CN115184881B - Aging test board, aging test method and aging test system of pulse transponder - Google Patents
Aging test board, aging test method and aging test system of pulse transponder Download PDFInfo
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- CN115184881B CN115184881B CN202210726262.0A CN202210726262A CN115184881B CN 115184881 B CN115184881 B CN 115184881B CN 202210726262 A CN202210726262 A CN 202210726262A CN 115184881 B CN115184881 B CN 115184881B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
- G01S7/4004—Means for monitoring or calibrating of parts of a radar system
Abstract
The invention provides a burn-in test board of a pulse transponder, a burn-in test method and a burn-in test system. The aging test bench comprises a phase-locked source unit, a modulation attenuation unit, a load unit and a detection unit; the phase-locked source unit generates a crystal oscillator signal, phase-locks and amplifies the crystal oscillator signal, generates a reference signal with set frequency and set amplitude, and outputs the reference signal to the modulation attenuation unit; the modulation attenuation unit is connected with the phase-locked source unit and used for adjusting the frequency and/or the amplitude of the reference signal and outputting a test signal; the load unit is connected with the modulation attenuation unit and is used for outputting a test signal to the pulse transponder in a radio frequency manner, receiving a feedback signal replied by the pulse transponder and outputting the feedback signal to the detection unit; the detection unit is connected with the load unit, receives the feedback signal, amplifies the feedback signal and outputs the feedback signal to finish aging test of the pulse transponder under different amplitude values and different frequencies. The invention can realize the aging test of the pulse transponder.
Description
Technical Field
The invention relates to the technical field of transponders, in particular to a burn-in test board, a burn-in test method and a burn-in test system of a pulse transponder.
Background
The impulse transponder is arranged on various space operation carriers, works cooperatively with the ground radar, increases the acting distance and completes real-time measurement of the carrier flight orbit. The transponder can provide highly accurate distance and speed information while providing flight trajectory data for post-hoc analysis. The basic working principle of the pulse transponder is that the uplink signal of the ground radar is received and forwarded in a delayed manner, the ground radar measures the radial distance through measuring the time delay, and meanwhile, the aircraft is positioned through tracking and angle measurement.
After the transponder is installed, the transponder is operated on various space operation carriers, so that the transponder is difficult to maintain, and the transponder is required to have high reliability. For example, longer fault-free run times, higher measurement and forwarding accuracy. Therefore, it is desirable to conduct burn-in testing of the transponder prior to installation to ensure that the transponder has high reliability, ensuring reliable operation of the transponder on various types of space-based carriers. However, the existing scheme does not have a burn-in testing device of the pulse transponder, so that the reliability test of the pulse transponder cannot be realized.
Therefore, a complete aging test device for the pulse transponder is needed to realize the reliability test of the pulse transponder.
Disclosure of Invention
The invention provides a burn-in test board, a burn-in test method and a burn-in test system of a pulse transponder, which can realize the burn-in test of the pulse transponder and ensure the reliability of the pulse transponder.
In a first aspect, the present invention provides a burn-in test stand for a pulse transponder, the burn-in test stand comprising a phase-locked source unit, a modulation attenuation unit, a load unit and a detection unit; the phase-locked source unit generates a crystal oscillator signal, phase-locks and amplifies the crystal oscillator signal, generates a reference signal with set frequency and set amplitude, and outputs the reference signal to the modulation attenuation unit; the modulation attenuation unit is connected with the phase-locked source unit and used for adjusting the frequency and/or the amplitude of the reference signal and outputting a test signal; the load unit is connected with the modulation attenuation unit and is used for outputting a test signal to the pulse transponder in a radio frequency manner, receiving a feedback signal replied by the pulse transponder and outputting the feedback signal to the detection unit; the detection unit is connected with the load unit, receives the feedback signal, amplifies the feedback signal and outputs the feedback signal to finish aging test of the pulse transponder under different amplitude values and different frequencies.
The invention provides a aging test board of a pulse transponder, which is characterized in that a crystal oscillator signal is used for carrying out frequency and amplitude adjustment to generate a reference signal with set frequency and set amplitude, the frequency and/or the amplitude of the reference signal are adjusted on the basis of the reference signal, test signals with different amplitudes and different frequencies are output, then a feedback signal replied by the pulse transponder is received, amplified and then output to a signal processing device, so that aging test of the pulse transponder under different amplitudes and different frequencies is completed, aging test of the pulse transponder is realized, and reliability of the pulse transponder is ensured.
In one possible implementation, the phase-locked source unit includes: the device comprises a crystal oscillator module, a phase-locked loop module, a microstrip filter, an amplifier and a pi-type attenuator; the crystal oscillator module generates a crystal oscillator signal; the phase-locked loop module performs phase locking on the crystal oscillator signal; the microstrip filter filters signals with set frequency in the phase-locked crystal oscillator signals and outputs signals with set frequency to the amplifier; the amplifier receives the signal with the set frequency, performs power amplification on the signal with the set frequency, and outputs the amplified signal with the set frequency to the pi-type attenuator; the pi-type attenuator receives the amplified signal with the set frequency and attenuates the power to generate a reference signal with the set frequency and set amplitude.
In one possible implementation, the phase-locked source unit includes: the device comprises a crystal oscillator module, a phase-locked loop module, a first microstrip filter, a first amplifier, a pi-type attenuator, a second amplifier, a second microstrip filter and a third amplifier; the crystal oscillator module generates a crystal oscillator signal; the phase-locked loop module performs phase locking on the crystal oscillator signal; the first microstrip filter filters a signal with a set frequency in the phase-locked crystal oscillator signal and outputs the signal to a first signal with the set frequency of the first amplifier; the first amplifier receives the first signal, amplifies the power of the first signal and outputs the amplified first signal to the pi-type attenuator; the pi-type attenuator receives the amplified first signal and carries out power attenuation to generate a second signal; the second amplifier receives the second signal, amplifies the power of the second signal and outputs the amplified second signal to the second microstrip filter; the second microstrip filter filters the amplified second signal and outputs a third signal with a set frequency to the third amplifier; the third amplifier receives the third signal and performs power amplification on the third signal to generate a reference signal with a set frequency and a set amplitude.
In one possible implementation, the burn-in test stand further includes a controller, the modulation attenuation unit includes: a microwave switch and a numerical control attenuator; the controller is respectively connected with the microwave switch and the digital control attenuator; the microwave switch receives a frequency control signal output by the controller, and realizes the opening and closing of the microwave switch based on the frequency control signal so as to perform step adjustment on the frequency of the reference signal; the digital control attenuator receives an amplitude control signal output by the controller, and adjusts the attenuation of the digital control attenuator in a stepping manner based on the amplitude control signal so as to adjust the amplitude of the reference signal in a stepping manner; the controller generates a frequency control signal and an amplitude control signal, and controls the microwave switch and the numerical control attenuator to output test signals with different frequencies and different amplitudes.
In one possible implementation, the controller includes a first single-chip microcomputer, a second single-chip microcomputer, and a third single-chip microcomputer; the first singlechip comprises an amplitude adjusting pin and a frequency adjusting pin, the amplitude adjusting pin is connected with the numerical control attenuator, and the frequency adjusting pin is connected with the microwave switch; the second singlechip is connected with the phase-locking source unit and is used for carrying out phase-locking control on the phase-locking source unit; the third singlechip is used for receiving an input instruction of a user, wherein the input instruction of the user comprises an instruction for controlling screen display and a communication instruction of the first singlechip.
In one possible implementation, the load unit includes: the device comprises a circulator, an output interface and a coupling microstrip line; the circulator is respectively connected with the output interface and the coupling microstrip line; the circulator receives the test signal in one direction and sends the test signal to the transponder through the output interface; and receives a feedback signal of the transponder via an output interface, and transmits the feedback signal to the detection unit via a coupling microstrip line.
In one possible implementation, the burn-in test stand further includes: a power supply unit; the power supply unit comprises an alternating current switch and a power supply module, wherein the input end of the power supply module is connected with the alternating current switch, and the output end of the power supply module comprises a first direct current power supply, a second direct current power supply, a third direct current power supply and a fourth direct current power supply; the first direct current power supply is a 12V direct current power supply and supplies power to the phase-locked source unit, the modulation attenuation unit and the detection unit; the second direct current power supply is a 24V direct current power supply and supplies power for the voltmeter and the ammeter; the third direct current power supply is a direct current power supply with adjustable voltage, the voltage adjusting range of the direct current power supply is 23V to 33V, and the third direct current power supply supplies power for the first pulse transponder; the fourth direct current power supply is a direct current power supply with adjustable voltage, the voltage adjusting range of the direct current power supply is 23V to 33V, and the fourth direct current power supply supplies power for the second pulse transponder.
In one possible implementation, the burn-in test stand further includes: a display unit; the display unit is connected with the third singlechip; the display unit comprises a display screen, a voltmeter and an ammeter, receives a display instruction sent by the third singlechip and displays data in the display instruction.
In a second aspect, an embodiment of the present invention provides a burn-in test method for a pulse transponder, including: acquiring the frequency and amplitude of a test signal required to carry out aging test on the pulse transponder; the phase-locked source unit is controlled to be started, and is used for generating a crystal oscillator signal, generating a reference signal with a set frequency and a set amplitude after phase-locking amplification of the crystal oscillator signal, and outputting the reference signal to the modulation attenuation unit; generating a frequency control signal based on the frequency of the test signal; and generating an amplitude control signal based on the amplitude of the test signal; controlling the modulation attenuation unit to be started, and sending a frequency control signal and an amplitude control signal to the modulation attenuation unit so that the modulation attenuation unit adjusts the frequency and/or the amplitude of the reference signal based on the frequency control signal and the amplitude control signal and outputs a test signal; the load unit is controlled to be started, and is used for outputting a test signal to the pulse transponder in a radio frequency manner, receiving a feedback signal replied by the pulse transponder and outputting the feedback signal to the detection unit; the detection unit is controlled to be started, and the detection unit is used for receiving the feedback signal, amplifying the feedback signal and outputting the feedback signal so as to finish aging test of the pulse transponder under different amplitude values and different frequencies.
In a third aspect, an embodiment of the present invention provides a burn-in test system of a transponder, including a burn-in test stand as described in the first aspect and any one of the possible implementation manners of the first aspect, and a signal processing device; the signal processing device is used for receiving and processing the feedback signal of the pulse transponder and outputting a processing result.
Technical effects caused by any implementation manner of the second aspect to the third aspect may refer to technical effects caused by corresponding implementation manners of the first aspect, which are not described herein.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a burn-in test stand for a transponder according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a burn-in test stand of another transponder according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a power supply unit of the burn-in test stand according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a power unit of another burn-in test stand according to an embodiment of the present invention;
fig. 5 is a schematic flow chart of a burn-in test method of a pulse transponder according to an embodiment of the present invention.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth such as the particular system architecture, techniques, etc., in order to provide a thorough understanding of the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
In the description of the present invention, "/" means "or" unless otherwise indicated, for example, A/B may mean A or B. "and/or" herein is merely an association relationship describing an association object, and means that three relationships may exist, for example, a and/or B may mean: a exists alone, A and B exist together, and B exists alone. Further, "at least one", "a plurality" means two or more. The terms "first," "second," and the like do not limit the number and order of execution, and the terms "first," "second," and the like do not necessarily differ.
In the embodiments of the present application, words such as "exemplary" or "such as" are used to mean serving as examples, illustrations, or descriptions. Any embodiment or design described herein as "exemplary" or "for example" should not be construed as preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "such as" is intended to present related concepts in a concrete fashion that may be readily understood.
Furthermore, references to the terms "comprising" and "having" and any variations thereof in the description of the present application are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or modules is not limited to only those steps or modules but may, alternatively, include other steps or modules not listed or inherent to such process, method, article, or apparatus.
For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the following description will be made with reference to the accompanying drawings of the present invention by way of specific embodiments.
As described in the background art, there is a need for a complete aging test device for a transponder to realize reliability test of the transponder.
In order to solve the above technical problems, as shown in fig. 1, an embodiment of the present invention provides a burn-in test board of a pulse transponder. The burn-in test stand 10 includes a phase-locked source unit 101, a modulation attenuation unit 102, a load unit 103, and a detection unit 104.
The transponder 11 is one of transponders. The transponder 11 in the embodiment of the invention may be a pulse coherent transponder, for example.
In this embodiment, the phase-locked source unit 101 generates a crystal oscillator signal, phase-locks and amplifies the crystal oscillator signal, generates a reference signal with a set frequency and a set amplitude, and outputs the reference signal to the modulation attenuation unit 102.
In this embodiment, the modulation attenuation unit 102 is connected to the phase-locked source unit 101, and is configured to adjust the frequency and/or the amplitude of the reference signal, and output a test signal.
In this embodiment, the load unit 103 is connected to the modulation attenuation unit 102, and is configured to rf output a test signal to the transponder, receive a feedback signal returned by the transponder, and output the feedback signal to the detection unit 104.
In this embodiment, the detection unit 104 is connected to the load unit 103, receives the feedback signal, amplifies the feedback signal, and outputs the feedback signal, so as to complete the aging test of the transponder 11 under different amplitude values and different frequencies.
The invention provides a aging test board of a pulse transponder, which is characterized in that a crystal oscillator signal is used for carrying out frequency and amplitude adjustment to generate a reference signal with set frequency and set amplitude, the frequency and/or the amplitude of the reference signal are adjusted on the basis of the reference signal, test signals with different amplitudes and different frequencies are output, then a feedback signal replied by the pulse transponder is received, amplified and then output to a signal processing device, so that aging test of the pulse transponder under different amplitudes and different frequencies is completed, aging test of the pulse transponder is realized, and reliability of the pulse transponder is ensured.
Optionally, fig. 2 is a schematic structural diagram of a burn-in test stand of a pulse answering machine according to an embodiment of the present invention.
In some embodiments, the phase-locked source unit 101 may include: a crystal oscillator module 1011, a phase-locked loop module 1012, a microstrip filter, an amplifier and a pi-type attenuator 1015;
illustratively, the crystal module 1011 generates a crystal signal.
It should be noted that the first stage of the link is a crystal oscillator module. The output frequency of the crystal oscillator module is 100MHz, and the output power is more than 0dBm. The temperature ranges from-40 ℃ to +70 ℃. The parameter index of the crystal oscillator can be referred to as shown in table 1.
TABLE 1
Illustratively, the phase-locked loop module 1012 phase locks the crystal oscillator signal.
It should be noted that, the rf signal with the frequency of 100MHz generated by the crystal oscillator module generates the required high-frequency signal after passing through the phase-locked loop module. The frequency range of the phase-locked loop module is 25-6000MHz.
The microstrip filter filters a signal with a set frequency in the phase-locked crystal oscillator signal and outputs the signal with the set frequency to the amplifier.
The amplifier receives a signal of a set frequency, amplifies the signal of the set frequency, and outputs the amplified signal of the set frequency to the pi-type attenuator.
After the signals are filtered by the microstrip filter, the signals enter the amplifier for signal amplification. The operating frequency of the amplifier may be DC-12GHz, at which the gain is 11dB.
Illustratively, the pi-type attenuator 1015 receives the amplified signal at a set frequency and attenuates the power to generate a reference signal at a set frequency and a set amplitude.
In order to adjust the link gain, a pi-type attenuator is also arranged in the link. For example, the design gain of a pi-type attenuator may be-4 dB. And after the signals are comprehensively regulated by the amplifier and the pi-type attenuator, outputting the signals to a modulation attenuation unit.
The radio frequency signal is generated by the crystal oscillator, generates the required frequency after passing through the phase-locked loop, and is output to the modulation attenuation unit after being filtered and amplified, and is output by the radio frequency antenna after passing through the circulator. The signals input by the coupling antenna pass through the two-section circulator and then pass through the detector and the amplifier to output detection waveforms so as to finish aging test of the pulse transponder under different amplitude values and different frequencies.
In other embodiments, the phase-locked source unit 101 may further include: a crystal oscillator module 1011, a phase-locked loop module 1012, a first microstrip filter 1013, a first amplifier 1014, a pi-type attenuator 1015, a second amplifier 1016, a second microstrip filter 1017, and a third amplifier 1018.
Illustratively, the crystal module 1011 generates a crystal signal.
Illustratively, the phase-locked loop module 1012 phase locks the crystal oscillator signal.
Illustratively, the first microstrip filter 1013 filters a signal with a set frequency from the phase-locked crystal oscillator signal, and outputs the filtered signal to the first amplifier 1014.
Illustratively, the first amplifier 1014 receives the first signal and power amplifies the first signal, outputting the amplified first signal to the pi-type attenuator 1015.
Illustratively, the pi-type attenuator 1015 receives the amplified first signal and performs power attenuation to generate a second signal.
Illustratively, the second amplifier 1016 receives the second signal and power amplifies the second signal, outputting the amplified second signal to the second microstrip filter 1017.
Illustratively, the second microstrip filter 1017 filters the amplified second signal and outputs a third signal having a set frequency to the third amplifier 1018.
Illustratively, the third amplifier 1018 receives the third signal and power amplifies the third signal to generate a reference signal having a set frequency and a set amplitude.
In some embodiments, burn-in test station 10 further includes a controller, and modulation attenuation unit 102 includes: a microwave switch and a numerical control attenuator; the controller is respectively connected with the microwave switch and the numerical control attenuator.
Illustratively, the microwave switch receives a frequency control signal output by the controller, and the microwave switch is turned on and off based on the frequency control signal to perform step adjustment on the frequency of the reference signal.
Wherein the number of microwave switches may be one or more. For example, a first microwave switch 1021 and a second microwave switch 1022. The plurality of microwave switches are connected in series, so that the frequency can be regulated more finely. The working range of the microwave switch is DC-12GHz, the isolation degree is 50dB at the working frequency point, the difference loss is 1.5dB, and the switching speed is 6ns.
For example, the modulation attenuation unit may comprise a two-stage microwave switch. A first microwave switch 1021 and a second microwave switch 1022. The embodiment of the invention realizes the switch output of the radio frequency excitation signal by controlling the on-off of the microwave switch, the repetition frequency is adjusted between 100Hz-5kHz, and the width of the pulse signal is realized within 800ns-900 ns.
Illustratively, the digitally controlled attenuator receives an amplitude control signal output by the controller, and adjusts the attenuation amount of the digitally controlled attenuator in steps based on the amplitude control signal to adjust the amplitude of the reference signal in steps.
The modulation attenuation unit may include a three-stage digital control attenuator. For example, a first digitally controlled attenuator 1023, a second digitally controlled attenuator 1024, and a third digitally controlled attenuator 1025. The operating frequency of the digitally controlled attenuator may be 2.2GHz-8GHz. Stepping 0.5dB, the maximum attenuation is 31.5dB. The difference is 4dB at this frequency.
For example, the digitally controlled attenuator may be a 20dB attenuator with an operating frequency of DC-10GHz. The attenuator may be controlled to attenuate 20 dB. The difference at this frequency was 1.5dB. The maximum attenuation of the three-stage attenuator can reach 71.5dB. The controller controls the radio frequency excitation signal amplitude to be adjusted between-60 and 0dB and the step adjustment to be 10 dB.
The controller generates frequency control signals and amplitude control signals to control the microwave switch and the digitally controlled attenuator to output test signals of different frequencies and different amplitudes.
In some embodiments, the controller includes a first single-chip microcomputer, a second single-chip microcomputer, and a third single-chip microcomputer.
The first singlechip comprises an amplitude adjusting pin and a frequency adjusting pin, wherein the amplitude adjusting pin is connected with the numerical control attenuator, and the frequency adjusting pin is connected with the microwave switch.
The second singlechip is illustratively connected to the phase-locked source unit 101, and is configured to perform phase-locked control on the phase-locked source unit 101.
The third singlechip is used for receiving an input instruction of a user, wherein the input instruction of the user comprises an instruction for controlling screen display and a communication instruction of the first singlechip.
In some embodiments, the load unit 103 includes: a circulator 1031, an output port 1032, and a coupled microstrip line 1033.
As a possible implementation, the circulator 1031 receives the test signal unidirectionally and transmits the test signal to the transponder 11 via the output interface 1032; and receives a feedback signal of the transponder 11 via the output interface 1032, and transmits the feedback signal to the detection unit 104 via the coupling microstrip line 1033.
In addition, the circulator 1031 unidirectionally receives the test signal to isolate the output port 1032 from the modulation attenuation unit 102.
It will be appreciated that the burn-in test station 10 has a detection output function that can detect and output radio frequency pulses having peak powers of not less than 100W. The transponder 11 transmits the received test signal, and the test signal is input to the load unit 103 via the coupling antenna 1033, and is transmitted to the detection unit 104 to be detected and output.
The applicable frequency range of the load unit 103 is DC-6GHz, the standing wave coefficient is less than 1.2, the continuous wave withstand power is 60W, and the withstand power under a pulse signal with a pulse width of 10us and a duty ratio of 1% is 600W. The signal pulse width of the transponder 11 is less than 900ns and the duty cycle is less than 0.5%.
The feedback signal of the transponder 11 is coupled via a coupling antenna with coupling strength of-25 dB and 30-dB, respectively, and transmitted to the detection unit 104. The frequency range of the detection unit 104 is 1MHz-10GHz, the accuracy is 1dB, and the output impulse response time is less than 10ms.
In some embodiments, burn-in test stand 10 further comprises: a power supply unit 105.
As a possible implementation, as shown in fig. 3, the power unit 105 includes an ac switch and a power module, an input terminal of the power module is connected to the ac switch, and an output terminal of the power module includes a first dc power supply, a second dc power supply, a third dc power supply, and a fourth dc power supply.
The first dc power supply is, for example, a 12V dc power supply, which powers the phase-locked source unit 101, the modulation attenuation unit 102, and the detection unit 104.
The second dc power supply is, for example, a 24V dc power supply, which powers the voltmeter and the ammeter.
Illustratively, the third dc power source is a voltage-regulated dc power source having a voltage regulation range of 23V to 33V, and the third dc power source powers the first transponder.
Illustratively, the fourth dc power source is a voltage-regulated dc power source having a voltage regulation range of 23V to 33V, the fourth dc power source powering the second transponder.
The input of the power supply unit 105 is AC220V 50Hz, the output is adjustable DC23-33V, DC24V is more than 1A, DC12V is more than 1A, and the DC output ripple is less than 20mV. The two outputs of the power supply unit 105 are DC23-33V, rated current > 1A.
The power supply unit 105 performs voltage value adjustment by a potentiometer with high accuracy, realizes continuous adjustment of output voltage in the range of 23-33V, and displays it in a voltmeter.
In some embodiments, the burn-in test stand further comprises: and a display unit. The display unit is connected with the third singlechip.
The display unit comprises a display screen, a voltmeter and an ammeter, receives a display instruction sent by the third singlechip and displays data in the display instruction.
In some embodiments, the display unit may be disposed on a control panel of the burn-in test stand. The voltmeter is used for displaying voltage values of the crystal oscillator signal, the reference signal, the test signal and the feedback signal; the ammeter is used for displaying the current values of the crystal oscillator signal, the reference signal, the test signal and the feedback signal.
In some embodiments, the control panel of the burn-in test stand includes a ground switch.
Illustratively, as shown in FIG. 4, the ground switch has a first end connected to the negative bus of the power module and a second end connected to the chassis ground.
Thus, the third direct current power supply and the fourth direct current power supply of the power supply module respectively supply power for one pulse transponder. When the grounding switch is disconnected, the negative bus of the power supply module is disconnected with the ground of the machine shell, and at the moment, the voltage provided by the power supply module for the pulse transponder is floating state voltage. When the grounding switch is closed, the negative bus of the power supply module and the ground of the machine shell are in a closed state, and at the moment, the voltage provided by the power supply module for the pulse transponder is in a grounding state voltage.
In other embodiments, the control panel of the burn-in test stand is further provided with an amplitude adjustment knob, a frequency adjustment knob, a step key, a signal switch key, and the like. The control quantity is manually input into the controller, the controller outputs the control quantity to each functional unit, so that the attenuation and adjustment of signals are realized, the step adjustment of the frequency and the amplitude of a test signal is further realized, and the aging test of the pulse transponder is realized.
Alternatively, as shown in fig. 5, an embodiment of the present invention provides a burn-in test method for a transponder. The aging test method includes steps S201 to S206.
S201, acquiring the frequency and the amplitude of a test signal required to carry out aging test on the pulse transponder.
S202, controlling a phase-locking source unit to be started, wherein the phase-locking source unit is used for generating a crystal oscillator signal, generating a reference signal with set frequency and set amplitude after phase-locking and amplifying the crystal oscillator signal, and outputting the reference signal to a modulation attenuation unit.
S203, generating a frequency control signal based on the frequency of the test signal; and generates an amplitude control signal based on the amplitude of the test signal.
S204, controlling the modulation attenuation unit to be started, and sending a frequency control signal and an amplitude control signal to the modulation attenuation unit so that the modulation attenuation unit can adjust the frequency and/or the amplitude of the reference signal based on the frequency control signal and the amplitude control signal and output a test signal.
S205, controlling the load unit to be started, wherein the load unit is used for outputting the test signal to the pulse transponder in a radio frequency manner, receiving the feedback signal replied by the pulse transponder and outputting the feedback signal to the detection unit.
S206, controlling the detection unit to be started, wherein the detection unit is used for receiving the feedback signal, amplifying the feedback signal and outputting the feedback signal so as to finish aging test of the pulse transponder under different amplitude values and different frequencies.
Optionally, the embodiment of the invention also provides a burn-in test system of the pulse transponder. The burn-in test system includes the burn-in test stand 10 in the above embodiment, and a signal processing device; the signal processing device is used for receiving and processing the feedback signal of the pulse answering machine and outputting a processing result.
The above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention, and are intended to be included in the scope of the present invention.
Claims (7)
1. The aging test board of the pulse transponder is characterized by comprising a phase-locked source unit, a modulation attenuation unit, a load unit and a detection unit;
the phase-locked source unit generates a crystal oscillator signal, phase-locks and amplifies the crystal oscillator signal, generates a reference signal with set frequency and set amplitude, and outputs the reference signal to the modulation attenuation unit;
the modulation attenuation unit is connected with the phase-locked source unit and is used for adjusting the frequency and the amplitude of the reference signal and outputting a test signal;
the load unit is connected with the modulation attenuation unit and is used for outputting the test signal to the pulse transponder in a radio frequency manner, receiving a feedback signal replied by the pulse transponder and outputting the feedback signal to the detection unit;
the detection unit is connected with the load unit, receives the feedback signal, amplifies the feedback signal and outputs the feedback signal so as to finish aging test of the pulse transponder under different amplitude values and different frequencies;
the phase-locked source unit includes: the device comprises a crystal oscillator module, a phase-locked loop module, a first microstrip filter, a first amplifier, a pi-type attenuator, a second amplifier, a second microstrip filter and a third amplifier; the crystal oscillator module generates a crystal oscillator signal; the phase-locked loop module performs phase locking on the crystal oscillator signal; the first microstrip filter filters signals with set frequency in the phase-locked crystal oscillator signals and outputs the signals to the first amplifier for setting the first signal with the frequency; the first amplifier receives the first signal, amplifies the power of the first signal and outputs the amplified first signal to the pi-type attenuator; the pi-type attenuator receives the amplified first signal and performs power attenuation to generate a second signal; the second amplifier receives a second signal, amplifies the power of the second signal and outputs the amplified second signal to the second microstrip filter; the second microstrip filter filters the amplified second signal and outputs a third signal with the set frequency to the third amplifier; the third amplifier receives a third signal and performs power amplification on the third signal to generate a reference signal with the set frequency and the set amplitude;
the burn-in test stand further includes a controller, and the modulation attenuation unit includes: a microwave switch and a numerical control attenuator; the controller is respectively connected with the microwave switch and the numerical control attenuator; the microwave switch receives a frequency control signal output by the controller, and realizes the opening and closing of the microwave switch based on the frequency control signal so as to perform step adjustment on the frequency of the reference signal; the numerical control attenuator receives an amplitude control signal output by the controller, and adjusts the attenuation amount of the numerical control attenuator in a stepping mode based on the amplitude control signal so as to adjust the amplitude of the reference signal in a stepping mode; the controller generates the frequency control signal and the amplitude control signal, and controls the microwave switch and the numerical control attenuator to output test signals with different frequencies and different amplitudes.
2. The burn-in test stand of claim 1, wherein the controller comprises a first single-chip microcomputer, a second single-chip microcomputer, and a third single-chip microcomputer;
the first singlechip comprises an amplitude adjusting pin and a frequency adjusting pin, the amplitude adjusting pin is connected with the numerical control attenuator, and the frequency adjusting pin is connected with the microwave switch;
the second singlechip is connected with the phase-locking source unit and is used for carrying out phase-locking control on the phase-locking source unit;
the third singlechip is used for receiving an input instruction of a user, wherein the input instruction of the user comprises an instruction for controlling screen display and a communication instruction of the first singlechip.
3. The burn-in test stand of claim 1, wherein the load cell comprises: the device comprises a circulator, an output interface and a coupling microstrip line; the circulator is respectively connected with the output interface and the coupling microstrip line;
the circulator receives the test signal in one direction and sends the test signal to the transponder through the output interface; and receives a feedback signal of the transponder via an output interface, and transmits the feedback signal to the detection unit via a coupling microstrip line.
4. The burn-in station of claim 1 wherein the burn-in station further comprises: a power supply unit;
the power supply unit comprises an alternating current switch and a power supply module, wherein the input end of the power supply module is connected with the alternating current switch, and the output end of the power supply module comprises a first direct current power supply, a second direct current power supply, a third direct current power supply and a fourth direct current power supply;
the first direct current power supply is a 12V direct current power supply and supplies power to the phase-locked source unit, the modulation attenuation unit and the detection unit;
the second direct current power supply is a 24V direct current power supply and supplies power for the voltmeter and the ammeter;
the third direct current power supply is a direct current power supply with adjustable voltage, the voltage adjusting range of the direct current power supply is 23V to 33V, and the third direct current power supply supplies power for the first pulse transponder;
the fourth direct current power supply is a direct current power supply with adjustable voltage, the voltage adjusting range of the direct current power supply is 23V to 33V, and the fourth direct current power supply supplies power for the second pulse transponder.
5. The burn-in station of claim 3 wherein the burn-in station further comprises: a display unit; the display unit is connected with the third singlechip;
the display unit comprises a display screen, a voltmeter and an ammeter, receives a display instruction sent by the third singlechip and displays data in the display instruction.
6. A burn-in test method for a transponder, comprising:
acquiring the frequency and amplitude of a test signal required to carry out aging test on the pulse transponder;
the phase-locked source unit is controlled to be started, and is used for generating a crystal oscillator signal, generating a reference signal with set frequency and set amplitude after phase-locking amplification of the crystal oscillator signal, and outputting the reference signal to the modulation attenuation unit;
generating the frequency control signal based on the frequency of the test signal; and generating the amplitude control signal based on the amplitude of the test signal;
controlling a modulation attenuation unit to be started, and sending the frequency control signal and the amplitude control signal to the modulation attenuation unit so that the modulation attenuation unit adjusts the frequency and the amplitude of the reference signal based on the frequency control signal and the amplitude control signal and outputs a test signal;
the load unit is controlled to be started, and the load unit is used for outputting the test signal to the pulse transponder in a radio frequency manner, receiving a feedback signal replied by the pulse transponder and outputting the feedback signal to the detection unit;
the detection unit is controlled to be started, and the detection unit is used for receiving the feedback signal, amplifying the feedback signal and outputting the feedback signal so as to finish aging tests of the pulse transponder under different amplitudes and different frequencies;
the phase-locked source unit includes: the device comprises a crystal oscillator module, a phase-locked loop module, a first microstrip filter, a first amplifier, a pi-type attenuator, a second amplifier, a second microstrip filter and a third amplifier; the phase-locked source unit is used for generating a crystal oscillator signal, generating a reference signal with set frequency and set amplitude after phase-locking amplification of the crystal oscillator signal, and outputting the reference signal to the modulation attenuation unit, and comprises the following components: the crystal oscillator module generates a crystal oscillator signal; the phase-locked loop module performs phase locking on the crystal oscillator signal; the first microstrip filter filters signals with set frequency in the phase-locked crystal oscillator signals and outputs the signals to the first amplifier for setting the first signal with the frequency; the first amplifier receives the first signal, amplifies the power of the first signal and outputs the amplified first signal to the pi-type attenuator; the pi-type attenuator receives the amplified first signal and performs power attenuation to generate a second signal; the second amplifier receives a second signal, amplifies the power of the second signal and outputs the amplified second signal to the second microstrip filter; the second microstrip filter filters the amplified second signal and outputs a third signal with the set frequency to the third amplifier; the third amplifier receives a third signal and performs power amplification on the third signal to generate a reference signal with the set frequency and the set amplitude;
the burn-in test stand further includes a controller, and the modulation attenuation unit includes: a microwave switch and a numerical control attenuator; the controller is respectively connected with the microwave switch and the numerical control attenuator; the sending the frequency control signal and the amplitude control signal to the modulation attenuation unit so that the modulation attenuation unit adjusts the frequency and the amplitude of the reference signal based on the frequency control signal and the amplitude control signal, and outputs a test signal, including: the microwave switch receives a frequency control signal output by the controller, and realizes the opening and closing of the microwave switch based on the frequency control signal so as to perform step adjustment on the frequency of the reference signal; the numerical control attenuator receives an amplitude control signal output by the controller, and adjusts the attenuation amount of the numerical control attenuator in a stepping mode based on the amplitude control signal so as to adjust the amplitude of the reference signal in a stepping mode; the controller generates the frequency control signal and the amplitude control signal, and controls the microwave switch and the numerical control attenuator to output test signals with different frequencies and different amplitudes.
7. A burn-in test system for a transponder, comprising a burn-in test station according to any one of claims 1 to 5, and signal processing means; the signal processing device is used for receiving and processing the feedback signal of the pulse transponder and outputting a processing result.
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