CN115495380A

CN115495380A - Test case generation method and device, electronic equipment and storage medium

Info

Publication number: CN115495380A
Application number: CN202211274834.2A
Authority: CN
Inventors: 肖应伟; 杨杰荣; 王丽
Original assignee: Agricultural Bank of China
Current assignee: Agricultural Bank of China
Priority date: 2022-10-18
Filing date: 2022-10-18
Publication date: 2022-12-20

Abstract

The invention discloses a test case generation method and device, electronic equipment and a storage medium. The method comprises the following steps: acquiring production operation and maintenance data corresponding to the to-be-tested application, and determining at least one to-be-used test case corresponding to the to-be-tested application; determining a to-be-used test equivalent class set corresponding to the current test input item based on the to-be-processed test equivalent class set of the current test input item and a used equivalent class set of a target configuration input item matched with the current test input item; obtaining a target test equivalence class set corresponding to the test input item based on the test equivalence class set to be used and the test equivalence class set to be processed corresponding to the corresponding test input item; and obtaining the target test case based on the target test equivalent set of each test input item corresponding to the test case to be used. The problem of among the prior art because the risk confirms the test item, lead to the test incomplete and test effect poor is solved, realize improving the comprehensiveness of test, reach the effect that improves test effect.

Description

Test case generation method and device, electronic equipment and storage medium

Technical Field

The invention relates to the technical field of computer processing, in particular to a test case generation method and device, electronic equipment and a storage medium.

Background

Currently, both on-line products and off-line products involve testing the products, and the performance of the products is continuously optimized through the tests, and in the process, the test items are selected for the products to be tested.

The existing method for selecting test items generally identifies which risks exist in the product to be tested, and determines which test items need to be selected for risk testing based on the risks. However, in the process of testing actual projects, due to factors such as complex system, multiple functions, limited human resources, short time period and the like, the design of test cases is lost, and the test effect is poor; or, too many test cases result in that the test cases cannot be executed completely, and further result in the problem of insufficient test.

Disclosure of Invention

The invention provides a test case generation method, a test case generation device, electronic equipment and a storage medium, which are used for improving the test comprehensiveness and achieving the technical effect of improving the test effect while ensuring the test requirements.

According to an aspect of the present invention, a test case generation method is provided, and the method includes:

the method comprises the steps of obtaining production operation and maintenance data corresponding to an application to be tested, and determining at least one test case to be used corresponding to the application to be tested; the production operation and maintenance data comprises at least one to-be-used configuration input item and a used equivalent class set corresponding to each to-be-used configuration input item, and the to-be-used test case comprises at least one test input item and a to-be-processed test equivalent class set corresponding to each test input item;

for each test input item, determining a to-be-used test equivalent class set corresponding to the current test input item based on the to-be-processed test equivalent class set corresponding to the current test input item and a used equivalent class set of a target configuration input item matched with the current test input item; the set of the test equivalence classes to be used comprises a test equivalence class to be adjusted and a used equivalence class to be supplemented;

obtaining a target test equivalence class set corresponding to the test input item based on the test equivalence class set to be used and the test equivalence class set to be processed corresponding to the corresponding test input item;

and obtaining a target test case corresponding to the application to be tested based on the target test equivalent set corresponding to each test input item corresponding to the test case to be used.

According to another aspect of the present invention, there is provided a test case generation apparatus, including:

the to-be-used test case determining module is used for acquiring production operation and maintenance data corresponding to the to-be-tested application and determining at least one to-be-used test case corresponding to the to-be-tested application; the production operation and maintenance data comprises at least one to-be-used configuration input item and a used equivalent class set corresponding to each to-be-used configuration input item, and the to-be-used test case comprises at least one test input item and a to-be-processed test equivalent class set corresponding to each test input item;

the system comprises a to-be-used test equivalent set determining module, a to-be-used test equivalent set determining module and a to-be-used test equivalent set determining module, wherein the to-be-used test equivalent set determining module is used for determining a to-be-used test equivalent set corresponding to a current test input item for each test input item based on the to-be-processed test equivalent set corresponding to the current test input item and a used equivalent set of a target configuration input item matched with the current test input item; the set of the test equivalence classes to be used comprises a test equivalence class to be adjusted and a used equivalence class to be supplemented;

the target test equivalent class set determining module is used for obtaining a target test equivalent class set corresponding to the test input item based on the test equivalent class set to be used and the test equivalent class set to be processed corresponding to the corresponding test input item;

and the target test case determining module is used for obtaining a target test case corresponding to the application to be tested based on the target test equivalent class set corresponding to each test input item corresponding to the test case to be used.

According to another aspect of the present invention, there is provided an electronic apparatus including:

at least one processor; and

a memory communicatively coupled to the at least one processor; wherein,

the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to execute the test case generation method according to any embodiment of the present invention.

According to another aspect of the present invention, a computer-readable storage medium is provided, where computer instructions are stored, and the computer instructions are used for causing a processor to implement the test case generation method according to any embodiment of the present invention when executed.

According to the technical scheme of the embodiment of the invention, the production operation and maintenance data corresponding to the application to be tested and at least one test case to be used are obtained, and the test equivalence class set to be used corresponding to the current test input item is determined based on the test equivalence class set to be processed corresponding to the current test input item and the used equivalence class set of the target configuration input item matched with the current test input item; obtaining a target test equivalence class set corresponding to the test input item based on the test equivalence class set to be used and the test equivalence class set to be processed corresponding to the corresponding test input item; the target test case corresponding to the application to be tested is obtained based on the target test equivalent set corresponding to each test input item corresponding to the test case to be used, the problems of incomplete test and poor test effect caused by the fact that the test items are determined based on risks in the prior art are solved, the test case in the test environment is adjusted based on the production operation and maintenance data in the actual production environment, the generated test case can cover the actual production environment, the generation quality of the test case is improved, the test requirement is guaranteed, meanwhile, the comprehensiveness of the test is improved, and the technical effect of improving the test effect is achieved.

It should be understood that the statements in this section do not necessarily identify key or critical features of the embodiments of the present invention, nor do they necessarily limit the scope of the invention. Other features of the present invention will become apparent from the following description.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the description below are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a flowchart of a test case generation method according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of an input item presentation according to an embodiment of the present invention;

FIG. 3 is a diagram illustrating an input item comparison between a production operation scenario and a test scenario according to a second embodiment of the present invention;

FIG. 4 is a schematic diagram of a test case generation method according to a second embodiment of the present invention;

fig. 5 is a schematic structural diagram of a test case generating apparatus according to a third embodiment of the present invention;

fig. 6 is a schematic structural diagram of an electronic device implementing the test case generation method according to the embodiment of the present invention.

Detailed Description

In order to make those skilled in the art better understand the technical solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, shall fall within the protection scope of the present invention.

It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Moreover, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

Example one

Fig. 1 is a flowchart of a test case generation method according to an embodiment of the present invention, where the embodiment is applicable to a case of generating a test case, the method may be executed by a test case generation apparatus, the test case generation apparatus may be implemented in a form of hardware and/or software, and the test case generation apparatus may be configured in a computing device. As shown in fig. 1, the method includes:

s110, obtaining production operation and maintenance data corresponding to the to-be-tested application, and determining at least one to-be-used test case corresponding to the to-be-tested application.

The application to be tested can be an application which needs a test case of the application to be tested, so that the application is tested based on the test case. The production operation and maintenance data may be various data to be tested and applied to an actual production environment, for example, may be a server, a network device, a database, a middleware, or the like, may also be an operation status of a device and an application system, or may also be usage data when a user uses application software. Optionally, the production operation and maintenance data includes at least one configuration entry to be used and an equivalent class set used and corresponding to each configuration entry to be used. The configuration input items to be used may be understood as input items when the application is actually used. For example, a user clicking a button may be an input, and the corresponding location may be an input, such as a user password, an account ID, a transaction node, and so on. The used equivalence class set includes at least one used equivalence class that can characterize an equivalence class used by a user in an actual production environment. An equivalence class refers to a subset of entries in which the effect of each input datum is equivalent, with reasonable assumptions: testing a representative value of an equivalence class is equivalent to testing other values of that class. For example, the entry is a user password, and its corresponding equivalence class may include letters, numbers, a combination of letters and numbers, alphabetical starts, and the like. The test case to be used comprises at least one test input item and a test equivalence class set to be processed corresponding to each test input item. The test entry refers to each operation required to bring the test entry into a state of comparing an expected result with a measured result in the test environment. The set of test equivalence classes to be processed includes at least one test equivalence class, and the test equivalence class can represent an equivalence class in a test environment. The test case to be used may be a test case tested for the application to be tested, or may be a test case designed for the application to be tested in real time.

In this embodiment, when a test case of an application to be tested needs to be generated, production operation and maintenance data corresponding to the application to be tested may be obtained through an interface. Specifically, the implementation manner of obtaining the production operation and maintenance data corresponding to the application to be tested may be: acquiring production operation and maintenance data corresponding to the application to be tested from a preset position based on a data acquisition interface; analyzing the production operation and maintenance data based on the data reading component to obtain at least one to-be-used configuration input item in the production operation and maintenance data and a used equivalent class set corresponding to each to-be-used configuration input item. The data acquisition interface may be interface data for acquiring the production operation and maintenance data. The preset position refers to a position for storing production operation and maintenance data, and can be a database or a cache. The data reading component may be a program or code with a parsing reading function, and may be an SQL statement, for example.

Specifically, the production operation and maintenance data corresponding to the application to be tested may be obtained from the cache in the preset location based on the data obtaining interface, for example, the production operation and maintenance data includes the total number of test points in the actual production environment. Furthermore, the production operation and maintenance data can be analyzed and read by using the data reading component, the full test points can be used as the configuration input items to be used, and the used equivalent class set corresponding to each configuration input item to be used is obtained.

For example, for an application a to be tested, a data table structure of production data of the application a may be obtained from a corresponding development system or an operation and maintenance system, and the table data is pulled to the system, after the system receives the table data, a data reading component such as an SQL statement or a tool may be used to query the required production data, and a total number of test points in the required production data is obtained as b = { b1, b2... Bn }, where bn represents a used equivalence class, and n is a natural number.

In this embodiment, when a test case of an application to be tested needs to be generated, at least one test case to be used corresponding to the application to be tested may be determined, and the implementation manner may be: calling at least one test case to be used corresponding to the application to be tested from a preset test case set; and/or receiving the uploaded test case data corresponding to the application to be tested, and analyzing the test case data to obtain at least one test case to be used.

The test case set stores existing test point assets and combs out test cases, and each test case is used for executing a corresponding application test. The test case data includes at least one of a test target, a test environment, an entry, a test step, an expected result, and a test script.

In this embodiment, at least one test case to be used corresponding to an application to be tested may be called from an existing test case set by using a mapping technique; or when the user uploads input conditions (such as documents of a requirement specification, a design specification and the like) related to the application to be tested by using the interface, the user considers that the test case data is received, and can analyze various input information in the test case data to obtain at least one test case to be used. For example, in a test environment, a tester may upload input conditions (such as documents of a requirement specification, a design specification, and the like) and call existing test point assets to comb out test cases, and the total test points are a = { a1, a2.... An }, where an represents a test equivalence class and n is a natural number.

And S120, for each test input item, determining a to-be-used test equivalent class set corresponding to the current test input item based on the to-be-processed test equivalent class set corresponding to the current test input item and the used equivalent class set of the target configuration input item matched with the current test input item.

The set of the equivalence classes to be used includes the equivalence class to be adjusted and the equivalence class to be supplemented. The test equivalence classes to be adjusted refer to the test equivalence classes that need to be deleted or retained. The used equivalence classes to be supplemented refer to used equivalence classes that need to be supplemented into the test cases. It should be noted that, the same manner is used for determining the to-be-used test equivalence set corresponding to each test input item, and any test input item may be used as the current test input item for description.

In this embodiment, the current test input item and each to-be-used configuration input item may be compared and analyzed, and the to-be-used configuration input item matching the current test input item is determined as the target configuration input item. Furthermore, the to-be-processed test equivalence class set corresponding to the current test input item and the used equivalence class set corresponding to the target configuration input item can be compared and analyzed, a test equivalence class different from the used equivalence class set in the to-be-processed test equivalence class set is determined to serve as the to-be-adjusted test equivalence class, and the to-be-adjusted test equivalence class can represent the equivalence class which is not used in the actual environment but tested in the test environment. And determining a used equivalence class which is different from the testing equivalence class in the testing equivalence class set to be processed as a used equivalence class to be supplemented from the used equivalence class set, wherein the used equivalence class to be supplemented can represent an equivalence class which is used in an actual environment but is not tested in a testing environment. Correspondingly, the used equivalence class to be supplemented and the test equivalence class to be adjusted can be used as the set of test equivalence classes to be used. So that test cases in the test environment are subsequently adjusted based on the set of test equivalence classes to be used.

Optionally, determining the to-be-used test equivalence class set corresponding to the current test input item based on the to-be-processed test equivalence class set corresponding to the current test input item and the used equivalence class set of the target configuration input item matched with the current test input item, where the determining includes: determining an intersection set based on the to-be-processed test equivalent set corresponding to the current test input item and the used equivalent set of the target configuration input item matched with the current test input item; determining a test equivalence class to be adjusted based on the intersection and the test equivalence class set to be processed corresponding to the current test input item; and determining used equivalence classes to be supplemented based on the used equivalence class sets and intersections of the target configuration entries; and determining a to-be-used test equivalence class set corresponding to the current test input item based on the to-be-adjusted test equivalence class and the to-be-supplemented used equivalence class.

In this embodiment, each test equivalence class in the to-be-processed test equivalence class set of the current test input item may be compared with each used equivalence class in the used equivalence class set of the target configuration input item, and a used equivalence class that is the same as the test equivalence class is determined as an equivalence class in the intersection set, so as to obtain an intersection correspondingly. The equivalence classes in the intersection may characterize equivalence classes that have been used in both an actual environment and tested in a test environment. Furthermore, the equivalence classes except the intersection in the test equivalence class set to be processed can be used as the test equivalence class set to be adjusted, the equivalence classes except the intersection in the used equivalence class set can be used as the used equivalence classes to be supplemented, and a set formed by the test equivalence classes to be adjusted and the used equivalence classes to be supplemented is used as the test equivalence class set to be used.

It should be noted that, in order to ensure the validity of test case generation, before determining the to-be-used test equivalence class set corresponding to the current test input item based on the to-be-processed test equivalence class set corresponding to the current test input item and the used equivalence class set of the target configuration input item matching the current test input item, a quantity value of the test equivalence class included in the to-be-processed test equivalence class set corresponding to the current test input item may be determined as a first quantity value, and a quantity value of the used equivalence class included in the used equivalence class set of the target configuration input item may be determined as a second quantity value. If the first number value is less than or equal to the second number value, it can be stated that the equivalent class in the production environment not covered needs to be added in the test solution, at this time, the to-be-supplemented used equivalent class in the used equivalent class set can be determined, so as to supplement the to-be-supplemented used equivalent class to the to-be-processed test equivalent class set. If the first numerical value is larger than or equal to the second numerical value, whether the equivalence class which does not exist in the current production environment is abandoned or not can be determined according to the actual test time and the test efficiency, and at the moment, the test equivalence class to be adjusted can be determined so as to update the test equivalence class set to be processed based on the test equivalence class to be adjusted.

S130, obtaining a target test equivalence class set corresponding to the test input item based on the to-be-used test equivalence class set and the to-be-processed test equivalence class set corresponding to the corresponding test input item.

In this embodiment, after determining the to-be-used test equivalence class set corresponding to a certain test input item, the to-be-processed test equivalence class set in the test input item may be updated based on the to-be-adjusted test equivalence class and the to-be-supplemented used equivalence class in the to-be-used test equivalence class set. For example, the used equivalence classes to be supplemented are supplemented to the to-be-processed test equivalence class set, so that the application to be tested is tested based on the test cases containing the equivalence classes in the actual production environment, and the test comprehensiveness is improved. The test equivalence classes to be adjusted can be deleted from the test equivalence class set to be processed, the test equivalence classes to be adjusted are unused equivalence classes in the actual production environment, and the test efficiency can be improved while the test comprehensiveness and accuracy are guaranteed.

It should be noted that, in order to further ensure the comprehensiveness and effect of the test, the equivalence class of the test to be adjusted may be properly deleted or retained according to the test duration reserved for the application to be tested, and the test information is selected to ensure that the test can be performed within a limited time, thereby ensuring the test accuracy.

Optionally, obtaining a target test equivalence class set corresponding to the test input item based on the to-be-used test equivalence class set and the to-be-processed test equivalence class set corresponding to the corresponding test input item includes: determining a test equivalence class to be deleted based on the test equivalence class to be adjusted and the to-be-tested time length corresponding to the to-be-tested application; updating the equivalence class set of the test to be processed based on the equivalence class to be deleted and the used equivalence class to be supplemented to obtain an updated equivalence class set of the test to be processed; and taking the updated to-be-processed test equivalence class set as a target test equivalence class set.

The duration to be tested refers to a testing duration reserved for the application to be tested.

In this embodiment, after determining the time length to be tested corresponding to the application to be tested, the test equivalence classes that need to be reserved in each test equivalence class to be adjusted and the test equivalence classes that need to be deleted, that is, the test equivalence classes to be deleted, may be determined according to the time length to be tested. For example, by referring to the to-be-tested time length of the to-be-tested application, determining whether the to-be-processed test equivalence class set corresponding to the to-be-tested application can be tested within the to-be-tested time length, if not, indicating that the test equivalence classes are too many, synthesizing the test importance of each to-be-adjusted test equivalence class, and taking the test equivalence class with low test importance as the deletable equivalence class; if so, then the test equivalence classes in the set of pending test equivalence classes may not be deleted. Or after the used equivalence class to be supplemented is supplemented to the test equivalence class set to be processed, the test equivalence class with low test importance in the test equivalence class to be adjusted can be deleted from the test equivalence class set to be processed according to the time length to be tested. Correspondingly, the processed to-be-processed test equivalence class set can be used as a target test equivalence class set. The effect of test balance is achieved, and the test efficiency is improved while the test comprehensiveness is improved.

S140, obtaining a target test case corresponding to the application to be tested based on the target test equivalence set corresponding to each test input item corresponding to the test case to be used.

The target test case refers to test information required to test the application to be tested.

In this embodiment, after the to-be-processed test equivalence class set in each test input item is updated based on the production operation and maintenance data in the actual environment, a target test equivalence class set corresponding to each test input item may be obtained. Correspondingly, the test case to be used can be considered to be updated, and for a certain test case to be used, the target test equivalent class sets corresponding to the test input items in the test case to be used can be combined to obtain a new test case which is used as the target test case. Accordingly, a plurality of target test cases corresponding to the applications to be tested can be obtained. And testing the application to be tested based on each target test case.

It should be noted that, in order to enable a tester to accurately know the distribution of equivalence classes in a test environment and the usage situation of equivalence classes in an actual environment, a visual mathematical model may be established based on at least one to-be-used configuration input item in production operation and maintenance data and a used equivalence class set corresponding to each to-be-used configuration input item, and at least one test input item in to-be-used test cases and a to-be-processed test equivalence class set corresponding to each test input item, the production operation and maintenance data is compared with test cases compiled by the tester, the test cases are adjusted according to the production operation and maintenance data, and a part of equivalence classes are added or deleted.

Optionally, the method further includes: when an input item query request is received, determining a request parameter in the input item query request; and calling at least one test input item to be displayed corresponding to the request parameter and the test equivalence class corresponding to each test input item to be displayed from a preset database and displaying the test equivalence classes.

Wherein an entry query request may be understood as an instruction or code requesting query for entry information. The request parameters include, but are not limited to, a main system identifier, a subsystem identifier, a service type, and the like.

In practical applications, the server may be considered to receive an entry query request when a user triggers an entry query control of a system page. The input item query request can be analyzed to obtain the request parameters carried by the input item query request. Furthermore, the input items in the test environment corresponding to the request parameters may be called from the preset database by using the mapping relationship to serve as the test input items to be displayed and the test equivalence classes corresponding to the test input items to be displayed, and the test equivalence classes corresponding to the test input items to be displayed may be displayed, for example, the test equivalence classes may be displayed in a form of a bar chart or a list, and the display mode is not limited herein. The tester can independently inquire according to the requirement, the monitoring effect of the test case is improved, the test scheme can be adjusted according to the displayed input items and the corresponding equivalence classes, and the efficiency of designing the test case is improved.

For example, referring to fig. 2, fig. 2 may be represented as an entry presentation diagram, and a user may input request parameters such as a main system, a module (i.e., a subsystem), a transaction (i.e., a service), a function (i.e., a service type), and the like in an input box of a query page, and may consider that an entry query request is received after clicking a query button. The entries corresponding to the request parameters and the corresponding test equivalence classes may be presented, e.g., test entry a includes a1, a2, an. The test input item b comprises b1, b2, a. The test input item c comprises a c1, a c2, a. The test entry d includes the d1, d2, d3, d4, d5 equivalence classes.

On the basis of the scheme, after the target test case corresponding to the application to be tested is determined, the target test case can be applied to a test scene, so that the application to be tested is tested and analyzed based on the target test case. Optionally, the application to be tested is subjected to test analysis based on the target test case corresponding to the application to be tested, so as to obtain a test result, and determine a solution corresponding to the abnormal used equivalence class in the production operation and maintenance data based on the test result.

The abnormal used equivalence class can be understood as an equivalence class which fails in an actual production environment, and for example, the abnormal used equivalence class can be a transaction channel 1, a password length is 10 bits, and the like.

Specifically, after the target test case corresponding to the application to be tested is determined, the target test case can be used for performing test analysis on the application to be tested, accordingly, a test result can be obtained, the test result includes a test result corresponding to a used equivalence class used by a user in an actual production environment, a mode for solving an anomaly marked in production operation and maintenance data can be determined by using the equivalent class based on the test result, and data maintenance capability is improved.

According to the technical scheme of the embodiment, a to-be-used test equivalence class set corresponding to a current test input item is determined on the basis of a to-be-processed test equivalence class set corresponding to the current test input item and a used equivalence class set of a target configuration input item matched with the current test input item by acquiring production operation and maintenance data corresponding to an to-be-tested application and at least one to-be-used test case; obtaining a target test equivalence class set corresponding to the test input item based on the test equivalence class set to be used and the test equivalence class set to be processed corresponding to the corresponding test input item; the target test case corresponding to the application to be tested is obtained based on the target test equivalent set corresponding to each test input item corresponding to the test case to be used, the problems of incomplete test and poor test effect caused by the fact that the test items are determined based on risks in the prior art are solved, the test case in the test environment is adjusted based on the production operation and maintenance data in the actual production environment, the generated test case can cover the actual production environment, the generation quality of the test case is improved, the test requirement is guaranteed, meanwhile, the comprehensiveness of the test is improved, and the technical effect of improving the test effect is achieved.

Example two

As an alternative embodiment of the above embodiment, in order to make the technical solutions of the embodiments of the present invention further clear to those skilled in the art, a specific application scenario example is given. Specifically, the following details can be referred to.

In order to solve the problem of insufficient testing (such as missing of design cases and excessive design cases), the technical scheme can update the test cases in the test scene by comparing and verifying the production operation and maintenance scene with the test scene, thereby improving the effective coverage of the test cases. For example, referring to fig. 3, fig. 3 may be a schematic diagram for representing an input item alignment between a production operation and maintenance scenario and a test scenario. After a tester uploads input conditions (documents such as a requirement specification and a design specification) and the like to a system and calls existing test point assets to comb out a test scheme, the test information in a test environment received by the system is considered to be analyzed to obtain at least one test case to be used, and the test case to be used can include a total number of test points, such as a = { a1, a2. The method comprises the steps of obtaining production operation and maintenance data in an actual production environment, wherein the production operation and maintenance data can comprise a full test point b = { b1, b2... Bm }, bm represents a used equivalence class, and m is a natural number. If n is less than m, it means that there are more used equivalence classes in the actual production environment than test equivalence classes, i.e. the test scenario does not cover the production scenario, and there is a need to add equivalence classes in the production environment that are not covered in the test scenario, as shown in the dashed box on the left side of fig. 3. If n is greater than m, it indicates that the test equivalence class is more than the used equivalence class, i.e., the test scenario covers the production scenario, as shown in the dashed box on the right side of fig. 3, and it can be determined whether to discard an equivalence class that does not exist in the current production environment included in the test equivalence class according to the actual test duration and the test efficiency. By establishing the visual data model in the system, the change of the equivalence class of each input item in the production environment can be seen in real time, the test scheme and the test point are updated in time, and the test of each function is accurately completed.

Fig. 4 is a schematic diagram of a test case generation method according to a second embodiment of the present invention, and an implementation manner of specifically generating a test case may be: acquiring a table structure of the required production operation and maintenance data, for example, calling the corresponding data table structure from the corresponding development system or operation and maintenance system, pulling the table data to the system, and querying the required production data through SQL statements and components, that is, acquiring the production operation and maintenance data, and establishing a visual data model according to the production operation and maintenance data; further, comparing each input item and each corresponding used equivalence class in the production operation and maintenance data with the test input items in the test environment and the test equivalence classes of each test input item; and a tester can adjust the test case based on the production operation and maintenance data according to the visual comparison result, and add or delete part of the equivalence classes. So that the test case can be generated more accurately and effectively.

The technical scheme can also increase visual analysis and statistics of other key transaction input items, and provides guarantee for smooth development of test work and quality guarantee and excellent production guarantee of test items. For example, the system, the module, the transaction, the function and the like can be used as a basic query framework, query results are analyzed and counted, the method can continue to refer to fig. 2, the equivalence class update of each input item can be visualized in real time, the production condition can be mastered, meanwhile, independent query and application can be performed according to requirements, test cases in a test scheme can be updated in time according to the real-time update condition of production operation and maintenance data, the generated test cases are comprehensive, and the test effect is improved.

EXAMPLE III

Fig. 5 is a schematic structural diagram of a test case generation apparatus according to a third embodiment of the present invention. As shown in fig. 5, the apparatus includes: a test case determination module 510 to be used, a test equivalence class set determination module 520 to be used, a target test equivalence class set determination module 530, and a target test case determination module 540.

The to-be-used test case determining module 510 is configured to obtain production operation and maintenance data corresponding to an application to be tested, and determine at least one to-be-used test case corresponding to the application to be tested; the production operation and maintenance data comprises at least one to-be-used configuration input item and a used equivalent class set corresponding to each to-be-used configuration input item, and the to-be-used test case comprises at least one test input item and a to-be-processed test equivalent class set corresponding to each test input item; a to-be-used test equivalence class set determining module 520, configured to determine, for each test input item, a to-be-used test equivalence class set corresponding to the current test input item based on a to-be-processed test equivalence class set corresponding to the current test input item and a used equivalence class set of a target configuration input item matched with the current test input item; the set of the test equivalence classes to be used comprises a test equivalence class to be adjusted and a used equivalence class to be supplemented; a target test equivalence class set determining module 530, configured to obtain a target test equivalence class set corresponding to the test input item based on the to-be-used test equivalence class set and the to-be-processed test equivalence class set corresponding to the corresponding test input item; and the target test case determining module 540 is configured to obtain a target test case corresponding to the application to be tested based on the target test equivalence set corresponding to each test input item corresponding to the test case to be used.

On the basis of the above device, optionally, the test case determining module 510 to be used includes a production operation and maintenance data determining unit and a used equivalence class set determining unit.

The production operation and maintenance data determining unit is used for acquiring the production operation and maintenance data corresponding to the application to be tested from a preset position based on a data acquisition interface;

the used equivalent class set determining unit is used for analyzing the production operation and maintenance data based on a data reading component to obtain at least one to-be-used configuration input item in the production operation and maintenance data and a used equivalent class set corresponding to each to-be-used configuration input item;

wherein the used equivalence class set comprises at least one used equivalence class.

On the basis of the above apparatus, optionally, the to-be-used test case determining module 510 further includes a to-be-used test case determining unit.

The to-be-used test case determining unit is used for calling at least one to-be-used test case corresponding to the to-be-tested application from a preset test case set; and/or the presence of a gas in the gas,

receiving uploaded test case data corresponding to the application to be tested, and analyzing the test case data to obtain at least one test case to be used; wherein the test case data includes at least one of a test target, a test environment, an entry, a test procedure, an expected result, and a test script.

On the basis of the above apparatus, optionally, the to-be-used test equivalent class set determining module 520 includes an intersection determining unit, an equivalent class determining unit, and a to-be-used test equivalent class set determining unit.

The intersection determining unit is used for determining an intersection based on the to-be-processed test equivalent set corresponding to the current test input item and the used equivalent set of the target configuration input item matched with the current test input item;

the equivalence class determining unit is used for determining a test equivalence class to be adjusted based on the intersection and the test equivalence class set to be processed corresponding to the current test input item; and a determining unit, configured to determine, based on the used equivalence class set and the intersection of the target configuration input item, a used equivalence class to be supplemented;

and the to-be-used test equivalence class set determining unit is used for determining the to-be-used test equivalence class set corresponding to the current test input item based on the to-be-adjusted test equivalence class and the to-be-supplemented used equivalence class.

On the basis of the foregoing apparatus, optionally, the target test equivalence class set determining module 530 includes a to-be-deleted test equivalence class determining unit, a to-be-processed test equivalence class set determining unit, and a target test equivalence class set determining unit.

The to-be-deleted test equivalence class determining unit is used for determining the to-be-deleted test equivalence class based on the to-be-adjusted test equivalence class and the to-be-tested time length corresponding to the to-be-tested application;

a to-be-processed test equivalence class set determining unit, configured to update the to-be-processed test equivalence class set based on the to-be-deleted test equivalence class and the to-be-supplemented used equivalence class, and obtain an updated to-be-processed test equivalence class set;

and the target test equivalence class set determining unit is used for taking the updated to-be-processed test equivalence class set as the target test equivalence class set.

On the basis of the above device, optionally, the device further includes a display module, where the display module includes a request parameter determining unit and a display unit.

The device comprises a request parameter determining unit, a query unit and a query unit, wherein the request parameter determining unit is used for determining a request parameter in an input item query request when the input item query request is received; the request parameters comprise a main system identifier, a subsystem identifier, a service identifier and a service type;

and the display unit is used for calling and displaying at least one test input item to be displayed corresponding to the request parameter and the test equivalence class corresponding to each test input item to be displayed from a preset database.

On the basis of the above device, optionally, the device is applied to a test scenario, the device further includes a test analysis module,

and the test analysis module is used for carrying out test analysis on the application to be tested based on the target test case corresponding to the application to be tested to obtain a test result, and determining a solution corresponding to the abnormal used equivalence class in the production operation and maintenance data based on the test result.

The test case generation device provided by the embodiment of the invention can execute the test case generation method provided by any embodiment of the invention, and has the corresponding functional module and beneficial effect of the execution method.

Example four

Fig. 6 is a schematic structural diagram of an electronic device implementing the test case generation method according to the embodiment of the present invention. Electronic devices are intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device may also represent various forms of mobile devices, such as personal digital assistants, cellular phones, smart phones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be exemplary only, and are not meant to limit implementations of the inventions described and/or claimed herein.

As shown in fig. 6, the electronic device 10 includes at least one processor 11, and a memory communicatively connected to the at least one processor 11, such as a Read Only Memory (ROM) 12, a Random Access Memory (RAM) 13, and the like, wherein the memory stores a computer program executable by the at least one processor, and the processor 11 can perform various suitable actions and processes according to the computer program stored in the Read Only Memory (ROM) 12 or the computer program loaded from a storage unit 18 into the Random Access Memory (RAM) 13. In the RAM 13, various programs and data necessary for the operation of the electronic apparatus 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other via a bus 14. An input/output (I/O) interface 15 is also connected to bus 14.

A number of components in the electronic device 10 are connected to the I/O interface 15, including: an input unit 16 such as a keyboard, a mouse, or the like; an output unit 17 such as various types of displays, speakers, and the like; a storage unit 18 such as a magnetic disk, optical disk, or the like; and a communication unit 19 such as a network card, modem, wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information/data with other devices via a computer network such as the internet and/or various telecommunication networks.

The processor 11 may be a variety of general and/or special purpose processing components having processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various specialized Artificial Intelligence (AI) computing chips, various processors running machine learning model algorithms, a Digital Signal Processor (DSP), and any suitable processor, controller, microcontroller, or the like. The processor 11 performs the various methods and processes described above, such as the test case generation method.

In some embodiments, the test case generation method may be implemented as a computer program tangibly embodied in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program may be loaded and/or installed onto the electronic device 10 via the ROM 12 and/or the communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the test case generation method described above may be performed. Alternatively, in other embodiments, the processor 11 may be configured to perform the test case generation method in any other suitable manner (e.g., by way of firmware).

Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuitry, field Programmable Gate Arrays (FPGAs), application Specific Integrated Circuits (ASICs), application Specific Standard Products (ASSPs), system on a chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs that are executable and/or interpretable on a programmable system including at least one programmable processor, which may be special or general purpose, receiving data and instructions from, and transmitting data and instructions to, a storage system, at least one input device, and at least one output device.

A computer program for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the computer programs, when executed by the processor, cause the functions/acts specified in the flowchart and/or block diagram block or blocks to be performed. A computer program can execute entirely on a machine, partly on a machine, as a stand-alone software package partly on a machine and partly on a remote machine or entirely on a remote machine or server.

In the context of the present invention, a computer-readable storage medium may be a tangible medium that can contain, or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. A computer readable storage medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. Alternatively, the computer readable storage medium may be a machine readable signal medium. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which a user can provide input to the electronic device. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form, including acoustic, speech, or tactile input.

The systems and techniques described here can be implemented in a computing system that includes a back-end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back-end, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), wide Area Networks (WANs), blockchain networks, and the internet.

The computing system may include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server can be a cloud server, also called a cloud computing server or a cloud host, and is a host product in a cloud computing service system, so that the defects of high management difficulty and weak service expansibility in the traditional physical host and VPS service are overcome.

It should be understood that various forms of the flows shown above may be used, with steps reordered, added, or deleted. For example, the steps described in the present invention may be executed in parallel, sequentially, or in different orders, and are not limited herein as long as the desired results of the technical solution of the present invention can be achieved.

The above-described embodiments should not be construed as limiting the scope of the invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions may be made, depending on design requirements and other factors. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A test case generation method is characterized by comprising the following steps:

2. The method of claim 1, wherein the obtaining production operation and maintenance data corresponding to the application to be tested comprises:

acquiring production operation and maintenance data corresponding to the application to be tested from a preset position based on a data acquisition interface;

analyzing the production operation and maintenance data based on a data reading component to obtain at least one to-be-used configuration input item in the production operation and maintenance data and a used equivalent class set corresponding to each to-be-used configuration input item;

3. The method of claim 1, wherein the determining at least one test case to be used corresponding to the application to be tested comprises:

calling at least one test case to be used corresponding to the application to be tested from a preset test case set; and/or the presence of a gas in the atmosphere,

4. The method of claim 1, wherein determining the set of equivalent classes to be used corresponding to the current test entry based on the set of equivalent classes to be tested corresponding to the current test entry and the set of equivalent classes used for the target configuration entry matching the current test entry comprises:

determining an intersection set based on the to-be-processed test equivalent class set corresponding to the current test input item and the used equivalent class set of the target configuration input item matched with the current test input item;

determining a test equivalence class to be adjusted based on the collection and the test equivalence class set to be processed corresponding to the current test input item; and,

determining a used equivalence class to be supplemented based on the used equivalence class set and the intersection of the target configuration input item;

and determining a set of to-be-used test equivalence classes corresponding to the current test input item based on the to-be-adjusted test equivalence class and the to-be-supplemented used equivalence class.

5. The method of claim 1, wherein obtaining the target test equivalence class set corresponding to the test entry based on the to-be-used test equivalence class set and the to-be-processed test equivalence class set corresponding to the corresponding test entry comprises:

determining a test equivalence class to be deleted based on the test equivalence class to be adjusted and the to-be-tested time length corresponding to the to-be-tested application;

updating the to-be-processed test equivalence class set based on the to-be-deleted test equivalence class and the to-be-supplemented used equivalence class to obtain an updated to-be-processed test equivalence class set;

and taking the updated to-be-processed test equivalence class set as the target test equivalence class set.

6. The method of claim 1, further comprising:

when an input item query request is received, determining a request parameter in the input item query request; the request parameters comprise a main system identifier, a subsystem identifier, a service identifier and a service type;

and calling and displaying at least one test input item to be displayed corresponding to the request parameter and the test equivalence class corresponding to each test input item to be displayed from a preset database.

7. The method of claim 1, applied to a test scenario, further comprising:

and testing and analyzing the application to be tested based on the target test case corresponding to the application to be tested to obtain a test result, and determining a solution corresponding to the abnormal used equivalence class in the production operation and maintenance data based on the test result.

8. A test case generation apparatus, comprising:

9. An electronic device, characterized in that the electronic device comprises:

at least one processor; and

a memory communicatively coupled to the at least one processor; wherein,

the memory stores a computer program executable by the at least one processor, the computer program being executable by the at least one processor to enable the at least one processor to perform the test case generation method of any of claims 1-7.

10. A computer-readable storage medium storing computer instructions for causing a processor to implement the test case generation method of any one of claims 1-7 when executed.