CN115514366A - Single-rotation dual-drive circuit in temperature sensor and time sequence control optimization method thereof - Google Patents

Single-rotation dual-drive circuit in temperature sensor and time sequence control optimization method thereof Download PDF

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Publication number
CN115514366A
CN115514366A CN202211420962.3A CN202211420962A CN115514366A CN 115514366 A CN115514366 A CN 115514366A CN 202211420962 A CN202211420962 A CN 202211420962A CN 115514366 A CN115514366 A CN 115514366A
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CN
China
Prior art keywords
circuit
double
temperature sensor
drive circuit
adc
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Pending
Application number
CN202211420962.3A
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Chinese (zh)
Inventor
倪灿灿
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Canxin Semiconductor Chengdu Co ltd
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Canxin Semiconductor Chengdu Co ltd
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Application filed by Canxin Semiconductor Chengdu Co ltd filed Critical Canxin Semiconductor Chengdu Co ltd
Priority to CN202211420962.3A priority Critical patent/CN115514366A/en
Publication of CN115514366A publication Critical patent/CN115514366A/en
Priority to CN202310351342.7A priority patent/CN116318151B/en
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

The invention discloses a time sequence control optimization method of a single-rotation dual-drive circuit in a temperature sensor, belonging to the technical field of power design of the temperature sensor, wherein a temperature sensor chip comprises the following steps: the temperature-to-single-ended voltage circuit is operated to convert the temperature detected by the temperature sensor into single-ended voltage; the single-to-double driving circuit is connected with the temperature-to-single-end voltage circuit and is operated to convert single-end voltage to double-end voltage; the ADC circuit is connected with the single-rotation dual-drive circuit and is operated to convert the voltage signal into a digital signal; and the LDO circuit is connected with the ADC circuit and is operated to supply power to the ADC circuit. The invention can ensure that the single-turn double-driving circuit works after the output clock CLKOUT in the ADC circuit works through the COUNTER circuit, thereby avoiding the error result generated by the premature work of the single-turn double-driving circuit, improving the working state of the circuit and reducing the circuit deviation.

Description

Single-rotation dual-drive circuit in temperature sensor and time sequence control optimization method thereof
Technical Field
The invention belongs to the technical field of electric power design of a temperature sensor, and particularly relates to a single-rotation dual-drive circuit of the temperature sensor and a time sequence control optimization method thereof.
Background
A conventional temperature sensor circuit (see fig. 1) includes: the analog temperature signal quantization circuit comprises a preceding-stage temperature voltage conversion circuit, a single-stage double-drive circuit, an ADC circuit and an LDO (low dropout regulator) for supplying power to the ADC, and is used for quantizing an analog temperature signal into a digital signal.
The temperature sensor circuit has more internal time sequence control, and the time sequence control can generate some deviation when the temperature sensor circuit directly and independently works, so that a corresponding optimization circuit is designed aiming at the time sequence control of the single-conversion double-drive circuit, the working state of the circuit is improved, and the circuit deviation is reduced.
Disclosure of Invention
The invention aims to provide a single-rotation dual-drive circuit of a temperature sensor and a time sequence control optimization method thereof, which can carry out time sequence control on the single-rotation dual-drive circuit, improve the working state of the circuit, further effectively reduce the circuit deviation and effectively solve the problems in the background art.
To achieve the above object, according to one aspect of the present invention, there is provided a single-turn dual driving circuit for a temperature sensor, wherein the single-turn dual driving circuit includes:
the temperature-to-single-ended voltage circuit is operated to convert temperature data detected by the temperature sensor into single-ended voltage;
the single-to-double driving circuit is connected with the temperature-to-single-end voltage circuit and is operated to convert single-end voltage into double-end voltage;
the ADC circuit is connected with the single-rotation dual-drive circuit and is operated to convert the voltage signal into a digital signal;
the LDO circuit is connected with the ADC circuit and is operated to supply power to the ADC circuit;
the COUNTER circuit is coupled with the single-to-double driving circuit to realize the time sequence control of the single-to-double driving circuit, ensure that the single-to-double driving circuit works after an output clock CLKOUT in the ADC circuit works, and avoid the error work of the single-to-double driving circuit.
Preferably, the COUNTER circuit implements timing control of the single-to-double driving circuit, and ensures that the single-to-double driving circuit operates after the output clock CLKOUT in the ADC circuit operates, thereby avoiding erroneous operation of the single-to-double driving circuit, which specifically includes:
after the output clock CLKOUT in the ADC circuit works, the single-turn double-drive circuit works to avoid that the single-turn double-drive circuit works too early to generate an error result.
According to another aspect of the present invention, the present invention provides a timing control optimization method for a single-rotation dual-driving circuit in a temperature sensor, which is applied to the single-rotation dual-driving circuit in the temperature sensor, and the timing control optimization method includes:
in the process, the COUNTER circuit realizes the time sequence control of the single-to-double driving circuit, and ensures that the single-to-double driving circuit works after an output clock CLKOUT in the ADC circuit works, so as to avoid the phenomenon that the single-to-double driving circuit works too early to generate an error result.
Compared with the prior art, the invention has the beneficial effects that:
according to the invention, through the COUNTER circuit, after the output clock CLKOUT in the ADC circuit works, the single-turn double-drive circuit works, so that the error result caused by the premature work of the single-turn double-drive circuit is avoided, the working state of the circuit is improved, and the circuit deviation is reduced.
Drawings
Fig. 1 is a circuit diagram of a conventional temperature sensor.
Fig. 2 is a circuit diagram of a single-turn dual-driving circuit of a temperature sensor according to the present invention.
FIG. 3 is a circuit diagram of a COUNTER timing control circuit of a single-turn dual-driving circuit in a temperature sensor according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 2, according to an aspect of the present embodiment, the present embodiment provides a single-turn dual driving circuit for a temperature sensor, wherein the single-turn dual driving circuit includes:
the temperature-to-single-ended voltage circuit is operated to convert temperature data detected by the temperature sensor into single-ended voltage;
the single-to-double driving circuit is connected with the temperature-to-single-end voltage circuit and is operated to convert single-end voltage into double-end voltage;
the ADC circuit is connected with the single-rotation dual-drive circuit and is operated to convert the voltage signal into a digital signal;
the LDO circuit is connected with the ADC circuit and is operated to supply power to the ADC circuit;
the COUNTER circuit is coupled with the single-rotation double-drive circuit to realize the time sequence control of the single-rotation double-drive circuit, ensure that the single-rotation double-drive circuit works after an output clock CLKOUT in the ADC circuit works, and avoid the error work of the single-rotation double-drive circuit.
Referring to fig. 3, as an embodiment of the present invention, the COUNTER circuit implements timing control on the single-to-dual driving circuit, so as to ensure that the single-to-dual driving circuit works after the output clock CLKOUT in the ADC circuit works, and avoid the single-to-dual driving circuit from working erroneously, which specifically includes:
after the output clock CLKOUT in the ADC circuit works, the single-turn double-drive circuit works, so that the phenomenon that the single-turn double-drive circuit works too early to generate an error result is avoided.
Referring to fig. 3, according to another aspect of the present invention, the invention provides a timing control optimization method for a single-turn dual driver circuit in a temperature sensor, which is applied to the single-turn dual driver circuit in the temperature sensor, and the timing control optimization method includes:
in the process, the COUNTER circuit realizes the time sequence control of the single-to-double driving circuit, and ensures that the single-to-double driving circuit works after an output clock CLKOUT in the ADC circuit works, so as to avoid the phenomenon that the single-to-double driving circuit works too early to generate an error result.
Therefore, the invention can ensure that the single-turn double-drive circuit works after the output clock CLKOUT in the ADC circuit works through the COUNTER circuit, thereby avoiding the error result caused by the early work of the single-turn double-drive circuit, improving the working state of the circuit and reducing the circuit deviation.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including the preferred embodiment and all changes and modifications that fall within the scope of the invention.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.

Claims (3)

1. A single-turn dual driver circuit for a temperature sensor, the single-turn dual driver circuit comprising:
the temperature-to-single-ended voltage circuit is operated to convert the temperature data detected by the temperature sensor into single-ended voltage;
the single-to-double driving circuit is connected with the temperature-to-single-end voltage circuit and is operated to convert single-end voltage into double-end voltage;
the ADC circuit is connected with the single-rotation dual-drive circuit and is operated to convert the voltage signal into a digital signal;
the LDO circuit is connected with the ADC circuit and is operated to supply power to the ADC circuit;
the COUNTER circuit is coupled with the single-rotation double-drive circuit to realize the time sequence control of the single-rotation double-drive circuit, ensure that the single-rotation double-drive circuit works after an output clock CLKOUT in the ADC circuit works, and avoid the error work of the single-rotation double-drive circuit.
2. The single-turn dual driver circuit of claim 1, wherein the COUNTER circuit implements a timing control for the single-turn dual driver circuit to ensure that the single-turn dual driver circuit operates after an output clock CLKOUT in the ADC circuit operates, thereby avoiding an erroneous operation of the single-turn dual driver circuit, and specifically:
after the output clock CLKOUT in the ADC circuit works, the single-turn double-drive circuit works to avoid that the single-turn double-drive circuit works too early to generate an error result.
3. A method for optimizing timing control of a single-rotation dual-drive circuit in a temperature sensor, which is applied to the single-rotation dual-drive circuit in the temperature sensor according to any one of claims 1-2, wherein the method for optimizing timing control comprises:
in the process, the COUNTER circuit realizes the time sequence control of the single-to-double driving circuit, and ensures that the single-to-double driving circuit works after an output clock CLKOUT in the ADC circuit works, so as to avoid the premature work of the single-to-double driving circuit and generate an error result.
CN202211420962.3A 2022-11-15 2022-11-15 Single-rotation dual-drive circuit in temperature sensor and time sequence control optimization method thereof Pending CN115514366A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN202211420962.3A CN115514366A (en) 2022-11-15 2022-11-15 Single-rotation dual-drive circuit in temperature sensor and time sequence control optimization method thereof
CN202310351342.7A CN116318151B (en) 2022-11-15 2023-04-04 Single-turn double-buffer in temperature sensor and time sequence control optimization method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202211420962.3A CN115514366A (en) 2022-11-15 2022-11-15 Single-rotation dual-drive circuit in temperature sensor and time sequence control optimization method thereof

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Application publication date: 20221223