CN115864994B - Reliability evaluation method and system for photovoltaic module testing device - Google Patents
Reliability evaluation method and system for photovoltaic module testing device Download PDFInfo
- Publication number
- CN115864994B CN115864994B CN202310076998.2A CN202310076998A CN115864994B CN 115864994 B CN115864994 B CN 115864994B CN 202310076998 A CN202310076998 A CN 202310076998A CN 115864994 B CN115864994 B CN 115864994B
- Authority
- CN
- China
- Prior art keywords
- server
- test
- preset
- module
- reliability
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 409
- 238000011156 evaluation Methods 0.000 title claims abstract description 63
- 238000004088 simulation Methods 0.000 claims abstract description 77
- 238000000034 method Methods 0.000 claims abstract description 12
- 238000012544 monitoring process Methods 0.000 claims description 37
- 238000001704 evaporation Methods 0.000 claims description 22
- 230000008020 evaporation Effects 0.000 claims description 21
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 19
- 238000005070 sampling Methods 0.000 claims description 18
- 230000005540 biological transmission Effects 0.000 claims description 13
- 238000005286 illumination Methods 0.000 claims description 10
- 238000005259 measurement Methods 0.000 claims description 7
- 238000002360 preparation method Methods 0.000 claims description 3
- 230000000875 corresponding effect Effects 0.000 description 63
- 238000010586 diagram Methods 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 3
- 238000000342 Monte Carlo simulation Methods 0.000 description 2
- 230000032683 aging Effects 0.000 description 2
- 238000004422 calculation algorithm Methods 0.000 description 2
- 230000001276 controlling effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000012797 qualification Methods 0.000 description 2
- 238000012502 risk assessment Methods 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000005315 distribution function Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000013441 quality evaluation Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Photovoltaic Devices (AREA)
Abstract
The invention relates to the technical field of evaluation and prediction, in particular to a reliability evaluation method and a system for a photovoltaic module testing device, comprising the following steps: step S1, performing sunlight simulation and measuring the voltage of a test module; step S2, voltage stability assignment is carried out on the single model test module according to the simulation duration time; s3, performing uniformity stability assignment on the single model test module according to the test uniformity; s4, performing reliability assignment on the testing device; s5, judging the reliability of the device according to the reliability assignment and the actual measured value of the device to be tested; step S6, reliability assignment of the corresponding model is adjusted according to the operation data; by utilizing the steps, the method effectively reduces the complexity of the evaluation of the photovoltaic module testing device and simultaneously effectively improves the reasonability of the evaluation of the photovoltaic module testing device.
Description
Technical Field
The invention relates to the technical field of evaluation and prediction, in particular to a reliability evaluation method and system for a photovoltaic module testing device.
Background
The photovoltaic product is used as an emerging product, and because the product updating speed is high, the testing device and the testing method of the photovoltaic product are updated and perfected continuously, and on the basis, the working condition of the testing device is estimated, so that the photovoltaic product quality evaluation method has an extremely important auxiliary effect.
Chinese patent publication No.: CN108364117a discloses a grid risk assessment method considering the reliability of elements of a photovoltaic power station, classifying key elements of the photovoltaic power station according to an element failure mechanism, respectively establishing a two-state model of an inverter and a multi-state model of a photovoltaic array, and generating a photovoltaic power station output power probability model considering the reliability of the elements through state sampling; then, according to the modeling type extraction photovoltaic output value, determining the shutdown state and the system load state of the conventional generator and the circuit, and obtaining a deterministic system state of one sampling; then, calculating the load shedding amount of a primary deterministic sampling system through a direct current power flow optimal load shedding algorithm; finally, calculating the system load loss probability and the power deficiency expected risk index through non-sequential Monte Carlo simulation. According to the invention, all elements of the photovoltaic array are taken as a whole and divided into a multi-state model according to the cumulative distribution function, so that the problems of large memory consumption, low sampling speed, low calculation efficiency and the like possibly caused by sampling the state of each photovoltaic element are effectively solved, and the power grid risk assessment efficiency of the photovoltaic power station is improved; chinese patent publication No.: CN105260952a discloses a photovoltaic power station reliability evaluation method based on a markov chain monte carlo method, which utilizes the establishment of a markov chain model of each element, state sampling, operation process simulation and judgment of algorithm convergence. The invention has good stability and good correctness and superiority in reliability evaluation of large-scale photovoltaic power stations.
It can be seen that the above technical solution has the following problems:
1. the rationality of the operation of the simulation device cannot be judged;
2. it is impossible to determine whether the test device works reasonably.
Disclosure of Invention
Therefore, the invention provides a reliability evaluation method and a reliability evaluation system for a photovoltaic module testing device, which are used for solving the problems that in the prior art, the rationality of simulated sunlight cannot be judged, whether the testing device works reasonably or not cannot be judged, and the rationality of the evaluation of the testing device is reduced.
In one aspect, the present invention provides a reliability evaluation method for a photovoltaic module testing apparatus, including:
step S1, a server controls a single test module with a single model to simulate sunlight and measures working voltage of the test module through a monitoring module, and the monitoring module records that the duration from starting of the test module until the voltage fluctuation exceeds a preset voltage fluctuation allowable value is simulation duration and transmits the simulation duration to the server;
step S2, when the voltage fluctuation quantity exceeds the preset voltage fluctuation allowable value, the server judges that the voltage stability of the single-model test module exceeds a preset allowable interval, and the server carries out voltage stability assignment on the single-model test module according to the simulation duration;
Step S3, the server places the simulation module in a test range corresponding to the test module, controls the monitoring module to record water quantity changes of all positions in the simulation module and transmit the water quantity changes to the server, and judges the test uniformity of the test module according to the time from reaching a first preset simulation condition to reaching a second preset simulation condition in all sampling intervals of the simulation module, and carries out uniformity stability assignment on a single model test module according to the test uniformity;
step S4, the server performs stability assignment on the single test module according to the voltage stability assignment and the uniformity stability assignment, and simultaneously performs reliability assignment on the test device of the corresponding model in the test module according to the rated voltage of the power supply device of the test module and the stability assignment;
step S5, when the server finishes the reliability assignment to the testing device, the server controls the testing module corresponding to the testing device to be tested and the corresponding simulation module to simulate the steps, calculates the corresponding actual reliability assignment as an actual reliability measurement value, and judges the reliability of the testing device to be tested according to the reliability assignment and the actual reliability measurement value of the testing device to be tested;
Step S6, the server tests a plurality of to-be-tested devices, and when a first preset adjustment condition is met, the server adjusts the reliability assignment of the corresponding model according to the operation data of the to-be-tested device corresponding to the to-be-tested device;
the first preset simulation condition is a corresponding moment when a first sampling interval of the simulation module reaches a preset state;
the second preset simulation condition is the corresponding moment when all sampling intervals of the simulation module reach a preset state;
the first preset adjustment condition is the corresponding moment when the server completes reliability judgment on the preset number of the to-be-tested devices.
Further, rated voltage and rated power corresponding to the ith model test module are stored in the server, the server controls the ith test module to simulate sunlight with corresponding rated voltage, preset power and preset illuminance, preset preheating duration is set in the server, and when the simulated sunlight of the test module reaches the preset preheating duration Tyi, the server controls the monitoring module to periodically test and continuously record the voltage of the test module with preset transmission duration;
The server is provided with a preset voltage fluctuation allowable value, and when the server judges that the difference value between the voltage value tested by the monitoring module and the rated voltage V0i is larger than the preset voltage fluctuation allowable value for the j-th preset transmission duration, the server judges that the voltage fluctuation of the i-th model test module in the j-th preset transmission duration exceeds the preset allowable interval, and assigns the voltage stability VWi of the i-th model test module to VWi =j;
wherein i=1, 2,3, …, n, n is the maximum value corresponding to the number of the test module models recorded by the server, n is an integer greater than 2, j=1, 2,3, …, m, m is the maximum value corresponding to the maximum number of the preset transmission duration recorded by the server, m is an integer greater than 3, and the preset allowable interval is a reasonable fluctuation interval of alternating voltage.
Taking 100V as an example, the power supply is AC, and the voltage fluctuation allowable value is set to 15V, and the preset allowable interval is 85V-115V.
Namely, when the voltage value tested by the monitoring module is 85V-115V, the monitoring module judges that the voltage value does not exceed a preset allowable interval; the allowable value of 15V is the normal fluctuation of the conventional alternating current power transmission, namely a reasonable fluctuation interval.
Further, for the test module of the ith model, the server stores the illuminance of the test module generated when the test module is rated at the rated power as Zi, a preset starting duration Tqi and a preset test range Si, a unit test interval δsk is stored in the server, the server divides Si into a plurality of simulation test intervals δsik according to the shape of the preset test range Si, and the corresponding simulation module is set according to the division result, wherein any simulation test interval δsik=δsk;
in the step S3, the server calculates the illuminance variance corresponding to each simulation test interval δsik in the preset test range Si
The value of (2) is recorded as the test uniformity corresponding to the test module of the ith model, and #>
Judging the uniformity stability value corresponding to the test module of the ith model according to the evaporation test, and assigning the uniformity stability of the test module of the ith model according to the test uniformity and the uniformity stability value;
the simulation module is internally provided with a horizontal platform which is perpendicular to the simulated solar illumination direction of the test module, the horizontal platform is provided with a plurality of cubic containers with identical shapes, a single cubic container is used as a single sampling interval, and the opening cross-section area of the single cubic container is identical to that of a single simulation test interval delta Sik;
Where k=1, 2,3, …, q, q is the maximum value of the unit test interval that the server will divide in the test range corresponding to a single piece, and q is an integer greater than 1.
Further, before the evaporation test is performed on the preset test range Si, each cube container is placed at a corresponding position of the horizontal platform so that the cube containers are in one-to-one correspondence with the simulation test interval, and a preset volume of water is filled into each cube container to complete preparation of the evaporation test;
when the server judges that the preset starting time Tqi is reached, the server controls the simulation module to open the opening of each cube container, controls the monitoring module to record the evaporation time of water in each container in each simulation module, and sets the evaporation time of the kth cube container as Tqik from the moment of Tqi of the preset starting time to the moment of complete evaporation of water in the kth cube container;
the server equalizes the ith preset test range The uniformity stable value was recorded as JWi, and JWi =maxtqik-minTqik was set, where mintqik=
，maxTqik=
。
Further, in the step S4, for the ith test device corresponding to the ith model test module, the server sets a reliability assignment Ki of the ith test device as represented by formula (1):
Ki=
（1）
wherein ,
is->
And the decimal place of the value of Ki approximates to the percentile.
Further, when the server performs reliability evaluation on the test device i ' of the same model as the i-th test device, the server calculates a reliability assignment Ki ' of the test device i ', compares the reliability assignment Ki ' with a Ki difference Δki ' to determine the reliability of the test device i ', and sets Δki ' =
A first preset fluctuation difference value K alpha and a second preset fluctuation difference value K beta are arranged in the server, wherein 0 is smaller than K alpha and smaller than K beta, the first preset fluctuation difference value K alpha is an error fluctuation difference value, the second preset fluctuation difference value K beta is a critical fluctuation difference value,
if ΔKi 'is less than or equal to Kα, the server determines that the reliability of the testing device i' is in a first preset allowable range;
if K alpha is less than delta Ki ' < K beta, the server judges that the reliability of the testing device i ' is in a second preset tolerance range, and further judges according to the use times and the use time of the testing device i ';
If Kbeta is less than or equal to deltaKi ', the server judges that the reliability of the testing device i ' exceeds a preset tolerance range and judges that the testing device i ' is damaged;
the first preset allowable range is an allowable range corresponding to normal fluctuation of the testing device in operation, and the second preset allowable range is an allowable range corresponding to normal fluctuation of the testing device, which is beyond normal use and is not affected.
Further, in the step S6, when the server completes the reliability judgment of the plurality of test devices i 'having the same model as the i-th test device and reaches the first preset adjustment condition, the server adjusts the value of Ki' according to the value of Ki 'corresponding to each test device i';
the server calculates an adjustment target value δki of Ki from the Ki', δki being determined by formula (2):
δKi=
（2）
wherein a is the preset number up to the first preset adjustment condition,
summing values distributed in a range from 0.3a to 0.7a after normal distribution is carried out on Ki 'values corresponding to the test devices i', and rounding 0.3a and 0.7a respectively;
when the monitoring module determines that the voltage of the power supply device exceeds 1.8 times of rated voltage at any time, the server determines that the power supply device is damaged, the testing device is unreliable, and stops operating the testing device.
Further, for the ith test device, the server is provided with a corresponding preset limit use time length ST0i and a preset limit use number CT0i, and the server gives an individual reduction value Gi to the reliability of the ith test device according to the use time length stb and the use number CTi of the ith test device, wherein Gi is determined by the formula (3):
Gi=
（3）
when the server determines the value of Gi, the server adjusts the reliability assignment Ki of the ith test apparatus, and marks the adjusted value as ζki, where ζki=gi×ki.
Further, a preset reliability threshold value K zeta is arranged in the server, and when the server evaluates the reliability of the ith testing device, if zeta Ki is less than or equal to K zeta, the server marks the ith testing device as a risk device;
when the server evaluates the reliability of the risk device, if the monitoring module detects that the working voltage value of the risk device exceeds the preset tolerance interval, the server judges that the risk device is scrapped, and meanwhile, the risk device is powered off and scrapped and warned.
Further, the server judges that the reliability of the single testing device reaches a first capacity reliability condition, the server marks the testing result of the single photovoltaic module by using the testing device as a reliable result, if the reliable result of the photovoltaic module is qualified, the server marks the photovoltaic module as a qualified photovoltaic module, and controls the assembly module to assemble each qualified photovoltaic module into a photovoltaic panel;
The first tolerance condition is that a server judges that the testing device is in the first preset tolerance range or the second preset tolerance range.
In another aspect, the present invention provides a reliability evaluation system for a photovoltaic module testing apparatus, comprising:
a test module to test the photovoltaic module, comprising:
the testing device is used for radiating simulated sunlight to the photovoltaic module to be tested;
the power supply device is connected with the testing device and used for providing stable voltage to supply power to the testing device;
the simulation module comprises a horizontal platform and a plurality of cube containers and is used for simulating the testing uniformity of the testing device;
the monitoring module is connected with the power supply device and is used for observing the testing module and monitoring voltage fluctuation of the power supply device, illuminance of the testing device and/or evaporation degree of liquid in the simulation module cube container;
an assembly module to assemble the qualified photovoltaic modules;
and the server is respectively connected with the monitoring module, the assembling module and each device of the testing module and is used for controlling each device in the testing module to execute corresponding actions and analyzing the information collected by the monitoring module.
Compared with the prior art, the method has the beneficial effects that the reliability of the testing device is evaluated by utilizing a mode of testing and assigning a value to a single type of testing device, and meanwhile, the reliability is adjusted according to the subsequent measuring result, so that the evaluation complexity of the photovoltaic module testing device is effectively reduced, and the evaluation rationality of the photovoltaic module testing device is effectively improved.
Further, the operation states of the photovoltaic modules are classified by means of testing and assigning the voltage stability of the testing device, so that the reliability judgment accuracy of the use of the photovoltaic module testing device is effectively improved, and meanwhile, the reasonability of the evaluation of the photovoltaic module testing device is further improved.
Furthermore, the illumination uniformity of the testing device is assigned by judging the illumination in the testing range, so that the reliability evaluation complexity of the testing device is effectively reduced, and the evaluation rationality of the photovoltaic module testing device is further improved.
Further, through setting up a plurality of containers on the simulation module, and the mode of evaporating test is carried out, tests testing arrangement's energy conduction degree of consistency, when effectively promoting testing arrangement reliability evaluation accuracy, further promoted photovoltaic module testing arrangement and evaluated rationality.
Furthermore, the reliability of the testing device is assigned according to each item of data measured by the monitoring module, so that the reliability evaluation intuitiveness of the testing device is effectively improved, and the evaluation reasonability of the photovoltaic module testing device is further improved.
Further, the actual reliability of each testing device is judged by means of the fluctuation value of the reliability assignment, and the reliability evaluation practicability of the testing device is effectively improved, and meanwhile the evaluation rationality of the photovoltaic module testing device is further improved.
Further, the reliability assignment is adjusted by utilizing the test result and utilizing the normal distribution to adjust the test result, and the voltage of the power supply device is tested, so that the power is timely cut off and the operation of the test device is stopped when the voltage is severely fluctuated, the reliability assignment accuracy is effectively improved, the test device is protected, the inaccuracy of data collected by the monitoring module due to the power supply problem is avoided, and the evaluation rationality of the photovoltaic module test device is further improved.
Furthermore, the reliability of each testing device is reduced by giving an individual value to each testing device, so that the failure of the testing device caused by aging is effectively avoided, and the evaluation rationality of the photovoltaic module testing device is further improved.
Further, the running process of the testing device is monitored by setting the reliability threshold, and the voltage test is carried out on the testing device with the reliability reduced to the threshold, so that the running stability of the testing device is effectively improved, and meanwhile, the evaluation rationality of the photovoltaic module testing device is further improved.
Further, the photovoltaic modules are tested in batches, and the qualified photovoltaic modules are assembled, so that the qualification rate of the photovoltaic modules is effectively improved, and meanwhile, the evaluation rationality of the photovoltaic module testing device is further improved.
Drawings
FIG. 1 is a flow chart of a reliability evaluation method for a photovoltaic module testing apparatus of the present invention;
FIG. 2 is a block diagram of a reliability evaluation system for a photovoltaic module testing apparatus according to the present invention;
FIG. 3 is a schematic diagram showing a testing range of a testing device according to an embodiment of the present invention;
FIG. 4 is a schematic view of an embodiment of a simulation module according to the present invention;
wherein: 1: a test range; 2: a container.
Detailed Description
In order that the objects and advantages of the invention will become more apparent, the invention will be further described with reference to the following examples; it should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
Preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are merely for explaining the technical principles of the present invention, and are not intended to limit the scope of the present invention.
It should be noted that, in the description of the present invention, terms such as "upper," "lower," "left," "right," "inner," "outer," and the like indicate directions or positional relationships based on the directions or positional relationships shown in the drawings, which are merely for convenience of description, and do not indicate or imply that the apparatus or elements must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, it should be noted that, in the description of the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention can be understood by those skilled in the art according to the specific circumstances.
Referring to fig. 1, which is a flowchart of a reliability evaluation method for a photovoltaic module testing apparatus according to the present invention, the reliability evaluation method for a photovoltaic module testing apparatus according to the present invention includes:
step S1, a server controls a single test module with a single model to simulate sunlight and measures working voltage of the test module through a monitoring module, and the monitoring module records that the duration from starting of the test module until the voltage fluctuation exceeds a preset voltage fluctuation allowable value is simulation duration and transmits the simulation duration to the server;
step S2, when the voltage fluctuation quantity exceeds a preset voltage fluctuation allowable value, the server judges that the voltage stability of the single-model test module exceeds a preset allowable interval, and the server carries out voltage stability assignment on the single-model test module according to the simulation duration;
step S3, the server places the simulation module in a test range corresponding to the test module, controls the monitoring module to record water quantity changes of all positions in the simulation module and transmit the water quantity changes to the server, and judges the test uniformity of the test module according to the time from reaching a first preset simulation condition to reaching a second preset simulation condition in all sampling intervals of the simulation module, and carries out uniformity stability assignment on the test module of a single model according to the test uniformity;
Step S4, the server performs stability assignment on the single test module according to the voltage stability assignment and the uniformity stability assignment, and meanwhile, the server performs reliability assignment on the corresponding model of test device in the test module according to the rated voltage and the stability assignment of the power supply device of the test module;
step S5, when the server finishes the reliability assignment to the testing device, the server controls the testing module corresponding to the testing device to be tested and the corresponding simulation module to simulate the testing device by the steps, calculates the corresponding actual reliability assignment as an actual reliability measurement value, and judges the reliability of the testing device to be tested according to the reliability assignment and the actual reliability measurement value of the testing device to be tested;
step S6, the server tests a plurality of to-be-tested devices, and when a first preset adjustment condition is met, the server adjusts reliability assignment of corresponding models according to operation data of the to-be-tested devices corresponding to the to-be-tested devices;
the first preset simulation condition is the corresponding moment when the first sampling interval of the simulation module reaches a preset state;
the second preset simulation condition is the corresponding moment when all sampling intervals of the simulation module reach a preset state;
The first preset adjustment condition is the corresponding moment when the server completes reliability judgment on the preset number of to-be-tested devices.
The reliability of the testing device is evaluated by testing and assigning the single-class testing device, and meanwhile, the reliability is adjusted according to the subsequent measurement result, so that the evaluation complexity of the photovoltaic module testing device is effectively reduced, and the evaluation rationality of the photovoltaic module testing device is effectively improved.
Referring to fig. 2, which is a block diagram of a reliability evaluation system for a photovoltaic module testing apparatus according to the present invention, the system comprises:
a test module for testing a photovoltaic module, comprising:
the testing device is used for radiating simulated sunlight to the photovoltaic module to be tested;
the power supply device is connected with the testing device and used for providing stable voltage to supply power to the testing device;
the simulation module comprises a horizontal platform and a plurality of cube containers and is used for simulating the testing uniformity of the testing device;
the monitoring module is connected with the power supply device and is used for observing the testing module and monitoring voltage fluctuation of the power supply device, illuminance of the testing device and/or evaporation degree of liquid in the simulated module cube container;
An assembly module to assemble a qualified photovoltaic module;
and the server is respectively connected with the monitoring module and each device of the testing module and is used for controlling each device in the testing module to execute corresponding actions and analyzing the information collected by the monitoring module.
Specifically, rated voltage and rated power corresponding to the ith model test module are stored in the server, the server controls the ith test module to simulate sunlight with corresponding rated voltage, preset power and preset illuminance, preset preheating duration is set in the server, and when the simulated sunlight of the test module reaches the preset preheating duration Tyi, the server controls the monitoring module to periodically test and continuously record the voltage of the test module with preset transmission duration;
the method comprises the steps that a preset voltage fluctuation allowable value is arranged in a server, for the jth preset transmission time length, when the server judges that the difference value between the voltage value tested by a monitoring module and a rated voltage V0i is larger than the preset voltage fluctuation allowable value, the server judges that the voltage fluctuation of the ith model test module in the jth preset transmission time length exceeds a preset allowable interval, and assigns the voltage stability VWi of the ith model test module to VWi =j;
Wherein i=1, 2,3, …, n, n is the maximum value corresponding to the number of test module models recorded by the server, n is an integer greater than 2, j=1, 2,3, …, m, m is the maximum value corresponding to the maximum number of preset transmission durations recorded by the server, m is an integer greater than 3, and the preset allowable interval is a reasonable fluctuation interval of alternating voltage.
The method for testing and assigning the voltage stability of the testing device is utilized to classify the running state of the photovoltaic module, so that the reliability judgment accuracy of the use of the photovoltaic module testing device is effectively improved, and meanwhile, the reasonability of the evaluation of the photovoltaic module testing device is further improved.
Fig. 3 is a schematic diagram showing a testing range of a testing device according to an embodiment of the invention.
When testing is carried out, the testing device emits simulated sunlight to the photovoltaic module, wherein the part with uniform illumination is the testing range 1.
For the test module of the ith model, the server stores the illuminance Zi generated when the test module is rated, the preset starting time Tqi and the preset test range Si, the server also stores a unit test interval delta Sk, the server divides Si into a plurality of simulation test intervals delta Sik according to the shape of the preset test range Si, and corresponding simulation modules are arranged according to the division result, wherein any simulation test interval delta Sik=delta Sk;
In step S3, the server sets the illuminance variance corresponding to each simulation test interval δSik in the preset test range Si
The value of (2) is marked as the test uniformity corresponding to the test module of the ith model, and +.>
Judging a uniformity stability value corresponding to the test module of the ith model according to the evaporation test, and assigning a uniformity stability value to the test module of the ith model according to the test uniformity and the uniformity stability value;
the simulation module is internally provided with a horizontal platform which is perpendicular to the simulated solar illumination direction of the test module, the horizontal platform is provided with a plurality of cubic containers with identical shapes, the single cubic container is used as a single sampling interval, and the opening cross-section area of the single cubic container is identical to that of a single simulation test interval delta Sik;
where k=1, 2,3, …, q, q is the maximum value of the unit test section that the server will correspond to divided in a single test range, and q is an integer greater than 1.
And the illumination uniformity of the testing device is assigned by judging the illumination in the testing range, so that the reliability evaluation complexity of the testing device is effectively reduced, and the evaluation rationality of the photovoltaic module testing device is further improved.
Specifically, before the evaporation test is performed on the preset test range Si, each cube container is placed at a corresponding position of the horizontal platform so that the cube containers are in one-to-one correspondence with the simulation test interval, and a preset volume of water is filled into each cube container to complete the preparation of the evaporation test;
when the server judges that the preset starting time Tqi is reached, the server controls the simulation module to open the opening of each cube container, controls the monitoring module to record the evaporation time of water in each container in each simulation module, and sets the evaporation time of the kth cube container as Tqik from the moment of Tqi of the preset starting time to the moment of complete evaporation of water in the kth cube container;
the server marks the uniformity stable value of the ith preset test range as JWi, and sets JWi =maxtqik-minTqik, wherein mintqik=
，maxTqik=
。
The energy conduction uniformity of the testing device is tested by arranging a plurality of containers on the simulation module and performing an evaporation test, so that the reliability evaluation accuracy of the testing device is effectively improved, and the evaluation rationality of the photovoltaic module testing device is further improved.
Specifically, in step S4, the server sets the reliability assignment Ki of the i-th test device for the i-th test device corresponding to the i-th test module, as represented by formula (1):
Ki=
（1）
wherein ,
is->
And the decimal place of the value of Ki approximates to the percentile.
The reliability of the testing device is assigned according to each item of data measured by the monitoring module, so that the reliability evaluation intuitiveness of the testing device is effectively improved, and the evaluation reasonability of the photovoltaic module testing device is further improved.
Specifically, when the server pairWhen the reliability evaluation is performed on the test device i 'of the same model as the i-th test device, the server calculates the reliability assignment Ki' of the test device i ', compares the reliability assignment Ki' with the Ki according to the difference value deltaki 'between Ki' and Ki to determine the reliability of the test device i ', and sets deltaki' =
The server is provided with a first preset fluctuation difference value K alpha and a second preset fluctuation difference value K beta, wherein K alpha is more than 0 and less than K beta, K alpha is an error fluctuation difference value, K beta is a critical fluctuation difference value, and K beta is a critical fluctuation difference value>
If the delta Ki 'is less than or equal to K alpha, the server judges that the reliability of the testing device i' is in a first preset allowable range;
If K alpha is less than delta Ki ' < K beta, the server judges that the reliability of the testing device i ' is in a second preset tolerance range, and further judges according to the use times and the use time of the testing device i ';
if Kbeta is less than or equal to deltaKi ', the server judges that the reliability of the testing device i ' exceeds a preset tolerance range and judges that the testing device i ' is damaged;
the first preset allowable range is an allowable range corresponding to normal fluctuation of the testing device in operation, and the second preset allowable range is an allowable range corresponding to normal use of the testing device when the testing device exceeds the normal fluctuation and is not influenced.
The actual reliability of each testing device is judged by means of setting the fluctuation value of the reliability assignment, and the reliability evaluation practicality of the testing device is effectively improved, and meanwhile the evaluation rationality of the photovoltaic module testing device is further improved.
Specifically, in step S6, when the server completes the adjustment of the plurality of test devices i ' having the same model as the i-th test device to the first preset adjustment condition, the server adjusts the value of Ki according to the value of Ki ' corresponding to each test device i ';
the server reorders the values of Ki' from small to large and marks the new sequence number as i ", where i" =1, 2,3, …, a, a is the preset number corresponding to the first preset adjustment condition, δki is set as the adjustment target value corresponding to Ki, δki is determined by equation (2):
δKi=
（2）
Wherein a is the preset number up to the first preset adjustment condition,
summing values distributed in a range from 0.3a to 0.7a after normal distribution is carried out on Ki 'values corresponding to the test devices i', and rounding 0.3a and 0.7a respectively;
the reliability assignment is adjusted by utilizing the test result and utilizing the normal distribution to adjust the test result, so that the reliability assignment accuracy is effectively improved, and the evaluation rationality of the photovoltaic module testing device is further improved.
Specifically, when the monitoring module determines that the voltage of the ith power supply device exceeds V0i which is 1.8 times at any one time, the server determines that the power supply device is damaged, determines that the test device is unreliable, and stops operating the test device.
Through testing the voltage of power supply unit, when voltage is violent undulant, in time outage and stop testing arrangement operation, when having protected testing arrangement, avoided because of the power supply problem leads to the data inaccuracy that monitoring module collected to further promoted the rationality that photovoltaic module testing arrangement aassessment.
Specifically, for the i-th test device, the server is provided with a corresponding preset limit use time length ST0i and a preset limit use number CT0i, and the server gives an individual decrease value Gi to the reliability of the i-th test device according to the use time length stb and the use number CTi of the i-th test device, where Gi is determined by the formula (3):
Gi=
（3）
When the server determines the value of Gi, the server adjusts the reliability assignment Ki of the i-th test device and marks the adjusted value as xi Ki, where xi ki=gi×ki.
The reliability of each testing device is reduced by giving an individual value to each testing device, so that the evaluation rationality of the photovoltaic module testing device is further improved while the failure of the testing device caused by aging is effectively avoided.
Specifically, a preset reliability threshold value K zeta is arranged in the server, and when the server tests the ith testing device, if the zeta Ki is less than or equal to K zeta, the server marks the ith testing device as a risk device;
when the server detects that the risk device works, if the monitoring module monitors that the voltage value corresponding to the wind direction device exceeds the preset tolerance interval, the server judges that the risk device is scrapped, and meanwhile, the risk device is powered off and scrapped and warned.
The running process of the testing device is monitored by setting the reliability threshold value, and the voltage test is carried out on the testing device with the reliability reduced to the threshold value, so that the running stability of the testing device is effectively improved, and the reasonability of the evaluation of the photovoltaic module testing device is further improved.
The server judges that the reliability of the single testing device reaches a first tolerance reliability condition, the server marks the testing result of the single photovoltaic module by using the testing device as a reliable result, if the reliable result of the photovoltaic module is qualified, the server marks the photovoltaic module as a qualified photovoltaic module, and controls the assembly module to assemble each qualified photovoltaic module into a photovoltaic panel;
the first tolerance condition is that the server judges that the testing device is in a first preset tolerance range or a second preset tolerance range.
The photovoltaic modules are tested in batches, and the qualified photovoltaic modules are assembled, so that the qualification rate of the photovoltaic modules is effectively improved, and meanwhile, the reasonability of evaluation of the photovoltaic module testing device is further improved.
The reliability evaluation of the photovoltaic module by using the method and the system can achieve the following effects:
at a voltage ofStability assignment VWi =900, v0i=220, uniformity stability value JWi =60, variance
=1.25, maxtqik=120 for example:
Ki=[900/220]+60/（120×1.25）=[4.09]+0.4=4.40
i.e. the reliability assignment of the test device model corresponding to the i-th test device is 4.40.
When 10 tests corresponding to the above test apparatus were performed according to ki=4.40, the measured reliability assignments were:
3.55 3.57 3.90 3.54 3.73
3.94 3.20 4.05 4.97 5.07
After sorting from small to large, the order is:
3.20、3.54、3.55、3.57、3.73、3.90、3.94、4.05、4.97、5.07
calculating δki according to the above order, then:
δKi=（5.07-4.40）×（3.55+3.57+3.73+3.90+3.94）/4.40+4.40=4.97
i.e. the adjustment target value of the test device model corresponding to the i-th test device is 4.97.
Please refer to fig. 4:
the test device refracts the light source through a plurality of lenses with set positions to simulate sunlight, the lenses in the test device form refraction, when the test area is irradiated, light spots of the test device generate illumination brightness differences with different brightness in the test area caused by the refraction of the lenses, which are also called ghosts, so that under the condition of the same illumination, the energy transfer efficiency is different, the reliability of the test device is further reduced, based on the differences,
the simulation module divides the test area into 4 squares, wherein each square comprises a square container, a certain volume of water is contained in each square, when the reliability evaluation is carried out, the test area is irradiated by the test device, and meanwhile, the water in the containers of each square is evaporated synchronously; when the water in the first container evaporates, the server records its corresponding point in time and sets it as minTqik, and when the water in all containers completely evaporates, the server records its corresponding point in time and sets it as maxTqik, and at the same time calculates the uniformity stabilization value JWi, jwi=maxtqik-minTqik.
Taking the serial number of the minTqik corresponding to the time point as 60 and the serial number of the maxtqik corresponding to the time point as 110 as an example: JWi =110-60=50, i.e. the uniformity stabilizing value for the ith test range is 50.
Thus far, the technical solution of the present invention has been described in connection with the preferred embodiments shown in the drawings, but it is easily understood by those skilled in the art that the scope of protection of the present invention is not limited to these specific embodiments. Equivalent modifications and substitutions for related technical features may be made by those skilled in the art without departing from the principles of the present invention, and such modifications and substitutions will be within the scope of the present invention.
The foregoing description is only of the preferred embodiments of the invention and is not intended to limit the invention; various modifications and variations of the present invention will be apparent to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A reliability evaluation method for a photovoltaic module testing apparatus, comprising:
step S1, a server controls a single test module with a single model to simulate sunlight and measures working voltage of the test module through a monitoring module, and the monitoring module records that the duration from starting of the test module until the voltage fluctuation exceeds a preset voltage fluctuation allowable value is simulation duration and transmits the simulation duration to the server;
Step S2, when the voltage fluctuation quantity exceeds the preset voltage fluctuation allowable value, the server judges that the voltage stability of the single-model test module exceeds a preset allowable interval, and the server carries out voltage stability assignment on the single-model test module according to the simulation duration;
step S3, the server places the simulation module in a test range corresponding to the test module, controls the monitoring module to record water quantity changes of all positions in the simulation module and transmit the water quantity changes to the server, and judges the test uniformity of the test module according to the time from reaching a first preset simulation condition to reaching a second preset simulation condition in all sampling intervals of the simulation module, and carries out uniformity stability assignment on a single model test module according to the test uniformity;
step S4, the server performs stability assignment on the single test module according to the voltage stability assignment and the uniformity stability assignment, and simultaneously performs reliability assignment on the test device of the corresponding model in the test module according to the rated voltage of the power supply device of the test module and the stability assignment;
Step S5, when the server finishes the reliability assignment to the testing device, the server controls the testing module corresponding to the testing device to be tested and the corresponding simulation module to simulate the steps, calculates the corresponding actual reliability assignment as an actual reliability measurement value, and judges the reliability of the testing device to be tested according to the reliability assignment and the actual reliability measurement value of the testing device to be tested;
step S6, the server tests a plurality of to-be-tested devices, and when a first preset adjustment condition is met, the server adjusts the reliability assignment of the corresponding model according to the operation data of the to-be-tested device corresponding to the to-be-tested device;
the first preset simulation condition is a corresponding moment when a first sampling interval of the simulation module reaches a preset state; the second preset simulation condition is the corresponding moment when all sampling intervals of the simulation module reach a preset state; the first preset adjustment condition is the corresponding moment when the server completes reliability judgment on the preset number of the to-be-tested devices.
2. The reliability evaluation method for a photovoltaic module testing device according to claim 1, wherein the server stores rated voltage and rated power corresponding to an ith model testing module, the server controls the ith testing module to simulate sunlight with corresponding rated voltage, preset power and preset illuminance, a preset preheating duration is set in the server, and when the testing module simulates sunlight to reach the preset preheating duration Tyi, the server controls the monitoring module to periodically test and continuously record the voltage of the testing module with the preset transmission duration;
The server is provided with a preset voltage fluctuation allowable value, and when the server judges that the difference value between the voltage value tested by the monitoring module and the rated voltage V0i is larger than the preset voltage fluctuation allowable value for the j-th preset transmission duration, the server judges that the voltage fluctuation of the i-th model test module in the j-th preset transmission duration exceeds the preset allowable interval, and assigns the voltage stability VWi of the i-th model test module to VWi =j;
wherein i=1, 2,3, …, n, n is the maximum value corresponding to the number of the test module models recorded by the server, n is an integer greater than 2, j=1, 2,3, …, m, m is the maximum value corresponding to the maximum number of the preset transmission duration recorded by the server, m is an integer greater than 3, and the preset allowable interval is a reasonable fluctuation interval of alternating voltage.
3. The reliability evaluation method for a photovoltaic module testing apparatus according to claim 2, wherein, for the test module of the ith model, the server stores the illuminance Zi generated by the test module of the ith model at the rated power, the preset starting duration Tqi and the preset test range Si, the server also stores a unit test interval δsk, the server divides Si into a plurality of simulation test intervals δsik according to the shape of the preset test range Si, and sets the corresponding simulation module according to the division result, wherein any one of the simulation test intervals δsik=δsk;
In the step S3, the server calculates the illuminance variance corresponding to each simulation test interval δsik in the preset test range Si
The value of (2) is recorded as the test uniformity corresponding to the test module of the ith model, and #>
Judging the uniformity stability value corresponding to the test module of the ith model according to the evaporation test, and assigning the uniformity stability of the test module of the ith model according to the test uniformity and the uniformity stability value;
the simulation module is internally provided with a horizontal platform which is perpendicular to the simulated solar illumination direction of the test module, the horizontal platform is provided with a plurality of cubic containers with identical shapes, a single cubic container is used as a single sampling interval, and the opening cross-sectional area of the single cubic container is identical to that of a single simulation test interval delta Sik;
where k=1, 2,3, …, q, q is the maximum value of the unit test interval that the server will divide in the test range corresponding to a single piece, and q is an integer greater than 1.
4. The reliability evaluation method for a photovoltaic module testing apparatus according to claim 3, wherein, before performing the evaporation test on the preset test range Si, preparation of the evaporation test is completed by placing each of the cube containers at a corresponding position of the horizontal platform so that the cube containers are in one-to-one correspondence with the simulation test sections, and filling a preset volume of water into each of the cube containers;
When the server judges that the preset starting time Tqi is reached, the server controls the simulation module to open the opening of each cube container, controls the monitoring module to record the evaporation time of water in each container in each simulation module, and sets the evaporation time of the kth cube container as Tqik from the moment of Tqi of the preset starting time to the moment of complete evaporation of water in the kth cube container;
the server marks the uniformity stable value of the ith preset test range as JWi, and sets JWi =maxtqik-minTqik, wherein mintqik=
，maxTqik=
。
5. The method according to claim 4, wherein in the step S4, for the ith test device corresponding to the ith model test module, the server sets a reliability assignment Ki of the ith test device as represented by formula (1):
Ki=
（1）
wherein ,
is->
And the decimal place of the value of Ki approximates to the percentile.
6. The reliability evaluation method for a photovoltaic module testing apparatus according to claim 5, wherein when the server performs reliability evaluation on a testing apparatus i ' of the same model as the i-th testing apparatus, the server calculates a reliability assignment Ki ' of the testing apparatus i ', and compares a difference Δki ' between Ki ' and Ki to determine the reliability of the testing apparatus i ', setting Δki ' =
The server is provided with a first preset fluctuation difference value K alpha and a second preset fluctuation difference value K beta, wherein K alpha is more than 0 and less than K beta, K alpha is an error fluctuation difference value, K beta is a critical fluctuation difference value, and K beta is a critical fluctuation difference value>
If ΔKi 'is less than or equal to Kα, the server determines that the reliability of the testing device i' is in a first preset allowable range;
if K alpha is less than delta Ki ' < K beta, the server judges that the reliability of the testing device i ' is in a second preset tolerance range, and further judges according to the use times and the use time of the testing device i ';
if Kbeta is less than or equal to deltaKi ', the server judges that the reliability of the testing device i ' exceeds a preset tolerance range and judges that the testing device i ' is damaged;
the first preset allowable range is an allowable range corresponding to normal fluctuation of the testing device in operation, and the second preset allowable range is an allowable range corresponding to normal fluctuation of the testing device, which is beyond normal use and is not affected.
7. The method according to claim 6, wherein in the step S6, when the server completes the reliability determination of the plurality of test devices i 'of the same model as the i-th test device and reaches the first preset adjustment condition, the server adjusts the value of Ki' according to the value of Ki 'corresponding to each test device i';
the server calculates an adjustment target value δki of Ki from the Ki', δki being determined by formula (2):
δKi=
（2）
wherein a is the preset number up to the first preset adjustment condition,
ki 'for each test device i'The values are summed over the interval 0.3a to 0.7a after normal distribution, and 0.3a and 0.7a are rounded up, respectively.
8. The reliability evaluation method for a photovoltaic module testing apparatus according to claim 7, wherein for the ith testing apparatus, the server is provided with a corresponding preset limit use time length ST0i and a preset limit use number CT0i, and the server gives an individual decrease value Gi to the reliability of the ith testing apparatus according to the use time length stb and the use number CTi of the ith testing apparatus, the Gi being determined by formula (3):
Gi=
（3）
When the server determines the value of Gi, the server adjusts the reliability assignment Ki of the ith test apparatus, and marks the adjusted value as ζki, where ζki=gi×ki.
9. The reliability evaluation method for a photovoltaic module testing device according to claim 8, wherein a preset reliability threshold kζ is set in the server, and when the server performs reliability evaluation on the i-th testing device, if ζ Ki is less than or equal to kζ, the server marks the i-th testing device as a risk device;
when the server evaluates the reliability of the risk device, if the monitoring module detects that the working voltage value of the risk device exceeds the preset tolerance interval, the server judges that the risk device is scrapped, and meanwhile, the risk device is powered off and scrapped and warned.
10. The reliability evaluation method for a photovoltaic module testing apparatus according to claim 9, wherein the server determines that the reliability of the individual testing apparatus reaches a first capacity approval reliability condition, the server marks a test result of the individual photovoltaic module by the testing apparatus as a reliable result, if the reliable result of the photovoltaic module is qualified, the server marks the reliable result as a qualified photovoltaic module, and controls the assembly module to assemble each qualified photovoltaic module into a photovoltaic panel;
The first tolerance condition is that a server judges that the testing device is in the first preset tolerance range or the second preset tolerance range.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310076998.2A CN115864994B (en) | 2023-02-08 | 2023-02-08 | Reliability evaluation method and system for photovoltaic module testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310076998.2A CN115864994B (en) | 2023-02-08 | 2023-02-08 | Reliability evaluation method and system for photovoltaic module testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115864994A CN115864994A (en) | 2023-03-28 |
| CN115864994B true CN115864994B (en) | 2023-05-23 |
Family
ID=85657755
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310076998.2A Active CN115864994B (en) | 2023-02-08 | 2023-02-08 | Reliability evaluation method and system for photovoltaic module testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115864994B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115911187B (en) * | 2023-03-08 | 2023-06-30 | 广东联塑班皓新能源科技集团有限公司 | Intelligent processing system based on photovoltaic module |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107093007A (en) * | 2017-03-31 | 2017-08-25 | 华南理工大学 | It is a kind of to consider the distribution network reliability evaluation method that light storage continues load capacity |
| WO2018129828A1 (en) * | 2017-01-11 | 2018-07-19 | 沃太能源南通有限公司 | Photovoltaic power generation predicting system and prediction method |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104052399B (en) * | 2014-06-20 | 2017-01-11 | 河海大学常州校区 | Method for estimating reliability of photovoltaic bypass diode |
| JP2017063591A (en) * | 2015-04-30 | 2017-03-30 | 株式会社別川製作所 | Solar power generation system, diagnostic method and diagnostic program of solar power generation unit |
| CN105024644A (en) * | 2015-08-12 | 2015-11-04 | 河海大学常州校区 | Performance evaluation system and method of photovoltaic system |
| JP6479645B2 (en) * | 2015-12-15 | 2019-03-06 | 株式会社日立製作所 | Diagnostic system and diagnostic method for photovoltaic power generation system |
| CN106777487B (en) * | 2016-11-18 | 2019-11-05 | 清华大学 | A kind of photovoltaic plant containing energy-storage system is credible capacity calculation methods and system |
| CN107748303A (en) * | 2017-09-15 | 2018-03-02 | 西藏自治区能源研究示范中心 | A kind of portable photovoltaic device electric performance test system |
| CN108364117B (en) * | 2018-01-05 | 2022-05-24 | 东南大学 | Power grid risk assessment method considering reliability of photovoltaic power station element |
| CN112016181A (en) * | 2019-05-28 | 2020-12-01 | 汉能移动能源控股集团有限公司 | Method and device for evaluating test time and module state of photovoltaic module |
| CN115118222A (en) * | 2022-06-24 | 2022-09-27 | 国网浙江省电力有限公司电力科学研究院 | Outdoor testing and evaluating method and system for degradation rate of photovoltaic module |
-
2023
- 2023-02-08 CN CN202310076998.2A patent/CN115864994B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018129828A1 (en) * | 2017-01-11 | 2018-07-19 | 沃太能源南通有限公司 | Photovoltaic power generation predicting system and prediction method |
| CN107093007A (en) * | 2017-03-31 | 2017-08-25 | 华南理工大学 | It is a kind of to consider the distribution network reliability evaluation method that light storage continues load capacity |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115864994A (en) | 2023-03-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US11243262B2 (en) | Degradation estimation apparatus, computer program, and degradation estimation method | |
| Lujano-Rojas et al. | Operating conditions of lead-acid batteries in the optimization of hybrid energy systems and microgrids | |
| US20200059098A1 (en) | Building and Building Cluster Energy Management and Optimization System and Method | |
| CN115864994B (en) | Reliability evaluation method and system for photovoltaic module testing device | |
| CN106532688B (en) | It is a kind of for assessing the method and system of micro-capacitance sensor operational reliability | |
| CN107238765A (en) | LED integrated driving power supply reliability analysis methods based on acceleration degradation parameter | |
| US20210255251A1 (en) | Action generator, energy storage device evaluator, computer program, learning method, and evaluation method | |
| CN104316879B (en) | A kind of prediction technique in lead-acid batteries service life | |
| EP3905424B1 (en) | Data processing device, data processing method and computer program | |
| CN111695736B (en) | Photovoltaic power generation short-term power prediction method based on multi-model fusion | |
| CN109978242A (en) | The photovoltaic power generation cluster power forecasting method and device of scale are risen based on statistics | |
| CN104217113B (en) | Independent wind-light storage system reliability estimation method based on energy storage probabilistic model | |
| Kumtepeli et al. | Energy arbitrage optimization with battery storage: 3D-MILP for electro-thermal performance and semi-empirical aging models | |
| KR20200119367A (en) | Demand power prediction device for energy storage system and method for predicting demand power using the same | |
| CN107453396A (en) | A kind of Multiobjective Optimal Operation method that distributed photovoltaic power is contributed | |
| CN115796393A (en) | Energy network management optimization method, system and storage medium based on multi-energy interaction | |
| Zhu et al. | An improved reliability assessment method for lithium-ion battery system considering imbalanced current and uneven cooling | |
| KR101456090B1 (en) | Educational test of the power storage system method and apparatus | |
| CN113408924B (en) | Planning method of park comprehensive energy system based on statistical machine learning | |
| Begovic et al. | Four-year performance assessment of the 342 kW PV system at Georgia Tech | |
| Jesus et al. | Hydrogen-based solutions to help the electrical grid management: Application to the Terceira Island case | |
| JP2018019567A (en) | Photovoltaic power generation system evaluation device, evaluation method, and program for evaluation device | |
| CN101071956A (en) | Method and and device for regulating secondary cell array for solar photovalatic system | |
| CN114386281B (en) | Automatic design method for test heating loop based on clustering | |
| CN108830010B (en) | Simulation device and method for stratosphere long-endurance aerostat energy system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: A reliability evaluation method and system for photovoltaic module testing equipment Granted publication date: 20230523 Pledgee: Fangzi sub branch of Weifang Rural Commercial Bank Co.,Ltd. Pledgor: SHANDONG AUCLON SOLAR ENERGY TECHNOLOGY Co.,Ltd. Registration number: Y2024980004339 |