CN115649856A - Testing device capable of simultaneously testing multiple chips to be tested - Google Patents
Testing device capable of simultaneously testing multiple chips to be tested Download PDFInfo
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- CN115649856A CN115649856A CN202211552750.0A CN202211552750A CN115649856A CN 115649856 A CN115649856 A CN 115649856A CN 202211552750 A CN202211552750 A CN 202211552750A CN 115649856 A CN115649856 A CN 115649856A
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- 238000012360 testing method Methods 0.000 title claims abstract description 43
- 238000001514 detection method Methods 0.000 claims abstract description 24
- 210000000078 claw Anatomy 0.000 claims abstract description 20
- 210000000245 forearm Anatomy 0.000 claims description 11
- 239000000523 sample Substances 0.000 claims description 8
- 238000009434 installation Methods 0.000 claims description 7
- 230000006978 adaptation Effects 0.000 claims description 3
- 238000004804 winding Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 9
- 230000008569 process Effects 0.000 description 9
- 230000006872 improvement Effects 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000001174 ascending effect Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
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Abstract
The invention provides a testing device capable of testing a plurality of chips to be tested simultaneously, which relates to the technical field of chip detection and comprises a support and a back frame, wherein a support plate is arranged on the front side of the back frame, a first conveying part and a second conveying part are arranged on the support, the first conveying part bypasses the support plate, the second conveying part bypasses the lower part of the support, a clamping claw is arranged on the outer side of the first conveying part, and a positioning groove is arranged on the outer side of the second conveying part; a motor is arranged above the front side of the back frame, and a first support arm is arranged at the output end of the motor; the chip testing device comprises a positioning rod, a rear shaft arm, a front arm, a detection block, a sliding rod, a rear shaft arm, a rotating shaft, a front arm, a rear arm, a front arm and a rear arm, wherein the positioning rod is arranged in the guide groove.
Description
Technical Field
The invention relates to the technical field of chip detection, in particular to a testing device capable of testing a plurality of chips to be tested simultaneously.
Background
With the growth of emerging industries such as mobile internet, cloud computing, internet of things, big data and the like, the electronic information industry enters a new development stage, a large number of emerging electronic technologies are integrated for control, communication, man-machine interaction, network interconnection and the like, the functions of equipment are more and more complex, the integration level of a system is more and more complex, and the development of the emerging electronic information technology depends on continuous promotion of the semiconductor industry, so that a chip is used as a core technology, the use of the chip becomes more and more frequent and important, the chip generally refers to an integrated circuit carrier and is formed by separating wafers, and also refers to the result of the integrated circuit after design, manufacture, packaging and testing, after the mass production of the chip is completed, the chip needs to be detected, if a computer CPU needs to test whether the chip can be lightened, so that unqualified chips are selected, and qualified chips are reserved;
in the prior art, because a plurality of chips need to be tested and all the chips need to be conveyed to a test area, manual testing is needed in the conveying process, or an automatic detection instrument is adopted to test the chips on one assembly line, and generally each automatic instrument can only measure one assembly line, so that the efficiency is insufficient.
Disclosure of Invention
In view of the above problems, the present invention provides a testing apparatus capable of testing a plurality of chips to be tested simultaneously, which can test the chips to be tested of a plurality of production lines simultaneously, thereby improving efficiency.
In order to realize the purpose of the invention, the invention is realized by the following technical scheme: a testing device capable of testing a plurality of chips to be tested simultaneously comprises a support and a back frame, wherein a support plate is arranged on the front side of the back frame, a first conveying part and a second conveying part are arranged on the support, the first conveying part bypasses the support plate, the second conveying part bypasses the lower part of the support, a clamping claw is arranged on the outer side of the first conveying part, and a positioning groove is arranged on the outer side of the second conveying part;
the top of back of the body frame front side is equipped with the motor, and the output of motor is equipped with first support arm, it has the second support arm to articulate under the first support arm, the inside movable mounting of extension board has the slide bar, the below and the slide bar upper end of second support arm are articulated, and the lower extreme of slide bar is equipped with the sleeve pipe, the intraductal rotation of cover is equipped with the pivot, and the front side of pivot is equipped with the forearm, the forearm has the detection piece, the rear end of pivot is equipped with the rear axle arm, and the top of rear axle arm rear end is equipped with the locating lever, the below of support front side is equipped with the installation piece, and is equipped with the guide way on the installation piece, the locating lever extends to the inside of guide way.
The further improvement is that: the one end of back of the body frame is equipped with industry control display, the bottom of detecting the piece is equipped with the probe, the probe is used for detecting the chip, industry control display and detection piece electric connection for show the testing result.
The further improvement is that: first conveying part includes first beam barrel and first belt, first beam barrel is equipped with two sets ofly, and two sets ofly first beam barrel rotates the upper end of installing in the inside both sides of support respectively, first beam barrel passes through motor drive, first belt is around establishing two sets ofly on the first beam barrel.
The further improvement is that: the supporting plate is inserted to the inner side of the first belt, the plurality of groups of clamping claws are arranged, and the plurality of groups of clamping claws are arranged on the outer side of the first belt at equal intervals.
The further improvement lies in that: the gripper jaw includes motor and axletree board, the both sides of motor all are equipped with the axletree board, and both sides all rotate on the axletree board and be equipped with the axle piece, two sets of the inboard of axle piece all rotates and is equipped with the switching piece, and two sets of the inboard below of switching piece all is equipped with the grip block.
The further improvement is that: two sets of it is connected with the connecting block to change the articulated between the piecing blocks, and the inboard of connecting block is equipped with the screw hole, the output of motor is equipped with the lead screw, and lead screw and screw hole looks adaptation.
The further improvement lies in that: the second conveying part comprises a second shaft roller and a second belt, the second shaft roller is provided with two groups, the second shaft roller is respectively rotated to be provided with the lower sides of the two sides inside the support, the second shaft roller is driven by a motor, and the second belt is wound on the outer sides of the second shaft roller.
The further improvement is that: the constant head tank is established in the outside of second belt, and the constant head tank equidistance is equipped with the multiunit and is, the lower end plate of support is inserted and is established the inboard of going into the second belt.
The further improvement lies in that: the inside one end of support is equipped with the backup pad, and is equipped with electric telescopic handle in the backup pad, electric telescopic handle's output is equipped with the first board of placing, the below of backup pad is equipped with the second and places the board.
The invention has the beneficial effects that:
1. the invention tests the chip by the detecting block, when testing, the chip is clamped by the clamping claw of the first conveying part for conveying, the chip is placed in the positioning groove of the second conveying part for conveying, in the process, the first supporting arm is driven to rotate by the rotation of the motor, the upper end of the second supporting arm is pulled to rotate around the axis of the motor, so that the sliding rod is pulled to ascend and descend, in the process of ascending of the sliding rod, the sleeve is pulled to ascend, so that the positioning rod moves in the guide groove, when removing the closed angle department to the guide way, rotatory to the locating lever direction for the rear axle arm is rotatory, thereby drives the forearm rotation through the pivot, makes to survey the piece upwards, and the bottom contact of the chip that the contact gripper held detects, and after the slide bar descends, the forearm resets, surveys the piece downwards, detects the chip top contact of placing on the constant head tank, thereby can test the chip that awaits measuring of a plurality of assembly lines simultaneously, raises the efficiency.
2. When the chip placing device is used for loading, the first placing plate and the second placing plate are used for placing chips respectively, the first placing plate can be pushed to rise through the electric telescopic rod, so that the stacked chips are sent to the jaw openings of the clamping jaws, automatic clamping and loading are facilitated, the chips on the second placing plate can be manually placed into the positioning grooves, manual operation is only needed, the labor intensity of operators is greatly reduced, and the chip placing device is more convenient to use.
Drawings
FIG. 1 is a front view of the present invention;
FIG. 2 is a schematic view of the structure of the back frame of the present invention;
FIG. 3 is a schematic view of a guide slot of the present invention;
FIG. 4 is a schematic view of a connection structure of the rotating shaft according to the present invention;
FIG. 5 is a schematic view of a clamping jaw of the present invention;
FIG. 6 is a schematic view of the structure at position A of the present invention.
Wherein: 1. a support; 2. a back frame; 3. a support plate; 4. a gripper jaw; 5. positioning a groove; 6. a motor; 7. a first support arm; 8. a second support arm; 9. a slide bar; 10. a sleeve; 11. a rotating shaft; 12. a forearm; 13. detecting a block; 14. a rear axle arm; 15. positioning a rod; 16. mounting blocks; 17. a guide groove; 18. an industrial control display; 19. a first beam barrel; 20. a first belt; 21. a motor; 22. a shaft plate; 23. a shaft block; 24. a transfer block; 25. a clamping block; 26. connecting blocks; 27. a screw shaft; 28. a second shaft roller; 29. a second belt; 30. a support plate; 31. an electric telescopic rod; 32. a first placing plate; 33. and a second placing plate.
Detailed Description
For the purpose of enhancing understanding of the present invention, the present invention will be further described in detail with reference to the following examples, which are provided for illustration only and are not intended to limit the scope of the present invention.
Example one
As shown in fig. 1, 2, 3, 4, and 5, the present embodiment provides a testing apparatus capable of testing a plurality of chips to be tested simultaneously, including a support 1 and a back frame 2, a support plate 3 is disposed on a front side of the back frame 2, a first conveying portion and a second conveying portion are disposed on the support 1, the first conveying portion bypasses the support plate 3, the second conveying portion bypasses a lower portion of the support 1, a clamping claw 4 is disposed on an outer side of the first conveying portion, and a positioning groove 5 is disposed on an outer side of the second conveying portion; the back frame 2 can be fixed on the wall at the rear;
the top of 2 front sides of back of the body frame is equipped with motor 6, and motor 6's output is equipped with first support arm 7, it has second support arm 8 to articulate under the first support arm 7, the inside movable mounting of extension board 3 has slide bar 9, the below and the slide bar 9 upper end of second support arm 8 are articulated, and the lower extreme of slide bar 9 is equipped with sleeve pipe 10, the rotation of sleeve pipe 10 is equipped with pivot 11, and the front side of pivot 11 is equipped with forearm 12, forearm 12 has detection piece 13, the rear end of pivot 11 is equipped with rear axle arm 14, and the top of rear axle arm 14 rear end is equipped with locating lever 15, the below of 1 front side of support is equipped with installation piece 16, and is equipped with guide way 17 on the installation piece 16, locating lever 15 extends to the inside of guide way 17. When the device is used, a chip is tested through the detection block 13, during testing, the chip is clamped by the clamping claw 4 of the first conveying part and is conveyed, the chip is placed in the positioning groove 5 of the second conveying part and is conveyed, in the process, the first support arm 7 is driven to rotate through the rotation of the motor 6, the upper end of the second support arm 8 is pulled to rotate around the axis of the motor 6, so that the slide rod 9 is pulled to ascend and descend, the sleeve pipe 10 is pulled to ascend in the lifting process of the slide rod 9, the positioning rod 15 moves in the guide groove 17, when the positioning rod 15 moves to the sharp corner of the guide groove 17, the positioning rod 15 is guided to rotate, the rear shaft arm 14 rotates, the front arm 12 is driven to rotate through the rotating shaft 11, the detection block 13 is made to ascend, the bottom contact of the chip clamped by the clamping claw 4 is contacted, after the slide rod 9 descends, the front arm 12 resets, the detection block 13 descends, the top contact of the chip placed on the positioning groove 5 is detected, and therefore chips to be tested of a plurality of assembly lines can be tested simultaneously.
One end of the back frame 2 is provided with an industrial control display 18, the bottom of the detection block 13 is provided with a probe, the probe is used for detecting a chip, and the industrial control display 18 is electrically connected with the detection block 13 and used for displaying a detection result. When in use, the probe contacts the chip to detect whether the chip can be lighted (similar to the probe contacting CPU on the computer mainboard, the prior art is used for detecting whether the chip can be lighted), and the detection result is displayed on the industrial control display 18.
First conveying part includes first beam barrel 19 and first belt 20, first beam barrel 19 is equipped with two sets ofly, and two sets ofly first beam barrel 19 rotates the upper end of installing in the inside both sides of support 1 respectively, first beam barrel 19 passes through motor drive, first belt 20 is around establishing two sets of on the first beam barrel 19. The support plate 3 is inserted into the inner side of the first belt 20, a plurality of groups of clamping claws 4 are arranged, and the groups of clamping claws 4 are equidistantly arranged on the outer side of the first belt 20. In use, the first shaft roller 19 rotates to drive the first belt 20 to move, so that the clamping claw 4 moves to clamp the chip to the detection position. The support plate 3 is inserted to the inner side of the first belt 20, can support the lower surface of the first belt 20, and improves stability during detection.
The second conveying part comprises a second shaft roller 28 and a second belt 29, the second shaft roller 28 is provided with two groups, the second shaft roller 28 rotates respectively to be provided with the lower sides of the two sides inside the support 1, the second shaft roller 28 is driven by a motor, and the second belt 29 is wound on the outer sides of the second shaft roller 28. The outside at second belt 29 is established to constant head tank 5, and constant head tank 5 equidistance is equipped with the multiunit and is, the inboard of establishing into second belt 29 is inserted to the lower terminal plate of support 1. During the use, the second axis roller 28 is rotatory to be driven the motion of second belt 29, carries the chip in the constant head tank 5 to detect the department, and the lower terminal plate of support 1 inserts the inboard of establishing into second belt 29 to support the upper surface of second belt 29, improve and detect stability.
Example two
As shown in fig. 1, 2, 3, 4, and 6, the present embodiment provides a testing apparatus capable of testing a plurality of chips to be tested simultaneously, including a support 1 and a back frame 2, a support plate 3 is disposed on a front side of the back frame 2, a first conveying portion and a second conveying portion are disposed on the support 1, the first conveying portion bypasses the support plate 3, the second conveying portion bypasses a lower portion of the support 1, a clamping claw 4 is disposed on an outer side of the first conveying portion, and a positioning groove 5 is disposed on an outer side of the second conveying portion; the back frame 2 can be fixed on the wall at the rear;
the top of 2 front sides of back of the body frame is equipped with motor 6, and motor 6's output is equipped with first support arm 7, it has second support arm 8 to articulate under the first support arm 7, the inside movable mounting of extension board 3 has slide bar 9, the below and the slide bar 9 upper end of second support arm 8 are articulated, and the lower extreme of slide bar 9 is equipped with sleeve pipe 10, the rotation of sleeve pipe 10 is equipped with pivot 11, and the front side of pivot 11 is equipped with forearm 12, forearm 12 has detection piece 13, the rear end of pivot 11 is equipped with rear axle arm 14, and the top of rear axle arm 14 rear end is equipped with locating lever 15, the below of 1 front side of support is equipped with installation piece 16, and is equipped with guide way 17 on the installation piece 16, locating lever 15 extends to the inside of guide way 17. When the device is used, a chip is tested through the detection block 13, during testing, the chip is clamped by the clamping claw 4 of the first conveying part and is conveyed, the chip is placed in the positioning groove 5 of the second conveying part and is conveyed, in the process, the first support arm 7 is driven to rotate through the rotation of the motor 6, the upper end of the second support arm 8 is pulled to rotate around the axis of the motor 6, so that the slide rod 9 is pulled to ascend and descend, the sleeve pipe 10 is pulled to ascend in the lifting process of the slide rod 9, the positioning rod 15 moves in the guide groove 17, when the positioning rod 15 moves to the sharp corner of the guide groove 17, the positioning rod 15 is guided to rotate, the rear shaft arm 14 rotates, the front arm 12 is driven to rotate through the rotating shaft 11, the detection block 13 is made to ascend, the bottom contact of the chip clamped by the clamping claw 4 is contacted, after the slide rod 9 descends, the front arm 12 resets, the detection block 13 descends, the top contact of the chip placed on the positioning groove 5 is detected, and therefore chips to be tested of a plurality of assembly lines can be tested simultaneously.
The support comprises a support frame 1 and is characterized in that a support plate 30 is arranged at one end inside the support frame 1, an electric telescopic rod 31 is arranged on the support plate 30, a first placing plate 32 is arranged at the output end of the electric telescopic rod 31, and a second placing plate 33 is arranged below the support plate 30. In the material loading, place board 33 through first placing board 32, second and place the chip respectively, can promote first placing board 32 through electric telescopic handle 31 and rise to send the chip of stacking to gripper jaw 4's claw mouth department, the automatic centre gripping material loading of being convenient for, the chip that the second was placed on board 33 can be placed into positioning groove 5 by the manual work, the manual work only need operate this step can, operating personnel's intensity of labour has significantly reduced, it is more convenient to use.
The invention tests the chip through the detecting block 13, during the test, the chip is clamped by the clamping claw 4 of the first conveying part to be conveyed, the chip is placed in the positioning groove 5 of the second conveying part to be conveyed, in the process, the motor 6 rotates to drive the first support arm 7 to rotate, the upper end of the second support arm 8 is pulled to rotate around the axis of the motor 6, so as to pull the slide rod 9 to ascend and descend, in the ascending process of the slide rod 9, the sleeve 10 is pulled to ascend, so that the positioning rod 15 moves in the guide groove 17, when the positioning rod 15 moves to the sharp corner of the guide groove 17, the positioning rod 15 is guided to rotate, so that the rear shaft arm 14 rotates, so as to drive the front arm 12 to rotate through the rotating shaft 11, so that the detecting block 13 ascends, contacts the bottom contact of the chip clamped by the clamping claw 4 to detect, when the slide rod 9 descends, the front arm 12 resets, the detecting block 13 descends, and detects the top contact of the chip placed on the positioning groove 5, thereby simultaneously testing chips of a plurality of assembly lines can be tested, and the efficiency is improved. In addition, when the chip placing device is used for loading, the first placing plate 32 and the second placing plate 33 are used for placing chips respectively, the first placing plate 32 can be pushed to ascend through the electric telescopic rod 31, so that the stacked chips are sent to the jaw openings of the clamping jaws 4, automatic clamping and loading are facilitated, the chips on the second placing plate 33 can be manually placed into the positioning grooves 5, only the step of manual operation is needed, the labor intensity of operators is greatly reduced, and the chip placing device is more convenient to use.
The foregoing shows and describes the general principles, principal features and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (9)
1. The utility model provides a can test a plurality of testing arrangement who awaits measuring the chip simultaneously, includes support (1) and back of the body frame (2), its characterized in that: a support plate (3) is arranged on the front side of the back frame (2), a first conveying part and a second conveying part are arranged on the support (1), the first conveying part bypasses the support plate (3), the second conveying part bypasses the lower part of the support (1), a clamping claw (4) is arranged on the outer side of the first conveying part, and a positioning groove (5) is arranged on the outer side of the second conveying part;
the top of back of the body frame (2) front side is equipped with motor (6), and the output of motor (6) is equipped with first support arm (7), it has second support arm (8) to articulate under first support arm (7), the inside movable mounting of extension board (3) has slide bar (9), the below and slide bar (9) upper end of second support arm (8) are articulated, and the lower extreme of slide bar (9) is equipped with sleeve pipe (10), sleeve pipe (10) internal rotation is equipped with pivot (11), and the front side of pivot (11) is equipped with forearm (12), forearm (12) have detection piece (13), the rear end of pivot (11) is equipped with rear axle arm (14), and the top of rear axle arm (14) rear end is equipped with locating lever (15), the installation piece (16) of support (1) front side is equipped with guide way (17) below, locating lever (15) extend to the inside of guide way (17).
2. The device of claim 1, wherein the device is capable of testing a plurality of chips under test simultaneously, and comprises: one end of the back frame (2) is provided with an industrial control display (18), the bottom of the detection block (13) is provided with a probe, the probe is used for detecting a chip, and the industrial control display (18) is electrically connected with the detection block (13) and used for displaying a detection result.
3. The device of claim 1, wherein the device is capable of testing a plurality of chips under test simultaneously, and comprises: first conveying part includes first beam barrel (19) and first belt (20), first beam barrel (19) are equipped with two sets ofly, and two sets ofly first beam barrel (19) rotate respectively and install the upper end in support (1) inside both sides, motor drive is passed through in first beam barrel (19), first belt (20) are around establishing two sets ofly on first beam barrel (19).
4. The device as claimed in claim 3, wherein the device comprises: the support plate (3) is inserted into the inner side of the first belt (20), the clamping claws (4) are provided with multiple groups, and the multiple groups of the clamping claws (4) are equidistantly arranged on the outer side of the first belt (20).
5. The device as claimed in claim 4, wherein the device comprises: gripper jaw (4) are including motor (21) and axletree (22), the both sides of motor (21) all are equipped with axletree (22), and both sides all rotate on axletree (22) and are equipped with axle piece (23), and are two sets of the inboard of axle piece (23) all rotates and is equipped with switching piece (24), and two sets of switching piece (24) inboard below all is equipped with grip block (25).
6. The device as claimed in claim 5, wherein the device comprises: two sets of it is connected with connecting block (26) to articulate between switching piece (24), and the inboard of connecting block (26) is equipped with the screw hole, the output of motor (21) is equipped with lead screw (27), and lead screw (27) and screw hole looks adaptation.
7. The device of claim 1, wherein the device is capable of testing a plurality of chips under test simultaneously, and comprises: the second conveying part comprises a second shaft roller (28) and a second belt (29), the second shaft roller (28) is provided with two sets of rollers, the two sets of rollers are arranged below the two sides of the inner part of the support (1) in a rotating mode respectively, the second shaft roller (28) is driven by a motor, and the second belt (29) is arranged on the outer side of the second shaft roller (28) in a winding mode.
8. The apparatus as claimed in claim 7, wherein the testing apparatus is capable of testing a plurality of chips under test simultaneously, and comprises: the outside at second belt (29) is established in constant head tank (5), and constant head tank (5) equidistance is equipped with the multiunit and is, the inboard of establishing into second belt (29) is inserted to the lower end plate of support (1).
9. The apparatus according to any one of claims 1 to 8, wherein: the support is characterized in that a supporting plate (30) is arranged at one end inside the support (1), an electric telescopic rod (31) is arranged on the supporting plate (30), a first placing plate (32) is arranged at the output end of the electric telescopic rod (31), and a second placing plate (33) is arranged below the supporting plate (30).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211552750.0A CN115649856B (en) | 2022-12-06 | 2022-12-06 | Testing device capable of simultaneously testing multiple chips to be tested |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211552750.0A CN115649856B (en) | 2022-12-06 | 2022-12-06 | Testing device capable of simultaneously testing multiple chips to be tested |
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| CN115649856A true CN115649856A (en) | 2023-01-31 |
| CN115649856B CN115649856B (en) | 2024-01-19 |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN207504089U (en) * | 2017-11-03 | 2018-06-15 | 中能东道集团有限公司 | Lithium ion cell polar ear folding device |
| CN109597002A (en) * | 2018-12-28 | 2019-04-09 | 陈清尧 | A kind of LED test detection device |
| CN110756460A (en) * | 2019-10-16 | 2020-02-07 | 武汉城市职业学院 | Multicolor injection molding sorting device based on edge extraction algorithm detection |
| CN214986663U (en) * | 2021-06-22 | 2021-12-03 | 深圳市拓世自动化设备有限公司 | Upset labeller constructs |
| CN217212206U (en) * | 2021-12-29 | 2022-08-16 | 惠州市盈帆实业有限公司 | IC card chip packaging quality detection equipment |
-
2022
- 2022-12-06 CN CN202211552750.0A patent/CN115649856B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN207504089U (en) * | 2017-11-03 | 2018-06-15 | 中能东道集团有限公司 | Lithium ion cell polar ear folding device |
| CN109597002A (en) * | 2018-12-28 | 2019-04-09 | 陈清尧 | A kind of LED test detection device |
| CN110756460A (en) * | 2019-10-16 | 2020-02-07 | 武汉城市职业学院 | Multicolor injection molding sorting device based on edge extraction algorithm detection |
| CN214986663U (en) * | 2021-06-22 | 2021-12-03 | 深圳市拓世自动化设备有限公司 | Upset labeller constructs |
| CN217212206U (en) * | 2021-12-29 | 2022-08-16 | 惠州市盈帆实业有限公司 | IC card chip packaging quality detection equipment |
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| CN115649856B (en) | 2024-01-19 |
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