CN115218855A - X-axis calibration method for profile measuring instrument - Google Patents
X-axis calibration method for profile measuring instrument Download PDFInfo
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- CN115218855A CN115218855A CN202210808136.XA CN202210808136A CN115218855A CN 115218855 A CN115218855 A CN 115218855A CN 202210808136 A CN202210808136 A CN 202210808136A CN 115218855 A CN115218855 A CN 115218855A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
The invention relates to a method for calibrating an X axis of a profile measuring instrument, which comprises the following steps: adjusting the parallelism of the special sample block and the X-axis guide rail of the contourgraph; the measuring needle scans from the first triangular sawtooth in sequence in an automatic contact mode until the upper limit of the measuring range of the X axis; the contourgraph forms a contour graph of a special sample block in a computer, the circle center position of each tooth top is fitted in the contour graph, the circle center distance is calculated by using measurement software of the contourgraph, the circle center distance is compared with a nominal value of the special sample block to obtain an indication error of an X axis of the measured contourgraph, and the indication error of the X axis of the contourgraph is calculated when the contour of a workpiece is detected. The special sample block can quickly and accurately adjust the position of the special sample block, ensures that the special sample block is parallel to an X-axis guide rail of the contourgraph, takes the distance between tooth top fillets of two adjacent triangular sawteeth as a measurement basis, and can effectively reduce the measurement error caused by the tooth top shape error, thereby obtaining the measurement error of the contourgraph.
Description
Technical Field
The invention relates to the technical field of error calibration of a profile measuring instrument, in particular to an X-axis calibration method of the profile measuring instrument.
Background
The contact pin type surface profile measuring instrument (hereinafter referred to as a profile instrument) is a measuring instrument which takes a linear guide rail as a reference, a contact pin moves along the surface of a workpiece, the profile curve of the measured surface is recorded, and the two-dimensional shape and position parameters of the measured profile, such as the size, the angle, the circular arc and the like, are calculated and evaluated. According to the requirements of GB/T19600-2004 'calibration of contact (contact pin) type instrument for product geometric technical specification (GPS) surface structure profile method' and JB/T11271-2012 'surface profile measuring instrument for contact (contact pin)', the indication error of the X axis of the profilometer is a very important technical index and needs to be calibrated.
At present, a widely used method for calibrating X-axis indicating value errors of a contourgraph is a laser interferometer calibration method. The laser interferometer calibration method needs to install a target mirror of the laser interferometer on a driving box of the contourgraph and a sensor connecting piece, but the target mirror is large in size and difficult to install, and the heavier weight of the target mirror easily damages the force measurement of the contourgraph, so that machine faults are caused.
Disclosure of Invention
The invention aims to overcome the defects and provides an X-axis calibration method for a profile measuring instrument, which can quickly and accurately adjust the position of a special sample block, takes the distance between the centers of the tooth tops of two adjacent triangular saw teeth as a measurement basis, and can effectively reduce the measurement error caused by the shape error of the tooth tops, thereby obtaining the measurement error of the profile measuring instrument, and the special sample block has good stability as a material measuring tool.
The purpose of the invention is realized by the following steps:
a method for calibrating an X-axis of a profile measuring instrument comprises the following steps:
step one, leveling a row:
placing the position adjusting base clamped with the special sample block on a contourgraph workbench, observing that the length direction of the special sample block 1 is consistent with the X-axis direction of the contourgraph by eye, and then carrying out fine adjustment on parallelism;
adjusting the height of an upright column of the contourgraph, enabling a measuring pin of the contourgraph to contact with the spherical bulge at the left end in an automatic contact mode, and finely adjusting the position of the special sample block through the adjusting thimble at the left side to accurately position the measuring pin at the top end of the spherical bulge at the left side; lifting the measuring needle, operating an X-axis guide rail of the contourgraph to enable the measuring needle to contact the spherical bulge on the right side, and finely adjusting the position of the special sample block through the adjusting thimble on the right side to enable the measuring needle to be accurately positioned at the top end of the spherical bulge on the right side;
the top ends of the left spherical bulge and the right spherical bulge are connected on the central line of the top surface of the special sample block, and the measuring needle captures the top ends of the two spherical bulges to indicate that the length direction of the special sample block is parallel to the running direction of the X-axis guide rail of the contourgraph at the moment;
step two, measurement;
from left to right, the measuring needle scans from the first triangular sawtooth in sequence in an automatic contact mode until the upper limit of the X-axis measuring range;
step three, data analysis;
the contourgraph forms a contour graph of a special sample block in a computer, the circle center position of each tooth top is fitted in the contour graph, the circle center distance is calculated by using measurement software of the contourgraph, the circle center distance is compared with a nominal value of the special sample block to obtain an indication error of an X axis of the measured contourgraph, and the indication error of the X axis of the contourgraph is calculated when the contour of a workpiece is detected.
Preferably, in the first step, the Z-axis error is also eliminated, the probe is contacted with the tooth tops of the triangular saw teeth in an automatic contact manner, the Z-axis guide rail is adjusted, the tooth top coordinates are observed through graphic software, and when the tooth tops have obvious difference in height, the height adjusting screw drives the cam to adjust the inclination of the special sample block, so that the tooth top connecting line of each triangular saw tooth is parallel to the X-axis guide rail, and the error introduced by the Z-axis in the X-axis calibration process can be reduced.
Preferably, special appearance piece in step one includes the base, the top surface of special appearance piece is equipped with globular arch along length direction both ends, and a plurality of triangle sawtooth interval equipartitions are between two globular archs, the tooth top radius angle of triangle sawtooth.
Preferably, the position adjustment base in the first step comprises a base plate, the base plate is provided with a horizontal adjustment support along the length direction, and the horizontal adjustment support clamps and adjusts the special sample block.
Preferably, the horizontal adjusting support comprises two vertical plates, an adjusting thimble and an elastic thimble, the two vertical plates are arranged on the front side and the rear side of the base plate, and the adjusting thimble and the elastic thimble are correspondingly arranged on the two vertical plates.
Preferably, one side of bed plate along length direction is equipped with cylindrical fulcrum, and the opposite side is equipped with the cam, the bed plate corresponds the cam and is equipped with the cam and holds the chamber, height adjusting screw is connected to the cam, height adjusting screw one end stretches out the bed plate, the bottom surface of special appearance piece contacts with cylindrical fulcrum, cam all the time.
The invention has the beneficial effects that:
the special sample block can quickly and accurately adjust the position of the special sample block, ensures that the special sample block is parallel to the X-axis guide rail of the contourgraph, takes the distance between the tooth top fillets of two adjacent triangular saw teeth as a measuring basis, and can effectively reduce the measuring error caused by the tooth top shape error, thereby obtaining the measuring error of the contourgraph, and the special sample block has good stability as a material measuring tool.
Drawings
Fig. 1 is a schematic view of the present invention in use.
Fig. 2 is an assembly diagram of the special sample block and the position adjusting base.
Fig. 3 is a left side view of fig. 2.
Fig. 4 is a schematic diagram of a state after the inclination of the special sample block is adjusted.
Fig. 5 is a schematic structural diagram of a dedicated sample block.
Wherein: a special sample block 1; a base 1.1; 1.2 of spherical bulge; 1.3 of triangular saw teeth; a position adjusting base 2; a base plate 2.1; a horizontal adjusting bracket 2.2; a vertical plate 2.2.1; adjusting the thimble 2.2.2; an elastic thimble 2.2.3; a cylindrical fulcrum 2.3; a cam 2.4; a height adjusting screw rod 2.5; a profiler 3; and 3.1 of measuring needles.
Detailed Description
Referring to fig. 1-5, the invention relates to an X-axis calibration device for a profile measuring instrument, which comprises a special sample block 1 and a position adjusting base 2, wherein the special sample block 1 comprises a base 1.1, spherical protrusions 1.2 are arranged at two ends of the top surface of the base 1.1 along the length direction, a plurality of triangular saw teeth 1.3 are uniformly distributed between the two spherical protrusions 1.2 at intervals, the spherical protrusions 1.2 and the triangular saw teeth 1.3 are distributed on the central line of the top surface of the base 1.1, the triangular saw teeth 1.2 are isosceles triangles, the vertex angles of the triangular saw teeth 1.2 are larger than 60 degrees, the tooth tops of the triangular saw teeth 1.2 are rounded off, the roundness error of the tooth tops is smaller than 2 micrometers, and the crawling contact pins in the measuring process of the profile measuring instrument are convenient to be smooth.
The base 1.1 width is greater than 5mm, highly is greater than 10mm, and the material is the steel, makes special appearance piece 1 have good stability, non-deformable.
The tooth thickness of the triangular saw teeth is less than or equal to 3mm, so that the tooth profile is easy to manufacture on the premise of ensuring the tooth crest straightness and the shape precision of tooth crest circular arcs.
The tooth height of triangle sawtooth is less than 4mm, and is less than the height of probe 3.1, guarantees that probe 3.1 contacts special appearance piece all the time in the contourgraph measurement process.
The distance between the tooth top fillets of two adjacent triangular sawteeth is the center distance, the center distance serves as a main technical index, measuring errors caused by tooth top shape errors can be effectively reduced, and meanwhile, the special sample block can trace to the source conveniently.
The position adjusting base 2 comprises a base plate 2.1, a horizontal adjusting support 2.2 is arranged on the base plate 2.1 in the front and back direction along the length direction, the horizontal adjusting support 2.2 is used for clamping and adjusting the special sample block 1, the horizontal adjusting support 2.2 comprises two vertical plates 2.2.1, an adjusting thimble 2.2.2 and an elastic thimble 2.2.3, the two vertical plates 2.2.1 are arranged on the front side and the back side of the base plate 2.1, the adjusting thimble 2.2.2 and the elastic thimble 2.2.3 are correspondingly arranged on the two vertical plates 2.2.1, a spring is sleeved on the elastic thimble 2.2.2, the elastic thimble 2.2.2 realizes elastic compression through a spring, when the horizontal adjusting support 2.2 is not inserted into the special sample block 1, the elastic thimble 2.2.2.2.2 is in an uncompressed state, and when the special sample block 1 is inserted into the horizontal adjusting support 2.2, the special sample block 1 pushes the elastic thimble outwards to compress the elastic thimble 2.2.3, so as to achieve the effect of clamping the special sample block 1; when the front and back positions of the special sample block 1 need to be horizontally adjusted, the thimble 2.2.2 is rotationally adjusted, and the special sample block 1 is ensured to be parallel to the X-axis guide rail of the contourgraph.
Base plate 2.1 is equipped with cylindrical fulcrum 2.3 along length direction's one side, and the opposite side is equipped with cam 2.4, base plate 2.1 corresponds cam 2.4 and is equipped with the cam and holds the chamber, high adjusting screw 2.5 is connected to cam 2.4, base plate 2.1 is stretched out to high adjusting screw 2.5 one end, the bottom surface of special appearance piece 1 contacts with cylindrical fulcrum 2.3, cam 2.4 all the time, when needs carry out high fine setting to special appearance piece 1, drives cam 2.4 above that through rotatory high adjusting screw 2.5 and rotates to realize the high fine setting of special appearance piece 1 of cam 2.4 side, ensure that special appearance piece 1 is parallel with profile appearance X axle guide rail, eliminate the Z axle error, avoid the X axle among the calibration process Z axle to introduce the error interference measuring result.
The X-axis calibration method of the profile measuring instrument comprises the following steps:
the method comprises the following steps:
step one, leveling a row: ensuring that the special sample block is parallel to the X-axis guide rail direction of the contourgraph;
firstly, a position adjusting base 2 holding a special sample block 1 is placed on a contourgraph workbench, the length direction of the special sample block 1 is visually observed to be consistent with the X-axis direction of the contourgraph, and then parallelism adjustment is carried out;
adjusting the height of an upright column of the contourgraph, enabling a measuring pin 3.1 of the contourgraph 3 to be in contact with the spherical bulge at the left end in an automatic contact mode, finely adjusting the position of the special sample block through a left adjusting thimble, enabling the measuring pin 3.1 to be accurately positioned at the top end of the spherical bulge at the left end, and marking the corresponding Z-axis indication value as Z1 when the measuring pin 3.1 is positioned at the top end of the spherical bulge at the left end;
lifting the measuring pin 3.1, operating an X-axis guide rail of the contourgraph 3 to enable the measuring pin 3.1 to contact the spherical bulge on the right side, finely adjusting the position of the special sample block through the adjusting thimble on the right side to enable the measuring pin 3.1 to be accurately positioned at the top end of the spherical bulge on the right side, and when the measuring pin 3.1 is positioned at the top end of the spherical bulge on the right side, marking the corresponding Z-axis indication value as Z2 to be maximum;
because the top ends of the left and right spherical bulges are connected on the central line of the top surface of the special sample block, the measuring needle 3.1 captures the top ends of the two spherical bulges to show that the length direction of the special sample block is parallel to the running direction of the X-axis guide rail of the contourgraph at the moment;
when the measuring needle 3.1 catches the top end of the spherical bulge, the measuring needle moves back and forth along the Y-direction tangent plane of the spherical bulge by adjusting the thimble, the Z-axis indicating value is observed while moving, and the maximum Z-axis indicating value is found, so that the top end of the spherical bulge is positioned.
Eliminating Z-axis errors: the measuring needle 3.1 is contacted with the tooth tops of the triangular saw teeth in an automatic contact mode, the Z-axis guide rail is adjusted, the coordinates of the tooth tops are observed through graphic software, if the heights of the tooth tops are obviously different, the height adjusting screw drives the cam to adjust the gradient of the special sample block, the tooth top connecting line of each triangular saw tooth is parallel to the direction of the X-axis guide rail, and errors introduced by the Z axis in the X-axis calibration process can be reduced.
Step two, measurement
From left to right, the stylus 3.1 scans in sequence from the first triangular saw tooth in an automatic contact manner to the upper limit of the X-axis measurement range.
Step three, data analysis
The method comprises the steps that a profile instrument forms a profile graph of a special sample block in a computer, the circle center position of each tooth top is fitted in the profile graph, a circle section is selected as large as possible during fitting so as to reduce measurement errors, the circle center distance is calculated by using measurement software of the profile instrument, the circle center distance is compared with a nominal value of the special sample block to obtain an indication value error of an X axis of the profile instrument, the indication value error of the X axis of the profile instrument is calculated during workpiece profile detection, the precision of the profile instrument is improved, and the measurement errors are reduced.
In addition to the above embodiments, the present invention also includes other embodiments, and any technical solutions formed by equivalent transformation or equivalent replacement should fall within the scope of the claims of the present invention.
Claims (7)
1. A method for calibrating an X axis of a profile measuring instrument is characterized by comprising the following steps: the method comprises the following steps:
step one, leveling a row:
placing the position adjusting base clamped with the special sample block on a contourgraph workbench, observing that the length direction of the special sample block 1 is consistent with the X-axis direction of the contourgraph by eye, and then carrying out fine adjustment on parallelism;
adjusting the height of an upright column of the contourgraph, enabling a measuring pin of the contourgraph to contact with the spherical bulge at the left end in an automatic contact mode, and finely adjusting the position of the special sample block through the adjusting thimble at the left side to accurately position the measuring pin at the top end of the spherical bulge at the left side; lifting the measuring needle, operating an X-axis guide rail of the contourgraph to enable the measuring needle to contact the spherical bulge on the right side, and finely adjusting the position of the special sample block through the adjusting thimble on the right side to enable the measuring needle to be accurately positioned at the top end of the spherical bulge on the right side;
the top ends of the left and right spherical bulges are connected on the central line of the top surface of the special sample block, and when the measuring needle captures the top ends of the two spherical bulges, the length direction of the special sample block is parallel to the running direction of the X-axis guide rail of the contourgraph at the moment;
step two, measurement;
from left to right, the measuring needle scans from the first triangular sawtooth in sequence in an automatic contact mode until the upper limit of the X-axis measuring range;
step three, data analysis;
the contourgraph forms a contour graph of a special sample block in a computer, the circle center position of each tooth top is fitted in the contour graph, the circle center distance is calculated by using measurement software of the contourgraph, the circle center distance is compared with a nominal value of the special sample block to obtain an indication error of an X axis of the measured contourgraph, and the indication error of the X axis of the contourgraph is calculated when the contour of a workpiece is detected.
2. A profile gauge X-axis calibration method according to claim 1, wherein: in the first step, the Z-axis error is required to be eliminated, the probe is contacted with the tooth tops of the triangular saw teeth in an automatic contact mode, the Z-axis guide rail is adjusted, the coordinates of the tooth tops are observed through graphic software, when the heights of the tooth tops are obviously different, the height adjusting screw drives the cam to adjust the gradient of the special sample block, so that the tooth top connecting line of each triangular saw tooth is parallel to the direction of the X-axis guide rail, and the error introduced by the Z axis in the X-axis calibration process can be reduced.
3. A profile gauge X-axis calibration method according to claim 1, wherein: the special sample block in the first step comprises a base, wherein spherical protrusions are arranged on the top surface of the special sample block along the two ends of the length direction, a plurality of triangular saw teeth are uniformly distributed between the two spherical protrusions at intervals, and the tooth tops of the triangular saw teeth are rounded.
4. A profile gauge X-axis calibration method according to claim 1, wherein: the position adjusting base in the first step comprises a base plate, wherein horizontal adjusting supports are arranged on the base plate in the front and at the back along the length direction, and the horizontal adjusting supports clamp and adjust the special sample blocks.
5. A profilometer X-axis calibration method according to claim 4 wherein: the horizontal adjusting support comprises two vertical plates, adjusting thimbles and elastic thimbles, the two vertical plates are arranged on the front side and the rear side of the base plate, and the adjusting thimbles and the elastic thimbles are correspondingly arranged on the two vertical plates.
6. A profilometer X-axis calibration method according to claim 4 wherein: the bed plate is equipped with cylindrical fulcrum along length direction's one side, and the opposite side is equipped with the cam, the bed plate corresponds the cam and is equipped with the cam and holds the chamber, high adjusting screw is connected to the cam, the bed plate is stretched out to high adjusting screw one end, the bottom surface of special appearance piece contacts with cylindrical fulcrum, cam all the time.
7. A profile gauge X-axis calibration method according to claim 1, wherein: when the measuring needle 3.1 catches the top end of the spherical bulge, the measuring needle moves back and forth along the Y-direction tangent plane of the spherical bulge by adjusting the thimble, the Z-axis indicating value is observed while moving, and the maximum Z-axis indicating value is found, so that the top end of the spherical bulge is positioned.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210808136.XA CN115218855A (en) | 2022-07-11 | 2022-07-11 | X-axis calibration method for profile measuring instrument |
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| CN202210808136.XA CN115218855A (en) | 2022-07-11 | 2022-07-11 | X-axis calibration method for profile measuring instrument |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116372283A (en) * | 2023-03-30 | 2023-07-04 | 湖南中大创远数控装备有限公司 | Gear grinding measuring device and checking method |
| CN116766135A (en) * | 2023-08-23 | 2023-09-19 | 成都国营锦江机器厂 | Helicopter main reducer stay bar hole center distance measuring tool and method |
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2022
- 2022-07-11 CN CN202210808136.XA patent/CN115218855A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116372283A (en) * | 2023-03-30 | 2023-07-04 | 湖南中大创远数控装备有限公司 | Gear grinding measuring device and checking method |
| CN116372283B (en) * | 2023-03-30 | 2024-01-30 | 湖南中大创远数控装备有限公司 | Gear grinding measuring device and checking method |
| CN116766135A (en) * | 2023-08-23 | 2023-09-19 | 成都国营锦江机器厂 | Helicopter main reducer stay bar hole center distance measuring tool and method |
| CN116766135B (en) * | 2023-08-23 | 2023-11-07 | 成都国营锦江机器厂 | Helicopter main reducer stay bar hole center distance measuring tool and method |
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