CN115549820B - Radio chip testing method and chip testing system - Google Patents
Radio chip testing method and chip testing system Download PDFInfo
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- CN115549820B CN115549820B CN202211532408.4A CN202211532408A CN115549820B CN 115549820 B CN115549820 B CN 115549820B CN 202211532408 A CN202211532408 A CN 202211532408A CN 115549820 B CN115549820 B CN 115549820B
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- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2289—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by configuration test
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Abstract
The invention provides a radio chip testing method and a chip testing system, wherein the method comprises the following steps: step 1: acquiring the chip model of a radio chip to be tested, and matching the chip parameters of the radio chip to be tested which are consistent with the chip model in a preset chip management library; step 2: dividing a test section of the radio chip to be tested based on the chip parameters, and setting a test factor and a tracking factor in the divided test section; and step 3: testing the radio chip to be tested based on the test factor, and simultaneously, tracking and recording the test result after testing the radio chip to be tested based on the tracking factor; through the mode of segmentation to the radio reception chip that awaits measuring test to make to the radio reception chip test more accurate and careful, can be through tracking the factor and make the test result have the mark can follow, leave valuable test data, thereby realize the accurate analysis to the test result of the radio reception chip that awaits measuring, improved the precision of test and the comprehensiveness of test.
Description
Technical Field
The invention relates to the technical field of chip testing, in particular to a radio chip testing method and a chip testing system.
Background
At present, a radio chip is a core device of a radio device such as a radio and determines the function of the radio device, so that the performance of the system performance of the whole radio device can be influenced, therefore, the chip test of the radio chip is the premise of ensuring the normal work of the radio device, and the disqualification of the radio chip can cause the core factor that the radio device cannot work normally;
however, in the radio chip test of the present day, the test of the pins is usually performed by a special test device, and the pin test is not divided, so that the test process is not precise, and the test result is inaccurate, and secondly, the test result of the radio chip is not recorded, and finally, different tests are not performed on different types of radio chips, so that the test results are too general.
Disclosure of Invention
The invention provides a radio chip testing method and a chip testing system, which are used for determining the chip model of a radio chip to be tested, further accurately matching the chip parameters of the radio chip to be tested, dividing the testing section of the radio chip to be tested, realizing the setting of a testing factor and a tracking factor in the testing section, and testing the radio chip to be tested in a segmented mode, so that the radio chip is tested more accurately and meticulously, the testing result can be traced through the tracking factor, precious testing data is left, accurate analysis of the testing result of the radio chip to be tested is realized, and the testing accuracy and the testing comprehensiveness are improved.
A radio chip testing method comprises the following steps:
step 1: acquiring the chip model of a radio chip to be tested, and matching the chip parameters of the radio chip to be tested, which are consistent with the chip model, in a preset chip management library;
step 2: dividing a test section of the radio chip to be tested based on the chip parameters, and setting a test factor and a tracking factor in the divided test section;
and step 3: and testing the radio chip to be tested based on the test factor, and simultaneously, tracking and recording the test result after testing the radio chip to be tested based on the tracking factor.
Preferably, in the step 1, the method for testing the radio chip obtains the chip model of the radio chip to be tested, and comprises the following steps:
acquiring an image of a radio chip to be tested, and simultaneously performing pixel gray processing on the chip image to obtain a chip gray image;
reading the chip gray image, determining the pixel point distribution of the chip gray image, and picking the chip main body outline pixel points of the to-be-tested radio chip in the chip gray image based on the pixel point distribution;
extracting the chip gray level image based on the chip main body outline pixel points to obtain a chip sub gray level image;
and acquiring font outline pixel points in the chip sub-gray level image, inputting the font outline pixel points into a preset character recognition library for matching, and outputting the chip model of the radio chip to be tested based on the matching result.
Preferably, the method for testing a radio chip, which obtains a font outline pixel point in a chip sub-gray level image, includes:
reading the chip sub-gray level image, and determining a first color pixel point and a second color pixel point in the chip sub-gray level image;
acquiring the number of first pixel points of the first color pixel points and the number of second pixel points of the second color pixel points, and meanwhile, determining the number of third pixel points of the chip sub-gray level image;
respectively obtaining a first proportion of the number of the first pixel points to the number of the third pixel points and a second proportion of the number of the second pixel points to the number of the third pixel points, and simultaneously comparing the first proportion with the second proportion, wherein the first proportion is not equal to the second proportion;
when the first proportion is larger than the second proportion, taking the area occupied by the first color pixel points as a first target area in the chip sub-gray level image, and taking the area occupied by the second color pixel points as a second target area in the chip sub-gray level image;
when the second proportion is larger than the first proportion, taking the area occupied by the second color pixel points as a first target area in the chip sub-gray level image, and taking the area occupied by the first color pixel points as a second target area in the chip sub-gray level image;
weakening the first target area in the chip sub-gray level image, marking the pixel points corresponding to the second target area, and determining font outline pixel points based on the marking result.
Preferably, in step 1, matching chip parameters of a radio chip to be tested, which are consistent with the chip model, in a preset chip management library, includes:
s101: reading the chip model of the radio chip to be tested, and determining the model identification of the chip model;
s102: inputting the model identification into a preset chip management library for indexing, and obtaining a target document in the preset chip management library based on an indexing result, wherein the target document comprises a target verification model;
s103: matching the chip model of the radio chip to be tested with the target verification model, and repeating the steps S101-S102 when the chip model of the radio chip to be tested is not matched with the target verification model until the chip model of the radio chip to be tested is matched with the target verification model;
s104: and when the chip model of the radio chip to be tested is matched with the target verification model, reading the target document and determining the chip parameters of the radio chip to be tested.
Preferably, in step 2, the radio chip to be tested is divided into test sections according to chip parameters, and the method includes:
obtaining a chip pin of a radio chip to be tested;
determining pin representation corresponding to chip pins;
and performing similar division on the chip pins according to the pin representations corresponding to the chip pins, and taking the division results as test sections of the radio chip to be tested.
Preferably, in step 2, the method for testing a radio chip sets a test factor and a tracking factor in the divided test segments, and includes:
respectively obtaining target pins of the radio receiving chip to be tested corresponding to the test section, and determining the pin functions corresponding to the target pins;
determining the test type of each test section based on the pin function of each test section, and setting test factors in the corresponding test sections according to different test types;
and acquiring the test characteristics of the test factors, determining corresponding tracking factors based on the test characteristics of the test factors, and setting the tracking factors in the test section.
Preferably, in step 3, the radio chip to be tested is tested based on the test factor, and meanwhile, the test result after the radio chip to be tested is traced and recorded based on the tracing factor, which includes:
inputting chip test excitation in the test factor;
testing the radio chip to be tested based on the chip test excitation and according to the test factor, and capturing the test output based on the tracking factor;
and outputting test data according to the capture result.
Preferably, in step 3, after the tracking recording is performed on the test result of the radio chip to be tested after the test is performed on the radio chip to be tested based on the tracking factor, the method further includes:
setting a safe output interval in the tracking factor based on the chip parameters, and reading an upper limit threshold of the safe output interval and a lower limit threshold of the safe output interval;
recording test data in real time based on the tracking factor, and comparing the test data with a safety output interval;
when the test data is larger than the upper limit threshold value of the safety output interval, the test data is used as first target test data, and first marks are made on the first target test data;
when the test data is in the safe output interval, the test data is used as second target test data and second marks are made on the test data;
when the test data is smaller than the lower limit threshold of the safety output interval, the test data is used as third target test data and third marks are made on the test data;
performing a first alarm operation based on the first mark, and performing a second alarm operation based on the third mark;
and generating a test report for the radio receiving chip to be tested according to the first mark, the second mark, the third mark, the first alarm operation and the second alarm operation.
Preferably, after generating a test report for the radio chip to be tested, the method further includes:
reading the test report, determining report keywords of the test report, and meanwhile, establishing a corresponding display data block according to the report keywords of the test report;
dividing the display data block into a first sub-display data block, a second sub-display data block and a third sub-display data block;
displaying first target test data and first alarm data based on the first sub-display data block, displaying second target test data in the second sub-display data block, and simultaneously displaying third test data and second alarm data in the third sub-display data block;
wherein, the first sub-display data block, the second sub-display data block, and the third sub-display data block further include:
determining a corresponding first target test segment according to the first target test data, setting a first hyperlink in a first sub-display data block, matching a first solution based on the first target test segment in a preset solution database according to the first hyperlink, and simultaneously displaying the first solution in the first sub-display data block;
determining a corresponding second target test section according to the second target test data, setting a data updating link in the second sub-display data block, and updating the second target test data into a preset scheme database according to the data updating link;
and determining a corresponding second target test segment according to the third target test data, setting a second hyperlink in a third sub-display data block, matching a second solution based on the third target test segment in a preset solution database according to the second hyperlink, and simultaneously displaying the second solution in the third sub-display data block.
A radio chip testing system, comprising:
the model determining module is used for acquiring the chip model of the radio chip to be tested and matching the chip parameters of the radio chip to be tested, which are consistent with the chip model, in the preset chip management library;
the test section confirmation module is used for dividing the test section of the radio chip to be tested based on the chip parameters and setting a test factor and a tracking factor in the divided test section;
and the test module is used for testing the radio chip to be tested based on the test factor, and simultaneously, tracking and recording the test result after the radio chip to be tested is tested based on the tracking factor.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by the practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
The technical solution of the present invention is further described in detail by the accompanying drawings and embodiments.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
FIG. 1 is a flow chart of a method for testing a radio chip according to an embodiment of the present invention;
FIG. 2 is a flowchart of step 1 of a radio chip testing method according to an embodiment of the present invention;
fig. 3 is a block diagram of a radio chip testing system according to an embodiment of the present invention.
Detailed Description
The preferred embodiments of the present invention will be described in conjunction with the accompanying drawings, and it will be understood that they are described herein for the purpose of illustration and explanation and not limitation.
Example 1:
the embodiment provides a radio chip testing method, as shown in fig. 1, including:
step 1: acquiring the chip model of a radio chip to be tested, and matching the chip parameters of the radio chip to be tested, which are consistent with the chip model, in a preset chip management library;
and 2, step: dividing a test section of the radio chip to be tested based on the chip parameters, and setting a test factor and a tracking factor in the divided test section;
and step 3: and testing the radio chip to be tested based on the test factor, and simultaneously, tracking and recording the test result after testing the radio chip to be tested based on the tracking factor.
In this embodiment, the chip model may be determined by identifying the radio chip to be tested after image acquisition processing, and the general chip model is in the main body of the radio chip to be tested, wherein the chip model of the radio chip to be tested may include: c9610 hand-tuning AM/FM/SW/LW radio receiving chip, C9611/12/13 hand-tuning AM/FM radio receiving chip, C9616 hand-tuning AM/FM/SW radio receiving chip, C9620 hand-tuning digital display AM/FM/SW/LW radio receiving chip, C9636 electric tuning (PLL) AM/FM/SW/LW/RDS radio receiving chip, C9650 hand-tuning AM/FM/WB radio receiving chip and C9652 electric tuning (PLL) AM/FM/WB radio receiving chip.
In this embodiment, the preset chip management library is set in advance, and stores all the radio chips and the chip parameters corresponding to the radio chips.
In this embodiment, the chip parameters may include the name of the chip pin of the radio chip to be tested, the working performance of the chip pin, and other parameters, for example, the power supply pin is generally connected to a voltage of 2.2V to 3.6V, and the IO port inputs and outputs: LOUT, ROUT, AUX - L1、AUX - R1, etc.
In this embodiment, the dividing of the test segments of the radio chip to be tested based on the chip parameters may be to determine the chip pin structure of the radio chip to be tested according to the knowledge of the chip parameters, so as to divide the test pins of the radio chip to be tested into multiple groups according to the different functions represented by the radio chip pins to be tested, for example, to use the power pins (e.g., GND and VDD) as a group of test segments, and to use the sound pins (e.g., VOL + \ SCK, VOL-/SDA) as a group of test segments.
In this embodiment, the test factor may be used to detect the working performance in the test section, and if in the power interface, the voltage and current of the radio chip to be detected need to be detected in real time, which is equivalent to a performance test device, such as a multimeter, an oscilloscope, etc.; the tracing factor can be a factor for recording test data after testing the radio receiving chip to be tested based on the test factor, and is equivalent to a data recording device.
The beneficial effects of the above technical scheme are: through the chip model that will confirm the radio reception chip that awaits measuring, and then can accurately match the chip parameter of the radio reception chip that awaits measuring, thereby carry out the test section to the radio reception chip that awaits measuring and divide, realize the settlement to test factor and pursuit factor in the test section, test the radio reception chip that awaits measuring through the mode of segmentation, thereby make more accurate and careful to the test of radio reception chip, can be so that the test result has the trace to follow through tracing the factor, leave valuable test data, thereby realize the accurate analysis to the test result of the radio reception chip that awaits measuring, the precision of test and the comprehensiveness of test have been improved.
Example 2:
on the basis of embodiment 1, this embodiment provides a radio chip testing method, which is characterized in that, in step 1, obtaining a chip model of a radio chip to be tested includes:
acquiring an image of a radio chip to be tested, and simultaneously performing pixel gray processing on the chip image to obtain a chip gray image;
reading the chip gray image, determining the pixel point distribution of the chip gray image, and picking the chip main body outline pixel points of the to-be-tested radio chip in the chip gray image based on the pixel point distribution;
extracting the chip gray level image based on the chip main body outline pixel points to obtain a chip sub gray level image;
and acquiring font outline pixel points in the chip sub-gray level image, inputting the font outline pixel points into a preset character recognition library for matching, and outputting the chip model of the radio chip to be tested based on the matching result.
In this embodiment, the chip image may be an image obtained by collecting the appearance of the radio chip to be tested based on a device such as a camera.
In this embodiment, the chip grayscale image may be an image obtained by performing a graying process on the chip image.
In this embodiment, since the radio chip to be tested has the structure of the pin and the main body, the main body contour pixel points may be edge pixel points of the main body.
In this embodiment, the chip sub-grayscale image may be a main body image of the radio chip to be tested, where the chip sub-grayscale image belongs to the chip grayscale image.
In this embodiment, the font outline pixel points may be edge pixel points including numbers, letters, and the like in the radio chip to be tested.
In this embodiment, the preset character recognition library may be set in advance, and include edge pixel points of all numbers, letters, and the like, and the character output according to the matching result is the chip model of the radio chip to be tested by matching the font outline pixel points with the edge pixel points of known characters (numbers, letters, and the like) in the preset character recognition library.
The beneficial effects of the above technical scheme are: font outline pixel points in a main body gray level image (namely a chip sub gray level image) of the radio chip to be tested can be accurately determined to be identified by collecting the image of the radio chip to be tested, and matching is carried out through a preset character identification library, so that the chip model of the radio chip to be tested is accurately determined, and the intelligence and the accuracy of identifying the radio chip to be tested are improved.
Example 3:
on the basis of embodiment 2, this embodiment provides a method for testing a radio chip, in which a font outline pixel point is obtained in a chip sub-grayscale image, including:
reading the chip sub-gray level image, and determining a first color pixel point and a second color pixel point in the chip sub-gray level image;
acquiring the number of first pixel points of the first color pixel points and the number of second pixel points of the second color pixel points, and meanwhile, determining the number of third pixel points of the chip sub-gray level image;
respectively obtaining a first proportion of the number of the first pixel points to the number of the third pixel points and a second proportion of the number of the second pixel points to the number of the third pixel points, and simultaneously comparing the first proportion with the second proportion, wherein the first proportion is not equal to the second proportion;
when the first proportion is larger than the second proportion, taking the area occupied by the first color pixel points as a first target area in the chip sub-gray level image, and taking the area occupied by the second color pixel points as a second target area in the chip sub-gray level image;
when the second proportion is larger than the first proportion, taking the area occupied by the second color pixel points as a first target area in the chip sub-gray level image, and taking the area occupied by the first color pixel points as a second target area in the chip sub-gray level image;
weakening the first target area in the chip sub-gray level image, marking the pixel points corresponding to the second target area, and determining font outline pixel points based on the marking result.
In this embodiment, since the grayscale image has only two kinds of images, i.e., black and white, the first color pixel may be black or white, i.e., the second color pixel is different from the first color pixel, i.e., white or black.
In this embodiment, the number of the first pixel points may be the number of the first color pixel points, and the number of the second pixel points may be the number of the second color pixel points.
In this embodiment, the number of the third pixel points may be the total number of the pixel points of the chip sub-gray level image.
In this embodiment, the first ratio may be a ratio between the number of the first pixel points and the number of the third pixel points.
In this embodiment, the second ratio may be a ratio between the number of the second pixel points and the number of the third pixel points.
In this embodiment, since the area occupied by the portion with the font is often smaller than the area occupied by the portion without the font in the general chip main body cover, the first ratio is not equal to the second ratio.
In this embodiment, the first target area may be an area occupied by no font in the chip sub gray scale image, and the second target area may be an area occupied by a font in the chip sub gray scale image.
In this embodiment, weakening the first target region in the chip sub-grayscale image may be, for example, performing a transparentization process on a pixel point in the first target region.
The beneficial effects of the above technical scheme are: the color pixel points are distinguished through the chip sub-gray level image, so that the first target area and the second target area are determined, the first target area is weakened in the chip sub-gray level image, the pixel points in the second target area can be displayed more obviously, the pixel points corresponding to the second target area are marked, the font outline pixel points are determined through marking results, and the intelligence and the accuracy of obtaining the font outline pixel points are improved.
Example 4:
on the basis of the embodiment, the embodiment provides a radio chip testing method, as shown in fig. 2, in step 1, matching chip parameters of a radio chip to be tested, which are consistent with a chip model, in a preset chip management library, including:
s101: reading the chip model of the radio chip to be tested, and determining the model identification of the chip model;
s102: inputting the model identification into a preset chip management library for indexing, and obtaining a target document in the preset chip management library based on an indexing result, wherein the target document comprises a target verification model;
s103: matching the chip model of the radio chip to be tested with the target verification model, and repeating the steps S101-S102 when the chip model of the radio chip to be tested is not matched with the target verification model until the chip model of the radio chip to be tested is matched with the target verification model;
s104: and when the chip model of the radio receiving chip to be tested is matched with the target verification model, reading the target document and determining the chip parameters of the radio receiving chip to be tested.
In this embodiment, the model identifier of the chip model may be a preset identifier used to specifically set the chip model of the radio chip to be tested, for example, when the chip model of the radio chip to be tested is C9610, the model identifier is set as a; when the chip model is C9611/12/13, setting the model mark as b; when the chip model is C9616, setting the model identification as d; when the chip model is C9620, setting a model mark as e; when the chip model is C9650, setting the model identification as f; when the chip model is C9652, the model identification is set to g.
In this embodiment, the preset chip management library may be set in advance, and the preset chip management library stores management documents of all the radio chips.
In this embodiment, the target document may be document data corresponding to the model identification.
In this embodiment, the target verification model may be set to verify whether the chip model of the radio chip to be tested is consistent with the target verification model, where the composition of the target verification model may be consistent with the composition of the chip model of the chip to be received, that is, when the target verification model is consistent with the chip model of the chip to be received (that is, when the chip model of the radio chip to be tested is matched with the target verification model), the target document may be read.
The beneficial effects of the above technical scheme are: the target document is locked by determining the model identification of the chip model, and whether the target document can be read is verified by matching the target verification model in the target document with the chip model of the radio chip to be tested, so that the reading safety and accuracy of the target document are improved, and the chip parameters of the radio chip to be tested are accurately determined.
Example 5:
on the basis of embodiment 1, this embodiment provides a radio chip testing method, and in step 2, the test segment division is performed on the radio chip to be tested based on chip parameters, including:
obtaining a chip pin of a radio chip to be tested;
determining pin representation corresponding to the chip pins based on the chip parameters;
and performing similar division on the chip pins according to the pin representations corresponding to the chip pins, and taking the division results as test sections of the radio chip to be tested.
In this embodiment, the pin characterization may be a function used to characterize the pins of the chip.
In this embodiment, the homogeneous partition may be, for example, a pin (e.g., VOL + \ SCK, VOL-/SDA) representing the sound as a group of test segments, etc.
The beneficial effects of the above technical scheme are: the pin classification test method is beneficial to realizing pin classification test, simplifies the test flow and enables the detection to be more accurate.
Example 6:
on the basis of the embodiment, the embodiment provides a method for testing a radio chip, in step 2, setting a test factor and a tracking factor in a divided test segment, including:
respectively obtaining target pins of the radio receiving chip to be tested corresponding to the test section, and determining the pin functions corresponding to the target pins;
determining the test type of each test section based on the pin function of each test section, and setting test factors in the corresponding test sections according to different test types;
and acquiring the test characteristics of the test factors, determining corresponding tracking factors based on the test characteristics of the test factors, and setting the tracking factors in the test section.
In this embodiment, the target pin may be a corresponding pin in the test segment.
In this embodiment, the test type may be, for example, that the test segment pin function is to detect the sound pin interface, and therefore, the corresponding test type may include: 1. testing the output signal of the sound pin interface contact, 2 and testing the output signal of the sound pin interface.
In this embodiment, the test characteristic may be determined according to the test factor, or according to a data attribute output by the test factor, for example, if the test factor is a contact condition of the test sound pin, the test characteristic is a current value or a voltage value of the test sound pin.
The beneficial effects of the above technical scheme are: by determining the test type of each test section, the test factors are set according to specific conditions, and then the tracking factors are set by determining the test characteristics of the test factors, so that the test efficiency and the data recording accuracy rate when the radio chip to be tested is tested are favorably ensured.
Example 7:
on the basis of embodiment 1, this embodiment provides a radio chip testing method, in step 3, the radio chip to be tested is tested based on the test factor, and meanwhile, the test result after the radio chip to be tested is traced and recorded based on the tracing factor, which includes:
inputting chip test excitation in the test factor;
testing the radio chip to be tested based on the chip test excitation and according to the test factor, and capturing the test output based on the tracking factor;
and outputting test data according to the capture result.
In this embodiment, the chip test stimulus may be an influence factor for exciting the radio receiving chip to be tested to operate, where the influence factor may be a factor for starting the radio receiving chip to be tested to operate, such as a power supply.
The beneficial effects of the above technical scheme are: the input chip test excitation is determined, the radio chip to be tested is tested according to the test factors, and meanwhile, the test output is captured based on the tracking factors to determine test data, so that the test adaptability and the test efficiency of the radio chip to be tested are improved.
Example 8:
on the basis of embodiment 1, this embodiment provides a radio chip testing method, and in step 3, after tracking and recording a test result obtained after the radio chip to be tested is tested based on the tracking factor, the method further includes:
setting a safe output interval in the tracking factor based on the chip parameters, and reading an upper limit threshold of the safe output interval and a lower limit threshold of the safe output interval;
recording test data in real time based on the tracking factor, and comparing the test data with a safety output interval;
when the test data is larger than the upper limit threshold value of the safety output interval, the test data is used as first target test data, and first marks are made on the first target test data;
when the test data is in the safe output interval, the test data is used as second target test data and second marks are made on the test data;
when the test data is smaller than the lower limit threshold of the safety output interval, the test data is used as third target test data and third marks are made on the test data;
performing a first alarm operation based on the first mark, and performing a second alarm operation based on the third mark;
and generating a test report for the radio receiving chip to be tested according to the first mark, the second mark, the third mark, the first alarm operation and the second alarm operation.
In this embodiment, the safety output interval may be a working safety data range of a corresponding pin in each test segment of the chip to be tested, for example, in characterizing the power supply pin, a voltage value accessed by the power supply pin is 1.8-5.5V.
In this embodiment, the upper threshold may be the maximum value of the working safety data range.
In this embodiment, the lower threshold may be a minimum value of the operational safety data range.
In this embodiment, the first target test data may be test data that is greater than the upper threshold of the safety output interval and corresponds to the upper threshold of the safety output interval; the second target test data may be test data corresponding to the security data interval in the test data; the third target test data may be test data corresponding to a lower threshold smaller than the safety output interval in the test data, where the first target test data, the second target test data, and the third target test data all belong to the test data, and the test data = the first target test data + the second target test data + the third target test data.
In this embodiment, the first marking may be marking the first target test data; the second marking may be marking the second target test data; the third marking may be marking the third target test data.
In this embodiment, the first warning operation may be a warning prompt based on the first flag, for example, a light warning is performed when the test data exceeds the upper threshold.
In this embodiment, the second alarm operation may be an alarm prompt based on the second flag, for example, an audible alarm is given when the test data is lower than the lower threshold.
The beneficial effects of the above technical scheme are: by setting the data safety output interval, the method is favorable for realizing accurate assessment and measurement of the test data, and is convenient for finding out the data with problems (namely the data which is larger than the upper limit threshold or smaller than the lower limit threshold) in time, so that the overall condition of the test data of the current radio chip to be tested can be known through the first mark, the second mark and the third mark, meanwhile, a tester can know the test data in real time through the first alarm operation and the second alarm operation, and the test efficiency and the test convenience are improved.
Example 9:
on the basis of embodiment 8, this embodiment provides a radio chip testing method, after generating a test report for a radio chip to be tested, further including:
reading the test report, determining report keywords of the test report, and meanwhile, establishing a corresponding display data block according to the report keywords of the test report;
dividing the display data block into a first sub-display data block, a second sub-display data block and a third sub-display data block;
displaying first target test data and first alarm data based on the first sub-display data block, displaying second target test data in the second sub-display data block, and simultaneously displaying third test data and second alarm data in the third sub-display data block;
wherein, the first sub-display data block, the second sub-display data block, and the third sub-display data block further include:
determining a corresponding first target test segment according to the first target test data, setting a first hyperlink in a first sub-display data block, matching a first solution based on the first target test segment in a preset solution database according to the first hyperlink, and simultaneously displaying the first solution in the first sub-display data block;
determining a corresponding second target test section according to the second target test data, setting a data updating link in the second sub-display data block, and updating the second target test data into a preset scheme database according to the data updating link;
and determining a corresponding second target test segment according to the third target test data, setting a second hyperlink in a third sub-display data block, matching a second solution based on the third target test segment in a preset solution database according to the second hyperlink, and simultaneously displaying the second solution in the third sub-display data block.
In this embodiment, the report keyword may be a keyword set according to a test attribute of the test segment, for example.
In this embodiment, the display data blocks may be in one-to-one correspondence with the test segments, i.e., one test segment corresponds to one display data block.
In this embodiment, the first sub-display data block may be used to display the first target test data and the first alarm data, where the first alarm data is determined according to the number of alarms, the alarm duration, and the like of the first alarm operation.
In this embodiment, the second sub-display data block may be used to display the second target test data.
In this embodiment, the third sub-display data block may be used to display the third target test data and the second alarm data, where the second alarm data may be determined according to the number of alarms, the alarm duration, and the like of the second alarm operation.
In this embodiment, the first target test segment may be a test segment in which a test pin corresponding to the first target test data is located, the second target test segment may be a test segment in which a test pin corresponding to the second target test data is located, and the third target test segment may be a test segment in which a corresponding test pin is located according to the third target test data.
In this embodiment, the first hyperlink may be connected to a preset scheme database for associating a solution related to the first target test segment in the preset scheme database.
In this embodiment, the second hyperlink may be connected to the preset solution database for associating the solution of the third target test segment in the preset solution database.
In this embodiment, the data update link may be connected to the preset solution database, and is used to update the test data of the third target test segment in the preset solution database, so as to facilitate the data in the preset solution database to be more enriched, and facilitate the solution to the second target test segment to be more reasonable and correct.
In this embodiment, the first solution may be a reference solution for a current pin condition of the first target test segment corresponding to the first target test data.
In this embodiment, the second solution may be a reference solution for a current pin status of a third target test segment corresponding to the third target test data.
In this embodiment, the preset solution database may include a preset solution database formed by combining the usual test data and the experimental experience when the test data of each test segment is greater than the upper threshold or less than the upper threshold.
The beneficial effects of the above technical scheme are: through setting for the data display piece, be favorable to making the tester to await measuring the test result that radio reception chip tested surveyability at a glance, through to setting for first hyperlink, the second hyperlink, and match corresponding first solution and second solution based on in the scheme database of predetermineeing, and simultaneously, show first solution and second solution, be favorable to the tester to find corresponding solution in real time, and combine the reality to adjust the test section etc. link through setting for the data update can make the data in the scheme database of predetermineeing more abundant, be favorable to about making the solution to the second target test section more reasonable correct.
Example 10:
the embodiment provides a radio chip testing system, as shown in fig. 3, including:
the model determining module is used for acquiring the chip model of the radio chip to be tested and matching the chip parameters of the radio chip to be tested, which are consistent with the chip model, in the preset chip management library;
the test section confirmation module is used for dividing the test section of the radio chip to be tested based on the chip parameters and setting a test factor and a tracking factor in the divided test section;
and the test module is used for testing the radio chip to be tested based on the test factor, and simultaneously, tracking and recording the test result after the radio chip to be tested is tested based on the tracking factor.
The beneficial effects of the above technical scheme are: through the chip model that will confirm the radio reception chip that awaits measuring, and then can accurately match the chip parameter of the radio reception chip that awaits measuring, thereby carry out the test section to the radio reception chip that awaits measuring and divide, realize the settlement to test factor and pursuit factor in the test section, test the radio reception chip that awaits measuring through the mode of segmentation, thereby make more accurate and careful to the test of radio reception chip, can be so that the test result has the trace to follow through tracing the factor, leave valuable test data, thereby realize the accurate analysis to the test result of the radio reception chip that awaits measuring, the precision of test and the comprehensiveness of test have been improved.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (10)
1. A radio chip testing method is characterized by comprising the following steps:
step 1: acquiring the chip model of a radio chip to be tested, and matching the chip parameters of the radio chip to be tested, which are consistent with the chip model, in a preset chip management library;
step 2: dividing a test section of the radio chip to be tested based on the chip parameters, and setting a test factor and a tracking factor in the divided test section;
and step 3: and testing the radio chip to be tested based on the test factor, and simultaneously, tracking and recording the test result after testing the radio chip to be tested based on the tracking factor.
2. The radio chip testing method of claim 1, wherein the step 1 of obtaining the chip type of the radio chip to be tested comprises:
acquiring an image of a radio chip to be tested, and simultaneously performing pixel gray processing on the chip image to obtain a chip gray image;
reading the chip gray image, determining the pixel point distribution of the chip gray image, and picking the chip main body outline pixel points of the to-be-tested radio chip in the chip gray image based on the pixel point distribution;
extracting the chip gray level image based on the chip main body outline pixel points to obtain a chip sub gray level image;
and acquiring font outline pixel points in the chip sub-gray level image, inputting the font outline pixel points into a preset character recognition library for matching, and outputting the chip model of the radio chip to be tested based on the matching result.
3. The radio chip testing method of claim 2, wherein obtaining font outline pixel points in a chip sub-gray image comprises:
reading the chip sub-gray level image, and determining a first color pixel point and a second color pixel point in the chip sub-gray level image;
acquiring the number of first pixel points of the first color pixel points and the number of second pixel points of the second color pixel points, and meanwhile, determining the number of third pixel points of the chip sub-gray level image;
respectively obtaining a first proportion of the number of the first pixel points to the number of the third pixel points and a second proportion of the number of the second pixel points to the number of the third pixel points, and simultaneously comparing the first proportion with the second proportion, wherein the first proportion is not equal to the second proportion;
when the first proportion is larger than the second proportion, taking the area occupied by the first color pixel points as a first target area in the chip sub-gray level image, and taking the area occupied by the second color pixel points as a second target area in the chip sub-gray level image;
when the second proportion is larger than the first proportion, taking the area occupied by the second color pixel points as a first target area in the chip sub-gray level image, and taking the area occupied by the first color pixel points as a second target area in the chip sub-gray level image;
weakening the first target area in the chip sub-gray level image, marking the pixel points corresponding to the second target area, and determining font outline pixel points based on the marking result.
4. The radio chip testing method of claim 1, wherein in step 1, matching chip parameters of a radio chip to be tested, which are consistent with a chip model, in a preset chip management library comprises:
s101: reading the chip model of the radio chip to be tested, and determining the model identification of the chip model;
s102: inputting the model identification into a preset chip management library for indexing, and obtaining a target document in the preset chip management library based on an indexing result, wherein the target document comprises a target verification model;
s103: matching the chip model of the radio chip to be tested with the target verification model, and repeating the steps S101-S102 when the chip model of the radio chip to be tested is not matched with the target verification model until the chip model of the radio chip to be tested is matched with the target verification model;
s104: and when the chip model of the radio chip to be tested is matched with the target verification model, reading the target document and determining the chip parameters of the radio chip to be tested.
5. The radio chip testing method of claim 1, wherein in step 2, the test segment division is performed on the radio chip to be tested according to the chip parameters, and the method comprises the following steps:
obtaining a chip pin of a radio chip to be tested;
determining pin representation corresponding to chip pins;
and performing similar division on the chip pins according to the pin representations corresponding to the chip pins, and taking the division results as test sections of the radio chip to be tested.
6. The radio chip testing method of claim 1, wherein in step 2, setting a test factor and a trace factor in the divided test segments comprises:
respectively obtaining target pins of the radio receiving chip to be tested corresponding to the test sections, and determining pin functions corresponding to the target pins;
determining the test type of each test section based on the pin function of each test section, and setting test factors in the corresponding test sections according to different test types;
and acquiring the test characteristics of the test factors, determining corresponding tracking factors based on the test characteristics of the test factors, and setting the tracking factors in the test section.
7. The radio chip testing method according to claim 1, wherein in step 3, the radio chip to be tested is tested based on the testing factor, and meanwhile, the test result after the radio chip to be tested is traced and recorded based on the tracing factor, which includes:
inputting chip test excitation in the test factor;
testing the radio chip to be tested based on the chip test excitation and according to the test factor, and capturing the test output based on the tracking factor;
and outputting test data according to the capture result.
8. The radio chip testing method of claim 1, wherein in step 3, after tracking and recording the test result after the radio chip to be tested is tested based on the tracking factor, the method further comprises:
setting a safe output interval in the tracking factor based on the chip parameters, and reading an upper limit threshold of the safe output interval and a lower limit threshold of the safe output interval;
recording test data in real time based on the tracking factor, and comparing the test data with a safety output interval;
when the test data is larger than the upper limit threshold value of the safety output interval, the test data is used as first target test data, and first marks are made on the first target test data;
when the test data is in the safe output interval, the test data is used as second target test data and second marks are made on the test data;
when the test data is smaller than the lower limit threshold of the safety output interval, the test data is used as third target test data and third marks are made on the test data;
performing a first alarm operation based on the first mark, and performing a second alarm operation based on the third mark;
and generating a test report for the radio receiving chip to be tested according to the first mark, the second mark, the third mark, the first alarm operation and the second alarm operation.
9. The radio chip testing method of claim 8, after generating a test report for the radio chip to be tested, further comprising:
reading the test report, determining report keywords of the test report, and meanwhile, establishing a corresponding display data block according to the report keywords of the test report;
dividing the display data block into a first sub-display data block, a second sub-display data block and a third sub-display data block;
displaying first target test data and first alarm data based on the first sub-display data block, displaying second target test data in the second sub-display data block, and simultaneously displaying third test data and second alarm data in the third sub-display data block;
wherein, the first sub-display data block, the second sub-display data block, and the third sub-display data block further include:
determining a corresponding first target test segment according to the first target test data, setting a first hyperlink in a first sub-display data block, matching a first solution based on the first target test segment in a preset solution database according to the first hyperlink, and simultaneously displaying the first solution in the first sub-display data block;
determining a corresponding second target test section according to the second target test data, setting a data updating link in the second sub-display data block, and updating the second target test data into a preset scheme database according to the data updating link;
and determining a corresponding second target test segment according to the third target test data, setting a second hyperlink in a third sub-display data block, matching a second solution based on the third target test segment in a preset solution database according to the second hyperlink, and simultaneously displaying the second solution in the third sub-display data block.
10. A radio chip test system, comprising:
the model determining module is used for acquiring the chip model of the radio chip to be tested and matching the chip parameters of the radio chip to be tested, which are consistent with the chip model, in the preset chip management library;
the test section confirmation module is used for dividing the test section of the radio chip to be tested based on the chip parameters and setting a test factor and a tracking factor in the divided test section;
and the test module is used for testing the radio chip to be tested based on the test factor and tracking and recording the test result after the radio chip to be tested is tested based on the tracking factor.
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