end 510 and a second guide rod end 520 which are oppositely arranged, and the first guide rod end 510 is connected with the box 400; the pressing plate 600 is provided with a guide hole 610, and the guide rod 500 passes through the guide hole 610 to move the pressing plate 600 in the direction of the guide rod 500; the pressing plate 600 is also provided with a fixing pin 620, and the fixing pin 620 moves along a first direction Z during operation so as to realize complete contact between the to-be-measured point and the spring test needle 300; the fixing pin 620 has a first dimension a in the first direction Z, and the circuit board to be tested has a second dimension B in the first direction Z, and the first dimension a is greater than the second dimension B.
Specifically, the platen 600 may apply a more uniform pressure to the carrier plate 100, resulting in uniform contact between the spring test pins 300 and the points under test; the guide rod 500 defines a moving path for the movement of the pressing plate 600, so that dislocation is avoided in the pressing process of the pressing plate 600, and uniform contact between the spring test needle 300 and the point to be tested is further ensured.
Referring to fig. 9, a schematic structural diagram of a power mechanism in a short circuit testing device according to an embodiment of the present application is provided.
In one embodiment, the short circuit testing apparatus further comprises a power mechanism 700. The power mechanism 700 includes a link 710, a handle 720, a plunger 730, and a holder 740.
The link 710 is provided with a first link end 711 and a second link end 712; the handle 720 includes a grip 721, a first connection portion 722, and a second connection portion 723, which are sequentially connected; the first connection portion 722 and the first connection rod end 711 are connected; the pressing lever 730 includes a first pressing lever end 731 and a second pressing lever end 732; the first link end 731 is connected to the second link end 712, and the second link end 732 is connected to the platen 600; the holder 740 is provided with a first fixed end 741, a second fixed end 742 and a third fixed end 743; the first fixing end 741 is connected to the second connecting portion 723, and the second fixing end 742 is connected to the first presser end 731.
Specifically, when the platen 600 is directly depressed with the palm, the position of the palm depression also affects the uniform effect of the platen 600, and thus the power mechanism 700 is provided. By fixedly disposing the pressing lever 730 at the center of the pressing plate 600, the pressing plate 600 can provide a uniform pressure every time it is pressed down. The arrangement of the connecting rod 710, the handle 720, the pressing rod 730 and the fixing base 740 in the application also utilizes the labor-saving lever principle, and only a small force needs to be applied to the handle 720, so that the pressing plate 600 can be uniformly pressed down, and the effect of the carrier plate 100 to the corresponding position can be realized.
Referring to fig. 10, a schematic structural diagram of a mounting frame in a short circuit testing device according to an embodiment of the present application is provided.
In one embodiment, the short circuit testing apparatus further comprises a mounting frame 800, the mounting frame 800 comprising a first beam 810, a second beam 820, and a strut 830. The first beam 810 is connected to the third fixed end 743; the second cross beam 820 is connected to the second rod end 520; the strut 830 is coupled to the first beam 810 and the strut 830 is coupled to the second beam 820.
Specifically, the mounting bracket 800 provides a supporting function for the entire short circuit testing device, thereby improving the stability and reliability of the short circuit testing device.
In one embodiment, the short circuit testing device further includes a short circuit warning unit 900, where the short circuit warning unit 900 and the testing unit 210 are in one-to-one correspondence and electrically connected. The short-circuit warning unit 900 may make it more straightforward for an operator to obtain the result of the short-circuit test, and preferably the short-circuit warning unit 900 includes an indicator light 910 and/or a buzzer 920. The indicator lamp 910 provides light warning information, the buzzer 920 provides sound warning information, the indicator lamp 910 and the buzzer 920 can be arranged in the box 400, the box 400 is provided with corresponding structures, such as a through hole is formed in a corresponding position of the indicator lamp 910 to transmit light, or a sound amplifying hole is formed in a corresponding position of the buzzer 920 to enhance the effect of the sound warning information. The indicator light 910 and the buzzer 920 may also be positioned in other locations that facilitate the operator's access to information. The indicator light 910 and the buzzer 920 may also set different warning information according to different usage habits, such as red light for indicating a short-circuit fault, green light for indicating no short-circuit fault, etc.
In an embodiment, the core board 200 may further be provided with a device self-checking function, and accordingly, a self-checking key is provided on the case 400, so that it may be noted that the indicator light 910 and the buzzer 920 of the test unit 210 are turned on, and whether the short circuit test device has a fault is determined by the light of the indicator light 910 and the sound of the buzzer 920.
The second embodiment of the present application provides a short-circuit testing circuit, which is used in the short-circuit testing device. Referring to fig. 11, a schematic structural diagram of a short circuit test circuit according to an embodiment of the present application is provided, where the short circuit test circuit includes a comparator, a switch and a warning unit. The comparator is used for comparing the test voltage of the to-be-tested point with a preset reference voltage and generating a comparison result; the switch is used for outputting a warning information sending signal according to the comparison result; the warning unit is used for sending out warning information according to the warning information sending signal.
Specifically, the comparator comprises a first comparison input end, a second comparison input end and a first comparison output end; the first comparison input end inputs the test voltage, the second comparison input end inputs the reference voltage, and the first comparison output end outputs the comparison result; the switch comprises a first switch input end and a first switch output end; the first switch input end is coupled with the first comparison output end, and the first switch output end outputs a warning information sending signal; the warning unit comprises a first warning input end, and the first warning input end is coupled with the first switch output end.
In one embodiment, the comparator is an AD8500 control unit and the switch is a triode. The warning unit includes an indication lamp circuit DS1 of the indication lamp 910 and/or a buzzer circuit P3 of the buzzer 920.
Specifically, when the voltage U of the first comparison input terminal is detected 1 Higher than the second comparison input voltage U 2 When the first comparison output end outputs high levelThe same as the AD8500 chip power supply voltage VCC is 3.3V; conversely, when the voltage U at the first comparison input terminal is detected 1 Lower than the second comparison input voltage U 2 The first comparison output terminal outputs a low level. The third transistor Q1 is used as a switch in the circuit, the first comparison output end is in a high level, the switch is in an on state, the indicator lamp circuit DS1 is lightened, and the buzzer circuit P3 sounds; when the first comparison output terminal is at a low level, the switch is in an off state, and the indicator lamp circuit DS1 and the buzzer circuit P3 are in an off state.
Voltage U of first comparison input terminal 1 The determination is made according to the following equation:
U 1 ＝{R 7 /(R 2 +R 7 )}*VCC (I)
wherein U is 1 For the voltage at the first comparison input, R 2 R is the resistance of R2 in FIG. 11 7 For the resistance value of R7 in fig. 11, VCC is the supply voltage in fig. 11.
Voltage U of the second comparison input terminal 2 The determination is made according to the following equation:
U 2 ＝{R T /(R T +R 1 )}*VCC (II)
wherein U is 2 For the voltage at the first comparison input, R 1 R is the resistance of R1 in FIG. 11 T For the resistance between test_point and COM in fig. 11, i.e., the resistance between two TEST POINTs introduced, VCC is the supply voltage in fig. 11.
Let U 1 ＝U 2 Obtaining R T =10Ω, i.e. when R T U when less than 10Ω 1 ＞U 2 The first comparison output end outputs a high level, the indicator lamp circuit DS1 is lightened, and the buzzer circuit P3 sounds; when R is T U at > 10Ω 3 ＜U 4 The first comparison output terminal outputs a low level, and the indicator lamp circuit DS1 and the buzzer circuit P3 are in an off state.
In one embodiment, the resistance R of R7 in FIG. 11 can also be adjusted 7 To adjust the highest and lowest thresholds of the short circuit test circuit alarm.
The third embodiment of the application provides a short circuit test method, which adopts the short circuit test device to test or adopts the short circuit test circuit to test; the method comprises the following steps:
step 101, placing a circuit board to be tested in a placing groove 110;
step 102, the test unit 210 is electrically connected to the to-be-tested point on the to-be-tested circuit board through the first through hole 120;
step 103, the control unit 220 controls the test unit to perform short circuit test on the point to be tested.
Therefore, the automatic short circuit test of the circuit board to be tested can be realized by the test unit and the control unit only by placing the circuit board to be tested in the placing groove, and the efficiency of the short circuit test of the circuit board is improved.
Further, the short circuit test method further comprises:
step 104, the power mechanism 700 is operated to drive the pressing plate 600 to move along the guide rod 500 in the first direction Z, and the circuit board to be tested is pressed down, so as to achieve complete contact between the point to be tested and the spring test needle 300, thereby improving the accuracy of the short circuit test.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and for parts of one embodiment that are not described in detail, reference may be made to related descriptions of other embodiments.
The foregoing describes in detail a short-circuit testing device, a short-circuit testing circuit and a short-circuit testing method provided in the embodiments of the present application, and specific examples are applied to illustrate the principles and implementations of the present application, where the descriptions of the foregoing embodiments are only used to help understand the technical solutions and core ideas of the present application; those of ordinary skill in the art will appreciate that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application.

Claims (14)

1. A short circuit testing device, the short circuit testing device comprising:
the support plate (100), the support plate (100) is provided with a placing groove (110), and the placing groove (110) is provided with a first through hole (120);
a test unit (210) and a control unit (220); wherein the test unit (210) is aligned to the first through hole (120), so that the test unit (210) is electrically connected with a point to be tested through the first through hole (120) when in operation; the control unit (220) is connected with the test unit (210) to control the short circuit test of the test unit (210) to the to-be-tested point.
2. The short-circuit testing device according to claim 1, further comprising a core board (200), the testing unit (210) and the control unit (220) being arranged on the core board (200).
3. The short-circuit testing device according to claim 1, characterized in that the control unit (220) is a control circuit with an FPGA chip.
4. A short-circuit testing device according to claim 2, characterized in that the test unit (210) and the point under test are electrically connected by means of a spring test pin (300).
5. The short-circuit testing device according to claim 4, characterized in that the carrier plate (100) is provided with a spring shaft (130), the carrier plate (100) being connected to the core plate (200) by means of the spring shaft (130); the spring shaft (130) has a natural length that is greater than or equal to the length of the spring test needle (300).
6. The short circuit testing device according to claim 5, wherein the short circuit testing device further comprises:
the box body (400) is arranged outside the core plate (200), and the carrier plate (100) is connected with the box body (400) through the spring shaft (130); the box body (400) is provided with a second through hole (410), and the second through hole (410) is arranged corresponding to the first through hole (120).
7. The short circuit testing apparatus according to claim 6, wherein the short circuit testing apparatus further comprises:
a guide rod (500), wherein the guide rod (500) is provided with a first guide rod end (510) and a second guide rod end (520) which are oppositely arranged, and the first guide rod end (510) is connected with the box body (400);
a pressing plate (600), wherein the pressing plate (600) is provided with a guide hole (610), and the guide rod (500) passes through the guide hole (610) so as to enable the pressing plate (600) to move along the direction of the guide rod (500); the pressing plate (600) is further provided with a fixing pin (620), and the fixing pin (620) moves along a first direction Z during operation so as to realize the contact between the point to be tested and the spring test needle (300); the fixing pin (620) has a first dimension A in the first direction Z, and the circuit board to be tested has a second dimension B in the first direction Z, wherein the first dimension A is larger than the second dimension B.
8. The short circuit testing device according to claim 7, further comprising a power mechanism (700), the power mechanism (700) comprising:
a link (710), the link (710) being provided with a first link end (711) and a second link end (712);
a handle (720), the handle (720) comprising a hand grip (721), a first connection (722) and a second connection (723) connected in sequence; the first connecting part (722) is connected with the first connecting rod end (711);
a compression bar (730), the compression bar (730) comprising a first compression bar end (731) and a second compression bar end (732); the first press bar end (731) is connected to the second link end (712), and the second press bar end (732) is connected to the press plate (600);
a fixing base (740), wherein the fixing base (740) is provided with a first fixing end (741), a second fixing end (742) and a third fixing end (743); the first fixed end (741) is connected to the second connecting portion (723), and the second fixed end (742) is connected to the first rod end (731).
9. The short circuit testing device according to claim 8, further comprising a mounting frame (800), the mounting frame (800) comprising:
a first cross beam (810), the first cross beam (810) being connected to the third fixed end (743);
a second cross beam (820), the second cross beam (820) being connected to the second guide rod end (520);
-a strut (830), said strut (830) being connected to said first beam (810), said strut (830) being connected to said second beam (820).
10. The short-circuit testing device according to claim 1, further comprising a short-circuit warning unit (900), the short-circuit warning unit (900) being electrically connected to the testing unit (210).
11. The short-circuit testing device according to claim 10, characterized in that the short-circuit warning unit (900) comprises an indicator lamp (910) and/or a buzzer (920).
12. A short circuit testing circuit for a short circuit testing device according to any of claims 1-11, the short circuit testing circuit comprising:
the comparator is used for comparing the test voltage of the to-be-tested point with a preset reference voltage and generating a comparison result;
the switch is used for outputting a warning information sending signal according to the comparison result;
and the warning unit is used for sending out warning information according to the warning information sending signal.
13. A short circuit testing circuit according to claim 12, wherein:
the comparator comprises a first comparison input end, a second comparison input end and a first comparison output end; the first comparison input end inputs the test voltage, the second comparison input end inputs the reference voltage, and the first comparison output end outputs the comparison result;
the switch comprises a first switch input end and a first switch output end; the first switch input end is coupled with the first comparison output end, and the first switch output end outputs the warning information sending signal;
the warning unit comprises a first warning input end, and the first warning input end is coupled with the first switch output end.
14. A short circuit testing method, characterized in that a short circuit testing device according to any one of claims 1-11 is used, or a short circuit testing circuit according to any one of claims 12-13 is used; the method comprises the following steps:
placing a circuit board to be tested in the placing groove (110);
the test unit (210) is electrically connected with the point to be tested on the circuit board to be tested through the first through hole (120);
the control unit (220) controls the test unit (210) to perform short circuit test on the point to be tested.
CN202310190599.9A 2023-03-01 2023-03-01 Short circuit testing device, short circuit testing circuit and short circuit testing method Pending CN116256618A (en)

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Application Number Priority Date Filing Date Title
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CN106483421A (en) * 2016-11-29 2017-03-08 深圳市燕麦科技股份有限公司 Open-short circuit system and method for testing between one kind is point-to-point
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CN102466737A (en) * 2010-11-15 2012-05-23 亚旭电脑股份有限公司 Auxiliary detection jig
CN106483421A (en) * 2016-11-29 2017-03-08 深圳市燕麦科技股份有限公司 Open-short circuit system and method for testing between one kind is point-to-point
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