CN116243033A - Electric contact probe device - Google Patents
Electric contact probe device Download PDFInfo
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- CN116243033A CN116243033A CN202111486172.0A CN202111486172A CN116243033A CN 116243033 A CN116243033 A CN 116243033A CN 202111486172 A CN202111486172 A CN 202111486172A CN 116243033 A CN116243033 A CN 116243033A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T10/00—Road transport of goods or passengers
- Y02T10/60—Other road transportation technologies with climate change mitigation effect
- Y02T10/70—Energy storage systems for electromobility, e.g. batteries
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Abstract
The application discloses an electric contact probe device, but this application wide application is in semiconductor technology field. The electric contact probe device comprises a fixed plate, wherein a plurality of mounting holes are formed in the fixed plate; the probe comprises a needle bar, a bulge and an axial annular groove, wherein the bulge and the axial annular groove are arranged on the needle bar, and the probe is arranged in the mounting hole; one end of the spring is arranged in the annular groove, and the other end of the spring is contacted with the fixed plate; the mounting hole comprises an upper half hole matched with the bulge and a lower half hole matched with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole. This application has shifted between fixed plate and the probe with the elasticity flexible function of probe itself among the prior art to make electric contact probe device have better reliability, and do not need to weld on the fixed plate when the probe uses, in the upper half hole of direct insertion and embedding mounting hole through the probe boss during the installation, the probe card is in the lower half hole, thereby makes more convenient when dismantling the change.
Description
Technical Field
The present application relates to the field of semiconductor technology, and more particularly, to an electrical contact probe apparatus.
Background
In modern life, various electrical devices and test equipment are not separated, and in these devices, electrical connection means are indispensable. The complex circuit environment requires various devices for connection, and therefore, the safety and reliability of electrical connection are extremely important parts for ensuring the operational reliability of electrical appliances and test equipment no matter what uses of the electrical appliance. With the miniaturization of various electrical devices, the electrical contact probe device for testing electrical connection is required to bear large current load, so that the probe has high working temperature and short working life, and therefore, the probe needs to be replaced frequently, and the replacement process is complicated due to the structural design of the existing electrical contact probe device.
Disclosure of Invention
The following is a summary of the subject matter described in detail herein. This summary is not intended to limit the scope of the claims.
Embodiments of the present application provide an electrical contact probe apparatus that overcomes the deficiencies in the prior art by improving the structural design of the electrical contact probe apparatus.
An embodiment of the present application provides an electrical contact probe apparatus, comprising:
the fixing plate is provided with a plurality of mounting holes;
the probe is arranged in the mounting hole and comprises a needle bar, a protrusion and an axial annular groove, wherein the protrusion and the axial annular groove are arranged on the needle bar;
one end of the spring is arranged in the annular groove, and the other end of the spring is contacted with the fixed plate;
the mounting hole comprises an upper half hole matched with the bulge and a lower half hole matched with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole.
Further, one end of the probe is provided with a wiring structure for welding an electrical connection wire.
Further, one end of the probe is a probe head, and the probe head is at least one of the following shapes: flat head, pointed head, nine-jaw head and round head.
Further, the needle bar is a solid needle bar.
Further, the fixing plate is a polypropylene material plate, and is also provided with mounting fixing holes.
Further, the number of the mounting holes is 13.
Further, a bushing is arranged in the mounting hole, and one end of the bushing is provided with a semi-through groove; the protrusion is arranged in the semi-through groove.
Further, the bushing is further provided with a guide groove, and the guide groove penetrates through the bushing.
Further, the other end of the bushing has a stop structure.
Further, the natural length of the spring is smaller than the distance between the bottom of the annular groove and the fixed plate.
The beneficial effects of this application include: an electrical contact probe apparatus in an embodiment of the present application includes: the probe comprises a needle rod, a bulge and an axial annular groove, wherein the bulge and the axial annular groove are arranged on the needle rod; one end of the spring is arranged in the annular groove, and the other end of the spring is contacted with the fixed plate; the mounting hole comprises an upper half hole matched with the bulge and a lower half hole matched with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole. This application has shifted between fixed plate and the probe with the elasticity flexible function of probe itself among the prior art to make electric contact probe device have better reliability, and do not need to weld on the fixed plate when the probe uses, in the upper half hole of direct insertion and embedding mounting hole through the probe boss during the installation, the probe card is in the lower half hole, thereby makes more convenient when dismantling the change.
Drawings
FIG. 1 is a schematic diagram of an electrical contact probe apparatus in an embodiment of the present application;
FIG. 2 is a schematic diagram of a probe structure of an electrical contact probe apparatus in an embodiment of the present application;
FIG. 3 is a schematic view of a mounting plate structure of an electrical contact probe apparatus in an embodiment of the present application;
FIG. 4 is a schematic diagram of a bushing structure of an electrical contact probe apparatus in an embodiment of the present application;
fig. 5 is a structural exploded view of an electrical contact probe apparatus in an embodiment of the present application.
Wherein reference numerals referred to in fig. 1-fig. are explained as follows: 1-probe, 2-spring, 3-bushing, 4-fixed plate, 5-mounting hole, 6-mounting fixed hole, 11-wiring structure, 12-bump, 13-axial annular groove, 31-half through groove, 32-guiding groove, 33-sleeve structure.
Detailed Description
For the purposes of making the objects, technical solutions and advantages of the present application more apparent, embodiments of the present application will be described in detail hereinafter with reference to the accompanying drawings. It should be noted that, in the case of no conflict, the embodiments and features in the embodiments may be arbitrarily combined with each other.
In order to make the present application solution better understood by those skilled in the art, the following description will be made in detail and with reference to the accompanying drawings in the embodiments of the present application, it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, shall fall within the scope of the present application.
The terms "first," "second," "third," and "fourth" and the like in the description and in the claims of this application and in the drawings, are used for distinguishing between different objects and not for describing a particular sequential order. Furthermore, the terms "comprise" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those listed steps or elements but may include other steps or elements not listed or inherent to such process, method, article, or apparatus.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the present application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.
The electric contact probe is a high-end precise electronic hardware component, and is generally used as a contact medium for electric test in the field of ICT-PCBA (functional test of assembly cards). The main work of the electric contact probe is to conduct current and complete testing tasks. As precision devices required in many fields of electronic design, many types of probes such as current pins, positioning pins, switching pins, capacitance pins, high-frequency pins, and the like have been developed in the related fields. The common general probe structure is generally divided into a needle sleeve, a needle rod, a spring and the like, wherein the spring is arranged in the needle sleeve, the needle rod is inserted into the needle sleeve, and the electric contact work is completed by the needle rod compressing the spring during work.
In an electrical contact test environment in the prior art, the working process of the original test environment is as follows: the probes are the common universal probes, the common universal probes can be fixed on the plastic plate through welding, and the plastic plate of the electric contact probe device can move back and forth by pressing a mechanical handle during testing, so that the probes can be contacted with and separated from a testing device along with the back and forth movement of the plastic plate. Because the needle bar is in shaft hole interference fit with the needle sleeve, and the spring is arranged in the needle sleeve, the elastic displacement and the compaction effect of the needle head can be realized when the spring is compressed and extended.
However, when testing a test module with a smaller size, for example, a test module with a length of 4cm or less, it is necessary to draw out more probes than the above-mentioned common general-purpose probes, and the working current of the probes can bear 60A at maximum, and current impact is accompanied in actual operation, so that the probes bear current load, and the current load acts on the small contact device of the type of the probes, so that the working temperature of the probes per se is too high, and the working life of the probes is short. Therefore, after the probe is operated for a period of time, the contact surface of the needle sleeve and the needle head can be difficult to avoid generating a black oxide layer, and the air gap between the needle sleeve and the needle head is increased, so that the interference fit between the needle sleeve and the needle head is invalid. If the probe is not replaced in time, an arc is generated in the opening and closing contact process of the probe with interference fit failure in operation, and the tested device can be damaged in severe cases. However, since the probe structure of the above-mentioned general-purpose probe is soldered to the plastic plate, the replacement process thereof is complicated.
In addition, the electrical performance of the contact elements such as the electrical contact probes is affected by various factors, wherein the use of the contact elements can be affected by the plating layer, the environmental temperature and humidity, the surface shape, the load, the impact, the vibration and other factors, and the phenomena such as surface fusion welding and contact gap increase can also occur along with the increase of the use time. Therefore, it is desirable to reduce the resistance of the contact and the complexity of the overall structure as much as possible, thereby ensuring reliability during use.
Based on this, the embodiment of the present application provides an electrical contact probe apparatus, including: the fixing plate is provided with a plurality of mounting holes and probes, the probes are mounted in the mounting holes and comprise a needle bar, and a bulge and an axial annular groove which are arranged on the needle bar; one end of the spring is arranged in the annular groove, and the other end of the spring is contacted with the fixed plate; the mounting hole comprises an upper half hole matched with the bulge and a lower half hole matched with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole. This application has shifted between fixed plate and the probe with the elasticity flexible function of probe itself among the prior art to make electric contact probe device have better reliability, and do not need to weld on the fixed plate when the probe uses, in the upper half hole of direct insertion and embedding mounting hole through the probe boss during the installation, the probe card is in the lower half hole, thereby makes more convenient when dismantling the change.
Referring to fig. 1-2, fig. 1 is a schematic structural diagram of an electrical contact probe apparatus in an embodiment of the present application, and fig. 2 is a schematic structural diagram of a probe of an electrical contact probe apparatus in an embodiment of the present application, where the electrical contact probe apparatus includes:
the fixing plate 4 is provided with a plurality of mounting holes 5;
a probe 1 mounted in the mounting hole 5, the probe 1 including a needle bar 14, a projection 12 provided on the needle bar 14, and an axial annular groove 13;
a spring 2, wherein one end of the spring 2 is arranged in the annular groove, and the other end is contacted with the fixed plate 4;
the mounting hole 5 comprises an upper half hole matched with the bulge and a lower half hole matched with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole.
The electric contact probe device in the embodiment of the application realizes structural improvement through the structural design of the probe and the open-pore structural design of the fixing plate. Wherein, cancelled through shaft hole interference fit between needle bar and the needle cover in this application embodiment, and the inside such traditional probe structural design that has the spring of needle cover. Specifically, this application embodiment sets up the spring between probe and fixed plate, fixes and exerts pressure the spring through axial ring channel and the fixed plate that probe structure itself had, through set up half through-hole on the fixed plate, cooperation probe setting is at the protruding structure on the needle bar, realizes the upper and lower shuttle of probe in the mounting hole. When the electric contact probe device disclosed by the embodiment of the application works, firstly, the probe head is contacted with the corresponding electric connection point of the module to be tested, then the fixed plate is forced to move forwards, the spring is continuously compressed in the moving process, and at the moment, the probe moves backwards along the semi-through groove of the fixed plate, so that the electric contact between the electric contact probe and the module to be tested is completed.
Notably, the spring is mounted on the probe with the circumference of the spring being greater than the circumferential length of the shank portion having the boss. The natural length of the spring is less than the distance between the bottom of the annular groove and the fixed plate, so that when no external force is applied to the fixed plate or the probe, the spring has a certain initial compression amount, thereby stabilizing the pre-compression of the electric contact probe device.
The electrical contact probe device in the embodiment of the application transfers the elastic telescopic function to the fixing plate by sacrificing the telescopic function of the probe in the prior art, and the better reliability is obtained. Under the small-size limitation of the original test environment, the probe with less structural redundancy can adopt a thicker rod body, and the electric contact probe device can not generate internal abrasion after being simplified. The electric contact probe device is used without being welded on a fixed plate as in the prior art, and is directly inserted into a mounting hole and is embedded into a half slot through a probe boss during mounting, so that the electric contact probe card is clamped in the hole.
It will be understood by those skilled in the art that the shape and structural details of the fixing plate and the shape of the probe shown in fig. 1 are not limited to the present application, and may include other fixing plate shapes and structural details different from those of the illustrated fixing plate and the shape of the probe, and in particular, the shape and structural details of the fixing plate and the shape of the probe, which are selected correspondingly, may be different according to specific requirements, and the shape of the probe, and the shape and structural details of the fixing plate and the shape of the probe listed in the embodiments of the present application are only exemplified.
Referring to fig. 2, fig. 2 is a schematic diagram of a probe structure of an electrical contact probe apparatus according to an embodiment of the present application, where the probe specifically includes: a shank 14, and a projection 12 and an axial annular groove 13 provided on the shank 14. The notch of the axial annular groove 13 arranged at the right part of the middle shaft shoulder of the needle bar 14 is opposite to the bulge 12 arranged at the left part of the middle shaft shoulder of the needle bar 14, so that after the bulge 12 enters the mounting hole, the two ends of the spring are fixed through the axial annular groove clamp and the fixing plate, the spring is prevented from being ejected out due to the opening and closing movement of the mechanism, and the spring is prevented from falling off. Wherein the protrusions 12 are adapted to move the probe in the half through hole of the fixture plate during operation and act to prevent the probe from rolling. It will be appreciated by those skilled in the art that the shapes of the needle shaft 14, the boss 12 and the axial annular groove 13 shown in fig. 2 are not limiting of the present application, and may include other boss shapes and axial annular groove shapes different from those illustrated, and in particular, the shapes of the needle shaft, the boss and the axial annular groove which are correspondingly selected may be different according to specific requirements, and the above-described needle shaft, boss and axial annular groove shapes listed in the embodiments of the present application are merely illustrative.
In the present embodiment, the needle shaft 14 is a solid needle shaft; according to a resistance formula r=ρl/S, wherein R is a probe resistance, ρ represents the resistivity of the resistor, which is determined by its own properties, L represents the length of the resistor, and S represents the cross-sectional area of the resistor; to reduce the overall electrical resistance of the electrical contact probe, the solid structure is larger than the equivalent cross-sectional area of the jacket structure and therefore the equivalent resistance is smaller for the same length and resistive material. In some embodiments, the probe may be made of a common metal material such as copper or brass. The electric contact probe adopts the solid needle bar, the temperature rise of the electric connection during normal operation is greatly reduced, the generation of contact resistance in the elastic friction process is avoided, and the stability and the service time of the electric connection testing system are improved.
Referring to fig. 2, in the embodiment of the present application, one end of the probe has a wiring structure 11, and the wiring structure 11 is used for soldering an electrical connection wire. The wiring structure 11 may be a structure that is convenient for fixing an electrical connection wire, such as a welding groove and a welding hole.
In the embodiments of the present application, the electrical contact devices between modern electronic devices are various, and there are surface contacts, point contacts, line contacts, and the like according to the contact surface form, and some fixed electrical contacts can be connected through threads, for example, multiple forms of fastening, pushing and pulling, direct insertion, and the like. Thus, the other end of the probe is a probe head, and the probe head is at least one of the following shapes: flat head, pointed head, nine-jaw head, round head, etc., can be used according to different conditions. When the probe head is flat head, the probe head is a contact plane, and the probe head is in a surface contact mode during working; when the probe head is a pointed head, the probe head is provided with 1 pointed contact, and the probe head is in a point contact mode during working; when the probe head is a round head, the probe head is a contact point or a contact plane, and the probe head can be in a line contact form or a surface contact form in operation; when the probe head is nine-jaw, the probe head is provided with nine sharp contacts, and the probe head is in a point contact mode in operation. Wherein, can adopt different probe head types according to the difference of service conditions, the number of times of opening and closing per unit time is less, and when the one-time contact time is longer, can adopt the flat head, because the contact resistance is less when the area of contact is great, can reduce the heating of long-time contact. When the opening and closing speed and the contact time are moderate, nine claw heads can be adopted, and the contact is stable. When the opening and closing speed is high, a round head can be adopted, and the capability of avoiding arcing effect caused by opening and closing discharge is high. The on-off test at low current can be performed by using a tip, and the sensitivity of the tip to low current is good. It will be appreciated by those skilled in the art that the above-mentioned probe selection methods are not limiting of the present application, and may include other choices different from the above-mentioned probe selection methods, and in particular, the corresponding probe selection methods may be different according to specific requirements, and the above-mentioned probe selection methods listed in the embodiments of the present application are only exemplary.
Referring to fig. 3, fig. 3 is a schematic view of a fixing plate structure of an electrical contact probe device according to an embodiment of the present application. The fixing plate is generally a plastic plate, and can be particularly a polypropylene plate, and the plate has the characteristics of high melting point and low density and is good in economical efficiency. The periphery of the fixing plate is also provided with mounting fixing holes 6, wherein the mounting fixing holes 6 can be threaded holes, and the periphery of the fixing plate is fixed through the cooperation of bolts and the threaded holes.
In some embodiments, a total of 13 probes are drawn when testing a 4cm long test module using an electrical contact probe device. The fixing plate may be a cuboid mechanism, and the big hole in the middle of the fixing plate shown in fig. 3 is used for installing other (original device) elements, and 13 small holes are formed in the lower right part of the fixing plate, and the small holes are the installation holes 5 of the probes. Wherein the mounting hole 5 comprises an upper half hole matched with the bulge and a lower half hole matched with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole. The full through hole penetrates through the fixing plate and is used for inserting a probe during installation; the half through hole is used for ensuring the front and back movement of the thimble during working.
In some embodiments, in order to reduce sliding friction generated by the probe in the mounting hole and avoid plastic deformation of the fixing plate during long-term use, a bushing may be provided for the electrical contact probe device, where the bushing is disposed in the mounting hole, and referring to fig. 4, fig. 4 is a schematic structural diagram of the bushing of the electrical contact probe device in the embodiment of the present application, and one end of the bushing is provided with a half-through groove 31; in the working state, the half through groove 31 corresponds to the half through hole of the mounting hole, and the boss of the probe is arranged in the half through hole and is clamped in the half through groove 31 of the bushing. In this embodiment, after the probe and the bushing are combined in the process of mounting the probe, the boss is clamped in the semi-through groove 31, and the boss and the bushing are mounted in the mounting hole together, so that the probe and the bushing can be pulled out together for uniform replacement when the probe is replaced.
In some embodiments, referring to fig. 4, one end of the bushing is provided with a semi-through slot 31; the bushing is further provided with a guide groove 32, wherein the guide groove 32 penetrates through the bushing, and when the probe is mounted, the boss passes through the mounting hole through the guide groove, and then the probe is rotated to enable the boss to enter the semi-through groove. Specifically, in the process of installing the probe, the half through groove 31 of the bushing is aligned with the upper half hole of the installation hole, namely the half through hole, after the bushing is installed successfully, then the boss is inserted into the installation hole along the guide groove 32 during the installation of the probe, the probe is rotated for half a circle after the insertion, and is embedded into the half through groove, and the lower half through groove mainly acts as a front-back movement along the groove when the probe contacts. It should be noted that the length of the half-through groove 31 may be less than or equal to the length of the upper half hole of the mounting hole, i.e., the half-through hole, so as to prevent the boss from colliding with the bottom of the upper half hole of the mounting hole, i.e., the half-through hole, when the probe shuttles inside the mounting hole.
The other end of the bushing is provided with a stop part for limiting the position of the bushing in the mounting hole, and the stop part can prevent the movement of the bushing when the guide groove completely enters the mounting hole. In some embodiments, referring to fig. 4, the other end of the bushing has a sleeve structure, which may be a thin ring or the like that is larger than the area of the hole when the probe is a cylindrical probe.
Referring to fig. 5, fig. 5 is an exploded view of the structure of an electrical contact probe apparatus in an embodiment of the present application. In an embodiment, first, the bush 3 shown in fig. 4 may be installed into the installation hole of the fixing plate 4, then the spring 2 is placed in the annular groove of the probe, the probe 1 enters the installation hole 5 along the guide groove of the bush 3, and after the boss structure passes through the bush 3, the boss is rotated to the half through groove and embedded therein by rotating the probe 1, and at this time, the length of the spring 2 is less than its natural length, wherein the natural length refers to the length of the spring without any pressure, thereby completing the combination of the probe 1 and the fixing plate 4.
The electrical contact probe device in the embodiment of the application transfers the elastic telescopic function to the fixing plate by sacrificing the telescopic function of the probe in the prior art, and the better reliability is obtained. Under the small-size limitation of the original test environment, the probe with less structural redundancy can adopt a thicker rod body, and the electric contact probe device can not generate internal abrasion after being simplified. The electric contact probe device is used without being welded on a fixed plate as in the prior art, and is directly inserted into a mounting hole and is embedded into a half slot through a probe boss during mounting, so that the electric contact probe card is clamped in the hole. The electric contact probe adopts the solid needle bar, the temperature rise of the electric connection during normal operation is greatly reduced, the generation of contact resistance in the elastic friction process is avoided, and the stability and the service time of the electric connection testing system are improved.
It should be noted that, unless otherwise specified, when a feature is referred to as being "fixed" or "connected" to another feature, it may be directly or indirectly fixed or connected to the other feature. Further, the descriptions of the upper, lower, left, right, etc. used in this disclosure are merely with respect to the mutual positional relationship of the various components of this disclosure in the drawings. As used in this disclosure, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. In addition, unless defined otherwise, all technical and scientific terms used in this example have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used in the description of the embodiments is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and/or" as used in this embodiment includes any combination of one or more of the associated listed items.
It should be understood that although the terms first, second, third, etc. may be used in this disclosure to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element of the same type from another. For example, a first element could also be termed a second element, and, similarly, a second element could also be termed a first element, without departing from the scope of the present disclosure. The use of any and all examples, or exemplary language ("e.g.," such as ") provided herein, is intended merely to better illuminate embodiments of the application and does not pose a limitation on the scope of the application unless otherwise claimed.
It should be appreciated that embodiments of the present application may be implemented or realized by computer hardware, a combination of hardware and software, or by computer instructions stored in a non-transitory computer readable memory. The methods may be implemented in a computer program using standard programming techniques, including a non-transitory computer readable storage medium configured with a computer program, where the storage medium so configured causes a computer to operate in a specific and predefined manner, in accordance with the methods and drawings described in the specific embodiments. Each program may be implemented in a high level procedural or object oriented programming language to communicate with a computer system. However, the program(s) can be implemented in assembly or machine language, if desired. In any case, the language may be a compiled or interpreted language. Furthermore, the program can be run on a programmed application specific integrated circuit for this purpose.
Furthermore, the operations of the processes described in the present embodiments may be performed in any suitable order unless otherwise indicated herein or otherwise clearly contradicted by context. The processes (or variations and/or combinations thereof) described in this embodiment may be performed under control of one or more computer systems configured with executable instructions, and may be implemented as code (e.g., executable instructions, one or more computer programs, or one or more applications), by hardware, or combinations thereof, that collectively execute on one or more processors. The computer program includes a plurality of instructions executable by one or more processors.
Further, the method may be implemented in any type of computing platform operatively connected to a suitable computing platform, including, but not limited to, a personal computer, mini-computer, mainframe, workstation, network or distributed computing environment, separate or integrated computer platform, or in communication with a charged particle tool or other imaging device, and so forth. Aspects of the present application may be implemented in machine-readable code stored on a non-transitory storage medium or device, whether removable or integrated into a computing platform, such as a hard disk, an optical read and/or write storage medium, RAM, ROM, etc., such that it is readable by a programmable computer, which when read by a computer, is operable to configure and operate the computer to perform the processes described herein. Further, the machine readable code, or portions thereof, may be transmitted over a wired or wireless network. When such media includes instructions or programs that, in conjunction with a microprocessor or other data processor, implement the steps described above, the invention described in this embodiment includes these and other different types of non-transitory computer-readable storage media. The present application also includes the computer itself when programmed according to the methods and techniques described herein.
The computer program can be applied to the input data to perform the functions described in this embodiment, thereby converting the input data to generate output data that is stored to the non-volatile memory. The output information may also be applied to one or more output devices such as a display. In a preferred embodiment of the present application, the transformed data represents physical and tangible objects, including specific visual depictions of physical and tangible objects produced on a display.
The present invention is not limited to the above embodiments, but can be modified, equivalent, improved, etc. by the same means to achieve the technical effects of the present invention without departing from the spirit and principles of the present invention. Various modifications and variations are possible in the technical solutions and/or embodiments within the scope of the application.
Claims (10)
1. An electrical contact probe apparatus, comprising:
the fixing plate is provided with a plurality of mounting holes;
the probe is arranged in the mounting hole and comprises a needle bar, a protrusion and an axial annular groove, wherein the protrusion and the axial annular groove are arranged on the needle bar;
one end of the spring is arranged in the annular groove, and the other end of the spring is contacted with the fixed plate;
the mounting hole comprises an upper half hole matched with the bulge and a lower half hole matched with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole.
2. The electrical contact probe apparatus of claim 1 wherein one end of the probe has a wiring structure for soldering electrical connection wires.
3. The electrical contact probe apparatus of claim 1, wherein the probe has a probe head at one end, the probe head having at least one of the following shapes: flat head, pointed head, nine-jaw head and round head.
4. The electrical contact probe apparatus of any one of claims 1-3, wherein the needle shaft is a solid needle shaft.
5. The electrical contact probe apparatus of claim 1, wherein the mounting plate is a plate of polypropylene material further having mounting and securing holes formed therein.
6. The electrical contact probe apparatus of claim 1, wherein the number of mounting holes is 13.
7. The electrical contact probe apparatus of claim 1, wherein a bushing is disposed in the mounting hole, and a semi-through slot is disposed at one end of the bushing; the protrusion is arranged in the semi-through groove.
8. The electrical contact probe apparatus of claim 7, wherein the bushing is further provided with a guide slot that extends through the bushing.
9. The electrical contact probe apparatus of claim 7 wherein the other end of the bushing has a stop structure.
10. The electrical contact probe apparatus of claim 1, wherein a natural length of the spring is less than a distance between the annular groove bottom and the stationary plate.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111486172.0A CN116243033A (en) | 2021-12-07 | 2021-12-07 | Electric contact probe device |
| PCT/CN2022/080724 WO2023103199A1 (en) | 2021-12-07 | 2022-03-14 | Electrical contact probe apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111486172.0A CN116243033A (en) | 2021-12-07 | 2021-12-07 | Electric contact probe device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116243033A true CN116243033A (en) | 2023-06-09 |
Family
ID=86628211
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111486172.0A Pending CN116243033A (en) | 2021-12-07 | 2021-12-07 | Electric contact probe device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN116243033A (en) |
| WO (1) | WO2023103199A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117434318B (en) * | 2023-12-20 | 2024-03-05 | 安盈半导体技术(常州)有限公司 | Combined probe card |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6824427B1 (en) * | 2003-05-13 | 2004-11-30 | 3M Innovative Properties Company | Coaxial probe interconnection system |
| DE102006034928B4 (en) * | 2006-07-28 | 2008-06-26 | Ptr Messtechnik Gmbh & Co. Kg | Switching spring contact pin |
| TW201231977A (en) * | 2011-01-20 | 2012-08-01 | Pleader Yamaichi Co Ltd | Structure of high-frequency vertical spring plate probe card |
| JP6040532B2 (en) * | 2012-01-26 | 2016-12-07 | 日本電産リード株式会社 | Probe and connecting jig |
| CN103852707B (en) * | 2014-03-04 | 2016-08-24 | 中国科学院电工研究所 | A kind of power semiconductor chip test fixture |
| JP6361174B2 (en) * | 2014-03-06 | 2018-07-25 | オムロン株式会社 | Probe pin and electronic device using the same |
| CN105403826B (en) * | 2016-01-04 | 2019-02-22 | 京东方科技集团股份有限公司 | A kind of test fixture |
| CN107770980B (en) * | 2016-08-18 | 2019-11-29 | 株洲中车时代电气股份有限公司 | IGBT module |
| CN208621726U (en) * | 2018-08-15 | 2019-03-19 | 苏州市高威电子有限公司 | A kind of light loading structure printed circuit board test fixture |
| CN210604727U (en) * | 2019-07-02 | 2020-05-22 | 元鼎丰投资有限公司 | Probe card for wafer multi-point test |
| CN111122925A (en) * | 2019-12-24 | 2020-05-08 | 杭州易正科技有限公司 | Easy maintenance's test probe seat |
| CN214041489U (en) * | 2020-09-24 | 2021-08-24 | 西安和光明宸科技有限公司 | Semiconductor test probe convenient to change |
-
2021
- 2021-12-07 CN CN202111486172.0A patent/CN116243033A/en active Pending
-
2022
- 2022-03-14 WO PCT/CN2022/080724 patent/WO2023103199A1/en unknown
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| Publication number | Publication date |
|---|---|
| WO2023103199A1 (en) | 2023-06-15 |
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