CN116134989A - 一种存储器及电子设备 - Google Patents
一种存储器及电子设备 Download PDFInfo
- Publication number
- CN116134989A CN116134989A CN202080104784.6A CN202080104784A CN116134989A CN 116134989 A CN116134989 A CN 116134989A CN 202080104784 A CN202080104784 A CN 202080104784A CN 116134989 A CN116134989 A CN 116134989A
- Authority
- CN
- China
- Prior art keywords
- layer
- memory
- magnetic structure
- free layer
- mtj
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1659—Cell access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1653—Address circuits or decoders
- G11C11/1655—Bit-line or column circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3286—Spin-exchange coupled multilayers having at least one layer with perpendicular magnetic anisotropy
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
- H10B61/20—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
- H10B61/20—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors
- H10B61/22—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors of the field-effect transistor [FET] type
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Magnetic active materials
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Power Engineering (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Hall/Mr Elements (AREA)
Abstract
本申请实施例提供一种存储器及电子设备,涉及存储器技术领域,可以解决MTJ中自由层翻转需要的电流大的问题。该存储器包括设置于所述存储器的存储区域内阵列分布的多个存储单元以及位线,所述存储单元包括晶体管以及与所述晶体管连接的磁隧道结MTJ元件;所述MTJ元件设置于所述晶体管的源极或者漏极与所述位线之间的电流传输路径上;所述MTJ元件包括依次层叠设置的钉扎层、参考层、隧穿层和自由层;所述钉扎层的磁化方向平行于所述MTJ中各层的堆叠方向;所述存储器还包括设置于所述电流传输路径上,且与所述MTJ元件接触的第一磁性结构;其中,所述第一磁性结构的磁化方向与所述钉扎层的磁化方向的夹角为(90°,180°]。
Description
PCT国内申请,说明书已公开。
Claims (16)
- PCT国内申请,权利要求书已公开。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2020/132884 WO2022110187A1 (zh) | 2020-11-30 | 2020-11-30 | 一种存储器及电子设备 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN116134989A true CN116134989A (zh) | 2023-05-16 |
Family
ID=81753902
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202080104784.6A Pending CN116134989A (zh) | 2020-11-30 | 2020-11-30 | 一种存储器及电子设备 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20230298648A1 (zh) |
EP (1) | EP4239636A4 (zh) |
CN (1) | CN116134989A (zh) |
WO (1) | WO2022110187A1 (zh) |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9082951B2 (en) * | 2011-02-16 | 2015-07-14 | Avalanche Technology, Inc. | Magnetic random access memory with perpendicular enhancement layer |
US9871190B2 (en) * | 2014-04-28 | 2018-01-16 | Avalanche Technology, Inc. | Magnetic random access memory with ultrathin reference layer |
KR20160004744A (ko) * | 2014-07-04 | 2016-01-13 | 에스케이하이닉스 주식회사 | 반도체 메모리를 포함하는 전자 장치 |
SG11201700861XA (en) * | 2014-09-25 | 2017-03-30 | Agency Science Tech & Res | Magnetic element and method of fabrication thereof |
KR20160122916A (ko) * | 2015-04-14 | 2016-10-25 | 에스케이하이닉스 주식회사 | 전자 장치 및 그 제조 방법 |
KR20170047683A (ko) * | 2015-10-23 | 2017-05-08 | 에스케이하이닉스 주식회사 | 전자 장치 및 그 제조 방법 |
EP3460811B1 (en) * | 2017-09-20 | 2020-06-17 | IMEC vzw | Magnetic layer structure for magnetic tunnel junction device |
US10726892B2 (en) * | 2018-12-06 | 2020-07-28 | Sandisk Technologies Llc | Metallic magnetic memory devices for cryogenic operation and methods of operating the same |
-
2020
- 2020-11-30 WO PCT/CN2020/132884 patent/WO2022110187A1/zh unknown
- 2020-11-30 CN CN202080104784.6A patent/CN116134989A/zh active Pending
- 2020-11-30 EP EP20963075.5A patent/EP4239636A4/en active Pending
-
2023
- 2023-05-25 US US18/323,702 patent/US20230298648A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
EP4239636A4 (en) | 2024-01-10 |
US20230298648A1 (en) | 2023-09-21 |
EP4239636A1 (en) | 2023-09-06 |
WO2022110187A1 (zh) | 2022-06-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR102353406B1 (ko) | 스핀 궤도 토크를 이용하여 강화된 감쇠 프로그램 및 경사진 자화 용이축을 갖는 자기 접합부를 포함하는 자기 소자 | |
US8416620B2 (en) | Magnetic stack having assist layer | |
US7307876B2 (en) | High speed low power annular magnetic devices based on current induced spin-momentum transfer | |
US8884389B2 (en) | Magnetoresistive element and method of manufacturing the same | |
US6909633B2 (en) | MRAM architecture with a flux closed data storage layer | |
EP1653475B1 (en) | Multi-bit magnetic random access memory device and method for writing the same | |
JP2008522415A (ja) | 電力低減型磁気抵抗ランダム・アクセス・メモリ素子 | |
US20220149269A1 (en) | Spintronics element and magnetic memory device | |
US20230065198A1 (en) | Differentially programmable magnetic tunnel junction device and system including same | |
US6929960B2 (en) | Reducing the effects of neel coupling in MRAM structures | |
US11631804B2 (en) | Magnetoresistive effect element and magnetic memory | |
US10269400B2 (en) | Tilted synthetic antiferromagnet polarizer/reference layer for STT-MRAM bits | |
TWI833221B (zh) | 磁性記憶體裝置 | |
WO2022110187A1 (zh) | 一种存储器及电子设备 | |
US20200411752A1 (en) | Methods of manufacture precessional spin current magnetic tunnel junction devices | |
WO2022110212A1 (zh) | 一种存储器及电子设备 | |
US20070195593A1 (en) | Structure of magnetic memory cell and magnetic memory device | |
WO2022077499A1 (zh) | 一种存储器及电子设备 | |
WO2023207700A1 (zh) | 存储器及电子设备 | |
CN117202667A (zh) | 存储器及其制造方法和电子设备 | |
WO2021140934A1 (ja) | 磁性積層膜、磁気メモリ素子、磁気メモリ及び人工知能システム | |
US6657890B1 (en) | Magnetic memory device | |
CN117580440A (zh) | 基于自旋霍尔效应材料的磁随机存储器及电子设备 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |