CN110068752A - Dry type hollow shunt reactor low temperature is through-flow simulated testing system and its test method - Google Patents
Dry type hollow shunt reactor low temperature is through-flow simulated testing system and its test method Download PDFInfo
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- CN110068752A CN110068752A CN201910354215.6A CN201910354215A CN110068752A CN 110068752 A CN110068752 A CN 110068752A CN 201910354215 A CN201910354215 A CN 201910354215A CN 110068752 A CN110068752 A CN 110068752A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
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Abstract
The present invention relates to the through-flow simulated testing system of dry type hollow shunt reactor low temperature and its test methods, system therein includes dry type wall bushing, low-temperature cabinet, current transformer and current feedback circuit, dry type hollow shunt reactor is placed in low-temperature cabinet, between the winding turns of dry type hollow shunt reactor and the surface of interior outer encapsulating be equipped with the temperature sensor being connect with contact type thermometric indicator and with the strain gauge that connect of strain (FBG) demodulator, one end of dry type wall bushing is deep into low-temperature cabinet and connect with one end of dry type hollow shunt reactor, the other end of dry type wall bushing and the output end of current feedback circuit connect, the lead-out wire of the dry type hollow shunt reactor other end passes through current transformer, it is connect with the input terminal of current feedback circuit.The generation that the present invention can encapsulate crackle for dry type hollow shunt reactor provides direct test data, to cold operation encapsulating state of insulation research and explores with extremely important meaning.
Description
Technical field
The invention belongs to T & D Technology fields.In particular to a kind of through-flow simulation of dry type hollow shunt reactor low temperature is surveyed
Test system and its test method.
Background technique
By to dry type hollow shunt reactor insulating materials, production technology and national dry-type hollow parallel electricity in recent years
Discovery is collected in anti-device fault case and strip inspection, and there is many places microcrack on the reactor encapsulating surface that scaling loss occurs.Tentatively
According to the analysis, running feelings in psychro-environment since dry-type air-core reactor encapsulating insulating materials and the conducting wire coefficient of expansion are inconsistent
Under condition, there are larger thermal (temperature difference) stresses inside and outside encapsulating, and then cause encapsulating insulation cracking；In addition, dry-type air-core reactor is producing
When manufacture, hot setting stress release not may also lead to the generation of microcrack entirely.Currently, the mechanism that encapsulating crackle generates is only
Theoretical supposition and analogue simulation stage are rested on, can not directly be tested on dry-type air-core reactor.Therefore, one kind is developed
Carrying out through-flow simulation experiment system to dry type hollow shunt reactor is particularly important.
Summary of the invention
In view of the problem of causing the stress of dry-type air-core reactor encapsulating micro-crack not test directly, the present invention is directed to mention
For a kind of through-flow simulated testing system of dry type hollow shunt reactor low temperature and its test method；Wherein:
Dry type hollow shunt reactor low temperature is through-flow simulated testing system, including dry type wall bushing, low-temperature cabinet, the first temperature
Spend sensor, strain gauge, strain (FBG) demodulator, contact type thermometric indicator, current transformer and current feedback circuit；Wherein, first
The quantity at least two of temperature sensor is separately mounted between the winding turns of the dry type hollow shunt reactor and inside and outside
The surface of encapsulating, and connect with the contact type thermometric indicator, for detecting the through-flow rear winding of dry type hollow shunt reactor and packet
The temperature difference between envelope；The quantity at least two of the strain gauge, is separately mounted to the dry type hollow shunt reactor
Winding turns between and interior outer encapsulating surface, and connect with the strain (FBG) demodulator, for detecting the dry-type hollow parallel
The temperature for transient process that reactor is through-flow causes stress；The dry type hollow shunt reactor is placed in the inside of the low-temperature cabinet, described
The inside that one end of dry type wall bushing is deep into the low-temperature cabinet is connect with described dry type hollow shunt reactor one end, described
The other end of dry type wall bushing is connect with the output end of the current feedback circuit, the dry type hollow shunt reactor other end
Lead-out wire pass through the current transformer, connect with the input terminal of the current feedback circuit.
Furthermore it is preferred that scheme be that dry type hollow shunt reactor low temperature is through-flow simulated testing system further include the second temperature
Sensor is spent, the second temperature sensor is mounted on the cabinet body of the low-temperature cabinet, for monitoring inside the low-temperature cabinet
Temperature.
Additionally, it is preferred that scheme be that dry type hollow shunt reactor low temperature is through-flow simulated testing system further include that humidity passes
Sensor is mounted on the cabinet body of the low-temperature cabinet, for monitoring the humidity inside the low-temperature cabinet.
Furthermore it is preferred that scheme be, one end of dry type wall bushing be deep into the low-temperature cabinet inside and the dry type
Star-like frame connection at the top of air-core shunt reactor, the lead-out wire of the star-like frame of the dry type hollow shunt reactor bottom pass through
The current transformer is connect with the input terminal of the current feedback circuit.
It is described furthermore Preferable scheme is that the head end of dry type wall bushing is connect with the output end of the current feedback circuit
The tail end of dry type wall bushing is deep into the inside of the low-temperature cabinet and the star-like frame in top of the dry type hollow shunt reactor
Connection.
Dry type hollow shunt reactor low temperature is through-flow analog detection method, includes the following steps:
Step S1: starting low-temperature cabinet refrigeration keeps internal temperature constant in preset temperature range, when first is default
Between interval record primary stress sensor stress registration, the temperature between the first temperature sensor winding shown and encapsulating
Difference is zero；
Step S2: rated current is applied to dry type hollow shunt reactor by current feedback circuit, every every less than the
The second prefixed time interval record temperature registration of the first temperature sensor of one prefixed time interval and answering for strain gauge
Power registration, persistently records data, until the registration variable quantity of the first temperature sensor and strain gauge is respectively less than 1%；
Step S3: the maximum stress registration value P that strain gauge is detectedStressWith the packet of dry type hollow shunt reactor
Envelope insulation tensile strength PTensile strengthIt compares, assesses the state of insulation of dry type hollow shunt reactor cold operation.
Furthermore it is preferred that scheme be, preset temperature range subzero 10 DEG C-it is subzero between 40 DEG C.
Additionally, it is preferred that scheme be, the first prefixed time interval be 20-30 minutes.
Furthermore it is preferred that scheme be, the second prefixed time interval be 10-15 minutes.
Furthermore Preferable scheme is that whenWhen, then determine the cold operation of dry type hollow shunt reactor
State of insulation is poor；WhenWhen, then determine that the cold operation state of insulation of dry type hollow shunt reactor is good；
WhenWhen, then determine that the cold operation state of insulation of dry type hollow shunt reactor is general.
The invention has the benefit that dry type hollow shunt reactor is placed under low temperature environment, it is passed through rated current fortune
Row, tests the temperature and stress variation state at each position, by the machinery for testing obtained maximum stress and encapsulating isolation material
Stress compares, and then realizes that the assessment to dry type hollow shunt reactor state of insulation is tested.
To the accomplishment of the foregoing and related purposes, one or more aspects of the present invention include be particularly described below and
The feature particularly pointed out in claim.Certain illustrative aspects of the invention is described in detail in the following description and the annexed drawings.
However, these aspects indicate only usable some of the various ways in the principles of the present invention.In addition, of the invention
It is intended to include all such aspects and their equivalent.
Detailed description of the invention
By reference to the following description in conjunction with the accompanying drawings and the contents of the claims, and with to it is of the invention more comprehensively
Understand, other objects and results of the present invention will be more clearly understood and understood.In the accompanying drawings:
Fig. 1 is the structural schematic diagram of the tandem type fault electric arc test platform of the embodiment of the present invention.
Appended drawing reference therein includes: 1- dry type wall bushing, 2- low-temperature cabinet, 3- dry type hollow shunt reactor, 4-
One temperature sensor, 5- strain gauge, 6- second temperature sensor, 7- humidity sensor, 8- strain (FBG) demodulator, 9- contact
Temperature measurer, 10- current transformer, 11- current feedback circuit.
Specific embodiment
Specific implementation of the invention is described in further detail in the following with reference to the drawings and specific embodiments.Following embodiment
For illustrating the present invention, but it is not intended to limit the scope of the invention.
In view of the problem of causing the stress of dry-type air-core reactor encapsulating micro-crack not test directly, the present invention is directed to mention
It can provide specified operation for a kind of through-flow simulated testing system of dry type hollow shunt reactor low temperature and its test method, the system
Electric current simulates dry reactor cold operation state, and can test solidification process by pre-buried temperature and strain gauge
And the transient process stress that puts into operation varies with temperature trend, encapsulates internal temperature for precise measurement and stress is caused to provide effective test side
Method.
Fig. 1 shows the structure of the through-flow simulated testing system of dry type hollow shunt reactor low temperature of the embodiment of the present invention.
As shown in Figure 1, the through-flow simulated testing system of dry type hollow shunt reactor low temperature provided by the invention, comprising: dry
Formula wall bushing 1, low-temperature cabinet 2, the first temperature sensor 4, strain gauge 5, strain (FBG) demodulator 8, contact type thermometric indicator 9, electricity
Current transformer 10 and current feedback circuit 11；
Wherein, dry type hollow shunt reactor 3 is placed in the inside of low-temperature cabinet 2, and the tail end of dry type wall bushing 1 is deep into low
The inside of warm cabinet 2 is connect with the star-like frame in the top of dry type hollow shunt reactor 3, and the head end and electric current of dry type wall bushing 1 are sent out
The output end connection of raw device 11, the lead-out wire of the star-like frame in the bottom of dry type hollow shunt reactor 3 pass through current transformer 10, with
The input terminal of current feedback circuit 11 connects, and current feedback circuit 11 can provide the electric current of maximum 1000A, and current transformer 10 is for supervising
The size of current of current feedback circuit 11 is surveyed, dry type wall bushing 1 is silicone rubber composite bushing, and specified through-flow 800A passes through dry type
The high current of current feedback circuit 11 is introduced into dry type hollow shunt reactor 3 by wall bushing 1, low-temperature cabinet 2 be dry-type hollow simultaneously
Join 3 low temperature environment of reactor, simulates the cold operation state of dry type hollow shunt reactor 3.
The quantity at least two of first temperature sensor 4, is separately mounted to the winding turns of dry type hollow shunt reactor 3
Between and interior outer encapsulating surface, such as: the first temperature sensor 4 can be 3, two of them are installed on dry-type hollow parallel
Between the winding turns of reactor 3, another is installed on the surface of outer encapsulating in dry type hollow shunt reactor 3.
- 50 DEG C of test scope~200 DEG C of first temperature sensor 4, connect, for detecting with contact type thermometric indicator 9
The temperature difference after encapsulating insulation solidification temperature and dry type hollow shunt reactor 3 are through-flow between winding and encapsulating, the temperature difference are
That is the through-flow rear Joule heat generated of winding, causes to encapsulate internal temperature rising, forms the internal-external temperature difference of encapsulating, so generate centainly
Temperature cause stress；
The quantity at least two of strain gauge 5 is high precision electro resistive strain gauge, is separately mounted to dry type
Between the winding turns of the air-core shunt reactor 3 and surface of interior outer encapsulating is connect with strain (FBG) demodulator 8, exhausted for testing encapsulating
The temperature for the through-flow transient process of stress and dry type hollow shunt reactor that edge generates when solidifying causes stress.Such as: stress sensing
Device 5 can be 4, and two of them are installed between the winding turns of dry type hollow shunt reactor 3, other two is installed on dry type
The surface of outer encapsulating in air-core shunt reactor 3.
In order to meet common laboratory test power requirement, dry reactor winding is using layering reverse-winding, by reactance
Device mutual inductance is reduced to minimum, and experiment power supply capacity can be greatly reduced；In the winding process of dry type hollow shunt reactor 3, by
One temperature sensor 4 and strain gauge 5 are embedded in dry type hollow shunt reactor 3, can be directly between winding and encapsulating
Active force and temperature difference is tested between the two.Dry reactor is placed under low temperature environment, rated current operation is passed through, surveys
The temperature and stress variation state for trying each position, by the mechanical stress phase for testing obtained maximum stress with encapsulating isolation material
Compare, and then realizes that the assessment to integral insulation state is tested.
In order to adjust the temperature and humidity in low-temperature cabinet 2, second temperature sensor 6 is installed on the cabinet body of low-temperature cabinet 2
With humidity sensor 7, second temperature sensor 6 is used to monitor the temperature inside low-temperature cabinet 2, and humidity sensor 7 is low for monitoring
Humidity inside warm cabinet 2, second temperature sensor 6 and humidity sensor 7 pass through the data feedback monitored to control system
Outside condenser and humidistat carry out the adjusting of temperature and humidity in low-temperature cabinet 2.
The through-flow simulated testing system of dry type hollow shunt reactor low temperature provided by the invention is described in detail in above content
Structure, it is corresponding with the system, the present invention also provides it is a kind of utilize the through-flow simulation test of dry type hollow shunt reactor low temperature
The method that system is tested.
The through-flow analog detection method of dry type hollow shunt reactor low temperature provided by the invention, includes the following steps:
Step S1: starting low-temperature cabinet starts to freeze, and keeps internal temperature constant in preset temperature range, pre- every first
If time interval records the stress registration of primary stress sensor, until the encapsulating internal and external temperature that the first temperature sensor is shown shows
Until number is consistent.
Preset temperature range subzero 10 DEG C-it is subzero between 40 DEG C, it is logical with specific reference to dry type hollow shunt reactor low temperature
The requirement in flow field simulation test macro operation area is set, for example, operation area is Changchun, is then set in -20 DEG C, operably
Area is Harbin, then is set in -40 DEG C.
First prefixed time interval is 20-30 minutes, and the stress registration that strain gauge is recorded within this interval time is equal
It can.
Step S2: rated current is applied to dry type hollow shunt reactor by current feedback circuit, while pre- every second
If time interval records the temperature registration of temperature sensor and the stress registration of strain gauge, data, Zhi Dao are persistently recorded
The registration variable quantity of one temperature sensor and strain gauge is respectively less than 1%.
Second prefixed time interval is 10-15 minutes, temperature is recorded in this time interval less than the first prefixed time interval
Spend the temperature registration of sensor and the stress registration of strain gauge.
First temperature sensor 4 is respectively less than 1% with the registration variable quantity that strain gauge 5 records twice, then it is assumed that temperature
Reach stable with stress, transient process terminates, subsequently into steady-state process.
Step S3: the maximum stress registration value P that strain gauge is detectedStressWith the packet of dry type hollow shunt reactor
Envelope insulation tensile strength PTensile strengthIt compares, assesses the state of insulation of dry type hollow shunt reactor cold operation.
Encapsulating insulation tensile strength PTensile strengthRefer to the encapsulating insulating materials i.e. tensile strength of expoxy glass silk fiber, is purchasing
When buying dry type hollow shunt reactor 3, by reading specification you can learn that the encapsulating encapsulated in dry type hollow shunt reactor 3
Insulate tensile strength.
WhenWhen, then determine that the cold operation state of insulation of dry type hollow shunt reactor is poor, does not conform to
Lattice.
Such as: when the internal temperature of low-temperature cabinet is set as -20 °,Then determine dry-type hollow parallel electricity
The cold operation state of insulation of anti-device is poor, unqualified.
For another example: when the internal temperature of low-temperature cabinet is set as -40 °,Then determine dry-type hollow parallel electricity
The cold operation state of insulation of anti-device is poor, unqualified.
WhenWhen, then determine that the cold operation state of insulation of dry type hollow shunt reactor is good, closes
Lattice.
Such as: when the internal temperature of low-temperature cabinet is set as -15 °,Then determine dry-type hollow parallel
The cold operation state of insulation of reactor is good, qualified.
For another example: when the internal temperature of low-temperature cabinet is set as -35 °,Then determine dry-type hollow parallel electricity
The cold operation state of insulation of anti-device is good, qualified.
WhenWhen, then determine that the cold operation state of insulation of dry type hollow shunt reactor is general,
Dielectric strength needs to reinforce.
Such as: when the internal temperature of low-temperature cabinet is set as -25 °,Then determine dry-type hollow parallel electricity
The cold operation state of insulation of anti-device is general, and dielectric strength needs to reinforce.
For another example: when the internal temperature of low-temperature cabinet is set as -30 °,Then determine dry-type hollow parallel electricity
The cold operation state of insulation of anti-device is general, and dielectric strength needs to reinforce.
Equally dry type hollow shunt reactor is placed under different low temperature environments, can obtain dry-type air-core reactor low temperature
Adaptability.
Place is not described in detail by the present invention, is the well-known technique of those skilled in the art of the present technique.It is according to the present invention a kind of dry
Formula air-core shunt reactor low temperature is through-flow simulated testing system and its test method can will test oil-paper insulative dielectric under high temperature
Modal data reduction is of great significance to the assessment of the apparatus insulated ageing state of oil-impregnated paper insulation under assessment low temperature to low temperature.
Claims (10)
1. a kind of through-flow simulated testing system of dry type hollow shunt reactor low temperature, which is characterized in that including dry type wall bushing
(1), low-temperature cabinet (2), the first temperature sensor (4), strain gauge (5), strain (FBG) demodulator (8), contact type thermometric indicator (9),
Current transformer (10) and current feedback circuit (11)；Wherein,
The quantity at least two of first temperature sensor (4), is separately mounted to the dry type hollow shunt reactor (3)
Winding turns between and interior outer encapsulating surface, and connect with the contact type thermometric indicator (9), for detecting dry-type hollow parallel
The temperature difference after reactor (3) is through-flow between winding and encapsulating；
The quantity at least two of the strain gauge (5), be separately mounted to the dry type hollow shunt reactor (3) around
Between the group circle and surface of interior outer encapsulating, and connect with the strain (FBG) demodulator (8), for detecting the dry-type hollow parallel electricity
The temperature of the through-flow transient process of anti-device (3) causes stress；
The dry type hollow shunt reactor (3) is placed in the inside of the low-temperature cabinet (2), and the one of the dry type wall bushing (1)
The inside that end is deep into the low-temperature cabinet (2) is connect with the dry type hollow shunt reactor (3) one end, the dry type set through walls
The other end of pipe (1) is connect with the output end of the current feedback circuit (11), dry type hollow shunt reactor (3) other end
Lead-out wire pass through the current transformer (10), connect with the input terminal of the current feedback circuit (11).
2. the through-flow simulated testing system of dry type hollow shunt reactor low temperature as described in claim 1, which is characterized in that also wrap
It includes:
Second temperature sensor (6), the second temperature sensor (6) is mounted on the cabinet body of the low-temperature cabinet (2), for supervising
Survey the internal temperature of the low-temperature cabinet (2).
3. the through-flow simulated testing system of dry type hollow shunt reactor low temperature as described in claim 1, which is characterized in that also wrap
It includes:
Humidity sensor (7), is mounted on the cabinet body of the low-temperature cabinet (2), for monitoring the wet of the low-temperature cabinet (2) inside
Degree.
4. the through-flow simulated testing system of dry type hollow shunt reactor low temperature as described in claim 1, which is characterized in that described
One end of dry type wall bushing (1) is deep at the top of the inside and the dry type hollow shunt reactor (3) of the low-temperature cabinet (2)
The connection of star-like frame, the lead-out wire of the star-like frame of dry type hollow shunt reactor (3) bottom passes through the current transformer
(10), it is connect with the input terminal of the current feedback circuit (11).
5. the through-flow simulated testing system of dry type hollow shunt reactor low temperature as described in claim 1, which is characterized in that described
The head end of dry type wall bushing (1) is connect with the output end of the current feedback circuit (11), the tail of the dry type wall bushing (1)
End is deep into the inside of the low-temperature cabinet (2) and connect with the star-like frame in top of the dry type hollow shunt reactor (3).
6. a kind of through-flow analog detection method of dry type hollow shunt reactor low temperature, includes the following steps:
Step S1: starting low-temperature cabinet (2) refrigeration keeps internal temperature in preset temperature range, every between the first preset time
Every the stress registration of record primary stress sensor (5), until between the winding and encapsulating of the first temperature sensor (4) display
The temperature difference is zero；
Step S2: applying rated current to dry type hollow shunt reactor (3) by current feedback circuit (11), described every being less than
Second prefixed time interval of the first prefixed time interval records the temperature registration of first temperature sensor (4) and described answers
The stress registration of force snesor (5), persistently records data, until first temperature sensor (4) and the strain gauge
(5) registration variable quantity is respectively less than 1%；
Step S3: the maximum stress registration value P that the strain gauge (5) is detectedStressWith the dry-type hollow parallel reactance
The encapsulating insulation tensile strength P of device (3)Tensile strengthIt compares, assesses the state of insulation of dry type hollow shunt reactor cold operation.
7. the through-flow analog detection method of dry type hollow shunt reactor low temperature as claimed in claim 6, wherein the default temperature
Spend range subzero 10 DEG C-it is subzero between 40 DEG C.
8. the through-flow analog detection method of dry type hollow shunt reactor low temperature as claimed in claim 6, wherein described first is pre-
If time interval is 20-30 minutes.
9. the through-flow analog detection method of dry type hollow shunt reactor low temperature as claimed in claim 6, wherein described second is pre-
If time interval is 10-15 minutes.
10. the through-flow analog detection method of dry type hollow shunt reactor low temperature as claimed in claim 6, wherein
Work as PTensile strengthWhen > > 1.3, then determine that the cold operation state of insulation of the dry type hollow shunt reactor (3) is poor；
WhenWhen, then determine that the cold operation state of insulation of the dry type hollow shunt reactor (3) is good；
WhenWhen, then determine the cold operation state of insulation one of the dry type hollow shunt reactor (3)
As.
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Application publication date: 20190730 |