CN115989419B - 用于生成和测量电信号的系统和方法 - Google Patents

用于生成和测量电信号的系统和方法

Info

Publication number
CN115989419B
CN115989419B CN202180053385.6A CN202180053385A CN115989419B CN 115989419 B CN115989419 B CN 115989419B CN 202180053385 A CN202180053385 A CN 202180053385A CN 115989419 B CN115989419 B CN 115989419B
Authority
CN
China
Prior art keywords
voltage
current
analog
output terminal
channel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202180053385.6A
Other languages
English (en)
Chinese (zh)
Other versions
CN115989419A (zh
Inventor
A·马亨德拉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nix Labo Co ltd
Original Assignee
Nix Labo Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2020902625A external-priority patent/AU2020902625A0/en
Application filed by Nix Labo Co ltd filed Critical Nix Labo Co ltd
Publication of CN115989419A publication Critical patent/CN115989419A/zh
Application granted granted Critical
Publication of CN115989419B publication Critical patent/CN115989419B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/04—Voltage dividers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Remote Monitoring And Control Of Power-Distribution Networks (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
CN202180053385.6A 2020-07-27 2021-07-26 用于生成和测量电信号的系统和方法 Active CN115989419B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AU2020902625A AU2020902625A0 (en) 2020-07-27 Source measurement unit
AU2020902625 2020-07-27
PCT/IB2021/056696 WO2022023915A1 (en) 2020-07-27 2021-07-26 Systems and methods for generating and measuring electrical signals

Publications (2)

Publication Number Publication Date
CN115989419A CN115989419A (zh) 2023-04-18
CN115989419B true CN115989419B (zh) 2026-06-30

Family

ID=80035277

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180053385.6A Active CN115989419B (zh) 2020-07-27 2021-07-26 用于生成和测量电信号的系统和方法

Country Status (6)

Country Link
US (2) US12292458B2 (cg-RX-API-DMAC10.html)
EP (1) EP4189409B1 (cg-RX-API-DMAC10.html)
JP (1) JP7800930B2 (cg-RX-API-DMAC10.html)
CN (1) CN115989419B (cg-RX-API-DMAC10.html)
ES (1) ES3075343T3 (cg-RX-API-DMAC10.html)
WO (1) WO2022023915A1 (cg-RX-API-DMAC10.html)

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KR20230030436A (ko) * 2021-08-25 2023-03-06 삼성전자주식회사 모니터링 회로, 모니터링 회로를 포함하는 집적 회로 및 모니터링 회로의 동작 방법
CN115598445B (zh) * 2022-10-25 2023-12-01 浙江御辰东智能科技有限公司 一种基于硬件在环的电气故障检测方法及装置
US12422461B2 (en) * 2023-10-05 2025-09-23 Analog Devices International Unlimited Company Method to measure high voltages accurately
WO2025208205A1 (en) * 2024-03-30 2025-10-09 Seron Electronics Ltd. Systems and methods for implementing and controlling source-measurement systems
WO2025219848A1 (en) * 2024-04-15 2025-10-23 Nicslab, Inc. Electrical power supplies and related systems

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US6836272B2 (en) * 2002-03-12 2004-12-28 Sun Microsystems, Inc. Frame buffer addressing scheme
US7256600B2 (en) * 2004-12-21 2007-08-14 Teradyne, Inc. Method and system for testing semiconductor devices
KR100643246B1 (ko) * 2005-05-31 2006-11-10 삼성전자주식회사 디스플레이 장치
JP4293245B2 (ja) 2007-02-15 2009-07-08 株式会社デンソー 車両用バッテリ電流検出装置
US7903008B2 (en) * 2007-11-08 2011-03-08 National Instruments Corporation Source-measure unit based on digital control loop
JP5003955B2 (ja) 2007-11-21 2012-08-22 横河電機株式会社 Ｉｃテスタ
KR20130068126A (ko) * 2011-12-15 2013-06-25 한국전자통신연구원 정류기, 이를 이용한 수신 신호 강도 표시기 및 수신기
US8847674B1 (en) * 2013-03-13 2014-09-30 General Electric Company Systems and methods for power limiting for a programmable I/O device
JP6531370B2 (ja) * 2014-10-17 2019-06-19 株式会社リコー 液滴吐出装置、液滴吐出方法、及びプログラム
EP3427073B1 (en) * 2016-03-11 2021-04-28 Analog Devices Global Unlimited Company Configurable hardware platform for measurement or control
CN206460350U (zh) * 2017-02-17 2017-09-01 烟台海博电气设备有限公司 一种高精度多通道程控电流源电路
JP6797065B2 (ja) 2017-04-27 2020-12-09 日立オートモティブシステムズ株式会社 車載用電子制御装置
KR101918167B1 (ko) * 2017-06-19 2018-11-13 주식회사 지파랑 반도체 소자 측정용 소스 및 측정 장치
WO2020095140A1 (ja) * 2018-11-08 2020-05-14 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
FR3097985A1 (fr) * 2019-06-28 2021-01-01 Stmicroelectronics (Grenoble 2) Sas Compensation de chute de tension de câble
EP4003179A4 (en) * 2019-07-25 2023-08-09 BFLY Operations, Inc. METHODS AND DEVICES FOR SWITCHING ON AND OFF AND ADC DRIVERS IN AN ULTRASOUND DEVICE

Also Published As

Publication number Publication date
US20230288452A1 (en) 2023-09-14
WO2022023915A1 (en) 2022-02-03
US12292458B2 (en) 2025-05-06
ES3075343T3 (en) 2026-08-03
US20250231223A1 (en) 2025-07-17
EP4189409A4 (en) 2024-08-28
JP7800930B2 (ja) 2026-01-16
CN115989419A (zh) 2023-04-18
JP2023539422A (ja) 2023-09-14
EP4189409A1 (en) 2023-06-07
EP4189409B1 (en) 2026-07-08

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