CN116187715B

CN116187715B - Method and device for scheduling execution of test tasks

Info

Publication number: CN116187715B
Application number: CN202310426317.0A
Authority: CN
Inventors: 郭虹利; 朱俊杰; 戴政桦; 吕岩; 俞敏莲
Original assignee: Basf Integrated Base Guangdong Co ltd
Current assignee: Basf Integrated Base Guangdong Co ltd
Priority date: 2023-04-19
Filing date: 2023-04-19
Publication date: 2023-07-21
Anticipated expiration: 2043-04-19
Also published as: CN116187715A

Abstract

The present disclosure provides methods and apparatus for scheduling execution of test tasks. In the method, determining a test task to be arranged; task demand information of a task to be tested is acquired, tester information and a tested plan are acquired, and equipment idle time of the equipment to be tested is determined according to the tested plan; determining personnel idle time of each tester according to the tester information and the arranged test plan; and according to the equipment idle time, the personnel idle time and the estimated execution time, arranging corresponding target test equipment, target test personnel and target test time periods for the test tasks to be arranged. By the technical scheme, the idle time of the test equipment and the test personnel can be fully utilized, so that the execution plan of each test task is more compact and efficient.

Description

Method and device for scheduling execution of test tasks

Technical Field

The present disclosure relates to the field of computer technology, and in particular, to a method and apparatus for scheduling execution of test tasks.

Background

In the application scenario of industrial production, a laboratory matched with a production line is used for sampling and testing products on the production line so as to check the quality, qualification rate and the like of the products. During operation of the production line, the laboratory may sample from the production line to obtain product samples, and then take each product sample as a test task. When there are scheduled test tasks to be executed, execution plans may be scheduled for new test tasks after the scheduled test tasks to be executed in a first-to-first order, i.e., test times, testers, etc. are scheduled for the new test tasks.

Disclosure of Invention

In view of the foregoing, the present disclosure provides methods and apparatus for scheduling execution of test tasks. By the technical scheme, the idle time of the test equipment and the test personnel can be fully utilized, so that the execution plan of each test task is more compact and efficient.

According to one aspect of the present disclosure, there is provided a method for scheduling execution of a test task, comprising: determining a test task to be arranged; acquiring task demand information of the to-be-scheduled test task, wherein the task demand information comprises equipment information of to-be-selected test equipment for the to-be-scheduled test task and estimated execution time; acquiring tester information and an arranged test plan, wherein the arranged test plan comprises arranged test tasks, test time periods occupied by the test tasks, testers and test equipment, and the tester information comprises tester identifications and on-duty time; determining the equipment idle time of the to-be-selected test equipment according to the arranged test plan; determining personnel idle time of each tester according to the tester information and the arranged test plan; and according to the equipment idle time, the personnel idle time and the estimated execution time length, corresponding target test equipment, target test personnel and target test time periods are arranged for the to-be-arranged test tasks.

According to another aspect of the present disclosure, there is also provided an apparatus for scheduling execution of a test task, including: the task determining unit is used for determining a test task to be arranged; the task demand information acquisition unit is used for acquiring task demand information of the to-be-scheduled test task, wherein the task demand information comprises equipment information of to-be-selected test equipment used for the to-be-scheduled test task and estimated execution time; the system comprises a personnel information and plan acquisition unit, a test personnel information and an arranged test plan, wherein the arranged test plan comprises arranged test tasks, test time periods occupied by the test tasks, test personnel and test equipment, and the test personnel information comprises a test personnel identifier and a duty time; the equipment idle time determining unit is used for determining the equipment idle time of the to-be-selected test equipment according to the arranged test plan; a personnel idle time determining unit for determining personnel idle time of each tester according to the tester information and the arranged test plan; and a task scheduling unit for scheduling corresponding target test equipment, target test personnel and target test time period for the test task to be scheduled according to the equipment idle time, the personnel idle time and the estimated execution time.

According to another aspect of the present disclosure, there is also provided an electronic apparatus including: at least one processor, a memory coupled with the at least one processor, and a computer program stored on the memory, the at least one processor executing the computer program to implement a method for scheduling execution of a program for a test task as described in any of the above.

According to another aspect of the present disclosure, there is also provided a computer readable storage medium storing a computer program which, when executed by a processor, implements a method for scheduling execution of test tasks as described above.

Drawings

A further understanding of the nature and advantages of the present disclosure may be realized by reference to the following drawings. In the drawings, similar components or features may have the same reference numerals.

FIG. 1 illustrates a flow chart of one example of a method for scheduling execution of a program for a test task according to the present disclosure.

FIG. 2 illustrates a schematic diagram of one example of a pre-recorded test task according to the present disclosure.

FIG. 3 illustrates a schematic diagram of one example of an arranged test plan according to the present disclosure.

FIG. 4 illustrates a flow chart of another example for scheduling execution of a program for a test task according to the present disclosure.

FIG. 5 illustrates a flow chart of another example for scheduling execution of a program for a test task according to the present disclosure.

FIG. 6 illustrates a flow chart of another example for scheduling execution of a program for a test task according to the present disclosure.

Fig. 7 illustrates a block diagram of one example of an apparatus for scheduling execution of a program for a test task according to the present disclosure.

Fig. 8 shows a block diagram of an electronic device for implementing a test task execution scheduling method according to the present disclosure.

Detailed Description

The subject matter described herein will be discussed below with reference to example embodiments. It should be appreciated that these embodiments are discussed only to enable a person skilled in the art to better understand and thereby practice the subject matter described herein, and are not limiting of the scope, applicability, or examples set forth in the claims. Changes may be made in the function and arrangement of elements discussed without departing from the scope of the disclosure. Various examples may omit, replace, or add various procedures or components as desired. In addition, features described with respect to some examples may be combined in other examples as well.

As used herein, the term "comprising" and variations thereof mean open-ended terms, meaning "including, but not limited to. The term "based on" means "based at least in part on". The terms "one embodiment" and "an embodiment" mean "at least one embodiment. The term "another embodiment" means "at least one other embodiment". The terms "first," "second," and the like, may refer to different or the same object. Other definitions, whether explicit or implicit, may be included below. Unless the context clearly indicates otherwise, the definition of a term is consistent throughout this specification.

However, in the above-described execution scheduling manner, the respective test tasks are arranged in the order of first-come first-served, which results in that some test devices or testers have a long idle time, and the test tasks that can use the test devices or testers are arranged in a later period, which results in a low utilization rate of the test devices and testers, and a low efficiency of execution scheduling of the respective test tasks.

In view of the foregoing, the present disclosure presents methods and apparatus for scheduling execution of test tasks. In the method, determining a test task to be arranged; task demand information of a task to be tested is acquired, tester information and a tested plan are acquired, and equipment idle time of the equipment to be tested is determined according to the tested plan; determining personnel idle time of each tester according to the tester information and the arranged test plan; and according to the equipment idle time, the personnel idle time and the estimated execution time, arranging corresponding target test equipment, target test personnel and target test time periods for the test tasks to be arranged. By the technical scheme, the idle time of the test equipment and the test personnel can be fully utilized, so that the execution plan of each test task is more compact and efficient.

The method and apparatus for scheduling execution of test tasks of the present disclosure is described in detail below with reference to the accompanying drawings.

FIG. 1 illustrates a flow chart of one example 100 of a method for scheduling execution of a program for a test task according to the present disclosure.

One application scenario of the example shown in fig. 1 may be an industrial production application scenario in which a laboratory associated with a production line may be configured. The laboratory is used for sampling and testing products on a production line so as to check the quality, qualification rate and the like of the products. The technical solution of the present disclosure may be performed in a laboratory, and each test task performed in the laboratory may be directed to a product on a production line. The laboratory and the production line can run synchronously and asynchronously.

In one example, the application scenario of industrial production may be chemical production. In the application scenario of chemical production, the chemical production line is used for producing chemical products, and objects aimed at by each test task executed in a laboratory are chemical products.

In one example, the disclosed aspects may be implemented by a laboratory resource monitoring device for synchronizing and monitoring owned resources, including supplies, equipment, personnel, customer demand supplies, and the like, in real time. For example, the resource monitoring device may be a device running APS (Advanced Planning and Scheduling) applications.

As shown in FIG. 1, at 110, a test task to be scheduled may be determined.

In this disclosure, a test task to be scheduled may be a test task that has been created and that requires an execution plan to be scheduled. In one example, the test tasks to be scheduled may be created and issued by a lab SAP (System Applications and Products) system, the SAP system may be used to maintain the test tasks, as well as metrics of the test tasks, etc. In one example, in a laboratory, the resource monitoring device may be communicatively coupled to a device running the SAP system, and the manner of communication may include direct and indirect connections. In an indirect connection, the resource monitoring device may be connected to the equipment running the SAP system through OPC (OLE for Process Control).

In the present disclosure, the test tasks to be arranged may be determined according to the types of products, and different types of products may perform different test tasks. Thus, when determining the task to be tested, the type of product for which the task to be tested is intended can be determined.

In one example, the test tasks to be scheduled corresponding to the product samples may be determined from the product samples collected from sampling points on the production line. In this example, during operation of the production line, samples may be taken from the production line. The sampling mode can be random sampling or sampling at fixed sampling points.

Product samples for testing tasks can be acquired through sampling operation, and each product sample corresponds to one testing task. The types of the product samples are different, and the corresponding test tasks can be different. In this example, the test tasks to be excluded may be determined correspondingly from the product samples collected on the production line.

At 120, task demand information for the test tasks to be scheduled may be obtained.

In the present disclosure, each test task is predetermined, each test task corresponds to a fixed test procedure, and each test procedure of each test task may be formed by a plurality of procedures, and each procedure may further include a plurality of steps. In the test flow for the test task, each process is sequentially executed, and the execution sequence of each process is determined.

In the present disclosure, the equipment and/or personnel required for each process in each test task may be different. For a process requiring equipment, the equipment required for the process may be deterministic. For example, the equipment required in the process "muffle furnace ash burn" is a muffle furnace. In addition, each procedure in each test task may correspond to an estimated execution time period, the estimated execution time period corresponding to each procedure is used to represent a time required for executing the procedure, and the estimated execution time periods corresponding to different procedures may be different.

In one example, each test task may be pre-recorded or stored, and relevant information corresponding to each test task may also be pre-recorded, where the relevant information is determined information of the test task, for example, a procedure included in the test task, a step included in each procedure, equipment and/or personnel required by each procedure, and estimated execution duration of each procedure, etc.

FIG. 2 illustrates a schematic diagram of one example of a pre-recorded test task according to the present disclosure. As shown in fig. 2, the test task includes two procedures: the ash weighing and ash burning and the muffle furnace ash burning comprise a plurality of steps, wherein the estimated execution time of the ash weighing and ash burning is 5 minutes, and the estimated execution time of the muffle furnace ash burning is 15 minutes.

In one way of recording the test tasks, the individual test tasks may be pre-recorded in the device, for example, a resource monitoring device of a laboratory. When the task demand information of the test task needs to be acquired, the task demand information can be directly called from the equipment.

In another approach, the individual test tasks may be pre-recorded in a form of a document, such as an Excel form. When task demand information of a test task needs to be acquired, the table may be input into a corresponding device (e.g., a resource monitoring apparatus), and the device may extract the corresponding information from the table.

In the disclosure, after determining a task to be tested, the task to be tested may be screened from pre-recorded test tasks, and task requirement information may be obtained from the recorded information of the task to be tested, where the task requirement information of the task to be tested may include device information of a device to be tested for the task to be tested, estimated execution duration, and the like. The device information may include at least one of a device identification, a device name, and the like. The test equipment to be selected is equipment for testing tasks to be arranged. For example, when the muffle furnace is required to burn ash in the test task to be discharged, the corresponding test equipment to be selected is the muffle furnace.

At 130, tester information and an ordered test plan may be obtained.

In the present disclosure, the tester information may include tester identification and time on duty. The tester identification may include at least one of a job number, a name, etc. of the tester. The time on duty of the tester can be used to determine if the tester can schedule. In one example, the tester information may further include at least one of a position, a professional field, a right, and the like of the tester.

In one example, the tester information may be pre-recorded in a device, such as a resource monitoring device of a laboratory. When the tester information needs to be acquired, the tester information can be directly called from the equipment.

In another example, the tester information may be pre-recorded in a form of a document, such as an Excel form. When the tester information needs to be acquired, the table can be input into corresponding equipment (such as a resource monitoring device), and the equipment can extract the corresponding tester information from the table.

In the present disclosure, the arranged test plan may include each of the test tasks that are arranged, as well as the test period, testers, and test equipment that are occupied by each of the test tasks. In the arranged test plans, the test equipment and the test personnel can be displayed separately. FIG. 3 illustrates a schematic diagram of one example of an arranged test plan according to the present disclosure. As shown in FIG. 3, a column of resource names includes each test device and tester, and each row is used to indicate the time schedule of the test device or tester corresponding to that row. The length of each block in the transverse direction used to characterize a process represents the estimated execution time of that process.

In the present disclosure, the arranged test plans may be updated in real time, and the arranged test plans may be updated in real time according to the execution condition of the test tasks. It should be noted that, in the present disclosure, the real time is a response within a specified time.

At 140, device idle times for the candidate test devices may be determined according to the ranked test plans.

In the present disclosure, the test devices to be selected may include a plurality of devices, and may also include a plurality of types of devices. The same type of test equipment provided for a test task may include multiple test equipment. For example, there may be 3 muffle furnaces, and then all 3 muffle furnaces may be used as alternative devices.

The device idle time of the test device to be selected is another time than the scheduled time of the test device to be selected. When multiple candidate test devices of the same type are available as candidate devices, in one example, a device idle time for each candidate device may be determined, each candidate device having a likelihood of being selected to perform a task for testing.

In another example, for multiple candidate devices belonging to the same type of candidate test device, a total scheduled execution time period for each candidate device may be determined according to the scheduled test plan. And then, screening target candidate devices from the candidate devices according to the total execution duration of each candidate device. The total execution duration of the target alternative devices is smaller than the total execution duration corresponding to other alternative devices. If the device idle time of the target candidate device, which is the candidate test device, is determined according to the ranked test plan, then the target candidate device may be subsequently arranged to perform the ranking test task.

For example, the test equipment to be selected comprises a muffle furnace, and 3 muffle furnaces serving as alternatives are respectively a muffle furnace No. 1, a muffle furnace No. 2 and a muffle furnace No. 3. The total execution duration of each muffle furnace can be determined according to the arranged test plan, and a muffle furnace No. 3 with the small total execution duration is taken as a target candidate device, so that the muffle furnace No. 3 can be arranged to execute the test task to be arranged.

By the method, the total execution duration of each device can represent the workload and the operation duration of the device, and by selecting the device with less total execution duration as the target candidate device, the workload and the operation duration of each device can be balanced, so that the overall execution efficiency of the test task can be improved, and the service life of the device can be prolonged.

At 150, personnel idle time for each tester may be determined based on the tester information and the ranked test plans.

And screening the testers on duty according to the on-duty time information in the tester information, wherein the testers can be scheduled with test tasks, so that the personnel idle time of each screened tester can be determined. The personnel idle time of a tester is the time of the tester other than the scheduled time, which can be derived from the scheduled test plan.

In one example, the tester information may include at least one of a position, a professional field, a right, and the like of the tester. Different test tasks may have different requirements for the testers, for example, some test tasks may be performed by a person with a high position (e.g., a supervisor), some test tasks may be performed by a person with a certain professional field (e.g., moisture testing), and some test tasks may be performed by a person with a specific authority.

In this example, the task demand information of the test task to be scheduled may also include personnel requirements of a tester for performing the test task to be scheduled, which may include requirements for positions, professional fields, rights, and the like.

In this example, the candidate testers meeting the personnel requirements may be screened from the tester information, and then the personnel idle time of each candidate tester is determined according to the candidate testers and the arranged test plan.

At 160, corresponding target test equipment, target test personnel and target test time periods may be scheduled for the test task to be scheduled according to the equipment idle time, the personnel idle time and the estimated execution time.

In one example, the device idle time of each test device to be selected and the personnel idle time of each tester may be cross-compared to screen out a first period of time in which the device idle time and the personnel idle time coincide. And then, further screening from the screened first time periods according to the estimated execution time length of the test tasks to be discharged to obtain a second time period with continuous time length not smaller than the estimated execution time length. And each obtained second time period meets the requirements of the test tasks to be arranged. Then, determining a target test time period from the obtained second time periods, and determining corresponding target testers and target test equipment according to the target test time period.

In one example, after the second time periods are obtained, one of the second time periods may be arbitrarily selected from the second time periods, a time period identical to the estimated execution time period may be intercepted from the selected second time period, and the intercepted time period may be determined as the target test time period.

In another example, after obtaining the second time period, one second time period closest to the current time may be selected from the second time periods, then a time period identical to the estimated execution duration may be intercepted from the selected second time period, and the intercepted time period may be determined as the target test time period.

In another example, after obtaining the second time period, one second time period having the closest time length to the estimated execution time length may be selected from the second time periods, then a time period identical to the estimated execution time length may be intercepted from the selected second time period, and the intercepted time period may be determined as the target test time period. When the second time period which is the same as the estimated execution time length exists in the obtained second time period, the same second time period can be directly determined as the target test time period.

In one example of determining the target test device, a test device to be selected that is idle for the target test period may be determined from among the test devices to be selected, and then one test device is selected as the target test device from among the determined test devices to be selected. In addition, the target test equipment can be determined according to the determined total execution duration corresponding to each test equipment to be selected.

In one example of determining the target tester, a candidate tester that is idle for the target test period may be determined from among the testers, and then one tester is selected as the target tester from among the determined candidate testers. In addition, the target testers can be determined according to the determined total execution duration corresponding to each candidate tester. For example, the candidate tester with the shortest total execution duration can be determined to be the target tester, so that the workload of each tester can be balanced.

In one example of the present disclosure, the task to be tested may include a plurality of sequential processes, and the task requirement information of the task to be tested includes device information of the test device to be tested corresponding to each process and estimated execution time. In this example, execution plans may be respectively arranged for the respective processes, and the respective processes need not be continuously executed, and only the execution order of the arranged respective processes need be ensured.

In this example, for each process, according to the equipment idle time, the personnel idle time and the estimated execution duration corresponding to the process, a corresponding target test equipment, a target test personnel and a target test time period can be arranged for the process, and the execution sequence of each arranged process is unchanged.

In one example, for each process in the test tasks to be scheduled, execution plans may be arranged for each process in turn according to the execution order of the process. For example, an execution plan is first scheduled for a first process, after the execution plan for the first process is completed, the execution plan is continued to be scheduled for a second process, and so on.

For example, after the execution plan of the first process is completed, the resulting current ranked test plan includes the execution plan of the first process. And then, re-determining the equipment idle time of the to-be-selected test equipment corresponding to the second procedure and the personnel idle time of the testers according to the current arranged test plan, and arranging corresponding target test equipment, target testers and target test time periods for the second procedure according to the re-determined equipment idle time, personnel idle time and estimated execution time corresponding to the second procedure. The target test period of the second process is after the target test period of the first process.

In one example, for each process in a test task to be ranked, it may be checked whether there is a ranked process in the ranked test plan that is the same process type as that process. If so, the information such as the test equipment and the estimated execution time corresponding to the arranged procedure can be the same as the procedure. Thus, the discharged process and the process can be batched. The batch processing is to integrate and execute a plurality of working procedures with the same working procedure type, so that the execution time can be saved, and the execution efficiency of the test task is improved. For example, the muffle furnace shown in FIG. 3 batch 4 identical processes "Ash-20".

Then, the test equipment, the tester, and the test time period of the batch of the arranged processes may be determined as the target test equipment, the target tester, and the target test time period corresponding to the process, respectively.

In addition, when all the working procedures in the test task to be arranged can not be subjected to batch processing, corresponding target test equipment, target test personnel and target test time periods are arranged for all the working procedures according to the equipment idle time, the personnel idle time and the estimated execution time length corresponding to the working procedures.

In one example of the present disclosure, after obtaining an execution plan of a task to be tested, execution plan information of the task to be tested may be updated to a total execution plan, where the execution plan information may include information of a target test device, a target tester, and a target test period corresponding to the task to be tested. The overall execution plan is an overview of the execution plan of the test task. The overall execution plan may be presented with execution plans for unexecuted test tasks and test tasks currently being executed.

The overall execution plan may be dynamically updated in real-time. After the execution plan information of the test tasks to be scheduled is updated to the total execution plan, the states of the target test equipment and the target test personnel in the total execution plan in the target test time period are updated to be occupied states.

In this example, the total execution plan may be displayed in real-time. The total execution plan is displayed by taking a tester as an object, and can also be displayed by taking a test task as an object.

For the example shown in fig. 4, after determining the task to be tested, it may be determined whether the task to be tested corresponds to a test priority. If not, then the execution plan is arranged in accordance with the example shown in FIG. 1; if so, the execution plan may be arranged in accordance with the operations shown in FIG. 4. Aiming at the test priorities corresponding to the test tasks, the test task with high test priority is executed preferentially, and the test task with low test priority is executed after the test task with low test priority is executed.

In one example, the priorities of the test tasks may include a sample priority for the sample and/or a task priority for the test tasks.

As shown in fig. 4, at 410, a first test priority corresponding to a test task to be ranked may be determined.

The test priority of each test task can be customized, and can be determined according to the execution sequence or importance degree among the test tasks.

At 420, when there are test tasks in the ranked test plan that have a lower test priority than the first test priority, a test task having a lower test priority than the first test priority may be determined from the ranked test plan.

At 430, it may be determined whether an execution plan can be scheduled for the test task to be scheduled in the scheduled test plan. If so, then the operations of 440 are performed. If not, then the operations of 450 are performed.

At 440, an execution plan may be scheduled for the task to be scheduled according to the scheduled test plan such that the scheduled task to be scheduled marks the test period before the test period corresponding to the determined test task, which may ensure that the task to be scheduled can be preferentially executed.

At 450, the determined individual test tasks may be deleted from the ranked test plans.

At 460, the current test task to be ranked may be determined from the test tasks to be ranked and the determined test tasks in order of the test priorities from high to low.

In the process of scheduling the execution plan, the execution can be performed in a plurality of rounds, and each round of execution plan of a test task is scheduled. For example, the test task with the highest test priority is scheduled in the first round, the test task with the second highest test priority is scheduled in the second round, and so on.

At 470, for the current test task to be ranked, a device idle time of the candidate test device corresponding to the current test task may be determined according to the current ranked test plan.

In this example, the current ranked test plans in different rounds are different. For example, the current ranked test plan in the first round is obtained by deleting each determined test task from the ranked test plan. The current ranked test plan in the second round is derived from the current ranked test plan in the first round plus the execution plan of the test tasks scheduled in the first round.

The current test tasks in different rounds may be different, and the corresponding test devices to be selected may be different, so that the determined device space time may also be different.

At 480, personnel idle time for each of the testers performing the current test task may be determined based on the tester information and the current ranked test plan.

At 490, an execution plan may be scheduled for the current task to be tested, i.e., corresponding target test equipment, target test personnel, and target test time periods, based on the determined equipment idle time, personnel idle time, and the corresponding estimated execution time period for the current test task.

At 500, a determination is made as to whether the test task to be scheduled and the determined test task are scheduled to be completed. If yes, the arrangement of the test tasks to be arranged and the determined test tasks is completed. If not, then the operation of 460 is returned to execution.

By the above example, the execution plan for the to-be-scheduled test task can be arranged under the condition that the to-be-scheduled test task corresponds to the test priority, and the execution plan of each test task is more compact and efficient on the basis of ensuring that the arranged to-be-scheduled test task accords with the test priority.

For the example shown in fig. 5, after determining the first test priority corresponding to the task to be tested, based on the example shown in fig. 4, it may be determined whether the first test priority is a priority indicating immediate execution. If not, the operations shown in FIG. 4 described above are performed. If so, the operation shown in FIG. 5 is performed.

As shown in fig. 5, when the first test priority is a priority indicating immediate execution, the device current state of the test device to be selected may be acquired at 510.

The device current state may include a device idle state and a device use state. In one application scenario, the OPC may also be connected in communication with the individual test devices, if the resource monitoring device can be connected via the OPC to the device running the SAP system. Thus, the OPC may acquire the device current status of each test device and send the acquired device current status to the resource monitoring apparatus.

At 520, the personnel current status of each tester for the test task to be scheduled may be obtained based on the tester information.

At 530, a target test device with a device current state being idle and a target test person with a person current state being idle in the candidate test devices may be scheduled for the task to be scheduled.

After the target test equipment and the target tester are arranged for the task to be tested, the task to be tested can be immediately executed.

At 540, execution plans may be rearranged for other individual test tasks in the ordered test plan based on the target test equipment, the target tester, and the estimated execution time of the test tasks to be ordered.

In one example, the ordered test plan may be maintained unchanged when the execution of the task to be ordered does not affect the execution plan of other individual test tasks in the ordered test plan. When the execution process of the to-be-scheduled test tasks affects the execution plan of other individual test tasks in the scheduled test plan, the execution plan may be rearranged for the other individual test tasks in the scheduled test plan.

In one example, when the execution duration of the to-be-scheduled test task is in the device idle time of the target test device and in the personnel idle time of the target tester in the scheduled test plan, it may be determined that the execution process of the to-be-scheduled test task does not affect the execution plan of other respective test tasks in the scheduled test plan. When the execution time length of the to-be-scheduled test task has an intersection with the estimated execution time length of other test tasks to be executed by the target test equipment in the scheduled test plan and/or an intersection with the estimated execution time length of other test tasks to be executed by the target test personnel, it can be determined that the execution process of the to-be-scheduled test task affects the execution plan of other test tasks in the scheduled test plan.

By the above example, when the first test priority corresponding to the to-be-scheduled test task indicates the priority of immediate execution, the to-be-scheduled test task is scheduled to be immediately executed, and other each scheduled test task is rearranged, so that the execution plan of each test task is more compact and efficient on the basis of meeting the requirement of immediate execution of the to-be-scheduled test task.

For the example shown in fig. 6, after determining the task to be ranked, it may be determined whether there is an execution order between the task to be ranked and the task to be ranked in the ranked test plan. If not, the execution plan may be arranged in accordance with the example shown in FIG. 1; if so, the execution plan may be arranged in accordance with the operations shown in FIG. 6.

As shown in FIG. 6, at 610, ranked test tasks that have an order of execution with respect to the test tasks to be ranked may be screened from the ranked test plans.

In this example, the screened out ranked test tasks may be all or part of the test tasks in the ranked test plan. The test tasks to be ranked and the screened ranked test tasks need to be executed according to a set sequence.

At 620, it is determined whether an execution plan can be scheduled for the test task to be scheduled in the scheduled test plan. If so, then the operation of 630 is performed. If not, then the operation of 640 is performed.

At 630, an execution plan is scheduled for the scheduled test tasks according to the scheduled test plan such that execution between the scheduled and the screened scheduled test tasks is enabled in a given order.

At 640, the filtered ranked test tasks may be deleted from the ranked test plans.

At 650, a current test task to be ranked may be determined from the test tasks to be ranked and the screened test tasks in order of execution.

In the process of scheduling the execution plan, the execution can be performed in a plurality of rounds, and each round of execution plan of a test task is scheduled. For example, a first test task in a given execution order is scheduled in a first round, a second test task in a given execution order is scheduled in a second round, and so on.

At 660, for the current test task to be ranked, a device idle time of the to-be-selected test device corresponding to the current test task is determined according to the current ranked test plan.

At 670, personnel idle time for each of the testers performing the current test task is determined based on the tester information and the current ranked test plan.

At 680, corresponding target test equipment, target test personnel and target test time periods are arranged for the current test task to be arranged according to the determined equipment idle time, personnel idle time and the estimated execution time length corresponding to the current test task.

At 690, a determination is made as to whether the test tasks to be scheduled and the screened test tasks are scheduled to be completed. If yes, the arrangement of the test tasks to be arranged and the screened test tasks is completed. If not, then operations of 650 are performed in return.

By the above example, the execution plan for the to-be-scheduled test task can be arranged under the condition that the execution sequence exists between the to-be-scheduled test task and the scheduled test task in the scheduled test plan, and the execution plans of the test tasks are more compact and more efficient on the basis of ensuring that the arranged to-be-scheduled test task accords with the execution sequence.

In one embodiment of the present disclosure, when there is a demand for execution time for a test task to be scheduled, in one example, it is desirable to schedule execution as soon as possible, i.e., immediately or within a specified time frame, such as within a few minutes. In another example, where the requirement of the execution time is a specified expected start time, for example, the task to be tested needs to start executing after 2 minutes, an execution plan may be scheduled for the task to be tested according to the scheme of the present embodiment. When there is no limitation on the execution time, the execution plan may be scheduled for the test task to be scheduled according to the embodiment shown in fig. 1 and the scheme of the related example described above.

First, the device current state of the test device to be selected may be obtained. The device current state may include an active state and an idle state. In one example, the device status of each test device may be obtained in real time, or only the device status of a specified portion of the test devices may be obtained. In another example, each test device may actively transmit a respective device status.

The personnel current status of each tester can then be used. And according to the current state of the equipment, the current state of the personnel and the estimated execution time length, arranging corresponding target test equipment, target test personnel and target test time periods for the test tasks to be arranged.

In one example, a first device under test for which the current state of the device is idle may be screened from the devices under test, the screened first device under test being a currently available device.

And determining the first to-be-selected test equipment with the idle time of the current equipment not less than the estimated execution time as the target test equipment corresponding to the to-be-arranged test task arrangement. And determining the testers with the idle time of the current personnel not less than the estimated execution time as the target testers corresponding to the to-be-arranged test task arrangement. And determining the time period corresponding to the current time as a starting point and the time length as the estimated execution time length as a target test time period corresponding to the test task to be arranged.

In one example, the target tester may be determined based on the current human idle time, and may also be determined jointly based on the current human idle time and the human information of the individual testers. The personnel information of the tester may include at least one of position, professional field, authority, etc. of the tester. For example, in determining the target tester, a tester that simultaneously satisfies first specified conditions including: the idle time of the current personnel is not less than the estimated execution time, the position of the tester accords with the position of the tester specified by the first test task, the professional field of the tester accords with the professional field of the first test task, and the authority of the tester reaches the authority range specified by the first test task.

In another example, when the current state of the device is an operational state, the current state of the device may further include a test progress in the operational state, which may be a real-time progress. The test progress may be expressed in terms of a percentage, for example, 90% of the test progress, indicating that the test is completed quickly. The test progress of 100% indicates that the test has been completed.

In this example, first, a second test device to be selected, from among the test devices to be selected, may be selected for which the time required for the test to end matches the estimated start time of the test task to be scheduled. The time required for ending the test can be determined according to the test progress, and the slower the test progress is, the longer the time required for ending the test is; the faster the test progress, the less time is required for the test to end. The time required for the test to end is the time for executing the remaining progress.

The predicted starting time of the test task to be scheduled may be a preset time, which is spaced apart from the current time by a duration. For example, the current time is 12 points, and the estimated start time is 12:02, the predicted start time is 2 minutes from the current time.

In one example, the time required for the test to end and the estimated start time of the task to be scheduled may be equal to each other and determined to match. In another example, the test ending required time may be determined to match the predicted starting time of the task to be tested when the test ending required time is less than the predicted starting time of the task to be tested and the time difference between the test ending required time and the predicted starting time is within a specified range. For example, the specified range may be 30 seconds or 1 minute.

After screening the second to-be-selected test equipment, the second to-be-selected test equipment with the equipment idle time after the test is finished not less than the estimated execution duration can be determined to be the target test equipment corresponding to the to-be-arranged test task arrangement. The device idle time after the test of each second test device to be selected is the device idle time starting from the current time when the test is ended. The device idle time may be derived from the populated test plan.

In addition, the tester with the idle time of the tester not less than the estimated execution time after the test is finished can be determined to be the target tester corresponding to the test task to be arranged. And determining a time period corresponding to the estimated execution time length by taking the time after the test is finished as a starting point, and determining the time period corresponding to the estimated execution time length as a target test time period corresponding to the test task to be arranged.

In one example, the target tester may be determined according to the personnel idle time after the test is finished, and may also be determined together according to the personnel idle time after the test is finished and the personnel information of each tester. The personnel information of the tester may include at least one of position, professional field, authority, etc. of the tester. For example, in determining the target tester, a tester that simultaneously satisfies the second specified condition including: the free time of the person after the test is finished is not less than the estimated execution time, the position of the tester accords with the position of the tester specified by the first test task, the professional field of the tester accords with the professional field of the first test task, and the authority of the tester reaches the authority range specified by the first test task.

Fig. 7 shows a block diagram of one example of an apparatus for scheduling execution plans for test tasks (hereinafter referred to as an execution plan scheduling apparatus 700) according to the present disclosure.

As shown in fig. 7, the execution scheduling apparatus 700 includes: a task determination unit 710, a task demand information acquisition unit 720, a person information and plan acquisition unit 730, a device idle time determination unit 740, a person idle time determination unit 750, and a task scheduling unit 760.

The task determination unit 710 may be configured to determine a test task to be excluded.

The task requirement information obtaining unit 720 may be configured to obtain task requirement information of a task to be tested, where the task requirement information includes device information of a test device to be selected for the task to be tested, and estimated execution duration.

The personnel information and plan acquiring unit 730 may be configured to acquire the personnel information and the scheduled test plan, where the scheduled test plan includes each scheduled test task, and a test period, a tester, and a test device occupied by each test task, and the personnel information includes a tester identifier and a time on duty.

The device idle time determination unit 740 may be configured to determine the device idle time of the test device to be selected according to the arranged test plan.

The personnel idle time determination unit 750 may be configured to determine the personnel idle time of each tester according to the tester information and the arranged test plan.

The task scheduling unit 760 may be configured to schedule corresponding target test equipment, target test personnel, and target test time periods for the test tasks to be scheduled according to the equipment idle time, the personnel idle time, and the estimated execution time.

In one example, the task demand information also includes personnel requirements of a tester for performing the test task to be scheduled. The person idle time determination unit 750 may be further configured to: screening out to-be-selected testers meeting the personnel requirements from the tester information; and determining the personnel idle time of each candidate tester according to the candidate testers and the arranged test plans.

In one example, the device idle time determination unit 740 may be further configured to: determining the scheduled total execution duration corresponding to each candidate device according to the scheduled test plan aiming at a plurality of candidate devices belonging to the same type of candidate test device; screening target alternative devices from the alternative devices according to the total execution time of each alternative device, wherein the total execution time of the target alternative devices is smaller than the total execution time corresponding to other alternative devices; and determining the device idle time of the target alternative device as the test device to be selected according to the arranged test plan.

In one example, the execution scheduling apparatus 700 may further include: a priority task processing unit, the priority task processing unit being configurable to: determining a first test priority corresponding to a test task to be arranged; determining a test task with a test priority lower than the first test priority from the arranged test plans; deleting each determined test task from the arranged test plan when an execution plan cannot be arranged for the to-be-arranged test task in the arranged test plan; the test tasks to be arranged and the determined test tasks are sequentially arranged according to the sequence of the test priorities from high to low, and an execution plan is arranged in the following mode until the test tasks to be arranged and the determined test tasks are arranged to be completed: aiming at a current test task to be discharged, determining the equipment idle time of the to-be-selected test equipment corresponding to the current test task according to the current discharged test plan; determining personnel idle time of each tester for executing the current test task according to the tester information and the current arranged test plan; and according to the determined equipment idle time, personnel idle time and estimated execution time length corresponding to the current test task, arranging corresponding target test equipment, target test personnel and target test time period for the current test task to be arranged.

In one example, the priority task processing unit may be configured to: when the first testing priority is a priority used for representing immediate execution, acquiring the current state of the equipment of the to-be-selected testing equipment; acquiring the personnel current state of each tester for the task to be tested according to the tester information; arranging target test equipment with idle current equipment state and target test personnel with idle personnel current state in the test equipment to be tested for the task to be tested; and rescheduling the execution plan for other various test tasks in the arranged test plan according to the target test equipment, the target tester and the estimated execution time length.

In one example, the execution scheduling apparatus 700 may further include: a sequential execution task processing unit, the sequential execution task processing unit being configurable to: when an execution sequence exists between the to-be-ranked test task and the ranked test task in the ranked test plan, the ranked test task is screened out from the ranked test plan; deleting the arranged test tasks from the arranged test plan; the execution plan is arranged according to the execution sequence of the test tasks to be arranged and the test tasks to be arranged in sequence until the test tasks to be arranged and the test tasks to be arranged are arranged to be completed by the following modes: aiming at a current test task to be discharged, determining the equipment idle time of the to-be-selected test equipment corresponding to the current test task according to the current discharged test plan; determining personnel idle time of each tester for executing the current test task according to the tester information and the current arranged test plan; and according to the determined equipment idle time, personnel idle time and estimated execution time length corresponding to the current test task, arranging corresponding target test equipment, target test personnel and target test time period for the current test task to be arranged.

In one example, the to-be-scheduled test task includes a plurality of sequentially executed processes, and the task demand information includes device information and estimated execution time length of to-be-selected test devices corresponding to each process. The task orchestration unit 760 may be further configured to: according to the equipment idle time, the personnel idle time and the estimated execution time corresponding to each process, corresponding target test equipment, target test personnel and target test time periods are arranged for each process, wherein the execution sequence of each arranged process is unchanged.

In one example, the execution scheduling apparatus 700 may further include: a batch task processing unit, the batch task processing unit being configurable to: for each process, when the arranged process with the same process type as the process exists in the arranged test plan, carrying out batch processing on the arranged process and the process; respectively determining test equipment, testers and test time periods of the batch of the arranged processes as target test equipment, target testers and target test time periods corresponding to the processes; and according to the equipment idle time, the personnel idle time and the estimated execution time length corresponding to each process, arranging corresponding target test equipment, target test personnel and target test time periods for each process comprises: when the batch processing cannot be executed in each process, corresponding target test equipment, target test personnel and target test time periods are arranged for each process according to the equipment idle time, the personnel idle time and the estimated execution time length corresponding to each process.

Embodiments of methods and apparatus for scheduling execution of test tasks according to the present disclosure are described above with reference to fig. 1-7.

The apparatus for scheduling execution of test tasks of the present disclosure may be implemented in hardware, software, or a combination of hardware and software. Taking software implementation as an example, the device in a logic sense is formed by reading corresponding computer program instructions in a memory into a memory by a processor of a device where the device is located. In the present disclosure, the means for scheduling execution of the test tasks may be implemented, for example, with an electronic device.

Fig. 8 illustrates a block diagram of an electronic device 800 for implementing a test task execution scheduling method in accordance with the present disclosure.

As shown in fig. 8, an electronic device 800 may include at least one processor 810, a memory (e.g., a non-volatile memory) 820, a memory 830, and a communication interface 840, and the at least one processor 810, the memory 820, the memory 830, and the communication interface 840 are connected together via a bus 850. At least one processor 810 executes at least one computer-readable instruction (i.e., the elements described above as being implemented in software) stored or encoded in memory.

In one embodiment, computer-executable instructions are stored in memory that, when executed, cause the at least one processor 810 to: determining a test task to be arranged; task demand information of a task to be tested is acquired, tester information and a tested plan are acquired, and equipment idle time of the equipment to be tested is determined according to the tested plan; determining personnel idle time of each tester according to the tester information and the arranged test plan; and according to the equipment idle time, the personnel idle time and the estimated execution time, arranging corresponding target test equipment, target test personnel and target test time periods for the test tasks to be arranged.

It should be appreciated that the computer-executable instructions stored in the memory, when executed, cause the at least one processor 810 to perform the various operations and functions described above in connection with fig. 1-7 in various embodiments of the present specification.

According to one embodiment, a program product, such as a machine-readable medium, is provided. The machine-readable medium may have instructions (i.e., elements described above implemented in software) that, when executed by a machine, cause the machine to perform the various operations and functions described above in connection with fig. 1-7 in various embodiments of the specification.

In particular, a system or apparatus provided with a readable storage medium having stored thereon software program code implementing the functions of any of the above embodiments may be provided, and a computer or processor of the system or apparatus may be caused to read out and execute instructions stored in the readable storage medium.

In this case, the program code itself read from the readable medium may implement the functions of any of the above-described embodiments, and thus the machine-readable code and the readable storage medium storing the machine-readable code form part of the present invention.

Computer program code required for operation of portions of the present description may be written in any one or more programming languages, including an object oriented programming language such as Java, scala, smalltalk, eiffel, JADE, emerald, C ++, c#, VB, NET, python and the like, a conventional programming language such as C language, visual Basic 2003, perl, COBOL 2002, PHP and ABAP, a dynamic programming language such as Python, ruby and Groovy, or other programming languages and the like. The program code may execute on the user's computer or as a stand-alone software package, or it may execute partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the latter scenario, the remote computer may be connected to the user's computer through any form of network, such as a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet), or the connection may be made to the cloud computing environment, or for use as a service, such as software as a service (SaaS).

Examples of readable storage media include floppy disks, hard disks, magneto-optical disks, optical disks (e.g., CD-ROMs, CD-R, CD-RWs, DVD-ROMs, DVD-RAMs, DVD-RWs), magnetic tapes, nonvolatile memory cards, and ROMs. Alternatively, the program code may be downloaded from a server computer or cloud by a communications network.

The foregoing describes specific embodiments of the present disclosure. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims can be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

Not all steps or units in the above-mentioned flowcharts and system configuration diagrams are necessary, and some steps or units may be omitted according to actual needs. The order of execution of the steps is not fixed and may be determined as desired. The apparatus structures described in the above embodiments may be physical structures or logical structures, that is, some units may be implemented by the same physical entity, or some units may be implemented by multiple physical entities, or may be implemented jointly by some components in multiple independent devices.

The term "exemplary" used throughout this specification means "serving as an example, instance, or illustration," and does not mean "preferred" or "advantageous over other embodiments. The detailed description includes specific details for the purpose of providing an understanding of the described technology. However, the techniques may be practiced without these specific details. In some instances, well-known structures and devices are shown in block diagram form in order to avoid obscuring the concepts of the described embodiments.

The alternative implementation manner of the embodiment of the present disclosure has been described in detail above with reference to the accompanying drawings, but the embodiment of the present disclosure is not limited to the specific details of the foregoing implementation manner, and various simple modifications may be made to the technical solution of the embodiment of the present disclosure within the scope of the technical concept of the embodiment of the present disclosure, and all the simple modifications belong to the protection scope of the embodiment of the present disclosure.

The previous description of the disclosure is provided to enable any person skilled in the art to make or use the disclosure. Various modifications to the disclosure will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other variations without departing from the scope of the disclosure. Thus, the disclosure is not intended to be limited to the examples and designs described herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A method for scheduling execution of a test task, comprising:

determining a to-be-discharged test task corresponding to a product sample according to the product sample collected from a production line of chemical production, wherein the to-be-discharged test task is used for checking the quality and the qualification rate of the product sample;

acquiring task demand information of the to-be-scheduled test task, wherein the task demand information comprises equipment information of to-be-selected test equipment for the to-be-scheduled test task and estimated execution time;

acquiring tester information and an arranged test plan, wherein the arranged test plan comprises arranged test tasks, test time periods occupied by the test tasks, testers and test equipment, the tester information comprises tester identifications and duty time, and different test tasks have different requirements on positions, professional fields and authorities of the testers; when no requirement is made on the execution time, determining the equipment idle time of the to-be-selected test equipment according to the arranged test plan; determining personnel idle time of each tester according to the tester information and the arranged test plan; according to the equipment idle time, the personnel idle time and the estimated execution time length, corresponding target test equipment, target test personnel and target test time periods are arranged for the to-be-arranged test tasks;

When the requirement on the execution time exists, the current state of the equipment of the to-be-selected test equipment is obtained, wherein the requirement is that the execution is scheduled in a specified time range taking the current time as a starting point; acquiring the personnel current state of each tester; according to the current state of the equipment, the current state of the personnel and the estimated execution time length, corresponding target test equipment, target test personnel and target test time periods are arranged for the test tasks to be arranged,

according to the current state of the device, the current state of the person and the estimated execution time length, the step of arranging corresponding target test devices, target test persons and target test time periods for the to-be-arranged test tasks comprises:

when the current state of the equipment is a working state, screening second to-be-selected test equipment, wherein the time required for ending the test is determined according to the test progress, from the to-be-selected test equipment, and the predicted starting time of the to-be-discharged test task are matched with each other, and the current state of the equipment comprises the test progress in the working state;

determining a second to-be-selected test device with the idle time of the device after the test is finished not less than the estimated execution time as a target test device corresponding to the to-be-arranged test task;

Determining a tester with the free time of the tested person not less than the estimated execution time as a target tester corresponding to the test task to be arranged; and

and determining a time period corresponding to the estimated execution time length by taking the time after the test is finished as a starting point, and determining the time period corresponding to the estimated execution time length as a target test time period corresponding to the test task to be arranged.

2. The method of claim 1, wherein determining the device idle time of the candidate test device according to the ranked test plan comprises:

determining the scheduled total execution time length corresponding to each candidate device according to the scheduled test plan aiming at a plurality of candidate devices belonging to the same type of candidate test device;

screening target alternative devices from the alternative devices according to the total execution time of each alternative device, wherein the total execution time of the target alternative devices is smaller than the total execution time corresponding to other alternative devices; and

and determining the equipment idle time of the target alternative equipment serving as the test equipment to be selected according to the arranged test plan.

3. The method of claim 1, further comprising:

determining a first test priority corresponding to the test task to be arranged;

Determining a test task with a test priority lower than the first test priority from the arranged test plans;

deleting each determined test task from the arranged test plan when an execution plan cannot be arranged for the to-be-arranged test task in the arranged test plan;

and sequentially arranging the execution plan for the to-be-arranged test tasks and the determined test tasks according to the sequence of the test priorities from high to low, wherein the execution plan is arranged in the following mode until the to-be-arranged test tasks and the determined test tasks are arranged to be completed:

aiming at a current test task to be discharged, determining the equipment idle time of the to-be-selected test equipment corresponding to the current test task according to a current discharged test plan;

determining personnel idle time of each tester for executing the current test task according to the tester information and the current arranged test plan; and

and according to the determined equipment idle time, personnel idle time and estimated execution time length corresponding to the current test task, corresponding target test equipment, target test personnel and target test time period are arranged for the current test task to be arranged.

4. A method according to claim 3, wherein the priorities of the test tasks include a sample priority for the samples and/or a task priority for the test tasks.

5. A method as in claim 3, further comprising:

when the first testing priority is a priority used for representing immediate execution, acquiring the current state of the equipment of the to-be-selected testing equipment;

acquiring the personnel current state of each tester for the to-be-arranged test task according to the tester information;

arranging target test equipment with idle current equipment states and target test personnel with idle personnel current states in the to-be-tested equipment for the to-be-tested tasks; and

and rescheduling an execution plan for each other test task in the arranged test plan according to the target test equipment, the target tester and the estimated execution time length.

6. The method of claim 1, further comprising:

when an execution sequence exists between the to-be-ranked test task and the ranked test task in the ranked test plan, the ranked test task is screened out from the ranked test plan;

Deleting the arranged test tasks from the arranged test plans;

and arranging an execution plan for the to-be-arranged test tasks and the arranged test tasks in turn according to the execution sequence in the following manner until the to-be-arranged test tasks and the arranged test tasks are arranged to be completed:

7. The method of claim 1, wherein the task to be tested comprises a plurality of procedures which are sequentially executed, the task demand information comprises equipment information of the test equipment to be tested corresponding to each procedure and estimated execution time length,

according to the equipment idle time, the personnel idle time and the estimated execution time length, arranging corresponding target test equipment, target test personnel and target test time period for the to-be-arranged test task comprises:

And according to the equipment idle time, the personnel idle time and the estimated execution time length corresponding to each process, corresponding target test equipment, target test personnel and target test time periods are arranged for each process, wherein the execution sequence of each arranged process is unchanged.

8. The method of claim 7, further comprising:

for each process, when the arranged process with the same process type as the process exists in the arranged test plan, carrying out batch processing on the arranged process and the process;

respectively determining test equipment, testers and test time periods of the batch of the arranged processes as target test equipment, target testers and target test time periods corresponding to the processes; and

according to the equipment idle time, the personnel idle time and the estimated execution time length corresponding to each process, arranging corresponding target test equipment, target test personnel and target test time period for each process comprises:

and when the batch processing cannot be executed in each working procedure, corresponding target test equipment, target test personnel and target test time periods are arranged for each working procedure according to the equipment idle time, the personnel idle time and the estimated execution time corresponding to each working procedure.

9. The method of claim 1, wherein scheduling the corresponding target test equipment, target test personnel, and target test time period for the task to be tested according to the equipment current state, the personnel current state, and the estimated execution time period comprises:

when the current state of the equipment has an idle state, screening a first to-be-selected test equipment with the current state of the equipment idle from the to-be-selected test equipment;

determining a first to-be-selected test device with the idle time of the current device not smaller than the estimated execution time as a target test device corresponding to the to-be-arranged test task;

determining a tester with the idle time of the current personnel not less than the estimated execution time as a target tester corresponding to the test task to be arranged; and

and determining a time period corresponding to the estimated execution time length with the current time as a starting point as a target test time period corresponding to the test task to be arranged.

10. The method of claim 1, further comprising:

and updating the execution plan information of the to-be-scheduled test task into a total execution plan so that the states of the target test equipment and the target test personnel in the total execution plan in the target test time period are occupied, wherein the execution plan information comprises the information of the target test equipment, the target test personnel and the target test time period.

11. An apparatus for scheduling execution of a test task, comprising:

the task determining unit is used for determining a to-be-discharged test task corresponding to a product sample according to the product sample collected from a production line of chemical production, wherein the to-be-discharged test task is used for checking the quality and the qualification rate of the product sample;

the task demand information acquisition unit is used for acquiring task demand information of the to-be-scheduled test task, wherein the task demand information comprises equipment information of to-be-selected test equipment used for the to-be-scheduled test task and estimated execution time;

the system comprises a personnel information and plan acquisition unit, a test personnel information and a scheduled test plan, wherein the scheduled test plan comprises scheduled test tasks, test time periods occupied by the test tasks, test personnel and test equipment, the test personnel information comprises test personnel identifiers and duty time, and different test tasks have different requirements on positions, professional fields and authorities of the test personnel;

the equipment idle time determining unit is used for determining the equipment idle time of the to-be-selected test equipment according to the arranged test plan when no requirement is made on the execution time;

A personnel idle time determining unit for determining personnel idle time of each tester according to the tester information and the arranged test plan;

the task scheduling unit schedules corresponding target test equipment, target test personnel and target test time periods for the to-be-scheduled test task according to the equipment idle time, the personnel idle time and the estimated execution time;

the task orchestration unit is further configured to:

12. An electronic device, comprising: at least one processor, a memory coupled with the at least one processor, and a computer program stored on the memory, the at least one processor executing the computer program to implement the method of any of claims 1-10.

13. A computer readable storage medium storing a computer program which, when executed by a processor, implements the method of any of claims 1-10.