CN115715169A - 用于dax成像中的缺陷补偿的步进策略 - Google Patents
用于dax成像中的缺陷补偿的步进策略 Download PDFInfo
- Publication number
- CN115715169A CN115715169A CN202180041302.1A CN202180041302A CN115715169A CN 115715169 A CN115715169 A CN 115715169A CN 202180041302 A CN202180041302 A CN 202180041302A CN 115715169 A CN115715169 A CN 115715169A
- Authority
- CN
- China
- Prior art keywords
- phase
- imaging
- grating
- ifd
- phase stepping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/58—Testing, adjusting or calibrating thereof
- A61B6/586—Detection of faults or malfunction of the device
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/44—Constructional features of apparatus for radiation diagnosis
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/48—Diagnostic techniques
- A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
- G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/067—Construction details
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
- G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Medical Informatics (AREA)
- High Energy & Nuclear Physics (AREA)
- Radiology & Medical Imaging (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pathology (AREA)
- Surgery (AREA)
- Heart & Thoracic Surgery (AREA)
- Molecular Biology (AREA)
- Optics & Photonics (AREA)
- Animal Behavior & Ethology (AREA)
- Biophysics (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Biomedical Technology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP20178712.4A EP3922179A1 (en) | 2020-06-08 | 2020-06-08 | Stepping strategy for defect compensation in dax imaging |
| EP20178712.4 | 2020-06-08 | ||
| PCT/EP2021/064725 WO2021249836A1 (en) | 2020-06-08 | 2021-06-02 | Stepping strategy for defect compensation in dax imaging |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115715169A true CN115715169A (zh) | 2023-02-24 |
Family
ID=71069753
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202180041302.1A Pending CN115715169A (zh) | 2020-06-08 | 2021-06-02 | 用于dax成像中的缺陷补偿的步进策略 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20230221265A1 (https=) |
| EP (2) | EP3922179A1 (https=) |
| JP (1) | JP2023527572A (https=) |
| CN (1) | CN115715169A (https=) |
| WO (1) | WO2021249836A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117788396B (zh) * | 2023-12-18 | 2024-08-30 | 江苏省特种设备安全监督检验研究院 | 一种基于深度学习的dr图像缺陷智能识别方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150092914A1 (en) * | 2013-09-27 | 2015-04-02 | Siemens Aktiengesellschaft | Method for examining an object using an x-ray recording system for phase contrast imaging with stochastic phase scanning |
| CN104582575A (zh) * | 2012-08-17 | 2015-04-29 | 皇家飞利浦有限公司 | 处置差分相衬成像中的未对准 |
| CN108720857A (zh) * | 2017-04-20 | 2018-11-02 | 株式会社岛津制作所 | X射线相位差摄像系统 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59102227A (ja) * | 1982-12-03 | 1984-06-13 | Fuji Photo Film Co Ltd | 蓄積性螢光体シ−トを用いた高速撮影台 |
| JPH10136665A (ja) * | 1996-10-31 | 1998-05-22 | Tdk Corp | 圧電アクチュエータ |
| JP2006172604A (ja) * | 2004-12-15 | 2006-06-29 | Tdk Corp | レンズ用アクチュエータ、光ヘッド及び光ディスク装置 |
| JP5789613B2 (ja) * | 2009-12-10 | 2015-10-07 | コーニンクレッカ フィリップス エヌ ヴェ | オンザフライ位相ステッピングを備えた非平行な格子装置、x線システム及び使用方法 |
| JP5725870B2 (ja) * | 2010-02-22 | 2015-05-27 | キヤノン株式会社 | X線撮像装置およびx線撮像方法 |
| JP2013106882A (ja) * | 2011-11-24 | 2013-06-06 | Fujifilm Corp | 放射線撮影装置及び放射線撮影方法 |
| JP2013116270A (ja) * | 2011-12-05 | 2013-06-13 | Canon Inc | X線撮像装置 |
| JP6191136B2 (ja) * | 2013-01-10 | 2017-09-06 | コニカミノルタ株式会社 | 画像生成方法 |
| JP6402780B2 (ja) * | 2014-12-22 | 2018-10-10 | 株式会社島津製作所 | 放射線位相差撮影装置 |
| US10945690B2 (en) * | 2015-06-30 | 2021-03-16 | Koninklijke Philips N.V. | Scanning X-ray apparatus with full-field detector |
| DE102016211761A1 (de) * | 2016-06-29 | 2018-01-04 | Siemens Healthcare Gmbh | Gitterträger zur Nutzung im Rahmen einer interferometrischen Röntgenbildgebung |
| DE102016219055A1 (de) * | 2016-09-30 | 2018-04-05 | Carl Zeiss Microscopy Gmbh | Stellantrieb zur Justage eines zu bewegenden Elements, Verwendungen und Verfahren zur Justage |
-
2020
- 2020-06-08 EP EP20178712.4A patent/EP3922179A1/en not_active Withdrawn
-
2021
- 2021-06-02 EP EP21729895.9A patent/EP4161388A1/en active Pending
- 2021-06-02 JP JP2022574092A patent/JP2023527572A/ja active Pending
- 2021-06-02 WO PCT/EP2021/064725 patent/WO2021249836A1/en not_active Ceased
- 2021-06-02 CN CN202180041302.1A patent/CN115715169A/zh active Pending
- 2021-06-02 US US18/008,646 patent/US20230221265A1/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104582575A (zh) * | 2012-08-17 | 2015-04-29 | 皇家飞利浦有限公司 | 处置差分相衬成像中的未对准 |
| US20150092914A1 (en) * | 2013-09-27 | 2015-04-02 | Siemens Aktiengesellschaft | Method for examining an object using an x-ray recording system for phase contrast imaging with stochastic phase scanning |
| CN108720857A (zh) * | 2017-04-20 | 2018-11-02 | 株式会社岛津制作所 | X射线相位差摄像系统 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3922179A1 (en) | 2021-12-15 |
| US20230221265A1 (en) | 2023-07-13 |
| EP4161388A1 (en) | 2023-04-12 |
| WO2021249836A1 (en) | 2021-12-16 |
| JP2023527572A (ja) | 2023-06-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6430636B2 (ja) | デュアルエネルギー微分位相コントラスト撮像 | |
| JP6448649B2 (ja) | 収集及び再構築技術を含む離調構成に基づく大視野位相差撮影法 | |
| RU2545319C2 (ru) | Формирование фазово-контрастных изображений | |
| CN107847199B (zh) | 具有全视场探测器的扫描x射线装置 | |
| CN108289649B (zh) | 用于对对象进行x射线成像的装置 | |
| CN111107787A (zh) | X射线成像参考扫描 | |
| WO2011122715A1 (en) | Radiation detection device, radiographic apparatus and radiographic system | |
| EP2509487A1 (en) | Calibration of differential phase-contrast imaging systems | |
| US10660595B2 (en) | Apparatus for x-ray imaging an object | |
| JP2016540587A (ja) | 走査微分位相コントラストシステムのための位相回復 | |
| JP6058860B2 (ja) | X線撮像装置及びx線撮像方法 | |
| CN104837409A (zh) | 具有可移动光栅的微分相位衬度成像装置 | |
| Thüring et al. | Compact hard X-ray grating interferometry for table top phase contrast micro CT | |
| CN115715169A (zh) | 用于dax成像中的缺陷补偿的步进策略 | |
| CN113453623B (zh) | 用于dax成像的全视场散射估计 | |
| EP3889885A1 (en) | Bias correction for dark-field imaging based on sliding window phase retrieval | |
| CN111615360A (zh) | 单次射击x射线相衬和暗场成像 | |
| US20220218296A1 (en) | Application for x-ray dark-field and/or x-ray phase contrast imaging using stepping and moiré imaging | |
| JP2014147418A (ja) | 画像生成装置および放射線断層撮影装置並びにプログラム | |
| Anton | talbot-Lau x-ray phase-contrast setup for fast scanning of large samples |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |