CN115656216A - Method and device for detecting surface defects of lens - Google Patents
Method and device for detecting surface defects of lens Download PDFInfo
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- CN115656216A CN115656216A CN202211181430.9A CN202211181430A CN115656216A CN 115656216 A CN115656216 A CN 115656216A CN 202211181430 A CN202211181430 A CN 202211181430A CN 115656216 A CN115656216 A CN 115656216A
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Abstract
The invention discloses a lens surface defect detection method and a device for detecting lens surface defects, which are used for a Fresnel lens, and particularly enable illumination light to irradiate a detected lens after passing through a baffle, the baffle is provided with a plurality of light-transmitting parallel slits, the illumination light irradiates the detected lens through the parallel slits to form an illumination environment with alternating light and shade, an image of the detected lens is obtained from one side of the detected lens far away from the illumination light, and the defects on the surface of the detected lens are identified in the image according to the image of the detected lens. Compared with the existing detection method, the method can enable the defects of the detected lens to be more easily shown in the obtained detected lens image, and can detect more defects on the detected lens, so that the missing detection condition of the lens surface defect detection can be reduced.
Description
Technical Field
The invention relates to the field of optical element detection, in particular to a method for detecting surface defects of a lens. The invention also relates to a device for detecting the surface defects of the lens.
Background
Fresnel lenses are common optical elements in the optical field, for example, with the development of the rear mobile internet, the application of the head-mounted VR device is more and more extensive, and fresnel lenses are important components in the VR device.
For the produced fresnel lens, it is necessary to detect whether there is a defect, such as scratch, dirt or tooth-sticking on the surface of the lens, and if the defective lens is used in an optical device, the functional effect of the optical device will be affected. According to the detection result and experience of the Fresnel lens, due to the characteristics of the Fresnel lens, the Fresnel stripes also have serious influence on the defects in the detection process, and part of the defects may not be revealed, so that only part of the defects can be detected, the detection omission is caused, and the reject ratio is high.
Disclosure of Invention
The invention aims to provide a lens surface defect detection method and a device for detecting lens surface defects, which can reduce the condition of missing detection of the lens surface defect detection.
In order to achieve the purpose, the invention provides the following technical scheme:
a lens surface defect detection method is used for a Fresnel lens and comprises the following steps:
illuminating illumination light to a detected lens after passing through a baffle, acquiring an image of the detected lens from one side of the detected lens far away from the illumination light, wherein the baffle is provided with a plurality of light-transmitting parallel slits, and the illumination light is enabled to pass through the parallel slits and be illuminated to the detected lens;
identifying defects on the surface of the detected lens in the image according to the image of the detected lens.
Optionally, the detected lens includes a first area located in the central area, the illumination light passes through the baffle and then irradiates to the first area, and the optical axis of the illumination light is parallel to the optical axis of the detected lens;
identifying defects in the detected lens surface in the image includes: in the image, a defect is identified in the surface of the first zone of the inspected lens.
Optionally, the detected lens includes a second area located in a non-central area, the illumination light passes through the baffle and then irradiates to the second area, and an included angle between an optical axis of the illumination light and an optical axis of the detected lens is greater than 0 degree;
identifying defects in the detected lens surface in the image includes: identifying, in the image, a defect in the surface of the second area of the inspected lens.
Optionally, the non-central area of the detected lens is divided into a plurality of said second areas.
Optionally, the second area is an annular area centered on the center of the detected lens, and distances from different second areas to the center of the detected lens are different.
Optionally, the detected lens is divided into a plurality of areas by a plurality of horizontal lines and a plurality of vertical lines, and the plurality of areas include a first area including the center of the detected lens and a second area not including the center of the detected lens.
Optionally, acquiring the image of the detected lens comprises: focusing and imaging any surface of the detected lens;
identifying defects in the inspected lens surface in the image comprises: in the image, a defect of the surface of the inspected lens is identified.
A device for detecting surface defects of a lens is used for a Fresnel lens and comprises a light source, a baffle and an image acquisition device;
the baffle is arranged between the light source and the detected lens, and is provided with a plurality of light-transmitting parallel slits, so that illumination light emitted by the light source is irradiated to the detected lens through the parallel slits of the baffle;
the image acquisition device is arranged on one side of the detected lens far away from the illumination light and is used for acquiring an image of the detected lens from one side of the detected lens far away from the illumination light so as to identify the defect on the surface of the detected lens in the image according to the image of the detected lens.
Optionally, the width of the slit of the baffle is equal to the width of the space between two adjacent slits.
Optionally, the image of the detected lens is acquired by an optical lens, an optical axis extension line of the optical lens passes through the slit of the baffle, or an optical axis extension line of the optical lens passes through a portion between two adjacent slits of the baffle.
According to the technical scheme, the method for detecting the surface defects of the lens is used for the Fresnel lens, specifically, the illumination light is irradiated to the detected lens after passing through the baffle, the baffle is provided with the plurality of light-transmitting parallel slits, the illumination light is irradiated to the detected lens through the parallel slits to form an illumination environment with alternating light and shade, the image of the detected lens is obtained from the side, away from the illumination light, of the detected lens, and then the defects of the surface of the detected lens are identified in the image according to the image of the detected lens. Compared with the existing detection method, the method can enable the defects of the detected lens to be more easily shown in the obtained detected lens image, and can detect more defects on the detected lens, so that the missing detection condition of the lens surface defect detection can be reduced.
The device for detecting the surface defects of the lens can achieve the beneficial effects.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a flow chart of a method for detecting defects on a surface of a lens according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a method for detecting surface defects of a lens according to an embodiment of the present invention;
FIG. 3 is a schematic view of lens inspection using an apparatus for lens surface defect inspection according to an embodiment of the present invention;
FIG. 4 is a side cross-sectional view of a Fresnel lens according to one embodiment of the present invention;
FIG. 5 is a schematic diagram illustrating a detected lens being divided into a plurality of regions according to an embodiment of the invention;
FIG. 6 is a schematic view of another lens inspection using an apparatus for lens surface defect inspection according to an embodiment of the present invention;
FIG. 7 is a schematic diagram of a lens to be inspected being divided into a plurality of areas according to another embodiment of the present invention;
FIG. 8-1 is a schematic diagram illustrating an extended line of an optical axis of an optical lens passing through a slit of a baffle during a detection process according to an embodiment of the invention;
FIG. 8-2 is a schematic view of an image obtained by focusing imaging of the surface of the inspected lens in the manner shown in FIG. 8-1;
FIG. 9-1 is a schematic diagram of a portion of an extended line of an optical axis of an optical lens passing through a gap between two adjacent slits of a barrier during detection according to another embodiment of the present invention;
fig. 9-2 is a schematic view of an image obtained by focusing and imaging the surface of the lens to be inspected in the manner shown in fig. 9-1.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The inventor can know that the surface of the Fresnel lens has a sawtooth structure and a certain curvature due to the characteristics of the Fresnel lens, the Fresnel stripes generated in the detection process can have serious influence on the defects, and part of the defects can not be shown, but the Fresnel stripes cannot be well removed in the prior art, so that only part of the defects can be detected, the missed detection is caused, and the reject ratio is high. In view of the above, the present invention provides a method and an apparatus for detecting surface defects of a lens, which form an illumination environment with alternating light and shade on a lens to be detected and acquire an image of the lens to be detected.
Referring to fig. 1, fig. 1 is a flowchart of a method for detecting surface defects of a lens according to the present embodiment, and as shown in the figure, the method for detecting surface defects of a lens for a fresnel lens includes the following steps:
s11: the method comprises the steps of enabling illuminating light to penetrate through a baffle and then irradiate the detected lens, obtaining an image of the detected lens from one side, far away from the illuminating light, of the detected lens, and enabling the illuminating light to penetrate through the parallel slits and irradiate the detected lens.
Referring to fig. 2, fig. 2 is a schematic view of a method for detecting surface defects of a lens according to this embodiment, a baffle 101 is disposed on one side of a detected lens 100, illumination light passes through the baffle 101 and then irradiates the detected lens 100, and an image of the detected lens 100 is obtained from the other side of the detected lens 100.
The baffle 101 is provided with a plurality of light-transmitting parallel slits, when the illumination light reaches the baffle 101, at least part of the light can transmit when the illumination light irradiates the parallel slits of the baffle 101, and the light is shielded when the illumination light irradiates the intervals between the parallel slits on the baffle 101, so that the illumination light forms a light irradiation environment with alternating light and shade after passing through the baffle 101 and irradiates the detected lens 100.
S12: identifying defects on the surface of the detected lens in the image according to the image of the detected lens.
Compared with the existing detection method, the lens surface defect detection method of the embodiment can enable the defects of the detected lens to be more easily shown in the obtained detected lens image, and can detect more defects on the detected lens, so that the missing detection condition of the lens surface defect detection can be reduced.
The inspected eyeglass 100 generally comprises a plurality of surfaces, and each surface of the inspected eyeglass 100 can be inspected separately. Specifically, acquiring an image of the inspected lens 100 includes: focusing and imaging any surface of the detected lens 100. Accordingly, identifying defects in the surface of the inspected lens 100 in the image includes: in the image, the surface defects of the inspected lens 100 are identified. For example, when the illumination light is irradiated to the inspection lens 100, an image of the upper surface of the inspection lens 100 is focused and formed to obtain an image of the upper surface, whether or not a defect exists on the surface of the inspection lens 100 is checked based on the image of the upper surface, and if a defect exists, the defect is recognized.
In some embodiments, the lens 100 to be inspected includes a first area located in the central area, and the illumination light passes through the baffle 101 and then irradiates the first area, and the optical axis of the illumination light is parallel to the optical axis of the lens 100 to be inspected. Accordingly, identifying defects in the surface of the inspected lens 100 in the image includes: in the image, defects are identified in the first zone surface of the inspected lens 100. Referring to fig. 3, fig. 3 is a schematic diagram of lens inspection using the apparatus for lens surface defect inspection provided in this embodiment, as shown in the figure, the optical axis of the light source 102 is parallel to the optical axis of the inspected lens 100, so that the optical axis of the illumination light emitted by the light source 102 is parallel to the optical axis of the inspected lens 100.
For the Fresnel lens, one surface of the Fresnel lens is engraved with small-to-large concentric circular insections, and the other surface of the Fresnel lens is a smooth curved surface which is spherical or aspheric. Referring to fig. 4, fig. 4 is a side cross-sectional view of an embodiment of a fresnel lens, wherein the first surface 104 of the lens is smooth and the second surface 105 is indented according to the requirements of light interference and interference, relative sensitivity and acceptance angle. The curvatures of the central and edge regions of the same surface of the fresnel lens may differ and the edge region of the lens is thinner. Referring to fig. 5, fig. 5 is a schematic diagram illustrating the lens to be inspected being divided into a plurality of areas in an embodiment, as shown in the figure, the lens to be inspected 100 is divided into a first area (i.e., area a in the figure) and a plurality of second areas (including area B and area C in the figure), the first area (i.e., area a) is located in a central area of the lens to be inspected 100, and the second area is an annular area centered on the center of the lens to be inspected 100. For the first area, i.e. the a area, of the lens 100 to be inspected, the defect of the first area can be detected by the method described in the above embodiment. More specifically, for a first area, namely an area a, of the detected lens 100, a surface of the area a engraved with insections can be focused and imaged, and a defect condition of the surface of the area a can be detected according to the obtained image; in addition, another smooth surface of the A area can be focused and imaged, and the defect condition of the smooth surface of the A area can be detected according to the obtained image.
In other embodiments, the inspected lens 100 includes a second area located in a non-central area, the illumination light passes through the baffle 101 and then irradiates the second area, and an angle between an optical axis of the illumination light and an optical axis of the inspected lens 100 is greater than 0 degree. Accordingly, identifying defects in the surface of the inspected lens 100 in the image includes: in the image, defects are identified on the surface of the second zone of the inspected lens 100. Referring to fig. 6, fig. 6 is another exemplary schematic diagram of lens detection using the apparatus for detecting surface defects of a lens provided in this embodiment, as shown in the figure, an optical axis of the light source 102 is not parallel to an optical axis of the lens 100 to be detected, and an included angle between the two is greater than 0 degree, so that an optical axis of illumination light emitted by the light source 102 is not parallel to the optical axis of the lens 100 to be detected, and the illumination light is obliquely irradiated to the lens 100 to be detected.
The curvatures of the central and edge regions of the same surface of the fresnel lens may differ and the edge region of the lens is thinner. The inventor finds that if the non-central area of the lens 100 is detected, the optical axis of the illumination light is parallel to the optical axis of the lens 100, the non-central area of the lens 100 is dark in the acquired image, and the defect on the lens surface cannot be displayed. In contrast, when detecting the non-central area of the detected lens 100, if the included angle between the optical axis of the illumination light and the optical axis of the detected lens 100 is set to be greater than 0 degree, the illumination light is obliquely irradiated to the detected lens 100, and the obtained image is clearer.
In this embodiment, the size of the included angle between the optical axis of the illumination light and the optical axis of the detected lens 100 is determined by the surface curvature of the second area and the angle of the insection disposed in the second area. The angle of the insection can be understood as the angle between the line connecting the top end and the bottom end of the insection and the normal direction of the surface of the lens. During detection, the size of the included angle between the optical axis of the illumination light and the optical axis of the detected lens 100 is required to make the defects on the surface of the second area appear as clearly as possible in the acquired image. In practical applications, for a certain non-central area of the lens, an appropriate angle can be found through multiple experiments and multiple adjustments of an included angle between the optical axis of the illumination light and the optical axis of the detected lens 100.
Further preferably, the non-central area of the lens 100 to be inspected can be divided into a plurality of said second areas, the non-central area of the lens 100 to be inspected is relatively large, and the surface curvatures may be different at different positions, and by dividing into a plurality of areas, the respective second areas of the lens 100 to be inspected can be respectively inspected sequentially. In this embodiment, the number of the second areas into which the non-central area of the detected lens 100 is divided is not limited, and in practical application, the number of the second areas can be determined according to the size and the curvature of the detected lens 100. For different second areas on the lens to be detected 100, the size of the included angle between the optical axis of the illumination light and the optical axis of the lens to be detected 100 during detection may be different.
In some embodiments, the first area is an area including the center of the inspected lens 100, the second area may be an annular area centered at the center of the inspected lens 100, and different distances from the center of the inspected lens 100 are different in different second areas. Referring to fig. 5, the detected lens 100 is divided into two second areas, including a B area and a C area, where the B area is located outside the a area, and the C area is located outside the B area. For the B area and the C area of the detected lens 100, imaging and detection can be performed by obliquely irradiating the illumination light.
In other embodiments, the inspected lens 100 may be divided into a plurality of areas by a plurality of horizontal lines and a plurality of vertical lines, and the plurality of areas includes a first area including the center of the inspected lens 100 and a second area not including the center of the inspected lens 100. Referring to fig. 7, fig. 7 is a schematic diagram illustrating a detected lens is divided into a plurality of areas in a further embodiment, and as shown in the figure, the detected lens 100 is divided into nine areas by two horizontal lines and two vertical lines, wherein the first area is included in the center of the detected lens 100. The remaining eight are the second zones, including zone 1 through zone 8. The areas 1 to 8 are each illuminated so that the optical axis of the illumination light is inclined with respect to the optical axis of the lens to be detected 100.
The device for detecting the surface defects of the lens provided by the embodiment is used for a fresnel lens, and can refer to fig. 3 or fig. 6, and the device comprises a light source 102, a baffle 101 and an image acquisition device 103;
the baffle 101 is arranged between the light source 102 and the detected lens 100, the baffle 101 is provided with a plurality of light-transmitting parallel slits, and illumination light emitted by the light source 102 is irradiated to the detected lens 100 through the parallel slits of the baffle 101;
the image acquisition device 103 is disposed on a side of the detected lens 100 away from the illumination light, and is configured to acquire an image of the detected lens 100 from the side of the detected lens 100 away from the illumination light, so as to identify a defect on the surface of the detected lens 100 in the image according to the image of the detected lens 100.
Compared with the existing detection method, the device for detecting the surface defects of the lens can enable the defects of the detected lens to be more easily shown in the obtained detected lens image, so that more defects on the detected lens can be detected, and the condition of missing detection of the surface defects of the lens can be reduced.
In this embodiment, the type and structure of the light source 102 are not limited, the wavelength range of the illumination light is not limited, and blue light is preferably used, so that the defect on the lens is better revealed.
Preferably, the width of the slits of the baffle 101 is equal to the width of the space between two adjacent slits, so that illumination light forms an illumination intensity distribution with alternating light and dark after passing through the baffle 101, and the illumination intensity distribution is relatively uniform. In this embodiment, the width of the slit on the baffle 101 and the width of the space between two adjacent slits are not specifically limited, and in practical applications, the width of the slit on the baffle 101 and the width of the space between two adjacent slits are such that a defect can be clearly shown as much as possible in an acquired image.
Alternatively, an image of the inspected eyeglass 100 may be acquired by an optical lens at the time of inspection, an optical axis extended line of the optical lens passing through the slit of the barrier 101, or an optical axis extended line of the optical lens passing through a portion between two adjacent slits of the barrier 101. Exemplary reference may be made to fig. 8-1 and 8-2, where fig. 8-1 is a schematic diagram of an embodiment in which an extended optical axis line of an optical lens passes through a slit of a baffle during inspection, fig. 8-2 is a schematic diagram of an image obtained by focusing and imaging a surface of an inspected lens in a manner shown in fig. 8-1, fig. 9-1 and 9-2 are schematic diagrams of an embodiment in which an extended optical axis line of an optical lens passes through a portion between two adjacent slits of a baffle during inspection, and fig. 9-2 is a schematic diagram of an image obtained by focusing and imaging a surface of an inspected lens in a manner shown in fig. 9-1. An extended line of the optical axis of the optical lens 106 passes through the slits of the barrier 101 in fig. 8-1, and an extended line of the optical axis of the optical lens 106 passes through a portion between two adjacent slits of the barrier 101 in fig. 9-1. Comparing fig. 8-2 and fig. 9-2, it can be seen that the gray scale display of the bright and dark stripes in the acquired images is just opposite in the two modes, and the appearance effect of the defects in the two images is not much different under the same other conditions. In practical applications, both of these two ways of acquiring images may be used.
In addition, in this embodiment, as to the specific implementation of the method for polishing different areas of the detected lens 100 and the specific implementation of the method for detecting different surfaces of the detected lens 100, reference may be made to the above detailed description of the implementation of the method for detecting the surface defect of the lens, and details are not repeated here.
The method and apparatus for detecting surface defects of a lens provided by the present invention are described in detail above. The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
Claims (10)
1. A method for detecting surface defects of a lens is used for a Fresnel lens, and is characterized by comprising the following steps:
illuminating illumination light to a detected lens after passing through a baffle plate, acquiring an image of the detected lens from one side of the detected lens far away from the illumination light, wherein the baffle plate is provided with a plurality of light-transmitting parallel slits, and the illumination light is irradiated to the detected lens through the parallel slits;
identifying defects on the surface of the detected lens in the image according to the image of the detected lens.
2. The method for detecting defects on the surface of a lens according to claim 1, wherein the lens to be detected includes a first area located in the central area, the illumination light is irradiated to the first area through the baffle, and the optical axis of the illumination light is parallel to the optical axis of the lens to be detected;
identifying defects in the inspected lens surface in the image comprises: in the image, a defect is identified in the surface of the first zone of the inspected lens.
3. The method for detecting the surface defects of the lens according to claim 1, wherein the lens to be detected comprises a second area located in a non-central area, the illumination light passes through the baffle and then irradiates the second area, and an included angle between an optical axis of the illumination light and an optical axis of the lens to be detected is greater than 0 degree;
identifying defects in the inspected lens surface in the image comprises: identifying, in the image, a defect in the surface of the second area of the inspected lens.
4. The method of claim 3, wherein the non-central area of the inspected lens is divided into a plurality of the second areas.
5. The method of claim 4, wherein the second area is an annular area centered on the center of the inspected lens, and the distances from the center of the inspected lens to the different second areas are different.
6. The lens surface defect detection method according to claim 3, wherein the inspected lens is divided into a plurality of areas by a plurality of horizontal lines and a plurality of vertical lines, the plurality of areas including a first area including a center of the inspected lens and the second area not including the center of the inspected lens.
7. The method of any one of claims 1 to 6, wherein acquiring an image of the inspected lens comprises: focusing and imaging any surface of the detected lens;
identifying defects in the inspected lens surface in the image comprises: in the image, a defect of the surface of the inspected lens is identified.
8. A device for detecting surface defects of a lens is used for a Fresnel lens and is characterized by comprising a light source, a baffle and an image acquisition device;
the baffle is arranged between the light source and the detected lens, and is provided with a plurality of light-transmitting parallel slits, so that illumination light emitted by the light source is irradiated to the detected lens through the parallel slits of the baffle;
the image acquisition device is arranged on one side of the detected lens far away from the illumination light and is used for acquiring an image of the detected lens from one side of the detected lens far away from the illumination light so as to identify the defect on the surface of the detected lens in the image according to the image of the detected lens.
9. The apparatus of claim 8, wherein the width of the slit of the baffle is equal to the width of the space between two adjacent slits.
10. The apparatus for surface defect inspection of lenses according to claim 8, wherein the image of the inspected lens is acquired by an optical lens, an optical axis extension line of the optical lens passes through the slits of the baffle, or an optical axis extension line of the optical lens passes through a portion between two adjacent slits of the baffle.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202211181430.9A CN115656216A (en) | 2022-09-27 | 2022-09-27 | Method and device for detecting surface defects of lens |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211181430.9A CN115656216A (en) | 2022-09-27 | 2022-09-27 | Method and device for detecting surface defects of lens |
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| CN115656216A true CN115656216A (en) | 2023-01-31 |
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| CN202211181430.9A Pending CN115656216A (en) | 2022-09-27 | 2022-09-27 | Method and device for detecting surface defects of lens |
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| CN (1) | CN115656216A (en) |
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