CN107770980B - IGBT module - Google Patents

IGBT module Download PDF

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Publication number
CN107770980B
CN107770980B CN201610688245.7A CN201610688245A CN107770980B CN 107770980 B CN107770980 B CN 107770980B CN 201610688245 A CN201610688245 A CN 201610688245A CN 107770980 B CN107770980 B CN 107770980B
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China
Prior art keywords
probe
lower contact
igbt module
igbt
installing hole
Prior art date
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Application number
CN201610688245.7A
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Chinese (zh)
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CN107770980A (en
Inventor
陈燕平
黄南
时海定
熊辉
忻兰苑
王世平
袁勇
文驰
石廷昌
邵强
孙康康
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zhuzhou CRRC Times Semiconductor Co Ltd
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Zhuzhou CRRC Times Electric Co Ltd
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Priority to CN201610688245.7A priority Critical patent/CN107770980B/en
Publication of CN107770980A publication Critical patent/CN107770980A/en
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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K5/00Casings, cabinets or drawers for electric apparatus
    • H05K5/02Details
    • H05K5/0247Electrical details of casings, e.g. terminals, passages for cables or wiring

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The present invention relates to IGBT modules.The IGBT module includes: IGBT liner plate, the gland being mounted on the IGBT liner plate, probe installing hole is provided through on the gland, the probe of electric conductivity, its main body is in the probe installing hole, upper contact head and lower contact extend to except the probe installing hole, and the lower contact is contacted with the IGBT liner plate.The lock projection with probe installing hole interference fit is configured in the main body of probe.In IGBT module of the invention, does not use easy impaired elastic ring and engage probe with gland, and the operation for the person of being convenient to use.

Description

IGBT module
Technical field
The present invention relates to a kind of electronic device, especially a kind of IGBT module.
Background technique
IGBT module (Insulated Gate Bipolar Transistor) i.e. insulated gate bipolar transistor, which has, to be driven The advantages of dynamic power is small and saturation pressure reduces, is thus widely used in alternating current generator, frequency converter, inverter, Switching Power Supply, illumination In the fields such as circuit, Traction Drive.
In above-mentioned a variety of devices, in order to realize the communication of other component in IGBT module and device, in the prior art In, gland is usually installed above IGBT module, entering in inner cover interpolation has probe, and the lower end of probe is contacted with IGBT module, on End is contacted with other component, is achieved in the communication of IGBT module Yu other devices.In order to visit in probe card gland The upper end of needle is configured to elastic ring.When installing probe, firmly squeezes elastic ring and snapped fit onto gland, this is highly susceptible to Elastic ring or gland is caused to damage.In addition, the size of probe is smaller, this causes operator to have to arduously hold and squeeze Probe could be properly mounted in gland by elastic ring, this is not easy to operate very much.
Summary of the invention
In view of the above-mentioned problems, the invention proposes a kind of IGBT modules.In IGBT module of the invention, do not use easily Impaired elastic ring engages probe with gland, and the operation for the person of being convenient to use.
IGBT module according to the present invention includes IGBT liner plate, and the gland being mounted on IGBT liner plate runs through on gland It is provided with probe installing hole, the probe of electric conductivity, main body is in probe installing hole, and upper contact head and lower contact extend to probe Except mounting hole, and lower contact is contacted with the IGBT liner plate.It is configured in the main body of probe and probe installing hole interference The lock projection of cooperation.
IGBT module according to the present invention, due to being configured with lock projection in the main body of probe, in installation probe When, user, which only needs to apply towards the power of probe installing hole probe, to be correctly inserted into probe installing hole for probe It is interior.Probe can be maintained in gland by lock projection and probe installing hole interference fit naturally.Which strongly simplifies installations Operation, and probe and gland are also not easy to be damaged.
In a specific embodiment, lock projection circumferentially extends to form retaining ring in the main body of probe.This is convenient for It is machining.
In one embodiment, the size that extends radially outwardly is also configured on upper contact head or lower contact to install greater than probe The block body of the diameter of the outlet in hole.By constructing block body, probe is inserted in place with can be convenient in probe installing hole, is avoided Probe is excessively inserting.
In a specific embodiment, block body circumferentially extends to form stopping ring on lower contact.This is convenient for being machined to Type.
In one embodiment, upper contact head and lower contact with body elastic are connect.In this way, being installed to by multiple probes After in gland, it can ensure that multiple upper contacts are contacted with corresponding member in tight by compressing the elastic connection, for lower contact It is also such.This facilitates signal transmission.
In one embodiment, the main body of probe includes the stiff case of electric conductivity, is installed in shell conductive Spring, upper contact head and lower contact are connected with spring respectively and extend to except shell.Shell is by spring, upper contact head and lower contact An entirety is connected into, this facilitate that saving and installing probe.
In one embodiment, lock projection is formed on shell.In another embodiment, block body is formed in lower contact The part except the shell on.In this way, no matter installing probe in which way, lock projection all can be with probe installing hole mistake It is full of cooperation, and block body can guarantee that probe is accurately installed in place.This facilitate that using.
In one embodiment, shell includes the entity portion in middle part and two receiving slits in entity portion two sides, The quantity of spring is two and is separately mounted in two receiving slits that upper contact head and lower contact are engaged respectively within two receiving slits It is interior.By this structure, two springs will not influence each other, and the elastic force that upper contact head and lower contact are subject to will not mutual shadow It rings, this helps to ensure that upper contact head and lower contact are in close contact with corresponding other component respectively.
In one embodiment, radially inward flanging, upper contact head and lower touching are configured at the edge of two receiving slits Head respectively includes being less than upper contact head and lower contact respectively end with flanging matched radial retraction area, the radial diameter for being retracted area Diameter.Flanging and radial retraction area define the stroke of upper contact head and lower contact elastic movement, and can prevent upper contact head and Lower contact falls off.
Compared with the prior art, the advantages of the present invention are as follows: (1) it on the probe body of of the invention IGBT module constructs There is the lock projection with probe installing hole interference fit, which strongly simplifies the installation of probe operations.Probe and gland are not yet Easily it is damaged.(2) block body on upper contact head or lower contact can also avoid probe from surprisingly falling off out of gland probe installing hole.
Detailed description of the invention
The invention will be described in more detail below based on embodiments and refering to the accompanying drawings.Wherein:
Fig. 1 schematically shows IGBT module according to the present invention;
Fig. 2 schematically shows the structure of probe according to a first embodiment of the present invention;
Fig. 3 schematically shows the shell of probe according to the present invention;
Fig. 4 is the enlarged view of part A in Fig. 2;
Fig. 5 schematically shows the lower contact of probe according to the present invention;And
Fig. 6 schematically shows the structure of probe according to a second embodiment of the present invention.
In the accompanying drawings, identical component uses identical appended drawing reference.Attached drawing is not according to actual ratio.
Specific embodiment
The present invention will be further described with reference to the accompanying drawings.
Fig. 1 shows the structural schematic diagram of IGBT module 10 according to the present invention.As shown in Figure 1, IGBT module 10 includes IGBT liner plate 1, the gland 2 being fitted on IGBT liner plate 1, and the probe 4 being inserted in the probe installing hole 3 of gland 2.Probe 4 Lower contact 5 extend to except probe installing hole 3 and contacted with IGBT liner plate 1, upper contact head 6 also extend into probe installing hole 3 it Outside to contact with the other component (not shown) of 2 top of gland to be fitted in, it is achieved in signal transmission.
The structure of probe 4 is described in detail below.
As shown in Fig. 2, probe 4 includes columned main body 21, columned upper contact head 6 and lower contact 5 are respectively elastically It is mounted on the both ends of main body 21.In this way, main body 21, upper contact head 6 and lower contact 5 have just been assembled into an entirety.This is flexibly Installation facilitates lower contact 5 and realizes good electrical contact with IGBT liner plate 1, and upper contact head 6 also can be good with other component realization Good electrical contact, or even this electrical contact will not be influenced filling gel sealing even if into IGBT module 10.The assembly of probe 4 In state, main body 21 is in probe installing hole 3, upper contact head 6 and lower contact 5 extend at least partly into probe installing hole 3 it Outside.
As shown in figure 3, main body 21 includes stiff case 22.The middle part of shell 22 is entity portion 31, the two sides in entity portion 31 It is two receiving slits 32,33 of hollow tubular to install upper contact head 6 and lower contact 5.
Retaining ring 35 is configured on the outer surface of shell 22.The diameter of retaining ring 35 is slightly larger than probe installing hole 3 Internal diameter, thus after probe 4 is inserted into probe installing hole 3, retaining ring 35 can be realized with probe installing hole 3 and is interference fitted, this Probe 4 is stably maintained in probe installing hole 3 (or gland 2), and overturning gland 2, probe 4 will not be fallen. Retaining ring 35 can also be embodied as multiple raised (as shown in Figure 6) being uniformly distributed circumferentially, this can equally guarantee 4 energy of probe It is stably installed in probe installing hole 3.
Upper contact head 6 is identical with the mounting means of lower contact 5, for simplicity, only describes only following contact 5 below here With the mounting structure of receiving slit 32.
In order to realize the elastic connection of lower contact 5 and shell 22, spring 23 is provided in receiving slit 32, lower contact 5 pushes up It touches spring 23 and extends to except receiving slit 32.In this way, lower contact 5 can be towards entity portion 31 when contact 5 applies pressure downwards Movement.After removing pressure, under the action of spring 23, lower contact 5 can move far from entity portion 31 and return to it and not be extruded When original state.
In order to limit the stroke of lower contact 5, prevents it from deviating from out of receiving slit 32, the edge of receiving slit 32 is configured to diameter To inside flanging 34, radial retraction area 61 (as shown in Figure 5) of the cooperation of flanging 34 is configured on lower contact 5, it is radial to be retracted The diameter of area 61 and flanging 34 is both less than the lower end 62 of contact 5 and the diameter of end 63.In this way, will keep lower contact 5 with Shell 22 connects, as shown in Figure 4.It should be understood that in order to which lower contact 5 is engaged with receiving slit 32, first by the end of lower contact 5 Portion 62 is installed in receiving slit 32, is then again bent the edge of receiving slit 32 to form flanging 34.
Also as shown in Fig. 1,2 and 5, the position on the end 63 of lower contact 5 close to radial retraction area 61, which is also configured with, stops Only ring 51.In this way, no matter descending how contact 5 moves, stopping ring 51 will not all be entered in shell 22.The diameter for stopping ring 51 is big In the diameter of probe installing hole 3.When probe 4 is correctly inserted into probe installing hole 3, the table of gland 2 should be abutted against by stopping ring 51 Face.In this way, check whether probe 4 is inserted in place with can be convenient.In another embodiment, stopping ring 51 can also be embodied as The multiple block bodies being uniformly distributed circumferentially.
The material of shell 22, upper contact head 6 and lower contact 5 is copper, and the material of spring 23 is beallon, so that probe 4 It can be conductive.Preferably, it in shell 22, upper contact head 6 and lower 5 surface gold-plating of contact or silver-plated to prevent it to be oxidized, and improves Electric conductivity.
Fig. 6 schematically shows the structure of probe 4 ' according to a second embodiment of the present invention.The structure and spy of probe 4 ' The structure of needle 4 is substantially the same, here only description difference: the shell 22 ' of probe 4 ' is hollow tube body, is only arranged in shell 22 ' There is a spring 23 '.Lower contact 5 ' and upper contact head 6 ' all link together with spring 23 ', descend contact 5 ' and upper contact head 6 ' as a result, It can flexibly move.
Although by reference to preferred embodiment, invention has been described, the case where not departing from the scope of the present invention Under, various improvement can be carried out to it and can replace component therein with equivalent.Especially, as long as there is no structures to rush Prominent, items technical characteristic mentioned in the various embodiments can be combined in any way.The invention is not limited to texts Disclosed in specific embodiment, but include all technical solutions falling within the scope of the claims.

Claims (9)

1. a kind of IGBT module, comprising:
IGBT liner plate,
The gland being mounted on the IGBT liner plate, is provided through probe installing hole on the gland,
The probe of electric conductivity, main body are in the probe installing hole, and upper contact head and lower contact extend to the probe installation Except hole, and the lower contact is contacted with the IGBT liner plate, and the upper contact head and lower contact with the body elastic connect It connects;
Wherein, the lock projection with probe installing hole interference fit is configured in the main body of the probe.
2. IGBT module according to claim 1, which is characterized in that main body last week of the lock projection in the probe To extending to form retaining ring.
3. IGBT module according to claim 1 or 2, which is characterized in that also constructed on the upper contact head or lower contact There is block body of the size greater than the diameter of the outlet of the probe installing hole that extend radially outwardly.
4. IGBT module according to claim 3, which is characterized in that the block body circumferentially extends shape on the lower contact At stopping ring.
5. IGBT module according to claim 4, which is characterized in that the main body of the probe includes the rigid crust of electric conductivity Body, installs conductive spring in the shell, and the upper contact head and lower contact are connected and prolong with the spring respectively It reaches except the shell.
6. IGBT module according to claim 5, which is characterized in that the lock projection is formed on the housing.
7. IGBT module according to claim 5 or 6, which is characterized in that the block body is formed in the place of the lower contact On part except the shell.
8. IGBT module according to claim 7, which is characterized in that the shell includes entity portion and place in middle part Two receiving slits in entity portion two sides, the quantity of the spring are two and are separately mounted to described two receiving slits Interior, the upper contact head and lower contact are engaged respectively in described two receiving slits.
9. IGBT module according to claim 8, which is characterized in that be configured with diameter at the edge of described two receiving slits To inside flanging, the upper contact head and lower contact respectively include and the matched radial retraction area of the flanging, the radial contracting The diameter of time zone is less than the diameter of the respective end of the upper contact head and lower contact.
CN201610688245.7A 2016-08-18 2016-08-18 IGBT module Active CN107770980B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610688245.7A CN107770980B (en) 2016-08-18 2016-08-18 IGBT module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610688245.7A CN107770980B (en) 2016-08-18 2016-08-18 IGBT module

Publications (2)

Publication Number Publication Date
CN107770980A CN107770980A (en) 2018-03-06
CN107770980B true CN107770980B (en) 2019-11-29

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116243033A (en) * 2021-12-07 2023-06-09 中兴通讯股份有限公司 Electric contact probe device

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* Cited by examiner, † Cited by third party
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JPH1050993A (en) * 1996-08-02 1998-02-20 Denso Corp Semiconductor device with current detecting function
CN201478582U (en) * 2009-03-26 2010-05-19 中兴通讯股份有限公司 Mobile phone and waterproof assembly of connector
CN103675622B (en) * 2013-12-04 2017-01-04 株洲南车时代电气股份有限公司 For testing the apparatus and method of the shelf depreciation of IGBT module

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Effective date of registration: 20200928

Address after: 412001 Room 309, floor 3, semiconductor third line office building, Tianxin hi tech park, Shifeng District, Zhuzhou City, Hunan Province

Patentee after: Zhuzhou CRRC times Semiconductor Co.,Ltd.

Address before: The age of 412001 in Hunan Province, Zhuzhou Shifeng District Road No. 169

Patentee before: ZHUZHOU CRRC TIMES ELECTRIC Co.,Ltd.

TR01 Transfer of patent right