CN115642913A - Analog-to-digital converter ADC calibration method, device, equipment and storage medium - Google Patents
Analog-to-digital converter ADC calibration method, device, equipment and storage medium Download PDFInfo
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Abstract
The embodiment of the invention provides a method, a device, equipment and a storage medium for calibrating an analog-to-digital converter (ADC), wherein the method comprises the following steps: acquiring a plurality of sample signal sets of an ADC at a first working temperature; the sample signal set comprises an input signal of the ADC and an output signal of the ADC corresponding to the input signal; determining an output-input curve corresponding to the ADC at the first working temperature according to the first target model and the input signal and the output signal in the plurality of sample signal sets; the first target model is determined based on a third order equation; and calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature. The method of the embodiment of the invention realizes the calibration and elimination of the error caused by the higher harmonic wave and improves the calibration effect of the ADC.
Description
Technical Field
The present invention relates to the field of integrated circuit technologies, and in particular, to a method, an apparatus, a device, and a storage medium for calibrating an ADC.
Background
An Analog to Digital Converter (ADC) is a Converter that converts a sampled continuous Analog signal into a Digital signal that can be processed by a Digital system. A digital system is capable of adjusting its own working condition to achieve optimal performance or perform self-protection in different external working environments (such as voltage, current, temperature, etc.), so a high-precision ADC sampling system is necessary. The ideal ADC transfer curve is linear, however, the ADC is a digital-analog hybrid circuit, the performance of the analog part of the ADC is affected by the process and the temperature, the output signal contains noise and harmonics, and the ADC has different performances at different temperatures, and therefore, the output signal of the ADC is calibrated.
In the related technology, gain errors and offset errors output by the ADC are calibrated through two known reference points, sampling points are too few, more discrete points appear outside a straight line, and the curve fitting precision is poor, so that the calibration result of an output signal of the ADC is poor.
Disclosure of Invention
To solve the problems in the prior art, embodiments of the present invention provide a method, an apparatus, a device, and a storage medium for calibrating an ADC of an analog-to-digital converter.
Specifically, the embodiment of the invention provides the following technical scheme:
in a first aspect, an embodiment of the present invention provides an ADC calibration method, including:
acquiring a plurality of sample signal sets of an ADC at a first working temperature; the sample signal set comprises an input signal of the ADC and an output signal of the ADC corresponding to the input signal;
determining an output-input curve corresponding to the ADC at the first working temperature according to the first target model and the input signal and the output signal in the plurality of sample signal sets; the first target model is determined based on a third order equation;
and calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature.
Further, the third order equation may be expressed as:
x＝a 0 +a 1 y+a 2 y 2 +a 3 y 3 (ii) a The x represents an input signal of the ADC; y represents an output signal of the ADC; a is a 0 、a 1 、a 2 And a 3 Representing the coefficients of a third order equation.
Further, the determining the corresponding output-input curve of the ADC at the first operating temperature according to the first target model and the input signal and the output signal in the plurality of sample signal sets includes:
and fitting the input signals and the output signals in the sample signal set according to the first target model to obtain an output-input curve corresponding to the ADC at the first working temperature.
Further, calibrating the ADC according to the output-input curve corresponding to the ADC at the first operating temperature and the output voltage of the ADC measured at the first operating temperature, including:
inputting a first signal to the ADC, and determining the output voltage of the ADC measured at a first working temperature;
inputting the output voltage of the ADC measured at the first working temperature into an output-input curve corresponding to the ADC at the first working temperature to obtain an ADC calibration signal;
and calibrating the ADC according to the ADC calibration signal and the first signal.
Further, the ADC calibration method further includes:
acquiring an output-input curve corresponding to the ADC at a second working temperature;
determining a correspondence between ADC output and input at a third operating temperature based on the second target model; the third working temperature is any working temperature between the first working temperature and the second working temperature; the second model is determined based on the first working temperature, the ADC input signal at the first working temperature, the second working temperature and the ADC input signal at the second working temperature;
and calibrating the ADC according to the corresponding relation between the output and the input of the ADC at the third working temperature.
Further, the second target model is determined based on the following formula:
wherein, t 0 Representing a first operating temperature; t is t 1 Representing a second operating temperature; x is a radical of a fluorine atom 0 Representing an ADC input signal at a first operating temperature; x is the number of 1 Representing the ADC input signal at a second operating temperature; t is t x Represents a third operating temperature; x is the number of x Representing the ADC input signal at the third operating temperature.
In a second aspect, an embodiment of the present invention further provides an ADC calibration apparatus, including:
the acquisition module is used for acquiring a plurality of sample signal sets of the ADC at a first working temperature; the sample signal set comprises an input signal of the ADC and an output signal of the ADC corresponding to the input signal;
the determining module is used for determining an output-input curve corresponding to the ADC at the first working temperature according to the first target model and the input signal and the output signal in the plurality of sample signal sets; the first target model is determined based on a third order equation;
and the calibration module is used for calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature.
In a third aspect, an embodiment of the present invention further provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor executes the computer program to implement the ADC calibration method according to the first aspect.
In a fourth aspect, the present invention further provides a non-transitory computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the ADC calibration method according to the first aspect.
In a fifth aspect, embodiments of the present invention also provide a computer program product, which includes a computer program, and when the computer program is executed by a processor, the computer program implements the ADC calibration method according to the first aspect.
According to the analog-to-digital converter ADC calibration method, device, equipment and storage medium provided by the embodiment of the invention, the first target model is determined through the third-order equation, so that the output and the input of the ADC are fitted based on the first target model, the calibration and the elimination of errors caused by higher harmonics can be realized, the points of the input and the output of the ADC fall on the corresponding output and input curves of the ADC at the first working temperature determined based on the first target model, and the calibration effect of the ADC is improved.
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In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
Fig. 1 is a schematic flowchart of an ADC calibration method according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of an ADC calibration method according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of an ADC calibration apparatus according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without inventive step based on the embodiments of the present invention, are within the scope of protection of the present invention.
The method provided by the embodiment of the invention can be applied to an integrated circuit scene, realizes the calibration and elimination of the error brought by the higher harmonic wave, and improves the calibration effect of the ADC.
In the related technology, gain errors and offset errors output by the ADC are calibrated through two known reference points, sampling points are too few, more discrete points appear outside a straight line, and the curve fitting precision is poor, so that the calibration result of an output signal of the ADC is poor.
According to the calibration method of the ADC, the first target model is determined through the third-order equation, so that the output and the input of the ADC are fitted based on the first target model, calibration and elimination of errors caused by higher harmonics can be achieved, points of the input and the output of the ADC fall on the corresponding output and input curves of the ADC at the first working temperature determined based on the first target model, and the calibration effect of the ADC is improved.
The technical solution of the present invention is described in detail with specific embodiments in conjunction with fig. 1-4. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments.
Fig. 1 is a flowchart illustrating an embodiment of an ADC calibration method for an analog-to-digital converter according to the present invention. As shown in fig. 1, the method provided in this embodiment includes:
101, acquiring a plurality of sample signal sets of an ADC (analog to digital converter) at a first working temperature; the sample signal set comprises an input signal of the ADC and an output signal of the ADC corresponding to the input signal;
specifically, the ADC is a converter for converting a sampled continuous analog signal into a digital signal that can be processed by a digital system, and an ideal ADC transmission curve is linear, however, the ADC is a digital-analog hybrid circuit, the performance of an analog part of the ADC is affected by the process and the temperature, the output signal contains noise and harmonics, and the ADC has different performances at different temperatures, and therefore, the output signal of the ADC is calibrated.
In the related technology, the gain error and the offset error of the ADC output are calibrated through two known reference points, a curve obtained by the method is a straight line meeting a linear equation, sampling points are too few, more discrete points appear outside the straight line, the curve fitting precision is poor, sampling errors caused by harmonic waves exist, and the calibration result of the ADC output signal is poor.
In order to solve the above problem, in an embodiment of the present invention, first, a plurality of sample signal sets of an ADC at a first operating temperature are obtained, where a sample signal set includes an input signal of the ADC and an output signal of the ADC corresponding to the input signal; alternatively, in the case where the operating temperature range of the ADC is [ t0, t2], the average value t1 of the operating temperature range of the ADC [ t0, t2], then there may be three typical operating temperature values t0, t1 and t2 of the ADC; optionally, the operating temperature of the ADC may be adjusted to a first operating temperature t0, then several points within the range of the ADC are measured for the ADC, and ADC output data is recorded, so as to obtain output scatter diagrams corresponding to different input voltages of the ADC at the first operating temperature t0, that is, input signals of multiple ADCs at the first operating temperature, output signals of the ADC corresponding to the input signals, and multiple sample signal sets of the ADC at the first operating temperature are obtained.
Optionally, the number of sampling points of the acquired input signal of the ADC and the output signal of the ADC at the first operating temperature determines the calibration precision of the ADC, so that the number of sampling points of the acquired input signal of the ADC and the output signal of the ADC at the first operating temperature can be determined based on the requirement of the calibration precision, and the more the sampling points are, the higher the fitting precision is; in addition, the step size can also be measured in an adaptive step size manner, and sampling points are encrypted in a working range with high probability of the ADC, for example, most of the sampling range of the ADC is between 0.9V and 1.5V, so that the number of sampling points in the range can be increased to improve the calibration accuracy of the ADC in the range.
specifically, an ideal ADC transmission curve is linear, however, the performance of the ADC as a digital-analog hybrid circuit is affected by the process and temperature, the output signal contains noise and harmonics, that is, the actual ADC output is nonlinear in response to the input, the output of the nonlinear system contains many higher harmonics besides the input fundamental wave, and the gain error and the offset error of the ADC output are calibrated by two known reference points in the related art, the curve obtained by this method is a straight line satisfying a linear equation, and there are many points scattered in the straight line, resulting in a poor calibration result of the output signal of the ADC.
In order to solve the above problems, in the implementation of the present invention, after a plurality of sample signal sets of the ADC at the first operating temperature are obtained, a target model is established based on a third order equation to fit the output and the input of the ADC, so that calibration and elimination of errors caused by higher harmonics can be achieved, so that points of the input and the output of the ADC all fall on an output and input curve corresponding to the ADC at the first operating temperature determined based on the first target model, and the calibration effect of the ADC is improved. Optionally, as the number of harmonics in the ADC circuit increases, the proportion of errors contributed by fast attenuation of harmonic energy is very low and can be ignored, so that in the embodiment of the present invention, a target model is established based on a third order equation to fit the output and the input of the ADC, and only errors caused by the third harmonic are calibrated and eliminated, so that a good calibration effect of the ADC can be achieved.
And 103, calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature.
Specifically, after a first target model is determined based on a third-order equation, and an output-input curve corresponding to the ADC at a first working temperature is determined through the first model and the input signal and the output signal in the sample signal set, in the embodiment of the invention, the ADC can be calibrated by the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature, so that errors caused by higher harmonics are eliminated, so that points of input and output of the ADC all fall on the output-input curve corresponding to the ADC at the first working temperature determined based on the first target model, and the calibration effect of the ADC is improved.
According to the method, the first target model is determined through the third-order equation, so that the output and the input of the ADC are fitted based on the first target model, calibration and elimination of errors caused by high harmonics can be achieved, points of the input and the output of the ADC fall on the output and input curve corresponding to the ADC at the first working temperature determined based on the first target model, and the calibration effect of the ADC is improved.
In one embodiment, the third order equation may be expressed as:
x＝a 0 +a 1 y+a 2 y 2 +a 3 y 3 (ii) a x represents the input signal of the ADC; y represents the output signal of the ADC; a is 0 、a 1 And a 3 Representing the coefficients of a third order equation.
Specifically, in the embodiment of the present invention, the third order equation may be expressed as:
x＝a 0 +a 1 y+a 2 y 2 +a 3 y 3 (ii) a x represents the input signal of the ADC; y represents the output signal of the ADC; a is a 0 、a 1 And a 3 Representing the coefficients of a third order equation. Optionally, in the embodiment of the present invention, x = a is according to the third order equation 0 +a 1 y+a 2 y 2 +a 3 y 3 And establishing a target model, and further accurately determining an output-input curve corresponding to the ADC at the first working temperature according to the target model and the input signal and the output signal in the plurality of sample signal sets.
Optionally, determining an output-input curve corresponding to the ADC at the first operating temperature according to the first target model and the input signal and the output signal in the plurality of sample signal sets, includes:
and fitting the input signal and the output signal in the sample signal set according to the first target model to obtain an output-input curve corresponding to the ADC at the first working temperature.
Optionally, a third order equation x = a is utilized 0 +a 1 y+a 2 y 2 +a 3 y 3 After the target model is established, the target model is used for fitting the ADC output scatter diagram, so that the values of a0, a1, a2 and a3 in the target model can be determined based on the input signals of the ADC in the sample signal set and the output signals of the ADC corresponding to the input signals, and the first temperature is obtainedThe ADC outputs and inputs the curve in degree. Optionally, after the ADC output-input curve at the first temperature is obtained, the ADC input signal x may be accurately determined based on the measured ADC output y and the ADC output-input curve at the first temperature, so as to eliminate an error caused by a higher harmonic and improve the calibration effect of the ADC.
Note that, if the input is used as the abscissa x and the output is used as the ordinate y, i.e., y = a 0 +a 1 x+a 2 x 2 +a 3 x 3 The input and the output of the ADC are fitted, when the input x is solved according to the known y, the solution is not unique, the desired solution and a calibration result can be obtained only by adding constraint and logic judgment, and the ADC cannot be calibrated conveniently and quickly.
According to the method of the embodiment, the first target model is determined through the third order equation, the ADC output-input curve at the first temperature is determined by fitting the ADC output-input through the first target model, and then the input signal x of the ADC can be accurately determined based on the measured output y of the ADC and the ADC output-input curve at the first temperature, so that errors caused by higher harmonics are eliminated, and the calibration effect of the ADC is improved.
In one embodiment, the method for measuring the output voltage of the ADC at the first operating temperature according to the corresponding output-input curve of the ADC at the first operating temperature includes:
inputting a first signal to the ADC, and determining the output voltage of the ADC measured at a first working temperature;
inputting the output voltage of the ADC measured at the first working temperature into an output-input curve corresponding to the ADC at the first working temperature to obtain an ADC calibration signal;
the ADC is calibrated according to the ADC calibration signal and the first signal.
Specifically, in order to realize calibration of the ADC, a voltage x may be randomly input to the ADC and an output value of the ADC is obtained, and then the output value of the ADC is substituted into an ADC output-input curve at a first temperature determined by the first target model, so that a fitted input value x 'may be obtained, where x' is a sampling result output to the system after the ADC is subjected to fitting calibration by a third-order equation, and whether the accuracy requirement is met is determined by calculating an error between x and x ', and optionally, in a case where the error between x and x' is smaller than a first threshold, it is determined that the accuracy requirement of the ADC is met; and if the error between x and x' is larger than or equal to the first threshold, re-acquiring the sample signal set and re-fitting according to the first target model to obtain an output-input curve of the ADC at the first temperature.
According to the method of the embodiment, the ADC calibration signal is obtained by inputting the output voltage of the ADC measured at the first working temperature into the corresponding output-input curve of the ADC at the first working temperature, and then the ADC calibration signal can be calibrated through the error between the ADC calibration signal and the first signal, so that the precision of the ADC is improved.
In one embodiment, the ADC calibration method further includes:
acquiring an output-input curve corresponding to the ADC at a second working temperature;
determining a correspondence between ADC output and input at a third operating temperature based on the second target model; the third working temperature is any working temperature between the first working temperature and the second working temperature; the second model is determined based on the first working temperature, the ADC input signal at the first working temperature, the second working temperature and the ADC input signal at the second working temperature;
and calibrating the ADC according to the corresponding relation between the output and the input of the ADC at the third working temperature.
Specifically, after an output-input curve of the ADC at a typical operating temperature is obtained, for example, after the output-input curve of the ADC at the first operating temperature t0 and the output-input curve of the ADC at the second operating temperature t1 are obtained, in the embodiment of the present invention, a corresponding relationship between the output and the input of the ADC at the third operating temperature between the first operating temperature and the second operating temperature is determined based on the second target model, so that an output-input relationship of the ADC at different temperatures between the first operating temperature and the second operating temperature can be determined, fitting and temperature calibration of the output and the input of the ADC at the third operating temperature are realized, a sampling error caused by an ambient temperature is calibrated and eliminated, and a calibration effect of the ADC is improved.
Optionally, the second target model is determined based on the following formula:
wherein, t 0 Representing a first operating temperature; t is t 1 Representing a second operating temperature; x is the number of 0 Representing an ADC input signal at a first operating temperature; x is the number of 1 Representing the ADC input signal at a second operating temperature; t is t x Represents a third operating temperature; x is the number of x Representing the ADC input signal at the third operating temperature.
In particular, based on
After the second target model is determined, the first working temperature is t 0 The second working temperature is t 1 The third operating temperature is t x ，t 0 <t x <t 1 Determining the ADC corresponding to the known output quantity y at t based on the ADC output-input curve at the calibrated first working temperature 0 Input at temperature is x 0 Determining the input x of the ADC corresponding to the known output y at the temperature t0 based on the output-input curve of the ADC at the calibrated second working temperature 1 Then the ADC for the known output y is at t x Input at temperature x x Can be determined by a second target model based on the known output y and the determined input x at a third operating temperature x The output-input relation between the first working temperature and the second working temperature at any working temperature can be determined, the fitting of ADC output and input at any working temperature and the temperature calibration of the ADC are realized, the efficiency is improved, the sampling error caused by the ambient temperature is eliminated, and the calibration effect of the ADC is improved.
According to the method of the embodiment, the corresponding relation between the ADC output and the ADC input at the third working temperature between the first working temperature and the second working temperature is determined through the second target model, so that the ADC output and input relations at different temperatures between the first working temperature and the second working temperature can be determined, the fitting and the temperature calibration of the ADC output and the ADC input at the third working temperature are realized, the sampling error caused by the ambient temperature is eliminated, and the calibration effect of the ADC is improved.
An exemplary schematic flowchart of an ADC calibration method provided by the embodiment of the present invention is shown in fig. 2:
(1) Acquiring an ADC working temperature range [ t0, t2] and an average value t1 of the working temperature range, and taking the average value as three typical temperature working points, t0, t1 and t2;
(2) Adjusting the operating temperature of the ADC to a typical temperature operating point, for example, adjusting the operating temperature point of the ADC to t0;
(3) Measuring a plurality of points in the measuring range by using the ADC, recording ADC output data, and obtaining an output scatter diagram of the ADC for measuring different input voltages at the temperature of t0;
optionally, the number of output points and the number of input points are not unique, and the more sampling points, the higher the fitting accuracy depends on the requirement on the accuracy;
optionally, the step size can also be measured in an adaptive step size manner, and sampling points are encrypted within a high-probability working range of the ADC, for example, most of the sampling range of the ADC is between 0.9V and 1.5V, so that the number of sampling points within the range can be increased, and the calibration accuracy of the ADC between 0.9V and 1.5V is improved;
(4) According to the third order equation x = a 0 +a 1 y+a 2 y 2 +a 3 y 3 Based on this, an ADC output scattergram is fitted, and values of a0, a1, a2, and a3 are determined, thereby obtaining an ADC output-input curve at a temperature of t0, which is denoted as f0 (y).
Alternatively, the least square method and the gradient descent method may be used for determining a0, a1, a2, and a3 according to the ADC output and input, and the present invention is not limited thereto.
(5) Randomly inputting a voltage to the ADC, checking an output value of the voltage, and substituting f0 (y), solving a fitted input value x ', wherein x ' is a sampling result output to the system after the ADC is subjected to fitting calibration by a third-order equation, calculating whether an error between x and x ' meets a precision requirement, and if not, reselecting a point for fitting;
(6) And repeating the steps to obtain an ADC output-input curve f1 (y) of the ADC working temperature t1 and an ADC output-input curve f2 (y) of the ADC at the working temperature t2, and writing the curve into the memory or software of the chip.
(7) And determining the output and input relations of the ADC at different temperatures to finish temperature calibration. If the current operating temperature is tx, t0< tx < t1, and the input to the ADC at temperature t0 is known as x0 and the input at temperature t1 is known as x1, then the input at temperature tx can be calculated by the following equation:
(8) And after temperature compensation is carried out, testing is carried out in the ADC working range (comprising a measurement range and a working temperature range), whether the calibration precision meets the requirement or not is judged, and if not, recalibration is returned. After calibration, the chip firstly needs to obtain a current working environment temperature value during working, and judges whether the current working environment temperature value is in a [ t0, t1] interval or a [ t1, t2] interval, if the current working environment temperature value is in the [ t0, t1] interval, f0 (y) and f1 (y) are used for calculation, and if the current working environment temperature value is in the [ t1, t2] interval, f1 (y) and f2 (y) are used for calculation, so that a more accurate measurement value is obtained.
According to the method, the first target model is determined based on the third-order equation, three ADC output and input curves are obtained by fitting and obtaining under three different temperatures, real-time calibration of ADC output data under different temperatures is achieved through the second target model and the obtained three ADC output and input curves, errors caused by high-order harmonics and sampling errors caused by ambient temperature are calibrated and eliminated, and calibration precision and calibration efficiency of the ADC are improved.
The following describes the calibration apparatus for ADC according to the present invention, and the calibration apparatus for ADC described below and the calibration method for ADC described above can be referred to correspondingly.
Fig. 3 is a schematic structural diagram of an ADC calibration apparatus of an analog-to-digital converter according to the present invention. The ADC calibration apparatus provided in this embodiment includes:
an obtaining module 710, configured to obtain a plurality of sample signal sets of an ADC at a first operating temperature; the sample signal set comprises an input signal of the ADC and an output signal of the ADC corresponding to the input signal;
a determining module 720, configured to determine an output-input curve corresponding to the ADC at the first operating temperature according to the first target model and the input signal and the output signal in the plurality of sample signal sets; the first target model is determined based on a third order equation;
the calibration module 730 is configured to calibrate the ADC according to the output-input curve corresponding to the ADC at the first operating temperature and the output voltage of the ADC measured at the first operating temperature.
Alternatively, the third order equation may be expressed as:
x＝a 0 +a 1 y+a 2 y 2 +a 3 y 3 (ii) a The x represents an input signal of the ADC; y represents an output signal of the ADC; a is a 0 、a 1 And a 3 Representing the coefficients of a third order equation.
Optionally, the determining module 720 is specifically configured to: and fitting the input signals and the output signals in the sample signal set according to the first target model to obtain an output-input curve corresponding to the ADC at the first working temperature.
Optionally, the calibration module 730 is specifically configured to: inputting a first signal to the ADC, and determining the output voltage of the ADC measured at a first working temperature;
inputting the output voltage of the ADC measured at the first working temperature into an output-input curve corresponding to the ADC at the first working temperature to obtain an ADC calibration signal;
and calibrating the ADC according to the ADC calibration signal and the first signal.
Optionally, the calibration module 730 is further configured to: acquiring an output-input curve corresponding to the ADC at a second working temperature;
determining a correspondence between ADC output and input at a third operating temperature based on the second target model; the third working temperature is any working temperature between the first working temperature and the second working temperature; the second model is determined based on the first working temperature, the ADC input signal at the first working temperature, the second working temperature and the ADC input signal at the second working temperature;
and calibrating the ADC according to the corresponding relation between the output and the input of the ADC at the third working temperature.
Optionally, the calibration module 730 is further configured to: determining a second target model based on the following formula:
wherein, t 0 Representing a first operating temperature; t is t 1 Represents a second operating temperature; x is the number of 0 Representing an ADC input signal at a first operating temperature; x is the number of 1 Representing the ADC input signal at a second operating temperature; t is t x Represents a third operating temperature; x is a radical of a fluorine atom x Representing the ADC input signal at the third operating temperature.
The apparatus according to the embodiment of the present invention is configured to perform the method according to any of the foregoing method embodiments, and the implementation principle and technical effects are similar, which are not described herein again.
Fig. 4 illustrates a physical structure diagram of an electronic device, which may include: a processor (processor) 810, a communication Interface 820, a memory 830 and a communication bus 840, wherein the processor 810, the communication Interface 820 and the memory 830 communicate with each other via the communication bus 840. Processor 810 may invoke logic instructions in memory 830 to perform an analog-to-digital converter ADC calibration method comprising: acquiring a plurality of sample signal sets of an ADC at a first working temperature; the sample signal set comprises an input signal of the ADC and an output signal of the ADC corresponding to the input signal; determining an output-input curve corresponding to the ADC at the first working temperature according to the first target model and the input signal and the output signal in the plurality of sample signal sets; the first target model is determined based on a third order equation; and calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature.
In addition, the logic instructions in the memory 830 can be implemented in the form of software functional units and stored in a computer readable storage medium when the software functional units are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk, and various media capable of storing program codes.
In another aspect, the present invention also provides a computer program product comprising a computer program stored on a non-transitory computer readable storage medium, the computer program comprising program instructions which, when executed by a computer, enable the computer to perform the method for calibrating an ADC provided by the above methods, the method comprising: acquiring a plurality of sample signal sets of an ADC at a first working temperature; the sample signal set comprises an input signal of the ADC and an output signal of the ADC corresponding to the input signal; determining an output-input curve corresponding to the ADC at the first working temperature according to the first target model and the input signal and the output signal in the plurality of sample signal sets; the first target model is determined based on a third order equation; and calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature.
In yet another aspect, the present invention also provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, is implemented to perform the analog-to-digital converter ADC calibration method provided in each of the above aspects, the method comprising: acquiring a plurality of sample signal sets of an ADC at a first working temperature; the sample signal set comprises an input signal of the ADC and an output signal of the ADC corresponding to the input signal; determining an output-input curve corresponding to the ADC at a first working temperature according to the first target model and the input signal and the output signal in the plurality of sample signal sets; the first target model is determined based on a third order equation; and calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment may be implemented by software plus a necessary general hardware platform, and may also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A method for calibrating an ADC, comprising:
acquiring a plurality of sample signal sets of an ADC at a first working temperature; the sample signal set comprises an input signal of an ADC and an output signal of the ADC corresponding to the input signal;
determining an output-input curve corresponding to the ADC at the first working temperature according to a first target model and input signals and output signals in a plurality of sample signal sets; the first target model is determined based on a third order equation;
and calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature.
2. The ADC calibration method of claim 1,
the third order equation can be expressed as:
x＝a 0 +a 1 y+a 2 y 2 +a 3 y 3 (ii) a The x represents an input signal of the ADC; y represents an output signal of the ADC; a is a mentioned 0 、a 1 、a 2 And a 3 Representing the coefficients of a third order equation.
3. The ADC calibration method of claim 2, wherein determining the corresponding output-input curve of the ADC at the first operating temperature according to the first target model and the input signal and the output signal of the plurality of sample signal sets comprises:
and fitting the input signals and the output signals in the sample signal set according to the first target model to obtain an output-input curve corresponding to the ADC at the first working temperature.
4. The ADC calibration method according to claim 3, wherein calibrating the ADC according to the corresponding output-input curve of the ADC at the first operating temperature and the output voltage of the ADC measured at the first operating temperature comprises:
inputting a first signal to the ADC, and determining the output voltage of the ADC measured at a first working temperature;
inputting the output voltage of the ADC measured at the first working temperature into an output-input curve corresponding to the ADC at the first working temperature to obtain an ADC calibration signal;
calibrating the ADC according to the ADC calibration signal and the first signal.
5. The ADC calibration method according to any one of claims 1-4, further comprising:
acquiring an output-input curve corresponding to the ADC at a second working temperature;
determining a correspondence between ADC output and input at a third operating temperature based on the second target model; the third working temperature is any one working temperature between the first working temperature and the second working temperature; the second model is determined based on the first working temperature, the ADC input signal at the first working temperature, the second working temperature and the ADC input signal at the second working temperature;
and calibrating the ADC according to the corresponding relation between the output and the input of the ADC at the third working temperature.
6. The ADC calibration method of claim 5, wherein the second target model is determined based on the following formula:
wherein, t 0 Representing a first operating temperature; t is t 1 Represents a second operating temperature; x is a radical of a fluorine atom 0 Representing an ADC input signal at a first operating temperature; x is a radical of a fluorine atom 1 Representing the ADC input signal at a second operating temperature; t is t x Represents a third operating temperature; x is the number of x Representing the ADC input signal at the third operating temperature.
7. An analog-to-digital converter (ADC) calibration apparatus, comprising:
the acquisition module is used for acquiring a plurality of sample signal sets of the ADC at a first working temperature; the sample signal set comprises an input signal of an ADC and an output signal of the ADC corresponding to the input signal;
the determining module is used for determining an output-input curve corresponding to the ADC at the first working temperature according to a first target model and the input signal and the output signal in the plurality of sample signal sets; the first target model is determined based on a third order equation;
and the calibration module is used for calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and the output voltage of the ADC measured at the first working temperature.
8. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the ADC calibration method according to any one of claims 1 to 6 when executing the program.
9. A non-transitory computer-readable storage medium on which a computer program is stored, the computer program when executed by a processor implementing the ADC calibration method according to any one of claims 1 to 6.
10. A computer program product having executable instructions stored thereon, which when executed by a processor cause the processor to implement the ADC calibration method of any one of claims 1 to 6.
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