CN116175668A - Cutting system and control method thereof - Google Patents
Cutting system and control method thereof Download PDFInfo
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- CN116175668A CN116175668A CN202211655348.5A CN202211655348A CN116175668A CN 116175668 A CN116175668 A CN 116175668A CN 202211655348 A CN202211655348 A CN 202211655348A CN 116175668 A CN116175668 A CN 116175668A
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- 238000000034 method Methods 0.000 title claims abstract description 18
- 238000001514 detection method Methods 0.000 claims abstract description 132
- 230000007547 defect Effects 0.000 claims abstract description 76
- 230000002950 deficient Effects 0.000 claims description 13
- 238000004140 cleaning Methods 0.000 claims description 11
- 230000010287 polarization Effects 0.000 claims description 3
- 239000010408 film Substances 0.000 description 133
- 239000002699 waste material Substances 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003292 glue Substances 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 239000012788 optical film Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D5/00—Arrangements for operating and controlling machines or devices for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
- B26D5/007—Control means comprising cameras, vision or image processing systems
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D7/00—Details of apparatus for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
- B26D7/06—Arrangements for feeding or delivering work of other than sheet, web, or filamentary form
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D7/00—Details of apparatus for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
- B26D7/27—Means for performing other operations combined with cutting
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02W—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
- Y02W30/00—Technologies for solid waste management
- Y02W30/50—Reuse, recycling or recovery technologies
- Y02W30/62—Plastics recycling; Rubber recycling
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- Controlling Rewinding, Feeding, Winding, Or Abnormalities Of Webs (AREA)
Abstract
The invention discloses a cutting system and a control method thereof, wherein the cutting system is used for cutting a phase difference film and comprises a conveying frame, a detection module, a cutting module and a control module, wherein the detection module and the cutting module are sequentially arranged in the conveying direction of the conveying frame, the conveying frame is used for conveying the phase difference film so that the phase difference film sequentially passes through the detection module and the cutting module, the detection module and the cutting module are both connected with the control module, the detection module is used for detecting whether a defect area exists in the phase difference film, and the control module controls the cutting module to cut a non-defect area of the phase difference film into a film piece with a preset size under the condition that the defect area exists in the phase difference film, and the phase difference film comprises the defect area and the non-defect area. The scheme can solve the problem that the alignment phase difference film is wasted greatly when the cutting system in the related technology cuts the alignment phase difference film.
Description
Technical Field
The invention relates to the technical field of cutting systems, in particular to a cutting system and a control method thereof.
Background
The retardation film is widely used in devices such as televisions, mobile phones, and vehicle-mounted displays due to its transparency, heat resistance, and high retardation performance. However, the dicing of the retardation film is an important step in the formation of the retardation film, and the dicing of the retardation film is generally performed in a dicing system of the retardation film. In the related art, when a defect is detected in the retardation film, the retardation film having the defect is generally directly judged as defective or directly discarded, thereby causing waste of the retardation film.
Disclosure of Invention
The invention discloses a cutting system and a control method thereof, which are used for solving the problem that the cutting system in the related art has great waste of an alignment phase difference film when cutting the alignment phase difference film.
In order to solve the technical problems, the invention is realized as follows:
in a first aspect, the present application discloses a cutting system for cutting a retardation film, the cutting system comprising a conveyor frame, a detection module, a cutting module and a control module, wherein,
the detection module and the cutting module are sequentially arranged in the conveying direction of the conveying frame, the conveying frame is used for conveying the phase difference film, so that the phase difference film sequentially passes through the detection module and the cutting module, the detection module and the cutting module are connected with the control module, the detection module is used for detecting whether a defect area exists in the phase difference film, and the control module controls the cutting module to cut a non-defect area of the phase difference film into a film piece with a preset size under the condition that the defect area exists in the phase difference film, and the phase difference film comprises the defect area and the non-defect area.
In a second aspect, the present application further discloses a control method of a cutting system, for cutting a retardation film, where the cutting system is the cutting system in the first aspect, and the control method includes:
controlling the phase difference film to be transmitted on the transmission rack;
controlling the detection module to detect whether a defect area exists in the phase difference film;
and under the condition that the defect area exists in the phase difference film, controlling the cutting module to cut the non-defect area of the phase difference film into a film piece with a preset size.
The technical scheme adopted by the invention can achieve the following technical effects:
the cutting system disclosed by the embodiment of the application is characterized in that the conveying rack, the detection module, the cutting module and the control module are arranged, so that the detection module can detect whether the phase difference film has a defect area when the phase difference film is conveyed, and the control module can control the cutting module to cut a non-defect area of the phase difference film into a film piece with a preset size when the phase difference film has the defect area, so that the non-defect area of the phase difference film can be fully utilized, and the problem that the cutting system in the related art has great waste of the phase difference film when the phase difference film is cut is effectively solved.
Drawings
FIG. 1 is a schematic diagram of a cutting system according to an embodiment of the present invention;
fig. 2 is a schematic diagram of cutting a para-phase difference film by using a cutting system according to an embodiment of the present invention;
fig. 3 is a flowchart of a control method of a cutting system according to an embodiment of the present invention.
Reference numerals illustrate:
100-conveying frame,
200-detection module, 210-first light-emitting component, 211-first light-emitting unit, 212-second light-emitting unit, 220-first camera module, 230-second light-emitting component, 240-second camera module, 250-first polarizer, 260-second polarizer, and,
300-cutting module, 500-cleaning module, 600-stock unit, 700-buffer device.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to specific embodiments of the present invention and corresponding drawings. It will be apparent that the described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The technical scheme disclosed by each embodiment of the invention is described in detail below with reference to the accompanying drawings.
Referring to fig. 1 to 3, an embodiment of the present invention discloses a cutting system for cutting a retardation film, which is an optical film, and is widely used in devices such as televisions, mobile phones, and vehicle-mounted displays.
The disclosed cutting system includes a conveyor frame 100, a detection module 200, a cutting module 300, and a control module. The detection module 200 and the cutting module 300 are sequentially disposed in the conveying direction of the conveying frame 100. The detection module 200 and the cutting module 300 may be provided on the conveyor frame 100, although the detection module 200 and the cutting module 300 may be provided on other members or objects outside the conveyor frame 100.
The transfer frame 100 is used for transferring the retardation film so that the retardation film passes through the detection module 200 and the cutting module 300 in sequence. The conveying frame 100 may stretch the two ends of the alignment phase difference film when conveying the alignment phase difference film, so that the alignment phase difference film is in a flattened and suspended state. For example, the conveyor frame 100 may be a roll-to-roll apparatus. Of course, in some embodiments, the retardation film may also be supported on a support table of the conveyor frame 100.
The detection module 200 and the cutting module 300 are both connected to the control module, and the detection module 200 is used for detecting whether a defect area exists in the phase difference film. The detection module 200 may be an ultrasonic detection module, an infrared detection module, a visible light detection module, etc., and the detection mode of the detection module 200 may be selected according to the requirements of the type of the phase difference film defect, the accuracy of the detected defect, etc. to be detected.
In the case that the retardation film has a defective region, the control module controls the cutting module 300 to cut a non-defective region of the retardation film into a film piece of a preset size, the retardation film including the defective region and the non-defective region. The preset dimensions may be perimeter dimensions, area dimensions, etc. of the membrane. The control module may control the cutting module 300 to cut the non-defective area while avoiding the defective area, thereby cutting the non-defective area into a film of a preset size.
The cutting system disclosed in the embodiment of the application is characterized in that the conveying rack 100, the detection module 200, the cutting module 300 and the control module are arranged, so that the detection module 200 can detect whether a defect area exists in the phase difference film when the phase difference film is conveyed, and therefore when the defect area exists in the phase difference film, the control module can control the cutting module 300 to cut a non-defect area of the phase difference film into a film piece with a preset size, the non-defect area of the phase difference film can be fully utilized, and the problem that the cutting system in the related art has great waste of the phase difference film when the phase difference film is cut is effectively solved.
Specifically, the cutting system may preset film part models with different sizes, and when a defect area of the phase difference film is detected, a non-defect area of the phase difference film may be determined, so that a plurality of cutting areas may be formed by dividing the non-defect area, and then the preset film part model corresponding to the cutting area may be determined according to the size of the cutting area (the size of the cutting area may be the perimeter size, the area size, etc.), and then the corresponding cutting area may be cut with the preset film part model, so as to form a film part with a corresponding preset size.
Under the condition that the detection module 200 is fixed, the conveying rack 100 conveys the alignment phase difference film, so that the detection module 200 sequentially passes through different areas of the alignment phase difference film, and continuous detection of the whole area of the alignment phase difference film can be realized.
In an alternative embodiment, the detection module 200 may include a first light emitting component 210, a first camera module 220, and a processing module, where the first light emitting component 210 may be configured to project detection light to a detection area of the phase difference film in the case of the transmission frame 100 transmitting the phase difference film, the first camera module 220 may be configured to capture the detection area and obtain a target image, and the processing module may be configured to compare the target image with a pre-stored image, and determine the detection area as a defective area in the case that the target image is inconsistent with the pre-stored image.
In the case where the first light emitting device 210 projects the detection light to the detection region of the phase difference film, the first image capturing module 220 captures an image of the detection region on which the detection light is projected, and acquires a target image. Because the phase difference film is an optical film, when the detection light is projected to the phase difference film, the defect area and the non-defect area can show different effects, so that the defect area can be compared with a pre-stored image, and the defect area can be determined by the detection area under the condition that the target image is inconsistent with the pre-stored image. In the process of transferring the retarder of the transfer frame 100, the detection area refers to an area where light projection is detected, and the position of the detection area on the retarder changes with the transfer of the retarder.
The cutting system disclosed in the embodiment of the present application is configured to set the detection module 200 to include the first light emitting component 210, the first camera module 220 and the processing module, so that the first light emitting component 210 projects detection light to the detection area of the phase difference film, and then the first camera module 220 shoots the detection area to obtain a target image, so that the detection area is determined to be a defect area under the condition that the target image is inconsistent with the pre-stored image, and the detection of the detection area is more accurate by comparing the target image with the pre-stored image.
In an alternative embodiment, the first light emitting assembly 210 may include a plurality of first light emitting units 211, and the plurality of first light emitting units 211 and the first camera module 220 may be located at the same side of the phase difference film in case that the phase difference film is transferred on the transfer frame 100. The plurality of first light emitting units 211 may sequentially project first light rays to the detection area at different incident angles, the first image capturing module 220 may be configured to capture first target sub-images when each of the light emitting units 211 projects the first light rays to the detection area, the processing module may be configured to compare the plurality of first target sub-images with the plurality of first pre-stored sub-images, and determine the detection area as a defect area if any of the plurality of first target sub-images is inconsistent with the corresponding first pre-stored sub-image, wherein the detection light rays may include the first light rays, the target image may include the first target sub-images, and the pre-stored image may include the first pre-stored sub-images.
It should be noted that, because the plurality of first light emitting units 211 and the first camera module 220 are all located on the same side of the phase difference film, the first camera module 220 receives the light emitted by the first light emitting units 211 through the phase difference film, and the reflection condition of the phase difference film can be detected by comparing the photographed first target sub-image with the first pre-stored sub-image, so as to determine whether the phase difference film has a defect. When the plurality of first light emitting units 211 sequentially project the first light to the detection area at different incident angles, the intervals at which the plurality of first light emitting units 211 project the first light are shorter, the shooting speed of the first shooting module 220 is faster, and the plurality of first target sub-images shot by the first shooting module can be regarded as images of the same detection area of the phase difference film. Different defects of the retardation film can be detected by projecting light rays with different angles to the retardation film, and when the first light emitting unit 211 projects first light rays to the detection area with different incident angles, different defects of the retardation film can be detected.
According to the cutting system disclosed by the embodiment of the application, the first light emitting assembly 210 is set to comprise the plurality of first light emitting units 211, the plurality of first light emitting units 211 and the first camera module 220 are located on the same side of the phase difference film, so that the plurality of first light emitting units 211 sequentially project first light rays to the detection area at different incidence angles, the first camera module 220 shoots first target sub-images when each light emitting unit 211 projects the first light rays to the detection area, and therefore the processing module is used for comparing the plurality of first target sub-images with the plurality of first pre-stored sub-images, and the detection area is determined to be a defect area under the condition that any first target sub-image in the plurality of first target sub-images is inconsistent with the corresponding first pre-stored sub-image, so that the detection of the defect area is realized. The plurality of first light emitting units 211 sequentially project the first light to the detection area at different incident angles, so that the detection capability of the alignment phase difference film defect is improved.
Specifically, the plurality of first light emitting units 211 may include a reflective bright field channel and a reflective dark field channel, where the reflective bright field channel refers to that when the surface of the phase difference film is a flat surface, the first light emitted by the first light emitting unit 211 may directly enter the first camera module 220 after being reflected by the phase difference film, and the reflective dark field channel refers to that when the surface of the phase difference film is a flat surface, the first light emitted by the first light emitting unit 211 may not enter the first camera module 220 after being reflected by the phase difference film. When the phase difference film has defects, the optical paths of the reflective bright field channel and the reflective dark field channel are changed, so that whether a defective region exists can be determined. The bright field detection channel can be used for detecting whether the phase difference film has defects such as glue points, foreign matters, crease marks and the like, and the dark field detection channel can be used for detecting defects such as glue-free lines, pattern glue and the like. In the reflected bright field channel path, the first light emitting unit 211 may project the first light ray to the detection area at any incident angle between 45 ° -75 °. In the reflected dark field channel path, the first light emitting unit 211 may project the first light toward the detection area at any incident angle between 15 ° -60 °.
Alternatively, the first light emitting component 210 may include a second light emitting unit 212, where the second light emitting unit 212 and the first camera module 220 may be respectively located on two opposite sides of the phase difference film, the second light emitting unit 212 may be used to project a second light beam onto the first surface of the detection area, and the first camera module 220 may be used to capture a second surface of the detection area and obtain a second target sub-image. Since the second light emitting unit 212 and the first image capturing module 220 are respectively located at two opposite sides of the phase difference film, the second target sub-image reflects the transmission condition of the second light in the detection area. The processing module may be configured to compare the second target sub-image with a second pre-stored sub-image, and determine the detection area as a defect area if the second target sub-image is inconsistent with the second pre-stored sub-image, where the detected light may include a second light, the target image may include the second target sub-image, and the pre-stored image may include the second pre-stored sub-image.
According to the cutting system disclosed by the embodiment of the application, the second light-emitting unit 212 is arranged, so that the second light-emitting unit 212 and the first camera module 220 are respectively located on two opposite sides of the phase difference film, the first camera module 220 can shoot the second surface of the detection area and obtain a second target sub-image, the transmission condition of second light in the detection area can be reflected, and therefore whether the phase difference film has defects or not can be detected through detecting the light projection image of the phase difference film.
Specifically, the second light emitting unit 212 may include a transmissive dark field channel, where the transmissive dark field channel refers to a path where the second light emitted by the second light emitting unit 212 is projected toward the phase difference film and does not pass through the first image capturing module 220. The transmitted dark field channel can be used for detecting whether scratch defects exist in the phase difference film or not. In the transmissive dark field channel path, the angle between the first camera module 220 and the viewing angle phase difference film may be between 45 ° -75 °.
Optionally, the detection module further includes a second light emitting component 230, a second camera module 240, a first polarizer 250, a second polarizer 260, and a processing module, where the phase difference film is disposed on the conveying frame 100, the second light emitting component 230 and the second camera module 240 may be respectively located on two opposite sides of the phase difference film. The first polarizer 250 may be disposed at a light outlet of the second light emitting device 230, the second polarizer 260 may be disposed at a light inlet of the second camera module 240, the second light emitting device 230 may be configured to project a third light to the detection area, the processing module may be connected to the second camera module 240, and the processing module may be configured to determine the detection area as a defect area when the second camera module 240 does not receive the third light emitted by the second light emitting device 230.
It should be noted that, in order to detect the optical performance of the phase difference film, when the second light emitting assembly 230 emits the third light, after the third light sequentially passes through the first polarizer 250, the phase difference film, and the second polarizer 260, the second camera module 240 can receive the third light emitted by the second light emitting assembly 230, which indicates that the optical performance of the detection area is good, and no defect exists, and when the second camera module 240 does not receive the third light emitted by the second light emitting assembly 230, which indicates that the detection area has a defect, and the detection area is determined as a defect area.
The cutting system disclosed in the embodiment of the application sets the detection module to be the structure of the second light emitting component 230, the second camera module 240, the first polarizer 250, the second polarizer 260 and the processing module, so that when the second light emitting component 230 emits third light, the third light sequentially passes through the first polarizer 250, the phase difference film and the second polarizer 260, and whether the second camera module 240 can receive the third light emitted by the second light emitting component 230 to detect whether a detection area has defects or not is detected, thereby improving the detection capability of the detection area.
Alternatively, the polarizing angle of the first polarizer 250 may be the same as that of the second polarizer 260, and the first polarizer 250 may be perpendicular to the second polarizer 260. It should be noted that, the first polarizer 250 may be perpendicular to the second polarizer 260, which means that the extension plane of the first polarizer 250 is perpendicular to the extension plane of the second polarizer 260. The polarization angle of the first polarizer 250 is the same as that of the second polarizer 260, and the first polarizer 250 may be perpendicular to the second polarizer 260, so that the first polarizer 250 may be disposed in a relatively simple manner with respect to the second polarizer 260.
Further, the angle of the first polarizer 250 with respect to the light outlet of the second light emitting assembly 230 is adjustable, and the angle of the second polarizer 260 with respect to the light inlet of the second camera module 240 is adjustable. The first polarizer 250 and the second polarizer 260 may be disposed at positions of the light outlet of the corresponding second light emitting assembly 230 and the light inlet of the second camera module 240 through an adjusting mechanism, and the angle of the second polarizer 260 relative to the light inlet of the second camera module 240 and the angle of the first polarizer 250 relative to the light outlet of the second light emitting assembly 230 may be adjusted through an adjusting mechanism. The first polarizer 250 and the second polarizer 260 may be mounted by screws, and may be fastened by manual adjustment. The angle of the second polarizer 260 with respect to the light inlet of the second camera module 240 may be adjusted between 0 ° and 90 °, and the angle of the first polarizer 250 with respect to the light outlet of the second light emitting module 230 may be adjusted between 0 ° and 90 °, but it is always ensured that the first polarizer 250 is perpendicular to the second polarizer 260.
It should be noted that, the first polarizer 250 and the second polarizer 260 are kept orthogonal, and the method is used for detecting defects of poor optics of the retardation film, such as bright spots, mura, and the like, because when the axis angle of the retardation film is 45 ° with respect to the polarizer, bright spots (light can pass through) are displayed, when the axis angle of the retardation film is 0 ° or 90 ° with respect to the polarizer, dark spots (light cannot pass through) are displayed, and when other angles, intermediate spots (partial light passes through) are displayed, the axis angle direction of the retardation film is determined according to the product type, and therefore, by adjusting the axis angle of the first polarizer 250 and the second polarizer 260 with respect to the axis angle of the retardation film, some defects of concentrated spot light (bright spots), uneven light in some areas, and the like can be observed, and the bright spots have a large influence on the product with the retardation film, and the second light emitting component with the polarizer is required to be used for detection.
According to the cutting system disclosed by the embodiment of the application, the first polaroid 250 is arranged to be adjustable relative to the angle of the light outlet of the second light emitting component 230, and the second polaroid 260 is arranged to be adjustable relative to the angle of the light inlet of the second camera module 240, so that the defect of poor optics of the phase difference film can be detected.
Optionally, the cutting system may further include a cleaning module 500, where the detection module 200, the cutting module 300, and the cleaning module 500 are sequentially disposed in the conveying direction of the conveying frame 100, and the cleaning module 500 may be used to clean the film. The cutting system disclosed in the embodiment of the application is provided with the cleaning module 500, so that the cleaning module 500 can clean the membrane.
The cutting system further comprises a buffer device 700 and a feeding unit, wherein the buffer device 700 can be arranged on a support of the feeding unit and the conveying frame 100, the buffer device 700 separates the feeding unit from the conveying frame 100 in the process of conveying the phase difference film of the conveying frame 100, and after the conveying frame 100 conveys the phase difference film, the buffer device 700 communicates the feeding unit with the conveying frame 100 so that the phase difference film to be detected of the feeding unit can be conveyed to the conveying frame 100 for conveying.
Optionally, the cutting system may further include a stock unit 600, where after the alignment phase difference film is cut to form a film, the film may be stored in the stock unit 600 and then enter the cleaning module 500 for cleaning.
The application also discloses a control method of a cutting system, which is used for cutting the phase difference film, wherein the disclosed cutting system is disclosed by the embodiment, and the disclosed control method comprises the following steps:
s101, controlling the phase difference film to be conveyed on the conveying rack 100.
S102, the control detection module 200 detects whether or not the phase difference film has a defective region.
S103, in the case that the defect area exists in the phase difference film, the cutting module 300 is controlled to cut the non-defect area of the phase difference film into film pieces with preset sizes.
The control method of the cutting system disclosed by the embodiment of the invention can detect whether the phase difference film has a defect area or not, so that when the phase difference film has the defect area, the cutting module 300 can be controlled to cut the non-defect area of the phase difference film into a film piece with a preset size, thereby fully utilizing the non-defect area of the phase difference film, and effectively solving the problem that the cutting system in the related art has great waste of the phase difference film when cutting the phase difference film.
Alternatively, the detection module 200 may include a first light emitting component 210, a first camera module 220, and a processing module, where in the case of transferring the alignment phase difference film of the transfer rack 100, the first light emitting component 210 is configured to project detection light to a detection area of the alignment phase difference film, and the first camera module 220 is configured to capture a target image and acquire the detection area. The control detecting module 200 detecting whether the phase difference film has a defective region includes:
in step A1, the first light emitting device 210 is controlled to project the detection light to the detection area of the phase difference film.
In step A2, the first camera module 220 is controlled to capture the detection area and acquire the target image.
And A3, comparing the target image with a pre-stored image, and determining the detection area as a defect area under the condition that the target image is inconsistent with the pre-stored image.
According to the control method of the cutting system disclosed by the embodiment of the application, the first light emitting component 210 is controlled to project detection light to the detection area of the phase difference film, and the first camera module 220 is controlled to shoot the detection area to acquire the target image, so that the detection area is determined to be a defect area under the condition that the target image is inconsistent with the pre-stored image, and the detection of the detection area is more accurate in a mode of comparing the target image with the pre-stored image.
The foregoing embodiments of the present invention mainly describe differences between the embodiments, and as long as there is no contradiction between different optimization features of the embodiments, the embodiments may be combined to form a better embodiment, and in view of brevity of line text, no further description is provided herein.
The embodiments of the present invention have been described above with reference to the accompanying drawings, but the present invention is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those having ordinary skill in the art without departing from the spirit of the present invention and the scope of the claims, which are to be protected by the present invention.
Claims (10)
1. A cutting system for cutting a retardation film, characterized in that the cutting system comprises a conveying frame (100), a detection module (200), a cutting module (300) and a control module, wherein,
the detection module (200) and the cutting module (300) are sequentially arranged in the conveying direction of the conveying rack (100), the conveying rack (100) is used for conveying the phase difference film, so that the phase difference film sequentially passes through the detection module (200) and the cutting module (300), the detection module (200) and the cutting module (300) are connected with the control module, the detection module (200) is used for detecting whether a defect area exists in the phase difference film, and the control module controls the cutting module (300) to cut a non-defect area of the phase difference film into a film piece with a preset size under the condition that the defect area exists in the phase difference film, and the phase difference film comprises the defect area and the non-defect area.
2. The cutting system according to claim 1, wherein the detection module (200) comprises a first light emitting component (210), a first camera module (220), and a processing module, wherein the first light emitting component (210) is configured to project detection light to a detection area of the retardation film when the transfer frame (100) transfers the retardation film, the first camera module (220) is configured to capture the detection area and acquire a target image, and the processing module is configured to compare the target image with a pre-stored image, and determine the detection area as the defect area when the target image is inconsistent with the pre-stored image.
3. The cutting system according to claim 2, wherein the first light emitting assembly (210) comprises a plurality of first light emitting units (211), the plurality of first light emitting units (211) and the first camera module (220) are located on the same side of the retardation film, the plurality of first light emitting units (211) sequentially project first light rays onto the detection area at different angles of incidence, the first camera module (220) is configured to capture a first target sub-image when each of the first light emitting units (211) projects the first light rays onto the detection area, and the processing module is configured to compare the plurality of first target sub-images with a plurality of first pre-stored sub-images, and determine the detection area as the defect area if any of the plurality of first target sub-images is inconsistent with the corresponding first pre-stored sub-image, wherein the detected light rays comprise the first light rays, and the processing module is configured to compare the plurality of first target sub-images with the plurality of first pre-stored sub-images, and the first pre-stored sub-images comprise the first pre-stored sub-images.
4. A cutting system according to claim 2 or 3, wherein the first light emitting assembly (210) comprises a second light emitting unit (212), the second light emitting unit (212) and the first camera module (220) are respectively located at two opposite sides of the phase difference film, the second light emitting unit (212) is configured to project a second light ray onto a first surface of the detection area, the first camera module (220) is configured to capture a second surface of the detection area and obtain a second target sub-image, and the processing module is configured to compare the second target sub-image with a second pre-stored sub-image, and determine the detection area as the defect area if the second target sub-image is inconsistent with the second pre-stored sub-image, wherein the detection light ray includes the second light ray, the target image includes the second target sub-image, and the pre-stored image includes the second pre-stored sub-image.
5. The cutting system according to claim 1, wherein the detection module (200) includes a second light emitting component (230), a second camera module (240), a first polarizer (250), a second polarizer (260) and a processing module, the second light emitting component (230) and the second camera module (240) are respectively located at two opposite sides of the phase difference film, the first polarizer (250) is disposed at a light outlet of the second light emitting component (230), the second polarizer (260) is disposed at a light inlet of the second camera module (240), the second light emitting component (230) is configured to project a third light to the detection area, the processing module is connected with the second camera module (240), and the processing module is configured to determine the detection area as the defect area when the second camera module (240) does not receive the third light emitted by the second light emitting component (230).
6. The cutting system of claim 5, wherein a polarization angle of the first polarizer (250) is the same as a polarization angle of the second polarizer (260), and the first polarizer (250) is perpendicular to the second polarizer (260).
7. The cutting system of claim 6, wherein an angle of the first polarizer (250) with respect to the light exit of the second light emitting assembly (230) is adjustable, and an angle of the second polarizer (260) with respect to the light entrance of the second camera module (240) is adjustable.
8. The cutting system according to claim 1, further comprising a cleaning module (500), wherein the detection module (200), the cutting module (300) and the cleaning module (500) are arranged in sequence in a conveying direction of the conveying frame (100), and wherein the cleaning module (500) is configured to clean the film.
9. A control method of a cutting system for cutting a retardation film, characterized in that the cutting system is the cutting system according to any one of claims 1 to 8, the control method comprising:
controlling the phase difference film to be conveyed on the conveying rack (100);
controlling the detection module (200) to detect whether a defect area exists in the phase difference film;
and under the condition that the defect area exists in the phase difference film, controlling the cutting module (300) to cut the non-defect area of the phase difference film into a film piece with a preset size.
10. The control method according to claim 9, wherein the detection module (200) includes a first light emitting element (210), a first image capturing module (220), and a processing module, the first light emitting element (210) being configured to project detection light to a detection area of the retardation film when the transfer frame (100) transfers the retardation film, the first image capturing module (220) being configured to capture the detection area and acquire a target image; the controlling the detecting module (200) to detect whether the retardation film has a defective region includes:
controlling the first light-emitting component (210) to project detection light to a detection area of the phase difference film;
controlling the first camera module (220) to shoot the detection area and acquire a target image;
and comparing the target image with a pre-stored image, and determining the detection area as the defect area under the condition that the target image is inconsistent with the pre-stored image.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211655348.5A CN116175668A (en) | 2022-12-22 | 2022-12-22 | Cutting system and control method thereof |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211655348.5A CN116175668A (en) | 2022-12-22 | 2022-12-22 | Cutting system and control method thereof |
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| Publication Number | Publication Date |
|---|---|
| CN116175668A true CN116175668A (en) | 2023-05-30 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211655348.5A Pending CN116175668A (en) | 2022-12-22 | 2022-12-22 | Cutting system and control method thereof |
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| Country | Link |
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| CN (1) | CN116175668A (en) |
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2022
- 2022-12-22 CN CN202211655348.5A patent/CN116175668A/en active Pending
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