CN115774151A - Device and method for testing turn-to-turn contact resistance of non-insulated superconducting coil - Google Patents
Device and method for testing turn-to-turn contact resistance of non-insulated superconducting coil Download PDFInfo
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- CN115774151A CN115774151A CN202211593564.1A CN202211593564A CN115774151A CN 115774151 A CN115774151 A CN 115774151A CN 202211593564 A CN202211593564 A CN 202211593564A CN 115774151 A CN115774151 A CN 115774151A
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- 238000012360 testing method Methods 0.000 title claims abstract description 40
- 238000000034 method Methods 0.000 title claims abstract description 18
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 19
- 239000007788 liquid Substances 0.000 claims abstract description 13
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 9
- 239000011229 interlayer Substances 0.000 claims abstract description 7
- 239000010410 layer Substances 0.000 claims description 51
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 10
- 229910052802 copper Inorganic materials 0.000 claims description 10
- 239000010949 copper Substances 0.000 claims description 10
- 239000011241 protective layer Substances 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 5
- 238000012935 Averaging Methods 0.000 claims description 4
- 229910052709 silver Inorganic materials 0.000 claims description 4
- 239000004332 silver Substances 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 3
- 238000007747 plating Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 abstract description 5
- 238000005516 engineering process Methods 0.000 description 5
- 238000010791 quenching Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E40/00—Technologies for an efficient electrical power generation, transmission or distribution
- Y02E40/60—Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment
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Abstract
The invention discloses a device and a method for testing turn-to-turn contact resistance of an uninsulated superconducting coil, which relate to the technical field of superconducting strip resistance measurement and comprise the following steps: the cavity of the cold-warm tank is used for placing the superconducting tape, and liquid nitrogen is arranged in an interlayer on the outer wall of the cold-warm tank; the inflator pump is communicated with the cavity of the cold-warm tank; the universal meter is used for detecting voltage values and current values between different turns of the superconducting tape under different compressive stresses; a control unit for calculating the interturn contact resistance value R under different compressive stresses according to the voltage value and the current value C Resistance to turn-to-turn contact ρ C . The invention can quickly and effectively measure the turn-to-turn contact resistance value of the uninsulated superconducting coil under different compressive stresses and improve the efficiency.
Description
Technical Field
The invention relates to the technical field of superconducting strip resistance measurement, in particular to a device and a method for testing turn-to-turn contact resistance of an uninsulated superconducting coil.
Background
The research and development of the high-magnetic-field superconducting magnet are mainly limited by the stability of the magnet, and the good stability can ensure that the magnet does not exit a superconducting state in the running process. The study of various quench detection and protection methods has been carried out by scholars at home and abroad aiming at the problem of safety and stability of the operation of the high-temperature superconducting magnet, but the current quench detection technology has the defects of slow detection speed, low precision, insufficient economic reliability and the like, and the quench detection requirement of the high-temperature superconducting magnet cannot be well met.
The uninsulated magnet technology can be used for enhancing the thermal stability of the high-field superconducting magnet, an insulating layer outside a superconducting strip is omitted by the technology, a coil is wound by a bare belt, the coil has a quench self-protection function due to the turn-to-turn shunting characteristic, the coil cannot be burnt down when running under an overcurrent working condition, the improvement of the thermal stability of the magnet is facilitated, and the problem of quench protection difficulty is relieved to a certain extent due to the self-protection function. However, in a large-scale electric power apparatus using the uninsulated magnet technology, a long excitation waiting time is required for the uninsulated coil to complete excitation, and a charging delay problem that the conventional insulated magnet does not have is brought about, and inter-turn contact resistance is one of the main factors causing the problem, so that it is necessary to study the test of the inter-turn contact resistance of the uninsulated superconducting tape.
At present, for the measurement of turn-to-turn contact resistance of an uninsulated superconducting tape, many methods measure the turn-to-turn contact resistance of the tape by adjusting the material, width and thickness of an encapsulated tape, or further modulate the turn-to-turn contact resistance of the tape by way of winding the tape, or even further optimize the turn-to-turn contact resistance by some treatment on the surface of the wound tape. These measurement methods have certain errors because the influence factors of the turn-to-turn contact resistance of the superconducting tape are complex and are influenced by contact pressure stress besides relevant parameters of the tape.
Disclosure of Invention
The invention aims to solve the problems and provides a device and a method for testing turn-to-turn contact resistance of an uninsulated superconducting coil
The invention provides the following technical scheme: a testing device for turn-to-turn contact resistance of an uninsulated superconducting coil comprises:
the cavity of the cold temperature tank is used for placing the superconducting strip, and liquid nitrogen is arranged in an interlayer on the outer wall of the cold temperature tank;
the inflator pump is communicated with the cavity of the cold-warm tank;
the universal meter is used for detecting voltage values and current values between different turns of the superconducting tape under different compressive stresses;
the control unit is electrically connected with the inflator pump and calculates the turn-to-turn contact resistance value R under different pressure stresses through the voltage value and the current value C Resistance to turn-to-turn contact ρ C 。
Preferably, the superconducting tape is placed on a rectangular central axis in the cavity, and the direction of the compressive stress applied to the superconducting tape is perpendicular to the surface of the superconducting tape.
Preferably, the device further comprises a pressure sensor arranged in the cold Wen Guankong cavity, and the pressure sensor is electrically connected with the control unit.
Preferably, the pressure stress in the cold-warm tank ranges from 0 MPa to 39MPa.
Preferably, a temperature sensor is arranged in the cavity.
Preferably, the superconducting tape is formed by stacking different layers of superconducting tape sheets, and comprises a copper protective layer, a substrate layer, a buffer layer, a superconducting layer, a silver coating and a copper protective layer which are sequentially arranged from outside to inside, wherein the thicknesses of the copper protective layer and the substrate layer are larger than those of other layers.
Preferably, the test device further comprises an external power supply, wherein the external power supply provides the current of 10A for the test device.
Another objective of the present invention is to provide a method for testing turn-to-turn contact resistance of an uninsulated superconducting coil, comprising the following steps:
preparing a plurality of superconducting tape testing sheets, and stacking the sheets to form superconducting tapes with different layers;
putting the superconducting strip into cold Wen Guanna, and fixing the superconducting strip on a rectangular central shaft of a cavity of a cold Wen Guanna layer;
filling liquid nitrogen in the interlayer of the cold-temperature tank to provide a low-temperature environment required by the superconducting state for the superconducting tape;
the control unit controls the air pump to start, and gas is injected into the cavity of the cold Wen Guanna, so that the internal pressure of the cavity is increased to apply pressure stress to the superconducting tape;
the pressure sensor measures the magnitude of the compressive stress of the superconducting tape and judges whether the superconducting tape reaches a proper value of the compressive stress;
recording voltage values and current values of different turns of the superconducting tape measured by a multimeter;
the control unit calculates the turn-to-turn contact resistance value R of the superconducting strip through the voltage value and the current value C Resistivity p of turn-to-turn contact C ；
Changing the magnitude of the compressive stress, and repeating the step of obtaining the inter-turn contact resistivity to obtain the inter-turn contact resistance value R of the superconducting strip under different compressive stresses C Resistance to turn-to-turn contact ρ C 。
Preferably, the contact resistance value R C Resistance to turn-to-turn contact ρ C The calculation process of (2) is as follows:
dividing the voltage difference by the current and the layer number difference to obtain the turn-to-turn contact resistance value R C ；
Repeating n groups to obtain turn-to-turn contact resistance value R C Obtaining n sets of inter-turn contact resistance values R C ；
Averaging the inter-turn contact resistance obtained by n times of calculation and multiplying the average value by the contact area to obtain the inter-turn contact resistance rate rho C ；
Wherein: i is the number of stacked layers of strip material, i>2；V i Is a beltVoltage when the number of the material layers is i; i is the loading current.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention can measure the resistance value of the superconducting tape under the influence of different compressive stresses by applying different compressive stresses to the superconducting tape to be measured in a superconducting state and with different layers, fully considers the actual distribution condition and the dynamic change process of the resistance of the superconducting tape to be measured under the influence of the compressive stresses, can quickly and effectively measure the turn-to-turn contact resistance value of the uninsulated superconducting coil under different compressive stresses, improves the efficiency, and is more suitable for practical application.
2. The measuring method provided by the invention reduces errors caused by differences of strip samples, and the method for averaging can also improve the accuracy of turn-to-turn contact resistivity calculation.
3. The invention can meet the requirement of testing various types of superconducting tapes to be tested.
Drawings
FIG. 1 is a schematic diagram of the operation of the turn-to-turn contact resistance testing apparatus according to the present invention;
FIG. 2 is a schematic structural view of a stack of superconducting tapes with different layers according to the present invention;
FIG. 3 is a schematic view showing a structure of a superconducting tape according to the present invention;
FIG. 4 is a partial schematic view of the superconducting tape of the present invention being fixed to the central axis of the cavity of cold Wen Guanna layers.
Reference numerals: 1-an inflator pump; 2-a control unit; 3-a compressive stress generating device; 4-cooling the temperature tank; 5-a pressure sensor; 6-temperature sensor; 7-external power supply; 8-a multimeter; 9-superconducting tapes; 10-liquid nitrogen; 901-a copper protective layer; 902-a base layer; 903-a buffer layer; 904-superconducting layer; 905-silver coating.
Detailed Description
The following further describes embodiments of the present invention with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
For understanding and explanation, the following describes in detail a testing apparatus and method for turn-to-turn contact resistance of an uninsulated superconducting coil according to embodiments of the present invention.
As shown in fig. 1-4, the testing device for turn-to-turn contact resistance of an uninsulated superconducting coil disclosed by the invention comprises a control unit 2, a compressive stress generating device 3, a pressure sensor 5, a temperature sensor 6, an external power supply 7 and a multimeter 8. The pressure stress generating device 3 is used for providing pressure stress and comprises an inflator pump 1 and a cold temperature tank 4, the inflator pump 1 is connected with the cold temperature tank 4, the inflator pump 1 is electrically connected with the control unit 2 and used for controlling the power of the inflator pump 1, the inflator pump 1 injects gas into an inner cavity of the cold temperature tank 4 to increase the internal pressure thereof to generate the pressure stress, a pressure sensor 5 is arranged in the cavity and used for measuring the specific pressure stress value applied to the superconducting strip 9, and a temperature sensor 6 is arranged and used for measuring the temperature of the superconducting strip 9. When in test, the superconducting tape is fixed on a rectangular central shaft in a cavity of the cold-temperature tank 4, the superconducting tape 9 is arranged in a low-temperature liquid nitrogen 10 environment which ensures that the superconducting tape is in a superconducting state, the direction of the compressive stress applied to the superconducting tape 9 is vertical to the surface of the superconducting tape, and the variation range of the compressive stress applied to the superconducting tape 9 by the compressive stress generating device 3 is 0-39MPa. The universal meter 8 is connected with the superconducting tapes 9 to be detected in parallel or in series, the voltage values and the current values of the superconducting tapes 9 with different layers under different compressive stresses are respectively detected, and the control unit 2 analyzes the voltage values and the current values to obtain turn-to-turn contact resistance values R under different compressive stresses C Resistance to turn-to-turn contact ρ C 。
The upper end and the lower end of the interlayer of the cold and warm tank 4 are respectively provided with a liquid inlet and a liquid outlet.
In the above embodiment, in order to reduce the influence of the superconducting tape layer on the test result, the loading current does not exceed the critical current of the tape, but is large enough to ensure that the voltage signal reaches the measurement range, and the measurement requirement can be met by taking the current value as 10A. In this embodiment, the superconducting tape 9 is formed by stacking different layers of superconducting tape sheets, wherein the superconducting tape 9 under consideration is formed by the copper protective layer 901, the base layer 902, the buffer layer 903, the superconducting layer 904 and the silver plating layer 905, and since the thicknesses of the copper protective layer 901 and the base layer 902 in the tape are much greater than those of the other layers, the mechanical properties of the tape are mainly determined by the copper protective layer 901 and the base layer 902.
The following is a detailed description of a method for testing turn-to-turn contact resistance of an uninsulated superconducting coil, which comprises the following steps:
several pieces of test superconducting tape are prepared and stacked to form different layers of superconducting tape 9.
The superconducting tape 9 is fixed on a rectangular shaft of the inner cavity of the cold-temperature tank in the compressive stress generating device 3.
The control unit controls the air pump 1 to start, and is used for controlling the power of the air pump, when the air pump 1 continuously injects air into the cavity of the cold Wen Guanna layer in which the superconducting tape 9 to be detected is placed, the internal pressure of the cavity is gradually increased, and the internal pressure of the cavity is increased to apply pressure stress to the superconducting tape 9 to be detected.
The pressure sensor 5 measures the magnitude of the compressive stress applied to the superconducting tape 9 and sends the compressive stress to the control unit, and the control unit judges whether the superconducting tape 9 reaches a proper value of the compressive stress. The magnitude of the pressure stress borne by the superconducting tape 9 is measured by the pressure sensor 5 in the cavity, and when the pressure sensor 5 detects that the pressure stress borne by the superconducting tape to be tested is close to a value required by the test, the control unit 2 controls to reduce the power of the air pump, and the air is slowly injected to reach a proper pressure stress value.
And (3) introducing current into the external power supply 7, recording the voltage values and the current values of the superconducting tapes 9 with different layers measured by the universal meter 8, and substituting the voltage values and the current values into a contact resistivity formula to calculate the turn-to-turn contact resistivity of the superconducting tapes 9. The universal meters 8 are connected in series and then used for detecting the current, in order to reduce the influence of the superconducting tape layer on the test result and meet the test requirement, the current passing is selected to be 10A.
And changing the magnitude of the compressive stress, and repeating the step of obtaining the inter-turn contact resistivity to obtain the inter-turn contact resistivity of the superconducting tape 9 under different compressive stresses.
Testing the number of layers of the three groups of stacked strips to be 2,3,4 layers respectively, obtaining the total voltage of the stacked strips with different number of layers through testing, and obtaining the turn-to-turn contact resistance value R by dividing the total voltage difference by the current and the layer number difference C Calculating n groups of results, averaging the turn-to-turn contact resistance obtained by n times of calculation and multiplying the average value by the contact area to obtain the turn-to-turn contact resistance rate rho C The calculation formula is as follows:
in the formula: i is the number of layers of the strip material, i is more than 2; vi is the voltage when the number of layers of the strip is i; i is the loading current. The superconducting tape 9 to be tested is connected with the universal meter 8 in parallel, the voltage values of the superconducting tapes with different stacking layers measured by the universal meter 8 are recorded during testing, and the recorded current and voltage values are substituted into a formula for calculation.
Fitting resistivity and compressive stress rho C And a sigma curve for observing and analyzing the change trend of the turn-to-turn contact resistivity of the superconducting tape along with the stress.
By adopting the uninsulated superconducting magnet technology, some defects in the prior art can be overcome, so that the test error is reduced, and the calculation accuracy is improved; the test efficiency is high, and the test method is more suitable for practical application; the test of various types of superconducting tapes can be met; the original paper is easy to prepare, the cost is lower, and the method has the beneficial effects of economy and environmental protection.
The above-mentioned embodiments are only preferred embodiments of the present invention, and the scope of the present invention is not limited thereto, and any simple modifications or equivalent substitutions of the technical solutions that can be obviously obtained by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Claims (9)
1. A testing device for turn-to-turn contact resistance of an uninsulated superconducting coil is characterized by comprising:
a cold-warm tank (4), the cavity of which is used for placing a superconducting tape (9), and the interlayer of the outer wall of which is provided with liquid nitrogen (10);
the inflator pump (1) is communicated with the cavity of the cold-warm tank (4);
the universal meter (8) is used for detecting voltage values and current values between different turns of the superconducting tape (9) under different compressive stresses;
the control unit (2) is electrically connected with the inflator pump (1) and calculates the turn-to-turn contact resistance value R under different compressive stresses through the voltage value and the current value C Resistance to turn-to-turn contact ρ C 。
2. The apparatus for testing turn-to-turn contact resistance of an uninsulated superconducting coil according to claim 1, wherein the superconducting tape (9) is placed on a rectangular central axis in the cavity, and the direction of the compressive stress applied to the superconducting tape (9) is perpendicular to the surface of the superconducting tape.
3. The device for testing the turn-to-turn contact resistance of the uninsulated superconducting coil according to claim 1, further comprising a pressure sensor (5) disposed in the cavity of the cold-hot tank (4), wherein the pressure sensor (5) is electrically connected to the control unit (2).
4. The testing device for the turn-to-turn contact resistance of the uninsulated superconducting coil according to claim 4, wherein the variation range of the compressive stress in the cold-hot tank (4) is 0-39MPa.
5. The apparatus for testing turn-to-turn contact resistance of an uninsulated superconducting coil according to claim 4, wherein a temperature sensor (6) is disposed in the cavity.
6. The device for testing the turn-to-turn contact resistance of the uninsulated superconducting coil according to claim 1, wherein the superconducting tape (9) is formed by stacking different layers of superconducting tape sheets, and comprises a copper protective layer (901), a substrate layer (902), a buffer layer (903), a superconducting layer (904), a silver plating layer (905) and the copper protective layer (901) which are sequentially arranged from outside to inside, wherein the thicknesses of the copper protective layer (901) and the substrate layer (902) are greater than those of the other layers.
7. The apparatus for testing turn-to-turn contact resistance of an uninsulated superconducting coil according to claim 1, further comprising an external power supply (7), wherein the external power supply (7) supplies a current of 10A to the apparatus.
8. A testing method for turn-to-turn contact resistance of an uninsulated superconducting coil is characterized by comprising the following steps:
preparing a plurality of test superconducting tape pieces, and stacking the test superconducting tape pieces to form superconducting tapes (9) with different layers;
placing the superconducting tape (9) into a cold-warm tank (4), and fixing the superconducting tape (9) on a rectangular central shaft of an inner layer cavity of the cold-warm tank (4);
filling liquid nitrogen (10) in the interlayer of the cold-warm tank (4) to provide a low-temperature environment required by the superconducting state for the superconducting tape (9);
the control unit (2) controls the air pump (1) to start, air is injected into a cavity in the cold-warm tank (4), and the pressure inside the cavity is increased to apply pressure stress to the superconducting strip (9);
the pressure sensor (5) measures the magnitude of the compressive stress borne by the superconducting tape (9) and judges whether the superconducting tape (9) reaches a proper compressive stress value or not;
recording voltage values and current values of different turns of the superconducting tape (9) measured by a universal meter (8);
the control unit (2) calculates the inter-turn contact resistance value R of the superconducting strip (9) through the voltage value and the current value C Resistance to turn-to-turn contact ρ C ；
Changing the magnitude of the compressive stress, and repeating the step of obtaining the inter-turn contact resistivity to obtain the inter-turn contact resistance value R of the superconducting tape (9) under different compressive stresses C Resistance to turn-to-turn contact ρ C 。
9. An uninsulated superconducting coil turn according to claim 8The method for testing the contact resistance is characterized in that the contact resistance value R C Resistance to turn-to-turn contact ρ C The calculation process of (2) is as follows:
dividing the voltage difference by the current and the layer number difference to obtain the turn-to-turn contact resistance value R C ；
Repeating n groups to obtain turn-to-turn contact resistance value R C Obtaining n sets of inter-turn contact resistance values R C ；
Averaging the inter-turn contact resistance obtained by n times of calculation and multiplying the average value by the contact area to obtain the inter-turn contact resistance rate rho C ；
Wherein: i is the number of stacked layers of strip material, i>2；V i The voltage is the voltage when the number of layers of the strip is i; i is the loading current.
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| CN202211593564.1A CN115774151A (en) | 2022-12-13 | 2022-12-13 | Device and method for testing turn-to-turn contact resistance of non-insulated superconducting coil |
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| CN202211593564.1A CN115774151A (en) | 2022-12-13 | 2022-12-13 | Device and method for testing turn-to-turn contact resistance of non-insulated superconducting coil |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116520026A (en) * | 2023-05-22 | 2023-08-01 | 上海交通大学 | Non-insulated superconducting coil inter-turn resistivity space distribution nondestructive measurement method and equipment |
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