CN115134010A - Testing device for third-order intermodulation - Google Patents

Testing device for third-order intermodulation Download PDF

Info

Publication number
CN115134010A
CN115134010A CN202210746732.XA CN202210746732A CN115134010A CN 115134010 A CN115134010 A CN 115134010A CN 202210746732 A CN202210746732 A CN 202210746732A CN 115134010 A CN115134010 A CN 115134010A
Authority
CN
China
Prior art keywords
intermodulation
sliding
connector
cable
swing arm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202210746732.XA
Other languages
Chinese (zh)
Other versions
CN115134010B (en
Inventor
李永春
梁建科
陈永榆
郭林波
杜艳伟
吴祖兴
黄汝闲
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Comba Telecom Technology Guangzhou Ltd
Jingxin RF Technology Guangzhou Co ltd
Original Assignee
Comba Telecom Technology Guangzhou Ltd
Jingxin RF Technology Guangzhou Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Comba Telecom Technology Guangzhou Ltd, Jingxin RF Technology Guangzhou Co ltd filed Critical Comba Telecom Technology Guangzhou Ltd
Priority to CN202210746732.XA priority Critical patent/CN115134010B/en
Publication of CN115134010A publication Critical patent/CN115134010A/en
Application granted granted Critical
Publication of CN115134010B publication Critical patent/CN115134010B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00Arrangements for monitoring or testing data switching networks
    • H04L43/50Testing arrangements

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention discloses a testing device for third-order intermodulation, which comprises an intermodulation instrument, a low intermodulation load instrument, a first connector and a second connector, wherein the first connector is electrically connected with the intermodulation instrument, the first connector is used for detachably butting with an input cable of a piece to be tested so as to electrically connect the piece to be tested with the intermodulation instrument, the second connector is electrically connected with the low intermodulation load instrument, at least one second connector is arranged, and the second connector is used for detachably butting with an output cable of the piece to be tested so as to electrically connect the piece to be tested with the low intermodulation load instrument. Because carry out quick detach butt joint through first connector and second connector, compare traditional welding mode, not only efficiency of software testing is high, and the test cost is also low moreover, and can not influence subsequent welding quality.

Description

Testing device for third-order intermodulation
Technical Field
The invention relates to the technical field of communication device testing, in particular to a testing device for third-order intermodulation.
Background
Products in the telecommunications industry typically require multiple materials to be assembled offline into an assembly, and then the assembly is mounted on the product. In the preparation process of the base station antenna, a third-order intermodulation test needs to be carried out on the components or parts so as to improve the preparation qualification rate of the base station antenna.
The traditional method is as follows: and welding the wiring terminal of the component or the part with the wiring terminal of the testing device, and then testing relevant indexes. However, this test method not only requires soldering operation, but also consumes solder, which not only results in long preparation time before testing, but also increases the testing cost of the components or parts; in addition, the soldered assembly or part will affect further solder quality and intermodulation levels during subsequent processing.
Disclosure of Invention
Based on this, it is necessary to provide a test apparatus for third-order intermodulation; this a testing arrangement for third-order intermodulation can realize the quick assembly disassembly to the piece that awaits measuring, and need not the welding, and not only the test cost is low, and test work volume is few moreover, improves efficiency of software testing.
The technical scheme is as follows:
one embodiment provides a test apparatus for third order intermodulation, comprising:
intermodulation instrument and low intermodulation load instrument;
the first connector is electrically connected with the intermodulation instrument and is used for detachably butting with an input cable of a piece to be tested so as to electrically connect the piece to be tested with the intermodulation instrument;
the second connector is electrically connected with the low intermodulation load instrument and is provided with at least one, and the second connector is used for detachably butting with an output cable of the piece to be tested so as to enable the piece to be tested to be electrically connected with the low intermodulation load instrument.
When the third-order intermodulation test needs to be carried out on the piece to be tested, on one hand, the input cable of the piece to be tested is in butt joint fit through the first connector to realize the communication between the piece to be tested and the intermodulation instrument, on the other hand, the output cable of the piece to be tested is in butt joint fit through the second connector to realize the communication between the piece to be tested and the low intermodulation load instrument, and then the third-order intermodulation test can be carried out through the intermodulation instrument and the low intermodulation load instrument; because carry out the butt joint of quick detach through first connector and second connector, compare traditional welding methods, not only efficiency of software testing is high, and the cost of software testing is also low moreover, and can not influence subsequent welding quality.
The technical solution is further explained below:
in one embodiment, the testing apparatus for third-order intermodulation further comprises a supporting base and a fixing mechanism, wherein the fixing mechanism is arranged on the supporting base and is used for fixing the piece to be tested on the supporting base.
In one embodiment, the fixing mechanism includes a base and a pressing component, the base is disposed on the supporting seat, and the pressing component is disposed on the base and is used for pressing the to-be-detected member against the supporting seat.
In one embodiment, the fixing mechanism further comprises a swing arm and a limiting arm, the swing arm is rotatably arranged on the base, the abutting assembly comprises an abutting rod, and the abutting rod can extend and retract relative to the swing arm; the limiting arm is arranged on the base in a rotating mode and used for limiting the swinging of the swinging arm.
In one embodiment, the swing arm is provided with a sliding groove, the sliding groove extends along the length direction of the swing arm, the fixing mechanism further comprises a sliding component, the sliding component is in sliding fit with the swing arm through the sliding groove, the abutting component is arranged on the sliding component, and the abutting rod can extend and retract relative to the sliding component.
In one embodiment, the sliding groove is arranged through the swing arm, the sliding assembly comprises a first sliding part and a second sliding part, the first sliding part and the second sliding part are in sliding fit with the swing arm through the sliding groove, the first sliding part is provided with a first through hole, and the second sliding part is provided with a second through hole;
the abutting rod is provided with a first thread and a second thread, one end of the abutting rod penetrates through the first through hole, the sliding groove and the second through hole and is used for abutting against the to-be-detected piece, the abutting assembly further comprises a first nut and a second nut, the first nut and the second nut are respectively located on two opposite sides of the sliding assembly, the first nut is in threaded connection with the abutting rod through the first thread, the second nut is in threaded connection with the abutting rod through the second thread, the first nut and the second nut are used for enabling the sliding assembly after sliding to be fixed onto the swing arm, and the abutting rod rotates relative to the first nut and the second nut to move in a telescopic mode.
In one embodiment, the limiting arm is provided with a limiting groove, a notch of the limiting groove faces the swing arm, and the limiting arm is abutted against the swing arm through the limiting groove so as to limit the swing of the swing arm.
In one embodiment, at least two fixing mechanisms are provided, and the fixing mechanisms are arranged at intervals along the length direction of the supporting seat.
In one embodiment, the supporting seat is provided with a supporting part and a mounting part; the fixing mechanism is arranged on the supporting portion and used for fixing the piece to be detected to the supporting portion, and the second connectors are arranged on the mounting portion at intervals.
In one embodiment, the support base is made of a non-conductive material; or the supporting seat is made of a conductive material, an insulating pad is arranged on the supporting seat, and the insulating pad is used for insulating the piece to be detected from the supporting seat.
In one embodiment, the first connector has a first contraction end, a first adjuster and a first plug end, the first contraction end and the first plug end are electrically connected, the first contraction end is used for being butted with the input cable, the first adjuster is used for adjusting the clamping force of the first contraction end on the input cable, the test device for the third-order intermodulation further comprises a first cable, one end of the first cable is electrically connected with the intermodulation instrument, and the other end of the first cable is in plug fit with the first plug end so that the input cable is electrically connected with the intermodulation instrument;
and/or the second connector has a second contraction end, a second adjusting part and a second plugging end, the second contraction end is electrically connected with the second plugging end, the second contraction end is used for being in butt joint with the output cable, the second adjusting part is used for adjusting the clamping force of the second contraction end to the output cable, the testing device for third-order intermodulation further comprises a second cable, one end of the second cable is electrically connected with the low intermodulation load instrument, and the other end of the second cable is in plugging fit with the second plugging end, so that the output cable is electrically connected with the low intermodulation load instrument.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification.
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Furthermore, the drawings are not drawn to a 1:1 scale, and the relative sizes of the various elements in the drawings are merely drawn by way of example, and not necessarily to true scale.
Fig. 1 is a schematic structural diagram of a testing apparatus (intermodulation product removal) for third-order intermodulation in an embodiment of the present invention;
FIG. 2 is a schematic diagram of a testing apparatus for third-order intermodulation and a device under test according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a fixing mechanism in a testing apparatus for third-order intermodulation according to an embodiment of the present invention;
FIG. 4 is a general schematic diagram of a first connector in an embodiment of the invention;
FIG. 5 is a front view of the first connector of the embodiment of FIG. 4;
FIG. 6 is a top view of the first connector of the embodiment of FIG. 4;
FIG. 7 is a side view of the first connector of the embodiment of FIG. 4;
fig. 8 is a structural diagram of a device under test in an embodiment of the invention.
Reference is made to the accompanying drawings in which:
110. an intermodulation instrument; 120. a low intermodulation load meter; 131. a first cable; 132. a second cable; 210. a first connector; 211. a first adjustment member; 212. a first plug end; 220. a second connector; 300. a supporting seat; 310. a support portion; 320. an installation part; 330. an insulating pad; 400. a fixing mechanism; 410. a base; 421. a first nut; 422. a second nut; 423. a pressing rod; 431. a first sliding section; 432. a second sliding section; 440. a swing arm; 441. a chute; 450. a limiting arm; 451. a limiting groove; 500. a piece to be tested; 510. an input cable; 520. and outputting the cable.
Detailed Description
Embodiments of the present invention are described in detail below with reference to the accompanying drawings:
in order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.
Referring to fig. 1 and fig. 2, an embodiment provides a testing apparatus for third-order intermodulation, including an intermodulation instrument 110, a low intermodulation load instrument 120, a first connector 210 and a second connector 220, wherein the first connector 210 is electrically connected to the intermodulation instrument 110, the first connector 210 is detachably connected to an input cable 510 of a device under test 500, so that the device under test 500 is electrically connected to the intermodulation instrument 110, the second connector 220 is electrically connected to the low intermodulation load instrument 120, at least one of the second connectors 220 is provided, and the second connector 220 is detachably connected to an output cable 520 of the device under test 500, so that the device under test 500 is electrically connected to the low intermodulation load instrument 120.
When the third-order intermodulation test needs to be performed on the to-be-tested piece 500, on one hand, the input cable 510 of the to-be-tested piece 500 is in butt joint fit through the first connector 210 to realize the communication between the to-be-tested piece 500 and the intermodulation instrument 110, on the other hand, the output cable 520 of the to-be-tested piece 500 is in butt joint fit through the second connector 220 to realize the communication between the to-be-tested piece 500 and the low intermodulation load instrument 120, and then the third-order intermodulation test can be performed through the intermodulation instrument 110 and the low intermodulation load instrument 120; because carry out quick detach butt joint through first connector 210 and second connector 220, compare traditional welding mode, not only the efficiency of software testing is high, and the test cost is also low moreover, and can not influence subsequent welding quality.
In the process of manufacturing the base station antenna, after a certain part or component is assembled, if a third order intermodulation test is performed on the part or the component, the part or the component is referred to as a device under test 500. The first connector 210 is used for connecting the piece 500 to be tested with the intermodulation instrument 110, the second connector 220 is used for connecting the piece 500 to be tested with the low intermodulation load instrument 120, then the third-order intermodulation test can be carried out on the piece 500 to be tested through the intermodulation instrument 110, and finally, after the test is finished, the piece 500 to be tested is separated from the first connector 210 and the second connector 220, the part or the assembly which is qualified in the test is placed in a specified area or a turnover vehicle, of course, the part or the assembly which is unqualified in the test can be placed in an unqualified area, and the description is omitted.
It can be understood that:
the test device for the third-order intermodulation can be applied to the third-order intermodulation test of various parts of the base station antenna, such as a phase shifter, a radiation unit, a combining plate, a power divider, a PCB power divider and the like. The cables are not required to be welded, so that materials such as wiring terminals and welding flux are saved, the consumption of consumables is reduced, secondary welding is avoided, and the risk of poor intermodulation is reduced; meanwhile, the testing efficiency is improved by a quick-release mode by more than 50%, the working strength of workers is reduced, and the operation is simpler; in addition, the testing device for the third-order intermodulation can be repeatedly used, and the testing cost is low.
In one embodiment, referring to fig. 1 and fig. 2, the testing apparatus for third-order intermodulation further includes a supporting base 300 and a fixing mechanism 400, wherein the fixing mechanism 400 is disposed on the supporting base 300 and is used for fixing the dut 500 to the supporting base 300.
As shown in fig. 2, the supporting base 300 may be a bottom plate structure, and the supporting base 300 is provided with a fixing mechanism 400, so that the to-be-tested object 500 is fixed on the supporting base 300 through the fixing mechanism 400, and the position of the to-be-tested object 500 is prevented from being changed during the testing process.
In one embodiment, referring to fig. 2 and fig. 3, the fixing mechanism 400 includes a base 410 and a pressing component, the base 410 is disposed on the supporting base 300, and the pressing component is disposed on the base 410 and is used for pressing the to-be-tested member 500 onto the supporting base 300.
As shown in fig. 3, the base 410 is fixed on the supporting base 300, the pressing component is disposed on the base 410 and is used for pressing the to-be-tested object 500, and the to-be-tested object 500 is fixed on the supporting base 300 under the pressing action.
In one embodiment, referring to fig. 3, the fixing mechanism 400 further includes a swing arm 440 and a limiting arm 450, the swing arm 440 is rotatably disposed on the base 410, the pressing component includes a pressing rod 423, and the pressing rod 423 can extend and retract relative to the swing arm 440; the limiting arm 450 is rotatably provided on the base 410 and serves to limit the swing of the swing arm 440.
As shown in fig. 3, in the process of fixing the object 500 to be tested, the swing arm 440 swings relative to the base 410, and when the swing arm 440 swings to enable the pressing rod 423 to press the object 500 to be tested, the pressing rod 423 further finely adjusts relative to the swing arm 440 through the expansion and contraction of the pressing rod 423, so that the pressing rod 423 presses the object 500 to be tested; in order to avoid that the swinging arm 440 swings reversely after pressing to affect the pressing effect of the pressing rod 423 on the object 500 to be tested, the swinging arm 440 is limited by the limiting arm 450, so that the swinging arm 440 cannot swing reversely.
In one embodiment, referring to fig. 3, the swing arm 440 has a sliding groove 441, the sliding groove 441 extends along a length direction of the swing arm 440, the fixing mechanism 400 further includes a sliding component, the sliding component is slidably engaged with the swing arm 440 through the sliding groove 441, the pressing component is disposed on the sliding component, and the pressing rod 423 can extend and retract relative to the sliding component.
As shown in fig. 3, the pressing component is disposed on the sliding component, and when the sliding component slides relative to the sliding groove 441, the pressing rod 423 moves along with the sliding component, and further selects a proper position of the to-be-tested piece 500 for pressing.
In one embodiment, referring to fig. 3, the sliding groove 441 is disposed through the swing arm 440, the sliding assembly includes a first sliding portion 431 and a second sliding portion 432, the first sliding portion 431 and the second sliding portion 432 are slidably engaged with the swing arm 440 through the sliding groove 441, the first sliding portion 431 is provided with a first through hole, and the second sliding portion 432 is provided with a second through hole.
Referring to fig. 3, the pressing rod 423 is provided with a first thread and a second thread, one end of the pressing rod 423 passes through the first through hole, the sliding groove 441 and the second through hole and is used for pressing the to-be-detected component 500, the pressing component further includes a first nut 421 and a second nut 422, the first nut 421 and the second nut 422 are respectively located on two opposite sides of the sliding component, the first nut 421 is screwed with the pressing rod 423 through the first thread, the second nut 422 is screwed with the pressing rod 423 through the second thread, the first nut 421 and the second nut 422 are used for fixing the sliding component after sliding to the swing arm 440, and the pressing rod 423 rotates relative to the first nut 421 and the second nut 422 to move telescopically.
Alternatively, the first sliding part 431 and the second sliding part 432 may be two independent members, such as two sliding plates or sliding blocks. Of course, the first sliding portion 431 and the second sliding portion 432 may also be integrally disposed, for example, the sliding assembly includes a carriage disposed in a U shape, the carriage is substantially clamped on the swing arm 440, and the first sliding portion 431 and the second sliding portion 432 are two portions of the carriage, which is not described again.
As shown in fig. 3, when an acting force along the length direction of the swing arm 440 is applied to the pressing rod 423, the sliding component and the pressing component both slide along the sliding groove 441, and when the pressing rod 423 moves to a position matched with the position of the to-be-tested piece 500, the first nut 421 and the second nut 422 are screwed with the pressing rod 423, so that the first nut 421 tightly presses the first sliding portion 431 on the swing arm 440, and the second nut 422 tightly presses the second sliding portion 432 on the swing arm 440, so as to ensure that the sliding component does not slide relative to the swing arm 440, and then the pressing rod 423 is rotated, and the pressing rod 423 rotates relative to the first nut 421 and the second nut 422, so that the pressing rod 423 extends and retracts, so that the pressing rod 423 gradually approaches and presses the to-be-tested piece 500, and the to-be-tested piece 500 is fixed; the swing arm 440 is then restrained by the restraint arm 450 to ensure that the swing arm 440 does not swing.
In one embodiment, referring to fig. 3, the limiting arm 450 is provided with a limiting groove 451, a notch of the limiting groove 451 faces the swing arm 440, and the limiting arm 450 abuts against the swing arm 440 through the limiting groove 451 to limit the swing of the swing arm 440.
As shown in fig. 3, the stopper arm 450 is configured like a wrench, and when the stopper arm 450 is pulled down, the stopper arm 450 presses the swing arm 440 toward the lower side through the stopper groove 451, so as to limit the swing of the swing arm 440.
Optionally, the lower portion of the arm 450 is substantially inverted V-shaped and hinged to the base 410, and forms the retaining groove 451, which will not be described in detail.
In one embodiment, referring to fig. 1 and 2, at least two fixing mechanisms 400 are provided, and the fixing mechanisms 400 are arranged at intervals along the length direction of the supporting seat 300.
The fixing mechanism 400 is provided in plural to fix the strip-shaped dut 500 better.
In one embodiment, referring to fig. 1 and 2, the supporting base 300 is provided with a supporting portion 310 and an installation portion 320; the fixing mechanism 400 is disposed on the supporting portion 310 and is used for fixing the to-be-tested object 500 to the supporting portion 310, and the second connector 220 is disposed in plurality and arranged at intervals on the mounting portion 320.
As shown in fig. 2, the supporting base 300 is substantially a right-angle base, the supporting portion 310 is substantially a horizontal plate, the mounting portion 320 is substantially a vertical plate, the object 500 is fixed on the supporting portion 310, and the second connectors 220 are disposed on the mounting portion 320 at intervals.
Of course, the first connector 210 may also be disposed on the supporting base 300.
For example, in fig. 2, the second connector 220 has 2 rows and 13 columns to meet the connection requirement of the output cables 520 of the device under test 500, so as to adapt to different specifications of the device under test 500.
As shown in fig. 8, the device under test 500 has an input cable 510 and four output cables 520, the input cable 510 passes through the first connector 210 and is conducted to the intermodulation instrument 110 via the first cable 131, and the four output cables 520 are respectively butt-fitted to four second connectors 220 of the plurality of second connectors 220 and are conducted to the low intermodulation load instrument 120 via the second cables 132.
As shown in fig. 1 and fig. 2, the number of the second connectors 220 is equal to the number of the second cables 132, and the second connectors 220 correspond to the second cables 132 one by one, and the number of the second connectors 220 can be set to be larger so as to meet the testing requirements of the devices 500 to be tested of different output cables 520.
In one embodiment, the support base 300 is made of a non-conductive material.
In another embodiment, the supporting base 300 is made of a conductive material, and the supporting base 300 is provided with an insulating pad 330, wherein the insulating pad 330 is used for insulating the dut 500 from the supporting base 300.
Alternatively, the insulating pad 330 may be fixed to the support base 300 by means of bonding.
In one embodiment, referring to fig. 4 to 7, the first connector 210 has a first shrinkage end, a first adjusting part 211 and a first plug end 212, the first shrinkage end is electrically connected to the first plug end 212, the first shrinkage end is used for being abutted with the input cable 510, the first adjusting part 211 is used for adjusting the clamping force of the first shrinkage end to the input cable 510, the testing apparatus for third order intermodulation further includes a first cable 131, one end of the first cable 131 is electrically connected to the intermodulation instrument 110, and the other end of the first cable 131 is plugged and matched with the first plug end 212, so that the input cable 510 is electrically connected to the intermodulation instrument 110.
The first adjusting member 211 is used for adjusting the contraction size of the first contraction end head, so that the first contraction end head can be adapted to the input cables 510 with different specifications in a contraction mode, and the butt joint requirements of the to-be-tested members 500 with different specifications are met.
Likewise, the second connector 220 may be the same type of connector as the first connector 210. Specifically, the method comprises the following steps:
the second connector 220 has a second contraction end, a second adjusting member and a second plugging end, the second contraction end is electrically connected to the second plugging end, the second contraction end is used for being connected to the output cable 520 in a butt joint manner, the second adjusting member is used for adjusting a clamping force of the second contraction end to the output cable 520, the testing apparatus for third-order intermodulation further includes a second cable 132, one end of the second cable 132 is electrically connected to the low intermodulation load meter 120, and the other end of the second cable 132 is matched with the second plugging end in a plugging manner, so that the output cable 520 is electrically connected to the low intermodulation load meter 120.
Optionally, the first cable 131 and the second cable 132 may each employ a DIN patch cable to facilitate the butt assembly.
It can be understood that:
the first plug end 212 and the second plug end are both standard cable connectors, and the first contraction end and the second contraction end are both adjustable cable connectors and are adjusted by the adjusting piece, which is not described in detail.
Alternatively, the first connector 210 and the second connector 220 may both employ coaxial cable connectors provided by CN 213304389U.
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the present invention, unless otherwise explicitly stated or limited, the terms "mounted," "connected," "fixed," and the like are to be construed broadly, e.g., as being permanently connected, detachably connected, or integral; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like as used herein are for illustrative purposes only and do not denote a unique embodiment.
All possible combinations of the technical features of the above embodiments may not be described for the sake of brevity, but should be considered as within the scope of the present disclosure as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that various changes and modifications can be made by those skilled in the art without departing from the spirit of the invention, and these changes and modifications are all within the scope of the invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (11)

1. A test apparatus for third order intermodulation, comprising:
intermodulation instrument and low intermodulation load instrument;
the first connector is electrically connected with the intermodulation instrument and is used for detachably butting with an input cable of a piece to be tested so as to electrically connect the piece to be tested with the intermodulation instrument;
the second connector is electrically connected with the low intermodulation load instrument and is provided with at least one, and the second connector is used for detachably butting with an output cable of the piece to be tested so as to enable the piece to be tested to be electrically connected with the low intermodulation load instrument.
2. The testing apparatus of claim 1, further comprising a support base and a fixing mechanism, wherein the fixing mechanism is disposed on the support base and is used to fix the dut to the support base.
3. The apparatus of claim 2, wherein the fixing mechanism comprises a base and a pressing component, the base is disposed on the supporting base, and the pressing component is disposed on the base and is configured to press the device under test against the supporting base.
4. The device according to claim 3, wherein the fixing mechanism further comprises a swing arm and a limiting arm, the swing arm is rotatably disposed on the base, the pressing component comprises a pressing rod, and the pressing rod can extend and retract relative to the swing arm; the limiting arm is arranged on the base in a rotating mode and used for limiting the swinging of the swinging arm.
5. The device according to claim 4, wherein the swing arm has a sliding slot extending along a length direction of the swing arm, the fixing mechanism further comprises a sliding component slidably engaged with the swing arm through the sliding slot, the pressing component is disposed on the sliding component, and the pressing rod can extend and retract relative to the sliding component.
6. The device according to claim 5, wherein the sliding slot is disposed through the swing arm, the sliding assembly comprises a first sliding portion and a second sliding portion, the first sliding portion and the second sliding portion are slidably engaged with the swing arm through the sliding slot, the first sliding portion is provided with a first through hole, and the second sliding portion is provided with a second through hole;
the abutting rod is provided with a first thread and a second thread, one end of the abutting rod penetrates through the first through hole, the sliding groove and the second through hole and is used for abutting against the to-be-detected piece, the abutting assembly further comprises a first nut and a second nut, the first nut and the second nut are respectively located on two opposite sides of the sliding assembly, the first nut is in threaded connection with the abutting rod through the first thread, the second nut is in threaded connection with the abutting rod through the second thread, the first nut and the second nut are used for enabling the sliding assembly after sliding to be fixed onto the swing arm, and the abutting rod rotates relative to the first nut and the second nut to move in a telescopic mode.
7. The device according to claim 4, wherein the limiting arm is provided with a limiting groove, a notch of the limiting groove faces the swing arm, and the limiting arm abuts against the swing arm through the limiting groove to limit the swing of the swing arm.
8. The testing device for third order intermodulation as recited in claim 2 wherein there are at least two fixing mechanisms, the fixing mechanisms being spaced apart along the length of the support base.
9. The test device for third order intermodulation as set forth in any of claims 2-8, wherein the support base is provided with a support portion and a mounting portion; the fixing mechanism is arranged on the supporting portion and used for fixing the piece to be tested on the supporting portion, and the second connectors are arranged on the mounting portion at intervals.
10. The test device for third order intermodulation as set forth in any of claims 2-8, wherein the standoff is made of a non-conductive material; or the supporting seat is made of a conductive material, an insulating pad is arranged on the supporting seat, and the insulating pad is used for insulating the piece to be detected and the supporting seat.
11. The apparatus of any one of claims 1-8, wherein the first connector has a first retractable end, a first adjuster and a first plug end, the first retractable end is electrically connected to the first plug end, the first retractable end is configured to be connected to the input cable, the first adjuster is configured to adjust a clamping force of the first retractable end on the input cable, the apparatus further comprises a first cable, one end of the first cable is electrically connected to the intermodulation instrument, and the other end of the first cable is plugged and matched to the first plug end so that the input cable is electrically connected to the intermodulation instrument;
or/and the second connector has a second shrink end, a second adjusting piece and a second plug end, the second shrink end and the second plug end are electrically connected, the second shrink end is used for being in butt joint with the output cable, the second adjusting piece is used for adjusting the clamping force of the second shrink end to the output cable, the test device for third-order intermodulation further comprises a second cable, one end of the second cable is electrically connected with the low intermodulation load instrument, and the other end of the second cable is in plug-in fit with the second plug end, so that the output cable is electrically connected with the low intermodulation load instrument.
CN202210746732.XA 2022-06-29 2022-06-29 Testing device for third-order intermodulation Active CN115134010B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210746732.XA CN115134010B (en) 2022-06-29 2022-06-29 Testing device for third-order intermodulation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210746732.XA CN115134010B (en) 2022-06-29 2022-06-29 Testing device for third-order intermodulation

Publications (2)

Publication Number Publication Date
CN115134010A true CN115134010A (en) 2022-09-30
CN115134010B CN115134010B (en) 2023-08-04

Family

ID=83379406

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210746732.XA Active CN115134010B (en) 2022-06-29 2022-06-29 Testing device for third-order intermodulation

Country Status (1)

Country Link
CN (1) CN115134010B (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103368665A (en) * 2012-03-30 2013-10-23 中国联合网络通信有限公司广东省分公司 Multi-signal passive intermodulation test method, equipment and system
CN206892218U (en) * 2017-05-23 2018-01-16 广州华烽启望电子科技有限公司 A kind of connector intermodulation testing device
CN211122961U (en) * 2019-11-13 2020-07-28 京信通信技术(广州)有限公司 Antenna intermodulation test fixture
CN215734291U (en) * 2021-07-22 2022-02-01 东莞立讯技术有限公司 Intermodulation test assembly

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103368665A (en) * 2012-03-30 2013-10-23 中国联合网络通信有限公司广东省分公司 Multi-signal passive intermodulation test method, equipment and system
CN206892218U (en) * 2017-05-23 2018-01-16 广州华烽启望电子科技有限公司 A kind of connector intermodulation testing device
CN211122961U (en) * 2019-11-13 2020-07-28 京信通信技术(广州)有限公司 Antenna intermodulation test fixture
CN215734291U (en) * 2021-07-22 2022-02-01 东莞立讯技术有限公司 Intermodulation test assembly

Also Published As

Publication number Publication date
CN115134010B (en) 2023-08-04

Similar Documents

Publication Publication Date Title
US6798223B2 (en) Test methods, systems, and probes for high-frequency wireless-communications devices
US7053643B2 (en) Radio frequency (RF) test probe
EP2811304B1 (en) Circuit board inspection method, circuit board inspection apparatus and circuit board inspection tool
US9335345B1 (en) Method for planarity alignment of waveguide wafer probes
CN111707929A (en) PGA packaging microwave test fixture
US6791317B1 (en) Load board for testing of RF chips
US20060279305A1 (en) Semiconductor test interface
CN115134010A (en) Testing device for third-order intermodulation
CN107389984B (en) Working method of high-power transistor test fixture
KR101722403B1 (en) the pin block with adjustable pitch control
CN101216501A (en) Radio frequency co-axial cable subassembly detecting clamp and method of use thereof
CN111929476A (en) Reusable universal radio frequency device test fixture
CN212514676U (en) Connecting device and electronic apparatus
CN211086401U (en) Detachable high-frequency testing device and vertical probe head thereof
KR101729068B1 (en) Zig
CN218629971U (en) Crystal frequency testing device and system
US20220299555A1 (en) Reduced impedance variation in a modular 2-terminal terminal contacting electrical measurement system
CN211148712U (en) Detection clamp for filter
CN109088676A (en) A kind of radio frequency testing head and radio frequency testing instrument
CN219997124U (en) Clamping fixture
CN216371844U (en) OMT electrical property detects clamping device
CN220606019U (en) Module intermodulation testing device
US6218845B1 (en) Slotline calibration standard kit for network analyzer and calibration method using same
CN214150999U (en) Cluster head short circuit missing welding detection device
JP2002207049A (en) Contact pin for four-probe measurement, contact apparatus, device on side of object to be measured, and device on side of measuring circuit

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant