CN115938252A - Display device and detection method for detecting same - Google Patents
Display device and detection method for detecting same Download PDFInfo
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- CN115938252A CN115938252A CN202211557401.8A CN202211557401A CN115938252A CN 115938252 A CN115938252 A CN 115938252A CN 202211557401 A CN202211557401 A CN 202211557401A CN 115938252 A CN115938252 A CN 115938252A
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Abstract
The display device comprises a plurality of switching pads, a plurality of first scanning line segments, a plurality of second scanning line segments, a plurality of data lines, a plurality of selection lines, a connecting line and an electrostatic protection piece. Each first scanning line segment is connected to the corresponding switching pad along the first axial direction. Each second scan line segment extends from the corresponding adapter pad along a second axial direction. The data lines extend along a first axial direction. The selection lines extend along a first axial direction and are disconnected from the first scanning line segments. The connecting lines connect the selection lines. The electrostatic protection part is electrically connected with the connecting wire.
Description
Technical Field
The embodiment of the invention relates to a display device and a detection method for detecting the same.
Background
Electronic Paper Displays (EPDs) have many advantages, such as no need of backlight, display quality close to that of ordinary Paper, power saving, and light weight. However, in the trend of being light, thin, short, and small, the electronic paper display has densely designed circuits, and thus, the problem of circuit defects (such as short circuit) is likely to occur, and therefore, how to detect the circuit defects is one of the efforts of the skilled in the art.
Disclosure of Invention
The embodiment of the invention relates to a display device and a detection method for detecting the same, which can improve the existing problems.
According to an embodiment of the present invention, a display device is provided. The display device comprises a plurality of switching pads, a plurality of first scanning line segments, a plurality of second scanning line segments, a plurality of data lines, a plurality of thin film transistors, a plurality of selection lines, a connecting line and a first electrostatic protection piece. Each first scanning line segment is connected to the corresponding switching pad along a first axial direction. Each second scan line segment extends from the corresponding adapter pad along a second axial direction. The data lines extend along a first axial direction. Each thin film transistor is connected with the corresponding data line and the second scanning line segment. The selection lines extend along a first axial direction and are disconnected from the first scanning line segments. The connecting lines connect the selection lines. The first electrostatic protection part is electrically connected with the connecting wire.
According to an embodiment of the present invention, a method for detecting a display device is provided. The detection method comprises the following steps: providing a display device, wherein the display device comprises a plurality of switching pads, a plurality of first scanning line segments, a plurality of second scanning line segments, a plurality of data lines, a plurality of thin film transistors, a plurality of selection lines, a connecting line and a first electrostatic protection piece, each first scanning line segment is connected to the corresponding switching pad along a first axial direction, each second scanning line segment extends from the corresponding switching pad along a second axial direction, the data lines extend along the first axial direction, each thin film transistor is connected with the corresponding data line and the second scanning line segment, the selection lines extend along the first axial direction and are disconnected with the first scanning line segments, the connecting line is connected with the selection lines, and the first electrostatic protection piece is electrically connected with the connecting line; a detection device outputs a first conduction signal to the connecting line; the detection device outputs a second conduction signal to a first testee of the first scanning line segments; the detection device outputs a third conduction signal to a second testee of the data lines; and generating a defect detection signal by the detection device based on the cut-off of the thin film transistor coupled with the first testee and the second testee.
In order to better understand the above and other aspects of the present invention, the following detailed description of the embodiments is made with reference to the accompanying drawings:
drawings
Fig. 1 shows a top view of a display device according to an embodiment of the invention.
Fig. 2 shows a top view of a display device according to another embodiment of the invention.
Fig. 3 shows a test signal diagram for detecting the display device of fig. 2.
Fig. 4 shows a flow chart of a detection method for detecting the display device of fig. 2.
Description of reference numerals:
10: detection device
11: detection circuit
100,200: display device
105: substrate
105A: display area
105B: non-display area
105B1: the first section
105B2: second section
105B3: third section
105B4: the fourth section
110: switching pad
120: first scanning line segment
130: second scanning line segment
135: thin film transistor
140: data line
150: selection line
155: common electrode
160: connecting wire
161A: first line segment
161B: second line segment
161B1: first sub-line segment
161B2: second sub-line segment
161C: third line segment
161D: fourth line segment
170A: first electrostatic protection part
170B: second electrostatic shield
180: circuit board
C1: first angle of rotation
C2: second corner
L COM : common electrode detection circuit
L G1 : first scanning line detection circuit
L G2 : second scanning line detection circuit
L D1 : first data line detection circuit
L D : second data line detection circuit
L EE : switching circuit
PX: pixel region
And SE: opening signal
S11, S21, S32, S42: conducting signal
S12, S31, S41: cut-off signal
S5: defect detection signal
T1: a first test signal
T2: second test signal
T3: third test signal
T4: fourth test signal
X: second axial direction
Y: first axial direction
Detailed Description
In the drawings, the thickness of layers, films, panels, regions, etc. have been exaggerated for clarity. Like reference numerals refer to like elements throughout the specification. It will be understood that when an element such as a layer, film, region or substrate is referred to as being "on" or "connected to" another element, it can be directly on or connected to the other element or intervening elements may also be present. In contrast, when an element is referred to as being "directly on" or "directly connected to" another element, there are no intervening elements present. As used herein, "connected" may refer to physical and/or electrical connections. Further, "electrically connected" or "coupled" may mean that there are additional elements between the elements.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms, including "at least one", unless the content clearly indicates otherwise. "or" means "and/or". As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, regions, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, regions integers, steps, operations, elements, components, and/or groups thereof.
Furthermore, relative terms, such as "lower" or "bottom" and "upper" or "top," may be used herein to describe one element's relationship to another element, as illustrated. It will be understood that relative terms are intended to encompass different orientations of the device in addition to the orientation depicted in the figures. For example, if the device in one of the figures is turned over, elements described as being on the "lower" side of other elements would then be oriented on "upper" sides of the other elements. Thus, the exemplary term "lower" can include both an orientation of "lower" and "upper," depending on the particular orientation of the figure. Similarly, if the device in one of the figures is turned over, elements described as "below" or "beneath" other elements would then be oriented "above" the other elements. Thus, the exemplary terms "below" or "beneath" can encompass both an orientation of above and below.
As used herein, "about", "approximately", or "substantially" includes the stated value and the average value within an acceptable range of deviation of the specified value as determined by one of ordinary skill in the art, given the particular number of measurements and errors associated with the measurements in question (i.e., the limitations of the measurement system). For example, "about" may mean within one or more standard deviations of the stated value, or within ± 30%, ± 20%, ± 10%, ± 5%. Further, as used herein, "about", "approximately" or "substantially" may be selected based on optical properties, etch properties, or other properties, with a more acceptable range of deviation or standard deviation, and not all properties may be applied with one standard deviation.
Unless defined otherwise, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and the present invention and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
Referring to fig. 1, a top view of a display device 100 according to an embodiment of the invention is shown. The display device 100 includes a substrate 105, a plurality of Transfer Data Pads (TDPs) 110, a plurality of first scan line segments 120, a plurality of second scan line segments 130, a plurality of Thin-Film transistors (TFTs) 135, a plurality of Data lines 140, a plurality of selection lines 150, at least one common electrode 155, a connection line 160, a first electrostatic protection component 170A, a second electrostatic protection component 170B, and a circuit board 180. Each first scanning line segment 120 is connected to the corresponding pad 110 along the first axis Y. Each second scan line segment 130 extends from the corresponding via pad 110 along the second axial direction X. The data lines 140 extend along the first axis Y. Each tft 135 connects the corresponding data line 140 and the second scan line segment 130. The select lines 150 extend along the first axis Y and are disconnected from the first scan line segments 120. The connection lines 160 connect the selection lines 150. In a defect detection (described later), the selection line 150 is connected through the connection line 160, and a defect of a line adjacent to the selection line 150, for example, a line defect short (conductive) to the selection line 150 can be detected.
As shown in fig. 1, the substrate 105 is, for example, a transparent substrate, and the material of the transparent substrate is, for example, glass or other transparent materials. The substrate 105 has a display region 105A and a non-display region 150B. The display area 105A is, for example, an active area, and the non-display area 150B is, for example, a non-active area. The non-display area 150B is an edge area of the substrate 105, which is connected to an outer side surface of the substrate 105. The non-display area 150B surrounds at least one side of the display area 105A, for example, the non-display area 150B surrounds the entire display area 105A. The adapter pads 110, the first scan lines 120, the second scan lines 130, the data lines 140, and the selection lines 150 are disposed in the display area 105A, and the connection lines 160, the first electrostatic protection component 170A, and the second electrostatic protection component 170B are disposed in the non-display area 105B.
As shown in fig. 1, the non-display area 105B has a first section 105B1 and a second section 105B2 opposite to each other and a third section 105B3 and a fourth section 105B4 opposite to each other, wherein the third section 105B3 and the fourth section 105B4 connect the first section 105B1 and the second section 105B2. The first section 105B1, the second section 105B2, the third section 105B3 and the fourth section 105B4 are connected to form a closed ring, and the closed ring surrounds the display area 105A.
As shown in FIG. 1, the landing pads 110 may be arranged along the diagonal of the display device 100. The pad 110 is coupled to the corresponding first scan line segment 120 and the second scan line segment 130, so as to convert the signal transmitted along the Y axis 5 (through the first scan line segment 120) into the signal transmitted along the X axis (through the second scan line segment 130). By the signal transfer design of the transfer pad 110, the width of the non-display areas (e.g., the third section 105B3 and the fourth section 105B 4) on both sides of the substrate 105 can be reduced, so that the display device 100 has the technical effect of "two-sided narrow frame".
As shown in fig. 1, in the present embodiment, the first scan line segment 120, the second scan line segment 130 and the 0 data line 140 define a plurality of pixel areas PX. In another embodiment, the pixel area PX may be defined in other manners, not limited to using data lines and scan lines.
At least one of all the select lines 150 is coupled to the connecting line 160, as shown in FIG. 1. The select line 150 is in a floating state, i.e., the select line 150 is physically disconnected from the landing pad 110,
the select line 150 is not electrically connected to the first scan line segment 120, the second scan line segment 130, the data line 140 and the 5-common electrode 155.
As shown in fig. 1, the common electrodes 155 are located in the corresponding pixel regions PX and electrically coupled to each other.
The common electrode 155 provides a reference potential to the pixel region PX for voltage stabilization.
In addition, the first scan line segment 120, the second scan line segment 130, the data line 140, the selection line 150 and the common electrode 155 may be different layer structures. In the present embodiment, the first scan line segment 120, the 0 data line 140, the selection line 150 and the common electrode 155 are, for example, in the same layer structure (in the same process),
and the second scan line segment 130 is of another layer structure (another process). The second scan line segments 130 and the first scan line segments 120 respectively located at different layers are electrically connected through the transfer pads 110, wherein the transfer pads 110 are, for example, via holes (conductive vias) of an insulating layer between two layers, which are connected to the two layers.
As shown in fig. 1, the connecting lines 160 are connected in parallel to the selection lines 150. The connection line 160 is disposed in the non-display 5 region 105B. For example, the connection line 160 includes a first line segment 161A and a second line segment 161B disposed oppositely and a third line segment 161C and a fourth line segment 161D disposed oppositely, wherein the third line segment 161C and the fourth line segment 161D connect the first line segment 161A and the second line segment 161B. The connection lines 160 are disposed in the first, second, and third segments 105B1, 105B2, 105B3 of the non-display region 105B
And a fourth segment 105B4. For example, the first, second, third and fourth segments 161A, 161B, 161C0 and 161D are respectively disposed in the first, second, third and fourth segments 105B1, 105B2, 105B3 and 105B4 of the non-display area 105B. The second segment 161B includes a first sub-segment 161B1 and a second sub-segment 161B2, and the first sub-segment 161B1 and the second sub-segment 161B2 are connected to the third segment 161C and the fourth segment 161D, respectively.
As shown in fig. 1, the first electrostatic protection component 170A is electrically connected to the connection wires 160 to prevent electrostatic damage to the electronic devices/circuits on the substrate 105. The first electrostatic shield 170A is disposed corresponding to a first corner C1 of the substrate 105, for example, the first corner C1 is a connection point of the first segment 105B1 and the third segment 105B 3. In addition, the first electrostatic protection component 170A is, for example, a diode, a transient suppression diode Array (TVS Array), or other electronic components capable of blocking or dredging static electricity. The first electrostatic shielding component 170A has an electron channel width and an electron channel length, wherein the larger the ratio of the electron channel width to the electron channel length, the larger the voltage value of the electrostatic shielding component is.
As shown in fig. 1, the second electrostatic protection component 170B is electrically connected to the connection wires 160 to prevent electrostatic damage to the electronic devices/circuits on the substrate 105. The second electrostatic protection component 170B is disposed corresponding to a second corner C2 of the substrate 105, where the second corner C2 is, for example, a connection point between the first segment 105B1 and the fourth segment 105B4. In addition, the second electrostatic protection component 170B is, for example, a diode, a transient suppression diode array, or other electronic components capable of blocking or dredging static electricity.
By the two electrostatic protection devices, the electrostatic protection range of the display device 100 can be expanded. In another embodiment, the number of the electrostatic shields may be three or more, which are disposed at different positions or different corners of the non-display area 105B. In another embodiment, the display device 100 may also omit one of the first and second electrostatic shielding elements 170A and 170B and selectively omit the corresponding connection lines. For example, if the second electrostatic shield 170B is omitted, the fourth line segment 161D and the second sub-line segment 161B2 may be selectively omitted.
As shown in fig. 1, the Circuit board 180 is, for example, a Flexible Printed Circuit (FPC), but this is not intended to limit the embodiment of the present invention. The circuit board 180 is electrically connected to the substrate 105. For example, the data line 140 and the first scan line segment 120 can extend to the second segment 105B and be coupled to the circuit board 180. In addition, the second line segment 161B may be electrically connected to the circuit board 180. For example, the first sub-segment 161B1 of the second segment 161B may extend from the third segment 105B3 to the circuit board 180, and the second sub-segment 161B2 of the second segment 161B may extend from the fourth segment 105B4 to the circuit board 180 to be electrically connected to the circuit board 180.
Referring to fig. 2, a top view of a display device 200 according to another embodiment of the invention is shown. The display device 200 includes a substrate 105, a plurality of landing pads 110, a plurality of first scan lines 120, a plurality of second scan lines 130, a plurality of data lines 140, a plurality of selection lines 150, a connection line 160, a first electrostatic protection component 170A, and a second electrostatic protection component 170B. The display device 200 has the same or similar features as the display device 100 described above, except that the circuit board 180 may be omitted from the display device 200. In one embodiment, the display device 200 is a display panel before being cut (singulated), and the circuit board 180 is not assembled yet. After the inspection is completed, the display panel may be singulated and then the circuit board 180 may be assembled to form the display device 100 shown in fig. 1.
As shown in fig. 2, the display device 200 is connected to a detection device 10. The detecting device 10 is, for example, a pixel potential Optical sensing system (VIOS), but this is not intended to limit the present invention. The detecting device 10 includes a plurality of detecting lines and detecting circuits 11, wherein the detecting lines can be formed on the substrate 105 and include a common electrode detecting line L COM The first scanning line detection circuit L G1 A second scanning line detection circuit L G2 A first data line detection circuit L D1 A second data line detection circuit L D2 And a switching line L EE . After cutting, the common electrode detection line L COM The first scanning line detection circuit L G1 A second scanning line detection circuit L G2 A first data line detection circuit L D1 A second data line detection circuit L D2 And switch line L EE Removed from the display device 200 after cutting.
As shown in fig. 2, a common electrode detection line L COM Electrically connected to the common electrode 155 and the first scan line detection circuit L G1 Is electrically connected to one or more of the first scan lines 120 (e.g., the 2 n-th first scan line 120,n is a positive integer equal to or greater than 1), a second scanning line detection line L G2 One or more of the first scan lines 120 (e.g., the (2 n-1) th first scan line 120) and the first data line detection circuit L D1 Electrically connected to one or more of the data lines 140 (e.g., the 2 n-th data line 140), the second data line detection circuit L D2 Is electrically connected to another one or the other ones (e.g., (2 n-1) th data line 140) and switches the line L EE Electrically connected to the connecting wires 160. The detection circuit 11 can provide detection signals to the detection lines and determine whether a line defect occurs by observing the on state of the thin film transistor 135 of the display device 200.
As shown in fig. 2, the first scan line segment 120, the data line 140 and the connection line 160 of the display device 200 can extend to the switch line L EE And a switching line L EE Connected with the first scanning line detection circuit L G1 A second scanning line detection circuit L G2 A first data line detection circuit L D1 And a second data line detection line L D2 For signal transmission between these circuits and the display device 200. In one embodiment, the switch circuit L EE Also known as GGTFTs.
As shown in fig. 2, the switching line L EE Can be used as the display device 200 and the detection circuit (e.g., the first scan line detection circuit L) G1 A second scanning line detection circuit L G2 A first data line detection circuit L D1 And a second data line detection line L D2 ) A switch of the transmission channel therebetween. When the detection circuit 11 outputs an on signal (e.g., a high level voltage) to the switch line L EE The transmission channel between the display device 200 and the detection circuit can be conducted. When the detection circuit 11 outputs a turn-off signal (e.g., a low level voltage) to the switching line L EE The transmission channel between the display device 200 and the detection line may be closed. When detecting a line defect, the detection circuit 11 may output a turn-on signal to the switch line L EE And outputting a reference signal (e.g., a low level voltage) to the common electrode detection line L COM And outputs a turn-on signal (e.g., for the TFT to be turned on)High level voltage) to the corresponding first scan line segment 120 and the data line 140 to turn on the corresponding thin film transistor, and determine whether a line defect occurs according to whether the thin film transistor is turned on or not.
The following further illustrates the detection method of the apparatus 200 as apparent from FIGS. 3 to 4. Fig. 3 illustrates a test signal diagram for detecting the display apparatus 200 of fig. 2, and fig. 4 illustrates a flowchart of a detection method for detecting the display apparatus 200 of fig. 2.
In step S110, a display device 200 as shown in fig. 2 is provided.
In step S120, referring to fig. 2 to 4, the detection circuit 11 outputs a turn-on signal SE to the connection line 160 of the display device 200. The turn-on signal SE is, for example, a high-level voltage, which is, for example, passed through the switching line L EE To the connection line 160. When switching the circuit L EE Receiving a start signal SE, switching the line L EE The transmission channel between the display device 200 and the detection circuit is conducted so that the signal generated by the detection circuit 11 can pass through the switch circuit L EE To the display device 200. Further, the detection circuit 11 outputs a reference signal S C (e.g., a low level voltage) to the common electrode 155. Reference signal S C Detection of line L by common electrode COM To the common electrode 155.
In step S130, please refer to fig. 2 to 4, the detecting circuit 11 outputs a first turn-on signal S11 to the first testees of the first scan lines 120. The first on signal S11 is, for example, a high level voltage. The first person under test is, for example, the first scanning line detection circuit L G1 A first scan line segment 120 coupled to the first conduction signal S11 via a first scan line detection line L G1 And transmitting to the first subject.
Further, the detection circuit 11 may output the first off signal S31 to the first off. The first off signal S31 is, for example, a low level voltage. The first cutoff is the first scan line segment 120 out of the first measurement. The first cut-off signal S31 can detect the line L through the second scanning line G2 To the first interceptor.
In step S140, referring to fig. 2 to 4, the detecting circuit 11 outputs the second pilotThe pass signal S21 is sent to the second testers of the data lines 140. The second on signal S21 is, for example, a high level voltage. The second tester is for example connected to the first data line testing circuit L D1 The coupled data line 140, the second conducting signal S21 passes through the first data line detection line L D1 And transmitting to a second subject.
Further, the detection circuit 11 may output a second off signal S41 to the second off. The second off signal S41 is, for example, a low level voltage. The second cut-off is the second off-test data line 140. The second off signal S41 may detect the line L through the second data line D2 And transmitted to the second terminator.
In step S150, the detecting apparatus 10 generates a defect detection signal S5 based on the turn-off of the thin film transistor 135 coupling the first subject and the second subject. In detail, based on the conduction of the first and second subjects, the tft 135 coupling the first and second subjects should be turned on in a normal state. However, if the tft 135 coupling the first subject and the second subject is turned off, it indicates a line abnormality, for example, at least one of the selection line 150 and the adjacent line in the same layer, for example, the common electrode 155 at a low potential (for example, receiving a turn-off signal), the data line 140 at a low potential (for example, receiving a turn-off signal), and the first scan line segment 120 at a low potential (for example, receiving a turn-off signal), is shorted, so that the switch line L is switched EE Is forced to drop to a low potential (switching line L) EE Off) so that the thin film transistor 135 of the display device 200, which should be turned on, is forced to be turned off, which is an abnormal state. The inspection device 10 generates a defect detection signal S5 to indicate the abnormality to the tester.
In addition, the inspection apparatus 10 can simulate the on/off of the thin film transistor 135, so that an inspector or an inspection machine can easily determine whether a defect occurs. By way of further example, the detection device 10 also includes an analog panel (not shown) that can be disposed directly above the display device 200. The analog panel includes a plurality of pixel regions corresponding in position to the pixel regions PX of the display device 200. Each pixel region of the analog panel includes liquid crystal, and the liquid crystal changes its state to allow light to pass (emit light) when the thin film transistor 135 below is turned on. On the contrary, the liquid crystal state is changed to prevent light from passing (no light emission) based on the off of the lower thin film transistor 135. Therefore, by determining the bright or dark state of the pixel region of the analog panel, the tester or the inspection machine can determine the on or off state of the corresponding tft 135.
In addition, as shown in fig. 3, the first test signal T1 includes a first turn-on signal S11 and a turn-off signal S12 (low level voltage), the second test signal T2 includes a second turn-on signal S21 and a turn-off signal S22 (low level voltage), the third test signal T3 includes a first turn-off signal S31 and a turn-on signal S32 (high level voltage), and the fourth test signal T4 includes a second turn-off signal S41 and a turn-on signal S42 (high level voltage). The first test signal T1 passes through the first scanning line detection circuit L G1 The second test signal T2 is transmitted to the display device 200 via the second scan line detection line L G2 The third test signal T3 is transmitted to the display device 200 through the first data line detection line L D1 Transmitted to the display device 200, and the fourth test signal T4 is detected through the second data line detection line L D2 To the display device 200. Any one or any of all the thin film transistors may be turned on and the other one or more of all the thin film transistors may be turned off at a test time as long as the timing and/or the time length of the high level voltage and the low level voltage of the turn-on signal SE, the timing and/or the time length of the high level voltage and the low level voltage of the second test signal T2, the timing and/or the time length of the high level voltage and the low level voltage of the third test signal T3, and the timing and/or the time length of the high level voltage and the low level voltage of the fourth test signal T4 are properly designed.
In summary, the embodiment of the invention provides a display device and a detection method for detecting the same. The display device includes a plurality of selection lines connected by a connection line. Thus, in a line defect detection, a defect of a line adjacent to the select line (e.g., a line adjacent to the select line in the same layer) can be detected, e.g., a line shorted (or electrically connected) to the select line can be detected.
While the present invention has been described with reference to the above embodiments, it is not intended to be limited thereto. It will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the invention. Therefore, the protection scope of the present invention should be defined by the appended claims.
Claims (10)
1. A display device, comprising:
a plurality of landing pads;
a plurality of first scanning line segments, each first scanning line segment being connected to the corresponding switching pad along a first axial direction;
a plurality of second scan lines, each extending from the corresponding adapter pad along a second axial direction;
a plurality of data lines extending in the first axial direction;
a plurality of thin film transistors, each thin film transistor connecting the corresponding data line and the second scan line segment;
a plurality of selection lines extending along the first axial direction and disconnected from the first scanning line segments;
a connecting line connected to the selection lines; and
a first electrostatic protection component electrically connected to the connection line.
2. The display device of claim 1, further comprising:
a substrate having a display region and a non-display region;
the switching pads, the first scanning line segments, the second scanning line segments, the data lines and the selection lines are arranged in the display area, and the connecting line and the first electrostatic protection element are arranged in the non-display area.
3. The display device according to claim 2, wherein the non-display area has a first section and a second section opposite to each other, and the connecting line is disposed between the first section and the second section.
4. The display device of claim 1, further comprising:
a substrate;
wherein the first electrostatic protection component is arranged corresponding to a first rotating angle of the substrate.
5. The display device of claim 4, further comprising:
the second electrostatic protection part is electrically connected with the connecting wire and is arranged corresponding to a second corner of the substrate.
6. The display device of claim 5, wherein the first and second electrostatic shield are disposed on a same side of the display device.
7. The display device according to claim 1, wherein the plurality of landing pads are arranged along a diagonal of the display device.
8. The display device according to claim 1, wherein the display device further comprises a switch circuit, and the connection line, the first scan lines and the data lines are connected to the switch circuit.
9. A method of detection, comprising:
providing a display device, wherein the display device comprises a plurality of switching pads, a plurality of first scanning line segments, a plurality of second scanning line segments, a plurality of data lines, a plurality of thin film transistors, a plurality of selection lines, a connecting line and a first electrostatic protection piece, each first scanning line segment is connected to the corresponding switching pad along a first axial direction, each second scanning line segment extends from the corresponding switching pad along a second axial direction, the data lines extend along the first axial direction, each thin film transistor is connected with the corresponding data line and the second scanning line segment, the selection lines extend along the first axial direction and are disconnected from the first scanning line segments, the connecting line is connected with the selection lines, and the first electrostatic protection piece is electrically connected with the connecting line;
a detection device outputs a starting signal to the connecting line;
the detection device outputs a first conduction signal to a first person to be detected of the first scanning line segments;
the detection device outputs a second conduction signal to a second testee of the data lines; and
the detection device generates a defect detection signal based on the cut-off of the thin film transistor coupled to the first and second subjects.
10. The detecting method as claimed in claim 9, wherein the connecting line, the first scan lines and the data lines are connected to a switch circuit, and the first conducting signal, the second conducting signal and the third conducting signal are transmitted to the display device through the switch circuit.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111131664 | 2022-08-23 | ||
| TW111131664A TWI820876B (en) | 2022-08-23 | 2022-08-23 | Display device and inspection method using the same |
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| CN115938252A true CN115938252A (en) | 2023-04-07 |
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| CN202211557401.8A Pending CN115938252A (en) | 2022-08-23 | 2022-12-06 | Display device and detection method for detecting same |
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| TW (1) | TWI820876B (en) |
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|---|---|---|---|---|
| TWI635568B (en) * | 2017-10-18 | 2018-09-11 | 友達光電股份有限公司 | Device substrate |
| CN109698192B (en) * | 2017-10-23 | 2021-01-22 | 京东方科技集团股份有限公司 | Electrostatic protection circuit, array substrate and display device |
| TWI729493B (en) * | 2019-09-12 | 2021-06-01 | 友達光電股份有限公司 | Pixel array substrate |
-
2022
- 2022-08-23 TW TW111131664A patent/TWI820876B/en active
- 2022-12-06 CN CN202211557401.8A patent/CN115938252A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| TWI820876B (en) | 2023-11-01 |
| TW202409692A (en) | 2024-03-01 |
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