CN115855317B - Device and method for testing response speed of thermistor temperature sensor - Google Patents
Device and method for testing response speed of thermistor temperature sensor Download PDFInfo
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- CN115855317B CN115855317B CN202310138704.4A CN202310138704A CN115855317B CN 115855317 B CN115855317 B CN 115855317B CN 202310138704 A CN202310138704 A CN 202310138704A CN 115855317 B CN115855317 B CN 115855317B
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Abstract
The invention belongs to the field of temperature sensor measurement, and particularly relates to a thermistor temperature sensor response speed testing device and method, wherein the device comprises a constant voltage excitation source, a filter circuit, a temperature sensor, a voltage continuous measurement module, a motion control system and a quasi-step temperature field; the constant-voltage excitation source is connected with the filter circuit and then provides excitation for the temperature sensor and the protection circuit which are connected in series; the filter circuit is used for optimizing the signal stability of the constant-voltage excitation source module; the tail end of the motion control system is provided with a temperature sensor, the motion control system drives the temperature sensor to pass through a quasi-step temperature field, the resistance value of the temperature sensor is changed, and a voltage continuous measurement module captures a load signal of the temperature sensor, so that the rapid measurement of the response speed of the temperature sensor is realized. The method has the advantages that the accurate measurement of the response speed of the thermistor temperature sensor is realized, and the quick response performance testing capability of the temperature sensor is improved.
Description
Technical Field
The invention belongs to the field of temperature sensor measurement, and particularly relates to a thermistor temperature sensor response speed testing device and method.
Background
Temperature (Temperature) is a core parameter which is most widely applied to the ocean, even the whole industrial field, and is widely applied to the fields of ocean science research, ocean resource development and utilization, ocean fishery production, military ocean application and the like. At the same time, the temperature also provides an indispensable background compensation parameter for other sensors.
The principle of the temperature sensor is that the change of the probe resistance along with the temperature is converted into the change of an AD value through a signal acquisition circuit, an amplifying circuit, an analog-to-digital conversion circuit and the like of a plurality of columns, a temperature-resistance value change response curve is obtained through sensor calibration, and the result is fitted into a high-order polynomial, so that the response index of the temperature sensor is obtained.
The time constant of the temperature sensor refers to the time required for the temperature of the measured medium to rise from the initial temperature T0 to 63.2% of the step temperature tn when the temperature of the measured medium changes from one temperature T to another temperature T, and the thermal response time is denoted by T.
Accurate measurement of the response speed of the temperature sensor requires ensuring several preconditions. Firstly, the accuracy of the initial temperature and the end temperature is ensured, the error is kept within +/-0.1 ℃, secondly, the rapid transfer of the temperature sensor in a temperature field is ensured, and the absolute standing of the temperature sensor is ensured after the transfer is finished, so that the measurement error caused by the rapid stop of the sensing movement is reduced.
Disclosure of Invention
Based on the above problems, the application provides a thermistor temperature sensor response speed testing device and a thermistor temperature sensor response speed testing method, so as to meet the requirement on the accuracy of a temperature sensor response time testing result. The technical proposal is that,
a thermistor temperature sensor response speed testing device comprises a constant voltage excitation source, a filter circuit, a temperature sensor, a voltage continuous measurement module, a motion control system and a quasi-step temperature field; the constant-voltage excitation source is connected with the filter circuit and then provides excitation for the temperature sensor and the protection circuit which are connected in series; the filter circuit is used for optimizing the signal stability of the constant-voltage excitation source module; the tail end of the motion control system is provided with a temperature sensor, the motion control system drives the temperature sensor to pass through a quasi-step temperature field, the resistance value of the temperature sensor is changed, and a voltage continuous measurement module captures a load signal of the temperature sensor, so that the rapid measurement of the response speed of the temperature sensor is realized.
Preferably, the temperature sensor is a thermistor, and a negative temperature coefficient thermistor (NTC) is adopted, and the resistance value is lower when the temperature is higher; the protection circuit is a protection resistor R, and two ends of the protection resistor R are respectively connected with the filter circuit and the temperature sensor.
Preferably, the filter circuit adopts a passive filter circuit composed of pure reactance elements, and is used for removing noise in a voltage waveform output by the excitation power supply.
Preferably, the motion control system comprises a supporting seat, a transmission rack, a temperature sensor, a transmission gear and a support arm; the support seat is provided with a transmission guide rail, the transmission guide rail is provided with a guide rail groove and a constant temperature groove, a constant temperature groove cover plate and a transmission rack are arranged above the guide rail groove, the constant temperature groove cover plate and the transmission rack are fixedly connected, two sides of the guide rail groove are respectively provided with a support column, the support columns are provided with transmission gears, the transmission racks are in transmission connection with the transmission gears, one end of each transmission gear is connected with a support arm, and a temperature sensor is fixed on each support arm.
Preferably, the support arm is L-shaped structure, the support arm end is equipped with temperature sensor fixed plate, is equipped with the wire on it and dredges the hole, and the lead wire of being connected with temperature sensor is placed in the wire and dredges the hole, is equipped with fixed buckle on the temperature sensor fixed plate.
Preferably, the constant-voltage excitation source is constant-voltage excitation, the amplitude of voltage is 30 mu v-6v, the resistance of the temperature sensor is 50 omega-500 KΩ, the range of the resistance ratio of the protection circuit impedance to the temperature sensor is 1:3-3:1, the motion speed of the motion control system is 0.3m/s-30m/s, the quasi-step temperature field comprises an initial temperature environment and an end temperature environment, the initial temperature environment is indoor, and the end temperature environment is the temperature in the constant-temperature tank;
the temperature difference of the quasi-step temperature field is-150 ℃ to 150 ℃.
Preferably, the method for testing the response speed of the temperature sensor comprises the following steps:
s1: the temperature sensor is fixed on a temperature sensor fixing plate of the support arm and is fixed through a fixing buckle and a fixing screw;
s2: starting the support arm, and driving the temperature sensor to reach the constant temperature tank by means of gravitational potential energy of the support arm to realize the transfer of a temperature field;
s3: capturing a load signal of a temperature sensor through a voltage continuous measurement module, and storing the acquired signal in a storage module;
s4, inputting the obtained continuous load signals into a computer for analysis and calculation, and obtaining response parameters of the temperature sensor.
The beneficial effects of this application lie in: according to the invention, the change of the thermistor impedance is converted into the voltage signal change of the protection circuit, so that the accurate measurement of the response speed of the thermistor temperature sensor is realized, the measurement error is not higher than +/-10 ms, and the quick response performance testing capability of the temperature sensor is improved.
Drawings
Fig. 1 is a schematic circuit diagram of the present application.
Fig. 2 is a measurement flow chart of the present application.
Fig. 3 is a block diagram of a motion control system.
Fig. 4 is a schematic view of a support base.
Fig. 5 is a graph of thermistor versus temperature.
Fig. 6 is a response speed test chart.
In the figure, a 1-constant voltage excitation source, a 2-filter circuit, a 3-protection circuit, a 4-temperature sensor, a 5-voltage continuous measurement module, a 6-supporting seat, a 7-transmission rack, an 8-fixed nitro-column, a 9-transmission gear, a 10-constant temperature tank cover plate, a 11-temperature sensor fixing plate, a 12-fixing buckle, a 13-fixing bolt, a 14-wire sparse hole, a 15-lead wire, a 16-supporting arm, a 18-transmission guide rail, a 19-constant temperature tank, a 21-supporting column and a 22-nitro-column through hole.
Detailed Description
The following detailed description is exemplary and is intended to provide further explanation of the present application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments in accordance with the present application.
A thermistor temperature sensor response speed testing device comprises a constant voltage excitation source 1, a filter circuit 2, a temperature sensor 4, a voltage continuous measurement module 5, a motion control system and a quasi-step temperature field; the constant-voltage excitation source 1 is connected with the filter circuit 2 and provides excitation for the temperature sensor 4 and the protection circuit 3 which are connected in series; the filter circuit 2 is used for optimizing the signal stability of the constant-voltage excitation source module; the temperature sensor 4 is arranged at the tail end of the motion control system, the temperature sensor is driven to quickly enter a quasi-step temperature field through mechanical motion and generate quick change of resistance, and a voltage continuous measurement module 5 captures a load signal of the temperature sensor, so that quick measurement of the response speed of the temperature sensor is realized. The constant-voltage excitation source is constant-voltage excitation, the amplitude of voltage is 30 mu v-6v, the resistance of the temperature sensor is 50 omega-500 KΩ, the range of the resistance ratio of the protection circuit impedance to the temperature sensor is 1:3-3:1, the motion speed of the motion control system is 0.3m/s-30m/s, and the temperature difference of the quasi-step temperature field is-150 ℃ to 150 ℃.
The temperature sensor 4 is a thermistor, and adopts a negative temperature coefficient thermistor (NTC), and the resistance value is lower when the temperature is higher; the protection circuit is a protection resistor R, and two ends of the protection resistor R are respectively connected with the filter circuit and the temperature sensor.
The filter circuit 2 adopts a passive filter circuit composed of pure reactance elements and is used for removing noise in a voltage waveform output by an excitation power supply.
The protection circuit 3 is used to limit the magnitude of the current flowing in the circuit, and to protect the temperature sensor 4 from burning out due to the excessive current.
The motion control system comprises a supporting seat 6, a transmission rack 7, a temperature sensor 4, a transmission gear 9 and a support arm 16; the support seat 6 (which is a heat insulation plate) is provided with a transmission guide rail 18, the transmission guide rail 18 is provided with a guide rail groove 20 and a constant temperature groove 19, a constant temperature groove cover plate 10 and a transmission rack 7 are arranged above the guide rail groove 20, the constant temperature groove cover plate 10 and the transmission rack 7 are fixedly connected or are of an integrated structure, two sides of the guide rail groove 20 are respectively provided with a support column 21, the support column 21 is provided with a nitrate column through hole 22, the support column 21 is provided with a transmission gear 9, and the two are connected through a fixed nitrate column 8; the transmission rack 7 is connected with the transmission gear 9 in a transmission way, one end of the transmission gear 9 is connected with the support arm 16, the support arm 16 is of an L-shaped structure, a temperature sensor fixing plate 11 is arranged at the tail end of the support arm 16, a wire dredging hole 14 is formed in the support arm, a lead wire connected with the temperature sensor 4 is placed in the wire dredging hole 14, and a fixing buckle 12 is arranged on the temperature sensor fixing plate 11.
The mechanical movement of the support arm 16 drives the thermistor to fall and the transmission gear drives the transmission rack to move backwards, and when the temperature sensor 4 (thermistor) approaches to the horizontal plane of the supporting seat 6, the constant temperature tank cover plate 10 is opened, so that the temperature sensor 4 rapidly enters the constant temperature tank 19, namely, the temperature sensor 4 is considered to pass through a quasi-step temperature field from 20 ℃ to 100 ℃ through a quasi-step temperature field (such as the room temperature is 20 ℃ and the temperature in the constant temperature tank is 100 ℃), the resistance value of the temperature sensor rapidly changes due to different temperatures, and the voltage continuous measurement module captures the load signal of the temperature sensor, so that the rapid measurement of the response speed of the thermistor is realized.
The temperature sensor response speed testing method comprises the following steps:
s0. the whole measuring device is arranged above the constant temperature tank 19, so that the constant temperature tank cover plate 10 can completely cover the constant temperature tank 19, and the whole measuring device comprises a constant voltage excitation source 1, a filter circuit 2, a protection resistor 3, a temperature sensor 4, a voltage continuous measuring module 5 and a test circuit comprising a data storage module.
S1: the temperature sensor is fixed on a temperature sensor fixing plate of the support arm 16, and is fixed through a fixing buckle 12 and a fixing screw 13, and the support arm 16 is fixed at a position 10cm away from the support seat through accurate measurement;
s2: the support arm is started, the temperature sensor is driven to reach the constant temperature tank by means of gravitational potential energy of the support arm (liquid with a certain temperature is stored in the constant temperature tank), and the transfer of a temperature field is realized;
s3: capturing a load signal of a temperature sensor through a voltage continuous measurement module, and storing the acquired signal in a storage module;
s4, inputting the obtained continuous load signals into a computer for analysis and calculation, and obtaining response parameters of the temperature sensor.
Fig. 6 shows the response speed test analysis results, in which:
v0 is the steady state value of the thermistor at the initial temperature field.
V1 is the steady state value of the thermistor at the end of the temperature field.
V2 is the point at which the thermistor reaches a step temperature value of 63.2% from the initial temperature.
DeltaV is the amount of change by 63.2% in the step temperature.
Δt is the time required to change Δv, i.e., the response time constant of the thermistor.
Fig. 5 shows that the temperature change causes a change in the resistance of the thermistor, and the monitoring of the change in resistance generally causes a voltage to be applied to the thermistor, which corresponds to the change in resistance of the thermistor and also to the change in temperature field.
The foregoing description is only of the preferred embodiments of the present application and is not intended to limit the same, but rather, various modifications and variations may be made by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application should be included in the protection scope of the present application.
Claims (6)
1. The device for testing the response speed of the thermistor temperature sensor is characterized by comprising a constant-voltage excitation source, a filter circuit, a temperature sensor, a voltage continuous measurement module, a motion control system and a quasi-step temperature field; the constant-voltage excitation source is connected with the filter circuit and then provides excitation for the temperature sensor and the protection circuit which are connected in series; the filter circuit is used for optimizing the signal stability of the constant-voltage excitation source module; the tail end of the motion control system is provided with a temperature sensor, the motion control system drives the temperature sensor to pass through a quasi-step temperature field, so that the resistance value of the temperature sensor is changed, and a voltage continuous measurement module captures a load signal of the temperature sensor to realize rapid measurement of the response speed of the temperature sensor;
the motion control system comprises a supporting seat, a transmission rack, a temperature sensor, a transmission gear and a support arm; the support seat is provided with a transmission guide rail, the transmission guide rail is provided with a guide rail groove and a constant temperature groove, a constant temperature groove cover plate and a transmission rack are arranged above the guide rail groove, the constant temperature groove cover plate and the transmission rack are fixedly connected, two sides of the guide rail groove are respectively provided with a support column, the support columns are provided with transmission gears, the transmission racks are in transmission connection with the transmission gears, one end of each transmission gear is connected with a support arm, and a temperature sensor is fixed on each support arm.
2. The device for testing the response speed of a thermistor temperature sensor according to claim 1, wherein the temperature sensor is a thermistor, and a negative temperature coefficient thermistor is adopted, and the resistance value is lower when the temperature is higher; the protection circuit is a protection resistor R, and two ends of the protection resistor R are respectively connected with the filter circuit and the temperature sensor.
3. The device for testing the response speed of the thermistor temperature sensor according to claim 1, wherein the filter circuit is a passive filter circuit consisting of pure reactance elements and is used for removing noise in a voltage waveform output by an excitation power supply.
4. The device for testing the response speed of the thermistor temperature sensor according to claim 1, wherein the support arm is of an L-shaped structure, a temperature sensor fixing plate is arranged at the tail end of the support arm, a wire dredging hole is formed in the support arm, a lead connected with the temperature sensor is placed in the wire dredging hole, and a fixing buckle is arranged on the temperature sensor fixing plate.
5. The device for testing the response speed of the thermistor temperature sensor according to claim 2, wherein the constant voltage excitation source is constant voltage excitation, the amplitude of voltage is 30 mu V-6V, the resistance value of the temperature sensor is 50 omega-500 KΩ, the range of the resistance value ratio of the protection circuit impedance to the temperature sensor is 1:3-3:1, the motion speed of the motion control system is 0.3m/s-30m/s, the quasi-step temperature field comprises an initial temperature environment and an end temperature environment, the initial temperature environment is indoor, and the end temperature environment is the temperature in the constant temperature tank; the temperature difference of the quasi-step temperature field is-150 ℃ to 150 ℃.
6. A method for testing the response speed of a temperature sensor using the device according to any one of claims 4 to 5, comprising the steps of:
s1: the temperature sensor is fixed on a temperature sensor fixing plate of the support arm and is fixed through a fixing buckle and a fixing screw;
s2: starting the support arm, and driving the temperature sensor to reach the constant temperature tank by means of gravitational potential energy of the support arm to realize the transfer of a temperature field;
s3: capturing a load signal of a temperature sensor through a voltage continuous measurement module, and storing the acquired signal in a storage module;
s4, inputting the obtained continuous load signals into a computer for analysis and calculation, and obtaining response parameters of the temperature sensor.
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