CN116223943A - Circuit board testing system and circuit board testing method - Google Patents
Circuit board testing system and circuit board testing method Download PDFInfo
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- CN116223943A CN116223943A CN202310048617.XA CN202310048617A CN116223943A CN 116223943 A CN116223943 A CN 116223943A CN 202310048617 A CN202310048617 A CN 202310048617A CN 116223943 A CN116223943 A CN 116223943A
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- 238000012360 testing method Methods 0.000 title claims abstract description 183
- 238000001514 detection method Methods 0.000 claims abstract description 20
- 230000009471 action Effects 0.000 claims abstract description 19
- QWCRAEMEVRGPNT-UHFFFAOYSA-N buspirone Chemical compound C1C(=O)N(CCCCN2CCN(CC2)C=2N=CC=CN=2)C(=O)CC21CCCC2 QWCRAEMEVRGPNT-UHFFFAOYSA-N 0.000 claims description 6
- 238000010998 test method Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 8
- 238000000034 method Methods 0.000 description 20
- 230000008569 process Effects 0.000 description 7
- 239000003086 colorant Substances 0.000 description 4
- 230000006835 compression Effects 0.000 description 4
- 238000007906 compression Methods 0.000 description 4
- 239000000306 component Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
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- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to a circuit board testing system and a circuit board testing method. The circuit board test system includes: a first test pin for connecting the test pin of the tested circuit board; an IIC unit connected with the first test needle; the tested circuit board enters a test mode when the IIC unit is identified through the detection pin; and after the tested circuit board enters the test mode, the tested circuit board is used for receiving the state signal of the IIC unit so as to execute the corresponding test action. The invention can achieve the purpose of quick test of the production line without providing extra hardware resources on the circuit board, and can timely detect potential problems.
Description
Technical Field
The present invention relates to the field of circuit board testing technology, and more particularly, to a circuit board testing system and a circuit board testing method.
Background
In the production of electronic products, the assembled circuit board is a core component. How to ensure that the materials of the circuit board are selected correctly, assembled correctly and welded components are correct, and it is very important to detect the problem circuit board in time, and a series of processes such as subsequent assembly, packaging and the like are related in advance. Once the omission is detected, the post-processing is performed, and the workload is wasted; heavy products have been introduced into the market and even into the customer's hands causing losses, and have had to be recalled, with significant reputation and cost losses. Therefore, the testing link of the circuit board of the product is indispensable.
For the circuit board of the non-embedded system, the working condition is single, and the test needle is additionally arranged at the key position through the jig to connect with the load, the oscilloscope or the voltage ammeter and other instruments, so that whether the circuit board is qualified or not is easily confirmed. For circuit boards with embedded systems, there are a large number of combinations of input conditions, and specific inputs have specific outputs. If the function test is adopted for detection, the method is difficult to exhaust the triggering condition, has low efficiency and is unnecessary, and the function is ensured by researching and developing the product; the test in production line production is to ensure the circuit board welding and assembling without error.
Disclosure of Invention
The invention aims to provide a circuit board testing system and a circuit board testing method.
The technical scheme adopted for solving the technical problems is as follows: a circuit board testing system is constructed, comprising:
a first test pin for connecting the test pin of the tested circuit board;
an IIC unit connected to the first test needle;
wherein,,
the tested circuit board enters a test mode when the IIC unit is identified through the detection pin;
and after the tested circuit board enters the test mode, the tested circuit board is used for receiving the state signal of the IIC unit so as to execute corresponding test actions.
Preferably, in the circuit board testing system of the present invention, the test pin of the tested circuit board is an IIC bus pin of the tested circuit board.
Preferably, in the circuit board testing system of the present invention, the circuit board testing system further includes an input unit connected to the IIC unit;
the input unit generates the state signal and sends the state signal to the tested circuit board through the IIC unit.
Preferably, in the circuit board testing system of the present invention, the input unit includes a key unit.
Preferably, in the circuit board testing system of the present invention, the circuit board testing system further includes an output unit connected to the IIC unit;
the tested circuit board is used for generating a corresponding test result according to the test action, and the IIC unit is used for receiving the test result and generating a corresponding indication result through the output unit.
Preferably, in the circuit board testing system of the present invention, the output unit includes a sound module and/or a light emitting module.
Preferably, in the circuit board testing system of the present invention, the system further includes a plurality of second test pins corresponding to test points of the tested circuit board, and a test unit correspondingly connected to the second test pins.
The invention also constructs a circuit board testing method, which comprises the following steps:
s1, acquiring an access state of an IIC unit through a detection pin of a circuit board to be tested;
s2, when the access of a preset IIC unit is judged, the tested circuit board is set to enter a test mode;
s3, the tested circuit board receives the state signal of the preset IIC unit and executes corresponding testing action.
Preferably, in the method for testing a circuit board according to the present invention, the method further includes:
and setting an IIC bus pin of the tested circuit board as a detection pin of the tested circuit board.
Preferably, in the method for testing a circuit board according to the present invention, the method further includes:
s31, an input unit generates the state signal and sends the state signal to the tested circuit board through the preset IIC unit; and/or
S4, the tested circuit board is used for generating a corresponding test result according to the test action, so that the preset IIC unit receives the test result and outputs an indication result through the output unit.
The implementation of the circuit board testing system and the circuit board testing method provided by the invention has the following beneficial effects: the purpose of quick test of the production line can be achieved without providing extra hardware resources on the circuit board, and potential problems can be detected in time without increasing the hardware cost of the circuit board.
Drawings
The invention will be further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a schematic diagram of a circuit board testing system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of another embodiment of a circuit board testing system according to the present invention;
FIG. 3 is a schematic diagram of a circuit board testing system according to another embodiment of the present invention;
FIG. 4 is a flowchart illustrating a method for testing a circuit board according to an embodiment of the present invention;
fig. 5 is a flowchart of a circuit board testing method according to an embodiment of the invention.
Detailed Description
For a clearer understanding of technical features, objects and effects of the present invention, a detailed description of embodiments of the present invention will be made with reference to the accompanying drawings.
As shown in fig. 1, in a first embodiment of a circuit board testing system 100 of the present invention, it includes: a first test pin 110 for connecting the test pins of the circuit board to be tested; an IIC unit 120 connected to the first test pin 110; wherein, the tested circuit board enters a test mode when the IIC unit 120 is identified through the detection pin; and, after the tested circuit board enters the test mode, the tested circuit board is used for receiving the status signal of the IIC unit 120 to execute the corresponding test action. Specifically, some detection pins may be obtained by using an existing circuit of the tested circuit board, for example, by using a processor pin or an MCU pin on the tested circuit board, some reserved pins are obtained as detection pins, and the first test pin 110 corresponding to the detection pins is set. That is, during the test of the circuit board under test, the test pins of the circuit board under test may be connected to the IIC unit 120 through the first test pins 110. The detection pins of the tested circuit board detect the connection state of the IIC unit 120, and after the connection relation between the tested circuit board and the IIC unit 120 is determined, the tested circuit board is set to enter a test mode. In an embodiment, the processor or the MCU of the circuit board under test may be set to enter a test mode so that the circuit board under test is in the test mode. After the tested circuit board enters the test mode, a corresponding test action can be executed according to the status signal of the IIC unit 120. It will be appreciated that only after the board under test enters the test mode will it respond to the test action. Through this process, the processor or MCU of the circuit board under test may attempt to access the preset IIC unit 120 when the circuit board under test is powered up. If the preset IIC unit 120 is detected, a test mode is entered.
Optionally, in the circuit board testing system 100 of the present invention, the test pin of the tested circuit board is an IIC bus pin of the tested circuit board. Specifically, the detection pins in the tested circuit board may preferably select the existing IIC bus pins in the tested circuit board. It will be appreciated that it is easy to attach an IIC device to another on a circuit board containing the IIC bus and devices, as long as the addresses of this IIC device do not conflict with other devices on the existing bus. The preset IIC unit 120 may be provided and attached to an existing IIC bus in the circuit board under test by a test pin. The I/O expansion chip through the IIC device and the like has the advantage that the MCU is not required to provide additional pins or reserve additional I/O devices on the product circuit board, and the result of the test mode can be expressed. If the MCU cannot detect the presence of the preset IIC unit 120 when the circuit board to be tested is powered on, it is considered that the circuit board to be tested is powered on in a normal working state, and the test mode is not entered, and the circuit board to be tested is powered on to perform correct work.
Optionally, as shown in fig. 2, in the circuit board testing system 100 of the present invention, an input unit 130 connected to the IIC unit 120 is further included; the input unit 130 is configured to generate the status signal and send the status signal to the tested circuit board via the IIC unit 120. Specifically, the input unit 130 may be configured to generate corresponding state information according to actions such as a key, and send the state information to the tested circuit board via the IIC unit 120. In one embodiment, the input unit 130 includes a key unit. For example, the key unit triggers and selects the test object of the tested circuit board to generate corresponding state information. In an embodiment, the input unit 130 may also be a compression spring switch disposed at a preset position, and the state of the compression spring switch generates a corresponding state signal and sends the state signal to the tested circuit board through the IIC unit 120. It will be appreciated that different components or functions of the tested circuit board need to be tested, different operations may be performed by the key unit to obtain different state information of the IIC unit 120, or different pressure spring switches may be pressed to obtain different state information of the IIC unit 120. The tested circuit board can execute different testing processes by obtaining different state information.
Optionally, as shown in fig. 2, in the circuit board testing system 100 of the present invention, an output unit 140 connected to the IIC unit 120 is further included; the tested circuit board is configured to generate a corresponding test result according to the test action, and the IIC unit 120 is configured to receive the test result and generate a corresponding indication result through the output unit 140. Specifically, the corresponding test result can be obtained after each test result of the tested circuit board is executed. The result indication information may be generated for a part of the test results, and the IIC unit 120 receives the indication result generated through the output unit 140. In an embodiment, the output unit 140 comprises a sound module and/or a light emitting module. The light emitting module may include LED lamps, which may be LED lamps of different colors, for example, may be connected to a red LED and a green LED through an output pin of the IIC unit 120, and different test results are indicated by lighting the LEDs of different colors, for example, the green lighting is normal, and the red lighting is abnormal.
Optionally, as shown in fig. 3, in the circuit board testing system 100 according to the present invention, a plurality of second test pins 150 corresponding to test points of the circuit board to be tested, and a test unit 160 correspondingly connected to the second test pins 150 are further included. Specifically, a second test needle 150 corresponding to the tested circuit board may be further provided, and a corresponding test process is performed by the corresponding test unit 160 and a corresponding test result is obtained.
As shown in fig. 4, in a circuit board testing method of the present invention, the method includes the following steps: s1, acquiring an access state of an IIC unit through a detection pin of a circuit board to be tested; s2, when the access of a preset IIC unit is judged, the tested circuit board is set to enter a test mode; s3, the tested circuit board receives the state signal of the preset IIC unit and executes corresponding testing action. Specifically, some detection pins can be obtained by using the existing circuit of the tested circuit board, for example, by using the processor pins or the MCU pins on the tested circuit board, some reserved pins are obtained as detection pins, the detection pins of the tested circuit board are used for detecting the connection state of the preset IIC unit, and after the connection relation between the tested circuit board and the preset IIC unit is determined, the tested circuit board is set to enter a test mode. In an embodiment, the processor or the MCU of the circuit board under test may be set to enter a test mode so that the circuit board under test is in the test mode. After the tested circuit board enters the test mode, the corresponding test action can be executed according to the state signal of the IIC unit. It will be appreciated that only after the board under test enters the test mode will it respond to the test action. Through this process, the processor or MCU of the circuit board under test may attempt to access the preset IIC unit when the circuit board under test is powered on. If a preset IIC unit is detected, a test mode is entered.
Optionally, in the method for testing a circuit board according to the present invention, the method further includes: and setting the IIC bus pin of the tested circuit board as a detection pin of the tested circuit board. The test pins in the circuit board under test may preferably be selected from the IIC bus pins already present in the circuit board under test. It will be appreciated that it is easy to attach an IIC device to another on a circuit board containing the IIC bus and devices, as long as the addresses of this IIC device do not conflict with other devices on the existing bus. Therefore, the preset IIC unit can be arranged and hung on the existing IIC bus in the tested circuit board through the test pin. The I/O expansion chip through the IIC device and the like has the advantage that the MCU is not required to provide additional pins or reserve additional I/O devices on the product circuit board, and the result of the test mode can be expressed. If the MCU can not detect the existence of the preset IIC unit when the tested circuit board is electrified, the tested circuit board is electrified in a normal working state, a test mode is not entered, and the tested circuit board is electrified to perform correct work.
Optionally, as shown in fig. 5, in the method for testing a circuit board according to the present invention, the method further includes: s31, the preset IIC unit transmits the state signal generated by the input unit to the tested circuit board; specifically, the input unit may detect the key action, and generate corresponding state information. The input unit includes a key unit in one embodiment, which is sent to the tested circuit board via the IIC unit. For example, the tested object of the tested circuit board is triggered and selected through the key unit, and the IIC unit generates corresponding state information according to the trigger information of the key unit. In an embodiment, the input unit may be a compression spring switch disposed at a preset position, and the state signal corresponding to the state of the compression spring switch is generated and sent to the tested circuit board through the IIC unit. It can be understood that different components or functions of the tested circuit board need to be tested, different operations can be performed through the key unit to enable the IIC unit to obtain different state information, or different pressure spring switches can be pressed to enable the IIC unit to obtain different state information. The tested circuit board can execute different testing processes by obtaining different state information.
Optionally, as shown in fig. 5, in the method for testing a circuit board according to the present invention, the method further includes: s4, the tested circuit board is used for generating a corresponding test result according to the test action, so that the preset IIC unit receives the test result and outputs an indication result through the output unit. Specifically, the corresponding test result can be obtained after each test result of the tested circuit board is executed. For some test results, result indication information may be generated, and the IIC unit receives the result indication information and generates a corresponding indication result via the output unit according to the result indication information. In an embodiment, the output unit comprises a sound module and/or a light emitting module. The light emitting module may include an LED lamp, and the LED lamp may be an LED lamp with different colors, for example, an output pin of the IIC unit may be connected to a red LED and a green LED, and different test results are indicated by lighting the LEDs with different colors, for example, the green lighting is a normal test result, and the red lighting is an abnormal test result.
Through the process, automatic detection can be realized when the circuit board is electrified so as to judge whether to enter a test mode. On the premise of not increasing the hardware cost of the circuit board of the product and not having extra operation, the test mode required by the production line during production is realized. The defects of material problems, welding and assembly are identified in time by the convenient production line, and the efficiency of product testing is greatly improved.
It is to be understood that the above examples only represent preferred embodiments of the present invention, which are described in more detail and are not to be construed as limiting the scope of the invention; it should be noted that, for a person skilled in the art, the above technical features can be freely combined, and several variations and modifications can be made without departing from the scope of the invention; therefore, all changes and modifications that come within the meaning and range of equivalency of the claims are to be embraced within their scope.
Claims (10)
1. A circuit board testing system, comprising:
a first test pin for connecting the test pin of the tested circuit board;
an IIC unit connected to the first test needle;
wherein,,
the tested circuit board enters a test mode when the IIC unit is identified through the detection pin;
and after the tested circuit board enters the test mode, the tested circuit board is used for receiving the state signal of the IIC unit so as to execute corresponding test actions.
2. The circuit board testing system of claim 1, wherein the test pin of the circuit board under test is an IIC bus pin of the circuit board under test.
3. The circuit board testing system of claim 1, further comprising an input unit coupled to the IIC unit;
the input unit is used for generating the state signal and sending the state signal to the tested circuit board through the IIC unit.
4. The circuit board testing system of claim 1, wherein the input unit comprises a key unit.
5. The circuit board testing system of claim 1, further comprising an output unit coupled to the IIC unit;
the tested circuit board is used for generating a corresponding test result according to the test action, and the IIC unit is used for receiving the test result and generating a corresponding indication result through the output unit.
6. The circuit board testing system according to claim 5, wherein the output unit comprises a sound module and/or a light emitting module.
7. The circuit board testing system of claim 1, further comprising a plurality of second test pins corresponding to test points of the circuit board under test, and a test unit correspondingly connected to the second test pins.
8. A method of testing a circuit board, comprising:
s1, acquiring an access state of an IIC unit through a detection pin of a circuit board to be tested;
s2, when the access of a preset IIC unit is judged, the tested circuit board is set to enter a test mode;
s3, the tested circuit board receives the state signal of the preset IIC unit and executes corresponding testing action.
9. The circuit board testing method of claim 8, further comprising:
and setting an IIC bus pin of the tested circuit board as a detection pin of the tested circuit board.
10. The circuit board testing method of claim 8, further comprising:
s31, an input unit generates the state signal and sends the state signal to the tested circuit board through the preset IIC unit; and/or
And S4, the tested circuit board is used for generating a corresponding test result according to the test action, so that the preset IIC unit receives the test result and outputs an indication result through an output unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310048617.XA CN116223943A (en) | 2023-01-31 | 2023-01-31 | Circuit board testing system and circuit board testing method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310048617.XA CN116223943A (en) | 2023-01-31 | 2023-01-31 | Circuit board testing system and circuit board testing method |
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| Publication Number | Publication Date |
|---|---|
| CN116223943A true CN116223943A (en) | 2023-06-06 |
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|---|---|---|---|
| CN202310048617.XA Pending CN116223943A (en) | 2023-01-31 | 2023-01-31 | Circuit board testing system and circuit board testing method |
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| CN (1) | CN116223943A (en) |
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- 2023-01-31 CN CN202310048617.XA patent/CN116223943A/en active Pending
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