CN115708599A - Electronic atomization device and consumption detection method of to-be-atomized matrix thereof - Google Patents
Electronic atomization device and consumption detection method of to-be-atomized matrix thereof Download PDFInfo
- Publication number
- CN115708599A CN115708599A CN202110969951.XA CN202110969951A CN115708599A CN 115708599 A CN115708599 A CN 115708599A CN 202110969951 A CN202110969951 A CN 202110969951A CN 115708599 A CN115708599 A CN 115708599A
- Authority
- CN
- China
- Prior art keywords
- atomization
- temperature
- atomized
- substrate
- consumption
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- A—HUMAN NECESSITIES
- A24—TOBACCO; CIGARS; CIGARETTES; SIMULATED SMOKING DEVICES; SMOKERS' REQUISITES
- A24F—SMOKERS' REQUISITES; MATCH BOXES; SIMULATED SMOKING DEVICES
- A24F40/00—Electrically operated smoking devices; Component parts thereof; Manufacture thereof; Maintenance or testing thereof; Charging means specially adapted therefor
- A24F40/40—Constructional details, e.g. connection of cartridges and battery parts
-
- A—HUMAN NECESSITIES
- A24—TOBACCO; CIGARS; CIGARETTES; SIMULATED SMOKING DEVICES; SMOKERS' REQUISITES
- A24F—SMOKERS' REQUISITES; MATCH BOXES; SIMULATED SMOKING DEVICES
- A24F40/00—Electrically operated smoking devices; Component parts thereof; Manufacture thereof; Maintenance or testing thereof; Charging means specially adapted therefor
- A24F40/40—Constructional details, e.g. connection of cartridges and battery parts
- A24F40/42—Cartridges or containers for inhalable precursors
-
- A—HUMAN NECESSITIES
- A24—TOBACCO; CIGARS; CIGARETTES; SIMULATED SMOKING DEVICES; SMOKERS' REQUISITES
- A24F—SMOKERS' REQUISITES; MATCH BOXES; SIMULATED SMOKING DEVICES
- A24F40/00—Electrically operated smoking devices; Component parts thereof; Manufacture thereof; Maintenance or testing thereof; Charging means specially adapted therefor
- A24F40/40—Constructional details, e.g. connection of cartridges and battery parts
- A24F40/46—Shape or structure of electric heating means
-
- A—HUMAN NECESSITIES
- A24—TOBACCO; CIGARS; CIGARETTES; SIMULATED SMOKING DEVICES; SMOKERS' REQUISITES
- A24F—SMOKERS' REQUISITES; MATCH BOXES; SIMULATED SMOKING DEVICES
- A24F40/00—Electrically operated smoking devices; Component parts thereof; Manufacture thereof; Maintenance or testing thereof; Charging means specially adapted therefor
- A24F40/50—Control or monitoring
-
- A—HUMAN NECESSITIES
- A24—TOBACCO; CIGARS; CIGARETTES; SIMULATED SMOKING DEVICES; SMOKERS' REQUISITES
- A24F—SMOKERS' REQUISITES; MATCH BOXES; SIMULATED SMOKING DEVICES
- A24F40/00—Electrically operated smoking devices; Component parts thereof; Manufacture thereof; Maintenance or testing thereof; Charging means specially adapted therefor
- A24F40/50—Control or monitoring
- A24F40/57—Temperature control
Abstract
The application discloses an electronic atomization device and a consumption detection method of a substrate to be atomized, wherein the method comprises the following steps: acquiring energy in time intervals, wherein the energy is applied to an atomizer for atomizing a substrate to be atomized; acquiring temperature in different time periods, wherein the temperature is the temperature corresponding to the heating body of the atomizer under the energy; and acquiring the consumption of the matrix to be atomized in each stage according to the energy and the temperature. According to the method, the consumption of the matrix to be atomized in the atomization process is obtained, so that the atomization amount of the electronic atomization device can be mastered in real time, a user can reasonably use the electronic atomization device according to the real-time atomization amount in a controlled manner, and the situation that the atomizer is scorched and has no matrix to be atomized to generate scorched smell and influence on health is prevented.
Description
Technical Field
The application relates to the technical field of atomizers, in particular to an electronic atomization device and a consumption detection method of a substrate to be atomized.
Background
Aerosol inhalation technology is receiving increasing attention as an advanced aerosol delivery technology. During the use, both the sufficient inhalation amount is ensured and the excessive intake during the use is prevented. Therefore, it is very important to accurately measure the content of inhaled aerosol in each atomization process, and the existing electronic atomizer has no or less prompts on dosage and residual matrix to be atomized in an atomization bin; or the accuracy of prompting for it is poor. The current relevant dose consumption acquisition schemes for the substrate to be aerosolized mainly include the following:
1. based on the acquisition of the pumping time, the method has low accuracy;
2. the air pressure sensor is added, and the dose is accurately acquired by detecting the speed of the suction air flow, so that the accuracy is high, the air pressure sensor needs to be additionally added, the cost is increased, the requirement on the structure of the battery is higher, and the volume of the battery is increased.
Disclosure of Invention
In view of the above, the present application provides a method for detecting consumption of a substrate to be atomized and an electronic atomization apparatus using the same, so as to solve the above technical problems.
In order to solve the above technical problem, a first technical solution provided by the present application is: there is provided a method of detecting consumption of a substrate to be nebulised comprising:
acquiring energy in a time-interval, wherein the energy is applied to an atomizer for atomizing a substrate to be atomized;
acquiring temperature in different time periods, wherein the temperature is the temperature corresponding to the heating body of the atomizer under the energy;
and acquiring the consumption of the matrix to be atomized in each stage according to the energy and the temperature.
Wherein the step of obtaining consumption of the substrate to be atomized for each phase according to the energy and the temperature comprises:
acquiring atomization latent heat corresponding to the temperature, wherein the atomization latent heat is energy required by unit atomization of the substrate to be atomized at the temperature;
and acquiring the consumption of the substrate to be atomized in the corresponding stage according to the energy and the atomization latent heat.
Wherein the step of acquiring the temperature in time intervals comprises:
acquiring a current resistance value corresponding to the heating element;
and acquiring the temperature according to the current resistance value.
Wherein the step of obtaining the temperature according to the current resistance value further comprises:
acquiring a corrected resistance value according to the current resistance value and a resistance temperature curve corresponding to the previous suction;
and acquiring the temperature according to the corrected resistance value.
The atomization latent heat comprises first atomization latent heat and second atomization latent heat, the first atomization latent heat is energy required by unit atomization of the substrate to be atomized at different temperatures in a temperature-rising atomization stage, and the second atomization latent heat is energy required by unit atomization of the substrate to be atomized in a constant-temperature atomization stage;
the step of obtaining consumption of the substrate to be atomized in a corresponding phase according to the energy and the latent heat of atomization comprises:
in the temperature-rising atomization stage, the consumption of the first substrate to be atomized is obtained according to the energy and the first latent heat of atomization;
and in the constant-temperature atomization stage, acquiring the consumption of the second substrate to be atomized according to the energy and the second latent heat of atomization.
Wherein, the step of obtaining energy by time interval, the step of obtaining temperature by time interval includes:
acquiring the energy and the temperature every predetermined time in response to the temperature of the atomizer reaching an initial atomization temperature;
the step of obtaining consumption of the substrate to be atomized in a corresponding phase according to the energy and the latent heat of atomization comprises:
in the temperature-rising atomization stage, acquiring the consumption of the substrate to be atomized in the preset time period according to the energy and the first latent heat of atomization in the preset time period;
and in the constant-temperature atomization stage, acquiring the consumption of the substrate to be atomized in the preset time period according to the energy and the second latent heat of atomization in the preset time period.
In the temperature-increasing atomization stage, the temperature of the atomizer in the preset time stage is an average atomization temperature obtained according to the highest atomization temperature and the lowest atomization temperature of the atomizer in the preset time.
Wherein, the step of obtaining energy by time interval, the step of obtaining temperature by time interval includes:
acquiring first energy and first temperature of the temperature-raising atomization stage; and
acquiring second energy and second temperature of the constant-temperature atomization stage;
the step of obtaining the consumption of the substrate to be atomized for the corresponding phase according to the energy and the latent heat of atomization comprises:
acquiring consumption of a first substrate to be atomized in the whole temperature-rising atomization stage according to the first energy and the first latent atomization heat, wherein the first latent atomization heat is energy required by atomization of the substrate to be atomized per unit at different temperatures in the temperature-rising atomization stage; and
and acquiring the consumption of a second substrate to be atomized in the whole constant-temperature atomization stage according to the second energy and the second latent heat of atomization, wherein the second latent heat of atomization is the energy required by atomization of the substrate to be atomized in a unit in the constant-temperature atomization stage.
Wherein the second latent heat of atomization is obtained by:
obtaining the first consumption of the substrate to be atomized when the substrate to be atomized reaches the constant-temperature atomization stage at the first working time;
weighing and measuring the second consumption of the substrate to be atomized when the substrate to be atomized reaches the constant-temperature atomization stage in the second working time;
the second latent heat of atomization is obtained by dividing a difference in energy applied to the atomizer during the second time and the first time of operation by a difference in the second consumption amount and the first consumption amount.
Wherein the first latent heat of atomization is obtained by:
acquiring average atomization latent heat in a temperature-rise atomization stage;
and acquiring the first atomization latent heat according to the average atomization latent heat, the second atomization latent heat and the resistance-time relation of the heating atomization stage.
Wherein the average latent heat of atomization is obtained by:
obtaining a third consumption of the matrix to be atomized in the temperature-raising atomization stage;
and obtaining the average latent heat of atomization according to the energy applied to the atomizer in the temperature-increasing atomization stage divided by the third consumption.
Wherein, after the step of obtaining consumption of the substrate to be atomized in each stage according to the energy and the temperature, the method further comprises the following steps: acquiring the total consumption of the substrate to be atomized in the atomization process according to the consumption of the substrate to be atomized in each stage; wherein the total consumption of the substrate to be atomized comprises the consumption of the first substrate to be atomized and the consumption of the second substrate to be atomized.
In order to solve the above technical problem, a second technical solution provided by the present application is: there is provided an electronic atomization device comprising:
the controller comprises an acquisition module, a control module and a control module, wherein the acquisition module is used for acquiring the consumption of the matrix to be atomized of the electronic atomization device; the method for acquiring the consumption of the substrate to be atomized by the electronic atomization device through the acquisition module is any one of the methods.
Wherein, the electronic atomization device still includes: a memory for storing characteristic information of a nebulizer of the electronic nebulizing device; wherein the characteristic information comprises an initial mass of the substrate to be nebulized of the nebulizer; the controller is further used for obtaining the residual amount of the substrate to be atomized of the atomizer according to the initial mass of the substrate to be atomized of the atomizer and the consumption amount of the substrate to be atomized.
The beneficial effect of this application: being different from the prior art, the application discloses electronic atomization device and consumption detection method of to-be-atomized matrix thereof, and the consumption detection method of to-be-atomized matrix comprises the following steps: acquiring energy applied to an atomizer in different time periods, and acquiring the corresponding temperature of a heating body of the atomizer under the energy in different time periods; and acquiring the consumption of the matrix to be atomized in each stage according to the energy and the temperature. According to the method, the consumption of the matrix to be atomized in the atomization process is obtained, so that the atomization amount of the electronic atomization device can be mastered in real time, a user can reasonably and sparingly use the electronic atomization device according to the real-time atomization amount, and the phenomenon that the atomizer is scorched and has no influence on health due to dry burning of the matrix to be atomized is prevented.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the description below are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a block diagram of an electronic atomizer device according to the present disclosure;
fig. 2 is a block diagram illustrating an internal structure of a controller of the electronic atomizer provided herein;
FIG. 3 is a schematic flow diagram of a method for detecting consumption of a substrate to be aerosolized as provided herein;
FIG. 4 is a schematic flow chart of an embodiment of step S3 of the method for detecting consumption of a substrate to be nebulized provided in FIG. 3;
FIG. 5 is a schematic flow chart diagram illustrating an embodiment of step S32 of the method for detecting consumption of a substrate to be atomized provided in FIG. 4;
FIG. 6 is a schematic flow diagram of one embodiment of the method for detecting consumption of a substrate to be aerosolized as provided in FIG. 3;
FIG. 7 is a schematic flow chart of an embodiment of step S2 of the method for detecting consumption of a substrate to be atomized provided in FIG. 3;
FIG. 8 is a schematic flow chart of an embodiment of step S21 of the method for detecting consumption of a substrate to be nebulized provided in FIG. 7;
FIG. 9 is a schematic flow diagram of another embodiment of the method for detecting consumption of a substrate to be aerosolized as provided in FIG. 3;
FIG. 10 shows the application obtaining a second latent heat of atomization X in the constant-temperature atomization stage 2 A schematic flow diagram of (a);
FIG. 11 shows the method of obtaining a first latent heat of atomization X in a temperature-increasing atomization stage 1 A schematic flow diagram of (a);
FIG. 12 shows the average latent heat of atomization X obtained in the temperature-increasing atomization stage according to the present application 3 A schematic flow diagram of (a);
FIG. 13 is a schematic flow chart of the application for obtaining a third consumption M3 of the substrate to be atomized for the phase of elevated temperature atomization to be tested;
fig. 14 is a graph of resistance versus time for a heating element of an atomizer.
Detailed Description
The present application will be described in further detail with reference to the following drawings and examples. It is to be noted that the following examples are only illustrative of the present application, and do not limit the scope of the present application. Likewise, the following examples are only some examples and not all examples of the present application, and all other examples obtained by a person of ordinary skill in the art without any inventive work are within the scope of the present application.
The terms "first", "second" and "third" in this application are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or as implying a number of indicated technical features. Thus, a feature defined as "first," "second," or "third" may explicitly or implicitly include at least one of the feature. In the description of the present application, "plurality" means at least two, e.g., two, three, etc., unless explicitly specifically limited otherwise. In the embodiment of the present application, all directional indicators (such as up, down, left, right, front, rear \8230;) are used only to explain the relative positional relationship between the components, the motion situation, etc. at a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indicator is changed accordingly. The terms "comprising" and "having" and any variations thereof in the embodiments of the present application are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or may alternatively include other steps or elements inherent to such process, method, article, or apparatus.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
Referring to fig. 1-2, fig. 1 is a block diagram illustrating a structure of an electronic atomizer according to the present disclosure, and fig. 2 is a block diagram illustrating an internal structure of a controller in the electronic atomizer according to the present disclosure.
The electronic atomizer device includes a controller 1, a memory 2, an atomizer 3, and a battery 4.
The atomizer 3 may be used for atomization of a liquid substrate. The atomizer 3 comprises a shell, an atomizing base, an atomizing core and the like. The atomizing core comprises a porous liquid guide base body and a heating element. Specifically, the heating element may adopt a heating element with a large TCR (temperature coefficient of resistance), and the controller 1 detects and controls the resistance of the heating element to realize the detection and control of the atomization temperature of the atomization bin.
The controller 1 is used for controlling the work of the atomizer 3 and obtaining the consumption of the matrix to be atomized of the electronic atomization device, and the like, and the memory 2 is used for storing the characteristic information of the atomizer 3 of the electronic atomization device; wherein the characteristic information comprises the initial mass of the substrate to be atomized of the atomizer 3, and the memory 2 may further store information such as a characteristic ID code of the atomizer 3.
The controller 1 can also obtain the characteristic information of the atomizer 3, and the residual amount of the to-be-atomized medium of the atomizer 3 is obtained according to the initial to-be-atomized medium quality and the to-be-atomized medium consumption of the atomizer 3, so that information such as consumed to-be-atomized medium dosage and residual to-be-atomized medium quality of the atomizer 3 can be reminded and displayed at any time, and a user can know specific use data at any time.
The controller 1 comprises an acquisition module 10, a reminding module 11 and a cutting module 12. The obtaining module 10 is used for obtaining the consumption amount and the remaining amount of the substrate to be atomized of the electronic atomization device. The reminding module 11 is used for reminding when the residual quantity of the matrix to be atomized of the atomizer 3 is less than or equal to a first preset threshold value. The cutting-off module 12 is used for cutting off when the remaining amount of the to-be-atomized substrate of the atomizer 3 is less than or equal to a second preset threshold value, so as to stop atomization, and prevent the to-be-atomized substrate of the atomizer 3 from being insufficient to be burnt to generate scorched smell and affect health. The electronic atomization device can further comprise an indicator light and the like, the indicator light is electrically connected with the reminding module 11, the indicator light flickers, and the reminding module 11 is matched to remind the allowance of the matrix to be atomized.
The first preset threshold is larger than the second preset threshold. The first preset threshold and the second preset threshold can be set according to actual use requirements, and once the matrix to be atomized is consumed to be larger than the preset threshold, reminding or cutting-off operation is carried out, so that the use safety is improved, and the health of a user is protected to a greater extent. The first preset threshold and the second preset threshold may be specific values or percentages.
The existing electronic atomizer 3 does not or less give a prompt for the dosage and/or the residual matrix to be atomized in the atomizing chamber; or the prompting of the dosage of the matrix to be atomized is poor in accuracy, complex in structure and high in cost.
Therefore, the application provides a consumption detection method of the substrate to be atomized, which obtains the consumption of the substrate to be atomized in the atomization process by adopting the principle of energy conservation in the heating atomization process, and applies the consumption detection method of the substrate to be atomized to an electronic atomization device.
Referring to fig. 14, fig. 14 is a graph of resistance versus time for a heating element of an atomizer. Since the heating element of the atomizer 3 of the present application has TCR (temperature coefficient of resistance) characteristics, fig. 14 actually reflects the atomizing temperature-time change curve of the atomizer. Referring to fig. 14, the abscissa is time, the ordinate is resistance AD value, and the heating element temperature can be calculated from the resistance AD value, specifically: the higher the temperature of the metal conductor, the higher the resistance, and the lower the temperature, the lower the resistance. It will be appreciated that in other embodiments, a dedicated temperature sensor may be provided to directly obtain the atomization temperature-time relationship of the atomizer 3.
Referring to fig. 14, the present application divides the primary atomization process into three phases: a non-atomization stage, a temperature-rise atomization stage and a constant-temperature atomization stage. In the earlier stage of the suction electronic atomization device, the temperature of the heating body is low, all energy is used for heating and warming the substrate to be atomized, and the atomization process is not carried out in the stage, so that the substrate to be atomized is not consumed, and the atomization stage is free. When the temperature of the substrate to be atomized reaches the atomization point temperature value, atomization starts to be generated, at the moment, a part of energy supplied by the battery 4 is used for continuously heating the substrate to be atomized of the atomizer 3, and a part of energy is used for atomizing the substrate to be atomized, namely, the temperature-rising atomization stage. Further, when the supply energy of the battery 4 and the atomization consumption energy reach an equilibrium state, the temperature will be kept constant, and the atomization amount also keeps a stable level, i.e. a constant temperature atomization stage.
In view of the above characteristics and the law of conservation of energy, the electronic atomization device can obtain the consumption of the substrate to be atomized by obtaining energy supply and measuring the energy value required for atomizing the substrate to be atomized at a specific temperature.
Because the consumption of the substrate to be atomized is 0 in the non-atomization stage, the consumption of the substrate to be atomized in the process of sucking one electronic atomization device by a user is obtained, and only the consumption of the substrate to be atomized in the temperature-raising atomization stage and the constant-temperature atomization stage is required to be obtained. The present application therefore particularly divides the consumption process of pumping a substrate to be nebulized by an electronic nebulization device into two phases: a temperature-rising atomization stage and a constant-temperature atomization stage. The total consumption of the substrate to be atomized by pumping one electronic atomizer is the sum of the respective consumed amounts of the substrate to be atomized in the temperature-increasing atomization stage and the constant-temperature atomization stage.
It should be noted that, not every time a user sucks the electronic atomization device, the user needs to go through three stages of no atomization, temperature rise atomization and stable atomization, and the current atomization stage of the electronic atomization device is related to the time interval after the user sucks one of the electronic atomization device and the ambient temperature of the user. In particular, at normal temperatures, if a user takes a second puff (typically a few seconds) soon after drawing one puff on the electronic atomization device, the temperature of the electronic atomization device may still be in a stable atomization phase. If the ambient temperature is low, the user may need to perform the heating atomization again from the temperature-increasing atomization stage when performing the second suction after sucking one of the electronic atomization devices for a few seconds. If the user performs the second suction after sucking one electronic atomization device for tens of minutes or hours, the electronic atomization device goes through three stages of no atomization, temperature rise atomization and stable atomization again.
The latent heat of atomization of the electronic atomization device is obtained experimentally and stored in the memory 2. When the electronic atomization device works, the consumption of the substrate to be atomized can be obtained according to the energy output of the battery 4, the temperature of the atomizer 3 and the atomization latent heat corresponding to the temperature of the atomizer 3.
Referring specifically to fig. 3, fig. 3 is a schematic flow chart of a method for detecting consumption of a substrate to be atomized according to the present application.
A method for detecting consumption of a substrate to be atomized, comprising:
s1: acquiring energy Q in time intervals, wherein the energy Q is the energy Q applied to the atomizer 3, which atomizer 3 is used for atomizing the substrate to be atomized;
s2: acquiring the temperature T in different time periods, wherein the temperature T is the temperature T corresponding to the heating body of the atomizer 3 under the energy Q;
s3: and acquiring the consumption of the matrix to be atomized in each stage according to the energy Q and the temperature T.
In steps S1 and S2, the energy Q is obtained in different periods of time, the temperature T is obtained in different periods of time, and "period of time" may be understood as a process of dividing the process of sucking the electronic atomization device according to different time intervals, and may also be understood as a process of atomizing the substrate to be atomized when sucking the one-bite electronic atomization device, which is divided according to a process of starting heating the substrate to be atomized without atomization, a process of heating up the substrate for atomization, and a process of constant temperature atomization. "time-period acquisition of energy Q" means acquisition of energy Q which the battery 4 applies to the atomizer 3 during the time period, and also energy Q which the battery 4 outputs to the atomizer 3. The "time-division acquisition temperature T" refers to acquisition of the temperature T corresponding to the heat generating body of the atomizer 3 under the energy Q. The atomization temperature T may be an atomization temperature T of a temperature-rising atomization process or an atomization temperature T of a constant-temperature atomization process, and the temperature T includes a surface temperature, an internal temperature, and an average temperature of a heat-generating body of the atomizer 3. Specifically, the temperature can be selected according to actual conditions, and the temperature obtained for multiple times before and after the temperature is ensured to be the same type of parameter. Referring to fig. 14, the atomization temperature T of the temperature-increasing atomization process is a variable that changes with time, and the atomization temperature T of the constant-temperature atomization process is a substantially constant value.
In step S3, the consumption amount of the substrate to be atomized at each stage can be found from the time period divided in the previous step in which the energy Q applied to the atomizer 3 by the battery 4 and the temperature T of the heat generating body of the atomizer 3 are obtained.
Specifically, in order to obtain the consumption of the substrate to be atomized at each stage, the method introduces the latent heat of atomization X, wherein the latent heat of atomization X can be obtained in advance through experiments and stored in the storage 2, the controller 1 searches for or obtains the latent heat of atomization X corresponding to the temperature through the temperature T of the heating body of the atomizer 3, and then the consumption of the substrate to be atomized in the atomization process is obtained according to the energy Q applied to the atomizer 3 by the battery 4 and the corresponding latent heat of atomization X.
In one embodiment, referring to fig. 4, fig. 4 is a schematic flowchart of an embodiment of step S3 of the method for detecting consumption of a substrate to be atomized provided in fig. 3. The step of obtaining the consumption of the substrate to be atomized at each stage according to the energy Q and the temperature T comprises the following steps:
s31: acquiring atomization latent heat X corresponding to the temperature T, wherein the atomization latent heat X is energy Q required by atomization of a single substrate to be atomized at the temperature T;
s32: and acquiring the consumption of the substrate to be atomized in the corresponding stage according to the energy Q and the atomization latent heat X.
In step S3, if one atomization process includes both a temperature-increasing atomization process and a constant-temperature atomization process, for example, first suction or suction stopping for a long time and then suction again, it is necessary to separately acquire the consumption amount of the substrate to be atomized in the temperature-increasing atomization process and the consumption amount of the substrate to be atomized in the constant-temperature atomization process, because the atomization latent heat X in the temperature-increasing atomization process and the atomization latent heat X in the constant-temperature atomization process are different, where the atomization latent heat X in the temperature-increasing atomization process varies with temperature, and the atomization latent heat X in the constant-temperature atomization process is a constant value.
Specifically, the latent heat of atomization X includes a first latent heat of atomization X 1 And a second latent heat of atomization X 2 First latent heat of atomization X 1 In order to raise the energy required for atomizing the substrate to be atomized at different temperatures in the atomization stage, the second latent heat of atomization X 2 The energy required for atomizing the unit matrix to be atomized in the constant-temperature atomization stage.
Referring to fig. 5, fig. 5 is a flowchart illustrating an embodiment of step S32 in the method for detecting consumption of the substrate to be atomized provided in fig. 4. And acquiring the consumption of the substrate to be atomized in the corresponding stage according to the energy Q and the atomization latent heat X. The method specifically comprises the following steps:
s321: in the temperature-rising atomization stage, the energy Q and the first atomization latent heat X are used 1 Obtaining the consumption of a first substrate to be atomized;
s322: in the constant-temperature atomization stage, the energy Q and the second atomization latent heat X are used 2 And obtaining the consumption of the second substrate to be atomized.
In step S321, the first atomization latent heat X due to the temperature-increasing atomization process 1 The consumption of the substrate to be atomized in the temperature-rising atomization process can be obtained by integration or staged accumulation along with the temperature change.
In step S322, the second latent heat of atomization X due to the constant temperature atomization process 2 The consumption of the substrate to be atomized in the constant-temperature atomization process can be directly obtained by dividing the energy Q of the constant-temperature atomization process by the latent heat X of atomization in the constant-temperature atomization process.
If the atomization process only comprises a constant-temperature atomization process, for example, multiple orifices are continuously sucked, and the temperature of the atomizer 3 does not fall below the temperature of constant-temperature atomization in the next suction, the atomization temperature in the next suction is a constant value, and the consumption of the substrate to be atomized in the next suction is acquired only by considering the consumption of the substrate to be atomized in the constant-temperature atomization process.
The consumption detecting method of the substrate to be atomized of the present application may include the following specific embodiments depending on the divided periods of time in which the energy Q applied to the atomizer 3 from the battery 4 and the temperature T of the heat generating body of the atomizer 3 are obtained.
In one embodiment, referring to fig. 6, fig. 6 is a schematic flow chart of an embodiment of the method for detecting consumption of a substrate to be atomized provided in fig. 3. In the step S1 and the step S2, the step of obtaining the energy Q in a time-division manner, and the step of obtaining the temperature T in a time-division manner include:
S1A, responding to the temperature T of the heating body of the atomizer 3 reaching the initial atomization temperature T 0 Acquiring energy Q and temperature T once every preset time;
in step S32, the step of obtaining the consumption of the substrate to be atomized in the corresponding stage according to the energy Q and the latent heat of atomization X includes:
S321A, in the temperature-rising atomization stage, according to the energy Q and the first atomization latent heat X in the preset time stage 1 Obtaining the consumption of the matrix to be atomized in a preset time period;
S322A, in the constant-temperature atomization stage, according to the energy Q and the second atomization latent heat X in the preset time stage 2 The consumption of the substrate to be atomized for a predetermined period of time is obtained.
In step S1A, since the atomization temperature T of the electronic atomization device is a variable that changes with time in the temperature-increasing atomization stage, in this embodiment, the temperature T of the atomizer 3 in the predetermined time is an average atomization temperature determined from the maximum atomization temperature and the minimum atomization temperature of the atomizer 3 in the predetermined time.
Data is collected every predetermined time under the condition that the electronic atomization device is heated. Optionally, the predetermined time is 5-20 ms, the collection interval time can be selected according to the requirement, and the collection times, the collection interval time and the collection time are controlledThe length of one time of suction of the user is related. Initial atomization temperature T of atomizer 3 0 Is the temperature at which the substrate to be atomized of the atomizer 3 is at least partially atomized. In an embodiment of the present application, the initial atomization temperature T of the atomizer 3 0 At 200 ℃, when the temperature of the heating element reaches 200 ℃, part of the matrix to be atomized starts to be atomized; the energy Q applied to the atomizer 3 by the battery 4 and the temperature T of the heating body of the atomizer 3 are obtained every 10 milliseconds, and in order to ensure the accuracy of temperature collection, the temperature T adopts the average atomization temperature obtained by the highest temperature atomization temperature and the lowest atomization temperature in the current temperature collection interval. In other possible embodiments, the initial atomization temperature T 0 Other temperatures are also possible, which are different according to the matrix to be atomized, and the collection interval time can be selected according to actual needs. The initial nebulization temperature T of the nebulizer 3 is determined when the composition of the substrate to be nebulized of the nebulizer 3 is determined 0 As well as the determination. The controller 1 can acquire the initial atomization temperature T of the atomizer 3 from the memory 2 according to the ID information of the atomizer 3 0 。
The time for pumping one electronic atomization device, namely the time for one atomization by the electronic atomization device, is generally 3-6s.
In step S321A, the first latent heat of atomization X is stored in advance in the memory 2 1 The first latent heat of atomization X corresponding to the temperature T at a predetermined time period can be obtained by a table look-up method or a formula acquisition method in accordance with a table or a functional relationship corresponding to the temperature T 1 . A first latent heat of atomization X corresponding to the energy Q divided by the temperature T in a predetermined period of time 1 The consumption of the substrate to be atomized for the predetermined period of time is obtained. Similarly, the consumption of the substrate to be atomized at each predetermined time period during the temperature-increasing atomization phase can be obtained.
In step S322A, the energy Q of the predetermined time period is divided by the second latent heat of atomization X 2 The consumption of the substrate to be atomized for the predetermined period of time is obtained. In a similar manner, the consumption of the substrate to be nebulized can be obtained for each predetermined period of time during the constant-temperature nebulization phase.
It should be noted that, here, the total consumption amount of the substrate to be atomized in the temperature-increasing atomization stage or the constant-temperature atomization stage may be obtained by adding the consumption amount of the substrate to be atomized in each observation of the predetermined time in the temperature-increasing atomization stage or the constant-temperature atomization stage. It is also possible to obtain only the consumption of the substrate to be atomized for each observation of the predetermined time during the warm-up atomization phase or the constant-temperature atomization phase, and to obtain the total consumption of the substrate to be atomized by sucking one of the electronic atomization devices together in the end.
In one embodiment, referring to fig. 7, fig. 7 is a schematic flowchart of an embodiment of step S2 in the method for detecting consumption of a substrate to be atomized provided in fig. 3. Specifically, the step of acquiring the temperature in time intervals comprises:
s21: acquiring a current resistance value corresponding to the heating element;
s22: and acquiring the temperature T according to the current resistance value.
Specifically, in practical application, the corresponding temperature value is obtained by collecting the resistance value of the atomizer 3, and the temperature value cannot be directly obtained. In this embodiment, before obtaining the temperature T, the current resistance value corresponding to the heating element needs to be obtained first, and the temperature T of the heating element in the current situation is estimated according to the magnitude of the resistance value of the heating element in the working process of the battery 4, so as to determine the working state (non-atomization state, temperature-rise atomization state, or stable atomization state) of the atomizer 3 at that time. And the resistance curve also serves as a judgment basis for the working state of the next atomization suction.
Referring to fig. 8, fig. 8 is a flowchart illustrating an embodiment of step S21 of the method for detecting consumption of the substrate to be atomized provided in fig. 7. The step of obtaining the temperature T according to the current resistance value further includes:
s211: acquiring a corrected resistance value according to the current resistance value and a resistance-temperature curve corresponding to the previous pumping;
s212: and acquiring the temperature T according to the corrected resistance value.
The resistance value changes during use, so correction is required. Specifically, since the resistance value of the atomizer 3 is lost with the use time, but the temperature point at which atomization is stabilized is substantially fixed, the resistance value-temperature relationship can be corrected accordingly. As the number of uses increases, the resistance value corresponding to the thermal equilibrium increases. Based on the history data, the relationship between the resistance and the temperature is appropriately corrected, and the atomization latent heat X corresponding to the temperature T is appropriately corrected.
For example, assuming that the resistance value sampled when the thermal equilibrium is reached for the first time is 20 ohms, the corresponding thermal equilibrium temperature is 210 degrees celsius, and the resistance value sampled when the thermal equilibrium is reached for the fifth time is 22 ohms, that is, the corresponding thermal equilibrium temperature is 210 degrees celsius, when the thermal equilibrium temperature is sampled for the fifth time is 20 ohms, the corresponding latent heat of atomization X is corrected, otherwise, an error occurs.
In another embodiment, the energy Q and the temperature T are obtained during the entire temperature-increasing atomization phase and the entire constant-temperature atomization phase, respectively.
Referring to fig. 9 and 14, fig. 9 is a schematic flow chart of another embodiment of the method for detecting consumption of a substrate to be atomized provided in fig. 3. The method for detecting the consumption of the substrate to be atomized comprises the following steps:
S11B: obtaining first energy Q in a heating atomization stage 1 And a first temperature T 1 ；
S12B: obtaining the second energy Q of the constant temperature atomization stage 2 And a second temperature T 2 ；
The step of obtaining the consumption of the substrate to be atomized in the corresponding stage according to the energy Q and the atomization latent heat X comprises the following steps:
S21B: according to a first energy Q 1 And a first latent heat of atomization X 1 Obtaining the consumption of a first substrate to be atomized in the whole temperature-rising atomization stage, wherein the first latent heat of atomization X 1 The energy required by the electronic atomization device for atomizing the substrate to be atomized at different temperatures in the temperature-rising atomization stage;
S22B: according to a second energy Q 2 And a second latent heat of atomization X 2 Obtaining the consumption of a second substrate to be atomized in the whole constant-temperature atomization stage, wherein the second atomization latent heat X 2 The energy required for atomizing the substrate to be atomized is a unit of the energy required for atomizing the substrate to be atomized in the constant-temperature atomization stage of the electronic atomization device.
In steps S11B and S12B, the first temperature T 1 As a function of time t, second temperatureDegree T 2 Is a constant value. First energy Q 1 And a second energy Q 2 Can be derived from the output power p and the output time t of the battery 4. For convenience of understanding, it can be assumed that the conversion rate of the electric energy into the heat energy is 100%, and if the control signal is a PWM signal, the energy supply amount can be determined according to Q = pt = U 2 The resistance value of the heating element is R. In one embodiment of the application, the battery 4 directly drives to output a constant power p, and the constant power p is multiplied by the output time t, i.e. the energy supplied by the battery 4 during the time. In another embodiment of the present application, the power p output by the battery 4 is a time variable, and the energy output by the battery 4 during the time period needs to be obtained by means of integration.
In step S21B, the instantaneous energy of the battery 4 may be represented as pt, and the instantaneous atomization amount of the atomizer 3 is (p × d (t))/X 1 . Latent heat of atomization X due to temperature rise in atomization stage 1 Is a temperature T 1 Variable of (2), temperature T 1 Is a function of time t, thus, X 1 Also a variable of time t. That is, the instantaneous atomization amount of the atomizer 3 is (p × d (t))/X 1 Only variable at time t. The instantaneous atomization amount of the atomizer 3 is (p multiplied by d (t))/X 1 The consumption of the first substrate to be atomized in the whole temperature-rising atomization stage can be directly obtained by integrating the consumption in the whole temperature-rising atomization stage.
In step S22B, a second energy Q 2 Can be derived from the output power p and the output time t of the battery 4. For example, p is multiplied by the duration t of the constant temperature atomization stage. By applying a second energy Q 2 Divided by the second latent heat of atomization X 2 And obtaining the consumption of the second substrate to be atomized of the electronic atomization device in the whole constant-temperature atomization stage.
The following describes the obtaining of the first latent heat of atomization X of the electronic atomization device provided by the present application 1 And a second latent heat of atomization X 2 The method of (1). The method obtains the first atomization latent heat X of the electronic atomization device by collecting the working parameters of the electronic atomization device to be tested and weighing and measuring 1 And a second latent heat of atomization X 2 . See below for details:
in an embodiment of the present application, please refer to fig. 10, in which fig. 10 illustrates the second latent heat of atomization X obtained in the constant temperature atomization stage 2 The process schematic diagram specifically comprises the following steps:
m1: the method comprises the following steps of enabling an electronic atomization device to be tested to reach a constant-temperature atomization stage from room temperature to work for the first time, and weighing and measuring a first consumption M1 of a matrix to be atomized;
m2: enabling the electronic atomization device to be tested to work from room temperature for the second time to reach a constant-temperature atomization stage, and weighing and measuring the second consumption M2 of the substrate to be atomized;
and M3: according to formula X 2 ＝Q 2 '/(M2-M1), second latent heat of atomization X 2 Is equal to Q 2 ' dividing the difference between the second consumption M2 and the first consumption M1 to obtain a second latent heat of atomization X 2 Wherein, Q 2 ' is the difference in energy of the battery 4 during the second time and the first time, respectively, of the operation of the electronic atomizer to be tested.
In particular, according to formula X 2 ＝Q 2 '/(M2-M1) taking a second latent heat of atomization X 2 That is, the second latent heat of atomization X 2 Is equal to Q 2 Dividing the difference between the second consumption M2 and the first consumption M1, namely dividing the difference between the energy output in the two heating processes by the difference between the consumption of the substrate to be atomized in the two heating processes to obtain the energy required by the electronic atomization device in the constant-temperature atomization stage for atomizing the substrate to be atomized in unit of temperature T, namely the second latent heat of atomization X 2 。
In the steps M1-M2, the electronic atomization device to be tested can also start to work at other temperatures besides room temperature, as long as the temperature for starting the test is not higher than the initial atomization temperature. In addition, the electronic atomization device to be tested can be an electronic atomization device specially used for testing or an electronic atomization device to be sold. If the electronic atomization device to be tested is the electronic atomization device to be sold, after the test is finished, the substrate to be atomized consumed in the test process is written into the memory 2 or the substrate to be atomized consumed in the test process is replenished.
In step M2, the electronic atomization device to be tested in step M1 may be operated for the second time from room temperature, or another electronic atomization device to be tested, which is identical to the electronic atomization device to be tested in step M1, may be used for testing.
Referring to FIG. 11, FIG. 11 shows the first latent heat of atomization X obtained in the temperature-increasing atomization stage of the present application 1 Is a schematic flow diagram. After obtaining the second latent heat of atomization X 2 Based on the first latent heat of atomization X 1 The method can be specifically obtained by the following steps:
m4: obtaining average atomization latent heat X of an electronic atomization device to be tested in a temperature-rise atomization stage 3 ；
M5: according to the average latent heat of atomization X 3 Second latent heat of atomization X 2 And acquiring a first atomization latent heat X from a resistance-time curve of the electronic atomization device to be tested in a temperature-rise atomization stage 1 。
Referring to FIG. 12, FIG. 12 shows the average latent heat of atomization X obtained in the temperature-increasing atomization stage of the present application 3 Is a schematic flow diagram. Specifically, the average latent heat of atomization X in the temperature-increasing atomization stage 3 Is obtained by the following method:
m51: acquiring a third consumption M3 of the substrate to be atomized of the electronic atomization device to be tested in the temperature-rising atomization stage;
m52: according to formula X 3 ＝Q 1 '/M3 obtaining average latent heat of atomization X 3 Wherein, Q 1 ' is the energy of the battery 4 of the electronic atomization device to be tested in the temperature-rising atomization stage.
As described in detail in step M3 above, according to formula X 3 ＝Q 1 '/M3 obtaining average latent heat of atomization X 3 That is, X 3 Is equal to Q 1 Dividing by the third consumption M3, i.e. the total energy of the cell 4 in the warm-up atomization phase, by the total consumption of the substrate to be atomized in the warm-up atomization phase (i.e. the third consumption M3), yields the average latent heat of atomization X at the temperature T in the warm-up atomization phase 3 。
Further, please refer to fig. 13, fig. 13 is a schematic flow chart of obtaining a third consumption M3 of the substrate to be atomized in the temperature-increasing atomization stage to be tested. The step of the third consumption M3 of the substrate to be atomized in the temperature-rising atomization stage of the electronic atomization device to be tested comprises the following steps:
m511: and acquiring the consumption M4 of the substrate to be atomized in unit time of the electronic atomization device to be tested in the constant-temperature atomization stage according to the first consumption M1, the second consumption M2, the first time and the second time in the constant-temperature atomization stage.
Specifically, M4 is equal to the difference between the second consumption M2 and the first consumption M1, divided by the difference between the second time and the first time, i.e., M4= (M2-M1)/(second time-first time);
m512: and obtaining a third consumption M3 of the substrate to be atomized according to the first consumption M1 and the second consumption M2 of the constant-temperature atomization stage, the consumption M4 of the substrate to be atomized in unit time and the duration C of the electronic atomization device to be tested in the constant-temperature atomization stage.
Specifically, M3= M1-M4 × C1, that is, M3 is a difference between the first consumption M1 and the consumption of the substrate to be atomized in the period of duration C1, M4 is a consumption of the substrate to be atomized in the period of duration C1 multiplied by the duration C1, or M3= M2-M4 × C2, that is, M3 is a difference between the second consumption M2 and the consumption of the substrate to be atomized in the period of duration C2, and M4 is a consumption of the substrate to be atomized in the period of duration C2 multiplied by the duration C2, where C1 is a duration of the first time to be tested in the constant temperature atomization stage, and C2 is a duration of the second time to be tested in the constant temperature atomization stage.
Illustratively, referring to fig. 14, a first consumption M1 of constant temperature atomization phases a 'to B (corresponding to a temperature T of 250 ℃) is observed and detected, a latent heat of atomization X of 100J/g is obtained at times a' to B by X = Q/M1, a second consumption M2 of constant temperature atomization phases B to C (corresponding to a temperature T of 250 ℃) is observed and detected, and a latent heat of atomization X of 100J/g is obtained at times B to C by X = Q/M2, where B is observed and detected>A’，A’>A, and A, A' and B are time points. The latent heat of atomization X in the constant-temperature atomization phase can thus be determined 2 Is 100J/g.
In obtainingGiving out the second latent heat of atomization X 2 Based on the first latent heat of atomization X 1 The method can be specifically obtained by the following steps:
first on the basis of the average latent heat of atomization X 3＝ Q 1 '/M3 obtaining average atomization latent heat X in temperature-rising atomization stage 3 Wherein Q is 1 ' is the energy of the battery 4 of the temperature-increasing atomization stage to be tested, and M3 is the third consumption of the substrate to be atomized of the temperature-increasing atomization stage.
Specifically, the temperature T of the temperature-increasing atomization stage A is 200 ℃ and the temperature T of A 'is 250 ℃ through observation and detection, and the average atomization latent heat X of the temperature-increasing atomization stages A to A' is assumed here 3 ＝Q 1 '/M3=150J/g, and the latent heat of atomization X of A' is known from the above 2 When the average value is 100J/g, the latent heat of atomization at the temperature point a, X = (150 × 2-100) J/g =200J/g, that is, the latent heat of atomization at 200 ℃ is 200J/g. Using a linear method one can derive: first latent heat of atomization X 1 = a × T + b. Wherein T is first latent heat of atomization X 1 The corresponding temperature values a and b are both constant, and the specific values of a and b (as shown here, a = -2, b = -600) can be obtained by substituting a temperature of A of 200 ℃ for atomization latent heat of 200J/g and a' of 250 ℃ for atomization latent heat of 100J/g, so as to obtain a first atomization latent heat X 1 And a linear function of temperature T: first latent heat of atomization X 1 And (c) = (-2) × T +600, whereby the latent heat at other temperature points can be obtained, for example, the latent heat at 230 ℃ is 140J/g. In other embodiments of the present application, the average latent heat of atomization X of the warm-up atomization phases A to A 3 Other values are possible as the case may be. Meanwhile, the first latent heat of atomization X is expressed by a linear function other than the above-described one 1 The relation with the temperature T can also be obtained by fitting a temperature rise curve 1 The results are made more realistic and are not limited herein.
In both embodiments of the present application, the step of obtaining the consumption of the substrate to be atomized at each stage according to the energy Q and the temperature T may further comprise:
s4: and acquiring the total consumption of the matrix to be atomized in the atomization process according to the consumption of the matrix to be atomized in each stage. Wherein the total consumption of the substrate to be atomized comprises the consumption of the first substrate to be atomized and the consumption of the second substrate to be atomized.
That is, after the consumption of the substrate to be atomized at each stage is obtained, the results are added, and the total consumption of the substrate to be atomized in the atomization process can be obtained. The total amount is compared with the mass of the substrate to be atomized, which is prestored in the memory 2, so that the residual amount of the substrate to be atomized can be obtained, and reference data are provided for the reminding module 11 and the cutting module 12.
It should be noted that the electronic atomization device to be tested described herein refers to the currently tested electronic atomization device, and the objects to be used in the method for detecting consumption of substrate to be atomized by the electronic atomization device disclosed in this application may be the same or similar electronic atomization device, or similar or modified electronic atomization device with the same function.
The application discloses electronic atomization device and a consumption detection method of to-be-atomized matrix thereof, wherein the consumption detection method of the to-be-atomized matrix comprises the following steps: acquiring energy Q in time intervals, wherein the energy Q is the energy Q applied to the atomizer 3, which atomizer 3 is used for atomizing the substrate to be atomized; acquiring the temperature T in different time periods, wherein the temperature T is the temperature T corresponding to the heating body of the atomizer 3 under the energy Q; and acquiring the consumption of the matrix to be atomized in each stage according to the energy Q and the temperature T. According to the method, the consumption of the matrix to be atomized in the atomization process is obtained, so that the atomization amount of the electronic atomization device can be mastered in real time, a user can reasonably and sparingly use the electronic atomization device according to the real-time atomization amount, and the phenomenon that the atomizer 3 is scorched and generates scorched smell to affect health due to no dry burning of the matrix to be atomized is avoided.
The above description is only a part of the embodiments of the present application, and not intended to limit the scope of the present application, and all equivalent devices or equivalent processes that can be directly or indirectly applied to other related technologies, which are made by using the contents of the present specification and the accompanying drawings, are also included in the scope of the present application.
Claims (14)
1. A method for detecting the consumption of a substrate to be nebulized, comprising:
acquiring energy in a time-interval, wherein the energy is applied to an atomizer for atomizing a substrate to be atomized;
acquiring temperature in different time periods, wherein the temperature is the temperature corresponding to the heating body of the atomizer under the energy;
and acquiring the consumption of the matrix to be atomized in each stage according to the energy and the temperature.
2. The method according to claim 1, characterized in that said step of obtaining the consumption of the substrate to be nebulized for each phase as a function of said energy and of said temperature comprises:
acquiring atomization latent heat corresponding to the temperature, wherein the atomization latent heat is energy required by unit atomization of the substrate to be atomized at the temperature;
and acquiring the consumption of the matrix to be atomized in a corresponding stage according to the energy and the atomization latent heat.
3. A method for detecting the consumption of a substrate to be nebulized according to claim 2, characterized in that said step of acquiring the temperature in time intervals comprises:
acquiring a current resistance value corresponding to the heating element;
and acquiring the temperature according to the current resistance value.
4. A method for detecting the consumption of a substrate to be nebulized according to claim 3, characterized in that said step of acquiring said temperature from said current resistance value further comprises:
acquiring a corrected resistance value according to the current resistance value and a resistance temperature curve corresponding to the previous suction;
and acquiring the temperature according to the corrected resistance value.
5. The method according to any one of claims 2 to 4, wherein the latent heat of atomization comprises a first latent heat of atomization and a second latent heat of atomization, the first latent heat of atomization is the energy required per atomization of the substrate to be atomized at different temperatures in the temperature-increasing atomization phase, and the second latent heat of atomization is the energy required per atomization of the substrate to be atomized in the constant-temperature atomization phase;
the step of obtaining the consumption of the substrate to be atomized for the corresponding phase according to the energy and the latent heat of atomization comprises:
in the temperature-rising atomization stage, the consumption of the first substrate to be atomized is obtained according to the energy and the first latent heat of atomization;
and in the constant-temperature atomization stage, acquiring the consumption of the second substrate to be atomized according to the energy and the second latent heat of atomization.
6. A method for detecting the consumption of a substrate to be nebulized according to claim 5, characterized in that said step of acquiring energy in time intervals and acquiring temperature in time intervals comprises:
acquiring the energy and the temperature every predetermined time in response to the temperature of the atomizer reaching an initial atomization temperature;
the step of obtaining the consumption of the substrate to be atomized for the corresponding phase according to the energy and the latent heat of atomization comprises:
in the temperature-rising atomization stage, acquiring the consumption of the substrate to be atomized in the preset time stage according to the energy and the first latent heat of atomization in the preset time stage;
and in the constant-temperature atomization stage, acquiring the consumption of the substrate to be atomized in the preset time stage according to the energy and the second latent heat of atomization in the preset time stage.
7. The method as claimed in claim 6, wherein the temperature of the atomizer in the predetermined time period is an average atomization temperature obtained from the highest atomization temperature and the lowest atomization temperature of the atomizer in the predetermined time period.
8. A method for detecting the consumption of a substrate to be nebulized according to claim 5, characterized in that said step of acquiring energy in time intervals and acquiring temperature in time intervals comprises:
acquiring first energy and first temperature of the temperature-raising atomization stage; and
acquiring second energy and second temperature of the constant-temperature atomization stage;
the step of obtaining consumption of the substrate to be atomized in a corresponding phase according to the energy and the latent heat of atomization comprises:
acquiring the consumption of a first substrate to be atomized in the whole temperature-rising atomization stage according to the first energy and the first latent atomization heat, wherein the first latent atomization heat is the energy required by atomizing the unit substrate to be atomized at different temperatures in the temperature-rising atomization stage; and
and acquiring the consumption of a second substrate to be atomized in the whole constant-temperature atomization stage according to the second energy and the second latent heat of atomization, wherein the second latent heat of atomization is the energy required by atomization of the substrate to be atomized in a unit in the constant-temperature atomization stage.
9. A method for detecting the consumption of a substrate to be nebulized according to claim 5, characterized in that the second latent heat of nebulization is obtained by:
obtaining a first consumption of the substrate to be atomized when the substrate to be atomized reaches the constant-temperature atomization stage at a first working time;
weighing and measuring the second consumption of the substrate to be atomized when the substrate to be atomized reaches the constant-temperature atomization stage in the second working time;
the second latent heat of atomization is obtained by dividing a difference in energy applied to the atomizer during the second time and the first time of operation by a difference in the second consumption and the first consumption.
10. A method for detecting the consumption of a substrate to be nebulized according to claim 9, characterized in that the first latent heat of nebulization is obtained by:
acquiring average atomization latent heat in a temperature-rise atomization stage;
and acquiring the first atomization latent heat according to the average atomization latent heat, the second atomization latent heat and the resistance-time relation of the heating atomization stage.
11. A method for detecting the consumption of a substrate to be nebulized according to claim 10, characterized in that the average latent heat of nebulization is obtained by:
obtaining a third consumption of the matrix to be atomized in the temperature-raising atomization stage;
and obtaining the average atomization latent heat according to the energy applied to the atomizer in the temperature-increasing atomization stage divided by the third consumption.
12. The method for detecting consumption of a substrate to be atomized according to claim 8, wherein after the step of obtaining consumption of the substrate to be atomized at each stage according to the energy and the temperature, the method further comprises:
acquiring the total consumption amount of the matrix to be atomized in the atomization process according to the consumption amount of the matrix to be atomized in each stage; wherein the total consumption of the substrate to be atomized comprises the consumption of the first substrate to be atomized and the consumption of the second substrate to be atomized.
13. An electronic atomization device, comprising:
the controller comprises an acquisition module, a storage module and a control module, wherein the acquisition module is used for acquiring the consumption of the substrate to be atomized of the electronic atomization device; the method for acquiring the consumption of the substrate to be atomized by the electronic atomization device through the acquisition module is the method as set forth in any one of claims 1 to 12.
14. The electronic atomizer device of claim 13, further comprising:
a memory for storing characteristic information of a nebulizer of the electronic nebulizing device; wherein the characteristic information comprises an initial substrate mass to be nebulized of the nebulizer;
the controller is further used for obtaining the rest amount of the to-be-atomized substrate of the atomizer according to the initial to-be-atomized substrate quality and the to-be-atomized substrate consumption of the atomizer.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110969951.XA CN115708599A (en) | 2021-08-23 | 2021-08-23 | Electronic atomization device and consumption detection method of to-be-atomized matrix thereof |
| PCT/CN2022/105779 WO2023024746A1 (en) | 2021-08-23 | 2022-07-14 | Electronic atomization device and measurement method for consumption of matrix to be atomized of electronic atomization device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110969951.XA CN115708599A (en) | 2021-08-23 | 2021-08-23 | Electronic atomization device and consumption detection method of to-be-atomized matrix thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115708599A true CN115708599A (en) | 2023-02-24 |
Family
ID=85230299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110969951.XA Pending CN115708599A (en) | 2021-08-23 | 2021-08-23 | Electronic atomization device and consumption detection method of to-be-atomized matrix thereof |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN115708599A (en) |
| WO (1) | WO2023024746A1 (en) |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2468116A1 (en) * | 2010-12-24 | 2012-06-27 | Philip Morris Products S.A. | An aerosol generating system having means for handling consumption of a liquid substrate |
| WO2017219360A1 (en) * | 2016-06-24 | 2017-12-28 | 惠州市吉瑞科技有限公司深圳分公司 | Method for controlling electronic cigarette |
| CN110720672B (en) * | 2018-07-17 | 2021-08-06 | 常州市派腾电子技术服务有限公司 | Liquid supply method and device |
| JP7204909B2 (en) * | 2018-11-30 | 2023-01-16 | 昂納自動化技術（深▲ゼン▼）有限公司 | E-cigarette control method |
| CN112438437B (en) * | 2019-09-03 | 2022-12-20 | 深圳市合元科技有限公司 | Aerosol generating system, aerosol detecting method, atomizing device, and power supply device |
| WO2021175640A1 (en) * | 2020-03-05 | 2021-09-10 | Jt International Sa | Aerosol generation device providing enhanced vaping experience |
| CN111772247A (en) * | 2020-08-13 | 2020-10-16 | 深圳市菲墨科技有限公司 | Electronic atomization device, atomization heating control method and device and atomizer main body |
| CN113170923A (en) * | 2021-05-18 | 2021-07-27 | 深圳市鹏翔半导体有限公司 | Electronic cigarette tobacco tar detection method and system |
-
2021
- 2021-08-23 CN CN202110969951.XA patent/CN115708599A/en active Pending
-
2022
- 2022-07-14 WO PCT/CN2022/105779 patent/WO2023024746A1/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2023024746A1 (en) | 2023-03-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP3249488B1 (en) | Temperature control system and control method thereof, and electronic cigarette containing said temperature control system | |
| CN108851233B (en) | Aerosol generating device and control method thereof | |
| KR102290037B1 (en) | Aerosol Generating System with Improved Aerosol Production | |
| US11901747B2 (en) | Charger for an electronic cigarette | |
| CN105027016B (en) | For controlling electric heater with the device and method of limit temperature | |
| CN108618207A (en) | Control the method and inhalator generator that aerosol generates in inhalator generator | |
| WO2021073227A1 (en) | Electronic cigarette capable of automatically preheating after pre-determination of smoking action and control method for electronic cigarette | |
| TW202310761A (en) | Anemometric-assisted control of a vaporizer and method of heat control within a vaporizer | |
| CN112469295B (en) | Aerosol generating device, method of operating aerosol generating device, and recording medium | |
| US20230141960A1 (en) | Aerosol generating device and operation method thereof | |
| EP2948763A1 (en) | Imaging for quality control in an electronic cigarette | |
| CN110121371B (en) | Electrically operated aerosol-generating system | |
| CN112469293B (en) | Aerosol generating device, method for operating aerosol generating device, and computer-readable storage medium | |
| CN112584719B (en) | Aerosol generating device and method of operating the same | |
| EP3562341A1 (en) | Electrically operated aerosol generation system | |
| US20230363454A1 (en) | Electronic smoking simulation device with resistance recording and replay | |
| CN115708599A (en) | Electronic atomization device and consumption detection method of to-be-atomized matrix thereof | |
| US20230180850A1 (en) | Non-combustible aerosol provision system | |
| JP6824449B2 (en) | Aerosol generation system with four contacts | |
| WO2023169526A1 (en) | Electronic atomization apparatus and control method for electronic atomization apparatus | |
| US20230148676A1 (en) | Aerosol generating apparatus and method of controlling the same | |
| CN117413979A (en) | Electronic atomizing device, heating control method thereof, control device and storage medium | |
| CN117204621A (en) | Atomizing assembly, atomizing device, control method, and readable storage medium | |
| CN114468381A (en) | Method and device for detecting atomizer or electronic atomization device | |
| EA043286B1 (en) | ELECTRICLY CONTROLLED AEROSOL GENERATION SYSTEM |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |