CN116193107A - Wide-angle and long-focus module compatible test structure and test device - Google Patents
Wide-angle and long-focus module compatible test structure and test device Download PDFInfo
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- CN116193107A CN116193107A CN202310324520.7A CN202310324520A CN116193107A CN 116193107 A CN116193107 A CN 116193107A CN 202310324520 A CN202310324520 A CN 202310324520A CN 116193107 A CN116193107 A CN 116193107A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
- G01M11/0214—Details of devices holding the object to be tested
Abstract
The application discloses compatible test structure of wide angle and long burnt module and test equipment, wide angle and long burnt module compatible test structure includes at least: the device comprises a supporting seat, a positioning table, two first collimator assemblies and two rotary tables, wherein the two first collimator assemblies are respectively connected with the two rotary tables, the rotation centers of the two rotary tables are coaxial, the two rotary tables are connected with the supporting seat through connecting pieces, and a camera module to be tested is arranged on the positioning table and is opposite to the first collimator assemblies. The testing device comprises the testing structure compatible with the wide angle and the long focal module. The method and the device can achieve the testing difficulty of 9 collimator assemblies or 5 collimator assemblies in the prior art, can test the angles of view at different positions, have high automatic rotation testing precision and convenient debugging, and reduce the cost compared with the prior art; the camera module to be detected with the angle of view of 0 to 210 can be detected, and the application range is wide.
Description
Technical Field
The application belongs to the technical field of camera module testing, and particularly relates to a testing structure and a testing device compatible with a wide angle and a long focus module.
Background
As shown in fig. 1, in the existing vehicle-mounted camera module detection device, when SFR (Spatial Frequency Response ) test is performed on a camera module, in order to ensure efficiency, 9 or 5 parallel light pipes are generally adopted, when 9 or 5 parallel light pipes are adopted, only 9 or 5 parallel light pipes can be fixed at a certain position each time to test SFR of a camera view field of an automobile, and a plurality of parallel light pipes cannot be used for testing different view angles of a long-focus camera module, and after a plurality of parallel light pipes are installed, the center of the parallel light pipe is difficult to center with the center of the camera module to be tested, so that the problems of large time consumption, troublesome debugging, high cost and the like can occur.
Therefore, it is needed to provide a testing structure of a vehicle-mounted camera module, which has a simple structure, can ensure testing efficiency, can automatically calibrate out different angles to perform the SFR test of the camera module, and improves accuracy and reduces cost.
Disclosure of Invention
Aiming at the defects or shortcomings of the prior art, the application aims to solve the technical problem of providing a test structure and a test device compatible with wide-angle and long-focus modules.
In order to solve the technical problems, the application is realized by the following technical scheme:
the application provides a compatible test structure of wide angle and long burnt module includes at least: the device comprises a supporting seat, a positioning table, two first collimator assemblies and two rotary tables, wherein the two first collimator assemblies are respectively connected with the two rotary tables, the rotation centers of the two rotary tables are coaxial, the two rotary tables are connected with the supporting seat through connecting pieces, and a camera module to be tested is arranged on the positioning table and is opposite to the first collimator assemblies.
Further, the test structure compatible with the wide angle and tele modules further comprises: the trigger signal piece and the induction signal piece are correspondingly arranged, and the trigger signal piece and the induction signal piece are respectively arranged on the two first collimator assemblies.
Further, in the test structure compatible with the wide angle and the telephoto module, the support base is further provided with a stop block for limiting the movement range of the first collimator assembly.
Further, in the test structure compatible with the wide angle and the long focal module, the first collimator assembly is further provided with an external light source.
Further, the test structure compatible with the wide angle and tele modules further comprises: and the measuring tool is arranged on the supporting seat and/or the turntable.
Further, the test structure compatible with the wide angle and tele modules, wherein the positioning table comprises: six-axis gesture adjusting piece and tool, the tool with six-axis gesture adjusting piece is connected.
The application also provides a testing device, which comprises the testing structure compatible with the wide angle and long focal module.
Further, the testing device further includes: the rotary seat is provided with at least two stations, and the stations are provided with the positioning table; the positioning table of the test structure compatible with the wide angle and long focal module is arranged on the second station.
Further, the testing device further includes: the black field and white field test structure is correspondingly arranged on the third station; the black field and white field test structure comprises: integrating sphere light source module, magazine module, first lifting module and pushing away the material module, integrating sphere light source module set up in on the first lifting module, just integrating sphere light source module with be located on the third station the position adjustment platform sets up relatively, the magazine module with it is connected to push away the material module, just the magazine module set up in integrating sphere light source module with on the third station between the position adjustment platform.
Further, the testing device further includes: the electronic rearview mirror test structure is correspondingly arranged on the third station; the electronic rearview mirror test structure comprises: the image card test piece and the second lifting module are arranged on the second lifting module, and the image card test piece and the positioning table on the third station are arranged oppositely.
Further, the testing device further includes: the defocusing curve and the internal reference calibration test structure are correspondingly arranged on the fourth station; the defocusing curve and internal reference calibration test structure comprises: the second parallel light pipe assembly is arranged on the third lifting module, and the second parallel light pipe assembly is arranged opposite to the positioning table on the fourth station.
Compared with the prior art, the application has the following technical effects:
the method and the device can achieve the testing difficulty of 9 collimator assemblies or 5 collimator assemblies in the prior art, can test the angles of view at different positions, have high automatic rotation testing precision and convenient debugging, and reduce the cost compared with the prior art;
the camera module to be detected with the angle of view of 0 to 210 can be detected, and the application range is wide.
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading of the detailed description of non-limiting embodiments, made with reference to the following drawings, in which:
fig. 1: a structural schematic diagram of the prior art;
fig. 2: the embodiment of the application is a structural schematic diagram of a test structure compatible with a wide angle module and a tele module;
fig. 3: in an embodiment of the present application, a partial schematic diagram of a test structure compatible with a wide angle and a tele module is provided;
fig. 4: in an embodiment of the present application, a partial schematic diagram of a test structure compatible with a wide angle and a tele module is provided;
fig. 5: in an embodiment of the present application, a schematic structural diagram of a positioning table;
fig. 6: schematic diagram of a testing device according to an embodiment of the present application;
fig. 7: an internal schematic diagram of a test device according to an embodiment of the present application;
fig. 8: a partial schematic view of a swivel mount according to an embodiment of the present disclosure;
fig. 9: schematic diagram of a black field and white field test structure in an embodiment of the application;
fig. 10: in an embodiment of the present application, a schematic diagram of a black field and white field test structure is partially shown;
fig. 11: schematic diagram of defocus curve and internal reference calibration test structure in one embodiment of the application;
in the figure: the camera module to be tested 0, the supporting seat 1, the first motor 101, the second motor 102, the positioning table 2, the jig 201, the X-axis moving group 202, the Y-axis moving group 203, the Z-axis moving group 204, the Z-axis rotating group 205, the X-axis rotating group 206, the Y-axis rotating group 207, the connecting frame 208, the first collimator assembly 3, the turntable 4, the rotating shaft 5, the connecting piece 6, the trigger signal piece 7, the sensing signal piece 8, the stop block 9, the external light source 10, the measuring tool 11, the black field white field test structure 12, the integrating sphere light source module 1201, the cassette module 1202, the first lifting module 1203, the pushing module 1204, the defocus curve and internal reference calibration test structure 13, the second collimator assembly 1301, the third lifting module 1302, the rotating seat 14, the first station 1401, the second station 1402, the third station 1403, the fourth station 1404, the rotating platform 1405, the rotating column 1406, the base 1407, 1408 and the housing 15.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
As shown in fig. 2 to 4, one embodiment of the present application is a test structure compatible with a wide-angle and a telephoto module, at least including: the camera module to be measured 0 is arranged on the positioning table 2 and is opposite to the first collimator assembly 3.
In the embodiment, the number of the first collimator assemblies 3 is two, the first collimator assemblies are respectively arranged at one ends of the rotary tables 4, the other ends of the two rotary tables 4 are rotatably arranged with the rotary shaft 5, and the first collimator assemblies are arranged on the supporting seat 1 through the connecting piece 6; the camera module to be tested 0 is arranged on the positioning table 2, and the camera module to be tested 0 and the two first collimator assemblies 3 are oppositely arranged. Through the arrangement, the two first collimator assemblies 3 can rotate and are driven by the turntable 4 to rotate, 270-degree rotation of the first collimator assemblies 3 is realized, and the precision can reach +/-0.02mm; meanwhile, the positioning table 2 can drive the camera module 0 to be tested to adjust the pose. Therefore, the test efficiency of nine collimator assemblies in the prior art can be realized, namely, the test time of each camera module is 40-50 seconds, and compared with the prior art, the cost is reduced.
Optionally, the first collimator assembly 3 includes, but is not limited to, a 15 ° collimator or a 30 ° collimator.
Specifically, the first collimator assembly 3 is driven to rotate by the first motor 101.
Alternatively, the first motor 101 includes, but is not limited to, a stepper motor.
Specifically, the turntable 4 is driven to rotate by the second motor 102.
Optionally, the second motor 102 includes, but is not limited to, a servo motor.
Specifically, the positioning table 2 includes: the six-axis gesture adjusting device comprises a six-axis gesture adjusting piece and a jig 201, wherein the jig 201 is connected with the six-axis gesture adjusting piece.
In this embodiment, the fixture 201 clamps the camera module 0 to be tested and is connected to the six-axis gesture adjusting member, so that the camera module 0 to be tested can realize six-axis motion.
Optionally, the jig 201 is a profiling jig, and a profiling cavity is provided according to the camera module 0 to be tested to ensure that the camera module is stably clamped in the jig 201.
As shown in fig. 5, the six-axis gesture adjusting member includes: the X-axis moving group 202, the Y-axis moving group 203, the Z-axis moving group 204, the Z-axis rotating group 205, the X-axis rotating group 206 and the Y-axis rotating group 207 are sequentially connected, the Y-axis rotating group 207 is connected with the jig 201 through a connecting frame 208, six-axis movement of the jig 201 is realized, and the precision can reach 5um. Optionally, the six-axis gesture adjusting member can be set to be manually gesture-adjusting or electric gesture-adjusting according to actual requirements, and the embodiment adopts electric automatic gesture-adjusting.
Optionally, the wide-angle and tele module compatible test structure further includes: the trigger signal piece 7 and the induction signal piece 8 that correspond to the setting, trigger signal piece 7 with the induction signal piece 8 sets up respectively two on the first collimator assembly 3 to avoid the position of two first collimator assemblies 3 too closely and bump.
In this embodiment, the sensing signal piece 8 can sense the trigger signal piece 7 when the included angle position of the two first collimator assemblies 3 is smaller than 35 °, so that the two first collimator assemblies 3 can be moved to a safe distance to stop.
Specifically, the support base 1 is further provided with a stop 9 for limiting the movement range of the first collimator assembly 3, so as to avoid the first collimator assembly 3 from colliding during movement.
Specifically, the first collimator assembly 3 is further provided with an external light source 10.
In this embodiment, an external light source 10 is provided for the first collimator assembly 3, and the external light source 10 is an annular light source, so that the first collimator assembly 3 can accurately find deviation and improve accuracy when physically calibrating the rotation center.
Optionally, the wide-angle and tele module compatible test structure further includes: and a measuring tool 11, wherein the measuring tool 11 is arranged on the supporting seat 1 and/or the turntable 4.
In this embodiment, gauges 11 are provided on both the support base 1 and the turntable 4 to facilitate quick adjustment of the first collimator assembly 3 to a vertical or horizontal position.
As shown in fig. 6 and 7, the present application further proposes a testing device, which includes the testing structure compatible with the wide-angle and tele modules.
In this embodiment, the test structure compatible with the wide angle and tele modules is disposed in the housing 15 to facilitate the integrated test.
Specifically, the test structure for compatibility of the wide-angle and tele modules is described in detail above, and will not be described herein.
As shown in fig. 8, the test apparatus further includes: a rotary seat 14 with at least two stations, wherein the stations are provided with the positioning table 2; the positioning table 2 of the test structure compatible with the wide angle and tele modules is arranged on the second station 1402.
In this embodiment, the rotary base 14 is provided with four stations, and a person skilled in the art is motivated to adapt the number thereof to be increased or decreased. The rotating seat 14 with four stations is provided with a positioning table 2, the first station 1401 is a loading and unloading station, namely, the camera module 0 to be tested is placed in the jig 201 of the positioning table 2 of the first station 1401, and is rotated to the second station 1402 through the rotating seat 14 to perform SFR (Spatial Frequency Response, space frequency response) test, namely, test is performed by using the test structure compatible with the wide-angle and tele modules.
Optionally, the rotating base 14 includes at least: a rotary table 1405, a spin column 1406, and a base 1407, wherein the rotary table 1405 is connected to the spin column 1406, the positioning table 2 is disposed on the base 1407, and the base 1407 is connected to the rotary table 1405 via a connection plate 1408.
In this embodiment, four bases 1407 are provided, that is, corresponding to four stations, and the rotary column drives the bases 1407 to rotate under the drive of the motor.
As shown in fig. 9 and 10, the test apparatus further includes: a black field and white field test structure 12, wherein the black field and white field test structure 12 is correspondingly arranged on the third station 1403; the black field and white field test structure 12 includes: integrating sphere light source module 1201, magazine module 1202, first lifting module 1203 and pushing module 1204, integrating sphere light source module 1201 set up in on the first lifting module 1203, just integrating sphere light source module 1201 with be located on the third station 1403 the setting is relative, magazine module 1202 with pushing module 1204 is connected, just magazine module 1202 set up in integrating sphere light source module 1201 with on the third station 1403 between the setting 2.
In this embodiment, after the to-be-tested camera module 0 passes through the SFR test of the second station, the rotating seat 14 drives the to-be-tested camera module 0 to the third station 1403, the third station 1403 is provided with the black field white field test structure 12, the first lifting module 1203 is lifted or lowered to drive the integrating sphere light source module 1201 to perform the white field test, and when the white field test is completed, the cassette module 1202 arranged below the integrating sphere light source module 1201 is moved to the position right below the integrating sphere light source module 1201 through the pushing module 1204, i.e. the cassette module 1202 and the to-be-tested camera module 0 are oppositely arranged to perform the black field test.
Optionally, the pushing module 1204 includes, but is not limited to, a cylinder assembly.
As shown in fig. 11, the test apparatus further includes: the defocus curve and the internal reference calibration test structure 13 are correspondingly arranged on the fourth station 1404; the defocus curve and internal reference calibration test structure 13 comprises: the second parallel light pipe assembly 1301 and the third lifting module 1302, the second parallel light pipe assembly 1301 is arranged on the third lifting module 1302, and the second parallel light pipe assembly 1301 is arranged opposite to the positioning table 2 at the fourth station 1404.
In this embodiment, after the camera module 0 to be tested passes through the black field and white field test of the third station, the camera module 0 to be tested is driven by the rotating seat 14 to the fourth station 1404, the fourth station 1404 is provided with the defocus curve and the internal reference calibration test structure 13, the second parallel light pipe assembly 1301 is arranged on the third lifting module 1302, and the second parallel light pipe assembly 1301 is driven to move by the lifting or lowering of the third lifting module 1302 to perform the defocus curve and the internal reference calibration test.
Optionally, the second collimator assembly 1301 includes, but is not limited to, a 30 ° collimator.
In another embodiment of the present application, the third station 1403 of the testing apparatus may also be configured as an electronic rearview mirror test configuration; the electronic rearview mirror test structure comprises: the graphic card test piece and the second lifting module are arranged on the second lifting module, and the graphic card test piece and the positioning table 2 positioned on the third station 1403 are arranged oppositely.
In this embodiment, the third station 1403 is replaced with an electronic rear view mirror test structure to perform an automobile CMS (Camera Monitor System, electronic rear view mirror) test. Specifically, a graphic card test piece (not shown in the figure) is arranged on a second lifting module (not shown in the figure), and the graphic card test piece is moved under the driving of the lifting or lowering of the second lifting module to test the electronic rearview mirror.
Alternatively, the graphic card test piece includes, but is not limited to, glass provided with a color graphic card or glass provided with a gray graded graphic card.
In the description of the present application, unless explicitly stated and limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art as the case may be.
In this application, unless expressly stated or limited otherwise, a first feature "above" or "below" a second feature may include both the first and second features being in direct contact, and may also include the first and second features not being in direct contact but being in contact with each other by way of additional features therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly under and obliquely below the second feature, or simply means that the first feature is less level than the second feature.
In the description of the present embodiment, the terms "upper", "lower", "left", "right", etc. azimuth or positional relationship are based on the azimuth or positional relationship shown in the drawings, and are merely for convenience of description and simplification of operations, and do not indicate or imply that the apparatus or element referred to must have a specific azimuth, be configured and operated in a specific azimuth, and thus should not be construed as limiting the present application. Furthermore, the terms "first," "second," and the like, are used merely for distinguishing between descriptions and not for distinguishing between them.
The above embodiments are only for illustrating the technical solution of the present application, not for limiting, and the present application is described in detail with reference to the preferred embodiments. It will be understood by those skilled in the art that various modifications and equivalent substitutions may be made to the technical solution of the present application without departing from the spirit and scope of the technical solution of the present application, and it is intended to cover within the scope of the claims of the present application.
Claims (11)
1. A test structure compatible with wide angle and long focus module is characterized in that at least includes: the device comprises a supporting seat, a positioning table, two first collimator assemblies and two rotary tables, wherein the two first collimator assemblies are respectively connected with the two rotary tables, the rotation centers of the two rotary tables are coaxial, the two rotary tables are connected with the supporting seat through connecting pieces, and a camera module to be tested is arranged on the positioning table and is opposite to the first collimator assemblies.
2. The wide-angle and tele module compatible test structure of claim 1, further comprising: the trigger signal piece and the induction signal piece are correspondingly arranged, and the trigger signal piece and the induction signal piece are respectively arranged on the two first collimator assemblies.
3. The wide-angle and tele module compatible testing structure of claim 1, wherein the support base is further provided with a stop for limiting a range of motion of the first collimator assembly.
4. The test structure of claim 1, wherein the first collimator assembly further comprises an external light source.
5. The wide-angle and tele module compatible testing structure of any one of claims 1 to 4, further comprising: and the measuring tool is arranged on the supporting seat and/or the turntable.
6. The wide-angle and tele module compatible testing structure of any one of claims 1 to 4, wherein the positioning stage comprises: six-axis gesture adjusting piece and tool, the tool with six-axis gesture adjusting piece is connected.
7. A testing device comprising the wide and tele module compatible testing structure of any one of claims 1 to 6.
8. The test apparatus of claim 7, further comprising: the rotary seat is provided with at least two stations, and the stations are provided with the positioning table; the positioning table of the test structure compatible with the wide angle and long focal module is arranged on the second station.
9. The test apparatus of claim 8, further comprising: the black field and white field test structure is correspondingly arranged on the third station; the black field and white field test structure comprises: integrating sphere light source module, magazine module, first lifting module and pushing away the material module, integrating sphere light source module set up in on the first lifting module, just integrating sphere light source module with be located on the third station the position adjustment platform sets up relatively, the magazine module with it is connected to push away the material module, just the magazine module set up in integrating sphere light source module with on the third station between the position adjustment platform.
10. The test apparatus of claim 8, further comprising: the electronic rearview mirror test structure is correspondingly arranged on the third station; the electronic rearview mirror test structure comprises: the image card test piece and the second lifting module are arranged on the second lifting module, and the image card test piece and the positioning table on the third station are arranged oppositely.
11. The test device of claim 9 or 10, further comprising: the defocusing curve and the internal reference calibration test structure are correspondingly arranged on the fourth station; the defocusing curve and internal reference calibration test structure comprises: the second parallel light pipe assembly is arranged on the third lifting module, and the second parallel light pipe assembly is arranged opposite to the positioning table on the fourth station.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310324520.7A CN116193107A (en) | 2023-03-29 | 2023-03-29 | Wide-angle and long-focus module compatible test structure and test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310324520.7A CN116193107A (en) | 2023-03-29 | 2023-03-29 | Wide-angle and long-focus module compatible test structure and test device |
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| CN116193107A true CN116193107A (en) | 2023-05-30 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202310324520.7A Pending CN116193107A (en) | 2023-03-29 | 2023-03-29 | Wide-angle and long-focus module compatible test structure and test device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116708764A (en) * | 2023-08-09 | 2023-09-05 | 苏州艾微视图像科技有限公司 | Inspection device and inspection method for camera internal parameters |
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2023
- 2023-03-29 CN CN202310324520.7A patent/CN116193107A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116708764A (en) * | 2023-08-09 | 2023-09-05 | 苏州艾微视图像科技有限公司 | Inspection device and inspection method for camera internal parameters |
| CN116708764B (en) * | 2023-08-09 | 2023-11-24 | 苏州艾微视图像科技有限公司 | Inspection device and inspection method for camera internal parameters |
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