CN116124335A - Device and method for detecting internal stress direction of organic glass - Google Patents
Device and method for detecting internal stress direction of organic glass Download PDFInfo
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- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
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- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
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Abstract
The invention relates to an organic glass internal stress direction detection device and method, belongs to the technical field of internal stress detection, and solves the problem of nondestructive detection of internal stress directions in the prior art. The device comprises an incidence device and a receiving device which are arranged on two sides of the organic glass to be tested; the method comprises the steps of adjusting dials of a first polaroid mirror bracket, a wave plate mirror bracket and a second polaroid mirror bracket in an incidence device and a receiving device, and obtaining a possible direction of internal stress of the organic glass to be detected when the integral spectrum curve amplitude of spectrum data collected by a spectrometer is minimum; wherein the possible directions comprise parallel or perpendicular to the slow axis direction of the wave plate; the wave plate frame dial is kept unchanged, the polarizer dial and the analyzer dial are synchronously rotated, and the result of the wave plate optical path difference and the organic glass optical path difference to be measured is recorded to determine the direction of stress in the final organic glass. And the nondestructive detection of the internal stress direction of the organic glass is realized.
Description
Technical Field
The invention relates to the technical field of internal stress detection, in particular to a device and a method for detecting the internal stress direction of organic glass.
Background
Among the factors affecting the quality of the material and the structural life, the stress factor plays a critical role. The internal stress of a material refers to the stress which is still present in the material and remains self-balanced after the external effect is eliminated, and is also called residual stress. Internal stresses in materials are generally classified by source into thermal, structural and mechanical stresses that can cause the material to warp or distort, cracking, and even failure of the material. The detection of the internal stress of the material can reflect the state and potential problems of the material, so that the method has very important research and application significance.
The internal stress detection mainly comprises two aspects of internal stress level and internal stress direction. The level of internal stress generally refers to the magnitude of the internal stress, i.e., the magnitude of the internal stress. The structural safety and the service life of the material in the presence of the internal stress can be analyzed and predicted by measuring and calculating the internal stress level of the material and comparing the internal stress level with the mechanical parameters of the material; the direction of internal stress is another important aspect, and in many cases, the direction of internal stress is worth noting and knowing. Through accurate detection of the internal stress direction, the method can help judge the relationship between the internal stress and a specific structure of the material, can help predict the further development and the influence range of the internal stress of the material, and provides basis and reference for taking effective countermeasure. At present, the internal stress detection at home and abroad is limited to the detection of the internal stress level.
The accurate detection of the internal stress direction is full of difficulty and challenge, and an ideal detection mode is to adopt a nondestructive detection method for the material to be detected, namely the normal use of the material is not affected after the internal stress direction detection is completed, and the damage of the structure of the material to be detected is not caused. In the application fields related to transparent materials such as aerospace porthole glass, diving ware porthole glass, organic glass large-scale structures, electronic product screens and the like, the nondestructive detection of the internal stress direction is strongly required.
Disclosure of Invention
In view of the above analysis, the embodiments of the present invention aim to provide a device and a method for detecting the direction of internal stress of organic glass, which are used for solving the problems of limited prior art, low measurement precision and nondestructive detection.
In one aspect, the embodiment of the invention provides an organic glass internal stress direction detection device, which comprises an incidence device and a receiving device which are arranged on two sides of organic glass to be detected;
the incident device comprises an incident light component and a first polaroid lens frame with a polarizer; parallel light emitted by the incident light component is incident to the organic glass to be tested through the polarizer;
the receiving device sequentially comprises a wave plate frame with a wave plate, a second polaroid frame with an analyzer, a receiving light assembly and a spectrometer along the direction far away from the organic glass to be detected;
The first polaroid mirror bracket, the wave plate mirror bracket and the second polaroid mirror bracket are provided with dials; and adjusting the scale values of each scale, and obtaining the internal stress direction of the organic glass to be detected based on the scale values of each scale and the spectrum data correspondingly collected by the spectrometer.
Optionally, the incident light assembly includes:
the device comprises a light source, a first optical fiber, a collimating lens, a first adapter plate and a first connecting rod; light rays emitted by the light source are transmitted to the collimating lens through the first optical fiber; the collimating lens converts the received light into parallel light;
the first adapter plate is used for fixing the collimating lens;
the two ends of the first connecting rod are respectively connected with the first adapter plate and the first polaroid lens frame and are used for supporting the first adapter plate and the first polaroid lens frame.
Optionally, the incident device further comprises a first connecting rod supporting leg and a first supporting leg fixing piece;
the first connecting rod supporting leg is used for supporting the first connecting rod;
one end of the first support leg fixing piece is fixed on the optical platform, and the other end of the first support leg fixing piece is used for fixing the first connecting rod support leg.
Optionally, the light receiving component includes: the second adapter plate, the second connecting rod and the second optical fiber;
the wave plate frame, the second polaroid frame and the second adapter plate are sequentially connected through a second connecting rod;
The second adapter plate is internally provided with an adapter structure device, and the adapter structure device is used for being connected with a second optical fiber;
the second optical fiber is used for transmitting the light output from the switching structure to the spectrometer.
Optionally, the receiving device further comprises a second connecting rod leg and a second leg fixing piece;
the second connecting rod supporting leg is connected with the second connecting rod and used for supporting the second connecting rod;
one end of the second supporting leg fixing piece is fixed on the optical platform, and the other end of the second supporting leg fixing piece is used for fixing the second connecting rod supporting leg.
The embodiment of the invention also comprises a method for detecting the internal stress direction of the organic glass, which specifically comprises the following steps:
parallel light emitted by the incident light component is incident to the organic glass to be tested through the polarizer;
the parallel light emitted by the organic glass to be tested enters a spectrometer through a wave plate, an analyzer and a light receiving component; the polarizer, the wave plate and the analyzer are respectively arranged in the first polaroid mirror bracket, the wave plate mirror bracket and the second polaroid mirror bracket with the dial;
and adjusting the scale values of each scale, and obtaining the internal stress direction of the organic glass to be tested based on the scale values of each scale and the spectrum data correspondingly collected by the spectrometer.
Optionally, adjusting each scale value of the scale, and obtaining the internal stress direction of the organic glass to be measured based on each scale value of the scale and the spectrum data collected by the spectrometer, including:
Adjusting dials of the first polaroid lens frame, the wave plate lens frame and the second polaroid lens frame, and obtaining a possible direction of internal stress of the organic glass to be detected when the integral spectrum curve amplitude of spectrum data acquired by the spectrometer is minimum; wherein the possible directions comprise parallel or perpendicular to the slow axis direction of the wave plate;
the wave plate frame dial is kept unchanged, the polarizer dial and the analyzer dial are synchronously rotated, and the superposition result of the wave plate optical path difference and the organic glass optical path difference to be measured is recorded, so that the direction of stress in the organic glass is finally determined.
Optionally, the adjusting the dials of the first polarizer frame, the wave plate frame, and the second polarizer frame, when the spectrum data collected by the spectrometer has the smallest overall spectrum curve amplitude, obtains a possible direction of the internal stress of the organic glass to be measured, includes:
and respectively adjusting the scale values of the polarizer, the wave plate and the analyzer dial, keeping the sum of the scale values of the polarizer and the wave plate dial to be 360 degrees, keeping the sum of the scale values of the polarizer and the analyzer dial to be 90 degrees, recording the spectrum data on the spectrometer, and obtaining the possible direction of the internal stress of the organic glass to be measured to be parallel or perpendicular to the slow axis direction of the wave plate when the acquired spectrum data curve amplitude is minimum.
Optionally, the internal stress of the organic glass to be tested corresponds to compressive stress or tensile stress.
Optionally, the maintaining the wave plate frame dial unchanged, synchronously rotating the polarizer dial and the analyzer dial, and recording a superposition result of the wave plate optical path difference and the organic glass optical path difference to be measured, thereby finally determining a stress direction in the organic glass, including:
the position of the wave plate scale value at the current moment is kept unchanged, the polarizer dial and the analyzer dial are synchronously rotated, spectrum data on a spectrometer are recorded, and the spectrum data are the superposition result of the wave plate optical path difference and the optical path difference of the organic glass to be measured; the superposition result is that the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the sum of the optical path difference of the wave plate and the optical path difference of the organic glass sample to be tested or the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the optical path difference of the wave plate and the optical path difference of the organic glass sample to be tested;
finally determining the internal stress direction of the organic glass to be measured according to the superposition result of the obtained wave plate optical path difference and the optical path difference of the organic glass to be measured; when the superposition result is that the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the sum of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be tested, if the internal stress of the organic glass is compressive stress, the direction of the compressive stress is parallel to the direction of the slow axis of the wave plate; if the existing internal stress is tensile stress, the tensile stress direction is perpendicular to the slow axis direction of the wave plate;
When the optical path difference value of the wave plate and the organic glass to be measured is equal to the absolute value of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be measured, if the internal stress of the organic glass is compressive stress, the direction of the compressive stress is vertical to the slow axis direction of the wave plate; if the existing internal stress is tensile stress, the direction of the tensile stress is parallel to the slow axis direction of the wave plate.
Compared with the prior art, the invention has at least one of the following beneficial effects:
1. the incident device and the receiving device are arranged on two sides of the organic glass to be detected, the wave plate frame with the wave plate is arranged at the receiving device, and the direction of the slow axis of the wave plate is known, so that the direction of the internal stress of the organic glass to be detected is determined, and the detection of the direction of the internal stress is realized.
2. And respectively adjusting the scale values of the polarizer, the wave plate and the analyzer dial, keeping the sum of the scale values of the polarizer and the wave plate to be 360 degrees, keeping the sum of the scale values of the polarizer and the analyzer dial to be 90 degrees, recording the spectrum data on the spectrometer, obtaining the possible direction of the internal stress of the organic glass to be measured to be parallel or perpendicular to the slow axis direction of the wave plate when the amplitude of the acquired spectrum data curve is minimum, and finally determining the internal stress direction of the organic glass to be measured through the superposition result of the optical path difference of the wave plate and the optical path difference of the organic glass to be measured.
The position of the wave plate scale value at the current moment is kept unchanged, the polarizer dial and the analyzer dial are synchronously rotated, spectrum data on a spectrometer are recorded, and the spectrum data are the superposition result of the wave plate optical path difference and the optical path difference of the organic glass to be measured; when the superposition result is that the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the sum of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be tested, the compressive stress direction is parallel to the slow axis direction of the wave plate, and the tensile stress direction is perpendicular to the slow axis direction of the wave plate; when the optical path difference value of the wave plate and the organic glass to be measured is equal to the absolute value of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be measured, the compressive stress direction is perpendicular to the slow axis direction of the wave plate, and the tensile stress direction is parallel to the fast axis direction of the wave plate. Thereby achieving nondestructive detection of the internal stress direction.
In the invention, the technical schemes can be mutually combined to realize more preferable combination schemes. Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention may be realized and attained by the structure particularly pointed out in the written description and drawings.
Drawings
The drawings are only for purposes of illustrating particular embodiments and are not to be construed as limiting the invention, like reference numerals being used to refer to like parts throughout the several views.
FIG. 1 shows an internal stress direction detection device for organic glass in an embodiment of the invention;
FIG. 2 is a flow chart of an apparatus and method for detecting stress direction in organic glass according to an embodiment of the present invention;
FIG. 3 is a view of a polarizer frame with dials in an embodiment of the present invention;
FIG. 4 is a schematic diagram of an embodiment of the present invention in which the transparent material photoelastically generates interference light;
FIG. 5 is a graph of components of light vectors in the experimental light path in the direction of each device in an embodiment of the present invention;
FIG. 6 is a schematic diagram of the direction of the fast and slow axes of a wave plate according to an embodiment of the present invention;
FIG. 7 is a schematic diagram of the internal stress direction of the organic glass sample to be tested according to the present invention.
Reference numerals:
1-a light source; 2-a first optical fiber; 3-a collimating lens; 4-a first adapter plate; 5-a first connection; 6-a first polarizer frame; 7-a first connecting rod supporting leg 8-a first supporting leg fixing piece; 9-an organic glass sample to be tested; 10-sample fixing tool; 11-an optical platform; 12-a wave plate holder; 13-a second polarizer frame; 14-a second adapter plate; 15-a second leg mount; 16-a second connecting rod leg; 17-a second optical fiber; 18-spectrometer.
Detailed Description
Preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, which form a part hereof, and together with the description serve to explain the principles of the invention, and are not intended to limit the scope of the invention.
The internal stress detection device and the internal stress detection principle of the material to be detected in the method provided by the invention are now described:
in the embodiment of the invention, a spectrum measurement method is adopted to detect the direction of the internal stress.
Specifically, when internal stress exists in the transparent material, the transparent material is converted from an isotropic material to an anisotropic material, and birefringence occurs when light passes through the transparent material with internal stress. According to the Virtem's law of stress optics, the stress (sigma) in two mutually perpendicular principal stress directions (x, y) of a transparent material x 、σ y ) The relationship between the difference and the refractive index can be expressed as:
n x -n y ＝C(σ x -σ y ) (1)
in the above, n x 、n y Respectively representing refractive indexes in x and y directions; sigma (sigma) x 、σ y The stress in the x and y main stress directions is represented; c represents the stress optical coefficient of the transparent material, which is a physical property constant and is related only to the type of the transparent material.
When light passes through a transparent material (anisotropic material) having a thickness d, the relationship between the optical path difference δ and the refractive index is:
δ＝d(n x -n y ) (2)
The relation between the residual stress and the optical path difference of the transparent material can be obtained according to the formulas (1) and (2):
from the above equation, the difference between the optical path lengths of the transparent material in the two principal stress directions is determined, so that the difference between the stress of the transparent material in the two principal stress directions can be obtained. If the stress value in one of the principal stress directions is close to zero or negligible, then the relationship between internal stress and optical path difference in this case can be expressed as:
an experimental light path diagram for generating interference light to photoelastic of a transparent material in the embodiment of the present invention is shown in fig. 3.
In fig. 5, the polarization direction of the polarizer is perpendicular to the polarization direction of the analyzer, and the rectangular solid in the middle represents the transparent material specimen. The interface of the incident light of the transparent material is perpendicular to the propagation direction of the linearly polarized light passing through the polarizer, and the main stress direction in the transparent material is parallel to the interface of the incident light of the transparent material. The method of calculating internal stress of the birefringent transparent material by this method is called photoelastic method. Looking in the direction of light propagation in the optical path, and making component diagrams of the light vector in various directions, as shown in fig. 4.
In fig. 4, the polarization directions of the polarizer and the analyzer are perpendicular to each other, and the two principal stress directions (x, y) in the transparent material are also perpendicular to each other. An included angle between the polarization direction of the polarizer and a principal stress direction in the transparent material is set to be theta. The light passes through the polarizer to form linearly polarized light with the amplitude of a, and the linearly polarized light generated by the polarizer generates a double refraction phenomenon when passing through the transparent material, and the vibration directions of ordinary light and extraordinary light generated by double refraction are respectively parallel to the two main stress directions. The amplitude of the component light vectors of the linearly polarized light in the two principal stress directions is respectively:
The amplitudes of the two light vectors are the amplitudes of the ordinary light and the extraordinary light in the transparent material. After light passes through the transparent material, ordinary light and extraordinary light can generate certain optical path difference, and the optical path difference is delta. When passing through the analyzer, only the light vector components parallel to the analyzer can pass through the analyzer, so that the light vector components in the two principal stress directions are subdivided once and decomposed in the polarization direction of the analyzer and in the direction perpendicular to the analyzer. From the geometrical relationship, the components of the light passing through the analyzer in two orthogonal directions of the analyzer are:
the two light vector components in the polarization direction of the analyzer are the same in vibration direction and have the phase difference of
So that the combined vector amplitude of the two light vector components satisfies:
simplifying the above expression can obtain the square value of the amplitude of the light passing through the analyzer. Because the light intensity i=a 2 The intensity value after passing through the analyzer can be expressed as:
in the experiment, for the convenience of analysis, the included angle theta between the polarizer and the main stress is set to be 45 degrees, so that the above method can be simplified into:
in the actual measurement process, the light intensity values of the wavelengths of the light source are not equal, namely alpha is not a constant, but the quantity related to the wavelength determined by the light source is directly fitted to the light data by using the formula (9), so that a larger error is generated, and the formula (9) is converted to obtain:
In a (lambda) 2 The spectrum corresponding to the light intensity of the light source is shown. For further more accurate measurement and study, the spectrum corresponding to the background light intensity of the natural light environment is also collected before the test and is marked as I BG . Considering the effect of natural light environment background light intensity on the experimental process, equation (10) may be further expressed as:
in the light path design, the included angle theta between the polarizer and the principal stress is set to be 45 DEG, but a certain deviation can exist in the actual adjustment of the angle, so sin in the formula (8) 2 The (2 theta) value may not be equal to 1, and sin is also required in data fitting 2 The (2 theta) value is considered as a fitting parameter. Equation (11) can then be further expressed as:
it is worth pointing out that in the actual testing process of the optical path difference superposition of the wave plate and the organic glass material to be tested, the polarizer adopts a plurality of polarization angles to collect and count data so as to obtain a more accurate measuring junctionAnd (5) fruits. The 45 ° in the above description is just one of several polarization angles. Thus, sin in equation (12) 2 (2 theta) incorporation is also necessary and reasonable.
The test quantities related in the formula (12) are all collected in a spectrum form, which represents a spectrum measurement method adopted by the patent and is an important means in the actual measurement process.
According to the principle, the invention discloses a device for detecting the internal stress direction of organic glass. As shown in fig. 1, the device comprises an incidence device and a receiving device which are arranged at two sides of the organic glass to be tested;
the incident device comprises an incident light component and a first polaroid lens frame with a polarizer; parallel light emitted by the incident light component is incident to the organic glass to be tested through the polarizer;
the receiving device sequentially comprises a wave plate frame with a wave plate, a second polaroid frame with an analyzer, a receiving light assembly and a spectrometer along the direction far away from the organic glass to be detected;
the first polaroid mirror bracket, the wave plate mirror bracket and the second polaroid mirror bracket are provided with dials; and adjusting the scale values of each scale, and obtaining the internal stress direction of the organic glass to be tested based on the scale values of each scale and the spectrum data correspondingly collected by the spectrometer.
The incident light assembly includes:
the device comprises a light source, a first optical fiber, a collimating lens, a first adapter plate and a first connecting rod; light rays emitted by the light source are transmitted to the collimating lens through the first optical fiber; the collimating lens converts the received light into parallel light;
the first adapter plate is used for fixing the collimating lens; a clamping opening is formed in the middle of the first adapter plate, and the collimating lens is screwed into the clamping ring in the middle of the first adapter plate to be fixed;
The two ends of the first connecting rod are respectively connected with the first adapter plate and the first polaroid lens frame and are used for supporting the first adapter plate and the first polaroid lens frame.
The incidence device further comprises a first connecting rod supporting leg and a first supporting leg fixing piece;
the first connecting rod supporting leg is used for supporting the first connecting rod;
one end of the first support leg fixing piece is fixed on the optical platform, and the other end of the first support leg fixing piece is used for fixing the first connecting rod support leg.
In a receiving apparatus, the receiving optical assembly includes: the second adapter plate, the second connecting rod and the second optical fiber;
the wave plate frame, the second polaroid frame and the second adapter plate are sequentially connected through a second connecting rod;
the second adapter plate is internally provided with an adapter structure device, and the adapter structure device is used for being connected with a second optical fiber; specifically, a PLA plastic fuse wire is adopted, a 3D printing technology is adopted to obtain a transition structural member which is used for transmitting the parallel light received by the receiving device to the second optical fiber, and the transition structural member is similar to a funnel in form. One wider end of the transition structural member is inserted into the middle through hole of the second adapter plate, and the sizes of the transition structural members are matched; the other end of the narrow transition structural member can be used for inserting the optical fiber of the spectrometer and is matched in size, so that the second adapter plate is connected with the optical fiber of the spectrometer.
The second optical fiber is used for transmitting the light output from the switching structure to the spectrometer.
The receiving device further comprises a second connecting rod supporting leg and a second supporting leg fixing piece;
the second connecting rod supporting leg is connected with the second connecting rod and used for supporting the second connecting rod;
one end of the second supporting leg fixing piece is fixed on the optical platform, and the other end of the second supporting leg fixing piece is used for fixing the second connecting rod supporting leg.
Preferably, in practical measurement, a halogen tungsten lamp light source is adopted, and for measurement, the working wavelength is 420-680 nm. The core diameter of the optical fiber connected with the light source is 1 mm. One end of the collimating lens is connected with the tail end of the optical fiber, and the other end of the collimating lens is fixed on the adapter plate and has the function of generating parallel light. The first polaroid mirror bracket and the second polaroid mirror bracket with the dial are adopted in measurement, and the dial can rotate; by the dial reading, the polarization direction of the polaroid can be accurately controlled. For the incident end in the incident device, the polaroid (polarizer) is arranged in the first polaroid mirror bracket, and when the polarization direction of the polarizer is aligned with 0 degree of the dial, the polarizer is screwed into the snap ring in the middle of the first adapter plate to fix, so that the polarization direction of the polarizer is always aligned with 0 degree of the dial during the rotation operation of the dial. Under this condition, when the dial is rotated to any angle, for example, the dial reads 60 degrees at a certain time, it can be known that the polarization direction of the current polarizer forms an included angle of 60 degrees with the identification line of the dial. In addition, the transmission method is adopted on the test light path for detection.
Preferably, the wave plates can be classified into quarter wave plates, half wave plates, and full wave plates by kind. The quarter wave plate is used in practical test, and is made of quartz crystal, and belongs to positive crystal. The quarter wave plate made of positive crystals has the following characteristics: the Fast axis (Fast) of the positive crystal wave plate is parallel to the vibration direction of the ordinary light (o light) when double refraction occurs; and a Slow axis (Slow) perpendicular to the fast axis direction of the positive crystal waveplate is parallel to the vibration direction of the extraordinary ray (e-ray) when birefringence occurs. When the quarter wave plate leaves the factory, the quarter wave plate can be installed in a metal cutting sleeve, and the cutting sleeve shell can mark the Fast axis direction (Fast) to indicate the Fast axis direction of the quarter wave plate. When the quarter wave plate is installed, the fast axis direction of the quarter wave plate is always aligned with the dial by 90 degrees; the direction perpendicular to the fast axis direction is the slow axis direction of the wave plate, namely the slow axis direction of the wave plate can be always aligned with the dial by 0 degrees when the wave plate is arranged. In the embodiment of the invention, the relation between the internal stress direction of the organic glass to be detected and the slow axis direction of the wave plate is explored.
The receiving end of the internal stress direction detection device receiving device is provided with a quarter wave plate in a wave plate frame with a dial, and after the fast axis direction of the wave plate is aligned with 90 degrees of the dial, the wave plate is screwed into a snap ring for fixation, so that the fast axis direction of the wave plate is always aligned with 90 degrees of the dial during the rotating operation of the dial; equivalently, the slow axis direction of the wave plate is always aligned with 0 degree of the dial. In addition, when the quarter wave plate leaves the factory, the optical path difference calibration value is also provided; and carrying out superposition test and analysis on the optical path difference of the quarter wave plate and the optical path difference of the organic glass sample to be tested, thereby judging the internal stress direction of the organic glass sample to be tested. The wavelength resolution of the spectrometer adopted in the actual measurement reaches 0.3nm, and the spectrometer has excellent testing performance.
In the test process, a standard optical platform is adopted, and the alignment of the light paths of the incident end and the receiving end can be realized by utilizing the positioning holes of the optical platform, so that the accuracy of the detection result is ensured.
In order to keep the organic glass sample stationary in the detection process, a sample fixing tool is designed and manufactured. And placing the organic glass sample in the fixture clamping groove, and screwing the screws on the side surfaces of the fixture until the sample is just propped against the sample, so that the sample can be kept still all the time in the internal stress direction detection process.
Preferably, the detection device is used for detecting the internal stress of the transparent material to be detected, as shown in fig. 2, and mainly comprises the following steps:
step S1: parallel light emitted by the incident light component is incident to the organic glass to be tested through the polarizer;
the parallel light emitted by the organic glass to be tested enters a spectrometer through a wave plate, an analyzer and a light receiving component; the polarizer, the wave plate and the analyzer are respectively arranged in the first polaroid lens frame, the wave plate lens frame and the second polaroid lens frame with the dial.
Specifically, the incidence device, the receiving device and the organic glass sample are assembled, and the internal stress direction detecting device is formed according to the above.
Specifically, the incidence device, the receiving device and the organic glass sample piece are installed and fixed according to the internal stress direction detection device of the organic glass to be detected.
Step S2: and adjusting the scale values of each scale, and obtaining the internal stress direction of the organic glass to be tested based on the scale values of each scale and the spectrum data correspondingly collected by the spectrometer.
Adjusting dials of the first polaroid lens frame, the wave plate lens frame and the second polaroid lens frame, and obtaining a possible direction of internal stress of the organic glass to be detected when the integral spectrum curve amplitude of spectrum data acquired by the spectrometer is minimum; wherein the possible directions include parallel or perpendicular to the slow axis direction of the wave plate.
Specifically, the scale value of the polarizer at the incidence end of the incidence device is set to 0 degrees, and the 0 degrees of the dial are aligned with the mark line of the glasses frame. Since the polarization direction of the polarizer is always aligned with 0 degree of the dial, the polarization direction of the polarizer is parallel to the mark line of the glasses frame at the initial moment.
And setting the scale value of the wave plate at the receiving end of the receiving device to be 0 degrees, wherein the slow axis direction of the wave plate is always aligned with the 0 degrees of the dial, so that the slow axis direction of the wave plate is parallel to the polarization direction of the polarizer at the incident end at the initial moment. Setting the scale value of the receiving end analyzer to 90 degrees; after completion, the polarization direction of the analyzer remains orthogonal to the polarization direction of the polarizer.
The light source is turned on, and parallel light is emitted after passing through the collimating lens, passes through the organic glass sample piece and enters the receiving end. The spectrometer is connected to a computer, spectrum acquisition software is started, exposure time is set (usually set to 20-50 ms), and the spectrum state in the software interface is observed in real time.
The scale value b of the wave plate at the receiving end and the scale value c of the analyzer are correspondingly and gradually lowered by gradually increasing the scale value a of the polarizer at the incident end from the low scale value; wherein a+b=360; a+c=90; and judging that the internal stress direction of the organic glass to be detected is parallel or perpendicular to the polarization direction of the polarizer until the integral spectrum curve acquired by the spectrometer reaches the minimum value.
Illustratively, the incident side polarizer scale value is set to 10 °, the receiving side wave plate scale value is set to 350 °, the receiving side analyzer scale value is set to 80 °, and the spectrum state (whether the overall spectrum curve amplitude is increased or the overall spectrum curve is decreased) in the acquisition software interface of the observation spectrometer is set. During this operation, the slow axis direction of the wave plate remains parallel to the polarization direction of the polarizer at all times, while the polarization direction of the analyzer remains orthogonal to the polarization direction of the polarizer at all times.
Setting the scale value of the polarizer at the incident end as 20 degrees, setting the scale value of the wave plate at the receiving end as 340 degrees, setting the scale value of the analyzer at the receiving end as 70 degrees, and observing the spectrum state (the whole spectrum curve amplitude is enhanced or the whole spectrum curve is weakened) in the acquisition software interface of the spectrometer. During this operation, the slow axis direction of the wave plate remains parallel to the polarization direction of the polarizer at all times, while the polarization direction of the analyzer remains orthogonal to the polarization direction of the polarizer at all times.
And similarly, setting the scale value of the polarizer at the incident end to 30 degrees, setting the scale value of the wave plate at the receiving end to 330 degrees, setting the scale value of the analyzer at the receiving end to 60 degrees, and observing the spectrum state (the whole spectrum curve amplitude is enhanced or the whole spectrum curve is weakened) in the acquisition software interface of the spectrometer. During this operation, the slow axis direction of the wave plate remains parallel to the polarization direction of the polarizer at all times, while the polarization direction of the analyzer remains orthogonal to the polarization direction of the polarizer at all times.
Specifically, when the scale value of the polarizer at the incident end is a certain value, such as 50 ° (310 ° corresponding to the scale value of the wave plate at the receiving end and 40 ° corresponding to the scale value of the analyzer at the receiving end), and the overall spectrum curve in the interface of the spectrometer acquisition software tends to be the minimum value (the overall spectrum curve tends to be straight line), then the internal stress direction of the organic glass to be measured is theoretically parallel to the slow axis direction of the wave plate or perpendicular to the slow axis direction of the wave plate, and the internal stress direction of the organic glass to be measured is one of the two conditions according to the formula (12)
Wherein I represents the intensity of light passing through the analyzer, I BG Is background light intensity under natural light environment, a (lambda) 2 The spectrum corresponding to the light intensity of the light source is shown, delta is the optical path difference, and lambda is the wavelength.
If the internal stress direction of the organic glass to be measured is parallel to the polarization direction (also the slow axis direction of the wave plate) of the polarizer, the corresponding value of theta is 0 degree; the right result of the equal sign of the formula (12) is 0, and the amplitude value of the integral spectrum curve in the corresponding spectrometer acquisition software interface tends to be the minimum value.
If the internal stress direction of the organic glass to be measured is perpendicular to the polarization direction of the polarizer (also the slow axis direction of the wave plate), the corresponding value of theta is 90 degrees; the right result of the equal sign of the formula (12) is 0, and the amplitude value of the integral spectrum curve in the spectrometer acquisition software interface also tends to be the minimum value.
Alternatively, the scale interval of the polarization direction of the polarizer is 10 °, and in the actual measurement process, the scale interval can be adjusted according to specific requirements, for example, the scale interval is adjusted to 5 °. Smaller scale value intervals are advantageous for improving the accuracy of the detection, but increase the detection time.
At this time, it can be determined that the internal stress direction of the organic glass to be measured is already locked in two most probable directions, and the two most probable directions are clear, which are parallel to the slow axis direction of the wave plate or perpendicular to the slow axis direction of the wave plate, and further testing and judging are required.
Step S3: the wave plate mirror bracket dial is kept unchanged, the polarizer dial and the analyzer dial are synchronously rotated, and the superposition result of the wave plate optical path difference and the organic glass optical path difference to be measured is recorded, so that the direction of stress in the organic glass is finally determined.
The position of the wave plate scale value at the current moment is kept unchanged, the polarizer dial and the analyzer dial are synchronously rotated, spectrum data on a spectrometer are recorded, and the spectrum data are the superposition result of the wave plate optical path difference and the optical path difference of the organic glass to be measured; the superposition result is that the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the sum value of the optical path difference of the wave plate and the optical path difference of the organic glass sample to be tested or the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the optical path difference value of the wave plate and the optical path difference of the organic glass sample to be tested;
in addition, the internal stress of the organic glass is one of compressive stress and tensile stress, and the internal stress of the organic glass to be detected is known to be specifically compressive stress or tensile stress in advance before the detection of the stress direction.
Finally determining the internal stress direction of the organic glass to be measured according to the superposition result of the obtained wave plate optical path difference and the optical path difference of the organic glass to be measured; when the superposition result is that the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the sum of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be tested, if the internal stress of the organic glass is compressive stress, the direction of the compressive stress is parallel to the direction of the slow axis of the wave plate; if the existing internal stress is tensile stress, the tensile stress direction is perpendicular to the slow axis direction of the wave plate.
When the optical path difference value of the wave plate and the organic glass to be measured is equal to the absolute value of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be measured, if the internal stress of the organic glass is compressive stress, the direction of the compressive stress is vertical to the slow axis direction of the wave plate; if the existing internal stress is tensile stress, the direction of the tensile stress is parallel to the slow axis direction of the wave plate.
The specific experimental process is as follows: the current scale value of the wave plate is kept unchanged, namely the wave plate dial is not rotated any more, only the incident end polarizer dial and the receiving end analyzer dial are synchronously rotated, and the polarization directions of the polarizer and the analyzer are always kept orthogonal. Illustratively, the current incident side polarizer has a scale value of 50 °, the receiving side wave plate has a scale value of 310 °, and the receiving side analyzer has a scale value of 40 °. The scale value of the polarizer at the incident end is set to be 60 degrees, the scale value of the wave plate at the receiving end is kept unchanged, the scale value of the analyzer at the receiving end is set to be 30 degrees, after the operation is finished, a spectrum data file in a spectrometer acquisition software interface is stored until the spectrum data file is under a specified path, the file name is set to be 60 degrees, and the spectrum data corresponding to the 60 degrees of the polarizer scale value is indicated.
Setting the scale value of the polarizer at the incident end to 70 degrees, keeping the scale value of the wave plate at the receiving end unchanged all the time, setting the scale value of the analyzer at the receiving end to 20 degrees, storing a spectrum data file in a spectrometer acquisition software interface to a specified path after the operation is finished, and enabling the file name to be 70 degrees, wherein the spectrum data is obtained when the scale value of the polarizer is 70 degrees.
Setting the scale value of the polarizer at the incident end to 80 degrees, keeping the scale value of the wave plate at the receiving end unchanged all the time, setting the scale value of the polarization analyzer at the receiving end to 10 degrees, storing a spectrum data file in a spectrum acquisition software interface until the spectrum data file is under a specified path after the operation is finished, and enabling the file name to be 80 degrees, wherein the spectrum data is obtained when the scale value of the polarizer is 80 degrees.
The spectral data obtained by the above operation corresponds to I in the numerator on the left of the equal sign of equation (12).
Similarly, a certain number of spectrum data files can be collected and stored according to specific requirements of experiments. More data files are advantageous for improving the accuracy of the detection, but increase the detection time.
The invention is further illustrated by the following specific examples:
example 1 acquisition of light intensity Spectrum a (lambda) of light source 2 Spectrum I corresponding to background light intensity of natural light environment BG Wherein the light intensity spectrum a (lambda) of the light source 2 The method is completed in two steps and specifically comprises the following steps:
setting the scale value of the polarizer at the incident end to 0 degrees, setting the scale value of the analyzer at the receiving end to 0 degrees, storing a spectrum data file in a spectrum acquisition software interface of a spectrometer to a specified path, and enabling the file name to be light 0; keeping the scale value of the polarizer at the incident end unchanged, setting the scale value of the analyzer at the receiving end to 90 degrees, storing a spectrum data file in a collection software interface of a spectrometer until the spectrum data file is under a specified path, and enabling the file name to be 'light 90', and making the light intensity spectrum a (lambda) 2 Can pass through light0-I BG AND light90-I BG The sum of "a" (lambda) is obtained 2 ＝(light0-I BG )+(light90-I BG )
Turning off the light source, storing the spectrum data file in the spectrometer acquisition software interface to the appointed path, and enabling the file name to be 'BG', wherein the spectrum I corresponding to the background light intensity of the natural light environment is correspondingly obtained BG . Obtain a definite I BG The form is also corresponding to the definite a (lambda) 2 Form of the invention. So far, the test data required by the internal stress direction of the organic glass to be tested is prepared completely, and the analysis link of the superposition of the optical path difference of the wave sheet and the optical path difference of the organic glass to be tested is entered.
The term "superposition" of the optical path difference of the wave plate and the optical path difference of the organic glass to be measured means I, a (lambda) obtained by the above test 2 And I BG Data file, calculating wave plate and to-be-measured deviceAnd comparing the total optical path difference of the organic glass sample with the optical path difference of a wave plate (the optical path difference of the wave plate is known and calibrated before delivery), and determining the internal stress direction of the organic glass to be detected by judging the relation between the internal stress direction of the organic glass to be detected and the slow axis direction of the wave plate (the internal stress direction is parallel to the slow axis direction of the wave plate or perpendicular to the slow axis direction of the wave plate). Finally determining the internal stress direction of the organic glass to be measured according to the superposition result of the obtained wave plate optical path difference and the organic glass optical path difference to be measured; when the superposition result is that the total optical path difference value is equal to the absolute value of the optical path difference sum value of the wave plate optical path difference and the organic glass sample to be tested, if the internal stress existing in the organic glass is compressive stress, the direction of the compressive stress is parallel to the slow axis direction of the wave plate; if the existing internal stress is tensile stress, the tensile stress direction is perpendicular to the slow axis direction of the wave plate;
When the total optical path difference value is equal to the absolute value of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be measured, if the internal stress existing in the organic glass is compressive stress, the direction of the compressive stress is vertical to the slow axis direction of the wave plate; if the existing internal stress is tensile stress, the direction of the tensile stress is parallel to the slow axis direction of the wave plate. The total optical path difference is the superposition result of the optical path difference of the wave plate and the optical path difference of the organic glass to be measured.
Preferably, the quarter wave plate selects a multi-stage quarter wave plate.
The multistage quarter wave plate optical path difference calibration value used in the practical test is 10565nm.
When the internal stress of the organic glass to be measured is compressive stress and the direction of the compressive stress is parallel to the slow axis direction of the wave plate, the total optical path difference value of the wave plate and the organic glass sample to be measured is equal to the absolute value of the sum value of the optical path differences of the wave plate and the organic glass sample to be measured; when the compressive stress direction of the organic glass to be measured is perpendicular to the slow axis direction of the wave plate, the total optical path difference value of the wave plate and the organic glass sample to be measured is equal to the absolute value of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be measured.
When the internal stress of the organic glass to be measured is tensile stress and the tensile stress direction is perpendicular to the slow axis direction of the wave plate, the total optical path difference value of the wave plate and the organic glass sample to be measured is equal to the absolute value of the sum value of the optical path differences of the wave plate and the organic glass sample to be measured; when the tensile stress direction of the organic glass to be measured is parallel to the slow axis direction of the wave plate, the total optical path difference value of the wave plate and the organic glass sample to be measured is equal to the absolute value of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be measured.
Example 2 as a verification of the method for detecting the direction of internal stress in organic glass, a laboratory test and analysis were performed on an organic glass sample (internal stress is compressive stress) having an optical path difference of 5754nm and a definite direction of internal stress according to the complete method and procedure described above. And calculating the total optical path difference of the wave plate and the organic glass sample to be measured by a numerical fitting method, and comparing the total optical path difference with the optical path difference of the wave plate so as to judge the internal stress direction of the organic glass sample to be measured. Because the organic glass sample with the internal stress being compressive stress and the direction of the compressive stress being definite is adopted in the test, the test can help to check whether the internal stress direction detection method in the patent is effective and correct. The method comprises the following steps:
1) When the stress (compressive stress) direction of the organic glass to be measured is parallel to the slow axis direction of the wave plate, as shown in fig. 6:
under the condition, the total optical path difference result of the wave plate and the organic glass sample piece to be measured obtained by numerical fitting calculation is 16319nm; and 16319= -10565 + 5754|, it shows that the internal stress (compressive stress) direction of the organic glass sample with optical path difference of 5754nm is parallel to the slow axis direction of the wave plate and also perpendicular to the fast axis direction of the wave plate. And observing a receiving end wave plate in the testing device, wherein the 0-degree direction on the wave plate dial is the internal stress direction of the organic glass sample to be tested.
2) When the stress (compressive stress) direction of the organic glass to be measured is perpendicular to the slow axis direction of the wave plate, as shown in fig. 6:
under the condition, the total optical path difference result of the wave plate and the organic glass sample piece to be measured obtained by numerical fitting calculation is 4811nm; 4811= -10565-5754|, which shows that the internal stress (compressive stress) direction of the organic glass sample with optical path difference of 5754nm is perpendicular to the slow axis direction of the wave plate and also parallel to the fast axis direction of the wave plate. By observing the receiving end wave plate in the testing device, the 90-degree direction on the wave plate dial is the internal stress direction of the organic glass sample to be tested, as shown in fig. 7.
The effectiveness and operability of the internal stress direction detection method in the patent are verified through the test and analysis of the two conditions, and the test and the analysis are proved; the method in the patent is universal for organic glass materials.
Those skilled in the art will appreciate that all or part of the flow of the methods of the embodiments described above may be accomplished by way of a computer program to instruct associated hardware, where the program may be stored on a computer readable storage medium. Wherein the computer readable storage medium is a magnetic disk, an optical disk, a read-only memory or a random access memory, etc.
The present invention is not limited to the above-mentioned embodiments, and any changes or substitutions that can be easily understood by those skilled in the art within the technical scope of the present invention are intended to be included in the scope of the present invention.
Claims (10)
1. The device for detecting the internal stress direction of the organic glass is characterized by comprising an incidence device and a receiving device which are arranged on two sides of the organic glass to be detected;
the incident device comprises an incident light component and a first polaroid lens frame with a polarizer; parallel light emitted by the incident light component is incident to the organic glass to be tested through the polarizer;
the receiving device sequentially comprises a wave plate frame with a wave plate, a second polaroid frame with an analyzer, a receiving light assembly and a spectrometer along the direction far away from the organic glass to be detected;
the first polaroid mirror bracket, the wave plate mirror bracket and the second polaroid mirror bracket are provided with dials; and adjusting the scale values of each scale, and obtaining the internal stress direction of the organic glass to be detected based on the scale values of each scale and the spectrum data correspondingly collected by the spectrometer.
2. The device for detecting stress direction in organic glass according to claim 1, wherein the incident light assembly comprises:
The device comprises a light source, a first optical fiber, a collimating lens, a first adapter plate and a first connecting rod; light rays emitted by the light source are transmitted to the collimating lens through the first optical fiber; the collimating lens converts the received light into parallel light;
the first adapter plate is used for fixing the collimating lens;
the two ends of the first connecting rod are respectively connected with the first adapter plate and the first polaroid lens frame and are used for supporting the first adapter plate and the first polaroid lens frame.
3. The device for detecting the direction of internal stress in the organic glass according to claim 2, wherein the incidence device further comprises a first connecting rod leg and a first leg fixing member;
the first connecting rod supporting leg is used for supporting the first connecting rod;
one end of the first support leg fixing piece is fixed on the optical platform, and the other end of the first support leg fixing piece is used for fixing the first connecting rod support leg.
4. A stress direction detection device in organic glass according to any one of claims 1 to 3, wherein the light receiving module comprises: the second adapter plate, the second connecting rod and the second optical fiber;
the wave plate frame, the second polaroid frame and the second adapter plate are sequentially connected through a second connecting rod;
The second adapter plate is internally provided with an adapter structure device, and the adapter structure device is used for being connected with a second optical fiber;
the second optical fiber is used for transmitting the light output from the switching structure to the spectrometer.
5. The device for detecting the direction of stress in the organic glass according to claim 4, wherein the receiving device further comprises a second connecting rod leg and a second leg fixing member;
the second connecting rod supporting leg is connected with the second connecting rod and used for supporting the second connecting rod;
one end of the second supporting leg fixing piece is fixed on the optical platform, and the other end of the second supporting leg fixing piece is used for fixing the second connecting rod supporting leg.
6. A method for detecting the internal stress direction of organic glass is characterized in that,
parallel light emitted by the incident light component is incident to the organic glass to be tested through the polarizer;
the parallel light emitted by the organic glass to be tested enters a spectrometer through a wave plate, an analyzer and a light receiving component; the polarizer, the wave plate and the analyzer are respectively arranged in the first polaroid mirror bracket, the wave plate mirror bracket and the second polaroid mirror bracket with the dial;
and adjusting the scale values of each scale, and obtaining the internal stress direction of the organic glass to be detected based on the scale values of each scale and the spectrum data correspondingly collected by the spectrometer.
7. The method for detecting the internal stress direction of the organic glass according to claim 6, wherein adjusting each scale value of the scale to obtain the internal stress direction of the organic glass to be detected based on each scale value of the scale and the spectrum data correspondingly collected by the spectrometer comprises:
adjusting dials of the first polaroid lens frame, the wave plate lens frame and the second polaroid lens frame, and obtaining a possible direction of internal stress of the organic glass to be detected when the integral spectrum curve amplitude of spectrum data acquired by the spectrometer is minimum; wherein the possible directions comprise parallel or perpendicular to the slow axis direction of the wave plate;
the wave plate frame dial is kept unchanged, the polarizer dial and the analyzer dial are synchronously rotated, and the superposition result of the wave plate optical path difference and the organic glass optical path difference to be measured is recorded, so that the direction of stress in the organic glass is finally determined.
8. The method for detecting internal stress direction of organic glass according to claim 7, wherein adjusting the dials of the first polarizer frame, the wave plate frame and the second polarizer frame to obtain the possible internal stress direction of the organic glass to be detected when the spectrum data collected by the spectrometer has the smallest overall spectrum curve amplitude comprises the following steps:
And respectively adjusting the scale values of the polarizer, the wave plate and the analyzer dial, keeping the sum of the scale values of the polarizer and the wave plate dial to be 360 degrees, keeping the sum of the scale values of the polarizer and the analyzer dial to be 90 degrees, recording the spectrum data on the spectrometer, and obtaining the possible direction of the internal stress of the organic glass to be measured to be parallel or perpendicular to the slow axis direction of the wave plate when the acquired spectrum data curve amplitude is minimum.
9. The method for detecting the direction of internal stress of organic glass according to any one of claims 6 to 8, wherein the internal stress of the organic glass to be detected corresponds to a compressive stress or a tensile stress.
10. The method for detecting stress in organic glass according to claim 7, wherein the step of keeping the waveplate frame scale unchanged and synchronously rotating the polarizer scale and the analyzer scale, recording the superposition result of the waveplate optical path difference and the organic glass optical path difference to be detected, and thereby finally determining the direction of stress in the organic glass comprises the steps of:
the position of the wave plate scale value at the current moment is kept unchanged, the polarizer dial and the analyzer dial are synchronously rotated, spectrum data on a spectrometer are recorded, and the spectrum data are the superposition result of the wave plate optical path difference and the optical path difference of the organic glass to be measured; the superposition result is that the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the sum of the optical path difference of the wave plate and the optical path difference of the organic glass sample to be tested or the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the optical path difference of the wave plate and the optical path difference of the organic glass sample to be tested;
Finally determining the internal stress direction of the organic glass to be measured according to the superposition result of the obtained wave plate optical path difference and the optical path difference of the organic glass to be measured; when the superposition result is that the optical path difference value of the wave plate and the organic glass to be tested is equal to the absolute value of the sum of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be tested, if the internal stress of the organic glass is compressive stress, the direction of the compressive stress is parallel to the direction of the slow axis of the wave plate; if the existing internal stress is tensile stress, the tensile stress direction is perpendicular to the slow axis direction of the wave plate;
when the optical path difference value of the wave plate and the organic glass to be measured is equal to the absolute value of the optical path difference value of the wave plate and the optical path difference value of the organic glass sample to be measured, if the internal stress of the organic glass is compressive stress, the direction of the compressive stress is vertical to the slow axis direction of the wave plate; if the existing internal stress is tensile stress, the direction of the tensile stress is parallel to the slow axis direction of the wave plate.
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