CN115575801A - Chip detection device based on temperature change - Google Patents
Chip detection device based on temperature change Download PDFInfo
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- CN115575801A CN115575801A CN202211561651.9A CN202211561651A CN115575801A CN 115575801 A CN115575801 A CN 115575801A CN 202211561651 A CN202211561651 A CN 202211561651A CN 115575801 A CN115575801 A CN 115575801A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2875—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2877—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to cooling
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Abstract
The invention discloses a chip detection device based on temperature change, which relates to the technical field of chip detection and comprises a detection table, wherein the detection table is circular, a rotary table is arranged on the outer wall of the top of the detection table, and a rotating mechanism is arranged outside the detection table; the external installation rotating mechanism is arranged on the outer wall of the top of the detection table; an internal detection mechanism; the inner detection mechanism is arranged in the outer installation rotating mechanism, and comprises a sealing barrel, a stand column and four heat preservation partition plates, wherein the sealing barrel, the stand column and the four heat preservation partition plates are arranged on the outer wall of the top of the rotary table. The chip detection device based on temperature change disclosed by the invention can change the temperature of the chip by rotating the externally-mounted rotating mechanism after the test is finished once, so that all chips in the same batch can be subjected to low-temperature, normal-temperature and high-temperature detection, namely each chip can be subjected to relatively comprehensive detection, the functions are relatively complete, and the detection can be carried out on a renewed chip.
Description
Technical Field
The invention relates to the technical field of chip detection, in particular to a chip detection device based on temperature change.
Background
Chip test, designing initial system level chip test. The basis of SoC is a deep submicron process, so a brand new method is needed for testing Soc devices. Since each functional element has its own testing requirements, the design engineer must make a test plan at the beginning of the design.
The temperature of the chip during operation can affect the performance of the chip, and the specific embodiment is as follows:
1. under high temperature, the electrolyte in the capacitor boils, the pressure rises, and when the pressure exceeds the pressure borne by the aluminum shell of the electrolytic capacitor, slurry explosion occurs;
2. the increase of the temperature can strengthen the activity of the substance, so as to accelerate the progress of the chemical reaction, and the essence of the corrosion is the chemical reaction, so that the corrosion resistance of the chip is reduced under the situation of high temperature;
3. the irregular motion of various particles is strengthened when the temperature rises, and the performance of the chip is unstable due to the movement of electrons.
At present, few devices are available for detecting one chip at different temperatures according to temperature changes, performing comparative detection on a plurality of chips and simultaneously judging whether the chip is refurbished or not.
Disclosure of Invention
The invention discloses a chip detection device based on temperature change, and aims to solve the technical problems that detection is rarely carried out on one chip at different temperatures according to the temperature change, a plurality of chips are compared and detected, and whether the chip is renovated or not can be identified at present.
In order to achieve the purpose, the invention adopts the following technical scheme:
the utility model provides a chip detection device based on temperature variation, is including examining test table, it is circular to examine test table, the top outer wall of examining test table is provided with the revolving stage, still includes:
a rotating mechanism is arranged outside; the external installation rotating mechanism is arranged on the outer wall of the top of the detection table;
an internal detection mechanism; the internal detection mechanism is arranged inside the externally-mounted rotating mechanism and comprises a sealing barrel, a stand column and four heat insulation partition plates, the sealing barrel is arranged on the outer wall of the top of the rotary table, the stand column is divided into a low-temperature detection area, a first high-temperature detection area, a second high-temperature detection area and a normal-temperature detection area through the four heat insulation partition plates, and the stand column is of an upward-extending hollow structure;
a camera adjusting mechanism; the camera shooting adjusting mechanism comprises a driving mechanism arranged in a hollow structure of the upright post and an installation barrel arranged on the peripheral inner wall of the upright post, a slidable sliding barrel is arranged on the inner wall of the installation barrel, a convex lens and a placing barrel are respectively arranged on the inner wall of the sliding barrel, a camera lens is arranged in the placing barrel, threaded rods which are used for driving the sliding barrel to slide and are matched with the driving mechanism to use are arranged on the peripheral inner wall of the upright post, and mounting plates and concave lenses arranged on the mounting plates are arranged on the peripheral outer walls of the upright post;
a refresh detection mechanism; the refurbishment detection mechanism is arranged in the second high-temperature detection area and comprises a chemical agent storage box and a collection box which are arranged in the second high-temperature detection area, and the outer wall of the bottom of the chemical agent storage box is provided with a dispersion pipe and an electromagnetic valve arranged on the outer wall of the dispersion pipe;
a temperature adjustment mechanism; the temperature adjusting mechanism is arranged at the top of the external installation rotating mechanism.
The renovation detection mechanism control solenoid valve that sets up in the second high temperature detection zone emits chemical agent and carries out the medicament corruption to the chip under high temperature, then utilize camera lens to observe whether there is the mar after chip surface coating is stripped, the breach, type or recoat, thereby come the appraisal chip whether for renovating the chip, and two chips that contain in the detection zone of same temperature, the operation test under this temperature is directly done to a chip, appearance test when the operation is done to another chip, the device can do low temperature simultaneously to same batch of chip, normal atmospheric temperature and high temperature detection, can observe the contrast result that detects simultaneously, it can change the chip temperature to rotate externally mounted slewing mechanism after once the test is accomplished, thereby can let same batch of all chips all pass through low temperature, normal atmospheric temperature and high temperature detection, that is to say that each chip all can pass through more comprehensive detection, the function is more complete, can also detect the renovation chip, and is simple in operation.
In a preferred scheme, the driving mechanism comprises a subdivision knob arranged on the outer wall of the top fixing barrel, a rotating rod is arranged at the bottom of the subdivision knob, a second bevel gear is arranged at one end of the rotating rod, a first bevel gear is arranged at one end of a threaded rod, the first bevel gear is meshed with the second bevel gear, a through groove in a shape like a Chinese character 'tu' is arranged at the bottom of the mounting barrel, an adapting block in sliding fit with the through groove is arranged on the outer wall of the bottom of the sliding barrel, the distance between the camera lens and the convex lens is kept unchanged, and the threaded rod drives the sliding barrel to slide so as to adjust the imaging distance between the convex lens and the concave lens.
The sliding barrel is controlled to slide along the inner wall of the mounting barrel, so that the distance between the convex lens and the concave lens is adjusted, the telescope-like principle is kept away, the imaging definition is adjusted, the operation is simple, and the size of the chip in the same batch is the same, so that the operation can be completed by adjusting the subdividing knob once.
In a preferred scheme, the top outer wall of the first detection box and the second detection box are provided with first clamping grooves, the first clamping grooves and the second clamping grooves are used for placing chips, one ends, close to the outside, of the first detection box and the second detection box are provided with display screens used for displaying running data of the chips, the second clamping grooves of the second detection box are not powered on, and the other ends of the second detection box and all the first clamping grooves are powered on and are connected with the corresponding display screens.
Through camera lens outward appearance when can observing the chip running state and by the outward appearance when chemical agent strips the cladding material to this increases the scientificity of chip detection, lets the testing result have the contrast simultaneously, and same detection zone has two chip contrast detections.
By last, a chip detection device based on temperature variation, including examining test table, it is circular to examine test table, the top outer wall that examines test table is provided with the revolving stage, still includes:
a rotating mechanism is arranged outside; the external installation rotating mechanism is arranged on the outer wall of the top of the detection table;
an internal detection mechanism; the internal detection mechanism is arranged inside the externally-mounted rotating mechanism and comprises a sealing barrel arranged on the outer wall of the top of the rotary table, a stand column and four heat-insulation partition plates, the sealing barrel and the stand column are divided into a low-temperature detection area, a first high-temperature detection area, a second high-temperature detection area and a normal-temperature detection area through the four heat-insulation partition plates, and the stand column is of an upwardly-extending hollow structure;
a camera adjusting mechanism; the camera shooting adjusting mechanism comprises a driving mechanism arranged in a hollow structure of the upright post and an installation barrel arranged on the peripheral inner wall of the upright post, a slidable sliding barrel is arranged on the inner wall of the installation barrel, a convex lens and a placing barrel are respectively arranged on the inner wall of the sliding barrel, a camera lens is arranged in the placing barrel, threaded rods which are used for driving the sliding barrel to slide and are matched with the driving mechanism to use are arranged on the peripheral inner wall of the upright post, and mounting plates and concave lenses arranged on the mounting plates are arranged on the peripheral outer walls of the upright post;
a refresh detection mechanism; the refurbishment detection mechanism is arranged in the second high-temperature detection area and comprises a chemical agent storage box and a collection box which are arranged in the second high-temperature detection area, and a dispersion pipe and an electromagnetic valve arranged on the outer wall of the dispersion pipe are arranged on the outer wall of the bottom of the chemical agent storage box;
a temperature adjustment mechanism; the temperature adjusting mechanism is arranged at the top of the external installation rotating mechanism. The chip detection device based on temperature change provided by the invention can change the temperature of the chip by rotating the externally-mounted rotating mechanism after the test is completed once, so that all chips in the same batch can be subjected to low-temperature, normal-temperature and high-temperature detection, namely each chip can be subjected to relatively comprehensive detection, the functions are relatively complete, the detection can be carried out on the renewed chip, and the operation is simple.
Drawings
Fig. 1 is a schematic view of an overall structure of a chip detection device based on temperature variation according to the present invention.
Fig. 2 is a three-dimensional structure diagram of the internal distribution of the sealed barrel of the chip detection device based on temperature change.
Fig. 3 is a vertical column structure diagram of a chip detection device based on temperature change according to the present invention.
Fig. 4 is a three-dimensional structure diagram of a refresh detection mechanism of a chip detection device based on temperature change according to the present invention.
Fig. 5 is an enlarged schematic view of a portion a in fig. 4.
Fig. 6 is a three-dimensional structure diagram of a camera adjustment mechanism of a chip detection device based on temperature change according to the present invention.
Fig. 7 is a three-dimensional structure diagram of the inside of a mounting cylinder of the chip detection device based on temperature change according to the present invention.
Fig. 8 is a three-dimensional structure diagram of a focus control mechanism of a chip detection device based on temperature change according to the present invention.
In the figure: 1. a detection table; 2. a bottom fixed cylinder; 3. a drum; 4. a top fixed cylinder; 5. a cold gas production tank; 6. a heating box; 7. a subdivision knob; 8. a handle; 9. a connecting rod; 1001. a low temperature detection zone; 1002. a first high temperature detection zone; 1003. a second high temperature detection zone; 1004. detecting a zone at normal temperature; 11. sealing the barrel; 12. a heat-insulating partition plate; 13. a first detection box; 14. a column; 15. a chemical agent storage tank; 16. a first card slot; 17. a second detection box; 1701. a through hole; 1702. an aluminum foil bag; 1703. a leak hole; 1704. a second card slot; 18. a display screen; 19. a collection box; 20. mounting a plate; 21. an electromagnetic valve; 22. a fixing frame; 23. a rotating rod; 24. mounting the cylinder; 25. a threaded rod; 26. an adaptation block; 28. a concave lens; 29. a first bevel gear; 30. a second bevel gear; 31. a camera lens; 32. placing the cylinder; 33. a slide cylinder; 34. a convex lens; 35. a pressure sensor; 36. a baffle plate; 37. an explosion-proof air bag.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
The chip detection device based on temperature change is mainly applied to few scenes that detection is carried out on one chip at different temperatures according to the temperature change, comparison detection is carried out on a plurality of chips, and whether the chip is renovated or not can be identified at present.
Referring to fig. 1 and 2, a chip detection device based on temperature variation, including examining test table 1, examine test table 1 and be circular, the top outer wall of examining test table 1 is provided with the revolving stage, still includes:
a rotating mechanism is arranged outside; the external installation rotating mechanism is arranged on the outer wall of the top of the detection table 1;
an internal detection mechanism; the internal detection mechanism is arranged inside the externally-mounted rotating mechanism and comprises a sealing barrel 11, an upright post 14 and four heat-insulation partition plates 12, wherein the sealing barrel 11, the upright post 14 and the four heat-insulation partition plates 12 are arranged on the outer wall of the top of the rotary table, the sealing barrel 11 and the upright post 14 are divided into a low-temperature detection area 1001, a first high-temperature detection area 1002, a second high-temperature detection area 1003 and a normal-temperature detection area 1004 through the four heat-insulation partition plates 12, and the upright post 14 is of a hollow structure extending upwards;
a camera adjusting mechanism; the camera shooting adjusting mechanism comprises a driving mechanism arranged in a hollow structure of the upright post 14 and an installation barrel 24 arranged on the peripheral inner wall of the upright post 14, a slidable sliding barrel 33 is arranged on the inner wall of the installation barrel 24, a convex lens 34 and a placing barrel 32 are respectively arranged on the inner wall of the sliding barrel 33, a camera lens 31 is arranged in the placing barrel 32, threaded rods 25 which are used for driving the sliding barrel 33 to slide and are matched with the driving mechanism to use are arranged on the peripheral inner wall of the upright post 14, and a mounting plate 20 and a concave lens 28 arranged on the mounting plate 20 are arranged on the peripheral outer wall of the upright post 14;
a refresh detection mechanism; the refurbishment detection mechanism is arranged in the second high-temperature detection area 1003, the refurbishment detection mechanism comprises a chemical agent storage box 15 and a collection box 19 which are arranged in the second high-temperature detection area 1003, and a dispersion pipe and an electromagnetic valve 21 arranged on the outer wall of the dispersion pipe are arranged on the outer wall of the bottom of the chemical agent storage box 15;
a temperature adjustment mechanism; the temperature adjusting mechanism is arranged at the top of the external installation rotating mechanism.
The sealed barrel 11 is divided into four areas through the heat-insulating partition plate 12 and the upright post 14, namely a low-temperature detection area 1001, a first high-temperature detection area 1002, a second high-temperature detection area 1003 and a normal-temperature detection area 1004, then eight chips in the same batch are divided into four parts through an internal detection mechanism, two chips are placed in each area, so that the four parts of chips can be placed in different areas to be detected under different temperature conditions, the first high-temperature detection area 1002 and the second high-temperature detection area 1003 are synchronous in temperature, therefore, the two parts of chips are simultaneously observed by using the camera lens 31 at the same temperature, meanwhile, the renewing detection mechanism control electromagnetic valve 21 and the chemical storage box 15 arranged in the second high-temperature detection area 1003 emit chemical agents to corrode the chips at high temperature, then the camera lens 31 is used for observing whether scratches exist after the surface coatings of the chips are stripped, gaps, typing or recoating is carried out, so as to judge whether the chips are renewed chips, and the two chips contained in the detection area at the same temperature, one chip directly carries out operation appearance test at the same temperature, and the other chip can carry out the operation appearance test on the same chip batch at the same time.
Wherein, externally mounted slewing mechanism is including setting up in the fixed section of thick bamboo 2 of the bottom of detecting 1 top outer wall of platform and the fixed section of thick bamboo 4 of top that is fixed in the fixed section of thick bamboo 2 headspace of bottom and has the certain distance with the fixed section of thick bamboo 2 of bottom through connecting rod 9, the fixed section of thick bamboo 3 of being connected just rather than rotating between the fixed section of thick bamboo 4 of top and bottom, the top outer wall of the fixed section of thick bamboo 4 of top is provided with cold gas production case 5 and heating cabinet 6, cold gas production case 5 sends into low temperature detection area 1001 with air conditioning through the connecting pipe, first high temperature detection area 1002 and second high temperature detection area 1003 are sent into with the heating installation through two pipelines to the output of heating cabinet 6, the outer wall of rotary drum 3 is provided with four handles 8.
Specifically, the position of each handle 8 corresponds to the position of the thermal insulation partition 12, so that when the handle 8 is rotated, each time the handle 8 is opposite to the inner wall of the connecting rod 9, the four areas in the sealed barrel 11 can just correspond to the temperature adjusting mechanism on the top of the top fixed barrel 4.
The upright column 14, the heat-insulating partition plate 12 and the sealing barrel 11 are all made of aluminum silicate refractory fiber boards, the highest temperature resistance temperature of the aluminum silicate refractory fiber boards is 1000-1250 ℃, the highest temperature of chip detection cannot exceed 125 ℃, and therefore good independent temperature areas are formed among the four areas and cannot be influenced mutually.
Referring to fig. 1 and 4, in a preferred embodiment, the driving mechanism comprises a subdivision knob 7 arranged on the outer wall of the top fixed cylinder 4, a rotating rod 23 is arranged at the bottom of the subdivision knob 7, a second bevel gear 30 is arranged at one end of the rotating rod 23, a first bevel gear 29 is arranged at one end of a threaded rod 25, the first bevel gear 29 is meshed with the second bevel gear 30, a through groove in a shape like a Chinese character 'tu' is arranged at the bottom of the mounting cylinder 24, an adapting block 26 which is in sliding fit with the through groove is arranged on the outer wall of the bottom of a sliding cylinder 33, the distance between the camera lens 31 and the convex lens 34 is kept constant, and the threaded rod 25 drives the sliding cylinder 33 to slide for adjusting the imaging distance between the convex lens 34 and the concave lens 28; when observing the corresponding chip outward appearance through camera lens 31, probably because the chip size and dimension is different and lead to camera lens 31 can not all very clear at every turn to observe the outward appearance of chip, people can rotate segmentation knob 7 this moment, segmentation knob 7 drives bull stick 23 and rotates, bull stick 23 pivoted drives second bevel gear 30 simultaneously and rotates, second bevel gear 30 pivoted drives first bevel gear 29 simultaneously and rotates, first bevel gear 29 pivoted drives threaded rod 25 simultaneously and rotates, threaded rod 25 pivoted drives smooth barrel 33 simultaneously and slides along the inner wall of installation barrel 24, thereby adjust the distance between convex lens 34 and the concave lens 28, the similar telescope of principle is kept away from, and then adjust the definition of formation of image.
Wherein, the inner wall all around of stand 14 all is provided with the fixed frame 22 that is used for stabilizing bull stick 23 and threaded rod 25.
It should be noted that: the fixed frame 22 is connected with the threaded rod 25 and the rotating rod 23 through bearings.
Referring to fig. 1 and 3, in a preferred embodiment, the internal detection mechanism further includes mounting holes disposed on the outer walls of the sealed barrel 11 and the rotating drum 3, a sleeve is disposed on the inner wall of the mounting hole, a first detection box 13 or a second detection box 17 is disposed on the inner wall of the sleeve, the number of the first detection box 13 is three, the number of the second detection box 17 is one, the second detection box 17 is located in the second high temperature detection region 1003, a plurality of through holes 1701 is disposed on the outer wall of the top of the second detection box 17, a second clamping slot 1704 is disposed on each of the first detection box 13 and the second detection box 17, an aluminum foil bag 1702 communicated with the through holes 1701 is disposed on the inner wall of the top of the second clamping slot 1704 in the second detection box 17, a plurality of small holes are disposed on the bottom of the aluminum foil bag 1702, a leak 1703 is disposed on the inner wall of the bottom of the second clamping slot 1704 in the second detection box 17, a fillet structure is disposed at a position of the leak 1703 close to the second clamping slot 1704, so as to facilitate discharge of the chemical, and the bottom of the leak hole 1703 communicates with the interior of the collection box 17019.
After placing the chip in second draw-in groove 1704 of second detection case 17, cover aluminium foil bag 1702 at the upper half position of chip to can prevent that the chemical agent in chemical agent storage box 15 can not flow to the inside of chip, after the chemical agent corrodes the cladding material on chip surface, chemical agent enters into collection box 19 through weeping hole 1703 and retrieves.
It should be noted that: the chemical agent is prepared by adding water into a mixture of sodium m-nitrobenzenesulfonate, sodium hydroxide and sodium cyanide, and can cleanly remove the coating, so that the appearance of the chip after the coating is removed can be conveniently observed by the camera lens 31.
Referring to fig. 1 and 3, in a preferred embodiment, first card slots 16 are disposed on top outer walls of the first detection box 13 and the second detection box 17, the first card slots 16 and the second card slots 1704 are used for placing chips, a display screen 18 for displaying chip operation data is disposed at an outer end of the first detection box 13 and the second detection box 17, the second card slot 1704 of the second detection box 17 is not powered, and other second card slots 1704 and all first card slots 16 are powered and connected to the corresponding display screen 18.
This device sets up four first draw-in grooves 16 and four second draw-in grooves 1704, only one of them second draw-in groove 1704 does not have the switch on, this second draw-in groove 1704 is established for detecting this batch of chip, remaining three second draw-in grooves 1704 and four first draw-in grooves 16 are the on-state, and the operational aspect lug connection of chip is on display screen 18, people can directly observe the operational aspect of chip under different temperatures through display screen 18, display screen 18 is one screen dual-purpose simultaneously, display screen 18 connects camera lens 31 simultaneously, outward appearance when can observing the chip operational state through camera lens 31 and the outward appearance when being peeled off the cladding material by chemical, increase the scientificity of chip detection with this, let the testing result have the contrast simultaneously, same detection zone has two chip contrast detections.
It should be noted that: the first card slot 16 and the second card slot 1704 on the same first detection box 13 are connected in parallel.
Referring to fig. 8, in a preferred embodiment, the focusing control mechanism further includes through holes disposed on the outer circumferential wall of the mounting cylinder 24 close to the concave lens 28, the through holes are equidistantly distributed on the outer circumferential wall of the mounting cylinder 24, a baffle 36 and an explosion-proof air bag 37 are equidistantly distributed on the outer circumferential wall of the mounting cylinder 24, a pressure sensor 35 is disposed on the inner top wall of the baffle 36, one end of the pressure sensor 35 is disposed on the outer wall of the explosion-proof air bag 37, and the positions of the explosion-proof air bag 37 and the through holes correspond to each other.
Wherein, the upright post 14 is made of heat preservation material.
It should be noted that: the space formed between the concave lens 28 and the convex lens 34 in the installation cylinder 24 is a closed space, and the closed space is filled with relatively stable nitrogen, when the subdivision knob 7 is rotated to drive the sliding cylinder 33 to move, the nitrogen in the closed space is partially driven into the anti-explosion air bag 37, along with the expansion of the anti-explosion air bag 37, the pressure of the anti-explosion air bag 37 on the pressure sensor 35 is gradually increased, so that the number can be displayed on the display screen 18, the position of the sliding cylinder 33 corresponds to the position of the sliding cylinder 33, people can conveniently master the position and the amplification factor of the sliding cylinder 33 in real time, a stable environment is provided for the detection and the comparison of the chip, the observation accuracy is improved, and people can judge whether the chip is a renovated chip.
The working principle is as follows: when the device is used, the sealed barrel 11 is divided into four areas, namely a low-temperature detection area 1001, a first high-temperature detection area 1002, a second high-temperature detection area 1003 and a normal-temperature detection area 1004 through the heat-insulating partition plate 12 and the upright column 14, then eight chips in the same batch are divided into four parts through the internal detection mechanism, two chips are placed in each area, so that the four parts of chips can be placed in different areas to be detected under different temperature conditions, the temperatures of the first high-temperature detection area 1002 and the second high-temperature detection area 1003 are synchronous, therefore, the two parts of chips are simultaneously observed by using the camera lens 31 at the same temperature, meanwhile, the renovation detection mechanism arranged in the second high-temperature detection area 1003 controls the electromagnetic valve 21 and the chemical storage tank 15 to emit chemical agents to corrode the chips at high temperature, then the camera lens 31 is used for observing whether scratches, notches, typewriting or recoating exists after the surface coatings of the chips are stripped, so as to identify whether the chips are renovated chips, only one of the four first clamping grooves 16 and four second clamping grooves 1704 are not connected with a power supply, when the chip is directly detected, the chip is connected with the camera lens 1704, the other three clamping grooves 18, and the chip is directly detected by the camera lens 18, and the chip is connected with the camera lens 18, and the chip display screen 18, and the chip is connected with the chip display screen 18, and the chip display screen 18, when the chip is connected with the chip.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered as the technical solutions and the inventive concepts of the present invention within the technical scope of the present invention.
Claims (10)
1. The utility model provides a chip detection device based on temperature variation, is including examining test table (1), it is circular to examine test table (1), the top outer wall of examining test table (1) is provided with the revolving stage, its characterized in that still includes:
a rotating mechanism is arranged outside; the external installation rotating mechanism is arranged on the outer wall of the top of the detection table (1);
an internal detection mechanism; the internal detection mechanism is arranged inside the externally-mounted rotating mechanism and comprises a sealing barrel (11) arranged on the outer wall of the top of the rotary table, a stand column (14) and four heat-insulation partition plates (12), the sealing barrel (11) and the stand column (14) are divided into a low-temperature detection area (1001), a first high-temperature detection area (1002), a second high-temperature detection area (1003) and a normal-temperature detection area (1004) through the four heat-insulation partition plates (12), and the stand column (14) is of a hollow structure extending upwards;
a camera adjusting mechanism; the camera shooting adjusting mechanism comprises a driving mechanism arranged in a hollow structure of the upright post (14) and an installation cylinder (24) arranged on the inner wall of the periphery of the upright post (14), a slidable sliding cylinder (33) is arranged on the inner wall of the installation cylinder (24), convex lenses (34) and a placing cylinder (32) are respectively arranged on the inner wall of the sliding cylinder (33), a camera lens (31) is arranged in the placing cylinder (32), threaded rods (25) which are used for driving the sliding cylinder (33) to slide and are matched with the driving mechanism to use are respectively arranged on the inner wall of the periphery of the upright post (14), and an installation plate (20) and concave lenses (28) arranged on the installation plate (20) are respectively arranged on the outer wall of the periphery of the upright post (14);
a refresh detection mechanism; the refurbishment detection mechanism is arranged in the second high-temperature detection area (1003), the refurbishment detection mechanism comprises a chemical agent storage box (15) and a collection box (19) which are arranged in the second high-temperature detection area (1003), and the outer wall of the bottom of the chemical agent storage box (15) is provided with a dispersion pipe and an electromagnetic valve (21) arranged on the outer wall of the dispersion pipe;
a temperature adjustment mechanism; the temperature adjusting mechanism is arranged at the top of the external installation rotating mechanism.
2. The chip detection device based on temperature change according to claim 1, wherein the externally installed rotating mechanism comprises a bottom fixed cylinder (2) arranged on the outer wall of the top of the detection platform (1) and a top fixed cylinder (4) fixed in the top space of the bottom fixed cylinder (2) through a connecting rod (9) and having a certain distance with the bottom fixed cylinder (2), a rotating cylinder (3) rotatably connected between the top fixed cylinder (4) and the bottom fixed cylinder (2), the outer wall of the top fixed cylinder (4) is provided with a cold air production box (5) and a heating box (6), the cold air production box (5) sends cold air to the low temperature detection area (1001) through a connecting pipe, the output end of the heating box (6) sends warm air to the first high temperature detection area (1002) and the second high temperature detection area (1003) through two pipes, and the outer wall of the rotating cylinder (3) is provided with four handles (8).
3. The chip detection device based on temperature change as claimed in claim 1, wherein the upright column (14), the thermal insulation partition plate (12) and the sealing barrel (11) are all made of alumina silicate refractory fiber boards.
4. The chip detection device based on temperature change according to claim 2, wherein the driving mechanism includes a subdivision knob (7) disposed on the outer wall of the top fixed cylinder (4), a rotating rod (23) is disposed at the bottom of the subdivision knob (7), a second bevel gear (30) is disposed at one end of the rotating rod (23), a first bevel gear (29) is disposed at one end of the threaded rod (25), the first bevel gear (29) and the second bevel gear (30) are engaged, a through groove in a shape like a Chinese character 'tu' is disposed at the bottom of the mounting cylinder (24), and an adapter block (26) forming a sliding fit with the through groove is disposed on the outer wall of the bottom of the sliding cylinder (33).
5. The chip detection device based on temperature change according to claim 4, wherein the distance between the camera lens (31) and the convex lens (34) is kept constant, and the threaded rod (25) drives the sliding cylinder (33) to slide for adjusting the imaging distance between the convex lens (34) and the concave lens (28).
6. The chip detection device based on temperature change according to claim 4, wherein the internal detection mechanism further comprises a mounting hole disposed on the outer wall of the sealing barrel (11) and the rotating barrel (3), the inner wall of the mounting hole is provided with a sleeve, the inner wall of the sleeve is provided with a first detection box (13) or a second detection box (17), the number of the first detection boxes (13) is three, and the number of the second detection boxes (17) is one.
7. The chip detection device based on temperature variation according to claim 6, wherein the second detection box (17) is located in the second high temperature detection region (1003), the outer wall of the top of the second detection box (17) is provided with a plurality of through holes (1701), one end of each of the first detection box (13) and the second detection box (17) is provided with a second clamping groove (1704), the inner wall of the top of the second clamping groove (1704) in the second detection box (17) is provided with an aluminum foil bag (1702) communicated with the through holes (1701), the bottom of the aluminum foil bag (1702) is provided with a plurality of small holes, the inner wall of the bottom of the second clamping groove (1704) in the second detection box (17) is provided with a leakage hole (1703), the position of the leakage hole (1703) close to the second clamping groove (1704) is provided with a round corner structure for facilitating chemical agent discharge, and the bottom of the leakage hole (1703) is communicated with the inside of the collection box (19).
8. The chip detection device based on temperature change according to claim 7, wherein the first card slot (16) is disposed on the top outer wall of each of the first detection box (13) and the second detection box (17), the first card slot (16) and the second card slot (1704) are used for placing a chip, and a display screen (18) for displaying the chip operation data is disposed at the outer end of each of the first detection box (13) and the second detection box (17).
9. The chip detection device based on temperature variation according to claim 8, wherein the second card slot (1704) of the second detection box (17) is not powered, other second card slots (1704) and all first card slots (16) are powered and connected to the corresponding display screen (18), and fixing frames (22) for stabilizing the rotating rod (23) and the threaded rod (25) are arranged on the inner peripheral walls of the upright posts (14).
10. The chip detection device based on temperature variation according to claim 1, further comprising a focusing control mechanism, wherein the focusing control mechanism comprises through holes arranged on the circumferential outer wall of the installation cylinder (24) close to the concave lens (28), the through holes are equidistantly distributed on the circumferential outer wall of the installation cylinder (24), baffles (36) and explosion-proof airbags (37) are arranged on the circumferential outer wall of the installation cylinder (24), the top inner wall of the baffle (36) is provided with a pressure sensor (35), one end of the pressure sensor (35) is arranged on the outer wall of the explosion-proof airbag (37), and the explosion-proof airbags (37) correspond to the through holes in position.
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