CN115792576A - Test bench structure and corresponding fingerprint chip testing device - Google Patents
Test bench structure and corresponding fingerprint chip testing device Download PDFInfo
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- CN115792576A CN115792576A CN202211654572.2A CN202211654572A CN115792576A CN 115792576 A CN115792576 A CN 115792576A CN 202211654572 A CN202211654572 A CN 202211654572A CN 115792576 A CN115792576 A CN 115792576A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Abstract
This application of dividing a case provides a testboard structure and corresponding fingerprint chip testing arrangement, fingerprint chip testing arrangement includes the testboard, the test support, test drive arrangement, wiring board and wiring board drive arrangement, the testboard includes the fixed plate, fixed plate top middle part is provided with the spacing recess that is used for placing the chip board and the guiding hole that link up from top to bottom, the test support includes false finger mechanism, false finger mechanism is located the fixed plate below, test drive arrangement sets up in testboard one side, be used for driving false finger mechanism and stretch into the guiding hole and contact chip board test, the wiring board sets up in the testboard top, be used for chip circular telegram and data exchange on the chip board, wiring board drive arrangement sets up in the wiring board top, be used for driving the wiring board and remove. The fingerprint chip testing device provided by the invention can be used for simultaneously testing a plurality of fingerprint chips at one time, the chip board is convenient to replace on the testing platform, the testing efficiency is high, and the whole structure is stable and durable.
Description
The application is a divisional application, and the application number of the original application is as follows: "202010854564.7", filed as: the invention name of '08 month and 24 days in 2020': fingerprint chip testing device with fake finger mechanism "
Technical Field
The invention relates to the field of fingerprint chip testing devices, in particular to a test board structure and a corresponding fingerprint chip testing device.
Background
Along with the higher and higher requirement of people on information security and the stability and uniqueness that the fingerprint has, make the application of fingerprint detection recognition device very extensive, the fingerprint chip has widely been applied to the cell-phone, and it will promote the privacy and the convenience of cell-phone greatly, makes more that mobile payment becomes safer. The wide application of fingerprint identification in mobile phones makes the testing of fingerprint identification chips more and more important. The existing fingerprint chip testing mechanism has lower testing efficiency.
Therefore, it is desirable to provide a test platform structure and a corresponding fingerprint chip testing device to solve the above-mentioned technical problems.
Disclosure of Invention
The invention provides a test board structure and a corresponding fingerprint chip test device, and aims to solve the problem that a fingerprint chip test mechanism in the prior art is low in test efficiency.
In order to solve the technical problems, the technical scheme of the invention is as follows: the utility model provides a testboard structure, its includes base, support frame and fixed plate, the support frame includes that the bottom plate is connected with perpendicular the riser at bottom plate both ends, and bottom plate slidable connects on the base, the fixed plate is connected the riser top, fixed plate top middle part is provided with spacing recess, spacing recess is used for placing the chip board, the loading has a plurality of fingerprint chips on the chip board, the fixed plate middle part is provided with the guiding hole that link up from top to bottom, the guiding hole intercommunication spacing recess, the guiding hole is used for fake finger mechanism to stretch into the contact chip board, the fixed plate top is provided with the clamp plate, clamp plate middle part fretwork is in order to be used for fingerprint chip and wiring board electric connection, connects in chip board top, and the clamp plate is used for restricting the chip board in spacing recess.
In the invention, the guide holes are arranged in a matrix shape and are uniformly arranged at intervals, the number of the longitudinal arrangement corresponds to the number of the fake finger mechanisms, and the distance between the longitudinal arrangement positions corresponds to the distance between the fake finger mechanisms;
the wiring board is provided with a plurality of pin structures on one side close to the fixed plate, a plurality of flat cable sockets on one side far away from the fixed plate, the number of the longitudinal arrangement corresponds to that of the pin structures, and the distance between the longitudinal arrangement positions corresponds to that of the pin structures.
In the invention, a rubber pad is arranged at one side, close to the chip plate, in the limiting groove, a through hole is formed in the position, corresponding to the guide hole, of the rubber pad, and the section contour of the through hole is larger than that of the guide hole.
In the invention, the cross section of the fixing plate is rectangular, a shifting block is arranged at a corner position on the fixing plate close to one side of the test driving device, the shifting block comprises a handle, a connecting part and a first clamping block, the first clamping block and the handle are connected to two ends of the connecting part, the connecting part is hinged to the fixing plate, a first position avoiding opening is arranged below the first clamping block, the thickness of the first clamping block is gradually reduced along the first position avoiding opening in the direction far away from the connecting part, so that the extrusion force of the first clamping block on the second clamping block is gradually increased;
one side, far away from the test driving device, of the pressing plate is connected to the fixing plate in a hinge mode, a second clamping block is arranged on one side, close to the shifting block, of the pressing plate, a second avoiding port is arranged above the second clamping block and is fan-shaped, and when the first clamping block moves along the second avoiding port, the first clamping block and the second clamping block form limiting fit.
In the invention, a plurality of limiting bulges are arranged outside the limiting groove, and a limiting through hole is arranged on the pressure plate corresponding to the limiting bulges and is a long slot hole.
In the invention, open slots are arranged in the middle parts of two sides of the fixing plate, the open slots extend inwards to be communicated with the limiting grooves, and the open slots are used for facilitating the replacement of the chip plate.
The invention includes a fingerprint chip testing device, the testing platform structure, also includes:
the fake finger mechanism is connected with the test driving device so as to be driven to move;
the fixed frame is arranged on the outer side of the test board;
the wiring board;
the wiring board driving device is arranged above the wiring board and fixedly connected to the middle of the upper portion of the fixing plate and comprises a wiring board driving cylinder, and the wiring board driving cylinder is connected with the wiring board and used for driving the wiring board to contact the chip board.
In the present invention, the fake finger mechanism includes:
the copper guide sleeve is cylindrical and is connected in the fake finger hole, a first annular groove is formed in the arc surface of the outer side of the copper guide sleeve, a connecting hole is formed in the middle of the copper guide sleeve, and the axis of the connecting hole is consistent with the axis of the copper guide sleeve;
the artificial finger rod comprises an extension rod, a supporting plate and a connecting rod, wherein the supporting plate is connected between the extension rod and the connecting rod, the extension rod is connected in the connecting hole in a sliding manner, and a fixing threaded hole is formed in the middle of the lower end of the extension rod;
the spring is connected to the outer side of the extension rod, the upper end of the spring is in contact with the supporting plate, and the lower end of the spring is in contact with the copper guide sleeve;
the artificial finger of silica gel, the column sets up fixed plate below, the below is provided with the spread groove, the spread groove parcel is connected on the connecting rod.
Furthermore, the dummy finger mechanism is connected with the test driving device through a connecting arm, a connecting threaded hole is formed in the connecting arm corresponding to the first annular groove, the connecting threaded hole is communicated with the dummy finger hole, the axis of the connecting threaded hole is perpendicular to the axis of the dummy finger hole, and the connecting threaded hole is used for fixing the copper guide sleeve in the dummy finger hole;
and a second annular groove is arranged on the outer side of the connecting hole on the copper guide sleeve, the diameter of the second annular groove is consistent with that of the spring, the width of the second annular groove is greater than that of a spring wire of the spring, and the second annular groove is used for limiting the spring.
In the present invention, the test driving apparatus includes:
the supporting bottom plate is provided with a plurality of transverse long slotted holes and is used for supporting;
the test driving cylinder is connected to the supporting bottom plate and comprises an output end, and the output end faces upwards;
the supporting vertical plate is vertically connected to the supporting bottom plate, the plate surface is connected with the testing driving cylinder, a first limiting block is convexly arranged at the edge of one surface close to the testing driving cylinder, and the first limiting block is in contact with the testing driving cylinder and used for guaranteeing the verticality of the testing driving cylinder and the ground;
the first connecting plate comprises a connecting transverse plate and a connecting vertical plate, the connecting transverse plate is vertically connected above the connecting vertical plate, the connecting transverse plate is connected with the output end of the test driving cylinder, and the connecting vertical plate is positioned on one side, far away from the supporting vertical plate, of the test driving cylinder;
the second connecting plate comprises a plurality of vertical long groove holes, a transverse clamping groove is arranged above the two plate surfaces, the width of the transverse clamping groove is equal to the thickness of the connecting arm, a plurality of connecting through holes are formed in the transverse clamping groove corresponding to the positions of the longitudinal long groove holes in the connecting arm, the connecting arm is connected into the transverse clamping groove through the connecting through holes, the vertical long groove holes are connected to the connecting vertical plate, a second limiting block is arranged at the edge of one surface, close to the connecting vertical plate, of the second connecting plate in a protruding mode, the second limiting block contacts with the connecting vertical plate, and the first limiting block and the second limiting block are located on one side, close to the test board;
a third limiting block and a limiting screw are arranged on one side, away from the test board, of the test driving air cylinder, one end of the third limiting block is connected to the test driving air cylinder, the other end of the third limiting block is close to the connecting vertical plate, a limiting threaded hole is formed in one side, close to the connecting vertical plate, of the third limiting block, and the limiting screw is connected in the limiting threaded hole;
the connecting vertical plate is far away from a fourth limiting block is arranged on one side of the test board in a protruding mode, the fourth limiting block is arranged below the third limiting block, the connecting vertical plate drives the air cylinder to drive the fake finger mechanism to ascend to the highest degree, and the limiting screw abuts against the fourth limiting block.
Compared with the prior art, the invention has the beneficial effects that: according to the fingerprint chip testing device, the test board for placing the chip board is arranged, the guide hole is formed in the test board, the test driving device drives the fake finger mechanism to simultaneously test a plurality of fingerprint chips at one time, the chip board is convenient to replace on the test board, the testing efficiency is high, and the whole structure is stable and durable.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required in the embodiments are briefly introduced below, and the drawings in the following description are only corresponding drawings of some embodiments of the present invention.
FIG. 1 is a schematic structural diagram of a fingerprint chip testing device according to the present invention.
Fig. 2 is a schematic structural diagram of a test driving device and a test rack of the fingerprint chip testing device of the present invention.
FIG. 3 is a schematic structural diagram of a test driving device of the fingerprint chip testing device according to the present invention.
Fig. 4 is a schematic structural view of a fixing plate of the fingerprint chip testing device of the present invention.
FIG. 5 is a schematic structural diagram of a pressing plate of the fingerprint chip testing device of the present invention.
Fig. 6 is a schematic structural view of a rubber pad of the fingerprint chip testing device of the present invention.
FIG. 7 is a schematic structural diagram of a dial block of the fingerprint chip testing device of the present invention.
FIG. 8 is a schematic view showing the structure of a wiring board of the fingerprint chip testing device of the present invention.
FIG. 9 is a schematic structural diagram of a base of the fingerprint chip testing device of the present invention.
FIG. 10 is a schematic structural diagram of a connecting arm of the fingerprint chip testing device according to the present invention.
Fig. 11 is a schematic structural view of a copper guide sleeve of the fingerprint chip testing device of the present invention.
FIG. 12 is a schematic structural diagram of a dummy finger of the fingerprint chip testing device of the present invention.
Fig. 13 is a schematic structural view of a silicone rubber dummy finger of the fingerprint chip testing device of the present invention.
FIG. 14 is a schematic structural view of a supporting riser of the fingerprint chip testing device of the present invention.
Fig. 15 is a schematic structural view of a second connecting plate of the fingerprint chip testing device of the present invention.
Wherein, 1, a test board, 2, a test bracket, 3, a test driving device, 4, a wiring board, 5, a fixing frame, 6, a wiring board driving device, 11, a base, 12, a supporting frame, 13, a fixing plate, 14, a pressing plate, 21, a connecting arm, 22, a fake finger mechanism, 31, a supporting bottom plate, 32, a test driving cylinder, 33, a supporting vertical plate, 34, a first connecting plate, 35, a second connecting plate, 41, a pin structure, 42, a flat cable socket, 43, a pin platform, 44, a connecting block, 51, a top beam, 52, a support plate, 61, a wiring board driving cylinder, 121, a bottom plate, 122, a vertical plate, 131, a limiting groove, 132, a guide hole, 133, a rubber pad, 134, a shifting block, 135, a limiting protrusion, 136, an open slot, 141, a second clamping block, 142 and a second avoiding opening, 143, a limit through hole, 211, a fake finger hole, 212, a longitudinal long slot hole, 213, a connecting threaded hole, 221, a copper guide sleeve, 222, a fake finger rod, 223, a spring, 224, a silica gel fake finger, 311, a transverse long slot hole, 321, a third limiting block, 322, a limiting screw, 331, a first limiting block, 341, a connecting transverse plate, 342, a connecting vertical plate, 343, a fourth limiting block, 351, a vertical long slot hole, 352, a transverse clamping groove, 353, a connecting through hole, 354, a second limiting block, 1341, a handle, 1342, a connecting part, 1343, a first clamping block, 1344, a first position avoiding opening, 2211, a first annular groove, 2212, a connecting hole, 2213, a second annular groove, 2221, an extending rod, 2222, a supporting plate, 2223, a connecting rod, 2224, a fixing threaded hole, 2241 and a connecting groove.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the present invention, directional terms such as "up", "down", "front", "back", "left", "right", "inner", "outer", "side", "top" and "bottom" are used only with reference to the orientation of the drawings, and the directional terms are used for illustration and understanding of the present invention, and are not intended to limit the present invention.
The terms "first," "second," and the like in the terms of the invention are used for descriptive purposes only and not for purposes of indication or implication relative importance, nor as a limitation on the order of precedence.
In the present invention, unless otherwise explicitly stated or limited, the terms "mounted," "connected," "fixed," and the like are to be construed broadly, e.g., as being permanently connected, detachably connected, or integral; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the prior art, the testing efficiency of the fingerprint chip testing mechanism is low.
The following is a preferred embodiment of the fingerprint chip testing device provided by the present invention to solve the above technical problems.
Referring to fig. 1, 2, 3, 4 and 9, fig. 1 is a schematic structural diagram of a fingerprint chip testing device of the present invention, fig. 2 is a schematic structural diagram of a test driving device and a test bracket of the fingerprint chip testing device of the present invention, fig. 3 is a schematic structural diagram of a test driving device of the fingerprint chip testing device of the present invention, fig. 4 is a schematic structural diagram of a fixing plate of the fingerprint chip testing device of the present invention, and fig. 9 is a schematic structural diagram of a base of the fingerprint chip testing device of the present invention.
In the drawings, elements having similar structures are denoted by the same reference numerals.
The terms "first," "second," and the like in the terms of the invention are used for descriptive purposes only and not for purposes of indication or implication relative importance, nor as a limitation on the order of precedence.
The preferred embodiment provided by the invention is as follows: a fingerprint chip testing device is used for testing a chip board loaded with a plurality of fingerprint chips and comprises a test board 1, a test bracket 2, a test driving device 3, a wiring board 4, a fixing frame 5 and a wiring board driving device 6; the test bench 1 comprises a base 11, a support frame 12 and a fixing plate 13, wherein the support frame 12 comprises a bottom plate 121 and vertical plates 122 vertically connected to two ends of the bottom plate 121, the bottom plate 121 is slidably connected to the base 11, a transverse slide rail 111 and a linear motor set 112 are arranged on the base 11, two transverse slide rails 111 are arranged, the two transverse slide rails 111 can effectively guarantee the stability of movement, the linear motor set 112 is arranged between the two transverse slide rails 111, a transverse slide groove is arranged below the support frame 12 corresponding to the position of the transverse slide rail 111, and the transverse slide groove is connected with the transverse slide rails 111; the linear motor set 112 includes a linear motor stator 113 and a linear motor mover 114, the linear motor stator 113 is connected to the base 11, and the linear motor mover 114 is connected to the supporting frame 12. Fixed plate 13 is connected in riser 122 top, fixed plate 13 top middle part is provided with spacing recess 131, spacing recess 131 is used for placing the chip board, the chip board includes contact surface and contact surface, when placing the chip board, the contact surface is downward, fixed plate 13 middle part is provided with the guiding hole 132 that link up from top to bottom, guiding hole 132 communicates spacing recess 131, fixed plate 13 top is provided with clamp plate 14, clamp plate 14 middle part fretwork is connected in the chip board top, clamp plate 14 is used for restricting the chip board in spacing recess 131.
Referring to fig. 1, 4, 5, 6 and 7, fig. 5 is a schematic structural view of a pressing plate of a fingerprint chip testing device of the present invention, fig. 6 is a schematic structural view of a rubber pad of the fingerprint chip testing device of the present invention, and fig. 7 is a schematic structural view of a dial block of the fingerprint chip testing device of the present invention.
Be provided with rubber pad 133 in spacing recess 131 near chip board one side, rubber pad 133 corresponds guide hole position 132 and is provided with the through-hole, and the cross-sectional profile of through-hole is greater than the cross-sectional profile of guide hole 132, and the rubber pad is used for protecting the contact surface of chip board not by the fish tail, and the chip board has a buffering non-deformable when receiving clamp plate 14 pressure. The cross section of the fixing plate 13 is rectangular, a shifting block 134 is arranged at a corner position on the fixing plate 13 close to one side of the test driving device 3, the shifting block 134 comprises a handle 1341, a connecting part 1342 and a first fixture block 1343, the first fixture block 1343 and the handle 1341 are connected to two ends of the connecting part 1342, the connecting part 1342 is hinged to the fixing plate 13, a hinge hole is formed in the middle of the connecting part 1342 and connected to the fixing plate 13 through screws, the shifting block 134 can rotate around the screws, a first avoiding opening 1344 is formed below the first fixture block 1343, the first fixture block 1343 is gradually reduced in thickness along the direction from the first avoiding opening 1344 to the connecting part 1342, when the first fixture block 1343 is pressed on the second fixture block 141, the pressing force is large, the pressing force on the second fixture block 141 is gradually increased, when the handle 1 of the shifting block 134 contacts the side of the fixing plate 13, the first fixture block 1343 stably presses the second fixture block 141, the pressing plate 14 is stably pressed on the fixing plate, and when the pressing plate 14 contacts the side of the fixing plate 13, the fixture block 1341 is provided with the second fixture block 1343 and the second fixture opening 142, and the second fixture block 1343 moves along the second avoiding opening 142.
The outer side of the limiting groove 131 is provided with a plurality of limiting protrusions 135, the limiting protrusions 135 are flat, the pressing plate 14 can be pressed into the limiting through holes 143 conveniently when pressed downwards, the limiting through holes 143 are formed in the positions, corresponding to the limiting protrusions 135, of the pressing plate 14, and the limiting through holes 143 are long-slot holes. The middle parts of two sides of the fixing plate 13 are provided with an open slot 136, the open slot 136 extends inwards to be communicated with the limiting groove 131, the open slot 131 is used for conveniently replacing the chip plate, when the chip plate needs to be replaced, the shifting block 134 is shifted open, the handle 1341 is far away from the side surface of the fixing plate 13, the first clamping block 1343 is far away from the second clamping block 141, the pressing plate 14 is opened along the open slot 136, and then the chip plate is opened for replacement.
Referring to fig. 1, 2, 10, 11, 12 and 13, fig. 10 is a schematic structural view of a connecting arm of a fingerprint chip testing device of the present invention, fig. 11 is a schematic structural view of a copper guide sleeve of the fingerprint chip testing device of the present invention, fig. 12 is a schematic structural view of a dummy finger lever of the fingerprint chip testing device of the present invention, and fig. 13 is a schematic structural view of a silicone dummy finger of the fingerprint chip testing device of the present invention.
The test support 2 comprises a connecting arm 21 and a fake finger mechanism 22, one end of the connecting arm 21 extends into the test bench 1 and is located below the fixing plate 13, one side, close to the fixing plate 13, of the connecting arm 21 is provided with a plurality of fake finger holes 211, one end of the fake finger mechanism 22 is connected into the fake finger holes 211, one side, far away from the fixing plate 13, of the connecting arm 21 is provided with a longitudinal slotted hole 212, and the longitudinal slotted hole 212 is used for adjusting the depth of the connecting arm 21 extending into the test bench 1 and further adjusting the alignment guide hole 132 of the fake finger mechanism 22.
The artificial finger mechanism 22 comprises a copper guide sleeve 221, an artificial finger rod 222, a spring 223 and a silica gel artificial finger 224, wherein the copper guide sleeve 221 is cylindrical and is connected in the artificial finger hole 211, a first annular groove 2211 is arranged on the outer arc surface, a connecting hole 2212 is arranged in the middle, and the axis of the connecting hole 2212 is consistent with the axis of the copper guide sleeve 221; the connecting arm 21 is provided with a connecting threaded hole 213 corresponding to the first annular groove 2211, the connecting threaded hole 213 is communicated with the fake finger hole 211, the axis of the connecting threaded hole 213 is perpendicular to the axis of the fake finger hole 211, the connecting threaded hole 213 is used for fixing the copper guide sleeve 221 in the fake finger hole 211, the copper guide sleeve 221 is placed in the fake finger hole 211, and a screw is screwed into the connecting threaded hole 213 to abut against the first annular groove 2211, so that the copper guide sleeve 221 is fixedly connected to the connecting arm 21. The second annular groove 2213 is arranged on the outer side of the connecting hole 2212 in the copper guide sleeve 221, the diameter of the second annular groove 2213 is consistent with that of the spring 223, the width of the second annular groove 2213 is larger than that of a spring wire of the spring 223, the second annular groove 2213 is used for limiting the spring 223, the lower end of the spring 223 is clamped into the second annular groove 2213, and therefore the fact that the lower end of the spring 223 cannot scratch the extension rod 2221 in the ascending and descending process of the artificial finger rod 222 can be guaranteed, and friction is increased.
The artificial finger rod 222 comprises an extension rod 2221, a supporting plate 2222 and a connecting rod 2223, the supporting plate 2222 is connected between the extension rod 2221 and the connecting rod 2223, the extension rod 2221 is slidably connected in the connecting hole 2212, a copper guide sleeve 221 is arranged to be matched and connected with the artificial finger rod 222, the wear resistance is improved, a fixing threaded hole 2224 is formed in the middle of the lower end of the extension rod 2221, the extension rod 2221 penetrates through the connecting hole 2212 of the copper guide sleeve 221, and the fixing threaded hole 2224 is connected with the artificial finger rod 222 through a connecting screw to connect the copper guide sleeve 221; the spring 223 is connected to the outer side of the extension rod 2221, the upper end of the spring 223 is in contact with the supporting plate 2222, the lower end of the spring 223 is in contact with the copper guide sleeve 221, the spring 223 pushes the supporting plate 2222 to be away from the copper guide sleeve 221, when the test driving device 3 drives the dummy finger mechanism 22 to ascend and contact with a chip board, the supporting plate 2222 is pressed downwards to extrude the spring 223, the force applied by the dummy finger mechanism 22 to the chip board is guaranteed to be uniform, and when the test driving device 3 drives the dummy finger mechanism 22 to descend, the spring 223 pushes the supporting plate 2222 to enable the dummy finger mechanism 22 to reset; false finger 224 of silica gel is the column, sets up in fixed plate 13 below, and the below is provided with spread groove 2241, and spread groove 2241 parcel is connected on connecting rod 2223.
Referring to fig. 1, fig. 2, fig. 3, fig. 14 and fig. 15, in which fig. 14 is a schematic structural view of a support riser of the fingerprint chip testing device of the present invention, and fig. 15 is a schematic structural view of a second connecting plate of the fingerprint chip testing device of the present invention.
The test driving device 3 is arranged on one side of the test board 1, is connected with the test support 2 and is used for driving the test support 2 to move, the test driving device 3 comprises a supporting bottom plate 31, a test driving cylinder 32, a supporting vertical plate 33, a first connecting plate 34 and a second connecting plate 35, the supporting bottom plate 31 is used for supporting and is of a cuboid structure, a plurality of transverse long slotted holes 311 are formed in the plate surface, the transverse long slotted holes 211 are used for adjusting the position of the test driving device 3, the test driving cylinder 32 is connected to the supporting bottom plate 31 and is of a cuboid structure and comprises an output end, and the output end faces upwards; support riser 33 and connect perpendicularly on supporting baseplate 31, cuboid structure, the face is connected the test and is driven actuating cylinder 32, is close to the edge protrusion that the test drove actuating cylinder 32 one side and is provided with first stopper 331, and first stopper 331 contact test drives actuating cylinder 32 for the guarantee test drives the straightness that hangs down of actuating cylinder 32 and ground.
The first connecting plate 34 comprises a connecting transverse plate 341 and a connecting vertical plate 342, the connecting transverse plate 341 is vertically connected above the connecting vertical plate 342, the connecting transverse plate 341 is connected with the output end of the test driving cylinder 32, and the connecting vertical plate 342 is positioned on one side of the test driving cylinder 32 far away from the supporting vertical plate 33; the second connecting plate 35 includes a plurality of vertical slotted holes 351, vertical slotted hole 351 is used for adjusting the height of test support 2 apart from the horizontal plane, two face tops are provided with horizontal screens groove 352, the width of horizontal screens groove 352 equals the thickness of connecting arm 21, vertical slotted hole 212 position is provided with a plurality of connect the through-hole 353 on horizontal screens groove 352 corresponds the connecting arm 21, connecting arm 21 passes through connect the through-hole 353 and connects in horizontal screens groove 351, set up the straightness that hangs down of horizontal screens groove 351 effective guarantee connecting arm 21 and second connecting plate 35, vertical slotted hole 351 is connected on connecting riser 342, the edge protrusion that second connecting plate 35 is close to connecting riser 342 one side is provided with second stopper 354, second stopper 354 contacts and connects the riser 342, set up second stopper 354, quick location when guarantee connecting riser 342 and second connecting plate 35 are connected, guarantee test drive arrangement drive direction perpendicular ground.
The first stopper 331 and the second stopper 354 are located at a side close to the test board 1; the third limiting block 321 and the limiting screw 322 are arranged on one side, far away from the test board 1, of the test driving cylinder 32, one end of the third limiting block 321 is connected to the test driving cylinder 32, the other end of the third limiting block 321 is close to the connecting vertical plate 342, a limiting threaded hole is arranged on one side, close to the connecting vertical plate 342, of the limiting threaded hole, the axis of the limiting screw 322 is perpendicular to the ground, the connecting vertical plate 342 is connected to the limiting threaded hole, a fourth limiting block 343 is arranged on one side, far away from the test board 2, of the connecting vertical plate 342 in a protruding mode, the fourth limiting block 343 is arranged below the third limiting block 321, when the test driving cylinder 32 drives the fake finger mechanism 22 to ascend to the maximum, the limiting screw 322 abuts against the fourth limiting block 343, the limiting screw is rotated, the length of the limiting screw 322 extending out of the third limiting block 321 is adjusted, the effective ascending height of the test driving cylinder 32 can be adjusted, the ascending height of the fake finger mechanism 22 is further limited, the chip board is protected, and the phenomenon that the fake finger mechanism 22 props up the board is prevented from being damaged. Similarly, the wiring board driving device 6 is also provided with a structure similar to the third limiting block 321, the limiting screw 322 and the fourth limiting block 343, and is used for limiting the descending distance of the wiring board driving cylinder 61 and protecting the chip board.
Referring to fig. 1 and 8, fig. 8 is a schematic structural view of a wiring board of the fingerprint chip testing device of the present invention.
The wiring board 4 is arranged above the test board 1, one side close to the fixing plate 13 is provided with a plurality of pin structures 41, one side far away from the fixing plate 13 is provided with a plurality of flat cable sockets 42, the pin structures 41 are used for electrifying chips on the chip board, the flat cable sockets 42 are used for data exchange, one end of a flat cable is connected with the flat cable sockets 42, and the other end of the flat cable is connected with the background server; the guide holes 132 are arranged in a matrix shape and are uniformly spaced, the longitudinal arrangement number corresponds to the number of the fake finger mechanisms 22, the longitudinal arrangement position spacing corresponds to the fake finger mechanism 22 position spacing, the longitudinal arrangement number corresponds to the pin mechanism 41 number, and the longitudinal arrangement position spacing corresponds to the pin structure 41 position spacing; a pin platform 43 is convexly arranged below the wiring board 4, the pin structure 41 is connected to the pin platform 43, and the central axis of the pin platform 43 and the central axis of the connecting arm 21 are on the same vertical plane; the protruding connecting block 44 that is provided with in wiring board 4 top, connecting block 44 is located pin platform 43 directly over, connecting block 44 is connected and is driven actuating cylinder 61 below at the wiring board, and the wiring board drives actuating cylinder 61 and drives connecting block 44 and remove, and then drives pin platform 43 and remove, and the wiring board drives actuating cylinder 61's drive power and exerts on wiring board 4 through connecting block 44, and pin platform 43 is located under connecting block 44, makes things convenient for pin structure 41 atress even, switches on stably during the contact chip board.
The working principle of the invention is as follows: placing a chip board in the limiting groove 131, pressing down the pressing board 14, clamping the pressing board 14 by the aid of the fluctuation shifting block 134, driving the wiring board 4 to descend by the aid of the wiring board driving device 6, enabling the pin structure 41 to contact the chip board, driving the test support 2 to ascend by the aid of the test driving device 3, enabling the dummy finger mechanism 22 to stretch into the guide hole 132 to contact the chip board, starting testing, driving the test support 2 to descend by the aid of the test driving device 3, driving the wiring board 4 to ascend by the aid of the wiring board driving device 6, driving the fixing plate 13 to transversely move for a specified distance by the support frame 12, driving the wiring board 4 to descend by the aid of the wiring board driving device 6, enabling the pin structure 41 to contact the chip board, driving the test support 2 to ascend by the aid of the dummy finger mechanism 22, enabling the dummy finger mechanism 22 to stretch into the guide hole 132 to contact the chip board, starting testing, sequentially testing all chips on the chip board in a circulating mode, stopping the machine, shifting block 134 and taking out the chip board.
This completes the process of the fingerprint chip testing device of the preferred embodiment.
In summary, although the present invention has been described with reference to the preferred embodiments, the above-described preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, therefore, the scope of the present invention shall be determined by the appended claims.
Claims (10)
1. The utility model provides a testboard structure, a serial communication port, includes base, support frame and fixed plate, the support frame includes the bottom plate and connects perpendicularly the riser at bottom plate both ends, and bottom plate slidable connects on the base, the fixed plate is connected the riser top, fixed plate top middle part is provided with spacing recess, spacing recess is used for placing the chip board, the loading has a plurality of fingerprint chips on the chip board, the fixed plate middle part is provided with the guiding hole that link up from top to bottom, the guiding hole intercommunication spacing recess, the guiding hole is used for fake finger mechanism to stretch into the contact chip board, the fixed plate top is provided with the clamp plate, clamp plate middle part fretwork is in order to be used for fingerprint chip and wiring board electric connection, connects in chip board top, and the clamp plate is used for restricting the chip board in spacing recess.
2. The test bench structure of claim 1, wherein the guide holes are arranged in matrix form and uniformly spaced, the number of longitudinal arrangements corresponds to the number of the dummy finger mechanisms, and the spacing between the longitudinal arrangements corresponds to the spacing between the dummy finger mechanisms;
the wiring board is provided with a plurality of pin structures on one side close to the fixed plate, a plurality of flat cable sockets on one side far away from the fixed plate, the number of the longitudinal arrangement corresponds to that of the pin structures, and the distance between the longitudinal arrangement positions corresponds to that of the pin structures.
3. The test bench structure of claim 1, wherein a rubber pad is disposed at one side of the limiting groove close to the chip plate, a through hole is disposed at a position of the rubber pad corresponding to the guide hole, and a cross-sectional profile of the through hole is greater than that of the guide hole.
4. The test bench structure according to claim 1, wherein the cross section of the fixing plate is rectangular, a shifting block is arranged at a corner position on the fixing plate close to one side of the test driving device, the shifting block comprises a handle, a connecting part and a first clamping block, the first clamping block and the handle are connected to two ends of the connecting part, the connecting part is hinged to the fixing plate, a first position avoiding opening is arranged below the first clamping block, and the first clamping block is gradually reduced in thickness along the first position avoiding opening in the direction away from the connecting part, so that the extrusion force of the first clamping block on the second clamping block is gradually increased;
one side, far away from the test driving device, of the pressing plate is connected to the fixing plate in a loose-leaf mode, one side, close to the shifting block, of the pressing plate is provided with a second clamping block, a second avoiding opening is formed in the upper portion of the second clamping block and is fan-shaped, and when the first clamping block moves along the second avoiding opening, the first clamping block and the second clamping block form limiting matching.
5. The test bench structure of claim 1, wherein a plurality of limiting protrusions are disposed outside the limiting grooves, and a limiting through hole is disposed on the pressure plate corresponding to the limiting protrusions, and the limiting through hole is a long slot.
6. The test bench structure of claim 1, wherein an open slot is formed in the middle of each side of the fixing plate, the open slot extends inwards to communicate with the limiting groove, and the open slot is used for facilitating replacement of the chip plate.
7. A fingerprint chip testing device, characterized in that, using the test platform structure of any one of claims 1-6, it further comprises:
the artificial finger mechanism is connected with the test driving device and driven to move;
the fixed frame is arranged on the outer side of the test board;
the wiring board;
the wiring board driving device is arranged above the wiring board and fixedly connected to the middle of the upper portion of the fixing plate and comprises a wiring board driving cylinder, and the wiring board driving cylinder is connected with the wiring board and used for driving the wiring board to contact the chip board.
8. The fingerprint chip testing device of claim 7, wherein the fake finger mechanism comprises:
the copper guide sleeve is cylindrical and is connected in the fake finger hole, a first annular groove is formed in the arc surface of the outer side of the copper guide sleeve, a connecting hole is formed in the middle of the copper guide sleeve, and the axis of the connecting hole is consistent with the axis of the copper guide sleeve;
the artificial finger rod comprises an extension rod, a supporting plate and a connecting rod, wherein the supporting plate is connected between the extension rod and the connecting rod, the extension rod is connected in the connecting hole in a sliding manner, and a fixing threaded hole is formed in the middle of the lower end of the extension rod;
the spring is connected to the outer side of the extension rod, the upper end of the spring is in contact with the supporting plate, and the lower end of the spring is in contact with the copper guide sleeve;
the artificial finger of silica gel, the column sets up fixed plate below, the below is provided with the spread groove, the spread groove parcel is connected on the connecting rod.
9. The fingerprint chip testing device according to claim 8, wherein the dummy finger mechanism is connected to the test driving device through a connecting arm, a connecting threaded hole is formed in the connecting arm corresponding to the first annular groove, the connecting threaded hole is communicated with the dummy finger hole, an axis of the connecting threaded hole is perpendicular to an axis of the dummy finger hole, and the connecting threaded hole is used for fixing the copper guide sleeve in the dummy finger hole;
and a second annular groove is arranged on the outer side of the connecting hole on the copper guide sleeve, the diameter of the second annular groove is consistent with that of the spring, the width of the second annular groove is greater than that of a spring wire of the spring, and the second annular groove is used for limiting the spring.
10. The fingerprint chip testing device of claim 7, wherein the test driving device comprises:
the supporting bottom plate is provided with a plurality of transverse long slotted holes and is used for supporting;
the test driving cylinder is connected to the supporting bottom plate and comprises an output end, and the output end faces upwards;
the supporting vertical plate is vertically connected to the supporting bottom plate, the plate surface is connected with the testing driving cylinder, a first limiting block is convexly arranged at the edge of one surface close to the testing driving cylinder, and the first limiting block is in contact with the testing driving cylinder and is used for guaranteeing the verticality of the testing driving cylinder and the ground;
the first connecting plate comprises a connecting transverse plate and a connecting vertical plate, the connecting transverse plate is vertically connected above the connecting vertical plate, the connecting transverse plate is connected with the output end of the test driving cylinder, and the connecting vertical plate is positioned on one side, far away from the supporting vertical plate, of the test driving cylinder;
the second connecting plate comprises a plurality of vertical long slotted holes, a transverse clamping groove is arranged above two plate surfaces, the width of the transverse clamping groove is equal to the thickness of the connecting arm, a plurality of connecting through holes are formed in the transverse clamping groove corresponding to the positions of the longitudinal long slotted holes in the connecting arm, the connecting arm is connected into the transverse clamping groove through the connecting through holes, the vertical long slotted holes are connected to the connecting vertical plate, a second limiting block is arranged at the edge of one surface, close to the connecting vertical plate, of the second connecting plate in a protruding mode, the second limiting block is in contact with the connecting vertical plate, and the first limiting block and the second limiting block are located on one side, close to the test board;
a third limiting block and a limiting screw are arranged on one side, away from the test board, of the test driving air cylinder, one end of the third limiting block is connected to the test driving air cylinder, the other end of the third limiting block is close to the connecting vertical plate, a limiting threaded hole is formed in one side, close to the connecting vertical plate, of the third limiting block, and the limiting screw is connected in the limiting threaded hole;
connect the riser and keep away from testboard one side protrusion is provided with the fourth stopper, the fourth stopper sets up third stopper below drives actuating cylinder drive when the test fake finger mechanism rises to the highest time, stop screw supports the fourth stopper.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211654572.2A CN115792576A (en) | 2020-08-24 | 2020-08-24 | Test bench structure and corresponding fingerprint chip testing device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211654572.2A CN115792576A (en) | 2020-08-24 | 2020-08-24 | Test bench structure and corresponding fingerprint chip testing device |
| CN202010854564.7A CN111965526B (en) | 2020-08-24 | 2020-08-24 | Fingerprint chip testing device with fake finger mechanism |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202010854564.7A Division CN111965526B (en) | 2020-08-24 | 2020-08-24 | Fingerprint chip testing device with fake finger mechanism |
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| CN115792576A true CN115792576A (en) | 2023-03-14 |
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| CN202010854564.7A Active CN111965526B (en) | 2020-08-24 | 2020-08-24 | Fingerprint chip testing device with fake finger mechanism |
| CN202211654572.2A Pending CN115792576A (en) | 2020-08-24 | 2020-08-24 | Test bench structure and corresponding fingerprint chip testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9524415B2 (en) * | 2014-07-18 | 2016-12-20 | Qualcomm Incorporated | Test techniques for assessing ultrasonic fingerprint sensors |
| WO2017185247A1 (en) * | 2016-04-27 | 2017-11-02 | 深圳市汇顶科技股份有限公司 | Chip testing method and device |
| CN206331089U (en) * | 2016-12-30 | 2017-07-14 | 江苏凯尔生物识别科技有限公司 | Smart mobile phone fingerprint chip Turnover testing device |
| CN207281243U (en) * | 2017-06-16 | 2018-04-27 | 江苏凯尔生物识别科技有限公司 | Multipurpose test system for fingerprint chip |
| CN107632214B (en) * | 2017-08-28 | 2019-12-13 | 杭州长川科技股份有限公司 | Fingerprint chip pressing simulation test device and test method |
| CN107677950B (en) * | 2017-08-28 | 2019-12-24 | 杭州长川科技股份有限公司 | Fingerprint chip testing device and testing method |
| CN107656162A (en) * | 2017-10-27 | 2018-02-02 | 昆山精讯电子技术有限公司 | A kind of fingerprint recognition module test device |
| CN207703978U (en) * | 2017-11-03 | 2018-08-07 | 杭州长川科技股份有限公司 | A kind of fingerprint chip electric performance testing device |
| CN108051727B (en) * | 2017-11-03 | 2020-03-03 | 杭州长川科技股份有限公司 | Fingerprint chip electrical property testing arrangement |
| CN108169587A (en) * | 2017-12-06 | 2018-06-15 | 江西合力泰科技有限公司 | A kind of fingerprint module prosthetic finger test device of dead weight mode |
-
2020
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| CN111965526A (en) | 2020-11-20 |
| CN111965526B (en) | 2023-01-17 |
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