CN115343592A - Method, apparatus, device, medium, and program product for diagnosing service life of switching tube - Google Patents
Method, apparatus, device, medium, and program product for diagnosing service life of switching tube Download PDFInfo
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Abstract
The application relates to a method, a device, equipment, a medium and a program product for diagnosing service life of a switch tube, wherein the method comprises the following steps: acquiring initial driving threshold voltage of a target switching tube; determining the failure driving threshold voltage of the target switching tube according to the initial driving threshold voltage; and applying the failure driving threshold voltage to the target switch tube, and determining whether the target switch tube is in a state to be failed according to whether the conduction state of the target switch tube meets a preset condition. By adopting the method, the service life of the switching tube can be diagnosed in real time during the working of the switching tube, the interference of a complex environment on the service life of the switching tube is avoided, and the service life diagnosis accuracy of the switching tube is further improved.
Description
Technical Field
The present application relates to the field of semiconductor technologies, and in particular, to a method, an apparatus, a device, a medium, and a program product for diagnosing a lifetime of a switching tube.
Background
A Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) is a core device of an electronic switch, and is widely applied to power electronic equipment, and because the MOSFET has a long working time, a complex working environment, and is very easy to age and damage, and a failed MOSFET causes an accident and causes high maintenance cost, it is very important to predict the lifetime of the MOSFET.
At present, a conventional method for predicting the service life of an MOSFET provides a certain stress environment for an MOSFET sample, detects the change rule of parameters such as threshold voltage, saturated drain voltage and the like of the MOSFET sample to obtain a corresponding service life prediction model, and predicts the service life of the MOSFET through the prediction model.
However, the actual working environment of the MOSFET is complex and variable, and the life prediction model cannot completely and accurately restore the actual working environment of the MOSFET, so that the accuracy of predicting the life of the MOSFET by the life prediction model is low.
Disclosure of Invention
In view of the above, it is desirable to provide a method, an apparatus, a device, a medium, and a program product for diagnosing the lifetime of a switching tube, which are applicable to accurately measure the lifetime of the switching tube in different environments.
In a first aspect, the present application provides a method for diagnosing a lifetime of a switching tube, the method including:
acquiring initial driving threshold voltage of a target switching tube; determining the failure driving threshold voltage of the target switching tube according to the initial driving threshold voltage; and applying failure driving threshold voltage to the target switch tube, and determining whether the target switch tube is in a state to be failed according to whether the conduction state of the target switch tube meets a preset condition.
In one embodiment, obtaining the initial driving threshold voltage of the target switch tube includes: acquiring the maximum design driving threshold voltage and the minimum design driving threshold voltage of a target switching tube; gradually adjusting the driving threshold voltage output to the target switch tube within a voltage range between the maximum design driving threshold voltage and the minimum design driving threshold voltage until the conduction state of the target switch tube meets a preset condition; and taking the driving threshold voltage output to the target switch tube when the conduction state meets the preset condition as the initial driving threshold voltage.
In one embodiment, the method further comprises: the preset condition is determined according to whether the current value passing through the target switch tube is larger than a current threshold value, and the current threshold value is determined according to circuit elements in a circuit where the target switch tube is located.
In one embodiment, the circuit where the target switching tube is located includes an inductor connected in series with the target switching tube, and the current threshold is calculated according to a voltage applied to the inductor, a pulse width of a driving threshold voltage applied to the target switching tube, and an inductance value of the inductor.
In one embodiment, the method further comprises: if the conduction state of the target switch tube is that the current value passing through the target switch tube is larger than or equal to the current threshold value, determining that the conduction state of the target switch tube meets the preset condition; and if the conduction state of the target switch tube is that the current value passing through the target switch tube is smaller than the current threshold value, determining that the conduction state of the target switch tube does not accord with the preset condition.
In one embodiment, the method further comprises: and after determining that the target switching tube is in the state of about to fail, outputting an early warning signal.
In one embodiment, determining the failure driving threshold voltage of the target switching tube according to the initial driving threshold voltage comprises: acquiring sensitivity; and determining the failure driving threshold voltage of the target switching tube according to the initial driving threshold voltage and the sensitivity.
In one embodiment, applying a failure driving threshold voltage to the target switch tube comprises: and before the target switch tube is driven to be conducted every time, the step of applying the failure driving threshold voltage to the target switch tube is executed.
In a second aspect, the present application further provides a switch tube life diagnosis device, including:
the device comprises a control unit, a driving unit, a target switching tube and a detection unit, wherein the driving unit is connected with a grid electrode of the target switching tube, and the control unit is respectively connected with the driving unit and the detection unit; the control unit is used for controlling the driving unit to apply failure driving threshold voltage to the target switch tube, wherein the failure driving threshold voltage is determined according to the initial driving threshold voltage of the target switch tube; the control unit is also used for controlling the detection unit to detect the conduction state of the target switch tube and determining whether the target switch tube is in a state to be failed according to whether the conduction state of the target switch tube meets a preset condition.
In one embodiment, the control unit is further configured to control the driving unit to gradually adjust the driving threshold voltage output to the target switching tube within a voltage range between a maximum design driving threshold voltage and a minimum design driving threshold voltage of the target switching tube; the control unit is also used for controlling the detection unit to detect the conduction state of the target switching tube in the process that the driving unit gradually adjusts the driving threshold voltage output to the target switching tube; and the control unit is also used for controlling the driving unit to stop outputting the driving threshold voltage to the target switch tube when the conduction state of the target switch tube meets the preset condition, and taking the driving threshold voltage output to the target switch tube by the driving unit when the conduction state meets the preset condition as the initial driving threshold voltage.
In one embodiment, the detection unit is used for detecting the current value passing through the target switch tube; and the control unit is used for determining a preset condition according to whether the current value is greater than a current threshold value, wherein the current threshold value is determined according to a circuit element in a circuit where the target switching tube is located.
In one embodiment, the apparatus further includes an inductor and a power supply, the inductor and the first pole of the target switch tube are sequentially connected in series, and the current threshold is calculated according to a voltage applied to the inductor by the power supply, a pulse width of a driving threshold voltage applied to the target switch tube, and an inductance value of the inductor.
In one embodiment, the device further comprises a resistor, the second pole of the target switch tube is connected in series with the resistor and then grounded, and the detection unit is used for detecting the current value passing through the resistor, wherein the current value passing through the resistor is consistent with the current value passing through the target switch tube.
In one embodiment, the device further comprises an alarm unit, the alarm unit is connected with the control unit, and the control unit is further used for controlling the alarm unit to output an early warning signal after the target switch tube is determined to be in the state of about to fail.
In one embodiment, the control unit controls the driving unit to apply the failure driving threshold voltage to the target switch tube before the driving unit drives the target switch tube to conduct every time.
In a third aspect, the present application further provides a computer device, which includes a memory and a processor, where the memory stores a computer program, and the processor implements the steps of the method described in any one of the above first aspects when executing the computer program.
In a fourth aspect, the present application further provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the method of any one of the above first aspects.
In a fifth aspect, the present application also provides a computer program product comprising a computer program which, when executed by a processor, performs the steps of the method of any one of the above first aspects.
According to the method, the device, the equipment, the medium and the program product for diagnosing the service life of the switching tube, the initial driving threshold voltage of the target switching tube is obtained firstly, the failure driving threshold voltage of the target switching tube is determined according to the initial driving threshold voltage, and then the failure driving threshold voltage is applied to the target switching tube, so that whether the target switching tube is in a state to be failed or not can be judged according to whether the conduction state of the target switching tube meets the preset condition or not. The service life of the switch tube can be diagnosed in real time in the working process of the switch tube, the interference of a complex environment on the service life of the switch tube is avoided, and the service life diagnosis accuracy of the switch tube is improved.
Drawings
FIG. 1 is a schematic diagram of a process for diagnosing the lifetime of a switch tube according to an embodiment;
FIG. 2 is a flow diagram illustrating an exemplary process for obtaining an initial driving threshold voltage;
FIG. 3 is a block diagram of a switch tube life diagnosis apparatus according to an embodiment;
FIG. 4 is a block diagram of a switch tube life diagnosis apparatus in another embodiment;
FIG. 5 is a block diagram of a switch tube life diagnosis apparatus in another embodiment;
FIG. 6 is a block diagram of a switch tube life diagnosis apparatus in yet another embodiment;
FIG. 7 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of and not restrictive on the broad application.
The MOSFET is used in a control circuit, and is widely applied to high-frequency and high-voltage power systems because of its advantages of high voltage resistance, high operating frequency, high temperature resistance, low on-state resistance, low switching loss, and the like. With the continuous development of power electronic technology, more and more fields such as space flight, aviation, oil exploration, nuclear power, communication etc. the urgent need can be at the electronic device of extreme environment work such as high temperature, high frequency. The aging of electronic devices can be accelerated when the electronic devices work under the extreme environment of high temperature, high frequency and the like, so that in order to avoid the aging failure of the MOSFETs from influencing the normal operation of the whole device or system, the MOSFETs need to be subjected to state monitoring, the service lives of the MOSFETs are predicted according to the monitored relevant parameters, and relevant maintenance measures such as replacement of the MOSFETs are taken.
In one embodiment, as shown in fig. 1, a method for diagnosing the lifetime of a switching tube is provided, and this embodiment is described by taking as an example that the method is applied to an electronic device provided with a switching tube, for example, a MOSFET, and the electronic device may be, for example, an elevator control device installed in an elevator. In the embodiment of the application, the method comprises the following steps:
Specifically, the target switch tube is a switch tube for diagnosing the service life of the target switch tube, and the switch tube can be an N-type MOSFET and also can be a P-type MOSFET. The pins of the MOSFET have three: the MOSFET is conducted when the voltage applied to the grid of the MOSFET is larger than the threshold voltage of the MOSFET, and the current flows from the drain to the source if the MOSFET is of an N type, and flows from the source to the drain if the MOSFET is of a P type. The threshold voltage of the target switch tube will decrease with the duration of the operation, and the initial driving threshold voltage is the threshold voltage of the target switch tube before being used for the operation.
Optionally, when the target switching tube is used for operation for the first time, the voltage applied to the gate of the target switching tube is adjusted, and then whether the target switching tube is turned on is detected, so that the minimum voltage capable of turning on the target switching tube is the initial driving threshold voltage of the target switching tube. For example, in an elevator system, when a target switch tube is used for the first time, a voltage applied to a gate of the target switch tube is increased by 0.01 each time from 0, and then whether a current passes through the target switch tube is detected, and when the applied voltage is 2.11V, the current passes through the target switch tube is detected, and then an initial driving threshold voltage of the target switch tube is 2.11V.
For a new target switch tube, although the initial driving threshold voltage of the target switch tube can be obtained through query of a data manual, the query obtains a range value, and the initial driving threshold voltage of the target switch tube is not accurate. For the old target switch tube, in the new operation, the accurate initial driving threshold voltage of the old target switch tube in the new operation can be obtained through the mode. Therefore, the accurate value of the initial driving threshold voltage of the target switch tube can be obtained through the method, so that the accuracy of the failure driving threshold voltage determined through the initial driving threshold voltage is ensured, and the accuracy of the service life diagnosis of the switch tube is improved.
And 102, determining the failure driving threshold voltage of the target switching tube according to the initial driving threshold voltage.
Specifically, the threshold voltage of the target switching tube decreases with the increase of the operating time, when the threshold voltage of the target switching tube decreases to a certain value, the target switching tube is considered to be failed, and the failure driving threshold voltage is the threshold voltage of the target switching tube representing the failure of the target switching tube.
Optionally, according to the specification of the electrical characteristics of the MOSFET in international electrotechnical commission standard IEC62373-2006, if the threshold voltage of the MOSFET exceeds ± 10% of the initial value, the MOSFET is determined to be failed, and therefore, the failure driving threshold voltage of the target switching tube may be 0.9 times the initial driving threshold voltage at minimum. For example, if the initial driving threshold voltage of the target switch tube is 3V and the target switch tube is required to be replaced when the threshold voltage of the target switch tube is reduced to 8% of the initial value during the operation of the elevator system, the failure driving threshold voltage of the target switch tube is 3 × (1-8%) V =2.76V.
Specifically, the conduction state of the target switch tube can be represented by a current value passing through the target switch tube, and when the failure driving threshold voltage applied to the target switch tube is greater than or equal to the threshold voltage of the target switch tube, the target switch tube is conducted with the current passing through. The preset condition is a standard for judging whether the target switch tube is about to fail, and can be set according to requirements.
Optionally, before or after each operation of the target switching tube, applying a failure driving threshold voltage to the gate of the target switching tube, then detecting a current value of the target switching tube, and if the detected current value meets a preset condition, indicating that the target switching tube is in a state of about to fail; if the detected current does not meet the preset condition, the target switching tube can be continuously put into normal operation. It should be noted that the failure driving threshold voltage applied to the gate of the target switch tube is a fixed pulse width t 0 The voltage of (c).
Before or after each operation of the target switching tube, the purpose of diagnosing the service life of the target switching tube in real time is realized by applying a failure driving threshold voltage to the target switching tube to judge whether the target switching tube fails, and the method is not only free from the influence of the environment, but also free from interfering the normal operation of a system where the target switching tube is located.
To sum up, when the target switching tube is in primary operation, the voltage applied to the gate of the target switching tube is adjusted to enable the minimum voltage at which the current of the target switching tube passes to be the initial driving threshold voltage of the target switching tube, then the failure driving threshold voltage of the target switching tube is obtained according to the standard requirements on the threshold voltage of the target switching tube in different operations and the initial driving threshold voltage of the target switching tube, and then the failure driving threshold voltage is applied to the gate of the target switching tube before or after each operation of the target switching tube, so that whether the target switching tube is in a state about to fail is judged according to whether the detected conduction state of the target switching tube meets the preset condition. The method and the device can realize real-time diagnosis of the service life of the switching tube in the working process of the switching tube, avoid the interference of a complex environment on the service life measurement of the switching tube, and further improve the service life diagnosis accuracy of the switching tube.
In one embodiment, as shown in fig. 2, a schematic flow chart for obtaining an initial driving threshold voltage provided by an embodiment of the present application is shown. The step of obtaining the initial driving threshold voltage of the target switching tube comprises the following steps:
Specifically, a numerical range of the driving threshold voltage of the target switching tube can be obtained by inquiring from a data manual according to the model of the target switching tube, a maximum value in the numerical range is used as a maximum design driving threshold voltage of the target switching tube, and a minimum value in the numerical range is used as a minimum design driving threshold voltage of the target switching tube. For example, if the target switch tube of model number VBZM7N60 has a data section of [2.1v,2.5v ] in which its design drive threshold voltage is found from a data manual, the maximum design drive threshold voltage is 2.5V and the minimum design drive threshold voltage is 2.1V.
And step 203, taking the driving threshold voltage output to the target switch tube when the conducting state is consistent with the preset condition as the initial driving threshold voltage.
Specifically, the driving threshold voltage is a voltage applied to the gate of the target switching tube, and the value of the driving threshold voltage is within the range of the maximum design driving threshold voltage and the minimum design driving threshold voltage of the target switching tube. The driving threshold voltage output to the target switching tube is gradually adjusted, wherein the driving threshold voltage output to the target switching tube is adjusted from small to large according to a preset algorithm based on the minimum design driving threshold voltage of the target switching tube, or the driving threshold voltage output to the target switching tube is adjusted from large to small according to a preset algorithm based on the maximum design driving threshold voltage of the target switching tube. Wherein the preset algorithm may be a driving threshold voltage V outputted to the target switch tube i Equal to the driving threshold voltage V output to the target switch tube at the previous time i-1 Sum with added value A, i.e. V i ＝V i-1 + A, the preset algorithm may also be V i ＝A×V i-1 . It should be noted that the value of the increment a and the driving threshold voltage V outputted to the target switch tube in the previous time i-1 The relation with the incremental value a can be set as required, and is not limited herein.
Optionally, when the target switching tube is initially operated, the driving threshold voltage output to the gate of the target switching tube is adjusted in a manner that the minimum design driving threshold voltage is used as the start, and the value a is increased from small to large each time.
Optionally, when the target switching tube is operated for the first time, the maximum design driving threshold voltage is used as the start, the driving threshold voltage output to the gate of the target switching tube is adjusted in a manner of decreasing the value a from large to small, and when it is detected that the conduction state of the target switching tube meets the second preset condition, the driving threshold voltage output to the target switching tube at this time is the initial driving threshold voltage of the target switching tube.
To be explainedWhether the voltage is from small to large or from large to small, the driving threshold voltage output to the target switch tube is adjusted, wherein the driving threshold voltage has a fixed pulse width t 0 The voltage of (c).
For example, if the data book indicates that the data interval for finding the design drive threshold voltage of the target switching tube with model number VBZM7N60 is [2.1v,2.5v ], the voltage applied to the gate of the target switching tube is increased by 0.01V each time from 2.1V when the target switching tube is initially operated, and then whether the current value passing through the target switching tube meets the preset condition is detected, and if the applied voltage is 2.2V, the current value passing through the target switching tube is detected to just meet the preset condition, the initial drive threshold voltage of the target switching tube is 2.2V, and the voltage application to the gate of the target switching tube is stopped.
By gradually adjusting the driving threshold voltage output to the target switch tube within the range of the maximum design driving threshold voltage of the target switch tube within the minimum design driving threshold voltage, the frequency of outputting the driving threshold voltage to the target switch tube is reduced, the initial driving threshold voltage can be quickly obtained, and a large amount of time is saved.
In one embodiment, the preset condition is determined according to whether the current value passing through the target switch tube is larger than a current threshold value, and the current threshold value is determined according to a circuit element in a circuit in which the target switch tube is located. The circuit where the target switching tube is located comprises an inductor connected with the target switching tube in series, and the current threshold is obtained through calculation according to the voltage applied to the inductor, the pulse width of the driving threshold voltage applied to the target switching tube and the inductance value of the inductor. If the conducting state of the target switching tube is that the current value passing through the target switching tube is larger than or equal to the current threshold value, determining that the conducting state of the target switching tube meets the preset condition; and if the conduction state of the target switch tube is that the current value passing through the target switch tube is smaller than the current threshold value, determining that the conduction state of the target switch tube does not accord with the preset condition.
Specifically, the calculation formula of the current threshold is I Lth ＝U i ×t 0 /L 0 In which I Lth As current threshold, U i To be applied to an inductorVoltage of, in particular, a fixed voltage of a constant power supply input in series with an inductance, t 0 Pulse width of driving threshold voltage for applying to target switch tube 0 The inductance value of the inductor connected in series with the target switch tube. Current value I through target switch tube sence The measurement can be directly obtained from the source electrode or the drain electrode of the target switch tube, or the measurement can be carried out by measuring a resistor R connected with the source electrode of the target switch tube in series 1 Voltage U of sence Obtaining a calculation formula of a current value passing through the target switch tube as I sence ＝U sence /R 1 。
Optionally, the current threshold is calculated according to parameters of a circuit element in a circuit where the target switching tube is located, the current value passing through the target switching tube is calculated according to the voltage of the resistor and the measuring resistor connected in series with the target switching tube, and the preset condition is set such that the current value passing through the target switching tube is greater than or equal to the current threshold. The target switch tube has two conduction states, the first is that the current value of the target switch tube is larger than or equal to a current threshold value, the second is that the current value of the target switch tube is smaller than the current threshold value, if the conduction state of the target switch obtained through detection is the first type, the conduction state of the target switch tube is in accordance with a preset condition, and if the conduction state of the target switch obtained through detection is the second type, the conduction state of the target switch tube is in accordance with the preset condition.
The service life of the switching tube is judged according to the threshold voltage of the switching tube, the threshold voltage of the switching tube is reduced along with the increase of the working time, when the threshold voltage is reduced to a certain value, the switching tube is considered to be invalid, but the change of the threshold voltage of the switching tube is difficult to directly measure under the condition that the normal working of a system where the switching tube is located is not influenced.
In one embodiment, after determining that the target switch tube is in the impending failure state, outputting an early warning signal.
Specifically, after determining that the target switch tube is in the state of about to fail according to step 103, an early warning signal is output to notify the user that the target switch tube is about to fail, where the purpose of outputting the early warning signal is to notify the user that the target switch tube is about to fail, and a specific notification form is not limited herein, and may be a form of sending an alarm sound, or a form of flashing an indicator light, or a form of adding a flashing indicator light to the alarm sound.
In one embodiment, determining the failure driving threshold voltage of the target switching tube according to the initial driving threshold voltage comprises: acquiring sensitivity; and determining the failure driving threshold voltage of the target switching tube according to the initial driving threshold voltage and the sensitivity.
Specifically, according to the specification of MOSFET characteristics in international electrotechnical commission standard IEC62373-2006, a MOSFET is considered to fail whenever the threshold voltage of the MOSFET varies by more than ± 10% of the initial value, and therefore, the sensitivity a is generally less than 10%. Failure driving threshold voltage V of target switch tube th ＝V th0 (1-a) wherein V th0 Is the initial drive threshold voltage. The failure driving threshold voltage of the target switch tube can also be V th ＝a×V th0 And the value a can be adjusted according to actual requirements. It should be noted that, the relationship between the initial driving threshold voltage and the failure driving threshold voltage of the sensitivity determination target switching tube may be set as needed, and is not limited herein.
The requirements of different operations on a target switch tube can be realized by adjusting the sensitivity a. If the threshold voltage of the target switch tube is required to exceed 8% of the initial value to notify the maintenance personnel of replacement in the elevator system, the sensitivity a can be set to 8%.
In one embodiment, applying a fail drive threshold voltage to a target switch tube comprises: and before the target switch tube is driven to be conducted every time, the step of applying the failure driving threshold voltage to the target switch tube is executed.
Specifically, in the operation of the elevator system, each time the target switching tube is pressed before being conducted, the failure driving threshold voltage is applied to the target switching tube to judge whether the target switching tube is in a state of about to fail, so that the purpose of diagnosing the service life of the target switching tube in real time can be achieved under the condition that the normal work of the target switching tube is not influenced.
Based on the same inventive concept, the embodiment of the application also provides a switch tube service life diagnosis device for realizing the switch tube service life diagnosis method. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the method, so that specific limitations in one or more embodiments of the switch tube life diagnosis device provided below can be referred to the limitations on the switch tube life diagnosis method in the above, and details are not repeated herein.
In one embodiment, as shown in fig. 3, a switch tube life diagnosis apparatus is provided, which includes a control unit 301, a driving unit 302, a target switch tube M, and a detection unit 303, wherein the driving unit 302 is connected to a gate of the target switch tube M, and the control unit 301 is connected to the driving unit 302 and the detection unit 303 respectively; a control unit 301, configured to control the driving unit 302 to apply a failure driving threshold voltage to the target switching tube M, where the failure driving threshold voltage is determined according to an initial driving threshold voltage of the target switching tube M; the control unit 301 is further configured to control the detection unit 303 to detect the conduction state of the target switching tube M; the control unit 301 is further configured to determine whether the target switching tube M is in a state to be disabled according to whether the conduction state of the target switching tube M meets a preset condition.
In one embodiment, the control unit 301 is further configured to control the driving unit 302 to gradually adjust the driving threshold voltage output to the target switching tube M within a voltage range between the maximum design driving threshold voltage and the minimum design driving threshold voltage of the target switching tube M; the control unit 301 is further configured to control the detection unit 303 to detect a conduction state of the target switching tube M in a process that the driving unit 302 gradually adjusts the driving threshold voltage output to the target switching tube M; the control unit 301 is further configured to control the driving unit 302 to stop outputting the driving threshold voltage to the target switching tube M when the conduction state of the target switching tube M meets the preset condition, and use the driving threshold voltage output by the driving unit 302 to the target switching tube M when the conduction state meets the preset condition as the initial driving threshold voltage.
In one embodiment, the detecting unit 303 is used for detecting the current value passing through the target switch tube M; the control unit 301 is configured to determine a preset condition according to whether the current value is greater than a current threshold, where the current threshold is determined according to a circuit element in a circuit where the target switch M is located.
In one embodiment, as shown in fig. 4, the switch tube life diagnostic apparatus further includes an inductor L and a power source U, the inductor L and the first pole of the target switch tube M are sequentially connected in series, and the current threshold is calculated according to a voltage applied to the inductor L by the power source U, a pulse width of a driving threshold voltage applied to the target switch tube M and an inductance value of the inductor L.
In one embodiment, as shown in fig. 5, the switch tube life diagnostic apparatus further includes a resistor R, the second pole of the target switch tube M is connected in series with the resistor R and then grounded, and the detecting unit 303 is configured to detect a current value passing through the resistor R, wherein the current value passing through the resistor R is identical to the current value passing through the target switch tube M.
In one embodiment, as shown in fig. 6, the switch tube life diagnosis apparatus further includes an alarm unit 304, the alarm unit 304 is connected to the control unit 301, and the control unit 301 is further configured to control the alarm unit 304 to output an early warning signal after determining that the target switch tube M is in an impending failure state. The alarm unit 304 and the detection unit 303 may be integrated.
In one embodiment, the control unit 301 controls the driving unit 302 to apply the disable driving threshold voltage to the target switching tube M before the driving unit 302 drives the target switching tube M to conduct each time.
In one embodiment, a computer device is provided, which may be a server, the internal structure of which may be as shown in fig. 7. The computer device includes a processor, a memory, and a network interface connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The database of the computer equipment is used for storing the antenna pose information measurement data. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a method of diagnosing the lifetime of a switching tube.
Those skilled in the art will appreciate that the architecture shown in fig. 7 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is further provided, which includes a memory and a processor, the memory stores a computer program, and the processor implements the steps of the above method embodiments when executing the computer program.
In an embodiment, a computer-readable storage medium is provided, on which a computer program is stored which, when being executed by a processor, carries out the steps of the above-mentioned method embodiments.
In an embodiment, a computer program product is provided, comprising a computer program which, when being executed by a processor, carries out the steps of the above-mentioned method embodiments.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, database, or other medium used in the embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include a Read-Only Memory (ROM), a magnetic tape, a floppy disk, a flash Memory, an optical Memory, a high-density embedded nonvolatile Memory, a resistive Random Access Memory (ReRAM), a Magnetic Random Access Memory (MRAM), a Ferroelectric Random Access Memory (FRAM), a Phase Change Memory (PCM), a graphene Memory, and the like. Volatile Memory can include Random Access Memory (RAM), external cache Memory, and the like. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others. The databases referred to in various embodiments provided herein may include at least one of relational and non-relational databases. The non-relational database may include, but is not limited to, a block chain based distributed database, and the like. The processors referred to in the embodiments provided herein may be general purpose processors, central processing units, graphics processors, digital signal processors, programmable logic devices, quantum computing based data processing logic devices, etc., without limitation.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.
Claims (18)
1. A method for diagnosing the lifetime of a switching tube, the method comprising:
acquiring initial driving threshold voltage of a target switching tube;
determining the failure driving threshold voltage of the target switch tube according to the initial driving threshold voltage;
and applying the failure driving threshold voltage to the target switch tube, and determining whether the target switch tube is in a state to be failed according to whether the conduction state of the target switch tube meets a preset condition.
2. The method of claim 1, wherein the obtaining an initial driving threshold voltage of a target switching tube comprises:
acquiring the maximum design driving threshold voltage and the minimum design driving threshold voltage of the target switching tube;
gradually adjusting the driving threshold voltage output to the target switch tube within a voltage range between the maximum design driving threshold voltage and the minimum design driving threshold voltage until the conduction state of the target switch tube meets the preset condition;
and taking the driving threshold voltage output to the target switch tube when the conduction state meets the preset condition as the initial driving threshold voltage.
3. The method according to claim 1 or 2, characterized in that the method further comprises:
and determining the preset condition according to whether the current value passing through the target switch tube is larger than a current threshold value, wherein the current threshold value is determined according to a circuit element in a circuit where the target switch tube is located.
4. The method according to claim 3, wherein the circuit of the target switch tube includes an inductor connected in series with the target switch tube, and the current threshold is calculated according to a voltage applied to the inductor, a pulse width of a driving threshold voltage applied to the target switch tube, and an inductance value of the inductor.
5. The method of claim 3, further comprising:
if the conducting state of the target switching tube is that the current value passing through the target switching tube is larger than or equal to the current threshold, determining that the conducting state of the target switching tube meets the preset condition;
and if the conduction state of the target switch tube is that the current value passing through the target switch tube is smaller than the current threshold, determining that the conduction state of the target switch tube does not accord with the preset condition.
6. The method of claim 1, further comprising:
and outputting an early warning signal after the target switching tube is determined to be in the state of about to fail.
7. The method of claim 1 or 2, wherein determining the failed drive threshold voltage of the target switch tube from the initial drive threshold voltage comprises:
acquiring sensitivity;
and determining the failure driving threshold voltage of the target switching tube according to the initial driving threshold voltage and the sensitivity.
8. The method of claim 1 or 2, wherein the applying the failure driving threshold voltage to the target switch tube comprises:
and before the target switch tube is driven to be conducted every time, the step of applying the failure driving threshold voltage to the target switch tube is executed.
9. The switch tube service life diagnosis device is characterized by comprising a control unit, a driving unit, a target switch tube and a detection unit, wherein the driving unit is connected with a grid electrode of the target switch tube, and the control unit is respectively connected with the driving unit and the detection unit;
the control unit is used for controlling the driving unit to apply a failure driving threshold voltage to the target switching tube, wherein the failure driving threshold voltage is determined according to the initial driving threshold voltage of the target switching tube;
the control unit is also used for controlling the detection unit to detect the conduction state of the target switch tube;
the control unit is further used for determining whether the target switch tube is in a state to be failed according to whether the conduction state of the target switch tube meets a preset condition.
10. The apparatus of claim 9, wherein the control unit is further configured to control the driving unit to gradually adjust the driving threshold voltage output to the target switch tube within a voltage range between a maximum design driving threshold voltage and a minimum design driving threshold voltage of the target switch tube;
the control unit is further configured to control the detection unit to detect a conduction state of the target switching tube in a process that the driving unit gradually adjusts the driving threshold voltage output to the target switching tube;
the control unit is further configured to control the driving unit to stop outputting the driving threshold voltage to the target switch tube when the conduction state of the target switch tube meets the preset condition, and use the driving threshold voltage output by the driving unit to the target switch tube when the conduction state meets the preset condition as the initial driving threshold voltage.
11. The device according to claim 9 or 10, wherein the detection unit is used for detecting the current value passing through the target switch tube;
the control unit is used for determining the preset condition according to whether the current value is larger than a current threshold value, and the current threshold value is determined according to a circuit element in a circuit where the target switch tube is located.
12. The apparatus of claim 11, further comprising an inductor and a power source, wherein the power source, the inductor and the first pole of the target switch tube are connected in series, and the current threshold is calculated according to a voltage applied to the inductor by the power source, a pulse width of a driving threshold voltage applied to the target switch tube and an inductance value of the inductor.
13. The apparatus of claim 12, further comprising a resistor, wherein the second pole of the target switch is connected in series with the resistor and then grounded, and the detection unit is configured to detect a current value passing through the resistor, wherein the current value passing through the resistor is identical to the current value passing through the target switch.
14. The device of claim 9, further comprising an alarm unit, wherein the alarm unit is connected to the control unit, and the control unit is further configured to control the alarm unit to output an early warning signal after determining that the target switch tube is in an impending failure state.
15. The apparatus according to claim 9 or 10, wherein the control unit controls the driving unit to apply the disable driving threshold voltage to the target switching tube before the driving unit drives the target switching tube to conduct each time.
16. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 8.
17. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 8.
18. A computer program product comprising a computer program, characterized in that the computer program, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 8.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211020350.5A CN115343592A (en) | 2022-08-24 | 2022-08-24 | Method, apparatus, device, medium, and program product for diagnosing service life of switching tube |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202211020350.5A CN115343592A (en) | 2022-08-24 | 2022-08-24 | Method, apparatus, device, medium, and program product for diagnosing service life of switching tube |
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| CN115343592A true CN115343592A (en) | 2022-11-15 |
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| CN202211020350.5A Pending CN115343592A (en) | 2022-08-24 | 2022-08-24 | Method, apparatus, device, medium, and program product for diagnosing service life of switching tube |
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| CN (1) | CN115343592A (en) |
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- 2022-08-24 CN CN202211020350.5A patent/CN115343592A/en active Pending
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