CN115855317A - Thermistor temperature sensor response speed testing device and method - Google Patents
Thermistor temperature sensor response speed testing device and method Download PDFInfo
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- CN115855317A CN115855317A CN202310138704.4A CN202310138704A CN115855317A CN 115855317 A CN115855317 A CN 115855317A CN 202310138704 A CN202310138704 A CN 202310138704A CN 115855317 A CN115855317 A CN 115855317A
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Abstract
The invention belongs to the field of temperature sensor measurement, and particularly relates to a device and a method for testing response speed of a thermistor temperature sensor, wherein the device comprises a constant-voltage excitation source, a filter circuit, a temperature sensor, a voltage continuous measurement module, a motion control system and a quasi-step temperature field; the constant voltage excitation source is connected with the filter circuit and then provides excitation for the temperature sensor and the protection circuit which are connected in series; the filter circuit is used for optimizing the signal stability of the constant-voltage excitation source module; the tail end of the motion control system is provided with the temperature sensor, the motion control system drives the temperature sensor to pass through a quasi-step temperature field, so that the resistance value of the temperature sensor changes, and the voltage continuous measurement module captures a load signal of the temperature sensor to realize the rapid measurement of the response speed of the temperature sensor. The method has the advantages of realizing accurate measurement of the response speed of the thermistor temperature sensor and being beneficial to improving the quick response performance testing capability of the temperature sensor.
Description
Technical Field
The invention belongs to the field of temperature sensor measurement, and particularly relates to a device and a method for testing response speed of a thermistor temperature sensor.
Background
Temperature (Temperature) is the most widely used core parameter in the marine and even whole industrial fields, and is widely applied in the fields of marine scientific research, marine resource development and utilization, marine fishery production, military oceanographic application and the like. At the same time, temperature also provides the necessary background compensation parameters for other sensors.
The principle of the temperature sensor is that the change of the resistance of the probe along with the temperature is converted into the change of an AD value through a signal acquisition circuit, an amplification circuit, an analog-digital conversion circuit and the like, a temperature-resistance value change response curve is obtained through calibration of the sensor, and the result is fitted into a high-order polynomial so as to obtain a temperature sensor response index.
The temperature sensor time constant refers to the time required for the temperature of the measuring end of the sensor to rise from the initial temperature T0 to 63.2% of the step temperature value tn when the temperature of the measured medium jumps from a certain temperature T to another temperature T, and the thermal response time is represented by T.
Accurate measurement of the response speed of the temperature sensor requires ensuring several preconditions. Firstly, the accuracy of the initial temperature and the end temperature is ensured, and the error is kept within +/-0.1 ℃, secondly, the transfer of the temperature sensor in the temperature field is ensured to be rapid, and the absolute standing of the temperature sensor is ensured after the transfer is ended, so that the measurement error caused by the stop of the sensing movement speed is reduced.
Disclosure of Invention
Based on the above problems, the present application provides a device and a method for testing the response speed of a thermistor temperature sensor, so as to meet the requirement on the accuracy of the test result of the response time of the temperature sensor. The technical proposal is that the method comprises the following steps,
a thermistor temperature sensor response speed testing device comprises a constant voltage excitation source, a filter circuit, a temperature sensor, a voltage continuous measurement module, a motion control system and a quasi-step temperature field; the constant voltage excitation source is connected with the filter circuit and then provides excitation for the temperature sensor and the protection circuit which are connected in series; the filter circuit is used for optimizing the signal stability of the constant-voltage excitation source module; the tail end of the motion control system is provided with the temperature sensor, the motion control system drives the temperature sensor to pass through a quasi-step temperature field, so that the resistance value of the temperature sensor is changed, and the voltage continuous measurement module captures a load signal of the temperature sensor, so that the response speed of the temperature sensor is quickly measured.
Preferably, the temperature sensor is a thermistor, and a negative temperature coefficient thermistor (NTC) is adopted, and the resistance value is lower as the temperature is higher; the protection circuit is a protection resistor R, and two ends of the protection resistor R are respectively connected with the filter circuit and the temperature sensor.
Preferably, the filter circuit is a passive filter circuit composed of a pure reactance element, and is used for removing noise in the voltage waveform of the excitation power supply output.
Preferably, the motion control system comprises a supporting seat, a transmission rack, a temperature sensor, a transmission gear and a supporting arm; the supporting seat is provided with a transmission guide rail, the transmission guide rail is provided with a guide rail groove and a thermostatic bath, a thermostatic bath cover plate and a transmission rack are arranged above the guide rail groove, the thermostatic bath cover plate is fixedly connected with the transmission rack, two sides of the guide rail groove are respectively provided with a support column, the support columns are provided with transmission gears, the transmission rack is in transmission connection with the transmission gears, one end of each transmission gear is connected with the supporting arm, and the temperature sensors are fixed on the supporting arms.
Preferably, the support arm is of an L-shaped structure, the temperature sensor fixing plate is arranged at the tail end of the support arm, a wire dredging hole is formed in the temperature sensor fixing plate, a lead connected with the temperature sensor is placed in the wire dredging hole, and a fixing buckle is arranged on the temperature sensor fixing plate.
Preferably, the constant voltage excitation source is constant voltage excitation, the amplitude of the voltage is 30 muv-6 v, the resistance value of the temperature sensor is 50 omega-500K omega, the resistance value ratio of the protection circuit impedance to the temperature sensor ranges from 1:3-3:1, the movement speed of the movement control system is 0.3m/s-30m/s, the quasi-step temperature field comprises an initial temperature environment and an ending temperature environment, the initial temperature environment is indoor, and the ending temperature environment is the temperature in the constant temperature bath;
the temperature difference of the quasi-step temperature field is-150 ℃ to 150 ℃.
Preferably, the method for testing the response speed of the temperature sensor comprises the following steps:
s1: fixing a temperature sensor on a temperature sensor fixing plate of the support arm, and fixing the temperature sensor on the temperature sensor fixing plate of the support arm through a fixing buckle and a fixing screw;
s2: starting the support arm, and driving the temperature sensor to reach the thermostatic bath by means of gravitational potential energy of the support arm to realize the transfer of the temperature field;
s3: capturing a load signal of the temperature sensor through the voltage continuous measurement module, and storing the acquired signal in the storage module;
and S4, inputting the obtained continuous load signals into a computer for analysis and calculation to obtain the response parameters of the temperature sensor.
The beneficial effect of this application lies in: according to the invention, the change of the thermistor impedance is converted into the change of the voltage signal of the protection circuit, so that the accurate measurement of the response speed of the thermistor temperature sensor is realized, the measurement error is not higher than +/-10 ms, and the rapid response performance testing capability of the temperature sensor is favorably improved.
Drawings
Fig. 1 is a schematic circuit diagram of the present application.
Fig. 2 is a measurement flow chart of the present application.
Fig. 3 is a diagram of a motion control system.
FIG. 4 is a schematic view of the supporting base.
FIG. 5 is a graph of thermistor versus temperature.
Fig. 6 is a response speed test chart.
In the figure, 1-a constant voltage excitation source, 2-a filter circuit, 3-a protection circuit, 4-a temperature sensor, 5-a voltage continuous measurement module, 6-a support seat, 7-a transmission rack, 8-a fixed nitre column, 9-a transmission gear, 10-a constant temperature groove cover plate, 11-a temperature sensor fixing plate, 12-a fixed buckle, 13-a fixed bolt, 14-a lead sparse hole, 15-a lead, 16-a support arm, 18-a transmission guide rail, 19-a constant temperature groove, 21-a support column and 22-a nitre column through hole.
Detailed Description
The following detailed description is exemplary and is intended to provide further explanation of the invention as claimed. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application.
A thermistor temperature sensor response speed testing device comprises a constant voltage excitation source 1, a filter circuit 2, a temperature sensor 4, a voltage continuous measurement module 5, a motion control system and a quasi-step temperature field; the constant voltage excitation source 1 is connected with the filter circuit 2 and then provides excitation for the temperature sensor 4 and the protection circuit 3 which are connected in series; the filter circuit 2 is used for optimizing the signal stability of the constant-voltage excitation source module; the tail end of the motion control system is provided with the temperature sensor 4, the temperature sensor is driven to rapidly enter a quasi-step temperature field through mechanical motion and generate rapid change of resistance, and the load signal of the temperature sensor is captured by the voltage continuous measurement module 5, so that rapid measurement of the response speed of the temperature sensor is realized. The constant voltage excitation source is constant voltage excitation, the amplitude of the voltage is 30 muv-6 v, the resistance value of the temperature sensor is 50 omega-500K omega, the resistance value ratio of the protection circuit impedance to the temperature sensor ranges from 1:3-3:1, the movement speed of the movement control system is 0.3m/s-30m/s, and the temperature difference of the quasi-step temperature field ranges from-150 ℃ to 150 ℃.
The temperature sensor 4 is a thermistor and adopts a negative temperature coefficient thermistor (NTC), and the resistance value is lower when the temperature is higher; the protection circuit is a protection resistor R, and two ends of the protection resistor R are respectively connected with the filter circuit and the temperature sensor.
The filter circuit 2 adopts a passive filter circuit composed of pure reactance elements and is used for removing noise in a voltage waveform output by the excitation power supply.
The protection circuit 3 is used to limit the amount of current flowing through the circuit and protect the temperature sensor 4 from being burned out due to the excessive current.
The motion control system comprises a supporting seat 6, a transmission rack 7, a temperature sensor 4, a transmission gear 9 and a supporting arm 16; a transmission guide rail 18 is arranged on the support seat 6 (which is a heat insulation plate), a guide rail groove 20 and a constant temperature groove 19 are arranged on the transmission guide rail 18, a constant temperature groove cover plate 10 and a transmission rack 7 are arranged above the guide rail groove 20, the constant temperature groove cover plate 10 and the transmission rack 7 are fixedly connected or are of an integrated structure, support columns 21 are respectively arranged on two sides of the guide rail groove 20, nitre column through holes 22 are formed in the support columns 21, transmission gears 9 are arranged on the support columns 21, and the support columns and the nitre column are connected through fixed nitre columns 8; the transmission rack 7 is in transmission connection with the transmission gear 9, one end of the transmission gear 9 is connected with the support arm 16, the support arm 16 is of an L-shaped structure, the tail end of the support arm 16 is provided with a temperature sensor fixing plate 11, a wire thinning hole 14 is formed in the temperature sensor fixing plate, a lead connected with the temperature sensor 4 is placed in the wire thinning hole 14, and the temperature sensor fixing plate 11 is provided with a fixing buckle 12.
The mechanical movement of the support arm 16 drives the thermistor to fall, meanwhile, the transmission gear drives the transmission rack to move backwards, and the thermostatic bath cover plate 10 is opened when the temperature sensor 4 (thermistor) approaches the horizontal plane of the support seat 6, so that the temperature sensor 4 quickly enters the thermostatic bath 19, namely, the temperature sensor 4 is considered to pass through a quasi-step temperature field (such as the room temperature is 20 ℃, the temperature in the thermostatic bath is 100 ℃), namely, the temperature sensor 4 is from 20 ℃ to 100 ℃, and the resistance value of the temperature sensor is rapidly changed due to different temperatures, and the voltage continuous measurement module captures a load signal of the temperature sensor, so that the rapid measurement of the response speed of the thermistor is realized.
The method for testing the response speed of the temperature sensor comprises the following steps:
s0. places the whole measuring device on the thermostatic bath 19, ensures that the thermostatic bath cover plate 10 can completely cover the thermostatic bath 19, and the whole measuring device comprises a constant voltage excitation source 1, a filter circuit 2, a protection resistor 3, a temperature sensor 4, a voltage continuous measuring module 5 and a test circuit including a data storage module.
S1: fixing a temperature sensor on a temperature sensor fixing plate of a support arm 16, fixing the temperature sensor on the support arm by a fixing buckle 12 and a fixing screw 13, and fixing the support arm 16 at a position 10cm away from a support seat by accurate measurement;
s2: starting the support arm, and driving the temperature sensor to reach a thermostatic bath (liquid with a certain temperature is stored in the thermostatic bath) by means of the gravitational potential energy of the support arm to realize the transfer of a temperature field;
s3: capturing a load signal of the temperature sensor through the voltage continuous measurement module, and storing the acquired signal in the storage module;
and S4, inputting the obtained continuous load signals into a computer for analysis and calculation to obtain the response parameters of the temperature sensor.
FIG. 6 shows the results of response speed test analysis, where:
v0 is the steady state value of the thermistor under the initial temperature field.
V1 is the steady state value of the thermistor at the end of the temperature field.
V2 is the point at which the thermistor reaches 63.2% of the step temperature value from the initial temperature.
Δ V is the change of 63.2% in the step temperature.
Δ t is the time required to change Δ V, i.e., the response time constant of the thermistor.
It can be seen from fig. 5 that the change in resistance of the thermistor is caused by a change in temperature, and the monitoring of the change in resistance is typically such that a voltage is generated across the thermistor by applying a stimulus to the thermistor, which voltage change corresponds to a change in resistance of the thermistor and also to a change in temperature field.
The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims (7)
1. A thermistor temperature sensor response speed testing device is characterized by comprising a constant voltage excitation source, a filter circuit, a temperature sensor, a voltage continuous measurement module, a motion control system and a quasi-step temperature field; the constant voltage excitation source is connected with the filter circuit and then provides excitation for the temperature sensor and the protection circuit which are connected in series; the filter circuit is used for optimizing the signal stability of the constant-voltage excitation source module; the tail end of the motion control system is provided with the temperature sensor, the motion control system drives the temperature sensor to pass through a quasi-step temperature field, so that the resistance value of the temperature sensor changes, and the voltage continuous measurement module captures a load signal of the temperature sensor to realize the rapid measurement of the response speed of the temperature sensor.
2. A thermistor temperature sensor response speed testing device according to claim 1, characterized in that the temperature sensor is a thermistor, which uses a negative temperature coefficient thermistor, and the resistance value is lower as the temperature is higher; the protection circuit is a protection resistor R, and two ends of the protection resistor R are respectively connected with the filter circuit and the temperature sensor.
3. A thermistor temperature sensor response speed testing device according to claim 1, characterized in that the filter circuit is a passive filter circuit composed of a pure reactance element for removing noise from the voltage waveform of the excitation power supply output.
4. The thermistor temperature sensor response speed testing device of claim 1, characterized in that the motion control system comprises a support base, a transmission rack, a temperature sensor, a transmission gear and a support arm; the supporting seat is provided with a transmission guide rail, the transmission guide rail is provided with a guide rail groove and a thermostatic bath, a thermostatic bath cover plate and a transmission rack are arranged above the guide rail groove, the thermostatic bath cover plate is fixedly connected with the transmission rack, two sides of the guide rail groove are respectively provided with a support column, the support columns are provided with transmission gears, the transmission rack is in transmission connection with the transmission gears, one end of each transmission gear is connected with the supporting arm, and the temperature sensors are fixed on the supporting arms.
5. The device for testing the response speed of the thermistor temperature sensor according to claim 4, characterized in that the supporting arm is L-shaped, the end of the supporting arm is provided with a temperature sensor fixing plate, a lead hole is arranged on the supporting arm, a lead connected with the temperature sensor is placed in the lead hole, and the temperature sensor fixing plate is provided with a fixing buckle.
6. The device for testing the response speed of the thermistor temperature sensor according to claim 2, wherein the constant voltage excitation source is constant voltage excitation, the amplitude of the voltage is 30 μ V-6V, the resistance value of the temperature sensor is 50 Ω -500K Ω, the resistance ratio of the protection circuit impedance to the resistance value of the temperature sensor ranges from 1:3-3:1, the movement speed of the movement control system is 0.3m/s-30m/s, the quasi-step temperature field includes an initial temperature environment and an end temperature environment, the initial temperature environment is indoor, and the end temperature environment is the temperature in the thermostatic bath;
the temperature difference of the quasi-step temperature field is-150 ℃ to 150 ℃.
7. A method for testing the response speed of a temperature sensor using the device according to any one of claims 5 to 6, comprising the steps of:
s1: fixing a temperature sensor on a temperature sensor fixing plate of the support arm, and fixing the temperature sensor on the temperature sensor fixing plate of the support arm through a fixing buckle and a fixing screw;
s2: starting the support arm, and driving the temperature sensor to reach the thermostatic bath by means of gravitational potential energy of the support arm to realize the transfer of the temperature field;
s3: capturing a load signal of the temperature sensor through a voltage continuous measurement module, and storing the acquired signal in a storage module;
and S4, inputting the obtained continuous load signals into a computer for analysis and calculation to obtain the response parameters of the temperature sensor.
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