CN115766624A - Aging test monitoring method and aging test monitoring system based on switch - Google Patents
Aging test monitoring method and aging test monitoring system based on switch Download PDFInfo
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- CN115766624A CN115766624A CN202211374239.6A CN202211374239A CN115766624A CN 115766624 A CN115766624 A CN 115766624A CN 202211374239 A CN202211374239 A CN 202211374239A CN 115766624 A CN115766624 A CN 115766624A
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Abstract
The invention relates to an aging test monitoring method and an aging test monitoring system based on a switch, based on a plurality of DUTs, a management switch, a tester and an intelligent terminal which are sequentially connected in series, the cost of the tester can be saved by sequentially connecting the DUTs in series, and four ports of the tester are respectively connected with a first DUT, a last DUT, the management switch and the intelligent terminal.
Description
Technical Field
The present invention relates to the field of network communication technologies, and in particular, to an aging test monitoring method and an aging test monitoring system based on a switch.
Background
In the production test of the Device Under Test (DUT), the Device Under Test (DUT) is generally subjected to an aging test before the DUT leaves the factory, and a long-time flow test is performed at a high temperature of 45-55 ℃ by a tester, so as to verify the stability of the Device Under Test (DUT) in long-time operation under different temperature environments, which is a necessary link for improving the quality of shipment and reducing the bad repair rate, and in the aging test, because the Device Under Test (DUT) is subjected to continuous flow but not only maintains a power-on state, there is a problem: if a plurality of tested Devices (DUTs) are simultaneously flown by using the test instruments during mass production, instruments with a plurality of ports are needed, the cost is too high, and the test efficiency of a single tester is very low; if a plurality of Devices Under Test (DUTs) are connected in series, only two test ports are used for aging, although the cost of the test instrument can be saved, when the Devices Under Test (DUTs) have problems, which Devices Under Test (DUTs) are bad cannot be positioned in time. Therefore, an aging test monitoring method needs to be developed, which can greatly reduce the cost of the test instrument and can timely and effectively find and position defective products.
Disclosure of Invention
The technical problem to be solved by the present invention is to provide an aging test monitoring method and an aging test monitoring system based on a switch, aiming at the above-mentioned defects in the prior art.
The technical scheme adopted by the invention for solving the technical problems is as follows: a aging test monitoring method based on a switch is based on a plurality of DUTs, a management switch, a tester and an intelligent terminal which are sequentially connected in series; the method comprises the following steps:
electrically connecting four testing ends of the tester with a first DUT, a last DUT, a management type switch and an intelligent terminal respectively;
the management type switch establishes one-to-one connection with a plurality of DUTs through a plurality of data transmission channels;
starting a plurality of DUTs to be powered on, adjusting a current working module to be in an aging mode, and timing the power-on time of the DUTs;
the management type switch configures preset test scripts and addresses for the DUTs respectively and sends the preset test scripts to the tester; the addresses of a plurality of the DUTs are different;
the tester generates a data stream according to the preset test script, wherein the data stream comprises a plurality of digital instructions which are in one-to-one correspondence with the DUT; the tester performing a streaming test on a plurality of the DUTs through the data stream;
the intelligent terminal establishes communication connection with the DUTs through the addresses and positions the DUTs according to the addresses; the intelligent terminal monitors the condition of transmitting data or receiving data of a plurality of DUTs at the high temperature of 40-60 ℃ in real time through aging monitoring software; when any one or more DUTs are monitored to have fault and aging without sending data or receiving data, the aging monitoring software marks and positions the DUTs and triggers an alarm;
the aging test monitoring method based on the switch comprises the steps that after the intelligent terminal marks and positions a DUT (device under test), the intelligent terminal generates different test logs according to fault aging conditions, and analyzes the test logs to obtain test results;
the aging test monitoring method based on the switch, provided by the invention, comprises the steps that the preset test script comprises a preset connection instruction, an initialization instruction and a port setting instruction; when the preset connection instruction is called, the port of the managed switch and the port to be tested of the DUT are correspondingly connected through a network; when an initialization instruction is called, restoring factory settings of the port of the managed switch; when a port setting instruction is called, automatically configuring the port of the managed switch;
the aging test monitoring method and the aging test monitoring system based on the switch are characterized in that if any fault aging condition of automatic restart, false crash and disconnection occurs in the process of retesting the DUT, the DUT is marked as a defective product by the intelligent terminal;
the invention discloses an aging test monitoring system, wherein the system comprises a plurality of DUTs, a management switch, a tester and an intelligent terminal which are sequentially connected in series; the four testing ends of the tester are respectively and electrically connected with the first DUT, the last DUT, the management switch and the intelligent terminal; the management type switch establishes connection with the DUTs one by one through a plurality of data transmission channels;
the managed switch includes:
the configuration module is used for respectively configuring preset test scripts and addresses for the DUTs;
the sending module is used for sending the plurality of addresses to the intelligent terminal;
the aging test monitoring system of the invention, wherein, the said tester includes:
the generating module is used for generating a data stream according to the preset test script, and the data stream comprises a plurality of digital instructions which are in one-to-one correspondence with the DUT;
the test module is used for performing a flow test on a plurality of DUTs;
the aging test monitoring system of the invention, wherein, the said intelligent terminal includes:
an acquisition module for acquiring the addresses of a plurality of the DUTs;
the monitoring module is used for monitoring the condition that a plurality of DUTs transmit data or receive data at the high temperature of 40-60 ℃ in real time;
a fault marking module: the DUT which sends a fault but does not send data or receive data is marked as a defective product, and the DUT is positioned, so that a tester can conveniently find the faulty DUT;
the alarm module is used for reminding a tester that one or more DUTs have faults;
and the analysis module is used for generating different test logs according to the fault aging condition and analyzing the test logs to obtain a test result.
The invention has the beneficial effects that: according to the aging test monitoring method and the aging test monitoring system based on the switch, the DUTs are sequentially connected in series, and the four ports of the tester are respectively connected with the first DUT, the last DUT, the management switch and the intelligent terminal, so that the cost of the tester can be saved; the management type switch is connected with the DUTs one by one through the data transmission channels, so that the DUTs can conveniently send data information or receive data sent by the management type switch; the management type switch respectively configures preset test scripts and addresses for the DUTs and sends the preset test scripts to the tester; the tester generates data streams according to a preset test script, so that a plurality of DUTs are subjected to a stream-printing test; the intelligent terminal establishes communication connection with the DUTs through the addresses and positions the DUTs according to the addresses, so that the DUTs can be conveniently searched; monitoring the condition of transmitting data or receiving data of a plurality of DUTs at high temperature in real time through aging monitoring software; if the aging monitoring software monitors that the DUT does not send data or receive data, judging that the DUT fails, marking and positioning the DUT by the aging monitoring software, and triggering an alarm to remind a tester of finding a bad DUT in time; the aging test monitoring method and the aging test monitoring system based on the switch can greatly reduce the cost of the test instrument, can timely and effectively find and position defective products, and are simple to operate.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be further described with reference to the accompanying drawings and embodiments, wherein the drawings in the following description are only part of the embodiments of the present invention, and for those skilled in the art, other drawings can be obtained without inventive efforts according to the accompanying drawings:
FIG. 1 is a schematic diagram of a switch-based burn-in monitoring method in accordance with a preferred embodiment of the present invention;
FIG. 2 is a flow chart of a method for monitoring burn-in test based on a switch in accordance with a preferred embodiment of the present invention;
fig. 3 is a schematic structural diagram of a monitoring system for burn-in test according to another preferred embodiment of the invention.
Detailed Description
The terms "first," "second," "third," and "fourth," etc. in the description and claims of the invention and in the accompanying drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the invention. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein may be combined with other embodiments.
"plurality" means two or more. "and/or" describes the association relationship of the associated object, indicating that there may be three relationships, for example, a and/or B, which may indicate: a exists alone, A and B exist simultaneously, and B exists alone. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship.
Also, the terms "upper, lower, front, rear, left, right, upper, lower, longitudinal" and the like, which denote orientation, are used with reference to the attitude and position of the device or apparatus in the present disclosure during normal use.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the following description will be made clearly and completely in conjunction with the technical solutions in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present invention without inventive step, are within the scope of the present invention.
The first embodiment is as follows:
a method for monitoring aging tests based on a switch according to a preferred embodiment of the present invention, as shown in fig. 1-2, is based on a plurality of sequentially connected DUTs, managed switches, testers, and intelligent terminals; the method comprises the following steps:
the four testing ends of the tester are respectively and electrically connected with the first DUT, the last DUT, the management switch and the intelligent terminal;
preferably, the intelligent terminal can be a computer in the prior art.
The management type switch establishes connection with a plurality of DUTs one by one through a plurality of data transmission channels;
starting a plurality of DUTs to be electrified, adjusting the current working module to be in an aging mode, and timing the electrifying time of the DUTs;
the management type switch respectively configures preset test scripts and addresses for the DUTs and sends the preset test scripts to the tester; the addresses of the multiple DUTs are different;
the tester generates a data stream according to a preset test script, wherein the data stream comprises a plurality of digital instructions which are in one-to-one correspondence with the DUT; the tester conducts a stream-printing test on the DUTs through the data stream;
preferably, in this embodiment, it is set that data packets are transmitted at a transmission rate of 1000/S, then the tester starts a streaming test, the tester starts to transmit a data stream to the DUT1 through the test port 1, if the test port 1 receives a response data stream corresponding to the data stream transmitted by the DUT1, it indicates that the DUT1 is normal, and if the test port 1 does not receive a response data stream corresponding to the data stream transmitted by the DUT1, it indicates that the DUT1 has fault aging.
The intelligent terminal establishes communication connection with the DUTs through the addresses and positions the DUTs according to the addresses; the intelligent terminal monitors the conditions of data transmission or data reception of a plurality of DUTs at a high temperature of 40-60 ℃ in real time through aging monitoring software; when any one or more DUTs are monitored for fault aging without sending or receiving data, the aging monitor software marks and locates the DUT and triggers an alarm.
According to the aging test monitoring method based on the switch, the DUTs are sequentially connected in series, and the four ports of the tester are respectively connected with the first DUT, the last DUT, the management switch and the intelligent terminal, so that the cost of the tester can be saved; the method has the advantages that real-time flow monitoring is carried out on a plurality of switches connected in series, blanks of fault products are located, aging test cost is reduced, aging test efficiency is improved, and control capability on product quality is enhanced; the management type switch is connected with the DUTs one by one through the data transmission channels, so that the DUTs can conveniently send data information or receive data sent by the management type switch; the management type switch respectively configures preset test scripts and addresses for the DUTs and sends the preset test scripts to the tester; the tester generates data streams according to a preset test script, so that a plurality of DUTs are subjected to a stream-printing test; the intelligent terminal establishes communication connection with the DUTs through the addresses and positions the DUTs according to the addresses, so that the DUTs can be conveniently searched; monitoring the condition of transmitting data or receiving data of a plurality of DUTs at high temperature in real time through aging monitoring software; if the aging monitoring software monitors that the DUT does not send data or receive data, judging that the DUT fails, marking and positioning the DUT by the aging monitoring software, and triggering an alarm to remind a tester of finding a bad DUT in time; the aging test monitoring method and the aging test monitoring system based on the switch can greatly reduce the cost of the test instrument, can timely and effectively find and position defective products, and are simple to operate.
It should be noted that the tester can be NuStreams-700, and can also be other testers in the prior art, which are not described herein again; nuStreams is one of mainstream test equipment of network communication products, a reliable and high-accuracy verification test scheme, wherein an XM-RM731 multi-stream gigabit test card of Rapid-Matrix technology is used, and the test card has powerful functions of packet generation, statistics, packet capture and the like;
preferably, after the intelligent terminal marks and positions the DUT, the intelligent terminal generates different test logs according to the fault aging condition and analyzes the test logs to obtain test results.
Preferably, the preset test script comprises a preset connection instruction, an initialization instruction and a port setting instruction; when a preset connection instruction is called, the port of the managed switch and the port to be tested of the DUT are correspondingly connected through a network; when the initialization instruction is called, restoring factory settings of the port of the managed switch; and when the port setting instruction is called, automatically configuring the port of the managed switch.
Preferably, if any one of the conditions of automatic restart, false crash and line drop occurs in the DUT retest process, the intelligent terminal marks the DUT as a defective product.
Example two:
a kind of aging test monitoring system, as shown in fig. 3, the system includes a plurality of DUTs, management type switchboards, testers and intelligent terminals connected in series in turn; the four testing ends of the tester are respectively and electrically connected with the first DUT, the last DUT, the management switch and the intelligent terminal; the management type switch establishes connection with a plurality of DUTs one by one through a plurality of data transmission channels;
the managed switch includes:
the configuration module is used for respectively configuring preset test scripts and addresses for the DUTs;
and the sending module is used for sending a plurality of addresses to the intelligent terminal.
The tester includes:
the generating module is used for generating a data stream according to a preset test script, and the data stream comprises a plurality of digital instructions which are in one-to-one correspondence with the DUT;
and the test module is used for performing a flow test on the DUTs.
The intelligent terminal includes:
the acquisition module is used for acquiring the addresses of the DUTs;
the monitoring module is used for monitoring the data transmission or data receiving condition of a plurality of DUTs at a high temperature of 40-60 ℃ in real time;
a fault marking module: the DUT which is used for sending the fault but does not send the data or receive the data is marked as a defective product, and the DUT is positioned, so that a tester can conveniently find the faulty DUT;
the alarm module is used for reminding a tester that one or more DUTs have faults;
and the analysis module is used for generating different test logs according to the fault aging condition and analyzing the test logs to obtain a test result.
The aging test monitoring system can save the cost of the test instrument by sequentially connecting a plurality of DUTs in series and respectively connecting four ports of the test instrument with a first DUT, a last DUT, a management switch and an intelligent terminal; the method has the advantages that real-time flow monitoring is carried out on a plurality of switches connected in series, blanks of fault products are located, aging test cost is reduced, aging test efficiency is improved, and control capability on product quality is enhanced; the management type switch is connected with the DUTs one by one through the data transmission channels, so that the DUTs can conveniently send data information or receive data sent by the management type switch; the tester generates data streams according to a preset test script, so that a plurality of DUTs are subjected to a stream-printing test; the intelligent terminal establishes communication connection with the DUTs through the addresses and positions the DUTs according to the addresses, so that the DUTs can be conveniently searched; monitoring the condition of transmitting data or receiving data of a plurality of DUTs at high temperature in real time through aging monitoring software; if the aging monitoring software monitors that the DUT does not send data or receive data, judging that the DUT fails, marking and positioning the DUT by the aging monitoring software, and triggering an alarm to remind a tester of finding a bad DUT in time; the aging test monitoring method and the aging test monitoring system based on the switch can greatly reduce the cost of the test instrument, can timely and effectively find and locate defective products, and are simple to operate.
It will be appreciated that modifications and variations are possible to those skilled in the art in light of the above teachings, and it is intended to cover all such modifications and variations as fall within the scope of the appended claims.
Claims (7)
1. A aging test monitoring method based on a switch is characterized in that the aging test monitoring method is based on a plurality of DUTs, a management switch, a tester and an intelligent terminal which are sequentially connected in series; the method comprises the following steps:
electrically connecting four testing ends of the tester with a first DUT, a last DUT, a management type switch and an intelligent terminal respectively;
the management type switch establishes connection with the DUTs one by one through a plurality of data transmission channels;
starting a plurality of DUTs to be powered on, adjusting a current working module to be in an aging mode, and timing the power-on time of the DUTs;
the management type switch configures preset test scripts and addresses for the DUTs respectively and sends the preset test scripts to the tester; the addresses of a plurality of the DUTs are different;
the tester generates a data stream according to the preset test script, wherein the data stream comprises a plurality of digital instructions which are in one-to-one correspondence with the DUT; the tester performs a stream-taking test on a plurality of the DUTs through the data stream;
the intelligent terminal establishes communication connection with the DUTs through the addresses and positions the DUTs according to the addresses; the intelligent terminal monitors the condition of transmitting data or receiving data of a plurality of DUTs at the high temperature of 40-60 ℃ in real time through aging monitoring software; when any one or more DUTs are monitored to fail and age without sending or receiving data, the aging monitoring software marks and positions the DUT and triggers an alarm.
2. The aging test monitoring method according to claim 1, wherein after the intelligent terminal marks and positions the DUT, the intelligent terminal generates different test logs according to the fault aging condition, and analyzes the test logs to obtain the test results.
3. The aging test monitoring method according to claim 1 or 2, wherein the preset test script comprises a preset connection instruction, an initialization instruction and a port setting instruction; when the preset connection instruction is called, the port of the managed switch and the port to be tested of the DUT are correspondingly connected through a network; when an initialization instruction is called, restoring factory settings of the port of the managed switch; and when a port setting instruction is called, automatically configuring the port of the managed switch.
4. The aging test monitoring method according to claim 2, wherein if any one of a fault aging condition of automatic restart, a false crash and a dropped line occurs in the DUT retest process, the DUT is marked as a defective product by the intelligent terminal.
5. The aging test monitoring system is characterized by comprising a plurality of DUTs, a management type switch, a tester and an intelligent terminal which are sequentially connected in series; the four testing ends of the tester are respectively and electrically connected with the first DUT, the last DUT, the management switch and the intelligent terminal; the management type switch establishes connection with the DUTs one by one through a plurality of data transmission channels;
the managed switch includes:
the configuration module is used for respectively configuring preset test scripts and addresses for the DUTs;
and the sending module is used for sending the plurality of addresses to the intelligent terminal.
6. The degradation test monitoring system of claim 5, wherein the tester comprises:
the generating module is used for generating a data stream according to the preset test script, and the data stream comprises a plurality of digital instructions which are in one-to-one correspondence with the DUT;
and the test module is used for performing a streaming test on the DUTs.
7. The aging test monitoring system of claim 6, wherein the intelligent terminal comprises:
an acquisition module for acquiring the addresses of a plurality of the DUTs;
the monitoring module is used for monitoring the condition that a plurality of DUTs transmit data or receive data at the high temperature of 40-60 ℃ in real time;
a fault marking module: the DUT is marked as a defective product and is positioned, so that a tester can conveniently search the failed DUT;
the alarm module is used for reminding a tester that one or more DUTs have faults;
and the analysis module is used for generating different test logs according to the fault aging condition and analyzing the test logs to obtain a test result.
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| CN202211374239.6A CN115766624A (en) | 2022-11-04 | 2022-11-04 | Aging test monitoring method and aging test monitoring system based on switch |
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| CN202211374239.6A CN115766624A (en) | 2022-11-04 | 2022-11-04 | Aging test monitoring method and aging test monitoring system based on switch |
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