CN115470922A - Quantum bit calibration method and device, quantum control system and quantum computer - Google Patents
Quantum bit calibration method and device, quantum control system and quantum computer Download PDFInfo
- Publication number
- CN115470922A CN115470922A CN202210309493.1A CN202210309493A CN115470922A CN 115470922 A CN115470922 A CN 115470922A CN 202210309493 A CN202210309493 A CN 202210309493A CN 115470922 A CN115470922 A CN 115470922A
- Authority
- CN
- China
- Prior art keywords
- qubit
- time
- tested
- quantum
- calibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002096 quantum dot Substances 0.000 title claims abstract description 197
- 238000000034 method Methods 0.000 title claims abstract description 35
- 238000004590 computer program Methods 0.000 claims description 19
- 238000012360 testing method Methods 0.000 claims description 17
- 238000012545 processing Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 230000006870 function Effects 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012956 testing procedure Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000005610 quantum mechanics Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N10/00—Quantum computing, i.e. information processing based on quantum-mechanical phenomena
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Mathematical Analysis (AREA)
- Data Mining & Analysis (AREA)
- Evolutionary Computation (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computational Mathematics (AREA)
- Mathematical Optimization (AREA)
- Pure & Applied Mathematics (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Software Systems (AREA)
- Artificial Intelligence (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a quantum bit calibration method and device, a quantum control system and a quantum computer, wherein the quantum bit calibration method obtains the stable running time of a quantum bit to be tested, wherein the stable running time is the longest time that the quantum bit to be tested does not generate errors in a working state; and performing calibration operation on the qubit to be tested based on the stable running time. By utilizing the quantum bit calibration scheme provided by the application, the automatic calibration of the quantum bit can be realized, the manual intervention is not needed, the calibration operation is automatically carried out on the quantum bit to be tested after the stable running time of the quantum bit to be tested is reached, and the calibration efficiency and accuracy are effectively improved.
Description
Technical Field
The invention relates to the field of quantum computing, in particular to a quantum bit calibration method and device, a quantum control system and a quantum computer.
Background
Quantum computation and quantum information are a cross discipline for realizing computation and information processing tasks based on the principle of quantum mechanics, and are closely related to disciplines such as quantum physics, computer discipline, informatics and the like. There has been rapid development in the last two decades. Quantum computer-based quantum algorithms, in scenarios such as factorization, unstructured searching, etc., exhibit performance far exceeding existing classical computer-based algorithms, also placing this direction in the hope of exceeding existing computing capabilities. Since quantum computing has a potential for developing far beyond the performance of a classical computer in solving specific problems, in order to realize a quantum computer, it is necessary to obtain a quantum chip containing quantum bits with sufficient quantity and sufficient quality, and to perform extremely high-fidelity quantum logic gate operation and reading on the quantum bits.
The quantum chip is equivalent to a quantum computer as a CPU (central processing unit) and is a core component of the quantum computer. With the continuous research and advance of the quantum computing related technology, the quantum bit number on the quantum chip is also increased year by year, and it is expected that a larger-scale quantum chip will appear later, the quantum bit number in the quantum chip will be more at that time, and the quantum computer will also be loaded with the larger-scale quantum chip. With the increase of the number of qubits in the quantum chip, the problem of parameter drift of some qubits is necessarily faced in the use process, and at this time, corresponding calibration operation needs to be performed on the qubits.
Generally, in the process from research and development to online use, a quantum chip needs to pass through a plurality of early test stages until the performance parameters of the quantum chip meet the online requirement, and then the quantum chip can be used online. In the early stage of testing, all the quantum bits in the quantum chip can be tested and calibrated in detail according to a set of testing procedures, so that specific parameters which drift can be obtained in time in the early stage of testing. After online use, for example, when a certain quantum chip executes a quantum computing task, the performance of a certain qubit in the quantum chip is abnormal, and it is impossible to acquire which specific parameter is drifted in time. In the prior art, generally, a worker judges according to the output signal of the qubit according to past experience, and the scheme has low efficiency, thereby greatly affecting the execution efficiency of quantum computing tasks.
Therefore, it is becoming an urgent problem in the art to provide a solution capable of realizing automatic calibration of qubit parameters.
It is noted that the information disclosed in this background section is only for enhancement of understanding of the general background of the application and should not be taken as an acknowledgement or any form of suggestion that this information constitutes prior art already known to a person skilled in the art.
Disclosure of Invention
The invention aims to provide a quantum bit calibration method and device, a quantum control system and a quantum computer, which are used for solving the problem of low efficiency of the existing quantum bit calibration scheme.
In order to solve the above technical problem, the present invention provides a method for calibrating quantum bits, comprising:
obtaining stable running time of a quantum bit to be tested, wherein the stable running time is the longest time that the quantum bit to be tested does not generate errors in a working state;
and performing calibration operation on the qubit to be tested based on the stable running time.
Optionally, the obtaining the stable running time of the qubit to be tested includes:
applying a driving signal to the qubit to be detected in a first time to enable the qubit to be in a running working state, and acquiring an error rate of the qubit to be detected in the first time, wherein the error rate is determined based on the quantum computing task times of the qubit to be detected and the error occurrence times;
judging whether the error rate exceeds a preset threshold value or not;
and adjusting the first time based on a judgment result, and returning to execute the application of a driving signal to the qubit to be tested in the first time so as to enable the qubit to be in a running working state, and obtaining the error rate of the qubit to be tested in the first time until the maximum value of the first time is obtained, wherein the stable running time is the maximum value of the first time.
Optionally, the adjusting the first time based on the determination result, and returning to the executing step of applying a driving signal to the qubit to be tested within the first time so as to enable the qubit to be in a running working state, acquiring an error rate of the qubit to be tested within the first time until a maximum value of the first time is acquired, where the stable running time is the maximum value of the first time, includes:
if the error rate is greater than the preset threshold, reducing the first time, and returning to execute the application of the driving signal to the to-be-detected qubit in the first time so as to enable the qubit to be in a running working state, and acquiring the error rate of the to-be-detected qubit in the first time until the error rate is equal to the preset threshold;
if the error rate is smaller than the preset threshold, increasing the first time, and returning to execute the application of the driving signal to the to-be-detected qubit within the first time so as to enable the qubit to be in a running working state, and obtaining the error rate of the to-be-detected qubit within the first time until the error rate is equal to the preset threshold;
and outputting the current first time as the stable running time.
Optionally, the qubit calibration method further comprises:
acquiring a first probability of error occurrence of each qubit parameter of the qubit to be detected;
and performing the calibration operation on the qubit to be tested based on the first probability.
Optionally, the performing the calibration operation on the qubit to be tested based on the first probability includes:
obtaining a first directed acyclic graph, wherein the first directed acyclic graph is used for representing a plurality of quantum bit parameters of a quantum bit to be detected and a dependency relationship among the plurality of quantum bit parameters;
performing the calibration operation on the qubit to be tested based on the first directed acyclic graph and the first probability.
Optionally, the performing the calibration operation on the qubit to be tested based on the first directed acyclic graph and the first probability includes:
and acquiring a quantum bit parameter corresponding to the maximum value of the first probability as a first parameter, and starting traversal calibration from a node corresponding to the first parameter in the first directed acyclic graph forwards or backwards.
Optionally, the qubit calibration method further comprises:
judging whether the quantum bit to be tested meets the execution requirement of the current quantum computing task to be executed or not based on the stable running time;
if the stable running time meets the execution requirement of the quantum computing task to be executed, distributing the quantum computing task to be executed to the quantum bit to be tested for execution;
and if the stable running time does not meet the execution requirement of the quantum computing task to be executed, not distributing the quantum computing task to be executed to the quantum bit to be tested.
Optionally, the performing, based on the stable running time, a calibration operation on the qubit to be tested includes:
and executing the calibration operation on the qubit to be tested at intervals of the stable running time from the initial moment when the qubit to be tested starts to work.
Based on the same inventive concept, the invention also provides a quantum bit calibration device, comprising:
the steady operation time acquisition module is configured to acquire a steady operation time of a to-be-detected qubit, wherein the steady operation time is a longest time during which no error occurs in the to-be-detected qubit in a working state;
a qubit calibration module configured to perform a calibration operation on the qubit under test based on the stable runtime.
Based on the same inventive concept, the invention also provides a quantum control system, which utilizes the quantum bit calibration method described in any one of the above characteristic descriptions to perform calibration operation on the quantum bit, or comprises the quantum bit calibration device.
Based on the same inventive concept, the invention also provides a quantum computer which comprises the quantum control system.
Based on the same inventive concept, the present invention further proposes a readable storage medium, on which a computer program is stored, which, when being executed by a processor, is capable of implementing the qubit calibration method according to any of the above-mentioned features.
Compared with the prior art, the invention has the following beneficial effects:
the quantum bit calibration method provided by the invention comprises the steps of obtaining the stable running time of a quantum bit to be tested, wherein the stable running time is the longest time that the quantum bit to be tested does not generate errors in a working state; and performing calibration operation on the qubit to be tested based on the stable running time. By utilizing the quantum bit calibration scheme provided by the application, the automatic calibration of the quantum bit can be realized, the manual intervention is not needed, the calibration operation is automatically carried out on the quantum bit to be tested after the stable running time of the quantum bit to be tested is reached, and the calibration efficiency and accuracy are effectively improved.
Drawings
Fig. 1 is a schematic flowchart of a method for calibrating quantum bits according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a qubit calibration device according to another embodiment of the present invention;
Detailed Description
The following describes in more detail embodiments of the present invention with reference to the schematic drawings. Advantages and features of the present invention will become apparent from the following description and claims. It is to be noted that the drawings are in a very simplified form and are not to precise scale, which is merely for the purpose of facilitating and distinctly claiming the embodiments of the present invention.
In the description of the present invention, it should be understood that the terms "center", "upper", "lower", "left", "right", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, should not be construed as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
Referring to fig. 1, an embodiment of the invention provides a method for quantum bit alignment, including:
s100: obtaining stable running time of a quantum bit to be tested, wherein the stable running time is the longest time that the quantum bit to be tested does not generate errors in a working state;
s200: and performing calibration operation on the quantum bit to be tested based on the stable running time.
The difference from the prior art is that the qubit calibration method provided by the embodiment of the invention obtains the stable running time of the qubit to be measured, wherein the stable running time is the longest time for which no error occurs when the qubit to be measured is in a working state; and performing calibration operation on the qubit to be tested based on the stable running time. By utilizing the quantum bit calibration scheme provided by the application, the automatic calibration of the quantum bit can be realized, no human intervention is needed, the calibration operation is automatically carried out on the quantum bit to be tested after the stable running time of the quantum bit to be tested is reached, and the calibration efficiency and accuracy are effectively improved.
Specifically, in this embodiment, the calibrating operation is performed on the qubit to be tested based on the stable running time, that is, the step S200 includes:
and executing the calibration operation on the qubit to be tested at intervals of the stable running time from the initial moment when the qubit to be tested starts to work.
As can be understood by those skilled in the art, in general, a quantum chip needs to go through a plurality of preliminary testing stages from development to online use, and cannot be used online until the performance parameters of the quantum chip meet the online requirements. In the early testing stage, all the qubits in the quantum chip can be tested and calibrated in detail according to a set of testing procedures, and the stable running time of the qubits to be tested can be obtained in the testing stage of the quantum chip. Specifically, the obtaining the stable running time of the qubit to be tested may include:
s101: applying a driving signal to the qubit to be tested in a first time to enable the qubit to be in a running working state, and acquiring an error rate of the qubit to be tested in the first time, wherein the error rate is determined based on the quantum computing task times executed by the qubit to be tested and the error times;
s102: judging whether the error rate exceeds a preset threshold value or not;
s103: and adjusting the first time based on a judgment result, and returning to execute the application of a driving signal to the qubit to be tested in the first time so as to enable the qubit to be in a running working state, and obtaining the error rate of the qubit to be tested in the first time until the maximum value of the first time is obtained, wherein the stable running time is the maximum value of the first time.
In this embodiment, the adjusting the first time based on the determination result, and returning to execute the applying of the driving signal to the qubit to be detected in the first time to make the qubit in the running working state, and obtaining the error rate of the qubit to be detected in the first time until obtaining the maximum value of the first time, where the stable running time is the maximum value of the first time, that is, the step S103 specifically includes:
if the error rate is greater than the preset threshold, reducing the first time, and returning to execute the application of the driving signal to the to-be-detected qubit in the first time so as to enable the qubit to be in a running working state, and acquiring the error rate of the to-be-detected qubit in the first time until the error rate is equal to the preset threshold;
if the error rate is smaller than the preset threshold, increasing the first time, and returning to execute the application of the driving signal to the to-be-detected qubit within the first time so as to enable the qubit to be in a running working state, and obtaining the error rate of the to-be-detected qubit within the first time until the error rate is equal to the preset threshold;
and outputting the current first time as the stable running time.
It will be understood by those skilled in the art that the increase and decrease of the first time may be adjusted according to a set time threshold, for example, each increase for 1 minute or each decrease for 1 minute, or the magnitude of the increase or decrease may be adjusted in real time according to the magnitude of the current first time, which is not limited herein and may be adjusted according to specific practice. In addition, the preset threshold in this embodiment refers to only a specific value, and may also be a range of values, and may be specifically selected and adjusted according to actual needs, which is not limited herein.
When the qubit to be measured is in a working state, automatically performing calibration operation on the qubit to be measured at intervals of the stable running time, and performing the calibration operation by using a first probability that each qubit parameter of the qubit to be measured is wrong, specifically, the qubit calibration method further includes:
acquiring a first probability of error occurrence of each qubit parameter of the qubit to be detected;
and performing the calibration operation on the qubit to be tested based on the first probability.
It can be understood by those skilled in the art that the first probability of the errors occurring in each qubit parameter of the qubit to be tested can be obtained through a large amount of test data in the preliminary test process of the quantum chip, and the first probability can be obtained by counting the ratio of the number of times of the errors occurring in each qubit parameter of the qubit to be tested to the total number of times of the test in the test process.
Specifically, in this embodiment, the performing the calibration operation on the qubit to be tested based on the first probability includes:
obtaining a first directed acyclic graph, wherein the first directed acyclic graph is used for representing a plurality of quantum bit parameters of a quantum bit to be tested and a dependency relationship among the plurality of quantum bit parameters;
performing the calibration operation on the qubit to be tested based on the first directed acyclic graph and the first probability.
Specifically, the performing the calibration operation on the qubit to be tested based on the first directed acyclic graph and the first probability includes:
and acquiring a quantum bit parameter corresponding to the maximum value of the first probability as a first parameter, and starting traversal calibration from a node corresponding to the first parameter in the first directed acyclic graph forwards or backwards.
Because the requirements of each quantum computing task for the qubits are different, when a specific quantum computing task is executed, whether to allocate the current quantum computing task to the qubits to be tested may be determined according to the stable running time of the qubits to be tested, and specifically, the qubit calibration method further includes:
judging whether the quantum bit to be tested meets the execution requirement of the current quantum computing task to be executed or not based on the stable running time;
if the stable running time meets the execution requirement of the quantum computing task to be executed, distributing the quantum computing task to be executed to the quantum bit to be tested for execution;
and if the stable running time does not meet the execution requirement of the quantum computing task to be executed, not distributing the quantum computing task to be executed to the quantum bit to be tested.
Based on the same inventive concept, an embodiment of the present invention further provides a qubit calibration device, and referring to fig. 2, the qubit calibration device includes:
a stable running time obtaining module 10 configured to obtain a stable running time of a qubit to be tested, wherein the stable running time is a longest time for which no error occurs in the qubit to be tested in a working state;
a qubit calibration module 20 configured to perform a calibration operation on the qubit under test based on the stable runtime.
It is understood that the stable runtime acquisition module 10 and the qubit calibration module 20 may be combined in one device to be implemented, or any one of them may be split into a plurality of sub-modules, or at least part of the functions of one or more of the stable runtime acquisition module 10 and the qubit calibration module 20 may be combined with at least part of the functions of the other modules and implemented in one functional module. According to an embodiment of the present invention, at least one of the stable runtime acquisition module 10 and the qubit calibration module 20 may be implemented at least in part as a hardware circuit, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system on a chip, a system on a substrate, a system on a package, an Application Specific Integrated Circuit (ASIC), or may be implemented in hardware or firmware in any other reasonable manner of integrating or packaging a circuit, or in a suitable combination of three implementations, software, hardware, and firmware. Alternatively, at least one of the stable runtime acquisition module 10 and the qubit calibration module 20 may be implemented at least partly as a computer program module, which when executed by a computer may perform the functions of the respective module.
Based on the same inventive concept, an embodiment of the present invention further provides a quantum control system, which performs a calibration operation on a qubit by using the qubit calibration method described in any of the above feature descriptions, or includes the qubit calibration device described in the above feature description.
Based on the same inventive concept, the embodiment of the invention also provides a quantum computer, which comprises the quantum control system described in the characteristic description.
Based on the same inventive concept, an embodiment of the present invention further provides a readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, can implement the qubit calibration method described in any of the above features.
The readable storage medium may be a tangible device that can hold and store instructions for use by an instruction execution device, such as, but not limited to, an electronic memory device, a magnetic memory device, an optical memory device, an electromagnetic memory device, a semiconductor memory device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the readable storage medium include: a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a Static Random Access Memory (SRAM), a portable compact disc read-only memory (CD-ROM), a Digital Versatile Disc (DVD), a memory stick, a floppy disk, a mechanical coding device, such as a punch card or an in-groove protruding structure with instructions stored thereon, and any suitable combination of the foregoing. The computer program described herein may be downloaded from a readable storage medium to a respective computing/processing device, or to an external computer or external storage device over a network, such as the internet, a local area network, a wide area network, and/or a wireless network. The network may include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers and/or edge servers. The network adapter card or network interface in each computing/processing device receives the computer program from the network and forwards the computer program for storage in a readable storage medium in the respective computing/processing device. Computer programs for carrying out operations of the present invention may be assembly instructions, instruction Set Architecture (ISA) instructions, machine related instructions, microcode, firmware instructions, state setting data, or source code or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The computer program may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, aspects of the invention are implemented by personalizing a custom electronic circuit, such as a programmable logic circuit, a Field Programmable Gate Array (FPGA), or a Programmable Logic Array (PLA), with state information of a computer program, the electronic circuit being operable to execute computer-readable program instructions.
Aspects of the present invention are described herein with reference to flowchart illustrations and/or block diagrams of methods, systems and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer programs. These computer programs may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the programs, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions/acts specified in the flowchart and/or block diagram block or blocks. Such a computer program may also be stored in a readable storage medium that can direct a computer, programmable data processing apparatus, and/or other devices to function in a particular manner, such that the readable storage medium storing the computer program comprises an article of manufacture including instructions which implement the function/act specified in the flowchart and/or block diagram block or blocks.
The computer program may also be loaded onto a computer, other programmable data processing apparatus, or other devices to cause a series of operational steps to be performed on the computer, other programmable apparatus or other devices to produce a computer implemented process such that the computer program which executes on the computer, other programmable apparatus or other devices implements the functions/acts specified in the flowchart and/or block diagram block or blocks.
In the description herein, references to the description of "one embodiment," "some embodiments," "an example" or "a specific example" or the like are intended to mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. And the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments. Furthermore, various embodiments or examples described in this specification can be combined and combined by those skilled in the art.
The above description is only a preferred embodiment of the present invention, and does not limit the present invention in any way. Any person skilled in the art can make any equivalent substitutions or modifications on the technical solutions and technical contents disclosed in the present invention without departing from the scope of the technical solutions of the present invention, and still fall within the protection scope of the present invention without departing from the technical solutions of the present invention.
Claims (12)
1. A method of quantum bit alignment, comprising:
obtaining stable running time of a quantum bit to be tested, wherein the stable running time is the longest time that the quantum bit to be tested does not generate errors in a working state;
and performing calibration operation on the quantum bit to be tested based on the stable running time.
2. The qubit calibration method of claim 1, wherein said obtaining a stable running time of the qubit under test comprises:
applying a driving signal to the qubit to be detected in a first time to enable the qubit to be in a running working state, and acquiring an error rate of the qubit to be detected in the first time, wherein the error rate is determined based on the quantum computing task times of the qubit to be detected and the error occurrence times;
judging whether the error rate exceeds a preset threshold value or not;
and adjusting the first time based on a judgment result, and returning to execute the application of a driving signal to the qubit to be tested in the first time so as to enable the qubit to be in a running working state, and obtaining the error rate of the qubit to be tested in the first time until the maximum value of the first time is obtained, wherein the stable running time is the maximum value of the first time.
3. The qubit calibration method of claim 2, wherein the adjusting the first time based on the determination result and returning to the performing the applying the driving signal to the qubit to be tested in the first time to make the qubit in the running operation state, obtaining an error rate of the qubit to be tested in the first time until obtaining a maximum value of the first time, and the stable running time being the maximum value of the first time comprises:
if the error rate is greater than the preset threshold, reducing the first time, and returning to execute the application of the driving signal to the to-be-detected qubit in the first time so as to enable the qubit to be in a running working state, and acquiring the error rate of the to-be-detected qubit in the first time until the error rate is equal to the preset threshold;
if the error rate is smaller than the preset threshold, increasing the first time, and returning to execute the application of the driving signal to the qubit to be tested in the first time so as to enable the qubit to be in the running working state, and obtaining the error rate of the qubit to be tested in the first time until the error rate is equal to the preset threshold;
outputting the current first time as the stable running time.
4. The qubit calibration method of claim 1, further comprising:
acquiring a first probability of error occurrence of each qubit parameter of the qubit to be detected;
and performing the calibration operation on the qubit to be tested based on the first probability.
5. The qubit calibration method of claim 4, wherein said performing the calibration operation on the qubit under test based on the first probability comprises:
obtaining a first directed acyclic graph, wherein the first directed acyclic graph is used for representing a plurality of quantum bit parameters of a quantum bit to be detected and a dependency relationship among the plurality of quantum bit parameters;
performing the calibration operation on the qubit to be tested based on the first directed acyclic graph and the first probability.
6. The method of qubit calibration of claim 5, wherein said performing the calibration operation on the qubit under test based on the first directed acyclic graph and the first probability comprises:
and acquiring a quantum bit parameter corresponding to the maximum value of the first probability as a first parameter, and starting traversal calibration from a node corresponding to the first parameter in the first directed acyclic graph forwards or backwards.
7. The qubit calibration method of claim 1, further comprising:
judging whether the quantum bit to be tested meets the execution requirement of the current quantum computing task to be executed or not based on the stable running time;
if the stable running time meets the execution requirement of the quantum computing task to be executed, distributing the quantum computing task to be executed to the quantum bit to be tested for execution;
and if the stable running time does not meet the execution requirement of the quantum computing task to be executed, not distributing the quantum computing task to be executed to the quantum bit to be tested.
8. The qubit calibration method of claim 1, wherein the performing a calibration operation on the qubit under test based on the stable runtime comprises:
and executing the calibration operation on the qubit to be tested at intervals of the stable running time from the initial moment when the qubit to be tested starts to work.
9. A quantum bit alignment apparatus, comprising:
the stable running time obtaining module is configured to obtain a stable running time of the qubit to be tested, wherein the stable running time is the longest time for which no error occurs when the qubit to be tested is in a working state;
a qubit calibration module configured to perform a calibration operation on the qubit under test based on the stable runtime.
10. A quantum control system, wherein a qubit is subjected to a calibration operation using the qubit calibration method of any one of claims 1 to 8, or comprising the qubit calibration device of claim 9.
11. A quantum computer comprising the quantum control system of claim 10.
12. A readable storage medium on which a computer program is stored, the computer program being adapted to perform the method of qubit calibration of any of claims 1 to 8 when executed by a processor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210309493.1A CN115470922B (en) | 2022-03-28 | 2022-03-28 | Quantum bit calibration method and device, quantum control system and quantum computer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210309493.1A CN115470922B (en) | 2022-03-28 | 2022-03-28 | Quantum bit calibration method and device, quantum control system and quantum computer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115470922A true CN115470922A (en) | 2022-12-13 |
| CN115470922B CN115470922B (en) | 2024-04-05 |
Family
ID=84363357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210309493.1A Active CN115470922B (en) | 2022-03-28 | 2022-03-28 | Quantum bit calibration method and device, quantum control system and quantum computer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115470922B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170357561A1 (en) * | 2016-06-09 | 2017-12-14 | Google Inc. | Automatic qubit calibration |
| US20180330265A1 (en) * | 2015-11-06 | 2018-11-15 | Julian Shaw Kelly | In-situ quantum error correction |
| US20200311220A1 (en) * | 2019-03-29 | 2020-10-01 | International Business Machines Corporation | Adaptive error correction in quantum computing |
| CN113011594A (en) * | 2021-03-26 | 2021-06-22 | 合肥本源量子计算科技有限责任公司 | Quantum bit calibration method and device and quantum computer |
| CN113240122A (en) * | 2021-04-09 | 2021-08-10 | 合肥本源量子计算科技有限责任公司 | Quantum computer operating system and quantum computer |
-
2022
- 2022-03-28 CN CN202210309493.1A patent/CN115470922B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20180330265A1 (en) * | 2015-11-06 | 2018-11-15 | Julian Shaw Kelly | In-situ quantum error correction |
| US20170357561A1 (en) * | 2016-06-09 | 2017-12-14 | Google Inc. | Automatic qubit calibration |
| US20200311220A1 (en) * | 2019-03-29 | 2020-10-01 | International Business Machines Corporation | Adaptive error correction in quantum computing |
| CN113011594A (en) * | 2021-03-26 | 2021-06-22 | 合肥本源量子计算科技有限责任公司 | Quantum bit calibration method and device and quantum computer |
| CN113240122A (en) * | 2021-04-09 | 2021-08-10 | 合肥本源量子计算科技有限责任公司 | Quantum computer operating system and quantum computer |
Non-Patent Citations (1)
| Title |
|---|
| 吕蕾;刘尉悦;梁福田;: "超导量子计算任意波形发生器输出一致性校准的设计与实现", 无线通信技术, no. 02, 15 June 2020 (2020-06-15) * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115470922B (en) | 2024-04-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10489280B2 (en) | Method and apparatus for test modeling | |
| US10866804B2 (en) | Recommendations based on the impact of code changes | |
| CN113011594B (en) | Quantum bit calibration method and device and quantum computer | |
| US20150025872A1 (en) | System, method, and apparatus for modeling project reliability | |
| CN115470921B (en) | Quantum bit calibration method and device and quantum computer | |
| JP2019512126A (en) | Method and system for training a machine learning system | |
| US8930743B2 (en) | Preventing cascade failures in computer systems | |
| CN106301868A (en) | The method and apparatus determining the importance of network node | |
| CN114911788B (en) | Data interpolation method and device and storage medium | |
| Bharathi et al. | A machine learning approach for quantifying the design error propagation in safety critical software system | |
| US20140278309A1 (en) | Selective importance sampling | |
| CN115470922A (en) | Quantum bit calibration method and device, quantum control system and quantum computer | |
| CN110928941B (en) | Data fragment extraction method and device | |
| US20230385495A1 (en) | Efficient circuit simulation method and apparatus, device, and storage medium | |
| JP6835702B2 (en) | Anomaly estimation device, anomaly estimation method and program | |
| CN115293353A (en) | Quantum computer, running method thereof and readable storage medium | |
| CN115470920A (en) | Quantum bit calibration method and device and quantum computer | |
| CN114509791A (en) | Satellite positioning error analysis method and device capable of reducing storage | |
| Popli et al. | A sprint point based tool for agile estimation | |
| CN112363944A (en) | Method and equipment for comparing return values of multiple environment interfaces | |
| CN115902393B (en) | AC modulation spectrum acquisition method and device and quantum computer | |
| CN112396398A (en) | Cooperative office document processing method and device | |
| CN113282482A (en) | Compatibility test method and system for software package | |
| Agarwal | Markovian software reliability model for two types of failures with imperfect debugging rate and generation of errors | |
| US7536427B2 (en) | Comparing process sizes |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 230088 6th floor, E2 building, phase II, innovation industrial park, 2800 innovation Avenue, Hefei high tech Zone, Hefei City, Anhui Province Applicant after: Benyuan Quantum Computing Technology (Hefei) Co.,Ltd. Address before: 230088 6th floor, E2 building, phase II, innovation industrial park, 2800 innovation Avenue, Hefei high tech Zone, Hefei City, Anhui Province Applicant before: ORIGIN QUANTUM COMPUTING COMPANY, LIMITED, HEFEI |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |