CN116147764A - Device and method for calibrating illuminance and testing sensitivity - Google Patents
Device and method for calibrating illuminance and testing sensitivity Download PDFInfo
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- CN116147764A CN116147764A CN202310426893.5A CN202310426893A CN116147764A CN 116147764 A CN116147764 A CN 116147764A CN 202310426893 A CN202310426893 A CN 202310426893A CN 116147764 A CN116147764 A CN 116147764A
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0295—Constructional arrangements for removing other types of optical noise or for performing calibration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/429—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to measurement of ultraviolet light
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Abstract
The invention provides a device and a method for calibrating radiation illuminance and testing sensitivity, which relate to the technical field of optics, and comprise the following steps: the device comprises a first sliding rail, a second sliding rail, an ultraviolet point light source, a first fixing device, a second fixing device, a diffuse reflection plate and a controller; the controller is used for controlling at least one of the position of the first fixing device on the first sliding rail, the position of the second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail based on the first target illuminance and the first target mapping relation, and calibrating the illuminance of the illuminated surface to be the first target illuminance after the control is completed. The device and the method for calibrating the illuminance and testing the sensitivity can realize the illuminance less than 10 ‑9 W/cm 2 Continuous calibration of magnitude irradiance, capable of improving magnitude by less than 10 ‑9 W/cm 2 The calibration accuracy of the radiation illuminance.
Description
Technical Field
The invention relates to the technical field of optics, in particular to a device and a method for calibrating radiation illuminance and testing sensitivity.
Background
The irradiance refers to the radiant flux per unit area of the illuminated surface. The method can continuously and accurately mark the irradiation illuminance, and has important significance for optical application research in the aspects of sensitivity test and the like of the ultraviolet imager.
In the prior art, at least one attenuation sheet can be arranged between the light source and the object to be calibrated, and the radiation illuminance of the object to be calibrated can be calibrated through the radiation illuminance of the light source and the attenuation density of the attenuation sheet.
However, the scale is far less than 10 based on the method -9 W/cm 2 When the radiation illuminance of the light source is higher than that of the object to be calibrated, a plurality of attenuation sheets are required to be arranged between the light source and the object to be calibrated. When the optical signal passes through the attenuation sheets, multiple reflections are formed among the attenuation sheets, and the reflections can cause the calibration accuracy of the radiation illuminance of the object to be calibrated to be obviously reduced. Therefore, how to more accurately calibrate orders of magnitude less than 10 -9 W/cm 2 Is a technical problem to be solved in the field.
Disclosure of Invention
The invention provides a device and a method for calibrating illuminance and testing sensitivity, which are used for solving the problem that the magnitude of the illuminance is difficult to accurately calibrate to be less than 10 in the prior art -9 W/cm 2 The defect of the radiation illuminance of (2) can be realized to more accurately calibrate the magnitude less than 10 -9 W/cm 2 Is provided).
The invention provides a radiation illuminance calibration device, comprising: the device comprises a first sliding rail, a second sliding rail, an ultraviolet point light source, a first fixing device, a second fixing device, a diffuse reflection plate and a controller;
The ultraviolet point light source and the diffuse reflection plate are arranged along a first light path, the diffuse reflection plate and the fixing device are arranged along a second light path, and the first light path and the second light path intersect at the center point of the diffuse reflection plate;
the first sliding rail extends along the propagation direction of the first light path, and the first fixing device is movably arranged on the first sliding rail along the extension direction of the first sliding rail;
the second sliding rail extends along the propagation direction of the second light path, and the second fixing device is movably arranged on the second sliding rail along the extension direction of the second sliding rail;
the first fixing device is used for fixing the ultraviolet point light source;
the second fixing device is used for fixing an object to be calibrated, and the illuminated surface of the object to be calibrated faces the diffuse reflection plate under the condition that the object to be calibrated is fixed on the second fixing device;
the controller is respectively in communication connection with the first fixing device and the second fixing device;
the controller is used for controlling at least one of the position of a first fixing device on the first sliding rail, the position of a second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail based on the first target radiation illuminance and a first target mapping relation under the condition that the first target radiation illuminance is obtained, and calibrating the radiation illuminance of the illuminated surface to be the first target radiation illuminance after the control is completed;
The first target mapping relationship is used for describing the corresponding relationship of the radiation illuminance of the illuminated surface, the distance between the center point of the illuminated surface and the center point of the diffuse reflection plate, the distance between the ultraviolet point light source and the center point of the diffuse reflection plate and the included angle between the first sliding rail and the second sliding rail.
According to the radiant illuminance calibration device provided by the invention, a preset included angle is formed between the first sliding rail and the second sliding rail;
the controller is further configured to control a position of the first fixing device on the first slide rail and/or a position of the second fixing device on the second slide rail based on the first target illuminance, the preset included angle, and the first target mapping relationship when the first target illuminance and the preset included angle are obtained, and to calibrate the illuminance of the illuminated surface to the first target illuminance after the control is completed.
According to the invention, the radiation illuminance calibration device further comprises: an angle sensor; the angle sensor is electrically connected with the controller;
the angle sensor is used for acquiring the preset included angle and sending the preset included angle to the controller.
According to the invention, the radiation illuminance calibration device further comprises: the third fixing device, the fourth fixing device and the diaphragm; the third fixing device and the fourth fixing device are respectively in communication connection with the controller;
the first fixing device, the third fixing device and the fourth fixing device are movably arranged on the first sliding rail along the extending direction of the first sliding rail in sequence;
the third fixing device is used for fixing the diaphragm;
the fourth fixing device is used for fixing the object to be calibrated, and the illuminated surface of the object to be calibrated faces the ultraviolet point light source under the condition that the object to be calibrated is fixed on the fourth fixing device;
the controller is further configured to control a position of the fourth fixing device on the first slide rail based on the second target illuminance and a second target mapping relationship when the second target illuminance is obtained, and after the control is completed, calibrate the illuminance of the illuminated surface to the second target illuminance;
the second target mapping relationship is used for describing a mapping relationship between the radiation illuminance of the illuminated surface and the distance between the center point of the illuminated surface and the ultraviolet point light source.
According to the invention, the radiation illuminance calibration device further comprises: the sliding rail mounting platform and the diffuse reflection plate mounting bracket;
the sliding rail mounting platform is used for fixing the first sliding rail and the second sliding rail; the diffuse reflection plate mounting bracket is used for fixing the diffuse reflection plate.
According to the invention, the radiation illuminance calibration device further comprises: a closed housing;
the first sliding rail, the second sliding rail, the ultraviolet point light source, the first fixing device, the second fixing device and the diffuse reflection plate are all arranged in the closed shell.
The invention also provides a radiation illuminance calibration method, which is realized based on the radiation illuminance calibration device according to any one of the above, and comprises the following steps:
acquiring first target radiation illuminance;
controlling at least one of the position of the first fixing device on the first sliding rail, the position of the second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail based on the first target illuminance and the first target mapping relation;
calibrating the radiation illuminance of the illuminated surface of the object to be calibrated as the first target radiation illuminance;
the first target mapping relationship is used for describing the corresponding relationship of the radiation illuminance of the illuminated surface, the distance between the center point of the illuminated surface and the center point of the diffuse reflection plate, the distance between the ultraviolet point light source and the center point of the diffuse reflection plate and the included angle between the first sliding rail and the second sliding rail.
The invention also provides a sensitivity test device, comprising: the radiation illuminance calibration device and the processor as described above; the processor is respectively connected with the ultraviolet imager to be detected and a controller in the radiation illuminance calibration device in a communication way;
under the condition that the ultraviolet imager to be tested is fixed on a second fixing device in the radiation illuminance calibration device, the processor is used for sending first target radiation illuminance to the controller so that the ultraviolet imager to be tested can measure a received optical signal under the condition that the controller finishes controlling at least one of the position of the first fixing device on the first sliding rail, the position of the second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail, and sending a measurement result to the processor;
the processor is also used for acquiring a sensitivity test result of the ultraviolet imager to be tested based on the measurement result under the condition that the measurement result is received.
According to the sensitivity testing device provided by the invention, the radiation illuminance calibration device comprises the third fixing device and the fourth fixing device, the third fixing device is fixedly provided with the diaphragm, and the processor is further used for sending second target radiation illuminance to the controller so that the ultraviolet imaging to be tested can measure the received optical signal and send the measurement result to the processor under the condition that the controller finishes controlling the position of the fourth fixing device on the first sliding rail.
The invention also provides a sensitivity test method, which is realized based on the sensitivity test device, and comprises the following steps:
acquiring first target radiation illuminance;
the first target radiation illuminance is sent to a controller in the radiation illuminance calibration device, so that the controller controls at least one of the position of the first fixing device on the first sliding rail, the position of the second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail based on the first target radiation illuminance and the first target mapping relation;
receiving a measurement result sent by an ultraviolet imager to be measured;
acquiring a sensitivity test result of the ultraviolet imager to be tested based on the measurement result and the first target radiation illuminance;
and the measurement result is obtained by measuring the received optical signal by the ultraviolet imager to be measured under the condition that the controller finishes the control.
The invention also provides an electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements any one of the radiation illuminance calibration method and/or the sensitivity test method when executing the program.
The invention also provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements a radiation level calibration method and/or the sensitivity test method as described in any one of the above.
The invention also provides a computer program product comprising a computer program which when executed by a processor implements a method of calibrating illuminance of radiation and/or a method of testing sensitivity as described in any of the above.
According to the radiation illuminance calibration and sensitivity test device and method provided by the invention, the radiation illuminance calibration device is constructed according to the geometric optical transmission theory and the lambertian cosine characteristic of the diffuse reflection plate, and can realize that the radiation illuminance calibration device is smaller than 10 only by controlling at least one of the position of the first fixing device on the first sliding rail, the position of the second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail -9 W/cm 2 Continuous calibration of magnitude irradiance, capable of improving magnitude by less than 10 -9 W/cm 2 The calibration accuracy of the radiation illuminance can provide more accurate data basis for the sensitivity detection of the solar blind ultraviolet imager, the accuracy of the sensitivity detection of the solar blind ultraviolet imager can be improved, the radiation illuminance calibration device has simple structure, lower equipment cost, smaller occupied space, simpler calibration process and higher efficiency of radiation illuminance calibration.
Drawings
In order to more clearly illustrate the invention or the technical solutions of the prior art, the following description will briefly explain the drawings used in the embodiments or the description of the prior art, and it is obvious that the drawings in the following description are some embodiments of the invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a radiation illuminance calibration apparatus according to the present invention;
FIG. 2 is a schematic diagram of the geometrical relationship of the light path of the illuminance calibration device provided by the invention;
FIG. 3 is a schematic diagram of a second embodiment of the device for calibrating illuminance;
FIG. 4 is a schematic flow chart of the method for calibrating illuminance of radiation provided by the invention;
FIG. 5 is a schematic diagram of a sensitivity test apparatus according to the present invention;
FIG. 6 is a flow chart of a sensitivity test method provided by the invention;
fig. 7 is a schematic structural diagram of an electronic device provided by the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the invention, it should be noted that, unless explicitly stated and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
Since the atmosphere has a strong absorption effect for ultraviolet light having a wavelength of 200nm to 300nm, a wavelength band having a wavelength range of 240nm to 280nm is called a solar blind ultraviolet band.
The solar blind ultraviolet imaging detection technology is free from interference of solar background noise, can realize accurate imaging detection of weak ultraviolet targets, and is widely applied to the fields of corona discharge detection, missile approximation alarm, astronomical observation, medicine, biology and the like.
For example, in the field of high-voltage electric transmission, because partial discharge on the surface of high-voltage electric transmission equipment such as a power transmission line, a transformer substation power distribution and the like can generate ultraviolet rays in a specific wave band, the wavelength of the ultraviolet rays locally generated on the surface of the high-voltage electric transmission equipment is directly used as a criterion for equipment damage, so that measurement of 240nm to 280nm ultraviolet radiation signals is carried out on the high-voltage electric transmission equipment by using a solar blind ultraviolet imager, and the method is an important means for diagnosing faults of the high-voltage electric circuit.
The ultraviolet light detection sensitivity is an important parameter for evaluating the performance of the solar blind ultraviolet imager, and can reflect the minimum ultraviolet light intensity which can be detected by the solar blind ultraviolet imager and directly relate to the detection of the single photon detection capability of the solar blind ultraviolet imager. The limit magnitude of sensitivity detection for traditional solar blind ultraviolet imagers is usually 10 -18 W/cm 2 The photon counting phase is entered.
In general, the sensitivity detection of the solar blind ultraviolet imager can be realized by setting an attenuation sheet, and the specific detection process comprises the following steps: at least one attenuation sheet is arranged between the solar blind ultraviolet monochromatic light source and the object to be calibrated, so that the attenuation density of the light path can be changed by changing the arrangement mode of the attenuation sheet until an ultraviolet signal which can be detected by the solar blind ultraviolet imaging instrument is minimum; according to the radiation illuminance of the solar blind ultraviolet monochromatic light source and the attenuation density of the light path when the solar blind ultraviolet imager detects an ultraviolet signal, the calibration radiation illuminance of the light signal received by the solar blind ultraviolet imager can be calculated, after the detection result obtained by detecting the light signal by the solar blind ultraviolet imager is obtained, the ultraviolet detection sensitivity of the solar blind ultraviolet imager can be determined based on the calibration radiation illuminance and the detection result.
The attenuation density of the optical path can be calculated based on the spectral transmittance of the attenuation sheet. The measuring device for measuring the spectral transmittance of the attenuation sheet is generally composed of a light source, a spectroscopic light path, and a detector; after the light source is subjected to monochromator or grating light splitting, a monochromatic light source is formed and is received by the detector; according to the signal ratio acquired by the detector when the attenuation sheet exists or not, the spectral transmittance of the attenuation sheet can be calculated.
However, since the magnitude of the irradiation illuminance of the ultraviolet monochromatic light source is accurately measured, it is usually 10 -8 W/cm 2 To 10 -9 W/cm 2 In between, if the light signal emitted by the ultraviolet monochromatic light source is attenuated to 10 -18 W/cm 2 Magnitude, magnitude change over 10 9 To 10 10 The attenuation density of the optical path must be greater than OD9 or even higher. Where OD is an abbreviation of optical density, which indicates the optical density absorbed by the object, and the detection unit may be represented by an OD value, od=lg (1/trans), where trans is the light transmittance value of the object.
The difficulty in accurately measuring the spectral transmittance of the attenuation sheet of the attenuation density OD4 is very high, and the attenuation of the attenuation density OD9 must be achieved by using a combination of a plurality of attenuation sheets, for example, a combination of attenuation sheets of three attenuation densities OD3, such that two attenuation densities OD4 and one attenuation sheet of the attenuation density OD1 are combined. As the attenuation density increases in magnitude, a greater number of attenuation pads are required to be combined.
However, multiple reflections may form between the attenuation pads. In the case where three or more attenuation sheets are included in the attenuation sheet group, the difference between the true value and the calculated value of the OD10 attenuation sheet group spectral transmittance is large. The product of the spectral transmittance of each attenuator in the OD10 attenuator set is not equal to the spectral transmittance of the OD10 attenuator set. Also, even with a laser source, direct measurement of the OD10 attenuation sheet set spectral transmittance is not possible.
Therefore, when the solar blind ultraviolet imaging instrument is subjected to sensitivity detection by arranging the attenuation sheet, the calculated value of the spectral transmittance of the attenuation sheet group and the actual value are obviously increased along with the increase of the attenuation density magnitude of the optical path, so that the calculated error between the calibrated radiation illuminance of the light signal received by the solar blind ultraviolet imaging instrument and the actual radiation illuminance of the light signal is larger, and the accurate sensitivity detection of the solar blind ultraviolet imaging instrument is inevitably difficult based on the calibrated radiation illuminance.
In general, the sensitivity detection of the solar blind ultraviolet imager may also be implemented by setting two integrating spheres or multiple integrating spheres connected, where the specific detection device includes: the attenuation sheet and the integrating sphere form an attenuation system; the integrating sphere is provided with a light inlet hole, a first light outlet hole and a second light outlet hole, a light source is arranged at the light inlet hole, and a light power meter is arranged at the second light outlet hole; a first attenuation sheet is placed on the light inlet hole, and a second attenuation sheet is placed on the first light outlet hole; the light source signal enters the integrating sphere after passing through the first attenuation sheet, is attenuated again in the integrating sphere and then is emitted, enters the solar blind ultraviolet imager after passing through the second attenuation sheet, and the sensitivity detection of the solar blind ultraviolet imager can be realized based on the detection device.
However, when the solar blind ultraviolet imager is subjected to sensitivity detection by arranging two integrating spheres or a plurality of integrating spheres in a connecting manner, the last integrating sphere can emit a very weak radiation source after the integrating spheres are connected. Whereas for attenuation of the integrating sphere, a monitoring detector may be used for optical path attenuation monitoring.
However, the detection sensitivity of the monitoring detector is limited, and in particular, accurate metering of the responsivity of the monitoring detector must be above a certain level to be achieved. Under the condition that the integrating sphere light source is attenuated to an extremely weak magnitude, the accurate attenuation multiplying power of the integrating sphere light source is difficult to obtain accurately, and further the accuracy of the calibrated illuminance of the light signal received by the solar blind ultraviolet imager is difficult to ensure, and the sensitivity detection of the solar blind ultraviolet imager is necessarily difficult to accurately detect based on the calibrated illuminance.
In contrast, the invention provides a radiation illuminance calibration device which is designed according to the geometric optical transmission theory and the lambertian cosine characteristic of the diffuse reflection plate. Based on the radiation illuminance calibration device provided by the invention, the radiation illuminance calibration device can realize less than 10 only through position control and/or angle control -9 W/cm 2 The continuous calibration of the magnitude radiation illuminance can improve the magnitude to be less than 10 -9 W/cm 2 The calibration accuracy of the radiation illuminance can provide more accurate data basis for the sensitivity detection of the solar blind ultraviolet imager, and can improve the accuracy of the sensitivity detection of the solar blind ultraviolet imagerThe calibration device has the advantages of simple structure, lower equipment cost, simpler operation and higher calibration efficiency, and the technical problems of calculation of spectral transmittance of an attenuation sheet, measurement of an integrating sphere monitoring detector and the like are not involved in the process of calibrating the illuminance of radiation.
Fig. 1 is a schematic diagram of a radiation illuminance calibration device according to the present invention. The following describes a radiation illuminance calibration device provided by the present invention with reference to fig. 1. As shown in fig. 1, the illuminance calibration apparatus 101 includes: the device comprises a first sliding rail 102, a second sliding rail 103, an ultraviolet point light source 104, a first fixing device 105, a second fixing device 106, a diffuse reflection plate 107 and a controller 108;
the ultraviolet point light source 104 and the diffuse reflection plate 107 are arranged along a first light path, the diffuse reflection plate 107 and the fixing device are arranged along a second light path, and the first light path and the second light path intersect at the center point of the diffuse reflection plate 107;
the first sliding rail 102 extends along the propagation direction of the first optical path, and the first fixing device 105 is movably arranged on the first sliding rail 102 along the extension direction of the first sliding rail 102;
The second slide rail 103 extends along the propagation direction of the second optical path, and the second fixing device 106 is movably arranged on the second slide rail 103 along the extension direction of the second slide rail 103;
the first fixing device 105 is used for fixing the ultraviolet point light source 104;
the second fixing device 106 is used for fixing the object 109 to be calibrated, and when the object 109 to be calibrated is fixed on the second fixing device 106, the illuminated surface of the object 109 to be calibrated faces the diffuse reflection plate 107.
Specifically, the ultraviolet point light source 104 in the embodiment of the present invention may provide monochromatic light signals in the ultraviolet band.
It can be understood that the ultraviolet point light source 104 is the starting point of the first light path, that is, the first light path is the transmission path of the monochromatic light signal.
Optionally, the ultraviolet point light source 104 in the embodiment of the present invention may be formed by a light source and a beam splitter, where after the light signal emitted by the light source is split by a monochromator or a grating, a monochromatic light signal in an ultraviolet band is obtained.
It can be understood that, since the first optical path and the second optical path intersect at the center point of the diffuse reflection plate 107, the center point of the diffuse reflection plate 107 is the end point of the first optical path and the start point of the second optical path, and the end point of the second optical path is located on the illuminated surface of the object 109 to be calibrated. The optical signal provided by the ultraviolet point light source 104 can reach the illuminated surface of the object 109 to be calibrated through the first optical path and the second optical path.
Note that, the diffuse reflection plate 107 in the embodiment of the present invention may be a diffuse reflection whiteboard.
The diffuse reflection plate 107 in the embodiment of the present invention is circular.
Fig. 2 is a schematic diagram of the geometrical relationship of the light path of the radiant illuminance calibration apparatus provided by the present invention. As shown in fig. 2, point a represents the ultraviolet point light source 104, point N represents the center point of the illuminated surface of the object 109 to be calibrated, point O represents the center point of the diffuse reflection plate 107, and point P is the projection point of point N on the plane of the diffuse reflection plate 107.
The O point is taken as the origin of coordinates, the plane of the diffuse reflection plate 107 is taken as the XY plane, and the vector is taken as the vector
The direction of (2) is Y-axis direction, and the vector is +.>
The direction of the (2) is the Z-axis direction, and a space rectangular coordinate system is established. />
As shown in fig. 2, vectors
Vector->
The included angle between them can be->
And (3) representing.
It will be appreciated that the number of components,
namely, the included angle between the first optical path and the second optical path is also the included angle between the first sliding rail 102 and the second sliding rail 103.
The distance between the object 109 to be calibrated and the center point of the diffuse reflection plate 107 is the vector
Can be used as the length of (a)
A representation; the distance between the ultraviolet point light source 104 and the center point of the diffuse reflection plate 107 is the vector +.>
Can be used +.>
And (3) representing.
Irradiance of O point 
The method can be calculated by the following formula:
wherein,,
representing a preset distance;
Indicating distance from the uv spot light source 104 +.>
The illuminance of the illuminated surface.
It should be noted that, by controlling the output level of the uv point light source 104 or setting a diaphragm with a reasonable size at the light outlet of the uv point light source 104, the distance from the uv point light source 104 can be set
Illuminance of the illuminated surface at the spot +.>
At 1X 10 - 9 W/cm 2 Horizontal. Wherein, the illuminance measuring instrument based on the traditional ultraviolet radiation can accurately measure 10 -9 W/cm 2 Is provided).
In the embodiment of the invention
The value of (2) can be 10cm, (-)>
Can be 10 -9 W/cm 2 . At->
And->
In the known case, the calculation can be based on formula (1)>
。
For any point M on the diffuse reflection plate 107, the coordinates of the point M can be used
A representation; vector->
Vector of AND
The included angle between them is->
And (3) representing.
(Vector)
For vector->
Projection on XY plane, vector +.>
The angle between the X axis is +.>
A representation; vector->
Lying in the XY plane and being perpendicular to the vector->
Parallel, vector->
The angle between the X axis is +.>
And (3) representing.
Based on the geometric relationship of the points in the space rectangular coordinate system, the coordinates of the A point in the space rectangular coordinate system are as follows 
The method comprises the steps of carrying out a first treatment on the surface of the The coordinates of the N point in the space rectangular coordinate system are +.>
The method comprises the steps of carrying out a first treatment on the surface of the The coordinates of the P point in the space rectangular coordinate system are +.>
。
When the diffuse reflection plate 107 is irradiated by the ultraviolet point light source 104, the irradiation illuminance at the M point can be used
The radiation brightness of the M point can be expressed by +.>
And (3) representing.
Illuminance of illuminated surface of object 109 to be calibrated
Can be described by the following formula:
wherein,,
representing M point vector +.>
Prescription incidence, vector->
The directional reflectance can be measured by a BRDF measuring device;
Representation vector->
Is a length of (2);
Representation vector->
Is a length of (2);
representation vector->
Is a length of (2);
The radius of the diffuse reflection plate 107 is shown.
As can be seen from the above formula, in the embodiment of the present invention, the illuminance of the illuminated surface of the object 109 to be calibrated
Only the distance +.>
Distance between ultraviolet point light source 104 and center point of diffuse reflection plate 107 +.>
And the angle between the first slide rail 102 and the second slide rail 103 +.>
And (5) correlation.
The embodiment of the invention can acquire based on the formula
And->
、
And +.>
And the mapping relation is used as a first target mapping relation.
In the radius of the diffuse reflection plate 107
0.5cm @ and @ for >
In the case of 10cm, the illuminance +.o of the center point O of the diffuse reflection plate 107 can be calculated based on the formula (1)>
Is 1X 10 -9 W/cm 2 ，
And->
The ratio between them is 1:20, and the diffuse reflection plate 107 may be approximated as a dot.
In the case where the M point is located on the Y axis and near the edge of the diffusion reflection plate 107,
，
greater than 0.997;
at the position of
20 cm->
In the case of 45 DEG, the calculation results in +.>
Greater than 0.999.
Thus, equation (6) and equation (7) can be approximated as:
it will be appreciated that the number of components,
namely +.>
。
Based on the a priori knowledge it is known that,
and->
The difference between them is less than 0.3%. In the case where the diffuse reflection plate 107 is approximately a dot, < >>
Can be approximated as +.>
The value of the ultraviolet light source is slightly less than 1 in the ultraviolet band.
From the above, it is clear that the difference between the calculation result obtained by performing the accurate calculation based on the formula (6) and the formula (7) and the calculation result obtained by performing the approximate calculation based on the formula (8) and the formula (9) is less than 1%.
Therefore, in the embodiment of the present invention, the approximate calculation may be performed based on the formula (8) and the formula (9) to obtain the first target mapping relationship.
From the first target mapping relationship, in
10cm @ of>
20 cm->
In the case of 45 DEG, the illuminance of the illuminated surface of the object 109 to be marked is +. >
About 6X 10 -13 W/cm 2 ；
At the position of
Increase to 400cm @, @>
10 cm->
In the case of 45 DEG, the illuminance of the illuminated surface of the object 109 to be marked is +.>
Reduced to 1.6X10 -15 W/cm 2 ；
At the position of
Increase to 400cm @, @>
400cm>
In the case of 45 DEG, the illuminance of the illuminated surface of the object 109 to be marked is +.>
LoweringUp to 1X 10 -18 W/cm 2 。
Alternatively, the length of the first slide rail 102 may be between 200cm and 500 cm;
the length of the second slide rail 103 may be between 200cm and 500 cm;
the included angle between the first sliding rail 102 and the second sliding rail 103 may be in a range of 30 ° to 60 °.
It should be noted that, in the embodiment of the present invention, the space occupied by the illuminance calibration device 101 is of a conventional size, and the transmission of the optical radiant energy in the space can be precisely described by using geometric optics. If the calibration of the irradiation illuminance of the illuminated surface of the object 109 to be calibrated is realized by only changing the distance between the object 109 to be calibrated and the ultraviolet point light source 104, the irradiation illuminance is inversely proportional to the square of the distance, and the irradiation illuminance level is 10 -9 W/cm 2 Up to 10 -18 W/cm 2 In the case of (2), the distance between the object 109 to be calibrated and the ultraviolet point light source 104 will vary by more than a factor of 3 ten thousand, and such a large distance variation cannot be achieved at all in a laboratory.
In contrast, in the radiation illuminance calibration device 101 provided by the present invention, when the ultraviolet point light source 104 irradiates the diffuse reflection plate 107, the diffuse reflection plate 107 becomes a new radiation source. Due to the solid angle of the radiation coverage space 2pi of the diffuse reflection plate 107, the optical radiation signal of the diffuse reflection plate 107 at a certain small angle may be greatly reduced. The reflectivity of the diffuse reflection plate 107 can be measured, and the illuminance of the illuminated surface of the object 109 to be calibrated can be obtained through numerical calculation by combining the reflectivity and the geometric optics of the diffuse reflection plate 107.
The controller 108 is communicatively connected to the first fixture 105 and the second fixture 106, respectively;
the controller 108 is configured to control at least one of a position of the first fixing device 105 on the first slide rail 102, a position of the second fixing device 106 on the second slide rail 103, and an included angle between the first slide rail 102 and the second slide rail 103 based on the first target illuminance and the first target mapping relationship, and to calibrate the illuminance of the illuminated surface to the first target illuminance after the control is completed;
the first target mapping relationship is used for describing a correspondence relationship between the radiation illuminance of the illuminated surface, a distance between a center point of the illuminated surface and a center point of the diffuse reflection plate 107, a distance between the ultraviolet point light source 104 and a center point of the diffuse reflection plate 107, and an included angle between the first sliding rail 102 and the second sliding rail 103.
The broken line in fig. 1 indicates a communication connection.
Specifically, the controller 108 may obtain the first target illuminance by a variety of means, for example, the controller 108 may obtain the first target illuminance based on an input of a user; alternatively, the controller 108 may also receive the first target irradiance transmitted by the other electronic device. The specific manner in which the controller 108 obtains the first target illuminance is not limited in the embodiment of the present invention.
It should be noted that, in the embodiment of the present invention, the first target illuminance is less than 10 -9 W/cm 2 The method comprises the steps of carrying out a first treatment on the surface of the The lower value limit of the first target illuminance may be determined based on the first target mapping relationship.
In the case that the controller 108 obtains the first target illuminance, the first target distance between the ultraviolet point light source 104A and the center point O of the diffuse reflection plate 107 may be obtained by means of data query based on the first target illuminance and the first target mapping relationship
A second target distance +.f between the center point N of the illuminated surface of the object 109 to be calibrated and the center point O of the diffuse reflection plate 107>
And a target angle between the first slide rail 102 and the second slide rail 103 +.>
。
The controller 108 obtains the first target distance
Second target distance- >
Target angle +.>
Thereafter, the first target distance may be based on +.>
Second target distance->
Target angle +.>
At least one of the position of the first fixing device 105 on the first slide rail 102, the position of the second fixing device 106 on the second slide rail 103 and the included angle between the first slide rail 102 and the second slide rail 103 is controlled so that the distance between the ultraviolet point light source 104A and the center point O of the diffuse reflection plate 107 is->
Reach the first target distance->
Distance between center point N of illuminated surface of object 109 to be calibrated and center point O of diffuse reflection plate 107 +.>
Reaching a second target distance->
And the angle between the first slide rail 102 and the second slide rail 103>
Reach the target angle +.>
。
It should be noted that, each of the first fixing device 105 and the second fixing device 106 may be provided with a transmission mechanism, and the transmission mechanism may respond toUnder the control of the controller 108, the first fixing device 105 is driven to slide on the first sliding rail 102, and the second fixing device 106 is driven to slide on the second sliding rail 103, so that the distance between the ultraviolet point light source 104A and the center point O of the diffuse reflection plate 107
Reach the first target distance->
Distance between center point N of illuminated surface of object 109 to be calibrated and center point O of diffuse reflection plate 107 +. >
Reaching a second target distance->
。
It should be noted that, a transmission mechanism may also be disposed in the first sliding rail 102 and the second sliding rail 103, and the transmission mechanism may respond to the control of the controller 108 to drive the first sliding rail 102 and the second sliding rail 103 to rotate with the center of the diffuse reflection plate 107 as the origin, so that the included angle between the first sliding rail 102 and the second sliding rail 103 is formed
Reach the target angle +.>
。
It will be appreciated that the distance between the ultraviolet point light source 104A and the center point O of the diffuse reflection plate 107
Has been the first target distance->
The controller 108 need not control the position of the first fixture 105 on the first slide 102;
distance between center point N of illuminated surface of object 109 to be calibrated and center point O of diffuse reflection plate 107
Has been the second target distance->
The controller 108 does not need to control the position of the second fixing device 106 on the second slide rail 103;
an included angle between the first slide rail 102 and the second slide rail 103
Has been the target angle +>
The controller 108 does not need to control the angle between the first rail 102 and the second rail 103.
The controller 108 controls at least one of the position of the first fixing device 105 on the first sliding rail 102, the position of the second fixing device 106 on the second sliding rail 103 and the included angle between the first sliding rail 102 and the second sliding rail 103, so that the distance between the ultraviolet point light source 104A and the center point O of the diffuse reflection plate 107 
Reach the first target distance->
Distance between center point N of illuminated surface of object 109 to be calibrated and center point O of diffuse reflection plate 107 +.>
Reaching a second target distance->
And the angle between the first slide rail 102 and the second slide rail 103>
Reach the target angle +.>
The object 109 to be calibrated may then be illuminatedThe irradiance of the facet is calibrated to the first target irradiance.
According to the radiation illuminance calibration device disclosed by the embodiment of the invention, the radiation illuminance calibration device is constructed according to the geometric optical transmission theory and the lambertian cosine characteristic of the diffuse reflection plate, and the radiation illuminance calibration device can realize the radiation illuminance calibration device with the radiation illuminance of less than 10 only by controlling at least one of the position of the first fixing device on the first sliding rail, the position of the second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail -9 W/cm 2 Continuous calibration of magnitude irradiance, capable of improving magnitude by less than 10 -9 W/cm 2 The calibration accuracy of the radiation illuminance can provide more accurate data basis for the sensitivity detection of the solar blind ultraviolet imager, the accuracy of the sensitivity detection of the solar blind ultraviolet imager can be improved, the radiation illuminance calibration device has simple structure, lower equipment cost, smaller occupied space, simpler calibration process and higher efficiency of radiation illuminance calibration.
Based on the above-mentioned embodiments, a preset included angle is formed between the first sliding rail 102 and the second sliding rail 103;
the controller 108 is further configured to, when the first target illuminance and the preset angle are obtained, control the position of the first fixing device 105 on the first slide rail 102 and/or the position of the second fixing device 106 on the second slide rail 103 based on the first target illuminance, the preset angle, and the first target mapping relationship, and after the control is completed, calibrate the illuminance of the illuminated surface to the first target illuminance.
It should be noted that the preset included angle
May be based on actual conditions and/or predetermined. In the embodiment of the invention, the preset included angle is +.>
The specific value of (2) is not limited.
Optionally, a preset angle
Is taken from (a)The value range may be between 30 ° and 60 °, for example: preset included angle->
May be 30 °, 45 ° or 60 °.
Optionally, a preset angle
The range of values of (2) may be between 30 ° and 60 °, for example: preset included angle->
May be 30 °, 45 ° or 60 °.
Specifically, the controller 108 may obtain the preset included angle in a variety of ways
For example, the controller 108 may acquire the preset included angle based on the input of the user>
The method comprises the steps of carrying out a first treatment on the surface of the Alternatively, the controller 108 may also receive a preset included angle sent by other electronic devices 
. In the embodiment of the present invention, the controller 108 is provided with a predetermined angle +.>
The specific mode of (a) is not limited.
Specifically, the controller 108 obtains the first target irradiance and the preset angle
Can be based on the first target irradiance, a preset angle +.>
And the first target mapping relation, obtaining a third target distance between the ultraviolet point light source 104A and the center point O of the diffuse reflection plate 107 by means of data query>
And a fourth target distance between the center point N of the illuminated surface of the object 109 to be calibrated and the center point O of the diffuse reflection plate 107>
。
The controller 108 obtains a third target distance
Fourth target distance->
Thereafter, the third target distance +.>
Fourth target distance->
The position of the first fixing device 105 on the first slide rail 102 and/or the position of the second fixing device 106 on the second slide rail 103 are controlled so that the distance between the ultraviolet point light source 104A and the center point O of the diffuse reflection plate 107 +.>
Reach a third target distance->
Distance between center point N of illuminated surface of object 109 to be calibrated and center point O of diffuse reflection plate 107 +.>
Reach the fourth target distance->
。
Based on the foregoing matters of the embodiments, the illuminance calibration apparatus 101 further includes: an angle sensor; the angle sensor is electrically connected with the controller 108;
The angle sensor is used for acquiring a preset included angle and transmitting the preset included angle to the controller 108.
In the embodiment of the invention, the first sliding rail and the second sliding rail form the preset included angle, and the controller can perform radiation illuminance calibration more efficiently after acquiring the preset included angle based on the input of a user or an angle sensor.
It can be understood that in the radiant illuminance calibration apparatus 101 provided by the present invention, the distance between the center point N of the illuminated surface of the object 109 to be calibrated and the center point O of the diffuse reflection plate 107
Distance +.o between ultraviolet point light source 104A and center point O of diffuse reflection plate 107>
And the angle between the first slide rail 102 and the second slide rail 103 +.>
One or both of the above may be a preset value, and the controller 108 may control the remaining controllable objects based on the preset value and the first target mapping relationship, so as to achieve the calibration of the illuminance of the illuminated surface of the object 109 to be calibrated.
FIG. 3 is a schematic diagram of a second embodiment of the apparatus for calibrating illuminance. As shown in fig. 3, the radiation illuminance calibration apparatus 101 further includes: a third fixture 301, a fourth fixture 302, and a diaphragm 303; the third fixture 301 and the fourth fixture 302 are each communicatively coupled to the controller 108;
The first fixing device 105, the third fixing device 301, and the fourth fixing device 302 are movably disposed on the first slide rail 102 in order along the extending direction of the first slide rail 102;
the third fixing means 301 is for fixing the diaphragm 303;
the fourth fixing device 302 is used for fixing the object 109 to be calibrated, and when the object 109 to be calibrated is fixed on the fourth fixing device 302, the illuminated surface of the object 109 to be calibrated faces the ultraviolet point light source 104;
it will be appreciated that in the case where the ultraviolet point light source 104 and the object 109 to be calibrated are located in the same optical path, the illuminance of the illuminated surface of the object 109 to be calibrated is related to the square of the distance between the ultraviolet point light source 104 and the object 109 to be calibrated.
Thus, in the para-order of greater than or equal to 10 -9 W/cm 2 When the illuminance is calibrated, the diaphragm 303 may be arranged on the third fixing device 301, the object 109 to be calibrated is set on the third fixing device 301, it is determined that the illuminated surface of the object 109 to be calibrated faces the ultraviolet point light source 104, and both the center point of the illuminated surface of the object 109 to be calibrated and the ultraviolet point light source 104 are on the first optical path.
By controlling the output level of the ultraviolet point light source 104 or setting a diaphragm 303 with reasonable size at the light outlet of the ultraviolet point light source 104, the distance from the ultraviolet point light source 104 can be ensured 
Illuminance of the illuminated surface at the spot +.>
At 1X 10 -9 W/cm 2 Horizontal.
Thus, the illuminance of the radiation on the illuminated surface of the object 109 to be calibrated
Can be described by the following formula:
wherein,,
representing the distance between the center point of the illuminated surface of the object 109 to be calibrated and the ultraviolet point light source 104.
Optionally, in an embodiment of the present invention
The value of (2) can be 10cm, (-)>
Can be 10 -9 W/cm 2 。
As can be seen from equation (10), the present inventionIn the embodiment, the irradiation illuminance of the illuminated surface of the object 109 to be calibrated
Only the distance from the center point of the illuminated surface of the object 109 to be calibrated to the ultraviolet point light source 104>
And (5) correlation.
The embodiment of the invention can acquire based on the formula (10)
And->
And the mapping relation is used as a second target mapping relation.
The controller 108 is further configured to control the position of the fourth fixing device 302 on the first sliding rail 102 based on the second target illuminance and the second target mapping relationship, and after the control is completed, calibrate the illuminance of the illuminated surface to the second target illuminance;
the second target mapping relationship is used for describing a mapping relationship between the illuminance of the irradiated surface and the distance between the center point of the irradiated surface and the ultraviolet point light source 104.
The broken line in fig. 3 indicates a communication connection.
Specifically, the controller 108 may obtain the second target illuminance by a variety of means, for example, the controller 108 may obtain the second target illuminance based on the input of the user; alternatively, the controller 108 may also receive a second target irradiance transmitted by the other electronic device. The specific manner in which the controller 108 obtains the second target illuminance is not limited in the embodiment of the present invention.
It should be noted that, in the embodiment of the present invention, the second target irradiance is greater than or equal to 10 -9 W/cm 2 The method comprises the steps of carrying out a first treatment on the surface of the The upper limit of the second target illuminance may be determined based on the second target mapping relationship.
The controller 108 obtainsUnder the condition of taking the second target radiation illuminance, a fifth target distance between the center point of the illuminated surface of the object 109 to be calibrated and the ultraviolet point light source 104 can be obtained by a data query method based on the second target radiation illuminance and the second target mapping relationship
。
The controller 108 obtains the fifth target distance
Thereafter, it may be based on the fifth target distance +.>
The position of the fourth fastening means 302 on the first slide rail 102 is controlled such that the distance between the center point of the illuminated surface of the object 109 to be calibrated and the ultraviolet point light source 104 is >
Reach fifth target distance->
。
It should be noted that, a transmission mechanism may be disposed in the fourth fixing device 302, and the transmission mechanism may respond to the control of the controller 108 to drive the fourth fixing device 302 to slide on the first sliding rail 102, so as to enable the distance between the center point of the illuminated surface of the object 109 to be calibrated and the ultraviolet point light source 104
Reach fifth target distance->
。
The controller 108 controls the position of the fourth fixing device 302 on the first sliding rail 102 to enable the distance between the center point of the illuminated surface of the object 109 to be calibrated and the ultraviolet point light source 104
Reach fifth target distance->
Then, the illuminance of the illuminated surface of the object 109 to be calibrated may be calibrated as the second target illuminance.
According to the radiation illuminance calibration device provided by the embodiment of the invention, the position of the fourth fixing device on the first sliding rail is controlled to be more than or equal to 10 -9 W/cm 2 Continuous calibration of magnitude irradiance, capable of increasing magnitude by more than or equal to 10 -9 W/cm 2 The calibration accuracy of the radiation illuminance can provide more accurate data basis for the sensitivity detection of the solar blind ultraviolet imager, the accuracy of the sensitivity detection of the solar blind ultraviolet imager can be improved, the radiation illuminance calibration device has simple structure, lower equipment cost, smaller occupied space, simpler calibration process and higher efficiency of radiation illuminance calibration.
Based on the foregoing matters of the embodiments, the illuminance calibration apparatus 101 further includes: the sliding rail mounting platform and the diffuse reflection plate mounting bracket;
the sliding rail mounting platform is used for fixing the first sliding rail 102 and the second sliding rail 103; the diffuse reflection plate mounting bracket is used to fix the diffuse reflection plate 107.
Based on the foregoing matters of the embodiments, the illuminance calibration apparatus 101 further includes: a hermetic case 110;
the first sliding rail 102, the second sliding rail 103, the ultraviolet point light source 104, the first fixing device 105, the second fixing device 106 and the diffuse reflection plate 107 are all arranged in the closed shell 110.
According to the embodiment of the invention, the first sliding rail, the second sliding rail, the ultraviolet point light source, the first fixing device, the second fixing device and the diffuse reflection plate are arranged in the closed shell, so that interference of other light signals on radiation illuminance calibration can be avoided, and the accuracy of radiation illuminance calibration can be further improved.
Fig. 4 is a schematic flow chart of the method for calibrating illuminance of radiation provided by the invention. The radiation illuminance calibration method provided by the present invention is described below with reference to fig. 4, and the radiation illuminance calibration method described below is implemented based on the radiation illuminance calibration apparatus 101 provided by the present invention described above. As shown in fig. 4, the method includes: step 401, acquiring first target radiation illuminance;
the first target mapping relationship is used for describing a correspondence relationship between the radiation illuminance of the illuminated surface, a distance between a center point of the illuminated surface and a center point of the diffuse reflection plate 107, a distance between the ultraviolet point light source 104 and a center point of the diffuse reflection plate 107, and an included angle between the first sliding rail 102 and the second sliding rail 103.
It should be noted that, in the embodiment of the present invention, the execution body is the controller 108.
It should be noted that, specific execution steps of the method for calibrating illuminance of radiation provided by the present invention may be referred to the content of each embodiment, and the embodiments of the present invention are not repeated.
According to the geometrical optical transmission theory and the lambertian cosine characteristic of the diffuse reflection plate, the embodiment of the invention can realize that the angle between the first sliding rail 102 and the second sliding rail 103 is smaller than 10 by controlling at least one of the position of the first fixing device 105 on the first sliding rail 102, the position of the second fixing device 106 on the second sliding rail 103 and the included angle between the first sliding rail 102 and the second sliding rail 103 -9 W/cm 2 Continuous calibration of magnitude irradiance, capable of improving magnitude by less than 10 -9 W/cm 2 The calibration accuracy of the radiation illuminance can provide more accurate data basis for the sensitivity detection of the solar blind ultraviolet imager, the accuracy of the sensitivity detection of the solar blind ultraviolet imager can be improved, the radiation illuminance calibration device has simple structure, lower equipment cost, smaller occupied space, simpler calibration process and higher efficiency of radiation illuminance calibration.
Fig. 5 is a schematic structural diagram of the sensitivity testing device provided by the invention. The sensitivity test apparatus provided by the present invention is described below with reference to fig. 5. As shown in fig. 5, the sensitivity test apparatus 501 includes: any of the above radiation level calibration devices 101 and processors 502; the processor 502 is respectively in communication connection with the ultraviolet imager 503 to be tested and the controller 108 in the radiation illuminance calibration device 101;
in the case that the ultraviolet imager 503 to be measured is fixed on the second fixing device 106 in the radiation illuminance calibration device 101, the processor 502 is configured to send a first target radiation illuminance to the controller 108, so that the ultraviolet imager 503 to be measured measures a received optical signal and sends a measurement result to the processor 502 when the controller 108 finishes controlling at least one of a position of the first fixing device on the first slide rail, a position of the second fixing device on the second slide rail, and an included angle between the first slide rail and the second slide rail;
The processor 502 is further configured to obtain a sensitivity test result of the ultraviolet imager 503 to be tested based on the measurement result when the measurement result is received.
The broken line in fig. 5 indicates a communication connection.
Specifically, when the irradiation illuminance level of the ultraviolet imager 503 to be measured is required to be smaller than 10 -9 W/cm 2 Under the condition of sensitivity test of (1), the ultraviolet imaging device 503 to be tested can be fixed on the second fixing device 106, and the center point of the illuminated surface of the ultraviolet imaging device 503 to be tested and the center point of the diffuse reflection plate 107 are both ensured to be located on the second light path, and then the radiation illuminance calibration device 101 can be utilized to provide less than 10 for the illuminated surface of the ultraviolet imaging device 503 to be tested -9 W/cm 2 And (5) continuously calibrating the magnitude radiation illuminance.
The processor 502 may obtain the first target illuminance by a variety of means, for example, the processor 502 may obtain the first target illuminance based on the input of the user; alternatively, the processor 502 may also receive a first target irradiance transmitted by another electronic device. The specific manner in which the processor 502 obtains the first target illuminance is not limited in the embodiment of the present invention.
After the processor 502 obtains the first target irradiance, the first target irradiance may be sent to the controller 108.
The controller 108 may control at least one of the position of the first fixing device 105 on the first sliding rail 102, the position of the second fixing device 106 on the second sliding rail 103, and the included angle between the first sliding rail 102 and the second sliding rail 103 based on the first target illuminance and the first target mapping relationship, and after the control is completed, calibrate the illuminance of the illuminated surface of the ultraviolet imager 503 to be measured to the first target illuminance.
The controller 108 may perform measurement on the received optical signal by the ultraviolet imager 503 under control, and may send the measurement result to the processor 502. Wherein the optical signal reaches the ultraviolet imager 503 to be measured through the first optical path and the second optical path.
The processor 502 may obtain the sensitivity test result of the ultraviolet imager 503 to be tested by means of numerical calculation, data comparison, and the like based on the measurement result and the first target illuminance.
The sensitivity testing device in the embodiment of the invention comprises the radiation illuminance calibration device and a processor, and can provide less than 10 for an ultraviolet imager to be tested by utilizing the radiation illuminance calibration device -9 W/cm 2 Continuous calibration of magnitude irradiance, less than 10 is carried out on the ultraviolet imager to be tested -9 W/cm 2 The calibration accuracy of the magnitude irradiance is higher, the accuracy of the sensitivity detection of the ultraviolet imager to be detected can be improved, the structure of the sensitivity testing device is simple, the cost of equipment required to be input is lower, the occupied space of the sensitivity testing device is smaller, the calibration process is simpler, and the efficiency of the sensitivity testing device is higher.
Based on the above-mentioned embodiments, in the case that the radiation illuminance calibration device 101 includes the third fixing device 301 and the fourth fixing device 302 to which the diaphragm 303 is fixed, and the ultraviolet imager 503 to be measured is fixed to the fourth fixing device 302, the processor 502 is further configured to send the second target radiation illuminance to the controller 108, so that the ultraviolet imager 503 to be measured measures the received optical signal when the controller 108 completes the control of the position of the fourth fixing device on the first slide rail, and send the measurement result to the processor 502.
Specifically, when the irradiation illuminance level of the ultraviolet imager 503 to be measured is greater than or equal to 10 -9 W/cm 2 Under the condition of sensitivity test of (1), the ultraviolet imaging device 503 to be tested can be fixed on the fourth fixing device 302, and the center point of the illuminated surface of the ultraviolet imaging device 503 to be tested and the ultraviolet point light source 104 are both located on the first optical path, so that the radiation illuminance calibration device 101 can be utilized to provide more than or equal to 10 for the illuminated surface of the ultraviolet imaging device 503 to be tested -9 W/cm 2 And (5) continuously calibrating the magnitude radiation illuminance.
The processor 502 may obtain the second target illuminance by a variety of means, for example, the processor 502 may obtain the second target illuminance based on the input of the user; alternatively, the processor 502 may also receive a second target irradiance transmitted by the other electronic device. The specific manner in which the processor 502 obtains the second target illuminance is not limited in the embodiment of the present invention.
After the processor 502 obtains the second target irradiance, the second target irradiance may be sent to the controller 108.
The controller 108 may control the position of the fourth fixing device 302 on the first sliding rail 102 based on the second target illuminance and the second target mapping relationship, and after the control is completed, calibrate the illuminance of the illuminated surface of the ultraviolet imager 503 to be measured to the second target illuminance.
The controller 108 may perform measurement on the received optical signal by the ultraviolet imager 503 under control, and may send the measurement result to the processor 502. Wherein the optical signal reaches the ultraviolet imager 503 to be measured through the first optical path.
The processor 502 may obtain the sensitivity test result of the ultraviolet imager 503 to be tested by means of numerical calculation, data comparison, and the like based on the measurement result and the second target illuminance.
The sensitivity testing device in the embodiment of the invention can provide more than or equal to 10 for the ultraviolet imager to be tested by utilizing the irradiation intensity calibration device -9 W/cm 2 Continuously calibrating the magnitude radiation illuminance, and carrying out the ultraviolet imaging instrument to be tested to be more than or equal to 10 -9 W/cm 2 The calibration accuracy of the magnitude irradiance is higher, the accuracy of the sensitivity detection of the ultraviolet imager to be detected can be improved, the structure of the sensitivity testing device is simple, the cost of equipment required to be input is lower, the occupied space of the sensitivity testing device is smaller, the calibration process is simpler, and the efficiency of the sensitivity testing device is higher.
Fig. 6 is a flow chart of the sensitivity test method provided by the invention. The sensitivity test method provided by the present invention will be described below with reference to fig. 6, and the sensitivity test method described below is implemented based on the sensitivity test apparatus 501 provided by the present invention described above. As shown in fig. 6, the method includes: step 601, obtaining first target radiation illuminance;
the measurement result is obtained by measuring the received optical signal by the ultraviolet imager 503 under the condition that the controller 108 finishes the control.
It should be noted that, in the embodiment of the present invention, the execution body is the processor 502.
It should be noted that, specific execution steps of the sensitivity test method provided by the present invention may refer to the content of each embodiment, and the embodiments of the present invention are not repeated.
According to the embodiment of the invention, the first target illuminance is sent to the controller in the illuminance calibration device, so that the illuminance calibration device can be utilized to provide less than 10 for the ultraviolet imager to be tested -9 W/cm 2 Continuous calibration of magnitude irradiance, less than 10 is carried out on the ultraviolet imager to be tested -9 W/cm 2 The calibration accuracy of the magnitude irradiance is higher, and the ultraviolet imaging instrument to be measured can be improved by less than 10 -9 W/cm 2 The accuracy of magnitude sensitivity detection is simple, the sensitivity testing device is simple in structure, the equipment cost required to be input is lower, the occupied space of the sensitivity testing device is smaller, the calibration process is simpler, and the efficiency of performing the sensitivity testing device is higher.
Fig. 7 illustrates a physical schematic diagram of an electronic device, as shown in fig. 7, which may include: processor 710, communication interface (Communications Interface) 720, memory 730, and communication bus 740, wherein processor 710, communication interface 720, memory 730 communicate with each other via communication bus 740. Processor 710 may invoke logic instructions in memory 730 to perform the irradiance calibration method, and/or the sensitivity test method. The radiation illuminance calibration method comprises the following steps: acquiring first target radiation illuminance; controlling at least one of a position of the first fixing device on the first sliding rail, a position of the second fixing device on the second sliding rail and an included angle between the first sliding rail and the second sliding rail based on the first target illuminance and the first target mapping relation; calibrating the illuminance of the illuminated surface of the object to be calibrated as a first target illuminance; the first target mapping relation is used for describing the corresponding relation of the radiation illuminance of the illuminated surface, the distance between the center point of the illuminated surface and the center point of the diffuse reflection plate, the distance between the ultraviolet point light source and the center point of the diffuse reflection plate and the included angle between the first sliding rail and the second sliding rail. The sensitivity test method comprises the following steps: acquiring first target radiation illuminance; the method comprises the steps that first target radiation illuminance is sent to a controller in a radiation illuminance calibration device, and at least one of the position of a first fixing device on a first sliding rail, the position of a second fixing device on a second sliding rail and an included angle between the first sliding rail and the second sliding rail is controlled by the controller based on the first target radiation illuminance and a first target mapping relation; receiving a measurement result sent by an ultraviolet imager to be measured; acquiring a sensitivity test result of the ultraviolet imager to be tested based on the measurement result and the first target illuminance; the measurement result is obtained by measuring the received optical signal by the ultraviolet imager to be measured under the condition that the controller finishes control.
Further, the logic instructions in the memory 730 described above may be implemented in the form of software functional units and may be stored in a computer readable storage medium when sold or used as a stand alone product. Based on this understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution, in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
In another aspect, the present invention also provides a computer program product, where the computer program product includes a computer program, where the computer program can be stored on a non-transitory computer readable storage medium, where the computer program, when executed by a processor, can perform the method for calibrating illuminance of radiation and/or the method for testing sensitivity provided by the methods described above. The radiation illuminance calibration method comprises the following steps: acquiring first target radiation illuminance; controlling at least one of a position of the first fixing device on the first sliding rail, a position of the second fixing device on the second sliding rail and an included angle between the first sliding rail and the second sliding rail based on the first target illuminance and the first target mapping relation; calibrating the illuminance of the illuminated surface of the object to be calibrated as a first target illuminance; the first target mapping relation is used for describing the corresponding relation of the radiation illuminance of the illuminated surface, the distance between the center point of the illuminated surface and the center point of the diffuse reflection plate, the distance between the ultraviolet point light source and the center point of the diffuse reflection plate and the included angle between the first sliding rail and the second sliding rail. The sensitivity test method comprises the following steps: acquiring first target radiation illuminance; the method comprises the steps that first target radiation illuminance is sent to a controller in a radiation illuminance calibration device, and at least one of the position of a first fixing device on a first sliding rail, the position of a second fixing device on a second sliding rail and an included angle between the first sliding rail and the second sliding rail is controlled by the controller based on the first target radiation illuminance and a first target mapping relation; receiving a measurement result sent by an ultraviolet imager to be measured; acquiring a sensitivity test result of the ultraviolet imager to be tested based on the measurement result and the first target illuminance; the measurement result is obtained by measuring the received optical signal by the ultraviolet imager to be measured under the condition that the controller finishes control.
In yet another aspect, the present invention further provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, is implemented to perform the method of calibrating illuminance of radiation provided by the methods described above, and/or the method of testing sensitivity. The radiation illuminance calibration method comprises the following steps: acquiring first target radiation illuminance; controlling at least one of a position of the first fixing device on the first sliding rail, a position of the second fixing device on the second sliding rail and an included angle between the first sliding rail and the second sliding rail based on the first target illuminance and the first target mapping relation; calibrating the illuminance of the illuminated surface of the object to be calibrated as a first target illuminance; the first target mapping relation is used for describing the corresponding relation of the radiation illuminance of the illuminated surface, the distance between the center point of the illuminated surface and the center point of the diffuse reflection plate, the distance between the ultraviolet point light source and the center point of the diffuse reflection plate and the included angle between the first sliding rail and the second sliding rail. The sensitivity test method comprises the following steps: acquiring first target radiation illuminance; the method comprises the steps that first target radiation illuminance is sent to a controller in a radiation illuminance calibration device, and at least one of the position of a first fixing device on a first sliding rail, the position of a second fixing device on a second sliding rail and an included angle between the first sliding rail and the second sliding rail is controlled by the controller based on the first target radiation illuminance and a first target mapping relation; receiving a measurement result sent by an ultraviolet imager to be measured; acquiring a sensitivity test result of the ultraviolet imager to be tested based on the measurement result and the first target illuminance; the measurement result is obtained by measuring the received optical signal by the ultraviolet imager to be measured under the condition that the controller finishes control.
The apparatus embodiments described above are merely illustrative, wherein the elements illustrated as separate elements may or may not be physically separate, and the elements shown as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
From the above description of the embodiments, it will be apparent to those skilled in the art that the embodiments may be implemented by means of software plus necessary general hardware platforms, or of course may be implemented by means of hardware. Based on this understanding, the foregoing technical solution may be embodied essentially or in a part contributing to the prior art in the form of a software product, which may be stored in a computer readable storage medium, such as ROM/RAM, a magnetic disk, an optical disk, etc., including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method described in the respective embodiments or some parts of the embodiments.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. A radiant illuminance calibration apparatus, comprising: the device comprises a first sliding rail, a second sliding rail, an ultraviolet point light source, a first fixing device, a second fixing device, a diffuse reflection plate and a controller;
the ultraviolet point light source and the diffuse reflection plate are arranged along a first light path, the diffuse reflection plate and the fixing device are arranged along a second light path, and the first light path and the second light path intersect at the center point of the diffuse reflection plate;
the first sliding rail extends along the propagation direction of the first light path, and the first fixing device is movably arranged on the first sliding rail along the extension direction of the first sliding rail;
The second sliding rail extends along the propagation direction of the second light path, and the second fixing device is movably arranged on the second sliding rail along the extension direction of the second sliding rail;
the first fixing device is used for fixing the ultraviolet point light source;
the second fixing device is used for fixing an object to be calibrated, and the illuminated surface of the object to be calibrated faces the diffuse reflection plate under the condition that the object to be calibrated is fixed on the second fixing device;
the controller is respectively in communication connection with the first fixing device and the second fixing device;
the controller is used for controlling at least one of the position of a first fixing device on the first sliding rail, the position of a second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail based on the first target radiation illuminance and a first target mapping relation under the condition that the first target radiation illuminance is obtained, and calibrating the radiation illuminance of the illuminated surface to be the first target radiation illuminance after the control is completed;
the first target mapping relationship is used for describing the corresponding relationship of the radiation illuminance of the illuminated surface, the distance between the center point of the illuminated surface and the center point of the diffuse reflection plate, the distance between the ultraviolet point light source and the center point of the diffuse reflection plate and the included angle between the first sliding rail and the second sliding rail.
2. The radiant illuminance calibration apparatus according to claim 1, wherein a preset included angle is formed between the first slide rail and the second slide rail;
the controller is further configured to control a position of the first fixing device on the first slide rail and/or a position of the second fixing device on the second slide rail based on the first target illuminance, the preset included angle, and the first target mapping relationship when the first target illuminance and the preset included angle are obtained, and to calibrate the illuminance of the illuminated surface to the first target illuminance after the control is completed.
3. The radiant illuminance calibration apparatus of claim 2, further comprising: an angle sensor; the angle sensor is electrically connected with the controller;
the angle sensor is used for acquiring the preset included angle and sending the preset included angle to the controller.
4. The radiant illuminance calibration apparatus of claim 1, further comprising: the third fixing device, the fourth fixing device and the diaphragm; the third fixing device and the fourth fixing device are respectively in communication connection with the controller;
The first fixing device, the third fixing device and the fourth fixing device are movably arranged on the first sliding rail along the extending direction of the first sliding rail in sequence;
the third fixing device is used for fixing the diaphragm;
the fourth fixing device is used for fixing the object to be calibrated, and the illuminated surface of the object to be calibrated faces the ultraviolet point light source under the condition that the object to be calibrated is fixed on the fourth fixing device;
the controller is further configured to control a position of the fourth fixing device on the first slide rail based on the second target illuminance and a second target mapping relationship when the second target illuminance is obtained, and after the control is completed, calibrate the illuminance of the illuminated surface to the second target illuminance;
the second target mapping relationship is used for describing a mapping relationship between the radiation illuminance of the illuminated surface and the distance between the center point of the illuminated surface and the ultraviolet point light source.
5. The radiant illuminance calibration apparatus of claim 1, further comprising: the sliding rail mounting platform and the diffuse reflection plate mounting bracket;
The sliding rail mounting platform is used for fixing the first sliding rail and the second sliding rail; the diffuse reflection plate mounting bracket is used for fixing the diffuse reflection plate.
6. The illuminance calibration apparatus according to any one of claims 1 to 5, further comprising: a closed housing;
the first sliding rail, the second sliding rail, the ultraviolet point light source, the first fixing device, the second fixing device and the diffuse reflection plate are all arranged in the closed shell.
7. A radiation illuminance calibration method based on the radiation illuminance calibration device according to any one of claims 1 to 6, comprising:
acquiring first target radiation illuminance;
controlling at least one of the position of the first fixing device on the first sliding rail, the position of the second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail based on the first target illuminance and the first target mapping relation;
calibrating the radiation illuminance of the illuminated surface of the object to be calibrated as the first target radiation illuminance;
the first target mapping relationship is used for describing the corresponding relationship of the radiation illuminance of the illuminated surface, the distance between the center point of the illuminated surface and the center point of the diffuse reflection plate, the distance between the ultraviolet point light source and the center point of the diffuse reflection plate and the included angle between the first sliding rail and the second sliding rail.
8. A sensitivity test apparatus, comprising: a radiant illuminance calibration apparatus according to any one of claims 1 to 6, and a processor; the processor is respectively connected with the ultraviolet imager to be detected and a controller in the radiation illuminance calibration device in a communication way;
under the condition that the ultraviolet imager to be tested is fixed on a second fixing device in the radiation illuminance calibration device, the processor is used for sending first target radiation illuminance to the controller so that the ultraviolet imager to be tested can measure a received optical signal under the condition that the controller finishes controlling at least one of the position of the first fixing device on the first sliding rail, the position of the second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail, and sending a measurement result to the processor;
the processor is also used for acquiring a sensitivity test result of the ultraviolet imager to be tested based on the measurement result under the condition that the measurement result is received.
9. The sensitivity test apparatus according to claim 8, wherein the radiation illuminance calibration device includes a third fixing device and a fourth fixing device to which a diaphragm is fixed, and the processor is further configured to send a second target radiation illuminance to the controller, so that the ultraviolet imager to be measured measures the received optical signal when the controller completes the control of the position of the fourth fixing device on the first slide rail, and send the measurement result to the processor.
10. A sensitivity test method, implemented based on the sensitivity test apparatus according to claim 8 or 9, comprising:
acquiring first target radiation illuminance;
the first target radiation illuminance is sent to a controller in a radiation illuminance calibration device, so that the controller controls at least one of the position of the first fixing device on the first sliding rail, the position of the second fixing device on the second sliding rail and the included angle between the first sliding rail and the second sliding rail based on the first target radiation illuminance and the first target mapping relation;
receiving a measurement result sent by an ultraviolet imager to be measured;
acquiring a sensitivity test result of the ultraviolet imager to be tested based on the measurement result and the first target radiation illuminance;
and the measurement result is obtained by measuring the received optical signal by the ultraviolet imager to be measured under the condition that the controller finishes the control.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117387758A (en) * | 2023-12-13 | 2024-01-12 | 中国科学院合肥物质科学研究院 | System and method for calibrating lunar micro-light radiation simulated by standard reference plate |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06317463A (en) * | 1993-05-06 | 1994-11-15 | Matsushita Electric Ind Co Ltd | Radiation luminance measuring equipment |
| CN101451884A (en) * | 2007-12-04 | 2009-06-10 | 北京卫星环境工程研究所 | Indirect measurement method for extreme-ultraviolet source irradiance for simulating space environment |
| CN102486404A (en) * | 2010-12-06 | 2012-06-06 | 中国科学院西安光学精密机械研究所 | Ultraviolet low-light star equal simulation and star equal calibration system |
| CN103968858A (en) * | 2014-04-30 | 2014-08-06 | 中国科学院长春光学精密机械与物理研究所 | Geometric calibration device for ultraviolet imager with extra large field-of-view |
| CN104280670A (en) * | 2014-09-26 | 2015-01-14 | 北京环境特性研究所 | Corona detection method based on solar-blind ultraviolet imager |
| CN104374474A (en) * | 2014-10-11 | 2015-02-25 | 北京振兴计量测试研究所 | High-precision ultraviolet spectral irradiance measuring system |
| CN107677370A (en) * | 2017-09-29 | 2018-02-09 | 中国科学院长春光学精密机械与物理研究所 | The polarized radiation calibration system and method for a kind of channel-style polarization spectrum imaging instrument |
| CN111323121A (en) * | 2020-03-10 | 2020-06-23 | 中国科学院国家空间科学中心 | Ultraviolet spectrum remote sensing instrument wide-range linearity testing device and method |
| CN214702519U (en) * | 2021-05-26 | 2021-11-12 | 中国人民解放军63636部队 | Infrared radiation external field calibration device |
-
2023
- 2023-04-20 CN CN202310426893.5A patent/CN116147764B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06317463A (en) * | 1993-05-06 | 1994-11-15 | Matsushita Electric Ind Co Ltd | Radiation luminance measuring equipment |
| CN101451884A (en) * | 2007-12-04 | 2009-06-10 | 北京卫星环境工程研究所 | Indirect measurement method for extreme-ultraviolet source irradiance for simulating space environment |
| CN102486404A (en) * | 2010-12-06 | 2012-06-06 | 中国科学院西安光学精密机械研究所 | Ultraviolet low-light star equal simulation and star equal calibration system |
| CN103968858A (en) * | 2014-04-30 | 2014-08-06 | 中国科学院长春光学精密机械与物理研究所 | Geometric calibration device for ultraviolet imager with extra large field-of-view |
| CN104280670A (en) * | 2014-09-26 | 2015-01-14 | 北京环境特性研究所 | Corona detection method based on solar-blind ultraviolet imager |
| CN104374474A (en) * | 2014-10-11 | 2015-02-25 | 北京振兴计量测试研究所 | High-precision ultraviolet spectral irradiance measuring system |
| CN107677370A (en) * | 2017-09-29 | 2018-02-09 | 中国科学院长春光学精密机械与物理研究所 | The polarized radiation calibration system and method for a kind of channel-style polarization spectrum imaging instrument |
| CN111323121A (en) * | 2020-03-10 | 2020-06-23 | 中国科学院国家空间科学中心 | Ultraviolet spectrum remote sensing instrument wide-range linearity testing device and method |
| CN214702519U (en) * | 2021-05-26 | 2021-11-12 | 中国人民解放军63636部队 | Infrared radiation external field calibration device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117387758A (en) * | 2023-12-13 | 2024-01-12 | 中国科学院合肥物质科学研究院 | System and method for calibrating lunar micro-light radiation simulated by standard reference plate |
| CN117387758B (en) * | 2023-12-13 | 2024-03-12 | 中国科学院合肥物质科学研究院 | System and method for calibrating lunar micro-light radiation simulated by standard reference plate |
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