CN115576229A - Automatic testing method, terminal equipment and computer storage medium - Google Patents
Automatic testing method, terminal equipment and computer storage medium Download PDFInfo
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- CN115576229A CN115576229A CN202210970483.2A CN202210970483A CN115576229A CN 115576229 A CN115576229 A CN 115576229A CN 202210970483 A CN202210970483 A CN 202210970483A CN 115576229 A CN115576229 A CN 115576229A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
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Abstract
The invention relates to an automatic testing method, a terminal device and a computer storage medium. The automatic test method is applied to a control terminal, and comprises the following steps: acquiring a first instruction for completing the starting of a device to be tested connected to an intelligent power supply; sending a first control signal to the intelligent power supply based on the first instruction so that the intelligent power supply disconnects the power supply based on the first control signal; sending a second control signal to the smart power supply to cause the smart power supply to connect to the power supply based on the second control signal; and acquiring a second instruction which is completed by restarting the tested equipment after power failure, and completing the automatic test. The automatic test method can provide an automatic test effect without manual intervention through the intelligent socket.
Description
Technical Field
The present application relates to the field of device testing technologies, and in particular, to an automated testing method, a terminal device, and a computer storage medium.
Background
Because the device which needs power supply may have a problem that the device cannot be started when being powered on at a certain probability due to various reasons such as a defect of a hardware circuit design, a defect of built-in software, or a problem of software and hardware cooperation, and some problems are that the device cannot be completely reproduced when being restarted from software, so that the device needs to be powered off and restarted.
Because the power failure is restarted, the power switch needs to be manually operated for control, and the labor is consumed. This is especially true for situations where multiple iterations of pressure test verification are required. In addition, the manual operation is tedious, and the abnormal start is easily detected incorrectly.
Disclosure of Invention
The application provides an image duplicate removal method, an image duplicate removal system, a terminal device and a computer storage medium.
One technical solution adopted by the present application is to provide an automatic testing method, where the automatic testing method is applied to a control terminal, and the automatic testing method includes:
acquiring a first instruction of finishing the starting of a tested device connected to an intelligent power supply;
sending a first control signal to the intelligent power supply based on the first instruction so that the intelligent power supply disconnects the power supply based on the first control signal;
sending a second control signal to the smart power supply to cause the smart power supply to connect to the power supply based on the second control signal;
and acquiring a second instruction which is completed by restarting the tested equipment after power failure, and completing the automatic test.
Wherein the sending of the first control signal to the smart power supply based on the first instruction,
and sending a simulation command to the android device based on the first instruction, so that the android device sends the first control signal to the intelligent power supply based on the simulation command.
The simulation command is a command of a client-server program, and the control terminal simulates a manual touch action to control the android device by using the simulation command.
Wherein, the obtaining of the second instruction completed by the power-off restart of the tested device to complete the automated test comprises:
and outputting test information that the tested equipment fails to be powered off and restarted and cannot be started normally when the second instruction for completing the power-off restart cannot be obtained from the tested equipment within the preset time.
The obtaining of the second instruction that the power-off restart of the tested device is completed to complete the automated test includes:
when a second instruction of the tested equipment which is restarted after power failure is obtained within preset time, calculating reaction time between sending the second control signal and obtaining the second instruction;
and outputting the power-off restarting reaction efficiency of the tested equipment based on the reaction time.
Wherein after the calculating a reaction time between sending the second control signal and obtaining the second instruction, the automated testing method further comprises:
transmitting a third control signal to the smart power supply to cause the smart power supply to disconnect the power supply based on the third control signal.
The other technical scheme adopted by the application is to provide another automatic test method, wherein the automatic test method is applied to an automatic test system, and the automatic test system comprises a control terminal, an intelligent power supply and a tested device connected to the intelligent power supply; the automatic test method comprises the following steps:
the tested equipment sends a first instruction for completing starting to the control terminal;
the control terminal sends a first control signal to the intelligent power supply based on the first instruction;
the intelligent power supply disconnects the power supply based on the first control signal;
the control terminal sends a second control signal to the intelligent power supply;
the intelligent power supply is connected with the power supply based on the second control signal;
and the tested equipment acquires a second instruction for completing the power-off restart of the tested equipment, and completes the automatic test.
The automatic test system further comprises an android device;
the control terminal sends a first control signal to the intelligent power supply based on the first instruction, and the first control signal comprises the following steps:
sending a simulation command to the android device based on the first instruction;
and the android device sends the first control signal to the intelligent power supply based on the simulation command.
Another technical solution adopted by the present application is to provide a terminal device, where the terminal device includes a memory and a processor coupled to the memory;
wherein the memory is used for storing program data and the processor is used for executing the program data to realize the automatic testing method.
Another technical solution adopted by the present application is to provide a computer storage medium, where the computer storage medium is used to store program data, and the program data is used to implement the automated testing method as described above when being executed by a computer.
The beneficial effect of this application is: the method comprises the steps that a control terminal obtains a first instruction of starting completion of tested equipment connected to an intelligent power supply; sending a first control signal to the intelligent power supply based on the first instruction, so that the intelligent power supply cuts off the power supply based on the first control signal; sending a second control signal to the smart power supply to cause the smart power supply to connect to the power supply based on the second control signal; and acquiring a second instruction which is completed by restarting the tested equipment after power failure, and completing the automatic test. The automatic testing method can provide an automatic testing effect without manual intervention through the intelligent socket.
Drawings
The above and other objects, features and advantages of exemplary embodiments of the present disclosure will become readily apparent from the following detailed description, which proceeds with reference to the accompanying drawings. Several embodiments of the present disclosure are illustrated by way of example, and not by way of limitation, in the figures of the accompanying drawings and in which like reference numerals refer to like or corresponding parts and in which:
FIG. 1 is a schematic flow chart diagram illustrating an exemplary automated testing method provided herein;
FIG. 2 is a block diagram of an embodiment of an automated test system provided herein;
FIG. 3 is a schematic flow chart diagram illustrating another embodiment of an automated testing method provided herein;
fig. 4 is a schematic structural diagram of an embodiment of a terminal device provided in the present application;
FIG. 5 is a schematic structural diagram of an embodiment of a computer storage medium provided in the present application.
Detailed Description
The technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the drawings in the embodiments of the present disclosure, and it is obvious that the described embodiments are some, but not all embodiments of the present disclosure. All other embodiments, which can be derived by a person skilled in the art from the embodiments disclosed herein without making any creative effort, shall fall within the protection scope of the present disclosure.
Specific embodiments of the present disclosure are described in detail below with reference to the accompanying drawings.
Referring to fig. 1 and fig. 2, fig. 1 is a schematic flowchart of an embodiment of an automated testing method provided by the present application, and fig. 2 is a schematic framework diagram of an embodiment of an automated testing system provided by the present application.
As shown in fig. 2, the automatic test system provided by the present application at least includes a PC, i.e. a control terminal, an intelligent power supply and a device under test; the tested equipment is communicated with an intelligent power supply, and the intelligent power supply is plugged in a physical socket. In an embodiment, the automatic test system further comprises an android device, the android device is provided with an intelligent power supply control APP, and the intelligent power supply can be remotely controlled.
The following describes the functions and workflow of the automated testing system in detail with reference to the process of the automated testing method, wherein the automated testing method of the embodiment is applied to a control terminal in the automated testing system.
As shown in fig. 1, the automated testing method according to the embodiment of the present application may specifically include the following steps:
step S11: the method comprises the steps of obtaining a first instruction of starting completion of a device to be tested connected to an intelligent power supply.
In the embodiment of the application, in the control program of the control terminal, a first instruction for completing the starting of the device to be tested can be received.
Step S12: and sending a first control signal to the intelligent power supply based on the first instruction so that the intelligent power supply disconnects the power supply based on the first control signal.
In the embodiment of the application, the control terminal acquires that the tested equipment is in a normal working state based on the first instruction. Then, the control terminal may further send a first control signal to the intelligent power supply, so that the intelligent power supply disconnects from the power supply on the physical socket according to the first control signal, so that the device under test installed on the intelligent power supply disconnects from the power supply, and the normal operating state is changed to an offline state.
In one embodiment, the control terminal sends an analog command to the android device based on the first instruction, so that the android device sends a first control signal to the intelligent power supply based on the analog command.
Specifically, the control terminal can be through writing Python script control program to utilize the adb command that android equipment provided, this android equipment of simulation people hand touch action is controlled, thereby control smart jack, send first instruction promptly for intelligent power supply. Here, the information of each touch event needs to be acquired through the adb shell getevent, then a corresponding command is sent through the adb shell sendevent, the validity of the touch event is verified, and finally the touch screen event is sent in the control program according to the needs.
The ADB is called Android Debug Bridge, plays a role of debugging Bridge, and is a client-server program. The client is a computer used for operation, and the server is Android equipment. The ADB is also a tool in the Android SDK, and can directly operate and manage the Android simulator or real Android equipment.
Wherein, when the staff installs the APP of controlling this smart jack on android equipment, can be through this APP of manual operation to verify APP's usability.
Step S13: and sending a second control signal to the intelligent power supply so that the intelligent power supply is connected with the power supply based on the second control signal.
In the embodiment of the application, the control terminal sends the second control signal to the intelligent power supply again after controlling the tested device to enter the offline state, that is, after the power supply of the tested device is disconnected, so that the intelligent power supply is powered on again according to the second control signal, and the tested device is restarted.
The control procedure is the same as that of step S12, and will not be described herein.
Step S14: and acquiring a second instruction for completing the power-off and restarting of the tested equipment to complete the automatic test.
In the embodiment of the application, if the tested equipment is successfully restarted after power failure, the tested equipment can send a start-up instruction to the control terminal, and the control terminal obtains a second instruction for completing the power failure and restart of the tested equipment, so that an automatic test process for one-time power failure and restart of the tested equipment can be completed.
In an embodiment, when the control terminal cannot obtain the second command of completing the power-off restart from the device to be tested within the preset time, the control terminal may consider that the device to be tested cannot be normally started, and output test information that the device to be tested fails in the power-off restart and cannot be normally started, so as to achieve an effect of an automatic test.
In another embodiment, when the control terminal obtains a second instruction of the tested device after power-off and restart are completed within a preset time, calculating the reaction time between sending a second control signal and obtaining the second instruction; then, the power-off restart reaction efficiency of the device under test is output based on the reaction time. The control terminal can evaluate the performance of the intelligent power supply and the performance of the tested equipment through the power-off restarting reaction efficiency of the tested equipment, so that the working states of the intelligent power supply and the tested equipment are monitored.
After the control terminal obtains the command of completing the power-off restart of the tested equipment, the control terminal can also continue to send the control signal, and repeats the power-off restart control flow of the intelligent power supply and the tested equipment until the tested equipment is detected to be powered off and restarted and cannot be started normally.
In addition, the control terminal can adjust the strategy of the control program according to different test requirements, so as to achieve more detailed test requirements, such as setting control frequency, control duration, automatic control period and the like.
In the embodiment of the application, a control terminal acquires a first instruction for completing the starting of a device to be tested connected to an intelligent power supply; sending a first control signal to the intelligent power supply based on the first instruction, so that the intelligent power supply cuts off the power supply based on the first control signal; sending a second control signal to the smart power supply to cause the smart power supply to connect to the power supply based on the second control signal; and acquiring a second instruction which is completed by restarting the tested equipment after power failure, and completing the automatic test. The automatic test method can provide an automatic test effect without manual intervention through the intelligent socket.
For the test, the socket switch is not required to be operated mechanically repeatedly or the power supply of the equipment is not required to be plugged in and out, and only a control program in the PC is required to be operated. And the control program can be modified according to the needs to meet more flexible test requirements, for example, some control programs for random power-off restarting in the power-on process, or random power-off after the completion of starting, or automatic power-off restarting in the process of executing some specific operations, such as software upgrading and the like, can be set to achieve the test purpose.
Referring to fig. 3, fig. 3 is a schematic flow chart of another embodiment of the automated testing method provided by the present application, and the automated testing method of the present embodiment is applied to the automated testing system in fig. 2.
As shown in fig. 3, the automated testing method according to the embodiment of the present application may specifically include the following steps:
step S21: and the tested equipment sends a first instruction for completing starting to the control terminal.
Step S22: the control terminal sends a first control signal to the intelligent power supply based on the first instruction.
Step S23: the smart power supply disconnects the power supply based on the first control signal.
Step S24: and the control terminal sends a second control signal to the intelligent power supply.
Step S25: the intelligent power supply is connected with the power supply based on the second control signal.
Step S26: and the tested equipment acquires a second instruction of completing the power-off and restarting of the tested equipment, and the automatic test is completed.
The automated testing process of the embodiment of the present application is substantially the same as the automated testing process shown in fig. 1, and is not described herein again.
The above embodiments are only one of the common cases of the present application and do not limit the technical scope of the present application, so that any minor modifications, equivalent changes or modifications made to the above contents according to the essence of the present application still fall within the technical scope of the present application.
Continuing to refer to fig. 4, fig. 4 is a schematic structural diagram of an embodiment of a terminal device provided in the present application. The terminal device 400 of the embodiment of the present application includes a processor 41, a memory 42, an input-output device 43, and a bus 44.
The processor 41, the memory 42, and the input/output device 43 are respectively connected to the bus 44, the memory 42 stores program data, and the processor 41 is configured to execute the program data to implement the automated testing method according to the above embodiment.
In the embodiment of the present application, the processor 41 may also be referred to as a CPU (Central Processing Unit). Processor 41 may be an integrated circuit chip having signal processing capabilities. Processor 41 may also be a general purpose processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components. A general purpose processor may be a microprocessor or the processor 41 may be any conventional processor or the like.
Please refer to fig. 5, wherein fig. 5 is a schematic structural diagram of an embodiment of a computer storage medium provided in the present application, the computer storage medium 500 stores program data 51, and the program data 51 is used to implement the automated testing method of the above embodiment when being executed by a processor.
Embodiments of the present application may be implemented in software functional units and may be stored in a computer readable storage medium when sold or used as a stand-alone product. Based on such understanding, the technical solution of the present application may be substantially implemented or contributed by the prior art, or all or part of the technical solution may be embodied in a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, a network device, or the like) or a processor (processor) to execute all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk, and various media capable of storing program codes.
In the above description of the present specification, the terms "fixed," "mounted," "connected," or "connected," and the like, are to be construed broadly unless otherwise expressly specified or limited. For example, with the term "coupled", it can be fixedly coupled, detachably coupled, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship. Therefore, unless the specification explicitly defines otherwise, those skilled in the art can understand the specific meaning of the above terms in the present invention according to specific situations.
In light of the foregoing description of the present specification, those skilled in the art will also understand that terms used herein, such as "upper," "lower," "front," "rear," "left," "right," "length," "width," "thickness," "vertical," "horizontal," "top," "bottom," "inner," "outer," "axial," "radial," "circumferential," "center," "longitudinal," "lateral," "clockwise," or "counterclockwise," etc., indicate that such terms are based on the orientations and positional relationships illustrated in the drawings of the present specification, and are intended merely to facilitate explanation of the invention and to simplify the description, but do not indicate or imply that the device or element involved must have the particular orientation, be constructed and operated in the particular orientation, and therefore such terms are not to be understood or interpreted as limiting the scope of the present invention.
In addition, the terms "first" or "second", etc. used in this specification are used to refer to numbers or ordinal numbers only for descriptive purposes and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the feature. In the description of the present specification, "a plurality" means at least two, for example, two, three or more, and the like, unless specifically defined otherwise.
While various embodiments of the present invention have been shown and described herein, it will be obvious to those skilled in the art that such embodiments are provided by way of example only. Numerous modifications, changes, and substitutions will occur to those skilled in the art without departing from the spirit and scope of the present invention. It should be understood that various alternatives to the embodiments of the invention described herein may be employed in practicing the invention. It is intended that the following claims define the scope of the invention and that the module compositions, equivalents, or alternatives falling within the scope of these claims be covered thereby.
Claims (10)
1. An automatic test method is applied to a control terminal, and the automatic test method comprises the following steps:
acquiring a first instruction for completing the starting of a device to be tested connected to an intelligent power supply;
sending a first control signal to the intelligent power supply based on the first instruction so that the intelligent power supply disconnects the power supply based on the first control signal;
sending a second control signal to the smart power supply to cause the smart power supply to connect to the power supply based on the second control signal;
and acquiring a second instruction which is completed by restarting the tested equipment after power failure, and completing the automatic test.
2. The automated testing method of claim 1,
the sending of a first control signal to the smart power supply based on the first instruction,
and sending a simulation command to the android device based on the first instruction, so that the android device sends the first control signal to the intelligent power supply based on the simulation command.
3. The automated testing method of claim 2,
the simulation command is a command of a client-server program, and the control terminal simulates a hand touch action to control the android device by using the simulation command.
4. The automated testing method of claim 1,
the obtaining of the second instruction completed by restarting the tested device after power failure completes the automated test includes:
and outputting test information that the tested equipment fails to be powered off and restarted and cannot be started normally when the second instruction for completing the power-off restart cannot be obtained from the tested equipment within the preset time.
5. The automated testing method of claim 1,
the obtaining of the second instruction completed by restarting the tested device after power failure completes the automated test includes:
when a second instruction of the tested equipment which is restarted after power failure is obtained within preset time, calculating reaction time between sending the second control signal and obtaining the second instruction;
and outputting the power-off restarting reaction efficiency of the tested equipment based on the reaction time.
6. The automated testing method of claim 5,
after the calculating the reaction time between sending the second control signal and obtaining the second instruction, the automated testing method further comprises:
and sending a third control signal to the intelligent power supply to enable the intelligent power supply to disconnect the power supply based on the third control signal.
7. An automatic test method is characterized in that the automatic test method is applied to an automatic test system, and the automatic test system comprises a control terminal, an intelligent power supply and a device to be tested, wherein the device to be tested is connected to the intelligent power supply; the automatic testing method comprises the following steps:
the tested equipment sends a first instruction for completing starting to the control terminal;
the control terminal sends a first control signal to the intelligent power supply based on the first instruction;
the intelligent power supply disconnects the power supply based on the first control signal;
the control terminal sends a second control signal to the intelligent power supply;
the intelligent power supply is connected with the power supply based on the second control signal;
and the tested equipment acquires a second instruction which is completed by the power-off restart of the tested equipment, and the automatic test is completed.
8. The automated testing method of claim 7, wherein the automated testing system further comprises an android device;
the control terminal sends a first control signal to the intelligent power supply based on the first instruction, and the first control signal comprises the following steps:
sending a simulation command to the android device based on the first instruction;
and the android device sends the first control signal to the intelligent power supply based on the simulation command.
9. A terminal device, comprising a memory and a processor coupled to the memory;
wherein the memory is configured to store program data and the processor is configured to execute the program data to implement the automated testing method of any of claims 1-8.
10. A computer storage medium for storing program data for implementing an automated testing method according to any one of claims 1 to 8 when executed by a computer.
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| CN202210970483.2A CN115576229A (en) | 2022-08-12 | 2022-08-12 | Automatic testing method, terminal equipment and computer storage medium |
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| CN202210970483.2A CN115576229A (en) | 2022-08-12 | 2022-08-12 | Automatic testing method, terminal equipment and computer storage medium |
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| KR20070074824A (en) * | 2006-01-10 | 2007-07-18 | 주식회사디아이 | All automatic return systems of semiconductor tester and the return method |
| CN103927257A (en) * | 2013-01-16 | 2014-07-16 | 珠海市君天电子科技有限公司 | Method and device for triggering android behavior event |
| CN109684146A (en) * | 2018-12-28 | 2019-04-26 | 北京旷视科技有限公司 | Upper and lower electric test method, device, system and processing equipment |
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Application publication date: 20230106 |