CN115774174A

CN115774174A - Thyristor equipment tester

Info

Publication number: CN115774174A
Application number: CN202111044137.3A
Authority: CN
Inventors: 张翔; 杨帆; 方太勋; 卢宇; 罗新明; 刘磊
Original assignee: NR Electric Co Ltd; NR Engineering Co Ltd; Changzhou NR Electric Power Electronics Co Ltd
Current assignee: NR Electric Co Ltd; NR Engineering Co Ltd; Changzhou NR Electric Power Electronics Co Ltd
Priority date: 2021-09-07
Filing date: 2021-09-07
Publication date: 2023-03-10
Also published as: WO2023036132A1

Abstract

The application aims at providing a thyristor device tester. Thyristor equipment tester, including single-stage testing arrangement and multistage test cooperation device, wherein: the single-stage testing device is used for performing function testing on a single thyristor stage; the single-stage testing device is connected with the multi-stage testing matching device through an interface part and is used for simultaneously carrying out function testing on a plurality of thyristor stages. On the basis of keeping the testing function of a single thyristor level, the valve component level (polycrystalline thyristor level) testing function is added, so that the requirements of single thyristor level testing and fault analysis can be met, the advantages of light weight and easiness in carrying can be kept, the requirements of simultaneous testing of a plurality of thyristor levels can be met, the functional testing efficiency during routine annual inspection is improved, the testing and overhauling time is shortened, and the direct current availability is improved.

Description

Thyristor equipment tester

Technical Field

The application relates to the technical field of power electronics, in particular to a thyristor device tester.

Background

The conventional high-voltage direct-current converter valve is formed by connecting a plurality of thyristor stages in series, and each thyristor stage mainly comprises components such as a thyristor, a static voltage-sharing resistor, a damping capacitor and a thyristor trigger unit (TCU).

The thyristor is the most core device, can bear several kilovolts in the off state, and can be conducted after receiving a trigger signal at the gate level. The static voltage-sharing resistor is used for sharing voltage among thyristor levels under the direct-current voltage. The main functions of the damping resistor and the damping capacitor are to suppress the reverse voltage overshoot generated on the loop inductance due to the sudden change of current during the turn-off of the thyristor. The TCU is responsible for the control and protection of a thyristor level, and under a normal working condition, the TCU acquires energy in each power frequency period, sends a return signal IP to a valve control unit (VBE), receives an ignition signal FP issued by the VBE and then triggers the thyristor to be conducted. Besides the normal trigger function, the TCU also has the functions of forward overvoltage protection and reverse recovery period protection, and when the thyristor is in an off state or in a reverse recovery period, the TCU detects that the voltage of two ends of the thyristor level exceeds a corresponding protection fixed value, a protection trigger pulse is generated to force the thyristor to be triggered to conduct, so that the thyristor is prevented from being damaged by overvoltage.

In order to ensure the stability and reliability of the thyristor-level work and timely find and remove fault components, the thyristor-level function test needs to be carried out on an engineering site, and the test contents comprise thyristor-level impedance, voltage resistance, normal triggering and protection triggering of TCU and the like. The test occasions generally comprise subsystem tests after the converter valve is installed, routine annual inspection after formal power transmission and various abnormal fault overhauls, wherein besides the fault overhauls, the subsystem tests and the routine annual inspection both need to carry out large-batch tests on thyristor levels in the converter valve, the subsystem tests require all project function tests, and the routine annual inspection generally only carries out impedance and normal low-voltage trigger tests.

Compared with a subsystem test, routine annual inspection needs to temporarily transfer high power to other lines because power failure is carried out after formal power transmission, and the direct current transmission end does not have any economic benefit of power transmission during annual inspection, so that power failure time needs to be reduced as much as possible, and power transmission needs to be recovered as soon as possible.

At present, when a function test is carried out, only one thyristor level can be tested at each time, the test wiring needs to be moved to the next thyristor level after the test is finished, and under the condition of smooth test, the time of completing the test of all thyristor levels of a valve hall in routine annual inspection needs about 3 days, which often becomes a key restriction factor that the annual inspection power failure time can not be reduced.

Therefore, a scheme is needed to be designed, on the basis of keeping the testing function of the thyristor level, the function of the valve component level (the testing function of the thyristor level) is added, so that the requirements of testing and fault analysis of a single thyristor level can be met, the advantages of light weight and easiness in carrying can be kept, the requirements of simultaneously testing a plurality of thyristor levels can be met, the functional testing efficiency during routine annual inspection is improved, the testing and overhauling time is shortened, and the direct current availability is improved.

The above information disclosed in this background section is only for enhancement of understanding of the background of the application and therefore it may contain information that does not constitute prior art that is already known to a person of ordinary skill in the art.

Disclosure of Invention

The application aims at providing a thyristor device tester, can compatible single thyristor level and a plurality of thyristor level functional test.

According to an aspect of the present application, a thyristor device tester is provided, including single-stage testing arrangement and multistage test cooperation device, wherein:

the single-stage testing device is used for performing functional testing on a single thyristor stage;

the single-stage testing device is connected with the multi-stage testing matching device through an interface part and is used for simultaneously carrying out function testing on a plurality of thyristor stages.

According to some embodiments, the interface section includes a power transmission channel, a signal transmission channel, and a mechanical locking mechanism for power transmission, signal interaction, and mechanical locking between the single stage test device and the multi-stage test mating device.

According to some embodiments, the single stage test device includes a human-computer interaction module, a core control circuit, a single stage impedance test circuit, a single stage trigger test circuit, a first output control circuit, and a first interface section.

According to some embodiments, the multi-stage test rig includes an auxiliary control circuit, a multi-stage impedance test circuit, a multi-stage trigger test circuit, a second output control circuit, and a second interface section.

According to some embodiments, the human-computer interaction module displays a single-level test interface when only the single-level test device is available; after the single-stage testing device and the multi-stage testing matching device are assembled, a multi-stage testing interface can be automatically identified or manually selected.

According to some embodiments, the first output control circuit and the second output control circuit each comprise a plurality of switches for switching a test circuit;

the second output control circuit further comprises a plurality of selector switches for controlling the number of the single-stage trigger test circuits connected in series.

According to some embodiments, the single stage impedance testing circuit output stimulus voltage comprises a direct current or an alternating current and the multi-stage impedance testing circuit output stimulus voltage comprises a direct current or an alternating current.

According to some embodiments, the single stage trigger test circuit includes a transformer and a current limiting resistor, and the output excitation voltage is alternating current.

According to some embodiments, the multi-stage trigger test circuit comprises at least two of the single-stage trigger test circuits in series.

According to some embodiments, a wiring is led out between two adjacent single-stage trigger test circuits in the multi-stage trigger test circuit, and the selection switch of the second output control circuit is electrically connected.

According to some embodiments, the tester may set a number of stages to be tested, control the selection switch of the second output control circuit according to the number of stages to be tested, and control the number of the single-stage trigger test circuits in the multi-stage trigger test circuit to be put into use to be equal to the number of stages to be tested.

According to some embodiments, the changeover switch of the second output control circuit switches the multistage impedance test circuit to operate or the multistage trigger test circuit to operate by turning off a control switch.

According to some embodiments, the test meter comprises a first test mode and a second test mode, wherein:

in the first test mode, the tester and the converter valve to be tested are connected with a circuit through an optical path or only connected with the circuit;

and in the second test mode, the tester and the tested converter valve are only connected through a circuit.

According to some embodiments, the tester is for single-stage testing of a single thyristor stage in the first test mode or the second test mode; and is

The tester is used for carrying out multi-stage test on a plurality of thyristor stages only in the second test mode.

According to some embodiments, in the second test mode, the tester has positive and negative outputs from the multi-stage test rig or a positive output from the multi-stage test rig and a negative output from the single-stage test rig.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.

Drawings

The above and other objects, features and advantages of the present application will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings. The drawings described below are for illustrative purposes only of certain embodiments of the present application and are not intended to limit the present application.

FIG. 1 shows a system architecture diagram of a thyristor device tester according to an exemplary embodiment of the present application;

FIG. 2 illustrates a single stage trigger test circuit of the thyristor device tester of an exemplary embodiment of the present application;

FIG. 3 illustrates a circuit schematic of a multi-stage test rig of a thyristor device tester according to an exemplary embodiment of the present application;

FIG. 4 illustrates a test connection diagram of a single thyristor level test mode in accordance with an exemplary embodiment of the present application;

FIG. 5 illustrates yet another embodiment of a test connection diagram for an exemplary single thyristor level test mode of the present application;

fig. 6 illustrates a test connection diagram of a multi-thyristor level test mode according to an exemplary embodiment of the present application.

Detailed Description

Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals in the drawings denote the same or similar parts, and a repetitive description thereof will be omitted.

The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a thorough understanding of embodiments of the disclosure. One skilled in the relevant art will recognize, however, that the embodiments of the disclosure can be practiced without one or more of the specific details, or with other means, components, materials, devices, or the like. In such cases, well-known structures, methods, devices, implementations, materials, or operations are not shown or described in detail.

The flowcharts shown in the figures are illustrative only and do not necessarily include all of the contents and operations/steps, nor do they necessarily have to be performed in the order described. For example, some operations/steps may be decomposed, and some operations/steps may be combined or partially combined, so that the actual execution sequence may be changed according to the actual situation.

The terms "first," "second," and the like in the description and claims of the present application and in the above-described drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements but may alternatively include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

It should be understood by those skilled in the art that the drawings are merely schematic representations of exemplary embodiments, and that the blocks or flowchart illustrations in the drawings are not necessarily required to practice the present application and, therefore, should not be considered to limit the scope of the present application.

Embodiments of apparatus of the present application are described below that may be used to perform embodiments of the methods of the present application. For details not disclosed in the embodiments of the apparatus of the present application, reference is made to embodiments of the method of the present application.

Fig. 1 shows a system architecture diagram of a thyristor device tester according to an exemplary embodiment of the present application.

As shown in fig. 1, the tester for thyristor devices in this embodiment includes a single-stage testing device and a multi-stage testing coordination device.

Referring to fig. 1, the single-stage test device includes a human-computer interaction module 101, a core control circuit 109, a single-stage impedance test circuit 105, a single-stage trigger test circuit 103, an output control circuit 107 and an interface portion 1, and the multi-stage test matching device includes an auxiliary control circuit 209, a multi-stage impedance test circuit 203, a multi-stage trigger test circuit 205, an output control circuit 207 and an interface portion 2.

As shown in fig. 1, the human-computer interaction module 101 is connected to a core control circuit 109, the core control circuit 109 is connected to the single-stage trigger test circuit 103 and the single-stage impedance test circuit 105, the core control circuit 109 is connected to the interface portion 1, and the core control circuit 109 is connected to the output control circuit 107. The single-stage trigger test circuit 103 is connected to the output control circuit 107, and the single-stage impedance test circuit 105 is connected to the output control circuit 107. The output control circuit 107 is connected to the interface section 1.

As shown in fig. 1, the interface portion 1 is connected to the interface portion 2. The interface section 2 is connected to the auxiliary control circuit 209. The auxiliary control circuit 209 is connected to the multi-stage impedance test circuit 203 and the multi-stage trigger test circuit 205, and the auxiliary control circuit 209 is connected to the output control circuit 207. The multi-stage impedance test circuit 203 is connected to the output control circuit 207, and the multi-stage trigger test circuit 205 is connected to the output control circuit 207. The output control circuit 207 is connected to the interface section 2.

According to an exemplary embodiment, the interface parts 1 and 2 are in the form of male and female heads that are configured to mate with each other, each containing a respective power transmission channel, signal transmission channel, and mechanical locking mechanism. The thyristor equipment tester in the embodiment is formed by assembling a single-stage testing device and a multi-stage testing matching device, and the assembling work is realized by connecting an interface part 1 of the single-stage testing device and an interface part 2 of the multi-stage testing matching device.

According to an example embodiment, the human machine interaction module 101 is displayed as a single level test interface when there is only a single level of test equipment; after the single-stage testing device and the multi-stage testing matching device are assembled, the multi-stage testing interface can be automatically identified, and the number of the thyristor stages connected in series of the tested valve can be input on the interface.

According to an example embodiment, the output control circuit 107 and the output control circuit 207 each include a plurality of changeover switches, and the output control circuit 207 further includes a plurality of selection switches.

FIG. 2 illustrates a single stage trigger test circuit of the thyristor device tester of an exemplary embodiment of the present application.

As shown in fig. 2, the output excitation voltage of the single-stage impedance test circuit includes a direct current and an alternating current, and the output voltage has a settable voltage amplitude, for example, an output voltage amplitude of 30V. The single-stage trigger test circuit comprises a 220V/380V power frequency transformer and a current-limiting resistor.

Fig. 3 shows a circuit schematic of a multi-stage test coordination apparatus of a thyristor device tester according to an exemplary embodiment of the present application.

As shown in fig. 3, the multi-stage trigger test circuit includes at least two single-stage trigger test circuits connected in series with each other.

According to an exemplary embodiment, four single-stage trigger test circuits connected in series with each other are taken as an example. Referring to fig. 3, the multi-stage trigger test circuit includes 4 single-stage trigger test circuits connected in series with each other. The output control circuit 2 includes 4 selection switches. 3 terminals are led out between two adjacent single-stage trigger test circuits of the multi-stage trigger test circuit and are respectively used for being connected with one ends of selection switches K3, K4 and K5, the other ends of the K3, K4 and K5 are connected to form a public end, and the selection switch K6 is connected between the public end and one single-stage trigger test circuit on the most edge of the public end.

As shown in fig. 3, the multi-stage impedance test circuit is connected in parallel with the output control circuit 2, and the converter valve to be tested is connected in parallel with the output control circuit 2. And the on and off of the switches K1 and K2 are switched, so that the multi-stage trigger test circuit or the multi-stage impedance test circuit is put into operation, and whether the thyristor stage of the tested converter valve works normally is detected.

According to an example embodiment, the multi-stage impedance testing circuit outputs the excitation voltage comprising a direct current and an alternating current, and the output voltage has a settable voltage magnitude, for example, an output voltage magnitude of 120V.

FIG. 4 shows a test connection diagram of a single thyristor level test mode in an exemplary embodiment of the present application.

As shown in fig. 4, the tester and the converter valve under test are connected by an optical circuit and an electric circuit.

According to an exemplary embodiment, the tester is responsible for applying voltage excitations required for testing to the converter valve under test through the circuit connection; and receiving the measured converter valve return signal through the optical path connection, and outputting a trigger signal to the converter valve through the optical path connection to control the conduction of the converter valve.

According to some embodiments, when performing a functional test on a single thyristor level, the single level testing apparatus is carried to the lifting platform, and the tester and the converter valve under test are connected according to fig. 4, and the test is started.

FIG. 5 illustrates yet another embodiment of a test connection diagram for an exemplary single thyristor level test mode of the present application.

Referring to fig. 5, the tester and the converter valve under test have only circuit connections, and the tester applies voltage excitation required for testing to the converter valve under test through the circuit connections.

According to an exemplary embodiment, the tested converter valve and the valve control device VBE are connected by an optical path, and the valve control device VBE outputs a trigger signal to the converter valve to control the converter valve to be conducted after receiving the converter valve reporting signal.

According to some embodiments, when performing a functional test on a single thyristor level, the single level testing apparatus is carried to the lifting platform, and the tester and the converter valve under test are connected according to fig. 5 to start the test.

According to some embodiments, when performing single-stage testing, two test modes may be selected: test mode 1, as shown in fig. 4, and test mode 2, as shown in fig. 5.

FIG. 6 illustrates a test connection diagram of a multiple thyristor level test mode according to an exemplary embodiment of the present application.

As shown in fig. 6, the tester and the converter valve under test have only circuit connection, and the tester applies voltage excitation required by the test to the converter valve under test through the circuit connection; and the measured converter valve is connected with the valve control device VBE through an optical path, and the valve control device VBE outputs a trigger signal to the converter valve to control the conduction of the converter valve after receiving the converter valve return signal.

According to the embodiment, when a plurality of thyristor stages connected in series are required to be subjected to function testing simultaneously, the single-stage testing device and the multistage testing matching device are respectively carried to the lifting platform, the single-stage testing device is placed on the multistage testing matching device, the male and female heads are aligned and then plugged by the gravity of the single-stage testing device, and the plugging can also be performed in a manual mode, so that a power channel and a signal link between the interface parts 1 and 2 of the two devices are communicated, the two devices are locked through the locking structure, after the assembly, the power transmission and the signal interaction between the two devices can be realized, and a whole body can be formed, so that the purposes of stable structure and attractive appearance are achieved.

According to an example embodiment, taking testing of 4 thyristor levels as an example, a tester and a converter valve to be tested are connected, the testing level number is set to be 4 levels on a man-machine interaction module of a single-level testing device, at the moment, a testing mode 2 is selected by default by the tester, and a core control circuit of the single-level testing device transmits a control instruction to an auxiliary control circuit of a multi-level testing matching device through an interface part 1 and an interface part 2.

According to an exemplary embodiment, the auxiliary control circuit controls the selection switches K3-K5 of the output control circuit 2 to be all open and K6 to be closed, so that the number of series connections of the single-stage trigger test circuits in the multi-stage trigger test circuit is 4.

According to an example embodiment, when a multi-level impedance test is selected, K1 is closed and K2 is open; when a multi-stage trigger test is selected, K1 is opened and K2 is closed.

According to an exemplary embodiment, the final test stimulus of the tester is directed through the multi-stage test suite chassis.

According to an example embodiment, if there is a thyristor level fault through the multi-level test, the set of thyristors are tested single level, re-tested.

According to an exemplary embodiment, a plurality of thyristor stages are functionally tested simultaneously, test mode 2 is selected, either with the positive and negative outputs of the tester leading from the multi-stage test arrangement or with the positive output leading from the multi-stage test arrangement and the negative output leading from the single-stage test arrangement.

It should be clearly understood that this application describes how to make and use particular examples, but the application is not limited to any details of these examples. Rather, these principles can be applied to many other embodiments based on the teachings of the present disclosure.

Furthermore, it should be noted that the above-mentioned figures are only schematic illustrations of the processes involved in the method according to exemplary embodiments of the present application, and are not intended to be limiting. It will be readily appreciated that the processes illustrated in the above figures are not intended to indicate or limit the temporal order of the processes. In addition, it is also readily understood that these processes may be performed synchronously or asynchronously, e.g., in multiple modules.

Exemplary embodiments of the present application are specifically illustrated and described above. It is to be understood that the application is not limited to the details of construction, arrangement, or method of implementation described herein; on the contrary, the application is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the appended claims.

Claims

1. The utility model provides a thyristor equipment tester, its characterized in that includes single-stage testing arrangement and multistage test cooperation device, wherein:

the single-stage testing device is used for performing function testing on a single thyristor stage;

2. The test meter of claim 1, wherein the interface section includes power transmission channels, signal transmission channels, and mechanical locking mechanisms for power transmission, signal interaction, and mechanical locking between the single stage test device and the multi-stage test rig.

3. The tester of claim 1, wherein the single stage testing device includes a human-computer interaction module, a core control circuit, a single stage impedance testing circuit, a single stage trigger testing circuit, a first output control circuit, and a first interface section.

4. The tester of claim 3, wherein the multi-stage test coordination unit includes an auxiliary control circuit, a multi-stage impedance test circuit, a multi-stage trigger test circuit, a second output control circuit, and a second interface section.

5. The tester of claim 3, wherein the human interaction module displays a single level test interface when only the single level test device is present; after the single-stage testing device and the multi-stage testing matching device are assembled, a multi-stage testing interface can be automatically identified or manually selected.

6. The tester of claim 4, wherein the first output control circuit and the second output control circuit each include a plurality of switches for switching the test circuit;

7. The tester of claim 4 wherein the single stage impedance testing circuit output stimulus voltage comprises direct current or alternating current and the multi-stage impedance testing circuit output stimulus voltage comprises direct current or alternating current.

8. The tester as claimed in claim 3, wherein the single stage trigger test circuit includes a transformer and a current limiting resistor, and the output excitation voltage is alternating current.

9. The tester of claim 4, wherein the multi-stage trigger test circuit comprises at least two of the single-stage trigger test circuits connected in series.

10. The tester of claim 6, wherein a connection is routed between two adjacent single-stage trigger test circuits of the multi-stage trigger test circuit to electrically connect the selector switch of the second output control circuit.

11. The tester of claim 10, wherein the tester is capable of setting a number of stages to be tested, and wherein the selector switch of the second output control circuit is controlled according to the number of stages to be tested, and wherein the number of single-stage trigger test circuits in the multi-stage trigger test circuit to be put into use is controlled to be equal to the number of stages to be tested.

12. The tester of claim 6, wherein the switch of the second output control circuit switches the multi-stage impedance test circuit or the multi-stage trigger test circuit to operate by opening a control switch.

13. The tester of claim 1, wherein the tester comprises a first test mode and a second test mode, wherein:

14. The meter of claim 13, wherein:

the tester is used for performing single-stage test on a single thyristor stage in the first test mode or the second test mode; and is

15. The meter of claim 14, wherein:

in the second test mode, the positive and negative output ends of the tester are led out from the multi-stage test matching device or the positive output end is led out from the multi-stage test matching device, and the negative output end is led out from the single-stage test device.