CN115715169A - 用于dax成像中的缺陷补偿的步进策略 - Google Patents

用于dax成像中的缺陷补偿的步进策略 Download PDF

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Publication number
CN115715169A
CN115715169A CN202180041302.1A CN202180041302A CN115715169A CN 115715169 A CN115715169 A CN 115715169A CN 202180041302 A CN202180041302 A CN 202180041302A CN 115715169 A CN115715169 A CN 115715169A
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China
Prior art keywords
phase
imaging
grating
ifd
phase stepping
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Pending
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CN202180041302.1A
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English (en)
Chinese (zh)
Inventor
T·普拉洛
T·克勒
S·L·勒舍尔
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Koninklijke Philips NV
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Koninklijke Philips NV
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Publication of CN115715169A publication Critical patent/CN115715169A/zh
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    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58Testing, adjusting or calibrating thereof
    • A61B6/586Detection of faults or malfunction of the device
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/44Constructional features of apparatus for radiation diagnosis
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48Diagnostic techniques
    • A61B6/484Diagnostic techniques involving phase contrast X-ray imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041Phase-contrast imaging, e.g. using grating interferometers
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/043Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067Construction details
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pathology (AREA)
  • Surgery (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Optics & Photonics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Biomedical Technology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
CN202180041302.1A 2020-06-08 2021-06-02 用于dax成像中的缺陷补偿的步进策略 Pending CN115715169A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP20178712.4A EP3922179A1 (en) 2020-06-08 2020-06-08 Stepping strategy for defect compensation in dax imaging
EP20178712.4 2020-06-08
PCT/EP2021/064725 WO2021249836A1 (en) 2020-06-08 2021-06-02 Stepping strategy for defect compensation in dax imaging

Publications (1)

Publication Number Publication Date
CN115715169A true CN115715169A (zh) 2023-02-24

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CN202180041302.1A Pending CN115715169A (zh) 2020-06-08 2021-06-02 用于dax成像中的缺陷补偿的步进策略

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Country Link
US (1) US20230221265A1 (https=)
EP (2) EP3922179A1 (https=)
JP (1) JP2023527572A (https=)
CN (1) CN115715169A (https=)
WO (1) WO2021249836A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117788396B (zh) * 2023-12-18 2024-08-30 江苏省特种设备安全监督检验研究院 一种基于深度学习的dr图像缺陷智能识别方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150092914A1 (en) * 2013-09-27 2015-04-02 Siemens Aktiengesellschaft Method for examining an object using an x-ray recording system for phase contrast imaging with stochastic phase scanning
CN104582575A (zh) * 2012-08-17 2015-04-29 皇家飞利浦有限公司 处置差分相衬成像中的未对准
CN108720857A (zh) * 2017-04-20 2018-11-02 株式会社岛津制作所 X射线相位差摄像系统

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JPS59102227A (ja) * 1982-12-03 1984-06-13 Fuji Photo Film Co Ltd 蓄積性螢光体シ−トを用いた高速撮影台
JPH10136665A (ja) * 1996-10-31 1998-05-22 Tdk Corp 圧電アクチュエータ
JP2006172604A (ja) * 2004-12-15 2006-06-29 Tdk Corp レンズ用アクチュエータ、光ヘッド及び光ディスク装置
JP5789613B2 (ja) * 2009-12-10 2015-10-07 コーニンクレッカ フィリップス エヌ ヴェ オンザフライ位相ステッピングを備えた非平行な格子装置、x線システム及び使用方法
JP5725870B2 (ja) * 2010-02-22 2015-05-27 キヤノン株式会社 X線撮像装置およびx線撮像方法
JP2013106882A (ja) * 2011-11-24 2013-06-06 Fujifilm Corp 放射線撮影装置及び放射線撮影方法
JP2013116270A (ja) * 2011-12-05 2013-06-13 Canon Inc X線撮像装置
JP6191136B2 (ja) * 2013-01-10 2017-09-06 コニカミノルタ株式会社 画像生成方法
JP6402780B2 (ja) * 2014-12-22 2018-10-10 株式会社島津製作所 放射線位相差撮影装置
US10945690B2 (en) * 2015-06-30 2021-03-16 Koninklijke Philips N.V. Scanning X-ray apparatus with full-field detector
DE102016211761A1 (de) * 2016-06-29 2018-01-04 Siemens Healthcare Gmbh Gitterträger zur Nutzung im Rahmen einer interferometrischen Röntgenbildgebung
DE102016219055A1 (de) * 2016-09-30 2018-04-05 Carl Zeiss Microscopy Gmbh Stellantrieb zur Justage eines zu bewegenden Elements, Verwendungen und Verfahren zur Justage

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104582575A (zh) * 2012-08-17 2015-04-29 皇家飞利浦有限公司 处置差分相衬成像中的未对准
US20150092914A1 (en) * 2013-09-27 2015-04-02 Siemens Aktiengesellschaft Method for examining an object using an x-ray recording system for phase contrast imaging with stochastic phase scanning
CN108720857A (zh) * 2017-04-20 2018-11-02 株式会社岛津制作所 X射线相位差摄像系统

Also Published As

Publication number Publication date
EP3922179A1 (en) 2021-12-15
US20230221265A1 (en) 2023-07-13
EP4161388A1 (en) 2023-04-12
WO2021249836A1 (en) 2021-12-16
JP2023527572A (ja) 2023-06-29

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