CN115827338A - 一种SoC芯片的复位验证方法、系统及电子设备 - Google Patents
一种SoC芯片的复位验证方法、系统及电子设备 Download PDFInfo
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- CN115827338A CN115827338A CN202211004011.8A CN202211004011A CN115827338A CN 115827338 A CN115827338 A CN 115827338A CN 202211004011 A CN202211004011 A CN 202211004011A CN 115827338 A CN115827338 A CN 115827338A
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- 238000005859 coupling reaction Methods 0.000 description 3
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Country or region after: China Address after: Room 59, 17th Floor, Science and Technology Innovation Building, No. 777 Zhongguan West Road, Zhuangshi Street, Ningbo City, Zhejiang Province, 315200 Applicant after: Aixin Yuanzhi Semiconductor Co.,Ltd. Address before: Room 59, 17th Floor, Science and Technology Innovation Building, No. 777 Zhongguan West Road, Zhuangshi Street, Zhenhai District, Ningbo City, Zhejiang Province, 315200 Applicant before: Aixin Yuanzhi Semiconductor (Ningbo) Co.,Ltd. Country or region before: China Country or region after: China Address after: Room 59, 17th Floor, Science and Technology Innovation Building, No. 777 Zhongguan West Road, Zhuangshi Street, Zhenhai District, Ningbo City, Zhejiang Province, 315200 Applicant after: Aixin Yuanzhi Semiconductor (Ningbo) Co.,Ltd. Address before: 201700 room 1190, zone B, floor 11, building 1, No. 158, Shuanglian Road, Qingpu District, Shanghai Applicant before: Aisin Yuanzhi semiconductor (Shanghai) Co.,Ltd. Country or region before: China |