CN115508631A - Electronic component testing device - Google Patents

Abstract

The invention provides an electronic component testing device, comprising: a bearing chassis of a machine table top is provided with a test board which can be driven to rotate, and a feeding unit, an inspection unit and a discharging unit are arranged outside the periphery; the discharging unit is provided with a plurality of flexible guide pipes on a guide pipe plate, one end of each guide pipe corresponds to the upper part of the seat groove on the test plate, and the other end of each guide pipe draws the material guide frame to correspondingly conduct to a material box of a collecting mechanism; one side of the conduit plate is arranged on a lifting frame, and one end of the lifting frame is pivoted on a pivot seat above a seat frame of the collecting mechanism, so that the conduit plate and each conduit on the conduit plate can be lifted along with the lifting frame from the table top to the collecting mechanism; thereby facilitating maintenance.

Description

Electronic component testing device

Technical Field

The present invention relates to a testing apparatus, and more particularly, to an electronic device testing apparatus suitable for testing an electronic device.

Background

In general, electronic components are usually tested after their manufacture to determine their physical characteristics, for example, in the device provided in the patent application No. 411735, "Circuit component handling device" for testing electronic components for capacitors, wherein a concentric ring of one or more component holders is rotated with respect to the ring center, the holders are uniformly rotated at angular intervals and in increments, i.e., the angular intervals between adjacent holders, the ring is tilted at an angle, and when the ring is rotated, the component flow is tilted toward the ring, the non-home components confined by the fixed grid plates adjacent to the outer plate side of the holders are rolled randomly by power into empty holders passing through the arc of the ring rotation path, the random rolling action causes the components to be home in the holders, in the path of the rotating ring, there are electronic contactors for connecting the components to the tester, the tested components pass under an ejection manifold plate defining a plurality of ejection holes which are aligned with a set of seats each time the ring rotates an incremental amount, ejection tubes are connected to the ejection holes, the components are ejected from the seats by the air blast of the selectively activated individual pneumatic valves, the ejected components fall through tubes and are guided by a tube plate into a sorting magazine by the air blast and gravity, component flow paths can be selectively directed toward a grid plate in response to signals from detectors indicating the absence of components from the grid plate, and sensors can detect components in the seats that have not been ejected by the ejection manifolds.

Although the prior art of the No. 411735 patent application provides testing and sorting collection of capacitor electronic components, the ejection manifold plate of the prior art is screwed on the platform of the machine platform by screws, and once maintenance of each ejection manifold is required, the screws must be removed one by one, which is troublesome and troublesome.

Disclosure of Invention

Therefore, an object of the present invention is to provide an electronic component testing apparatus which is convenient to maintain.

An electronic component testing apparatus according to an object of the present invention comprises: a machine table, on which a machine table top is arranged; the bearing chassis is arranged on the table board, a test board which can be driven to rotate is arranged on the bearing chassis, and a feeding unit, an inspection unit and a discharging unit are arranged outside the periphery of the bearing chassis; wherein, the discharging unit is provided with a conduit plate, the conduit plate is provided with a plurality of flexible conduits, one end of each conduit corresponds to the upper part of one seat groove on the test board, and the other end of each conduit correspondingly conducts to a material box of a collecting mechanism by drawing through the material guide frame; one side of the conduit board is arranged on a lifting frame, one end of the lifting frame is pivoted on a pivot seat above a seat frame of the collecting mechanism, so that the conduit board and each conduit on the conduit board can be lifted along with the lifting frame from the table board to the collecting mechanism, namely, towards the direction of an operator, and the whole discharge unit is positioned above the seat frame.

Another electronic component testing apparatus according to an object of the present invention comprises: a machine table, on which a machine table top is arranged; the bearing chassis is arranged on the table board of the machine station, a test board which can be driven to rotate is arranged on the bearing chassis, and a feeding unit, an inspection unit and a discharging unit are arranged outside the periphery of the bearing chassis; wherein, the discharging unit is provided with a conduit plate, the conduit plate is provided with a plurality of flexible conduits, one end of each conduit corresponds to the upper part of one seat groove on the test board, and the other end of each conduit correspondingly conducts to a material box of a collecting mechanism by drawing through the material guide frame; the material box is arranged in the seat frame, the seat frame is pivoted, and the seat frame can be lifted to one side, so that one side of the lower part of the table board close to the discharge unit presents a hollow operation area.

In the electronic component testing device of the embodiment of the invention, one side of the conduit plate is arranged on the lifting frame, and one end of the lifting frame is pivoted on the pivoting seat above the seat frame of the collecting mechanism, so that the conduit plate and each conduit on the conduit plate can be lifted along with the lifting frame from the table board to the collecting mechanism, namely towards the direction of an operator, and the whole discharge unit is positioned above the seat frame, therefore, the operator can conveniently overhaul the discharge unit.

Drawings

Fig. 1 is a schematic perspective view of an electronic device testing apparatus for illustrating an embodiment of the invention.

FIG. 2 is a schematic view of the configuration of each mechanism on the table top of the electronic device testing apparatus.

Fig. 3 is a schematic view of a carrier chassis in the electronic component testing apparatus.

Fig. 4 is a schematic diagram of each block of the electronic device testing apparatus corresponding to each unit.

FIG. 5 is a schematic view of a portion of the upper surface of the test board in the electronic device testing apparatus.

FIG. 6 is a schematic view of a lower surface portion of the test board in the electronic device testing apparatus.

Fig. 7 is a perspective view of the discharge unit and the collection mechanism of the electronic component testing apparatus.

Fig. 8 is a perspective view of the other side of the discharge unit and the collection mechanism in the electronic component testing apparatus.

Fig. 9 is a schematic perspective view illustrating the electronic device testing apparatus with the lifting frame lifted above the seat frame and the seat frame lifted to one side.

[ description of symbols ]

A: machine table

A1: table top

A11: locating piece

A2: table top

A21: locating hole

A3: front side of machine

A31: clamping piece

B: load-bearing chassis

B1: feeding block

B11: feeding suction channel

B12: suction hole

B13: short arc edge

B14: long arc edge

B15: front end edge

B16: rear end edge

B17: empty part

B171: third suction ditch

B172: suction hole

B2: checking blocks

B21: first check block

B211: first suction channel

B212: suction hole

B213: partition rib

B214: collar

B215: shaft hole

B216: short arc edge

B217: long arc edge

B218: front end edge

B219: rear end edge

B22: second check block

B221: second suction trench

B222: suction hole

B223: partition rib

B224: collar

B225: shaft hole

B226: short arc edge

B227: long arc edge

B228: front end edge

B229: rear end edge

B23: second check block

B3: discharge block

B31: discharge suction nozzle

B32: suction hole

B33: short arc edge

B34: long arc edge

B35: front end edge

B36: rear end edge

C: test board

C1: seat groove

C2: guide channel

C3: cleaning tank

C31: between the expanded convex areas

D: feeding unit

E: inspection unit

E1: first checking unit

E2: second inspection unit

E3: third inspection unit

F: discharge unit

F1: conduit plate

F2: catheter tube

F3: lifting frame

F31: overlapping part

F32: screw fastener

F33: locating slot

F4: connecting piece

F5: pivot rod

F6: elastic piece

F7: screw abutting piece

F8: ion generator

F81: blowing groove

F9: inspection assembly

F91: detector

G: feeding unit

H: material guide frame

H1: embedding seat

H11: side seat

H12: side seat

H2: embedding hole

K: collection mechanism

K1: magazine

K2: stand

K21: pivot seat

K22: corner side

K23: pivot fastener seat

K24: pulling handle

K25: back side part

K26: buckling part

K3: interval of operation

K4: dorsal side

L: radial axis

Detailed Description

Referring to fig. 1 and 2, the embodiment of the invention is described with reference to an electronic device testing apparatus for testing a capacitor-type device under test, but the invention is not limited to the implementation of the capacitor-type electronic device; a disc-shaped bearing chassis B made of metal is arranged on a machine table top A1 which is inclined by about sixty degrees on a machine table A, a test board C which can be driven to rotate intermittently in a clockwise direction is arranged on the bearing chassis B, a feeding unit D which is used for loading tested elements, an inspection unit E which is used for testing the characteristics of the tested elements and a discharging unit F which is used for discharging and collecting the tested elements which are tested are arranged outside the periphery of the bearing chassis B, a feeding mechanism G which is used for providing the tested elements and a material guide frame H which is used for guiding the discharging unit F to a collecting mechanism K are arranged on a horizontal machine table top A2 of the machine table A, and the collecting mechanism K which is used for containing a plurality of material boxes K1 is arranged on the front side of the machine table A.

Referring to fig. 2, the inspection unit E is provided with a first inspection unit E1 for performing an Insulation Resistance (IR) inspection of a capacitor, and two second inspection units E2 and E3 respectively located before and after the first inspection unit E1 in a direction in which the test board C intermittently rotates for performing a capacitance, loss or quality factor (CD) inspection of the capacitor; the second inspection unit E3 located behind the first inspection unit E1 in the direction of intermittent rotation may be omitted as necessary.

Referring to fig. 3 and 4, the carrying chassis B is composed of a plurality of independent sector blocks with different sizes, which are assembled in a butt joint manner, and includes a feeding block B1 corresponding to the feeding unit D, an inspecting block B2 corresponding to the inspecting unit E, and a discharging block B3 corresponding to the discharging unit F, wherein the inspecting block B2 is composed of a first inspecting block B21 and two second inspecting blocks B22 and B23, which are assembled in a butt joint manner, and the first inspecting block B21 and the first inspecting unit E1 are arranged in a butt joint manner, and the two second inspecting blocks B22 and B23 are arranged in a butt joint manner, respectively, and correspond to the two second inspecting units E2 and E3;

a plurality of rows (8 rows in the embodiment) of concentric annular feeding suction grooves B11 which are arranged in a concave annular arc shape are arranged on the feeding block B1 at intervals in the radial direction, and a plurality of hollowed-out suction holes B12 which are arranged at intervals along the bottom of the feeding suction groove B11 are arranged in each feeding suction groove B11; the suction hole B12 can be communicated with a negative pressure source for vacuumizing, so that a negative pressure vacuum state is formed in the feeding suction ditch B11; the feeding block B1 comprises a short arc edge B13 and a long arc edge B14 which are parallel to each other, and a front end edge B15 and a rear end edge B16 which form an included angle with each other;

the first inspection block B21 is provided with a plurality of rows (8 rows in this embodiment) of concentrically-arranged concave arc-shaped first suction grooves B211 at radial intervals, each first suction groove B211 is provided with a plurality of hollowed-out suction holes B212 arranged at intervals along the bottom of the first suction groove B211, a plurality of rows (16 rows in this embodiment) of collar B214 made of insulating material are respectively arranged on the partition ribs B213 at corresponding positions between every two first suction grooves B211 arranged linearly and radially and at intervals on the radial axis of the sector, and each collar B214 is provided with a shaft hole B215; the suction hole B212 can be communicated with a negative pressure source for vacuumizing, so that a negative pressure vacuum state is formed in the first suction ditch B211; the first inspection block B21 includes a short arc side B216 and a long arc side B217 parallel to each other, and a front end side B218 and a rear end side B219 forming an angle with each other;

the second inspection block B22 is provided with a plurality of rows (in this embodiment, 8 rows) of concentrically-arranged concave arc-shaped second suction grooves B221 at radial intervals, each second suction groove B221 is provided with a plurality of hollowed-out suction holes B222 arranged at intervals along the bottom of the second suction groove B221, only one row of partition ribs B223 at corresponding positions between every two second suction grooves B221 arranged in a straight radial direction is provided with a collar B224 made of an insulating material, each collar B224 is provided with a shaft hole B225, and the collar B224 of each row is located on a radial axis L at the center of the sector; the suction hole B222 can be communicated with a negative pressure source for vacuumizing, so that a negative pressure vacuum state is formed in the second suction ditch B221; the second inspection block B22 includes a short arc side B226 and a long arc side B227 parallel to each other, and a front end side B228 and a rear end side B229 at an angle to each other;

the second checking block B23 and the second checking block B22 have the same structure, and the same process can be inferred, which is not repeated herein; however, when the second checking unit E3 is omitted as the above-mentioned requirement, the collar B224 and the shaft hole B225 in the second checking block B22 can be omitted as shown in fig. 3 on the second checking block B23;

a plurality of rows (8 rows in the embodiment) of concentrically arranged concave arc-shaped discharging and sucking grooves B31 which are radially spaced are arranged on the discharging block B3, and a plurality of hollowed-out sucking holes B32 which are arranged at intervals along the bottom of the discharging and sucking grooves B31 are arranged in each discharging and sucking groove B31; the suction hole B32 can be communicated with a negative pressure source for vacuumizing, so that a negative pressure vacuum state is formed in the discharging suction channel B31; the discharge block B3 comprises a short arc side B33 and a long arc side B34 which are parallel to each other, and a front end side B35 and a rear end side B36 which form an included angle with each other;

the first suction groove B211 on the first inspection block B21 is connected with the second suction groove B221 on the second inspection blocks B22 and B23 in parallel, but is not connected with the feeding suction groove B11 on the feeding block B1 and the discharging suction groove B31 on the discharging block B3 in parallel; the feeding suction groove B11 of the feeding block B1 has a vacant portion B17 at the rear end, the vacant portion B17 has a small section of a third suction groove B171 which is connected with the second suction groove B221 of the second inspection block B22, and a hollow suction hole B172 is formed in the third suction groove B171.

Referring to fig. 3 and 5, a plurality of rows (8 rows in this embodiment) of concentrically and annularly-arranged rectangular slots C1 are formed in the upper surface of the test board C at radial intervals, a plurality of rows of the slots C1 are annularly arranged at intervals, and the slots C1 corresponding to each row in the radial direction are linearly arranged at intervals in a plurality of rows; each of the sockets C1 can accommodate a device under test, such as a capacitor, having electrodes at upper and lower ends, respectively, and the device under test is placed in the socket C1 at the feeding unit D in fig. 5 with the electrodes at the upper and lower ends, respectively.

Referring to fig. 3 and 6, a recessed guide groove C2 is radially and circumferentially extended from the bottom of each seat groove C1 on the lower surface of the test board C, each guide groove C2 is respectively connected to the feeding suction groove B11, the first suction groove B211, the second suction groove B221, and the discharging suction groove B31 of the carrier chassis B during intermittent rotation of the test board C, so that when a negative pressure is introduced from the suction hole B12, the suction hole B1213, the suction hole B1223, and the suction hole B32 in the carrier chassis B for vacuum pumping, the negative pressure can be absorbed by the feeding suction groove B11, the first suction groove B211, the second suction groove B221, and the discharging suction groove B31 to the object to be tested (in this embodiment, a capacitor-type electronic component) contained in each seat groove C1; a long cleaning groove C3 in a concave section shape is formed between two rows of the seat grooves C1 on the lower surface of the test board C, a convex expansion section C31 close to the seat groove C1 is formed at the position, close to each seat groove C1, of the cleaning groove C3, and the cleaning groove C3 is used for containing powder scraps generated by friction between the lower surface of the test board C and the bearing chassis B under long-term operation so as to avoid blocking the aperture at the bottom of the seat groove C1.

Referring to fig. 1, 3 and 7, the discharging unit F is provided with a duct plate F1, the duct plate F1 is provided with a plurality of flexible ducts F2, each duct F2 has one end corresponding to the upper side of one seat C1 on the test board C, and the other end pulls one magazine K1 which is correspondingly conducted to the collecting mechanism K through the material guiding frame H;

the collecting mechanism K is provided with a rectangular frame-shaped seat frame K2, the material box K1 is arranged in the seat frame K2, and the table top A2 of the machine table is formed above the seat frame K2 and is provided with the material guiding frame H; the material guiding frame H is provided with a plurality of rows of strip-shaped embedding seats H1, the embedding seats H1 are provided with a plurality of embedding holes H2 which are arranged in a linear way at intervals and can be respectively embedded with the guide pipe F2, and the embedding seats H1 are formed by juxtaposing two detachable and assembled side seats H11 and H12 which are respectively arranged at the left side and the right side.

Referring to fig. 1, 7 and 8, one side of the duct board F1 of the discharge unit F is disposed on a lifting frame F3, wherein the lifting frame F3 is connected and linked with the duct board F1 through a connecting member F4, the connecting member F4 and the lifting frame F3 are provided with an overlapping portion F31 at the upper and lower portions thereof, two pivot rods F5 are disposed at the overlapping portion F31 at intervals, an elastic member F6 (not shown) formed by a spring is disposed between the lower surface of the connecting member F4 and the upper surface of the lifting frame F3, the distance between the lower surface of the connecting member F4 and the upper surface of the lifting frame F3 is maintained by the support of the elastic member F6, and a screw abutting member F7 is disposed on the connecting member F4 to be screwed into the upper surface of the lifting frame F3 at the lower portion thereof, and the screw abutting member F7 is pressed downward or upward by the screw abutting to adjust the connecting member F4 to move up and down under the support of the two pivot rods F5, so as to change the distance between the duct board F1 and the test board C; the lifting frame F3 is provided with two screw fasteners F32 which can be screwed to the table top A1 of the machine table to fix the lifting frame F3; the lifting frame F3 is also provided with a positioning groove F33 in a hollow long groove shape, and the positioning groove F33 is just sleeved and embedded on a positioning piece A11 on the table board A1 when the lifting frame F3 is placed on the table board A1, so that the lifting frame F3 is positioned; the lifting frame F3 is pivoted on a pivoting seat K21 above the seat frame K2 of the collecting mechanism K by one end, a corner side K22 of the seat frame K2 is pivoted on an upper side and a lower side by a pivoting buckle seat K23 respectively, and a pull handle K24 is arranged on one side of the seat frame K2.

Referring to fig. 8 and 9, by pulling the handle K24, the seat frame K2 can be lifted to one side with the pivot fastening seat K23 as a fulcrum, so that a hollow operation area K3 is formed below the machine table top A1 and on one side of the discharge unit F, and an operator can be located in the operation area K3 and close to the machine table top A1 for maintenance; the duct board F1 and the ducts F2 thereon can be lifted along with the lifting frame F3 from the machine table top A1 to the collecting mechanism K, i.e. to the direction of the operator, so that the whole discharging unit F is positioned above the seat frame K2, and when the seat frame K2 is lifted to one side, the whole discharging unit F is linked and displaced to one side.

Referring to fig. 7 and 9, an ion generator F8 is disposed on the duct board F1 below the duct board F1, where the test board C intermittently rotates clockwise to enter the exhaust unit F and is to leave the place below the duct board F1, and a blowing slot F81 in a slender slot shape and extending across each row of seat slots C1 covering the radial direction of each test board C is disposed below the duct board F1 at the ion generator F8, where the ion generator F8 can generate ion gas to blow through the blowing slot F81 to the upper surface of the test board C, so as to prevent the tested component from being adhered to the surface of the test board C due to static electricity; the test board C intermittently rotates in a clockwise direction away from the guide pipe plate F1, an inspection assembly F9 is arranged outside the guide pipe plate F1, and the inspection assembly F9 is provided with a detector F91 respectively corresponding to the upper part of each row of seat grooves C1 on the test board C and used for inspecting whether the tested elements which are not removed by the guide pipe F2 or the adsorption groove F8 exist or not;

the front side A3 of the machine under the machine table A1 is provided with a clamping piece A31 which is arranged at intervals and can be driven to horizontally extend out or retract to one side, the seat frame K2 is provided with an upper buckling part K26 and a lower buckling part K26 at intervals relative to a back side surface K25 of the front side A3 of the machine, one side of the seat frame K2 takes the pivot buckling seat K23 as a fulcrum to lead the other side to move back relative to the front side A3 of the machine, the clamping piece A31 can be driven to be embedded into the buckling part K26 by the driving clamp to lead the seat frame K2 to be kept in a positioning state, or when one side of the seat frame K2 takes the pivot buckling seat K23 as a fulcrum to lead the other side to be lifted relative to the front side A3 of the machine, the clamping piece A31 is driven to retract and is separated from being embedded into the buckling part K26, thus leading the seat frame K2 to be released from the positioning state and can be lifted.

In the electronic component testing device of the embodiment of the invention, one side of the conduit plate F1 is arranged on the lifting frame F3, one end of the lifting frame F3 is pivoted on the pivoting seat K21 above the seat frame K2 of the collecting mechanism, so that the conduit plate F1 and each conduit F2 thereon can be lifted along with the lifting frame F3 from the machine table board A1 to the direction of the collecting mechanism K, namely to the direction of an operator, and the whole discharging unit F is positioned above the seat frame K2, therefore, the operator can conveniently overhaul the discharging unit F.

The above description is only exemplary of the present invention, and should not be taken as limiting the scope of the invention, which is defined by the appended claims and their equivalents, as well as the claims and their equivalents.

Claims (10)

1. An electronic component testing apparatus comprising:

a machine table, on which a machine table top is arranged;

the bearing chassis is arranged on the table board, a test board which can be driven to rotate is arranged on the bearing chassis, and a feeding unit, an inspection unit and a discharging unit are arranged outside the periphery of the bearing chassis; wherein, the first and the second end of the pipe are connected with each other,

the discharging unit is provided with a conduit plate, the conduit plate is provided with a plurality of flexible conduits, one end of each conduit corresponds to the upper part of one seat groove on the test plate, and the other end of each conduit correspondingly conducts to a material box of a collecting mechanism by drawing through the material guide frame;

one side of the conduit board is arranged on a lifting frame, one end of the lifting frame is pivoted on a pivot seat above a seat frame of the collecting mechanism, so that the conduit board and each conduit on the conduit board can be lifted along with the lifting frame from the table board to the collecting mechanism, namely, towards the direction of an operator, and the whole discharge unit is positioned above the seat frame.

2. The device for testing electronic components of claim 1, wherein the magazine is disposed in the seat frame, the seat frame is pivoted, and the seat frame can be pivoted to one side, so that a hollow operation region is formed below the table top and on the side of the discharge unit.

3. An electronic component testing apparatus comprising:

a machine table, on which a machine table top is arranged;

the bearing chassis is arranged on the table board, a test board which can be driven to rotate is arranged on the bearing chassis, and a feeding unit, an inspection unit and a discharging unit are arranged outside the periphery of the bearing chassis; wherein the content of the first and second substances,

the discharging unit is provided with a conduit plate, the conduit plate is provided with a plurality of flexible conduits, one end of each conduit corresponds to the upper part of one seat groove on the test plate, and the other end of each conduit correspondingly conducts to a material box of a collecting mechanism by drawing through the material guide frame;

the material box is arranged in the seat frame, the seat frame is pivoted, and the seat frame can be lifted to one side, so that one side of the lower part of the table board close to the discharge unit presents a hollow operation area.

4. The device for testing electronic components of claim 3, wherein the duct board is disposed on a side of a cradle, the cradle having a pivot base pivotally mounted at an end thereof above the cradle, such that the duct board and the ducts thereon can be lifted along with the cradle from the platform surface toward the collecting mechanism, i.e., toward the operator, such that the entire discharge unit is located above the cradle.

5. The electronic component testing apparatus as claimed in any one of claims 1 or 3, wherein the seat frame is pivoted by a pivot seat at a corner side up and down, respectively.

6. The electronic component testing apparatus as claimed in any one of claims 1 or 3, wherein a pull handle is provided on one side of the housing, and the housing is lifted to one side with a pivot holder as a fulcrum by pulling the pull handle.

7. The device for testing electronic components of any one of claims 1 or 3, wherein the holder is displaceable in conjunction with the entire discharge unit.

8. The electronic component testing apparatus of any of claims 1 or 3, wherein a lead frame is disposed above the mount; the material guiding frame is provided with a plurality of rows of strip-shaped embedding seats, the embedding seats are provided with a plurality of embedding holes which are arranged in a linear way at intervals and can be respectively embedded with the guide tubes, and the embedding seats are formed by juxtaposing two detachable and assembled side seats which are respectively arranged at the left side and the right side.

9. The device for testing electronic components of any one of claims 1 or 4, wherein the cradle is coupled to the conduit board by a connecting member, the connecting member and the cradle have an overlapping portion at an upper and a lower portion thereof, the overlapping portion is provided with a pivot rod at a distance, an elastic member is provided between a lower surface of the connecting member and an upper surface of the cradle, the elastic member supports the connecting member to maintain a distance between the lower surface of the connecting member and the upper surface of the cradle, the connecting member is provided with a screw member which is screwed into the upper surface of the cradle below, and the screw member is screwed downward or upward to adjust the connecting member to move up and down under the support of the pivot rod, so as to couple the conduit board to change the distance between the conduit board and the test board.

10. The device for testing electronic components of any one of claims 1 or 4, wherein the lifting frame has a hollow positioning slot, and the positioning slot is just embedded on a positioning member on the platform of the platform when the lifting frame is placed on the platform of the platform, so that the lifting frame is positioned.

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