CN115602522A - Ion drift meter and ion drift analysis method - Google Patents

Ion drift meter and ion drift analysis method Download PDF

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Publication number
CN115602522A
CN115602522A CN202211061905.0A CN202211061905A CN115602522A CN 115602522 A CN115602522 A CN 115602522A CN 202211061905 A CN202211061905 A CN 202211061905A CN 115602522 A CN115602522 A CN 115602522A
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wall sleeve
ion drift
ground potential
ions
polar plate
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张清和
刘振平
孙祺
邢赞扬
李延辉
郭新
王艳玲
苗晓晴
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Shandong University
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Shandong University
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/008Drift detectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/001Details

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Abstract

The invention relates to an ion drift meter and an ion drift analysis method. Compared with the traditional ion drift meter, the area of the collecting polar plate is increased, only one path of operational amplifier and a rear-end electronic circuit are needed, the interference of difference among four quadrants of the traditional ion drift meter and natural deviation among measuring circuits on measuring data is avoided, the error of ion drift speed obtained through measurement and calculation is smaller, the reliability and usability of a plasma detection result are improved, circuit resources are saved, the large difference and error among multi-path measuring results caused by problems of zero drift, output bias and the like of the operational amplifier when a multi-path electronic circuit is used are avoided, and the ionic layer plasma can be detected and analyzed by cooperating with a high-spatial-resolution retarding potential analyzer.

Description

Ion drift meter and ion drift analysis method
Technical Field
The invention belongs to the technical field of improvement of ion drift meters, and particularly relates to an ion drift meter and an ion drift analysis method.
Background
An Ion Drift Meter (IDM) is a sensor used for space ionized layer plasma diagnosis, and is mainly carried on a satellite to measure space plasmas, the traditional ion drift meter is composed of a multi-layer grid mesh divided into four quadrants, the traditional ion drift meter assumes that parameters such as the area, the conductivity and the like among all collecting plates are completely consistent, and current measuring circuits at the rear ends of all quadrants are completely consistent, so that parameter information such as the ion drift speed, the incident angle and the like is solved by utilizing the sizes of current electric signals collected by the four quadrants. However, the four quadrants in the design mode of the conventional ion drift meter are difficult to achieve high consistency, and in actual measurement, the ion current is often very weak and is limited by factors such as the surface area of the collector plate and the weight of the sensor, the current of each quadrant is often in the nA level, and the difference of the current magnitude among the quadrants is small. As shown in fig. 1 and 2, each layer of grid mesh is sequentially a ground potential grid mesh, a +2V grid mesh, a-15V grid mesh and a ground potential grid mesh from top to bottom, and each layer of grid mesh is a circular metal mesh sheet consisting of four quarter circles. The uppermost layer of the ground potential grid mesh can shield the interference of an electric field in the IDM sensor on external plasma, the +2V grid mesh can screen ions, the +2V grid mesh can prevent H + in space plasma from entering the collecting polar plate, the-15V grid mesh can prevent electrons in the plasma from entering the collecting polar plate, the influence of electron current on ion diagnosis is avoided, and the lower layer of the ground potential grid mesh can prevent secondary electrons and photoelectrons of the collecting polar plate from escaping. The lowest layer is a collecting pole plate, the collecting pole plate is a circular metal pole plate consisting of four quarter circles and is respectively marked as A, B, C, D four quadrants, each quadrant is respectively responsible for collecting incident ion current, and scientific parameters such as the incident angle and the drift velocity of the plasma can be obtained through deduction and calculation by recording and utilizing the electric signal size of each quadrant.
If the areas of the quadrant collecting polar plates are different or the electrical conductivity is different, the error of collecting current can be caused, and the accuracy of the calculation result is further influenced. The back-end electronic circuit part, especially the operational amplifier circuit part, is difficult to achieve high consistency, because errors of measurement results caused by natural errors of semiconductor devices such as temperature drift, zero offset, output offset and the like are difficult to avoid. In the improvement method, the measurement deviation can be reduced as much as possible only by carrying out methods such as zeroing and calibrating on the operational amplification circuits corresponding to the quadrants one by one, but the improvement effect is not obvious.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides an ion drift meter which comprises a machine shell, wherein a metal inner wall sleeve which is divided into four quadrants is arranged in the machine shell in an insulating mode, a multi-layer grid structure is arranged in the inner wall sleeve, and a collecting polar plate at the lowest layer of the multi-layer grid structure is a single round metal polar plate. And (3) carrying out potential configuration on each quadrant of the ion drift meter in turn, measuring and recording the change condition of the current of the collecting polar plate, and obtaining corresponding ion parameters through calculation so as to realize diagnosis of ionized layer plasma.
The technical scheme adopted by the invention is as follows:
an ion drift meter comprises a machine shell, wherein an inner wall sleeve is arranged in the machine shell and comprises a plurality of quadrant blocks, and a multi-layer grid mesh structure and a collecting polar plate are arranged in the inner wall sleeve.
The inner wall sleeve is a hollow cylindrical sleeve, and is equally divided into four quadrant blocks along the circumferential direction.
Wherein, the collecting polar plate is a round metal polar plate.
The inner wall sleeve is made of metal, every two adjacent quadrant blocks of the inner wall sleeve are mutually insulated, and each quadrant block of the inner wall sleeve can be subjected to potential control and loading.
The multi-layer grid structure comprises upper ground potential grids, 2V grids, 15V grids, middle ground potential grids and lower ground potential grids which are vertically arranged at intervals, and the collecting polar plates are arranged below the lower ground potential grids.
The upper ground potential grid mesh, +2V grid mesh, -15V grid mesh and middle ground potential grid mesh are uniformly arranged at intervals, and the vertical interval between the middle ground potential grid mesh and the lower ground potential grid mesh is larger than the interval between the upper ground potential grid mesh, +2V grid mesh, -15V grid mesh and the middle ground potential grid mesh.
An ion drift analysis method for an ion drift meter, wherein, in the above ion drift meter, an ion drift velocity V in an axial direction of the inner wall sleeve Y The calculation formula of (c) is:
Figure BDA0003826620680000021
alpha is the included angle between the ion incidence direction and the axial direction of the inner wall sleeve, V r Is the overall velocity of the plasma relative to the satellite along the axial direction of the sensor, e is the unit charge,
Figure BDA0003826620680000022
mi is the mass of the ith ion, d is the inner diameter of the inner wall sleeve, h is the height of the inner wall sleeve, I0 is the current value of the collecting polar plate when two limiting blocks of the inner wall sleeve to which the ions irradiate apply ground potential, and I1 is the current value of the collecting polar plate when two limiting blocks of the inner wall sleeve to which the ions irradiate apply positive voltage.
The calculation formula of the included angle alpha between the ion incidence direction and the axial direction of the inner wall sleeve is as follows:
Figure BDA0003826620680000023
wherein the I0 and I1 satisfy the following ratio:
Figure BDA0003826620680000024
when the two limiting blocks of the inner wall sleeve to which the ions are emitted apply ground potential, the ions cannot deflect in the rear direction after being emitted into the inner wall sleeve, the ions emitted to and impacting on the inner wall sleeve are absorbed and annihilated, and only the ions directly emitted to the collecting polar plate can reach the collecting polar plate and form an electric signal; when positive voltage is applied to the two limiting blocks of the inner wall sleeve to which the ions are shot, the ions shot to the inner wall sleeve are repelled and turned and shot to the collecting polar plate when reaching the inner wall sleeve, and at the moment, the ions shot to the inner wall sleeve and the ions shot to the collecting polar plate can both reach the collecting polar plate and form electric signals.
The invention has the advantages and positive effects that:
in the invention, the inner wall sleeve is a cylindrical thin-wall sleeve which is divided into four quadrant blocks and separated from each other, the potential configuration can be carried out on the four quadrant blocks in turn respectively, only one whole collecting polar plate is adopted, the structure of four collecting polar plates of the traditional ion drift meter is not used, the area of the collecting polar plate is increased, the current difference of each quadrant in the traditional ion drift meter is not required to be considered, only one operational amplifier and a rear-end electronic circuit are required, the interference of natural deviation among the original measuring circuits on measuring data is avoided, only one group of data is measured in one mode, the circuit resource is saved, and the situation that large difference and error naturally exist among multi-path measuring results caused by the problems of drift zero point, output offset and the like of the operational amplifier when the multi-path electronic circuit is used is avoided.
Different electric potentials are configured for four quadrant blocks in turn, electric signal data of the collecting pole plates are measured, the drift velocity of ions can be obtained through analysis and calculation, the change of a single collecting pole plate relative to electric signals of the four collecting pole plates is more remarkable by more than 3-4 times, weak electric signals which cannot be measured by an original ion drift meter can be measured, the difference among four quadrants of a traditional ion drift meter is not needed to be considered, errors are eliminated through a difference calculation method, the ion drift velocity obtained through measurement and calculation is smaller than the error of the traditional ion drift meter, the reliability and usability of a plasma detection result are improved, and the ionized layer plasma can be detected and analyzed through cooperation with a high-spatial-resolution retardation potential analyzer.
Drawings
FIG. 1 is a schematic diagram of a prior art ion drift meter configuration;
FIG. 2 is a schematic view of a prior art ion drift meter collector plate;
FIG. 3 is a schematic structural view of the present invention;
FIG. 4 is a schematic view of the collection plate of FIG. 3;
FIG. 5 is a schematic view of the multi-layer grid structure of FIG. 3;
FIG. 6 is a schematic view of the inner wall sleeve of FIG. 3;
FIG. 7 is a quadrant block division schematic of the inner wall sleeve of FIG. 6;
FIG. 8 is a side view of the insulating pad of the present invention;
FIG. 9 is a right side view of FIG. 8;
FIG. 10 is a schematic illustration of the ion drift of the present invention in mode 0;
FIG. 11 is a graph of the simulated ion trajectory of FIG. 8;
FIG. 12 is a schematic illustration of ion drift when the present invention is in mode 1;
fig. 13 is a simulated ion trajectory diagram of fig. 10.
Detailed Description
The present invention is further illustrated by the following examples, which are intended to be illustrative, not limiting and are not intended to limit the scope of the invention.
An ion drift meter, as shown in fig. 3, 4, 5, 6, 7, 8, 9, the innovation of the invention lies in that: the casing 6 is a cubic frame, can be made of metal materials such as aluminum alloy materials, and is subjected to equipotential treatment, and is mainly used for supporting and protecting other components arranged in the casing. Be provided with inner wall sleeve 5 in the casing, the inner wall sleeve is whole to be the equal open-ended hollow cylinder type sleeve that only has the lateral wall of upper end and lower extreme, and the inner wall sleeve passes through the vertical fixed setting of insulating material in the casing. The telescopic cylinder type lateral wall of inner wall is followed the telescopic radial even four quadrant pieces 8 that divide into of inner wall, the central angle of every quadrant piece is 90 degrees, it is mutual insulating between every two adjacent quadrant pieces, insulating mode can adopt and be provided with vertical insulating pad 10 between two adjacent quadrant pieces, insulating pad enables to keep clearance and insulating pad between two adjacent quadrant pieces and can fill up the gap between two adjacent quadrant pieces, insulating pad and two quadrant piece contacts of side are provided with the metal mesh 12 that plays the electromagnetic shield effect on the surface, the metal mesh is isolated with two adjacent quadrant pieces. Each quadrant block is made of metal materials, such as beryllium copper, stainless steel and the like, has good conductivity, leads out of each quadrant block, and can be subjected to potential control and loading independently through the leads.
And a multilayer grid structure and a collecting polar plate are arranged in the inner wall sleeve in the axial direction. The multilayer grid structure comprises an upper ground potential grid 1, a +2V grid 2, a-15V grid 3, a middle ground potential grid 4 and a lower ground potential grid 7 which are sequentially and vertically arranged at intervals from top to bottom, a collecting polar plate 9 is arranged below the lower ground potential grid, the upper ground potential grid is positioned at an opening at the upper end of the inner wall sleeve, and the collecting polar plate is positioned at the lower end of the inner wall sleeve and used as the cylindrical bottom surface of the inner wall sleeve and seals the bottom of the inner wall sleeve. The upper ground potential grid meshes, +2V grid meshes, -15V grid meshes and middle ground potential grid meshes are uniformly arranged at intervals (the vertical distance between two adjacent grid meshes is the same), and the vertical distance between the middle ground potential grid meshes and the lower ground potential grid meshes is larger than the vertical distance between two adjacent grid meshes in the upper ground potential grid meshes, +2V grid meshes, -15V grid meshes and the middle ground potential grid meshes.
Each layer of grid mesh is a circular metal mesh, and all the grid meshes and the collecting polar plates are parallel to the plane where the upper end opening of the inner wall sleeve is located. As shown in fig. 8, a plurality of caulking grooves 11 are formed in the surface of each insulating pad facing the inner side of the inner wall sleeve, each group of caulking grooves with the same height in the axial direction of the inner wall sleeve can be embedded into the outer edge of one grid mesh or the outer edge of the collecting pole plate, the grid mesh and the collecting pole plate are fixed inside the inner wall sleeve through the caulking grooves, and the surface areas of all the grid meshes are the same and equal to the surface area of the collecting pole plate serving as the bottom surface of the inner wall sleeve. Each layer of grid mesh is supported, fixed and isolated through the caulking grooves on the insulating pads, an independent wire is led out from each grid mesh, independent potential control and loading can be carried out on each grid mesh through the wire, and the wiring mode of each layer of grid mesh and the collecting polar plate is consistent with that of a traditional ion drift meter.
The potential of the upper ground potential grid mesh is 0V, and the grid mesh layer is used for shielding the interference of an electric field inside the sensor to an external plasma environment; the potential of the +2V grid is +2V, and the grid is used for blocking H in the ionized layer + (Hydrogen ions) enter the sensor to be collected, and H with extremely high thermal velocity is prevented + Interference with sensor measurements; the potential of the grid of-15V is-15V, and the grid of the layer is used for blocking electrons in ionized layer plasma and O in the plasma + (oxygen ions) can pass through the-15V grid; the potential of the medium-ground potential grid mesh is 0V, the potential of the lower-ground potential grid mesh is 0V, and the medium-ground potential grid mesh and the lower-ground potential grid mesh are used for preventing secondary electrons from escaping (when the plasma impacts metal components such as the grid mesh, high-energy particles possibly existing in the plasma can bomb electrons of atoms in the metal components, the secondary electrons are the secondary electrons, the secondary electrons are generally high in energy but small in quantity, and the secondary electrons can be effectively absorbed by adding one layer of ground potential grid mesh as electromagnetic shielding so as to prevent the secondary electrons from escaping). The larger vertical distance between the middle ground potential grid mesh and the lower ground potential grid mesh can also ensure that ions have enough transverse drift distance between the middle ground potential grid mesh and the lower ground potential grid mesh, and the measurement accuracy of the sensor is improved. Ions (usually O) in the plasma after interception by the multi-layer grid + ) Finally reaching the collecting polar plate, thereby avoiding H with high thermal velocity + And interference of electrons.
The collecting polar plate is a whole circular metal polar plate, four collecting polar plates are not adopted any more, the collecting polar plate is made of copper or stainless steel plated gold, the collecting polar plate is connected with one path of operational amplifier and a rear-end electronic circuit, an electric signal can be generated on the collecting polar plate after ions reach the collecting polar plate, the electric signal can be measured through the operational amplifier and the rear-end electronic circuit which are connected with the collecting polar plate, and the measured data are analyzed and calculated to obtain ionic layer ion parameters such as ion drift velocity. Since the area of the collecting plate is increased by 4 times compared with the traditional ion drift meter, the change of the electric signal of a single collecting plate relative to four collecting plates is more obvious and is about 3-4 times of the traditional ion drift meter. Due to the increase of the area of the collecting polar plate, weak electric signals which cannot be measured by the original ion drift meter can be measured.
The ion drift analysis method of the ion drift meter divides four quadrant blocks of an inner wall sleeve of the ion drift meter into A, B, C, D four quadrant blocks by utilizing the ion drift meter, in the working process of the ion drift meter, potential configuration is carried out on A, D two quadrant blocks, A, B two quadrant blocks, B, C two quadrant blocks and C, D inner wall sleeve quadrant blocks of the two quadrant blocks in turn, the ion trajectory is controlled by controlling the change of potential, the potential values are generally 0 and 10V, the two modes can be switched in turn during measurement, and other potential values can be configured according to actual requirements, so that the collection condition that ions entering a sensor reach a collection polar plate can be controlled. The current measured by the collecting polar plate under the two modes with the potential value of 0 and the potential value of 10V is calculated and analyzed, and the corresponding parameters of the ions are calculated according to the change conditions of the current of the collecting polar plate under the two modes, so that the purpose of diagnosing the ionized layer plasma is realized. The calculation analysis process is as follows:
setting the height of the inner wall sleeve as h, the inner diameter of the inner wall sleeve as d, and the incident angle of ions along the X direction as alpha;
taking the ion drift calculation in the X direction as an example, the ions gradually shift to A, D two quadrant blocks along the X direction (in fig. 8, the horizontal coordinate axis is the X direction, and the vertical coordinate axis is the Y direction), the ion drift can be measured by adjusting the potentials of the two quadrant blocks A, D, corresponding to the following mode 0 and mode 1, respectively, according to the current values measured by the collecting plates in the two modes, and analyzing the current values measured in the two modes:
mode 0:
as shown in fig. 10 and 11, a ground potential (0V) is applied to the two quadrant blocks A, D of the inner wall sleeve, due to the existence of the transverse drift velocity of plasma ions, a part of ions collide with the two quadrant blocks A, D of the inner wall sleeve, the ions which collide with the inner wall sleeve are absorbed and annihilated, and cannot reach the collecting electrode plate to be measured and collected, so the ions in the range Lb are absorbed by the inner wall sleeve, only the ions in the range Lc can reach the collecting layer electrode plate to form an electric signal to be measured, and the current value at this time is measured and recorded by using a back-end electronic circuit and is marked as I0.
Mode 1:
as shown in fig. 12 and 13, in this mode, a positive voltage is applied to the A, D quadrant blocks of the inner wall sleeve, here 10V for example, when ions in the range Lb shift laterally to approach A, D quadrant blocks of the inner wall sleeve, they are repelled and deflected, and do not contact A, D quadrant blocks of the inner wall sleeve, they are all deflected in the direction of A, D quadrant blocks away from the inner wall sleeve, and they are all directed to the collecting plate, and finally they all reach the collecting plate and are collected by it. Therefore, the ions in the ranges Lc and Lb can be collected by the collecting plate at this time, and an electric signal is measured, and the current value of the collecting plate at this time is recorded as I1.
Through the above model analysis, according to the current value I0 of the collector plate measured in the mode 0 and the current value I1 of the collector plate measured in the mode 1, the following calculation formula is derived according to the current values I0 and I1 in the mode 0 and the mode 1:
the ratio of the current magnitudes in mode 0 and mode 1 satisfies:
Figure BDA0003826620680000061
the calculation formula of the included angle alpha between the ion incidence direction and the axial direction of the inner wall sleeve is as follows:
Figure BDA0003826620680000062
substitution intoThe incident angle alpha, and then the ion drift velocity V along the axial direction Y of the inner wall sleeve Y
Figure BDA0003826620680000063
Wherein, alpha is the included angle between the ion incidence direction and the axial direction of the inner wall sleeve, V r Is the speed of the plasma along the axial direction of the inner wall sleeve relative to the detection satellite, e is unit charge,
Figure BDA0003826620680000064
in order to detect the absolute potential of the satellite relative to the measured space plasma, mi is the mass of the ith ion, d is the inner diameter of the inner wall sleeve, h is the height of the inner wall sleeve, I0 is the current value of the collecting polar plate when two limiting blocks of the inner wall sleeve to which the ions irradiate apply the ground potential, and I1 is the current value of the collecting polar plate when two limiting blocks of the inner wall sleeve to which the ions irradiate apply the positive voltage.
According to the derivation process, in the mode 0, when the ground potential is applied to the two image limit blocks of the inner wall sleeve to which the ions irradiate, the ions cannot deflect after being irradiated into the inner wall sleeve, the ions irradiating and impacting the inner wall sleeve are absorbed and annihilated, and only the ions directly irradiating the collecting polar plate can reach the collecting polar plate and form an electric signal; in the mode 1, when a positive voltage is applied to the two quadrant blocks of the inner wall sleeve towards which ions are emitted, the ions which enter the inner wall sleeve and are emitted towards the inner wall sleeve are repelled and turned towards the collecting pole plate when reaching the inner wall sleeve, and the repelled ions and the ions directly emitted towards the collecting pole plate can both reach the collecting pole plate and form an electric signal. Therefore, when different electric potentials are applied to the inner wall sleeve in different modes, the change of the electric signal of the collector plate can be analyzed and calculated to obtain the ion drift amount.
When the material object sensor is manufactured for an experiment, the inner diameter d of the inner wall sleeve is designed to be 10cm, the height h of the inner wall sleeve is designed to be 10cm, an actual measurement experiment is carried out in a vacuum chamber, and the ion incident angle alpha is set to be 30 degrees. Respectively performing data acquisition in mode 0 and mode 1, and measuringThe average value of I0 in a period of time is 80nA, the average value of I1 in a period of time is 179nA, the values are substituted into the formula (2), and the incidence angle alpha is obtained s An error rate of about 28.8 degrees from the set point of about 4% is shown, which is a significant reduction in measurement error compared to the typical 20% -50% error rate of conventional ion drift meters, which may prove the effectiveness of this solution. After the incident angle of the ion is obtained, the drift velocity of the ion can be obtained according to the formula (3) by combining the angle of the incident angle with the actual velocity of the satellite. In actual operation, there may be the case that ions are incident in the directions of three quadrants, but since the vertical velocity component of the satellite (about 7.9 km/s) is much greater than the velocity of the free motion of the ions (about 1.8 km/s), the calculation is generally performed in two quadrants regardless of the incidence of three quadrants.
In the invention, the inner wall sleeve is a cylindrical thin-wall sleeve which is divided into four quadrant blocks and separated from each other, the potential configuration can be carried out on the four quadrant blocks in turn respectively, only one whole collecting polar plate is adopted, the structure of four collecting polar plates of the traditional ion drift meter is not used, the area of the collecting polar plate is increased, the current difference of each quadrant in the traditional ion drift meter is not required to be considered, only one operational amplifier and a rear-end electronic circuit are required, the interference of natural deviation among the original measuring circuits on measuring data is avoided, only one group of data is measured in one mode, the circuit resource is saved, and the situation that large difference and error naturally exist among multi-path measuring results caused by the problems of drift zero point, output offset and the like of the operational amplifier when the multi-path electronic circuit is used is avoided.
Different electric potentials are configured for four quadrant blocks in turn, electric signal data of the collecting pole plates are measured, the drift velocity of ions can be obtained through analysis and calculation, the change of a single collecting pole plate relative to electric signals of the four collecting pole plates is more remarkable by more than 3-4 times, weak electric signals which cannot be measured by an original ion drift meter can be measured, the difference among four quadrants of a traditional ion drift meter is not needed to be considered, errors are eliminated through a difference calculation method, the ion drift velocity obtained through measurement and calculation is smaller than the error of the traditional ion drift meter, the reliability and usability of a plasma detection result are improved, and the ionized layer plasma can be detected and analyzed through cooperation with a high-spatial-resolution retardation potential analyzer.

Claims (10)

1. An ion drift meter, characterized by: the device comprises a machine shell, wherein an inner wall sleeve is arranged in the machine shell and comprises a plurality of quadrant blocks, and a multilayer grid mesh structure and a collecting polar plate are arranged in the inner wall sleeve.
2. An ion drift meter in accordance with claim 1, wherein: the inner wall sleeve is a hollow cylindrical sleeve, and the inner wall sleeve is equally divided into four quadrant blocks along the circumferential direction.
3. An ion drift meter according to claim 1, wherein: the collecting polar plate is a round metal polar plate.
4. An ion drift meter according to claim 3, wherein: the inner wall sleeve is made of metal, every two adjacent quadrant blocks of the inner wall sleeve are mutually insulated, and each quadrant block of the inner wall sleeve can be subjected to potential control and loading.
5. An ion drift meter according to claim 4, wherein: the multi-layer grid structure comprises upper ground potential grids, 2V grids, 15V grids, middle ground potential grids and lower ground potential grids which are vertically arranged at intervals, and the collecting polar plate is arranged below the lower ground potential grids.
6. An ion drift meter according to claim 5, wherein: the upper ground potential grid mesh, +2V grid mesh, -15V grid mesh and middle ground potential grid mesh are uniformly arranged at intervals, and the vertical interval between the middle ground potential grid mesh and the lower ground potential grid mesh is larger than the interval between the upper ground potential grid mesh, +2V grid mesh, -15V grid mesh and the middle ground potential grid mesh.
7. An ion drift analysis method of an ion drift meter, characterized in that: the ion drift meter of any of claims 1 to 6, wherein the ion drift velocity V in the axial direction of the inner wall sleeve is Y The calculation formula of (2) is as follows:
Figure FDA0003826620670000011
wherein, alpha is the included angle between the ion incidence direction and the axial direction of the inner wall sleeve, V r Is the overall velocity of the plasma relative to the satellite along the axial direction of the sensor, e is the unit charge,
Figure FDA0003826620670000012
the absolute potential of the satellite earth relative to the space plasma is mi, the mass of the ith ion, d, the inner diameter of the inner wall sleeve, h, the height of the inner wall sleeve, I0, the current value of the collecting polar plate when the two limiting blocks of the inner wall sleeve to which the ions are ejected apply the ground potential, and I1, the current value of the collecting polar plate when the two limiting blocks of the inner wall sleeve to which the ions are ejected apply the positive voltage.
8. The method of claim 7, wherein the ion drift analysis method comprises: the calculation formula of the included angle alpha between the ion incidence direction and the axial direction of the inner wall sleeve is as follows:
Figure FDA0003826620670000013
9. the method of claim 8, wherein the ion drift analysis method comprises: the I0 and the I1 satisfy the following proportion:
Figure FDA0003826620670000021
10. the method of claim 8, wherein the ion drift analysis method comprises: when the two limiting blocks of the inner wall sleeve to which the ions are emitted apply ground potential, the ions cannot deflect in the rear direction after being emitted into the inner wall sleeve, the ions emitted to and impacting on the inner wall sleeve are absorbed and annihilated, and only the ions directly emitted to the collecting polar plate can reach the collecting polar plate and form an electric signal; when positive voltage is applied to the two limiting blocks of the inner wall sleeve to which the ions are shot, the ions shot to the inner wall sleeve are repelled and turned and shot to the collecting polar plate when reaching the inner wall sleeve, and at the moment, the ions shot to the inner wall sleeve and the ions shot to the collecting polar plate can both reach the collecting polar plate and form electric signals.
CN202211061905.0A 2022-08-31 2022-08-31 Ion drift meter and ion drift analysis method Pending CN115602522A (en)

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