CN115963302A - Auxiliary testing method and system for digital signal quality - Google Patents
Auxiliary testing method and system for digital signal quality Download PDFInfo
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Abstract
The application provides a digital signal quality auxiliary test method and a digital signal quality auxiliary test system, wherein a control computer sends a test instruction to an oscilloscope, the oscilloscope automatically tests multiple functions of a tested device according to the received test instruction, and sends the obtained test data back to the control computer, and the control computer automatically analyzes and stores the test data. By the testing method and the testing system provided by the embodiment, in the testing process, a tester only needs to complete the operation of sending the testing instruction to the oscilloscope, and the required testing data and the analysis result can be obtained. Compared with the existing manual test, the test method and the test system provided by the embodiment reduce the test time and the test workload on one hand, and can perform other work after the tester finishes sending the test instruction to the oscilloscope; on the other hand, the control computer has stronger reliability on data processing and data storage, so that the data errors and loss can be effectively reduced.
Description
Technical Field
The present application relates to the field of signal testing technologies, and in particular, to a method and a system for auxiliary testing of digital signal quality.
Background
Digital signals are increasingly widely used in the field of communications based on advantages in the aspects of confidentiality, interference resistance, transmission quality, and the like. During communication, it is often necessary to test the quality of the digital signal.
At present, the digital signal quality test mode is mainly that a tester manually operates an oscilloscope to perform required multiple functional tests on an item on a device to be tested. And after the function test is finished, manually copying the recorded test data into a record table and sorting the test data. This results in a significant amount of time being spent by the tester in the oscilloscope manipulation and data record interpretation. Meanwhile, data errors are easy to occur in the process of manually recording data.
Disclosure of Invention
In view of the above, the present application is directed to a method for testing quality of a digital signal.
Based on the above purpose, the present application provides a digital signal quality auxiliary test method, which is applied to a test system comprising a control computer and an oscilloscope; the control computer is in communication connection with the oscilloscope, and the oscilloscope is in communication connection with the device to be tested;
the method comprises the following steps:
generating a corresponding test instruction according to a preselected target test point through the control computer;
automatically executing the test instruction through the oscilloscope, and carrying out function test on the target test point to obtain test data and transmitting the test data back to the control computer;
and comparing the test data with standard data through the control computer, judging whether the test data meets the requirements to obtain a judgment result, and storing the test data and the judgment result.
Optionally, the test instruction includes:
instructions to set a trigger mode, a trigger edge, and a trigger level value;
instructions to set a horizontal time base and a vertical time base;
setting an instruction for adding a test item;
setting an instruction for starting automatic calibration;
and setting an instruction for collecting test data and transmitting the test data back to the specified position of the test record table.
Optionally, the test items include: peak-to-peak voltage, voltage maximum, period, frequency, waveform top voltage value, and waveform bottom voltage value.
Optionally, the test instruction is written through a development environment built by python.
Optionally, before the automatically executing the test instruction by the oscilloscope, the method further includes:
generating a test record table by the control computer;
and selecting a storage position for recording the test data and the judgment result in the test record table through the control computer.
Optionally, the test data and the judgment result are stored in the test record table by the control computer.
Optionally, the control computer sends the test instruction to the oscilloscope through a virtual instrument software architecture library function.
Optionally, the control computer is in communication connection with the oscilloscope through a network cable.
Optionally, the oscilloscope is in communication connection with the device under test through an oscilloscope probe.
Based on the same inventive concept, the present application further provides a digital signal quality auxiliary test system, comprising:
the control computer is configured to generate a corresponding test instruction according to a preselected target test point;
the oscilloscope is configured to automatically execute the test instruction, perform function test on the target test point, obtain test data and transmit the test data back to the control computer;
the control computer is further configured to compare the test data with standard data, judge whether the test data meets requirements, obtain a judgment result, and store the test data and the judgment result.
From the above, according to the digital signal quality auxiliary test method and system provided by the application, a tester sends a test instruction to the oscilloscope through the control computer, the oscilloscope automatically performs multiple function tests on the device to be tested according to the received test instruction, the obtained test data is transmitted back to the control computer, and the control computer automatically performs analysis and storage. By the test method provided by the embodiment, in the test process, a tester only needs to complete the operation of sending the test instruction to the oscilloscope, and the required test data and analysis result can be obtained. Compared with the existing manual test, the test method provided by the embodiment reduces the test time and lightens the test workload on the one hand; on the other hand, the control computer has stronger reliability on data processing and data storage, so that the data errors and loss can be effectively reduced.
Drawings
In order to more clearly illustrate the technical solutions in the present application or the related art, the drawings needed to be used in the description of the embodiments or the related art will be briefly introduced below, and it is obvious that the drawings in the following description are only embodiments of the present application, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic flowchart of a digital signal quality assistant testing method according to an embodiment of the present application;
FIG. 2 is a diagram of a hardware structure of a test system according to an embodiment of the present disclosure;
fig. 3 is a functional block diagram of a test system according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is further described in detail below with reference to the accompanying drawings in combination with specific embodiments.
It should be noted that technical terms or scientific terms used in the embodiments of the present application should have a general meaning as understood by those having ordinary skill in the art to which the present application belongs, unless otherwise defined. The use of "first," "second," and similar terms in the embodiments of the present application is not intended to indicate any order, quantity, or importance, but rather is used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
The clock frequency of today's high speed digital systems, which may be as high as several hundred megahertz, with fast slope transients, extremely high operating frequencies, and significant circuit density, will necessitate that the system behave distinctly from a low speed design, leading to signal integrity problems.
Signal integrity refers to the quality of a signal on a signal line, i.e., the ability of a signal to respond with the correct timing and voltage in a circuit. A circuit has better signal integrity if the signal in the circuit can arrive at the receiver with the required timing, duration and voltage amplitude. Conversely, when a signal does not respond properly, a signal integrity problem occurs.
Disrupting signal integrity will directly result in signal distortion, timing errors, and the generation of incorrect data, address, and control signals, thereby causing system malfunction and even system crash. Therefore, digital signal quality testing is one of the indispensable test items in digital circuit design, especially high-speed digital circuit design.
The white box test is one of the more reliable digital circuit test methods. White box testing focuses on the implementation of the device under test, requiring measurement of the signal and timing of each signal line, each power supply, and each interface. Except for conventional waveform observation, all indexes of the waveform and all indexes of the time sequence are tested, whether the waveform meets design expectations is analyzed, and whether the design requirements are met is judged according to the test results of all indexes.
It can be seen that the hardware white box test is very labor intensive and is mostly some repetitive work. If the test is finished manually by a tester, a large amount of time and energy are occupied, errors are easily generated in the testing, recording and sorting processes, and the testing result is adversely affected.
In view of this, the present embodiment provides a digital signal quality auxiliary testing method especially suitable for single board hardware white box testing. The method is applied to a test system comprising a control computer and an oscilloscope. The control computer is in communication connection with the oscilloscope, and the oscilloscope is in communication connection with the tested device.
As shown in fig. 1, the method for auxiliary testing of digital signal quality includes:
s101: generating a corresponding test instruction according to a preselected target test point through a control computer;
s102: automatically executing the test instruction through an oscilloscope, performing function test on the target test point to obtain test data, and transmitting the test data back to the control computer;
s103: and comparing the test data with the standard data by the control computer, judging whether the test data meets the requirements to obtain a judgment result, and storing the test data and the judgment result.
Before step S101, the hardware set-up of the test system needs to be performed, as shown in fig. 2.
An appropriate oscilloscope and oscilloscope probe (hereinafter referred to as probe) are selected. In order to ensure the accuracy of the test data, an active probe with high input impedance, small capacitance value and high bandwidth and an oscilloscope with high bandwidth can be adopted.
Optionally, the bandwidth of the probe and the oscilloscope (describing the inherent rise time, i.e., time delay of the oscilloscope) should exceed the bandwidth of the test digital signal by more than 3-5 times.
For accurate reproduction of the test digital signal, according to shannon's law:
R max ＝W×log 2 (1+S/N)
wherein R is max W is the channel bandwidth and S/N is the signal-to-noise ratio for the channel capacity.
The oscilloscope sampling rate (the frequency at which the digital oscilloscope samples the signal) needs to be at least 2 times the highest frequency content of the digital signal under test.
After the oscilloscope and the probe are selected according to the device to be tested, the LAN interface of the control computer and the oscilloscope is connected through the network cable, and after the connection, whether the indicator lamp at the interface end of the network cable is normal is observed, if not, the interface and the network cable need to be checked, so that the effective hardware connection between the control computer and the oscilloscope is ensured.
Optionally, the control computer may also be connected to the oscilloscope via a serial port, GPIB (General-Purpose Interface Bus), or other transmission medium.
The target test point may be selected manually by a tester or by other instrumentation, such as control computers, known in the art.
The target test point for digital signal quality is typically selected for end measurement (the test point is determined based on the current signal flow direction). For a device under test with a chip, it should be measured as close as possible to or on the input pins of the chip. For the condition that signals can be subjected to multi-stage matching and driving on a single board, a target test point is selected to be an input end of a chip after matching. For the case of the same signal at different topological points (e.g., star topology), the signal quality of all the input points can be tested due to the large difference in signal quality.
And after the target test point is selected, the communication connection between the oscilloscope and the target test point on the tested device is realized through the probe.
Of course, the test system also includes an external power supply for providing an uninterruptible power supply with constant voltage and constant frequency for the control computer, the oscilloscope, the probe and the device to be tested.
Of course, the control computer is equipped with a display for providing a user interface for human-computer interaction and data display.
The oscilloscope may be initialized, configured with basic parameters (e.g., range, attenuation, and protection thresholds of the oscilloscope, etc.), and set with operational parameters (to simulate different operating conditions) after power is turned on.
As shown in fig. 3, in order to implement communication between the control computer and the oscilloscope, an NI-VISA driver needs to be installed on the control computer, access to the oscilloscope by the control computer is implemented by using a VISA open function in a Virtual Instrument Software Architecture (VISA) library, and the communication preparation work is completed by selecting a VISA resource name in the I/O control and finding a device code connected to an interface.
The VISA library is one of standard I/O function libraries, provides a uniform device resource management, operation and use mechanism, is independent of hardware devices, interfaces, an operating system and a programming language, has the characteristic of independence of a hardware structure, is suitable for any bus mode, and therefore has good applicability.
Optionally, the control computer is preinstalled with a test program written through a development environment built by python. And opening an executable file of the test program and entering a user interface. The VISAIP address of the oscilloscope is obtained in the user interface (the address of a typical oscilloscope LAN interface is similar to: 192.168.0.1), and the control computer is connected to the oscilloscope by the obtained address.
After the control computer is in communication connection with the oscilloscope, a test record table is generated in the control computer.
Optionally, the test record table may be a text, excel, word, or other type of file.
Optionally, in the test record table, test record information such as test time, test instruments, test states, and the like may be set.
And selecting a storage position for recording the test data and the judgment result in the test record table.
Taking the test record table as an excel document as an example, the storage positions can be arranged in the same sheet in the same excel document, and the storage positions can also be arranged in different excel documents or different sheets in the same excel document according to conditions such as test items, test time and the like, so that a tester can conveniently analyze and check the storage positions.
Optionally, the test data further includes a waveform diagram.
When the test data to be stored is a waveform diagram, the specific storage position of the waveform diagram in the test record table is set, and the storage size of the waveform diagram is also set.
After the test record table is set, a test instruction is written according to the tested device under the development environment set up by python.
Optionally, the test instruction is SCPI (Standard Commands for Programmable instrument Instruments) supported by the oscilloscope.
Optionally, the test instruction includes: instructions to set a trigger mode, a trigger edge, and a trigger level value; instructions to set a horizontal time base and a vertical time base; setting an instruction for adding a test item; setting an instruction for starting automatic calibration (AUTOSCALE); and setting an instruction for collecting test data and transmitting the test data back to the specified position of the test record table.
Controlling a computer to send a test instruction according to different test item requirements to set the oscilloscope, for example: setting the oscilloscope to a rising edge trigger and a horizontal time base setting; acquiring waveform data by a test instruction after a rising edge triggers to capture a waveform; the acquired time is the rising time, the falling time and the positive pulse width of the waveform, so the acquired data needs to be processed by a corresponding algorithm according to the waveform shape to obtain the required test data.
Optionally, the test items include: peak-to-peak voltage (Vpp), voltage maximum (Vmax), period, frequency, waveform top voltage value (Vtop), and waveform bottom voltage value (Vbase).
In addition, the test instructions can also be pre-written and stored in the control computer. During testing, a tester selects and calls a required test instruction according to a tested device.
After the test instruction preparation is completed, the tester sends the compiled test instruction to the oscilloscope through the LAN interface and the control computer through the corresponding query button in the user interface.
In step S102, the oscilloscope recognizes that the operation represented by the test instruction is automatically executed after receiving the test instruction sent by the control computer. In the testing process, after a single test is completed, the control computer and the test program installed therein can be used to call the oscilloscope to quickly perform the next test according to the test items and the test flow information contained in the test instruction, so as to realize the automatic testing of multiple items on the device under test.
And after the oscilloscope executes the test instructions item by item according to the test flow, the obtained test data is transmitted back to the control computer.
In step S103, a plurality of standard data ranges with different testing requirements are preset in the control computer, the control computer compares the received test data with the set standard data range, and determines whether the test data meets the requirements, thereby obtaining a determination result.
And after the control computer completes the analysis processing of the test data, the test data and the judgment result are imported into the test record table according to the pre-selected storage position to complete the test.
Optionally, when the determination result is abnormal data, the determination result may be processed differently, for example, highlight identification is performed on the piece of data information.
Finally, the obtained test record table can be stored in a control computer, remotely sent to a server for archiving or output as a paper document through equipment such as a printer and the like.
In the digital signal quality auxiliary test method provided by the embodiment, a tester sends a test instruction to the oscilloscope through the control computer, the oscilloscope automatically performs multiple function tests on a tested device according to the received test instruction, and sends obtained test data back to the control computer, and the control computer automatically performs analysis and storage. By the test method provided by the embodiment, in the test process, a tester only needs to complete the operation of sending the test instruction to the oscilloscope, and can obtain the required test data and analysis results. Compared with the existing manual test, the test method provided by the embodiment reduces the test time and the test workload on one hand, and can perform other work after a tester sends a test instruction to the oscilloscope; on the other hand, the control computer has stronger reliability on data processing and data storage, so that the situations of data errors and data loss can be effectively reduced.
It should be noted that the method of the embodiment of the present application may be executed by a single device, such as a computer or a server. The method of the embodiment can also be applied to a distributed scene and completed by the mutual cooperation of a plurality of devices. In such a distributed scenario, one of the multiple devices may only perform one or more steps of the method of the embodiment, and the multiple devices interact with each other to complete the method.
It should be noted that the above describes some embodiments of the present application. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments described above and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing may also be possible or may be advantageous.
Based on the same inventive concept, the present application also provides a digital signal quality auxiliary test system corresponding to the above method of any embodiment, comprising:
the control computer is configured to select a target test point and generate a test instruction corresponding to the target test point;
the oscilloscope is configured to automatically execute the test instruction, perform function test on the target test point, obtain test data and transmit the test data back to the control computer;
and the control computer is also configured to compare the test data with the standard data, judge whether the test data meets the requirements, obtain a judgment result, and store the test data and the judgment result.
For convenience of description, the above test system is described with functions divided into various hardware devices, which are described separately. Of course, the functionality of the hardware devices may be implemented in the same one or more software and/or hardware devices in practicing the present application.
The apparatus of the foregoing embodiment is used to implement the digital signal quality auxiliary test method corresponding to any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiment, which are not described herein again.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, is limited to these examples; within the context of the present application, technical features in the above embodiments or in different embodiments may also be combined, steps may be implemented in any order, and there are many other variations of the different aspects of the embodiments of the present application described above, which are not provided in detail for the sake of brevity.
In addition, well-known power/ground connections to Integrated Circuit (IC) chips and other components may or may not be shown within the provided figures for simplicity of illustration and discussion, and so as not to obscure the embodiments of the application. Furthermore, devices may be shown in block diagram form in order to avoid obscuring embodiments of the application, and this also takes into account the fact that specifics with respect to implementation of such block diagram devices are highly dependent upon the platform within which the embodiments of the application are to be implemented (i.e., specifics should be well within purview of one skilled in the art). Where specific details (e.g., circuits) are set forth in order to describe example embodiments of the application, it should be apparent to one skilled in the art that the embodiments of the application can be practiced without, or with variation of, these specific details. Accordingly, the description is to be regarded as illustrative instead of restrictive.
While the present application has been described in conjunction with specific embodiments thereof, many alternatives, modifications, and variations of these embodiments will be apparent to those of ordinary skill in the art in light of the foregoing description. For example, other memory architectures, such as Dynamic RAM (DRAM), may use the discussed embodiments.
The present embodiments are intended to embrace all such alternatives, modifications and variances which fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalents, improvements, and the like that may be made without departing from the spirit or scope of the embodiments of the present application are intended to be included within the scope of the claims.
Claims (10)
1. A digital signal quality auxiliary test method is characterized in that the method is applied to a test system comprising a control computer and an oscilloscope; the control computer is in communication connection with the oscilloscope, and the oscilloscope is in communication connection with the device to be tested;
the method comprises the following steps:
generating a corresponding test instruction according to a preselected target test point through the control computer;
automatically executing the test instruction through the oscilloscope, and carrying out function test on the target test point to obtain test data and transmitting the test data back to the control computer;
and comparing the test data with standard data through the control computer, judging whether the test data meets the requirements to obtain a judgment result, and storing the test data and the judgment result.
2. The method of claim 1, wherein the test instructions comprise:
instructions to set a trigger mode, a trigger edge, and a trigger level value;
instructions to set a horizontal time base and a vertical time base;
setting an instruction for adding a test item;
setting an instruction for starting automatic calibration;
and setting an instruction for collecting test data and transmitting the test data back to the specified position of the test record table.
3. The test method of claim 2, wherein the test items comprise: peak-to-peak voltage, voltage maximum, period, frequency, waveform top voltage value, and waveform bottom voltage value.
4. The test method according to claim 1, wherein the test instructions are written through a development environment built by python.
5. The method according to claim 1, before the automatically executing the test instruction by the oscilloscope, further comprising:
generating a test record table by the control computer;
and selecting a storage position for recording the test data and the judgment result in the test record table through the control computer.
6. The test method according to claim 5, wherein the test data and the judgment result are stored in the test record table by the control computer.
7. The method of claim 1, wherein the control computer sends the test instructions to the oscilloscope via a virtual instrument software architecture library function.
8. The test method of claim 1, wherein the control computer is communicatively connected to the oscilloscope via a network cable.
9. The method of claim 1, wherein the oscilloscope is communicatively coupled to the device under test via an oscilloscope probe.
10. A digital signal quality assistive test system, comprising:
the control computer is configured to generate a corresponding test instruction according to a preselected target test point;
the oscilloscope is configured to automatically execute the test instruction, perform function test on the target test point, obtain test data and transmit the test data back to the control computer;
the control computer is further configured to compare the test data with standard data, judge whether the test data meets requirements, obtain a judgment result, and store the test data and the judgment result.
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