CN115165888A - Device, device and method for collecting defects on surface and subsurface of pipeline - Google Patents

Device, device and method for collecting defects on surface and subsurface of pipeline Download PDF

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CN115165888A
CN115165888A CN202210574563.6A CN202210574563A CN115165888A CN 115165888 A CN115165888 A CN 115165888A CN 202210574563 A CN202210574563 A CN 202210574563A CN 115165888 A CN115165888 A CN 115165888A
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pipeline
infrared image
annular
conical reflector
detected
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宋鹏
刘俊岩
王飞
王永辉
孙靖翔
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Harbin Institute of Technology
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Harbin Institute of Technology
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration by the use of more than one image, e.g. averaging, subtraction
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10048—Infrared image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30132—Masonry; Concrete

Abstract

A device for collecting defects on the surface and subsurface of a pipeline, a detection device and a detection method relate to the field of nondestructive detection of the defects on the surface and subsurface of the pipeline. The problem of the current infrared detection method cause optic fibre, cable winding to cause detection work efficiency low is solved. The method comprises the following steps: placing the collecting device into the pipeline to be detected; the driving mechanism in the acquisition device is controlled to drive the acquisition device to move at a constant speed along the axis of the pipeline to be detected; in the movement process, the semiconductor laser emits a laser signal, the laser signal is reflected by a second 90-degree conical reflector, an annular light spot is formed on the inner surface of the pipeline to be detected, and the annular light spot is a heat source; collecting an annular infrared image sequence of the inner wall of the pipeline to be detected, which is reflected by a first 90-degree conical reflector, by an infrared camera; and acquiring defect information according to the annular infrared image sequence. The invention is suitable for detecting and positioning the defects of the inner surface and the subsurface of the special-shaped hole pipeline.

Description

Device for collecting defects on surface and subsurface of pipeline, detection device and detection method
Technical Field
The invention relates to the field of pipeline surface and subsurface defect detection, in particular to a method for detecting pipeline surface and subsurface defects.
Background
The pipeline structure has the functions of liquid and gas transmission, storage, guidance and the like, has the advantages of large transportation amount, continuity, economy, safety, reliability, small investment, small occupied area and the like, and plays an extremely important role in the fields of petroleum, chemical industry, metallurgy, military industry, municipal administration and the like. The pipe material is usually selected from different materials according to working conditions, and metal pipes and composite pipes are commonly used. Defects can be generated on the inner surface and the subsurface of the pipeline due to the reasons of long-term work of the main material of the pipeline, corrosivity of transported substances and the like, the defects such as cracks and the like are frequently generated along with the change of material stress aiming at the metal pipeline, the defects such as debonding, delamination, cracks and the like are frequently generated aiming at the composite material pipeline, and the detection of the defects has important significance and practical application value for the safe and early diagnosis of the pipeline performance.
At present, nondestructive detection methods such as ultrasonic, eddy current and optical imaging are commonly adopted for detecting defects of the inner surface and the subsurface of the pipeline in China, the methods have requirements on the surface of a sample, meanwhile, couplant is needed for ultrasonic detection, and the detection result of the eddy current detection method is not visual. The optical imaging detection method has the advantages of non-contact, visual detection and the like, is a mature detection method at present, but is sensitive to surface defects and difficult to realize subsurface internal defect detection. Therefore, a nondestructive testing method is needed to realize a non-contact imaging testing method for the inner surface and subsurface of the pipeline.
The laser-induced infrared thermal imaging detection as a novel nondestructive detection technology has the advantages of non-contact, large area, visual detection and the like, the method utilizes laser to excite the sample piece, the surface of the sample piece converts light energy into heat through absorption, and the defect of the sample piece forms heat accumulation to form temperature difference which is captured by an infrared camera. Therefore, the infrared thermal imaging detection method can realize surface defect detection and internal defect detection compared with the optical imaging method. The prior art CN105758889A discloses an infrared thermal wave imaging detection system and method for an oil and gas pipeline, which utilize an infrared thermal wave detection method to detect the interior of the pipeline by adopting a 360-degree rotating platform, but in the actual operation process, because the pipeline has long and narrow characteristics, the optical fiber and cable of a camera can be wound when the optical fiber and cable rotate, and the system and method are not feasible.
Disclosure of Invention
The invention solves the problem of low detection efficiency caused by winding of optical fibers and cables in the conventional infrared detection method.
The invention provides a device for collecting defects on the surface and subsurface of a pipeline, which comprises:
the device comprises two groups of self-adaptive elastic adjusting mechanisms, a driving mechanism, an infrared camera, a coaxial connecting rod, a first 90-degree conical reflector, a conical reflector frame, a second 90-degree conical reflector and a semiconductor laser;
the driving mechanism, the infrared camera, the first 90-degree conical reflector, the second 90-degree conical reflector, the laser collimating lens and the semiconductor laser are sequentially arranged and coaxial, and all the components are fixedly connected between the driving mechanism and the semiconductor laser through coaxial connecting rods;
the bottom surfaces of the first 90-degree conical reflector and the second 90-degree conical reflector are arranged in a mirror image mode, and the first 90-degree conical reflector and the second 90-degree conical reflector are fixedly connected through a conical reflector frame;
laser emitted by the semiconductor laser is emitted to a second 90-degree conical reflector adjacent to the laser collimating lens to form an annular light spot on the inner surface of the pipeline to be measured; the infrared camera is used for collecting an image of the inner wall of the pipeline to be detected reflected by the adjacent first 90-degree conical reflector;
the self-adaptive adjusting mechanism comprises two groups of elastic supporting structures, a driving mechanism is fixed in the pipeline to be tested through one group of elastic supporting structures, a semiconductor laser is fixed in the pipeline to be tested through the other group of elastic supporting structures, and the driving mechanism and the semiconductor laser are coaxial with the pipeline to be tested;
the driving mechanism is used for driving the collecting device to move along the axis of the pipeline to be detected to one side of the semiconductor laser.
Further, each group of elastic support structures comprises at least 3 support units, and the at least 3 support units are located in the same plane and are uniformly distributed along the axial direction.
Further, each group of elastic supporting structures also comprises at least 3 wheels, and one wheel is arranged at the tail end of each supporting unit.
The invention also provides a device for detecting the defects of the surface and the subsurface of the pipeline, which comprises:
a collection device and a computer;
the collecting device is the collecting device for the defects on the surface and the subsurface of the pipeline;
the computer is internally embedded with a control module realized by computer software, and the control module comprises:
the laser control unit is used for sending a control signal to the semiconductor laser and controlling the semiconductor laser to emit a laser signal;
the driving control unit is used for sending a control signal to the driving mechanism and controlling the driving mechanism to drive the acquisition device to move towards one side of the semiconductor laser at a constant speed along the axis of the pipeline to be detected;
the image acquisition control unit is used for sending a control signal to the infrared camera and controlling the infrared camera to acquire an annular infrared image sequence;
and the image collecting unit is used for receiving the infrared image sequence collected by the infrared camera.
The invention also provides a pipeline surface detection method, which is realized based on the pipeline surface acquisition device, and the method comprises the following steps:
placing the collecting device into the pipeline to be detected;
the driving mechanism in the acquisition device is controlled to drive the acquisition device to move at a constant speed along the axis of the pipeline to be detected;
in the movement process, the semiconductor laser emits a laser signal, the laser signal is reflected by a second 90-degree conical reflector, an annular light spot is formed on the inner surface of the pipeline to be detected, and the annular light spot is a heat source;
collecting an annular infrared image sequence of the inner wall of the pipeline to be detected, which is reflected by a first 90-degree conical reflector, by an infrared camera;
and acquiring defect information according to the annular infrared image sequence.
Further, the process of obtaining the defect information according to the annular infrared image sequence is as follows:
determining the surface coordinate M (r) of the inner wall of the pipeline according to the nth infrared image pixel point M' (M, n) in the annular infrared image sequence M ,θ M ,z M )：
Figure BDA0003661559390000031
Wherein r is the radius of the pipeline, f is the focal length of the infrared camera, r M Is a distance, θ M Is an angle, z M The axial width of the annular infrared image is defined, M is a transverse pixel point of the infrared image pixel point M ', and n represents a longitudinal pixel point of the infrared image pixel point M'.
Further, the infrared camera sends the collected annular infrared image sequence to a computer for processing, and obtains a detection result, including:
converting the annular infrared image sequence into a planar infrared image sequence:
Figure BDA0003661559390000032
wherein rho is the polar diameter, theta is the polar angle, delta theta is the resolution in the x direction in the plane unfolding process, delta rho is the resolution in the y direction in the plane unfolding process, and R 1 Is the inner diameter, R, of the annular infrared image 2 The outer diameter of the annular infrared image is defined, t is the maximum transverse pixel point of the annular infrared image, and h is the maximum longitudinal pixel point of the annular infrared image;
extracting the characteristics of the overlapped part according to the plane infrared image sequence to obtain a plane infrared image;
and splicing two adjacent images together by extracting the characteristic point information of the overlapped part of the two adjacent plane infrared images to finally obtain a plane infrared image, wherein the screen infrared image represents the inner surface of the pipeline.
Further, the computer processing further comprises performing spatio-temporal transformation processing on the planar infrared image sequence.
The invention has the advantages that:
1. the invention provides a self-adaptive infrared detection system and a self-adaptive infrared detection method, which solve the problem that the traditional optical imaging detection method only detects surface defects, solve the problem of low detection efficiency caused by winding of optical fibers and cables in the existing infrared detection method, and adapt to different inner diameters of special-shaped hole pipelines. The detection principle of the invention is that the thermal resistance of the material is increased due to the defects on the surface and the sub-surface of the sample piece, an annular moving heat source is formed by exciting the inner surface of the pipeline through the movable annular laser, the heat quantity formed at the defect is accumulated and has temperature difference with the non-defect, and the defect characteristic distribution image is obtained by combining the thermal infrared imager with the related image processing algorithm, so that the detection of the defects on the inner surface and the sub-surface of the pipeline is realized, and the method is a novel, rapid and large-area visual imaging detection method. The continuous detection process is realized by adopting the annular laser excitation and annular detection imaging modes, and the detection efficiency is improved.
2. The invention adopts the coordinate transformation and infrared image splicing technology to convert the infrared image sequence of the inner wall of the pipeline into a plane graph, so that the detected image is more visual, and a new method is provided for detecting and positioning the defects of the inner wall surface and the subsurface of the pipeline.
3. The invention adopts a space-time transformation technology to convert the space position of the annular scanning into a pulse time sequence, achieves the effect of enhancing the signal-to-noise ratio of the characteristic image by combining a pulse phase method, realizes image visualization through space-time inverse transformation and is convenient to obtain a detection result.
The method is suitable for detecting and positioning the defects (cracks, debonding, delamination and the like) on the inner surface and the subsurface of the pipeline.
Drawings
FIG. 1 is a schematic diagram of an adaptive infrared acquisition and detection system for pipeline surface and subsurface defects, according to the present invention, in which: 1 is the pipeline, 2 and 10 are the spring, 3 and 9 are the wheel, 4 and 12 are coaxial connecting rod, 5 are heat radiation light, 6 is first 90 conical reflection mirrors, 7 is second 90 conical reflection mirrors, 8 is the laser collimation camera lens, 11 is semiconductor laser and power, 13 is annular facula region, 14 is the conical reflection mirror frame, 15 is infrared camera, 16 is actuating mechanism, 17 is the computer.
Fig. 2 shows the corresponding areas of the nth and n +1 images captured by the infrared camera on the inner wall of the pipeline according to the sixth embodiment of the present invention.
Fig. 3 is a schematic view of an nth infrared ring image according to an eighth embodiment of the present invention.
Fig. 4 is a schematic diagram of an expanded image of an image sequence according to an eighth embodiment of the present invention.
Fig. 5 is a schematic diagram of a spatio-temporal transformation technique according to a ninth embodiment of the present invention.
Detailed Description
To make the aspects and advantages of the present application more clear, several embodiments of the present application will now be described in detail with reference to the accompanying drawings, but the several embodiments described below are only some preferred embodiments of the present application and are not intended to limit the present application.
First embodiment this embodiment will be described with reference to fig. 1. The pipeline surface and subsurface defect collection system of this embodiment, collection system includes:
the device comprises two groups of self-adaptive elastic adjusting mechanisms, a driving mechanism 16, an infrared camera 15, a coaxial connecting rod 4, a coaxial connecting rod 12, a first 90-degree conical reflector 6, a conical reflector frame 14, a second 90-degree conical reflector 7 and a semiconductor laser 11;
the driving mechanism 16, the infrared camera 15, the first 90-degree conical reflector 6, the second 90-degree conical reflector 7, the laser collimating lens 8 and the semiconductor laser 11 are sequentially arranged and coaxial, and all the components are fixedly connected between the driving mechanism and the semiconductor laser through coaxial connecting rods;
the bottom surfaces of the first 90-degree conical reflector and the second 90-degree conical reflector are arranged in a mirror image mode, and the first 90-degree conical reflector and the second 90-degree conical reflector are fixedly connected through a conical reflector frame;
laser emitted by the semiconductor laser is emitted to a second 90-degree conical reflector adjacent to the laser collimating lens to the inner surface of the pipeline to be measured to form annular light spots; the infrared camera is used for collecting an image of the inner wall of the pipeline to be detected reflected by the adjacent first 90-degree conical reflector;
the self-adaptive adjusting mechanism comprises two groups of elastic supporting structures, a driving mechanism is fixed in the pipeline to be tested through one group of elastic supporting structures, a semiconductor laser is fixed in the pipeline to be tested through the other group of elastic supporting structures, and the driving mechanism and the semiconductor laser are coaxial with the pipeline to be tested;
the driving mechanism is used for driving the collecting device to move along the axis of the pipeline to be measured and towards one side of the semiconductor laser.
Specifically, the conical reflector frame 14 has an axial distance adjusting function, and the distance between the first 90 ° conical reflector 6 and the second 90 ° conical reflector 7 can be further adjusted by adjusting the position of the conical reflector frame 14, so as to adjust the distance between the heat source and the area to be measured;
the infrared camera 15 is arranged on the driving mechanism 16, and the thermal radiation light 5 of the region to be measured can smoothly enter the visual field of the infrared camera 15 by adjusting the focal length of the infrared camera 15, and the region to be measured is ensured to be clearly visible;
the laser collimating lens 8 is fixed on the laser 11, the axes of the laser collimating lens 8 and the pipeline 1 are overlapped, the emitted laser is guaranteed to perpendicularly hit the surface of the inner wall of the pipeline 1 through the second 90-degree conical reflector 7 to form an annular light spot 13 with uniform width, and the width of the annular light spot 13 can be changed by adjusting the focal position of the collimating lens 8.
The acquisition device of the embodiment can comprehensively acquire the annular image information of the infrared camera of the pipeline.
Second embodiment this embodiment will be described with reference to fig. 1. The present embodiment is further defined by the apparatus for collecting surface and subsurface defects of a pipeline according to the first embodiment, wherein each group of elastic supporting structures includes at least 3 supporting units, and the at least 3 supporting units are located in the same plane and uniformly distributed along the circumferential direction.
In a third embodiment, the collecting device for surface and subsurface defects of a pipeline according to the second embodiment is further defined, each set of elastic supporting structures further includes at least 3 wheels, and one wheel is arranged at the tail end of each supporting unit
Specifically, this embodiment will be described with reference to the first and second embodiments. One end of the elastic supporting structure is connected with the driving mechanism, the other end of the elastic supporting structure is fixedly connected with a wheel, and the wheel is tightly attached to the inner wall of the pipeline 1. 3 groups of same self-adapting adjusting mechanisms are adopted to support the driving mechanism 16, and the other 3 groups of same self-adapting adjusting mechanisms are adopted to support the laser 11, so that the axes of the driving mechanism 16, the laser and the power supply 11 are always coincident with the axis of the pipeline 1.
Fourth embodiment this embodiment will be described with reference to fig. 1. The detection device for the defects of the surface and the subsurface of the pipeline in the embodiment comprises:
a collection device and computer 17;
the collecting device is the collecting device for the defects on the surface and the subsurface of the pipeline in the first embodiment;
the computer 17 is embedded with a control module implemented by computer software, and the control module comprises:
the laser control unit is used for sending a control signal to the semiconductor laser 11 and controlling the semiconductor laser 11 to emit a laser signal;
the driving control unit is used for sending a control signal to the driving mechanism 16 and controlling the driving mechanism 16 to drive the collecting device to move towards one side of the semiconductor laser at a constant speed along the axis of the pipeline to be detected;
the image acquisition control unit is used for sending a control signal to the infrared camera 15 and controlling the infrared camera 15 to acquire an annular infrared image sequence;
an image collecting unit, configured to receive the infrared image sequence acquired by the infrared camera 15.
The detection device of the embodiment performs annular laser scanning detection on the defects of the inner wall of the pipeline, and has the advantages of large defect detection depth, high detection efficiency and the like compared with the traditional optical imaging method.
Fifth embodiment this embodiment will be described with reference to fig. 2. The method for detecting the defects of the surface and the subsurface of the pipeline is realized based on the pipeline surface acquisition device in the first embodiment, and comprises the following steps:
placing the collecting device into the pipeline to be detected;
the driving mechanism in the acquisition device is controlled to drive the acquisition device to move at a constant speed along the axis of the pipeline to be detected;
in the movement process, the semiconductor laser emits a laser signal, the laser signal is reflected by a second 90-degree conical reflector, an annular light spot is formed on the inner surface of the pipeline to be detected, and the annular light spot is a heat source;
the method comprises the following steps that an infrared camera collects an annular infrared image sequence of the inner wall of a pipeline to be detected, which is reflected by a first 90-degree conical reflector;
and acquiring defect information according to the annular infrared image sequence.
Sixth embodiment this embodiment will be described with reference to fig. 3, 4, and 5. In this embodiment, the method for detecting defects on a surface and a subsurface of a pipeline according to the fifth embodiment is further defined, and the process of obtaining the defect information according to the annular infrared image sequence includes:
determining the surface coordinate M (r) of the inner wall of the pipeline according to the nth infrared image pixel point M' (M, n) in the annular infrared image sequence M ,θ M ,z M )：
Figure BDA0003661559390000061
Wherein r is the pipe radius, f is redFocal length of the outer camera, r M Is a distance, θ M Is an angle, z M The axial width of the annular infrared image is defined, M is a transverse pixel point of the infrared image pixel point M ', and n represents a longitudinal pixel point of the infrared image pixel point M'.
Converting the annular infrared image sequence into a planar infrared image sequence, which specifically comprises the following steps:
Figure BDA0003661559390000071
wherein rho is the polar diameter, theta is the polar angle, delta theta is the resolution in the x direction in the plane unfolding process, delta rho is the resolution in the y direction in the plane unfolding process, and R 1 Is the inner diameter, R, of the annular infrared image 2 The outer diameter of the annular infrared image is defined, t is the maximum transverse pixel point of the annular infrared image, and h is the maximum longitudinal pixel point of the annular infrared image;
extracting the characteristics of the overlapped part according to the plane infrared image sequence to obtain a plane infrared image;
splicing two adjacent plane infrared images together by extracting the information of the characteristic points of the overlapped part of the two adjacent plane infrared images, so as to finally obtain a plane infrared image, wherein the screen infrared image represents the inner surface of the pipeline;
and performing space-time transformation processing on the plane infrared image sequence.
From this image obtained, further processing can be performed to obtain sub-defects of the inner surface of the pipe.
In practical application, the annular space position scanned by the infrared camera can be converted into a pulse time sequence by adopting space-time transformation processing, the signal-to-noise ratio of the characteristic image can be enhanced by combining a pulse phase method, and the image visualization is realized by space-time inverse transformation, so that the detection result can be conveniently obtained.

Claims (6)

1. A device for collecting surface and subsurface defects of a pipeline, the device comprising:
the device comprises two groups of self-adaptive elastic adjusting mechanisms, a driving mechanism, an infrared camera, a coaxial connecting rod, a first 90-degree conical reflector, a conical reflector frame, a second 90-degree conical reflector and a semiconductor laser;
the driving mechanism, the infrared camera, the first 90-degree conical reflector, the second 90-degree conical reflector, the laser collimating lens and the semiconductor laser are sequentially arranged and coaxial, and all the components are fixedly connected between the driving mechanism and the semiconductor laser through coaxial connecting rods;
the bottom surfaces of the first 90-degree conical reflector and the second 90-degree conical reflector are arranged in a mirror image mode relatively, and the first 90-degree conical reflector and the second 90-degree conical reflector are fixedly connected through a conical reflector frame;
laser emitted by the semiconductor laser is emitted to a second 90-degree conical reflector adjacent to the laser collimating lens to the inner surface of the pipeline to be measured to form annular light spots; the infrared camera is used for collecting an image of the inner wall of the pipeline to be detected reflected by the adjacent first 90-degree conical reflector;
the self-adaptive adjusting mechanism comprises two groups of elastic supporting structures, a driving mechanism is fixed inside the pipeline to be detected through one group of elastic supporting structures, a semiconductor laser is fixed inside the pipeline to be detected through the other group of elastic supporting structures, and the driving mechanism and the semiconductor laser are coaxial with the pipeline to be detected;
the driving mechanism is used for driving the collecting device to move along the axis of the pipeline to be measured and towards one side of the semiconductor laser.
2. The device of claim 1, wherein each set of resilient support structures comprises at least 3 support elements, and the at least 3 support elements are located in the same plane and are circumferentially and uniformly distributed.
3. The pipeline surface acquisition device of claim 2 wherein each set of resilient support structures further comprises at least 3 wheels, one wheel being provided at each support unit end.
4. A device for detecting surface and subsurface defects in a pipe, the device comprising:
a collection device and a computer;
the collecting device is the collecting device for the defects on the surface and the subsurface of the pipeline as claimed in claim 1;
the computer is internally embedded with a control module realized by computer software, and the control module comprises:
the laser control unit is used for sending a control signal to the semiconductor laser and controlling the semiconductor laser to emit a laser signal;
the driving control unit is used for sending a control signal to the driving mechanism and controlling the driving mechanism to drive the acquisition device to move towards one side of the semiconductor laser at a constant speed along the axis of the pipeline to be detected;
the image acquisition control unit is used for sending a control signal to the infrared camera and controlling the infrared camera to acquire an annular infrared image sequence;
and the image collecting unit is used for receiving the infrared image sequence collected by the infrared camera.
5. A pipeline surface detection method, wherein the detection method is implemented based on the pipeline surface acquisition device of claim 1, and the method comprises:
placing the collecting device into the pipeline to be detected;
the driving mechanism in the collecting device is controlled to drive the collecting device to move at a constant speed along the axis of the pipeline to be detected;
in the movement process, the semiconductor laser emits a laser signal, the laser signal is reflected by a second 90-degree conical reflector, an annular light spot is formed on the inner surface of the pipeline to be detected, and the annular light spot is a heat source;
the method comprises the following steps that an infrared camera collects an annular infrared image sequence of the inner wall of a pipeline to be detected, which is reflected by a first 90-degree conical reflector;
and acquiring defect information according to the annular infrared image sequence.
6. The method of claim 5, wherein the step of obtaining defect information from the annular infrared image sequence comprises:
determining the surface coordinate M (r) of the inner wall of the pipeline according to the nth infrared image pixel point M' (M, n) in the annular infrared image sequence M ,θ M ,z M )：
Figure FDA0003661559380000021
Wherein r is the radius of the pipeline, f is the focal length of the infrared camera, and r M Is a distance, θ M Is an angle, z M The axial width of the annular infrared image is defined, M is a transverse pixel point of the infrared image pixel point M ', and n represents a longitudinal pixel point of the infrared image pixel point M';
converting the annular infrared image sequence into a planar infrared image sequence:
Figure FDA0003661559380000022
wherein rho is the polar diameter, theta is the polar angle, delta theta is the resolution in the x direction in the plane unfolding process, delta rho is the resolution in the y direction in the plane unfolding process, and R 1 Is the inner diameter, R, of the annular infrared image 2 The outer diameter of the annular infrared image is defined, t is the maximum transverse pixel point of the annular infrared image, and h is the maximum longitudinal pixel point of the annular infrared image;
extracting the characteristics of the overlapped part according to the plane infrared image sequence to obtain a plane infrared image;
splicing two adjacent images together by extracting the characteristic point information of the overlapped part of the two adjacent plane infrared images to finally obtain a plane infrared image, wherein the screen infrared image represents the inner surface of the pipeline;
and performing space-time transformation processing on the plane infrared image sequence.
CN202210574563.6A 2022-05-25 2022-05-25 Device, device and method for collecting defects on surface and subsurface of pipeline Pending CN115165888A (en)

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