CN116202736A - Rotary optical delay line rapid calibration system and delay time rapid calibration method - Google Patents
Rotary optical delay line rapid calibration system and delay time rapid calibration method Download PDFInfo
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Abstract
The invention discloses a quick calibration system and a quick calibration method for a delay time of a rotary optical delay line. The calibration method is simple to operate, and can provide a foundation for the wide application of the rotary optical delay line.
Description
Technical Field
The invention relates to a quick calibration system and a quick calibration method for delay time of a rotating optical delay line, in particular to a quick calibration method for delay time of the rotating optical delay line in a terahertz time-domain spectroscopy system.
Background
The optical delay line can realize detection of sample information by changing the relative delay between reference light and detection light in an optical coherence detection system, has wide application in terahertz time-domain spectroscopy, optical coherence tomography, ultra-fast time resolution spectroscopy, pumping-detection and other technologies, and is a key subsystem for influencing the accuracy of acquired signals, signal-to-noise ratio and spectral resolution.
In a terahertz time-domain spectroscopy system, in order to realize rapid imaging and process real-time monitoring of terahertz detection, a rotating optical delay line with high scanning rate is required to effectively sample terahertz pulses. In the debugging process of the rotating optical delay line, the actual delay time of the delay line is influenced by different incident positions and incident angles of laser beams and the earlier processing errors of the delay line model, so that the actual delay time deviates from the theoretical delay time, and the accuracy and consistency of sampling signals are further influenced.
Therefore, a method for rapidly calibrating the delay time of the rotating optical delay line is needed, which is convenient for rapidly calibrating the total delay time of the window of the rotating optical delay line in the terahertz time-domain spectroscopy system.
Disclosure of Invention
The invention provides a quick calibration system and a quick calibration method for delay time of a rotating optical delay line.
The invention is realized by the following technical scheme:
the invention provides a quick calibration system for delay time of a rotary optical delay line, which comprises a femtosecond laser, a first beam splitter prism, a second beam splitter prism, a linear delay line, a photoconductive antenna excitation end, bias voltage, a third beam splitter prism, a rotary optical delay line to be calibrated, a reflector, a photoconductive antenna detection end, a lock-in amplifier and an oscilloscope, wherein the first beam splitter prism is arranged on the first beam splitter prism; the first beam splitter prism, the second beam splitter prism, the linear delay line and the photoconductive antenna excitation end are sequentially arranged in the direction of the light path to form a pumping light path; the first beam splitter prism, the third beam splitter prism, the reflecting mirror, the rotary optical delay line to be calibrated and the photoconductive antenna detection end are sequentially arranged in the direction of the light path to form a detection light path; one path of laser emitted by the femtosecond laser enters the phase-locked amplifier through bias voltage bias after passing through the pumping light path, and the other path also enters the phase-locked amplifier after passing through the detection light path, and finally, signal display is carried out through an oscilloscope.
The invention also provides a method for rapidly calibrating the delay time of the rotary optical delay line, which uses the rapid calibration system; the quick calibration method comprises the following steps:
step one, selecting a linear delay line for calibration;
step two, a rotary optical delay line rapid calibration system is built, and the position where the terahertz signal phase difference is zero is located at the middle position C of the optical step by adjusting the relative optical path of the pumping optical path and the detection optical path;
step three, adjusting the linear delay line to enable the phase difference of the terahertz signals to be zero to be respectively positioned at two ends of the optical step,and records the position indication d of the linear delay line 1 D 2 ；
And step four, repeating the step three times, and calculating the average indication difference of the positions of the linear delay lines corresponding to the two ends of the optical step to obtain the actual delay time of the working period of the rotary optical delay line to be calibrated.
And fifthly, repeating the second to fourth steps according to the working period of the rotation optical delay line to be calibrated for one circle, and realizing delay calibration of all working periods of the rotation optical delay line to be calibrated for one circle.
Further, the first step specifically includes:
1.1 Based on the theoretical delay time of the rotating optical delay line to be calibrated, estimating the actual delay time thereof;
1.2 Determining the delay time of the linear delay line for calibration according to the theoretical delay time of the rotary optical delay line to be calibrated;
1.3 According to the required sampling interval of the terahertz time-domain spectroscopy system, determining the delay precision delta T of the linear delay line for calibration, and obtaining the minimum stepping length delta l of the linear delay line for calibration:
wherein c is the speed of light in vacuum, n 0 Is the refractive index of air.
Further, the second step specifically includes the following steps:
2.1 Building a rotary optical delay line rapid calibration system;
2.2 Placing the rotary optical delay line to be calibrated in a detection light path of the terahertz time-domain spectroscopy system, enabling the rotary optical delay line to be in a working state, placing the linear delay line in a pumping light path of the system, enabling the linear delay line to be static at a midpoint position, and recording the position indication of the linear delay line as d;
2.3 Inputting photoelectric flow generated by the detection end of the photoconductive antenna into an oscilloscope through a phase-locked amplifier;
2.4 A plurality of working periods exist for the rotation of the rotary optical delay line to be calibrated, the rest working periods of the rotary optical delay line to be calibrated are shielded, light passing of only one working period exists in the calibration process of the rotary optical delay line to be calibrated, and at the moment, only one light step exists in the photocurrent generated at the detection end of the photoconductive antenna;
2.5 Adjusting the trigger voltage and the trigger mode of signals in the oscilloscope so that an optical step generated in the working range of the rotary optical delay line to be calibrated stably appears in the screen of the oscilloscope, and recording the positions of two ends of the optical step as an end A and an end B respectively;
2.6 The optical path difference between the pumping optical path and the detection optical path in the system is regulated, so that the terahertz signal phase difference is zero and the position C is positioned in the middle of the optical step.
Further, the third step specifically includes the following steps:
3.1 The step motor is driven by the pulse signal, the delay distance of the linear delay line is changed, the position C with the terahertz signal phase difference of zero in the oscilloscope moves forwards and coincides with the end A of the optical step, and the position indication d of the linear delay line at the moment is obtained by recording the number of the pulse signals received by the encoder in the moving process of the linear delay line 1 ；
3.2 The pulse signal is applied again to drive the stepping motor, the delay distance of the linear delay line is changed, the position C with the terahertz signal phase difference of zero in the oscilloscope moves backwards and finally coincides with the end B of the optical step, and the position indication d of the linear delay line at the moment is obtained by recording the number m of the pulse signals received by the encoder in the moving process of the linear delay line 2 ：
d 2 ＝d 1 +m·Δl
Where Δl is the minimum step distance of the stepper motor.
Further, the fourth step specifically includes the following steps:
4.1 Repeating the steps for a plurality of times, and solving the average indication difference delta d of the positions of the linear delay lines corresponding to the two ends of the optical step generated by the rotary optical delay line to be calibrated;
wherein d 2i The number indicating position d of the linear delay line when the terahertz signal recorded for the ith time is positioned at the rearmost end of the optical step 1i The number indicating position of the linear delay line is recorded for the ith recorded terahertz signal when the terahertz signal is positioned at the forefront end of the optical step, and N is the number of repeated measurement;
4.2 Obtaining the actual delay time delta t of the rotary optical delay line to be calibrated by utilizing the relation between the delay distance and the delay time of the linear delay line:
where c is the speed at which light propagates in vacuo, n 0 Is the refractive index of air.
Further, the fifth step specifically includes the following steps:
5.1 Based on the working period of one circle of rotation of the rotary optical delay line to be calibrated, the rest working periods of the rotary optical delay line to be calibrated are sequentially shielded, and only one working period is guaranteed to be communicated for each calibration.
5.2 And (3) repeating the second step to the fourth step until the delay calibration of all working periods of the rotary optical delay line to be calibrated is realized.
The invention has the following advantages:
the method can be used for rapidly calibrating the total delay time of the window of the coherent detection system, is simple in calibration operation, and can provide a basis for the wide application of the rotary optical delay line.
Drawings
FIG. 1 is a schematic diagram of a fast calibration system for a rotating optical delay line according to embodiment 1 of the present invention
FIG. 2 is a flow chart of a method for rapidly calibrating delay time of a rotating optical delay line according to embodiment 2 of the present invention;
FIG. 3 is a schematic diagram of an optical step generated by a rotating optical delay line according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a terahertz signal in the middle of an optical step according to an embodiment of the present invention;
fig. 5 is a schematic diagram of a terahertz signal at the forefront position of an optical step according to an embodiment of the invention
Fig. 6 is a schematic diagram of a terahertz signal at the rearmost position of an optical step according to an embodiment of the invention.
Detailed Description
The invention is further illustrated by the following examples, which are intended to be illustrative only and not limiting in any way.
Example 1
A fast calibration system for a rotational optical delay line delay time, as shown in fig. 1, comprises the following parts: the device comprises a femtosecond laser 1, a first beam splitter prism 2, a second beam splitter prism 3, a linear delay line 4, a photoconductive antenna excitation end 9, a bias voltage 10, a third beam splitter prism 5, a rotary optical delay line 6 to be calibrated, a reflecting mirror 7, a photoconductive antenna detection end 8, a lock-in amplifier 11 and an oscilloscope 12; the first beam splitting prism 2, the second beam splitting prism 3, the linear delay line 4 and the photoconductive antenna excitation end 9 are sequentially arranged in the direction of the light path to form a pumping light path; the first beam splitter prism 2, the third beam splitter prism 5, the reflecting mirror 7, the rotary optical delay line 6 to be calibrated and the photoconductive antenna detection end 8 are sequentially arranged in the direction of the light path to form a detection light path; one path of laser emitted by the femtosecond laser 1 is biased by the bias voltage 10 after passing through the pumping light path and then is amplified by the phase-locked amplifier 11, and the other path of laser is amplified by the phase-locked amplifier 11 after passing through the detection light path and finally is displayed by the oscilloscope 12.
Example 2
As shown in fig. 2, the present embodiment is a method for rapidly calibrating delay time of a rotating optical delay line, wherein the rotating optical delay line to be calibrated is exemplified by a multi-reflecting-surface rotating optical delay line based on involute principle in patent CN104166233a, and the method comprises the following steps:
step one, selecting a linear delay line 4 for calibration;
step two, constructing a rotary optical delay line rapid calibration system shown in fig. 1, and enabling the position where the terahertz signal phase difference is zero to be at an optical step middle position C by adjusting the relative optical path of a pumping optical path and a detection optical path;
step three, adjusting the linear delay line 4 to enable the positions with the terahertz signal phase difference of zero to be respectively positioned at two ends of the optical step, and recording the position indication d of the linear delay line 4 1 D 2 ；
Step four, repeating the step three times, and calculating the average indication difference of the positions of the two ends of the optical step corresponding to the linear delay line 4 to obtain the actual delay time of the working period of the rotary optical delay line 6 to be calibrated;
and fifthly, repeating the second to fourth steps based on the working period of the rotation optical delay line 6 to be calibrated for one circle, and realizing delay calibration of all working periods of the rotation optical delay line 6 to be calibrated for one circle.
Further, the first calibration linear delay line 4 selection specifically includes:
1.2 Based on the theoretical delay time of the rotating optical delay line 6 to be calibrated, estimating the actual delay time thereof;
1.2 Determining the delay time of the linear delay line 4 for calibration according to the theoretical delay time of the rotary optical delay line 6 to be calibrated;
1.3 Determining the delay precision deltat of the linear delay line 4 for calibration according to the required sampling interval of the terahertz time-domain spectroscopy system, and then the minimum stepping length deltal of the linear delay line 4 for calibration:
wherein c is the speed of light in vacuum, n 0 Is the refractive index of air.
Preferably, the delay time of the linear delay line 4 for calibration is longer than the theoretical delay time of the rotary optical delay line 6 to be calibrated. It is generally recommended that the delay time of the linear delay line 4 for calibration is 2 times the theoretical delay time of the rotary optical delay line 6 to be calibrated;
preferably, the linear delay line 4 for calibration is driven by a pulse signal to drive the stepper motor, the displacement generated by the single pulse to drive the stepper motor is the minimum stepping length of the linear delay line 4, and the position indication after the linear delay line 4 moves can be obtained by the pulse signal feedback received by the photoelectric encoder.
Preferably, the delay precision of the linear delay line 4 for calibration is smaller than the sampling interval of the terahertz time-domain spectroscopy system, and the smaller the minimum stepping length of the linear delay line 4 is, the higher the precision of the system calibration result is.
Further, the step two of constructing a rotary optical delay line rapid calibration system, and adjusting the relative optical path of the pumping optical path and the detection optical path to enable the position of the terahertz signal phase difference to be zero to be at the middle position C of the optical step comprises the following steps:
2.1 Constructing the rotary optical delay line rapid calibration system of example 1, as shown in fig. 1, the system comprises: the device comprises a femtosecond laser 1, a beam splitting prism 2, a beam splitting prism 3, a linear delay line 4, a photoconductive antenna excitation end 9, a bias voltage 10, a beam splitting prism 5, a rotary optical delay line 6 to be calibrated, a reflecting mirror 7, a photoconductive antenna detection end 8, a lock-in amplifier 11 and an oscilloscope 12, wherein the beam splitting prism 2, the beam splitting prism 3, the linear delay line 4 and the photoconductive antenna excitation end 9 are pumping light paths, and the beam splitting prism 2, the beam splitting prism 5, the reflecting mirror 7, the rotary optical delay line 6 to be calibrated and the photoconductive antenna detection end 8 are detection light paths.
2.2 The working principle of the rotating optical delay line rapid calibration system is as follows: the rotary optical delay line 6 to be calibrated is arranged in a detection light path of the terahertz time-domain spectroscopy system and is in a working state, the linear delay line 4 is arranged in a pumping light path of the system and is static at a midpoint position, and the position indication of the linear delay line 4 is recorded as d.
2.3 A photoelectric flow generated by the photoconductive antenna detection terminal 8 is input into an oscilloscope 12 through a lock-in amplifier 11.
2.4 Since the rotation of the rotation optical delay line 6 to be calibrated has 6 working cycles, and the light-passing duty ratio in a single working cycle is less than 100%, the femtosecond laser received by the photoconductive antenna detection end 8 is a square wave signal with the same duty ratio modulated by the rotation optical delay line 6 to be calibrated, the rotation of the rotation optical delay line 6 to be calibrated will generate 6 photoelectric current steps at the photoconductive antenna detection end 8. The rest 5 working periods of the rotary optical delay line 6 to be calibrated are blocked, so that only one working period is guaranteed to be electrified in the calibration process of the rotary optical delay line 6 to be calibrated, as shown in fig. 3, and at the moment, only one optical step exists in the photocurrent generated at the detection end 8 of the photoconductive antenna.
2.5 The trigger voltage and the trigger mode of the signals in the oscilloscope 12 are regulated, so that the optical steps generated in the working range of the rotary optical delay line 6 to be calibrated stably appear in the screen of the oscilloscope 12, and the positions of the two ends of the optical steps are respectively A and B.
2.6 The optical path difference between the pumping optical path and the detection optical path in the system is adjusted, as shown in fig. 4, so that the position C where the terahertz signal phase difference is zero is located in the middle of the optical step.
Further, the step three adjusts the linear delay line 4 so that the positions with the terahertz signal phase difference of zero are respectively positioned at two ends of the optical step, and records the position indication d of the linear delay line 4 1 D 2 The method specifically comprises the following steps:
3.1 Driving a stepping motor by pulse signals, changing the delay distance of the linear delay line 4, enabling the position C with the terahertz signal phase difference of zero in the oscilloscope 12 to move forwards and coincide with the end A of the optical step as shown in fig. 5, and obtaining the position indication d of the linear delay line 4 at the moment by recording the number of pulse signals received by an encoder in the moving process of the linear delay line 4 1 ；
3.2 A pulse signal is applied again to drive the stepping motor, the delay distance of the linear delay line 4 is changed, the position C with the terahertz signal phase difference of zero in the oscilloscope 12 moves backwards, finally coincides with the end B of the optical step as shown in fig. 6, and the position indication d of the linear delay line 4 at the moment is obtained by recording the number m of pulse signals received by the encoder in the moving process of the linear delay line 2 ：
d 2 ＝d 1 +m·Δl (2)
Where Δl is the minimum step distance of the stepper motor.
Further, the step four is repeated three times, the average indication difference of the positions of the two ends of the optical step corresponding to the linear delay line 4 is calculated, and the actual delay time of the working period of the rotary optical delay line 6 to be calibrated is obtained specifically includes:
4.1 Repeating the step three for N times, and solving the average indication difference of the positions of the linear delay lines 4 corresponding to the two ends of the optical step generated by the rotary optical delay line 6 to be calibrated as delta d;
wherein d 2i The reading position d of the linear delay line 4 when the terahertz signal recorded for the ith time is positioned at the rearmost end of the optical step 1i The number of times of repeated measurement is N, which is the number of times of indicating the number of positions of the linear delay line 4 when the terahertz signal recorded for the ith time is positioned at the forefront of the optical step.
4.2 Using the relationship between the delay distance and the delay time of the linear delay line 4 to obtain the actual delay time deltat of the rotating optical delay line 6 to be calibrated:
where c is the speed at which light propagates in vacuo, n 0 Is the refractive index of air.
Further, the fifth step of repeating the second to fourth steps based on the working cycle of the to-be-calibrated rotating optical delay line 6 rotating one circle, to achieve delay calibration of all working cycles of the to-be-calibrated rotating optical delay line 6 rotating one circle specifically includes:
5.1 As can be seen from fig. 1, the working period of the to-be-calibrated rotary optical delay line 6 is determined by the number of plane mirrors in the delay line, and there are 6 working periods when the to-be-calibrated rotary optical delay line 6 rotates for one circle, so that the rest 5 working periods of the to-be-calibrated rotary optical delay line are sequentially shielded, and it is ensured that only one working period of the to-be-calibrated rotary optical delay line 6 is used for light transmission during each calibration;
5.2 Repeating the second step to the fourth step for 6 times until the delay calibration of all working periods of the rotary optical delay line 6 to be calibrated is realized.
Claims (7)
1. The quick calibration system for the delay time of the rotary optical delay line is characterized by comprising a femtosecond laser, a first beam splitting prism, a second beam splitting prism, a linear delay line, a photoconductive antenna excitation end, bias voltage, a third beam splitting prism, a rotary optical delay line to be calibrated, a reflector, a photoconductive antenna detection end, a lock-in amplifier and an oscilloscope; the first beam splitter prism, the second beam splitter prism, the linear delay line and the photoconductive antenna excitation end are sequentially arranged in the direction of the light path to form a pumping light path; the first beam splitter prism, the third beam splitter prism, the reflecting mirror, the rotary optical delay line to be calibrated and the photoconductive antenna detection end are sequentially arranged in the direction of the light path to form a detection light path; one path of laser emitted by the femtosecond laser enters the phase-locked amplifier through bias voltage bias after passing through the pumping light path, and the other path also enters the phase-locked amplifier after passing through the detection light path, and finally, signal display is carried out through an oscilloscope.
2. A method for rapidly calibrating delay time of a rotating optical delay line, characterized in that the rapid calibration system according to claim 1 is used; the quick calibration method comprises the following steps:
step one, selecting a linear delay line for calibration;
step two, a rotary optical delay line rapid calibration system is built, and the position where the terahertz signal phase difference is zero is located at the middle position C of the optical step by adjusting the relative optical path of the pumping optical path and the detection optical path;
step three, adjusting the linear delay line to enable the positions with the terahertz signal phase difference of zero to be respectively positioned at two ends of the optical step, and recording the position indication d of the linear delay line 1 D 2 ；
And step four, repeating the step three times, and calculating the average indication difference of the positions of the linear delay lines corresponding to the two ends of the optical step to obtain the actual delay time of the working period of the rotary optical delay line to be calibrated.
And fifthly, repeating the second to fourth steps according to the working period of the rotation optical delay line to be calibrated for one circle, and realizing delay calibration of all working periods of the rotation optical delay line to be calibrated for one circle.
3. The method for rapidly calibrating delay time of a rotating optical delay line according to claim 2, wherein the first step specifically comprises:
1.1 Based on the theoretical delay time of the rotating optical delay line to be calibrated, estimating the actual delay time thereof;
1.2 Determining the delay time of the linear delay line for calibration according to the theoretical delay time of the rotary optical delay line to be calibrated;
1.3 According to the required sampling interval of the terahertz time-domain spectroscopy system, determining the delay precision delta T of the linear delay line for calibration, and obtaining the minimum stepping length delta l of the linear delay line for calibration:
wherein c is the speed of light in vacuum, n 0 Is the refractive index of air.
4. The method for rapidly calibrating the delay time of the rotating optical delay line according to claim 2, wherein the second step comprises the following steps:
2.1 Building a rotary optical delay line rapid calibration system;
2.2 Placing the rotary optical delay line to be calibrated in a detection light path of the terahertz time-domain spectroscopy system, enabling the rotary optical delay line to be in a working state, placing the linear delay line in a pumping light path of the system, enabling the linear delay line to be static at a midpoint position, and recording the position indication of the linear delay line as d;
2.3 Inputting photoelectric flow generated by the detection end of the photoconductive antenna into an oscilloscope through a phase-locked amplifier;
2.4 A plurality of working periods exist for the rotation of the rotary optical delay line to be calibrated, the rest working periods of the rotary optical delay line to be calibrated are shielded, light passing of only one working period exists in the calibration process of the rotary optical delay line to be calibrated, and at the moment, only one light step exists in the photocurrent generated at the detection end of the photoconductive antenna;
2.5 Adjusting the trigger voltage and the trigger mode of signals in the oscilloscope so that an optical step generated in the working range of the rotary optical delay line to be calibrated stably appears in the screen of the oscilloscope, and recording the positions of two ends of the optical step as an end A and an end B respectively;
2.6 The optical path difference between the pumping optical path and the detection optical path in the system is regulated, so that the terahertz signal phase difference is zero and the position C is positioned in the middle of the optical step.
5. The method for rapidly calibrating the delay time of a rotating optical delay line according to claim 4, wherein the third step comprises the steps of:
3.1 The step motor is driven by the pulse signal, the delay distance of the linear delay line is changed, the position C with the terahertz signal phase difference of zero in the oscilloscope moves forwards and coincides with the end A of the optical step, and the position indication d of the linear delay line at the moment is obtained by recording the number of the pulse signals received by the encoder in the moving process of the linear delay line 1 ；
3.2 The pulse signal is applied again to drive the stepping motor, the delay distance of the linear delay line is changed, the position C with the terahertz signal phase difference of zero in the oscilloscope moves backwards and finally coincides with the end B of the optical step, and the position indication d of the linear delay line at the moment is obtained by recording the number m of the pulse signals received by the encoder in the moving process of the linear delay line 2 ：
d 2 ＝d 1 +m·△l
Where Δl is the minimum step distance of the stepper motor.
6. The method for rapidly calibrating the delay time of a rotating optical delay line according to claim 5, wherein the fourth step comprises the steps of:
4.1 Repeating the steps for a plurality of times, and solving the average indication difference of the positions of the linear delay lines corresponding to the two ends of the optical step generated by the rotary optical delay line to be calibrated to be delta d;
wherein d 2i The number indicating position d of the linear delay line when the terahertz signal recorded for the ith time is positioned at the rearmost end of the optical step 1i The number indicating position of the linear delay line is recorded for the ith recorded terahertz signal when the terahertz signal is positioned at the forefront end of the optical step, and N is the number of repeated measurement;
4.2 Obtaining the actual delay time Deltat of the rotating optical delay line to be calibrated by utilizing the relation between the delay distance and the delay time of the linear delay line:
where c is the speed at which light propagates in vacuo, n 0 Is the refractive index of air.
7. The method for rapidly calibrating the delay time of a rotating optical delay line according to claim 6, wherein the fifth step comprises the steps of:
5.1 Based on the working period of one circle of rotation of the rotary optical delay line to be calibrated, the rest working periods of the rotary optical delay line to be calibrated are sequentially shielded, and only one working period is guaranteed to be communicated for each calibration.
5.2 And (3) repeating the second step to the fourth step until the delay calibration of all working periods of the rotary optical delay line to be calibrated is realized.
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