CN110794218A - Device and method for testing turn-to-turn resistance of uninsulated coil - Google Patents
Device and method for testing turn-to-turn resistance of uninsulated coil Download PDFInfo
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- CN110794218A CN110794218A CN201910950206.3A CN201910950206A CN110794218A CN 110794218 A CN110794218 A CN 110794218A CN 201910950206 A CN201910950206 A CN 201910950206A CN 110794218 A CN110794218 A CN 110794218A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention relates to a turn-to-turn resistance testing device of an uninsulated coil in the field of superconducting tape resistance measurement, which comprises a bottom plate, a first baffle, a current lead, a voltage lead, a conductive column, a pressure push block, a pressure regulating screw and a second baffle, wherein the first baffle is arranged on the bottom plate; the bottom plate is provided with an accommodating groove, the first baffle and the second baffle are respectively arranged at intervals along the axis direction of the accommodating groove, the pressure push block is arranged in the accommodating groove between the first baffle and the second baffle, and the pressure regulating screw rod penetrates through the second baffle, extends into the accommodating groove and is connected with the pressure push block; the current lead, the conductive column and the voltage lead are arranged in the accommodating groove between the first baffle and the pressure push block in a mirror symmetry mode, and the strip to be tested is placed in the accommodating groove between the two voltage leads. The invention also discloses a turn-to-turn resistance testing method of the uninsulated coil. The invention can quickly and effectively measure the turn-to-turn resistance value of the uninsulated superconducting coil under different pressures and different temperatures, thereby improving the efficiency.
Description
Technical Field
The invention relates to the field of superconducting tape resistance measurement, in particular to a turn-to-turn resistance testing device and method without an insulated coil.
Background
In 2011, haen proposed the concept of superconducting uninsulated coils. In the coil, the turn-to-turn insulation of the coil is eliminated, namely, the surface of the superconducting strip for preparing the coil is not sprayed with an insulating substance. The non-insulated superconducting coil between turns avoids potential damage to the magnet caused by quench phenomenon accompanied by the insulated superconducting magnet. In the process of preparing the uninsulated superconducting coil, a non-insulating material with certain conductivity is filled between the adjacent superconducting tapes. Once the uninsulated coil is quenched, quench current can flow through adjacent layers, so that the superconducting coil can work normally. Meanwhile, the non-insulating material between the strips has good thermal conductivity, so that the heat of the out-of-passing point can be quickly dissipated, and the thermal stability of the coil is effectively improved. However, this comes at the expense of coil charge and discharge time. The charging and discharging time of the coil depends on an equivalent RL parallel circuit of the whole uninsulated coil. The inductance is the inductance of the coil itself, and the resistance is the equivalent radial resistance when current flows between turns. After the coil winding is finished, the inductance change is not large, but the equivalent radial resistance between turns of the coil changes greatly. After the superconducting coil is subjected to cold and heat cycles during application, the expansion with heat and the contraction with cold change the size of a gap between adjacent superconducting wires, so that the radial resistance is greatly changed.
The charging and discharging time is greatly different due to the difference of the turn-to-turn resistance of the coil. Therefore, it is thought to modulate the turn-to-turn resistance by adjusting the material, width and thickness of the encapsulating tape of the superconducting tape. Refer to chinese patent 201710416026.8 "a superconducting tape packaging apparatus". Or the turn-to-turn resistance is further modulated by winding the strip, and even the turn-to-turn resistance is further optimized by performing some treatment on the surface of the wound strip. Refer to Chinese patent 201710298939.4 "Encapsulated uninsulated superconducting coil and method for encapsulating same
At present, the price of a superconducting strip is high, through-flow testing is carried out at a required low temperature by actually winding an uninsulated coil, and a method for fitting turns of the uninsulated superconducting coil is huge in workload and uneconomical, so that it becomes necessary to develop a small and rapid uninsulated coil turn-to-turn resistance testing device.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide an uninsulated coil turn-to-turn resistance testing device and a method thereof.
The turn-to-turn resistance testing device without the insulated coil comprises a bottom plate, a first baffle, a current lead, a voltage lead, a conductive column, a pressure push block, a pressure regulating screw and a second baffle, wherein the first baffle is arranged on the bottom plate;
the bottom plate is provided with an accommodating groove, the first baffle and the second baffle are respectively arranged at intervals along the axis direction of the accommodating groove, the pressure push block is arranged in the accommodating groove between the first baffle and the second baffle, and the pressure regulating screw rod penetrates through the second baffle, extends into the accommodating groove and is connected with the pressure push block;
the current lead, the conductive column and the voltage lead are arranged in the accommodating groove between the first baffle and the pressure push block in a mirror symmetry mode, and a strip to be tested is placed in the accommodating groove between the two voltage leads.
In some embodiments, the bottom plate is provided with a plurality of accommodating grooves, and each accommodating groove has a different structure.
In some embodiments, the first baffle is a clamping structure, and the first baffle is clamped in the accommodating groove.
In some embodiments, the first baffle is a cross-shaped plate.
In some embodiments, a plurality of groups of fixing screw holes are formed in the bottom plate on two sides of the accommodating groove, and the first baffle plate is provided with a through hole or/and a counter bore matched with the fixing screw holes.
In some embodiments, a pressure sensor is disposed between the first baffle and the current lead or between the pressure push block and the current lead.
In some embodiments, the bottom plate and the first baffle are epoxy, G10, or a teflon material.
The invention also provides a turn-to-turn resistance testing method of the uninsulated coil, which adopts the turn-to-turn resistance testing device of the uninsulated coil and comprises the following steps:
s1, preparing a plurality of test strip pieces, and stacking the test strip pieces to form a strip to be tested;
s2, placing the strip to be tested into the accommodating groove between the voltage leads;
s3, rotating the pressure regulating screw to regulate the distance between the pressure push block and the first baffle plate, so that the strip to be measured reaches a proper pressure value;
s4, placing the uninsulated coil turn-to-turn resistance testing device into a low-temperature environment in which a coil is actually used;
s5, introducing current from the current lead, collecting voltage through the voltage lead, gradually increasing the current, and obtaining a V-I curve after collecting the voltage;
s6, fitting a V-I curve, and calculating the sectional area of the strip to be measured so as to calculate the turn-to-turn resistance of the uninsulated coil;
and S7, repeating the steps S3-S6, and obtaining the turn-to-turn resistance of the strip to be detected under different pressures and different temperatures.
In some embodiments, in step S3, a pressure sensor is disposed between the first baffle and the current lead or between the pressure push block and the current lead, and the pressure sensor is configured to display and record a pressure value of the test strip.
In some embodiments, the test strip pieces in step S1 are strip pieces that simulate radial deployment without an insulated coil.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention can quickly and effectively measure the turn-to-turn resistance value of the uninsulated superconducting coil under different pressures and different temperatures, thereby improving the efficiency.
2. The invention can determine the winding process required by the subsequent uninsulated superconducting coil, such as the tape tension condition, and can also determine the form, the packaging material and the width of the superconducting tape required to be packaged, thereby greatly saving the superconducting tape and reducing the production cost.
3. According to the invention, the bottom plate is provided with the plurality of accommodating grooves, and each accommodating groove has a different structure, so that the same bottom plate can meet the test requirements of various types of strips to be tested.
4. According to the invention, through the structural improvement of the baffle plate, the same accommodating groove can be used for testing the strip materials to be tested with different lengths, and the same baffle plate can be matched with accommodating grooves with various structures, so that the purposes of reducing material consumption and saving cost are achieved.
5. By optimally selecting the materials of the bottom plate and the baffle plate, the invention can bear the temperature of the liquid helium without irreversible damage, ensures good insulating property at the temperature and improves the testing precision.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:
FIG. 1 is a schematic view of an apparatus for testing turn-to-turn resistance of an uninsulated superconducting coil according to the present invention;
FIG. 2 is a schematic cross-sectional view of a test strip sheet of the present invention;
FIG. 3 is a schematic view of a test strip sheet of the present invention;
FIG. 4 is a schematic cross-sectional view of a stacked test strip of the present invention;
fig. 5 is a schematic representation of a stacked test strip of the present invention.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the invention, but are not intended to limit the invention in any way. It should be noted that it would be obvious to those skilled in the art that various changes and modifications can be made without departing from the spirit of the invention. All falling within the scope of the present invention.
Example 1
The invention provides an insulation-free coil turn-to-turn resistance testing device which comprises a bottom plate 3, a first baffle plate 4, a current lead 5, a voltage lead 6, a conductive column 7, a pressure push block 9, a pressure regulating screw rod 10 and a second baffle plate 11, wherein the first baffle plate is arranged on the bottom plate;
the bottom plate 3 is provided with a containing groove 12, the first baffle plate 4 and the second baffle plate 11 are respectively arranged at intervals along the axial direction of the containing groove 12, the pressure push block 9 is arranged in the containing groove 12 between the first baffle plate 4 and the second baffle plate 11, and the pressure regulating screw 10 penetrates through the second baffle plate 11 and extends into the containing groove 12 to be connected with the pressure push block 9;
the current lead 5, the conductive column 7 and the voltage lead 6 are arranged in the accommodating groove 12 between the first baffle 4 and the pressure push block 9 in a mirror symmetry manner, and a strip to be tested is arranged in the accommodating groove 12 between the two voltage leads 6.
The bottom plate 3 is provided with a containing groove 12, the strip 2 to be measured is placed in the containing groove 12, a first baffle 4 and a second baffle 11 are arranged in the axial direction of the containing groove 12, the first baffle 4 and the second baffle 11 can be arranged at two ends of the containing groove 12, or one baffle can be arranged at the end part of the containing groove 12, and the other baffle is arranged at any position in the middle of the containing groove 12, the distance between the first baffle 4 and the second baffle 11 is determined according to the length of the strip 2 to be measured placed in the accommodating groove 12, the first baffle 4 or the second baffle 11 can be connected to the bottom plate 3 through screws, bolts or rivets, the pressure push block 9 is positioned between the first baffle 4 and the second baffle 11, the pressure push block 9 is embedded in the accommodating groove 12 in a matched mode and can move along the axial direction of the accommodating groove 12, and the pressure push block 9 is used for preventing the influence of uneven pressure caused by objects which are contacted with the pressure regulating screw 10 and have step-shaped and small cross sections at the bottom end of the screw.
The second baffle 11 is provided with a threaded through hole matched with the pressure regulating screw 10, preferably, the central axis of the threaded through hole of the second baffle 11 is consistent with the central axis of the accommodating groove 12, if the pressure regulating screw 10 is an external thread, the second baffle 11 is a matched internal threaded through hole, if the pressure regulating screw 10 is an internal thread, the second baffle 11 is a matched external threaded through hole, the diameter of the pressure regulating screw 10 is smaller than the width of the cross section of the accommodating groove, after the end part of the pressure regulating screw 10 passes through the threaded hole of the second baffle 11 through rotation, the screw part extends into the accommodating groove 12, the end part of the pressure regulating screw 10 located in the accommodating groove 12 is fixedly connected with the pressure push block 9, the end part of the pressure regulating screw 10 is in threaded connection with the pressure push block 9, and can also be fixedly connected through welding or cementing and other modes.
Meanwhile, I-V curve measuring devices are additionally arranged on two sides of the test strip material 2, two groups of current leads 5, conductive columns 7 and voltage leads 6 of the I-V curve measuring devices are arranged on two sides of the strip material 2 to be measured in a mirror symmetry mode, the strip material 2 to be measured is arranged between the two voltage leads 6, one of the two current leads 5 is located and tightly attached to one side of the first baffle 4, the other current lead is located on one side of the pressure push block 9, the current leads 5 and the voltage leads 6 are preferably in an axe shape, the axe part of the current leads 5 and the voltage leads 6 is located in the accommodating groove 12, the axe handle part of the voltage leads is used as a connecting part of the leads, the two conductive columns 7 are respectively located between the two groups of current leads 5.
The device detects the strip 2 to be detected in the following process:
the strip material 2 to be tested is placed in the containing groove 12, the voltage lead 6, the conductive post 7 and the current lead 5 are sequentially attached and installed on two sides of the strip material 2 to be tested, the positions of the first baffle 4 and the pressure push block 9 are adjusted to be respectively attached to the current lead 5, the first baffle 4 and the second baffle 11 are fastened on the bottom plate 3, at the moment, the strip material 2 to be tested bears certain pressure, the pressure push block 9 is pushed or pulled to move along the axial direction of the containing groove 12 by rotating the pressure adjusting screw 10, the length of the strip material 2 to be tested can be adjusted or increased or decreased by the displacement of the pressure push block 9 because the other end part of the strip material 2 to be tested is the first baffle 4 in a fastening state, so that the pressure between the strip material pieces 1 to be tested is changed, and the change of the turn-to-turn resistance can be directly caused by the pressure change between the strip material pieces 1 to be tested, for example, the strip material 2 to be, after the pressure regulating bolt 10 is screwed in for 0.1cm, the pressure is changed into 9.9cm, the pressure between the strips is increased, and the corresponding turn-to-turn resistance is reduced; on the contrary, the pressure between the strips of which the thickness is 10.1cm after the pressure regulating bolt 10 is screwed out by 0.1cm is reduced, the corresponding turn-to-turn resistance is increased, and then the turn-to-turn resistance of the uninsulated coil can be calculated by an I-V curve measuring device.
The invention relates to a device for changing the pressure between strips by applying pretightening force when a normally wound coil is simulated, and the turn-to-turn resistance value of an uninsulated superconducting coil can be quickly and effectively measured under different pressures and different temperatures by the device, so that the efficiency is improved. In addition, the device can simply and repeatedly test the winding process required by the subsequent uninsulated superconducting coil, such as the tension condition of the tape, and can also determine the form of the superconducting tape to be packaged, the packaging material and the width, thereby greatly saving the use amount of the superconducting tape and reducing the production cost.
The bottom plate 3 is provided with a plurality of accommodating grooves 12, and the structure of each accommodating groove 12 is different. The bottom plate 3 is provided with a plurality of accommodating grooves 12, the accommodating grooves 12 are preferably parallel to each other, and can be arranged into other forms such as crossing or inclining and non-crossing according to actual requirements, the structure of each accommodating groove 12 is different, the structure is not only different in shape, but also different in width or/and depth under the same shape indicates that the structure is different, and the arrangement enables the same bottom plate 3 to meet the test of the strips 2 to be tested with various types.
The first baffle 4 is of a clamping structure, and the first baffle 4 is clamped in the accommodating groove 12. First baffle 4 sets to the joint structure, the shape and the storage tank 12 looks adaptation of its joint portion, width promptly, degree of depth and shape and storage tank 12's groove width, groove depth and cell type looks adaptation, for example, the joint portion of the first baffle 4 of the type of calligraphy of the protruding that has a joint portion can be according to actual need length lock joint in storage tank 12's arbitrary position in the strip 2 that awaits measuring promptly, the rethread screw is fastened the both sides board of first baffle 4 and is accomplished the fixing of first bottom plate 4 on bottom plate 3, realize that same storage tank 12 can test the strip 2 that awaits measuring of different length. Alternatively, the protruding portion of the first baffle 4 may be inserted into the receiving groove 12 in an interference or over-fitting manner.
The first baffle 4 is a cross-shaped plate. First baffle 4 sets to the cross template, and first baffle 4 is for having four outstanding joint portions promptly, and each joint portion all can be adapted to the storage tank 12 of a structure, also is exactly that first baffle 4 can be applicable to the storage tank 12 of 4 isotructures, further improves the convenience of test, reduces the quantity and the experimental cost of consumptive material simultaneously.
The bottom plate 3 on the two sides of the accommodating groove 12 is provided with a plurality of groups of fixing screw holes 31, and the first baffle 4 is provided with through holes or/and counter bores matched with the fixing screw holes 31. The plurality of groups of fixing screw holes 31 are used for adjusting the position of the first baffle plate 4 on the accommodating groove 12, the first baffle plate 4 is provided with through holes or/and counter bores matched with the fixing screw holes 31, when the through holes are formed, the method is simple and convenient, and the first baffle plate 4 can be fixed on the bottom plate 3 by using screws; when the counter bore is formed, the nut part of the screw can be arranged in the plate of the first baffle plate 4, the appearance is attractive, and the scraping phenomenon can be avoided.
And a pressure sensor 8 is arranged between the first baffle 4 and the current lead 5 or between the pressure push block 9 and the current lead 5. The pressure sensor 8 is used for displaying and recording pressure at any time in the process of adjusting the pressure of the material 2 to be measured, and transmitting the recorded pressure to the device for measuring the I-V curve, so that the precision control of pressure adjustment is facilitated. The main reason why the pressure sensor 8 is not installed between the two current leads 5 is to prevent influence on the current.
The bottom plate 3 and the first baffle 4 are made of epoxy resin, G10 or polytetrafluoroethylene materials. In order to better adapt to the practical application environment of the test strip 2, it is preferable that the bottom plate 3 and the first baffle plate 4 are made of epoxy resin, G10 (i.e. glass fiber and resin composite material), tetrafluoroethylene, or other materials capable of withstanding the liquid helium temperature without irreversible damage and ensuring good insulation performance at the temperature.
Example 2
The invention provides a turn-to-turn resistance testing method of an uninsulated coil, which uses the turn-to-turn resistance testing device of the uninsulated coil in the embodiment 1 and comprises the following steps:
s1, preparing a plurality of test strip pieces 1, and stacking the test strip pieces to form a test strip 2;
s2, placing the test strip 2 into the accommodating groove 12 between the voltage leads 6;
s3, adjusting the distance between the pressure push block 9 and the first baffle 4 by using the pressure adjusting screw 10 to enable the test strip 2 to reach a proper pressure value;
s4, placing the uninsulated coil turn-to-turn resistance testing device into a low-temperature environment in which a coil is actually used;
s5, introducing current from the current lead 5, collecting voltage through the voltage lead 6, gradually increasing the current, and obtaining a V-I curve after collecting the voltage;
s6, fitting a V-I curve, and calculating the sectional area of the test strip 2 so as to calculate the turn-to-turn resistance of the uninsulated coil;
s7, repeating the steps S3-S6, and obtaining the turn-to-turn resistance of the test strip 2 under different pressures.
The method comprises the following steps: the strip material 2 to be tested is placed in the containing groove 12, the voltage lead 6, the conductive post 7 and the current lead 5 are sequentially attached and installed on two sides of the strip material 2 to be tested, the positions of the first baffle 4 and the pressure push block 9 are adjusted to be respectively attached to the current lead 5, the first baffle 4 and the second baffle 11 are fastened on the bottom plate 3, at the moment, the strip material 2 to be tested bears certain pressure, the pressure push block 9 is pushed or pulled to move along the axial direction of the containing groove 12 by rotating the pressure adjusting screw 10, the length of the strip material 2 to be tested can be adjusted or increased or decreased by the displacement of the pressure push block 9 because the other end part of the strip material 2 to be tested is the first baffle 4 in a fastening state, so that the pressure between the strip material pieces 1 to be tested is changed, and the change of the turn-to-turn resistance can be directly caused by the pressure change between the strip material pieces 1 to be tested, for example, the strip material 2 to be, after the pressure regulating bolt 10 is screwed in for 0.1cm, the pressure is changed into 9.9cm, the pressure between the strips is increased, and the corresponding turn-to-turn resistance is reduced; on the contrary, the pressure between the strips of which the thickness is 10.1cm after the pressure regulating bolt 10 is screwed out by 0.1cm is reduced, the corresponding turn-to-turn resistance is increased, and then the turn-to-turn resistance of the uninsulated coil can be calculated by an I-V curve measuring device.
Further, a pressure sensor 8 is arranged between the first baffle 4 and the current lead 5 or between the pressure push block 9 and the current lead 5. The pressure sensor 8 is used for displaying and recording pressure at any time in the process of adjusting the pressure of the material 2 to be measured, and transmitting the recorded pressure to the device for measuring the I-V curve, so that the precision control of pressure adjustment is facilitated. The main reason why the pressure sensor 8 is not installed between the two current leads 5 is to prevent influence on the current.
The method is performed on the basis of the device for testing turn-to-turn resistance of the uninsulated coil in embodiment 1, and the application principle and method of the device involved in each step are already described in embodiment 1 and are not described again.
The test strip piece in step S1 is a strip piece simulating a radial application of an uninsulated coil, and the strip 2 to be tested is formed by stacking and combining one or more of the following test strip pieces 1:
-copper-coated superconducting tapes, said encapsulated superconducting tapes being encapsulated by encapsulating material of different thickness, width and material to obtain different contact conductivity between turns;
-encapsulating superconducting tapes, said uninsulated tapes being made of uninsulated tapes of different thicknesses, widths and materials to obtain different turn-to-turn contact conductivity;
-a non-insulated strip, which may be roughened or coated with a film on the surface of the metal strip to obtain different turn-to-turn contact conductivity.
In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the present application and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present application.
Claims (10)
1. The device for testing the turn-to-turn resistance of the uninsulated coil is characterized by comprising a bottom plate (3), a first baffle (4), a current lead (5), a voltage lead (6), a conductive column (7), a pressure push block (9), a pressure regulating screw (10) and a second baffle (11);
the bottom plate (3) is provided with a containing groove (12), the first baffle plate (4) and the second baffle plate (11) are arranged at intervals along the axis direction of the containing groove (12), the pressure push block (9) is arranged in the containing groove (12) between the first baffle plate (4) and the second baffle plate (11), and the pressure regulating screw rod (10) penetrates through the second baffle plate (11) to extend into the containing groove (12) and is connected with the pressure push block (9);
the current lead (5), the conductive column (7) and the voltage lead (6) are arranged in the accommodating groove (12) between the first baffle (4) and the pressure push block (9) in a mirror symmetry mode, and the strip (2) to be tested is arranged in the accommodating groove (12) between the voltage leads (6).
2. The uninsulated coil turn-to-turn resistance testing device according to claim 1, wherein a plurality of receiving slots (12) are formed in the bottom plate (3), and each receiving slot (12) has a different structure.
3. The uninsulated coil turn-to-turn resistance testing device according to claim 1, wherein the first blocking plate (4) is a clamping structure, and the first blocking plate (4) is clamped in the accommodating groove (12).
4. The uninsulated coil turn-to-turn resistance testing device according to claim 3, wherein the first baffle (4) is a cross-shaped plate.
5. The uninsulated coil turn-to-turn resistance testing device according to claim 4, wherein a plurality of groups of fixing screw holes (31) are formed in the bottom plate (3) on two sides of the accommodating groove (12), and the first baffle (4) is provided with through holes or/and counter bores matched with the fixing screw holes (31).
6. The uninsulated coil turn-to-turn resistance testing device according to claim 1, wherein a pressure sensor (8) is disposed between the first baffle (4) and the current lead (5) or between the pressure push block (9) and the current lead (5).
7. The uninsulated coil turn-to-turn resistance testing device according to claim 1, wherein the bottom plate (3) and the first baffle (4) are made of epoxy, G10, or PTFE.
8. An uninsulated coil turn-to-turn resistance testing method, characterized in that the uninsulated coil turn-to-turn resistance testing device of any one of claims 1-7 is adopted, and the method comprises the following steps:
s1, preparing a plurality of test strip pieces (1), and stacking the test strip pieces (1) to form a strip (2) to be tested;
s2, placing the strip (2) to be tested into the accommodating groove (12) between the voltage leads (6);
s3, rotating the pressure regulating screw (10) to regulate the distance between the pressure push block (9) and the first baffle (4), so that the strip (2) to be measured reaches a proper pressure value;
s4, placing the uninsulated coil turn-to-turn resistance testing device into a low-temperature environment in which a coil is actually used;
s5, introducing current from the current lead (5), collecting voltage through the voltage lead (6), gradually increasing the current, and obtaining a V-I curve after collecting the voltage;
s6, fitting a V-I curve, and calculating the sectional area of the strip (2) to be measured so as to calculate the turn-to-turn resistance of the uninsulated coil;
s7, repeating the steps S3-S6, and obtaining the turn-to-turn resistance of the strip (2) to be detected under different pressures and different temperatures.
9. The uninsulated coil turn-to-turn resistance testing device according to claim 8, wherein in step S3, a pressure sensor (8) is disposed between the first baffle (4) and the current lead (5) or between the pressure pushing block (9) and the current lead (5), and the pressure sensor (8) is used for displaying and recording a pressure value of the test strip (2).
10. The uninsulated coil turn-to-turn resistance test method according to claim 8, wherein the test strip (1) in step S1 is a strip simulating a radial application of an uninsulated coil.
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